2SJ387S [HITACHI]

Silicon P-Channel MOS FET; 硅P沟道MOS场效应管
2SJ387S
型号: 2SJ387S
厂家: HITACHI SEMICONDUCTOR    HITACHI SEMICONDUCTOR
描述:

Silicon P-Channel MOS FET
硅P沟道MOS场效应管

晶体 晶体管 功率场效应晶体管 开关 脉冲
文件: 总10页 (文件大小:50K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
2SJ387(L), 2SJ387(S)  
Silicon P-Channel MOS FET  
Application  
High speed power switching  
Features  
Low on-resistance  
Low drive current  
2.5 V Gate drive device can be driven from 3 V Source  
Suitable for Switching regulator, DC - DC converter  
Outline  
DPAK-2  
4
4
1
2
3
1
2
3
D
1. Gate  
G
2. Drain  
3. Source  
4. Drain  
S
2SJ387(L), 2SJ387(S)  
Absolute Maximum Ratings (Ta = 25°C)  
Item  
Symbol  
VDSS  
Ratings  
–20  
Unit  
V
Drain to source voltage  
Gate to source voltage  
Drain current  
VGSS  
±10  
V
ID  
–10  
A
1
Drain peak current  
ID(pulse)  
*
–40  
A
Body to drain diode reverse drain current  
Channel dissipation  
Channel temperature  
Storage temperature  
IDR  
–10  
A
Pch*2  
Tch  
20  
W
°C  
°C  
150  
Tstg  
–55 to +150  
Notes: 1. PW 10 µs, duty cycle 1 %  
2. Value at Tc = 25°C  
2
2SJ387(L), 2SJ387(S)  
Electrical Characteristics (Ta = 25°C)  
Item  
Symbol Min  
Typ  
Max  
Unit  
Test conditions  
Drain to source breakdown  
voltage  
V(BR)DSS  
V(BR)GSS  
IGSS  
–20  
V
ID = –10 mA, VGS = 0  
Gate to source breakdown  
voltage  
±10  
V
IG = ±200 µA, VDS = 0  
Gate to source leak current  
±10  
µA  
µA  
V
VGS = ±6.5 V, VDS = 0  
VDS = –16 V, VGS = 0  
ID = –1 mA, VDS = –10 V  
ID = –5 A  
Zero gate voltage drain current IDSS  
–100  
–1.5  
0.07  
Gate to source cutoff voltage  
VGS(off)  
–0.5  
Static drain to source on state RDS(on)  
resistance  
0.05  
V
GS = –4 V*1  
ID = –5 A  
GS = –2.5 V*1  
ID = –5 A  
DS = –10 V*1  
7
0.07  
12  
0.1  
V
Forward transfer admittance  
|yfs|  
S
V
Input capacitance  
Output capacitance  
Ciss  
1170  
860  
310  
20  
pF  
pF  
pF  
ns  
ns  
ns  
ns  
V
VDS = –10 V  
VGS = 0  
Coss  
Reverse transfer capacitance Crss  
f = 1 MHz  
ID = –5 A  
VGS = –4 V  
RL = 2 Ω  
Turn-on delay time  
Rise time  
td(on)  
tr  
td(off)  
tf  
325  
350  
425  
–1.0  
Turn-off delay time  
Fall time  
Body to drain diode forward  
voltage  
VDF  
IF = –10 A, VGS = 0  
Body to drain diode reverse  
recovery time  
trr  
240  
ns  
IF = –10 A, VGS = 0,  
diF/dt = 20 A/µs  
Note: 1. Pulse Test  
3
2SJ387(L), 2SJ387(S)  
Power vs. Temperature Derating  
Maximum Safe Operation Area  
40  
30  
20  
10  
–100  
10 µs  
–30  
–10  
100 µs  
–3  
–1  
Operation in  
this area is  
limited by R  
DS(on)  
–0.3  
–0.1  
Ta = 25 °C  
0
50  
100  
150  
200  
–0.5 –1  
–2  
–5 –10 –20  
–50  
Drain to Source Voltage  
V
(V)  
DS  
Case Temperature Tc (°C)  
Typical Output Characteristics  
Typical Transfer Characteristics  
= –10 V  
–20  
–16  
–12  
–8  
–10  
–8  
–6  
–4  
–2  
–10 V  
Pulse Test  
–2.5 V  
V
DS  
Pulse Test  
–5 V  
–4 V  
–2 V  
Tc = –25 °C  
–4  
V
GS  
= –1.5 V  
25 °C  
75 °C  
0
–2  
–4  
–6  
–8  
–10  
0
–1  
–2  
–3  
–4  
(V)  
GS  
–5  
Drain to Source Voltage  
V
(V)  
Gate to Source Voltage  
V
DS  
4
2SJ387(L), 2SJ387(S)  
Static Drain to Source on State Resistance  
Drain to Source Saturation Voltage vs.  
