MRF284 [FREESCALE]

RF Power Field Effect Transistors; 射频功率场效应晶体管
MRF284
型号: MRF284
厂家: Freescale    Freescale
描述:

RF Power Field Effect Transistors
射频功率场效应晶体管

晶体 晶体管 功率场效应晶体管 射频
文件: 总12页 (文件大小:376K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
Document Number: MRF284  
Rev. 17, 5/2006  
Freescale Semiconductor  
Technical Data  
RF Power Field Effect Transistors  
MRF284LR1  
N-Channel Enhancement-Mode Lateral MOSFETs  
MRF284LSR1  
Designed for PCN and PCS base station applications with frequencies from  
1000 to 2600 MHz. Suitable for FM, TDMA, CDMA, and multicarrier amplifier  
applications. To be used in Class A and Class AB for PCN-PCS/cellular radio  
and wireless local loop.  
2000 MHz, 30 W, 26 V  
LATERAL N-CHANNEL  
BROADBAND  
Specified Two-Tone Performance @ 2000 MHz, 26 Volts  
Output Power = 30 Watts PEP  
Power Gain = 9 dB  
RF POWER MOSFETs  
Efficiency = 30%  
Intermodulation Distortion = -29 dBc  
Typical Single-Tone Performance at 2000 MHz, 26 Volts  
Output Power = 30 Watts CW  
Power Gain = 9.5 dB  
Efficiency = 45%  
CASE 360B-05, STYLE 1  
NI-360  
Capable of Handling 10:1 VSWR, @ 26 Vdc, 2000 MHz, 30 Watts CW  
Output Power  
MRF284LR1  
Features  
Excellent Thermal Stability  
Characterized with Series Equivalent Large-Signal Impedance Parameters  
Low Gold Plating Thickness on Leads. L Suffix Indicates 40μ″ Nominal.  
RoHS Compliant  
CASE 360C-05, STYLE 1  
NI-360S  
In Tape and Reel. R1 Suffix = 500 Units per 32 mm, 13 inch Reel.  
MRF284LSR1  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
-0.5, +65  
20  
Unit  
Vdc  
Vdc  
Drain-Source Voltage  
Gate-Source Voltage  
V
DSS  
V
GS  
Total Device Dissipation @ T = 25°C  
Derate above 25°C  
P
87.5  
0.5  
W
W/°C  
C
D
Storage Temperature Range  
Case Operating Temperature  
Operating Junction Temperature  
T
- 65 to +150  
150  
°C  
°C  
°C  
stg  
T
C
T
200  
J
Table 2. Thermal Characteristics  
Characteristic  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
R
θ
JC  
2.0  
°C/W  
Table 3. Electrical Characteristics (T = 25°C unless otherwise noted)  
C
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
Off Characteristics  
Drain-Source Breakdown Voltage  
(V = 0, I = 10 μAdc)  
V
65  
1.0  
10  
Vdc  
(BR)DSS  
GS  
D
Zero Gate Voltage Drain Current  
(V = 20 Vdc, V = 0)  
I
μAdc  
DSS  
DS  
GS  
Gate-Source Leakage Current  
(V = 20 Vdc, V = 0)  
I
μAdc  
GSS  
GS  
DS  
(continued)  
NOTE - CAUTION - MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and  
packaging MOS devices should be observed.  
© Freescale Semiconductor, Inc., 2006. All rights reserved.  
Table 3. Electrical Characteristics (T = 25°C unless otherwise noted) (continued)  
C
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
On Characteristics  
Gate Threshold Voltage  
V
2.0  
3.0  
3.0  
4.0  
0.3  
1.5  
4.0  
5.