Gate to Source Voltage  
vs. Drain Current  
1
–0.5  
–0.4  
–0.3  
–0.2  
–0.1  
Pulse Test  
Pulse Test  
0.5  
0.2  
0.1  
V
GS  
= –2.5 V  
–4 V  
I
= –5 A  
D
0.05  
–2 A  
–1 A  
0.02  
0.01  
–0.5 –1 –2  
–5 –10 –20  
(A)  
–50  
0
–2  
–4  
–6  
–8  
–10  
(V)  
Gate to Source Voltage  
V
Drain Current  
I
GS  
D
Forward Transfer Admittance vs.  
Drain Current  
Static Drain to Source on State Resistance  
vs. Temperature  
50  
0.2  
Pulse Test  
20  
10  
5
0.16  
0.12  
0.08  
0.04  
Tc = –25 °C  
25 °C  
I
= –5 A  
D
75 °C  
V
= –2.5 V  
GS  
–1, –2 A  
2
–5 A  
–2 A  
–1 A  
1
–4 V  
40  
V
= –10 V  
DS  
Pulse Test  
0.5  
0
–40  
–0.1 –0.2  
–0.5 –1 –2 –5 –10  
0
80  
120  
160  
Drain Current I  
(A)  
D
Case Temperature Tc (°C)  
5
2SJ387(L), 2SJ387(S)  
Typical Capacitance vs.  
Drain to Source Voltage  
Body to Drain Diode Reverse  
Recovery Time  
10000  
5000  
1000  
500  
2000  
1000  
200  
100  
Ciss  
Coss  
500  
50  
Crss  
200  
100  
20  
10  
V
= 0  
GS  
di / dt = 20 A / µs  
f = 1 MHz  
V
GS  
= 0, Ta = 25 °C  
0
–10  
–20  
–30  
–40 –50  
–0.1 –0.3  
–1  
–3  
–10 –30 –100  
Reverse Drain Current  
I
(A)  
Drain to Source Voltage V  
(V)  
DR  
DS  
Switching Characteristics  
Dynamic Input Characteristics  
1000  
500  
0
–10  
–20  
–30  
0
t
d(off)  
V
= –5 V  
–10 V  
–15 V  
DD  
t
f
–4  
–8  
–12  
200  
100  
50  
V
V
DD  
= –5 V  
–10 V  
–15 V  
DS  
t
r
V
GS  
V
= –4 V, V  
= –10 V  
DD  
GS  
PW = 5 µs, duty < 1 %  
–40  
–50  
–16  
–20  
20  
10  
t
d(on)  
I
= –10 A  
D
–0.1 –0.3  
–1  
–3  
–10 –30 –100  
(A)  
0
80  
20  
40  
60  
100  
Drain Current  
I
Gate Charge Qg (nc)  
D
6
2SJ387(L), 2SJ387(S)  
Reverse Drain Current vs.  
Source to Drain Voltage  
–20  
–16  
–12  
–8  
Pulse Test  
–5 V  
–3 V  
V
= 0, 5 V  
GS  
–4  
0
–0.4 –0.8  
–1.2 –1.6  
–2.0  
(V)  
Source to Drain Voltage  
V
SD  
Normalized Transient Thermal Impedance vs. Pulse Width  
3
1
Tc = 25°C  
D = 1  
0.5  
0.3  
0.1  
θ
θ
γ
θ
ch – c(t) = s (t) • ch – c  
ch – c = 6.25 °C/W, Tc = 25 °C  
PW  
T
P
DM  
D =  
0.03  
0.01  
PW  
T
10 µ  
100 µ  
1 m  
10 m  
100 m  
1
10  
Pulse Width PW (S)  
7
2SJ387(L), 2SJ387(S)  
Switching Time Test Circuit  
Waveforms  
Vout  
Monitor  
Vin Monitor  
D.U.T.  
Vin  
10%  
R
L
90%  
90%  
V
DD  
Vin  
–4 V  
90%  
10%  
50Ω  
= –10 V  
10%  
Vout  
td(off)  
td(on)  
t
f
tr  
8
Unit: mm  
6.5 ± 0.5  
5.4 ± 0.5  
2.3 ± 0.2  
0.55 ± 0.1  
1.15 ± 0.1  
0.8 ± 0.1  
(0.7)  
1.2 ± 0.3  
0.55 ± 0.1  
0.55 ± 0.1  
2.29 ± 0.5  
2.29 ± 0.5  
Hitachi Code  
DPAK (L)-(2)  
JEDEC  
EIAJ  
Weight (reference value) 0.42 g  
Cautions  
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,  
copyright, trademark, or other intellectual property rights for information contained in this document.  
Hitachi bears no responsibility for problems that may arise with third party’s rights, including  
intellectual property rights, in connection with use of the information contained in this document.  
2. Products and product specifications may be subject to change without notice. Confirm that you have  
received the latest product standards or specifications before final design, purchase or use.  
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,  
contact Hitachi’s sales office before using the product in an application that demands especially high  
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk  
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,  
traffic, safety equipment or medical equipment for life support.  
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly  
for maximum rating, operating supply voltage range, heat radiation characteristics, installation  
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used  
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable  
failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-  
safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other  
consequential damage due to operation of the Hitachi product.  
5. This product is not designed to be radiation resistant.  
6. No one is permitted to reproduce or duplicate, in any form, the whole or part of this document without  
written approval from Hitachi.  
7. Contact Hitachi’s sales office for any questions regarding this document or Hitachi semiconductor  
products.  
Hitachi, Ltd.  
Semiconductor & Integrated Circuits.  
Nippon Bldg., 2-6-2, Ohte-machi, Chiyoda-ku, Tokyo 100-0004, Japan  
Tel: Tokyo (03) 3270-2111 Fax: (03) 3270-5109  
URL  
NorthAmerica  
Europe  
: http:semiconductor.hitachi.com/  
: http://www.hitachi-eu.com/hel/ecg  
Asia (Singapore)  
Asia (Taiwan)  
: http://www.has.hitachi.com.sg/grp3/sicd/index.htm  
: http://www.hitachi.com.tw/E/Product/SICD_Frame.htm  
Asia (HongKong) : http://www.hitachi.com.hk/eng/bo/grp3/index.htm  
Japan  
: http://www.hitachi.co.jp/Sicd/indx.htm  
For further information write to:  
Hitachi Semiconductor  
(America) Inc.  
Hitachi Europe GmbH  
Hitachi Asia (Hong Kong) Ltd.  
Group III (Electronic Components)  
7/F., North Tower, World Finance Centre,  
Harbour City, Canton Road, Tsim Sha Tsui,  
Kowloon, Hong Kong  
Tel: <852> (2) 735 9218  
Fax: <852> (2) 730 0281  
Hitachi Asia Pte. Ltd.  
16 Collyer Quay #20-00  
Hitachi Tower  
Singapore 049318  
Tel: 535-2100  
Electronic components Group  
Dornacher Stra§e 3  
D-85622 Feldkirchen, Munich  
Germany  
Tel: <49> (89) 9 9180-0  
Fax: <49> (89) 9 29 30 00  
179 East Tasman Drive,  
San Jose,CA 95134  
Tel: <1> (408) 433-1990  
Fax: <1>(408) 433-0223  
Fax: 535-1533  
Hitachi Asia Ltd.  
Taipei Branch Office  
3F, Hung Kuo Building. No.167,  
Tun-Hwa North Road, Taipei (105)  
Tel: <886> (2) 2718-3666  
Fax: <886> (2) 2718-8180  
Telex: 40815 HITEC HX  
Hitachi Europe Ltd.  
Electronic Components Group.  
Whitebrook Park  
Lower Cookham Road  
Maidenhead  
Berkshire SL6 8YA, United Kingdom  
Tel: <44> (1628) 585000  
Fax: <44> (1628) 778322  
Copyright ' Hitachi, Ltd., 1999. All rights reserved. Printed in Japan.  

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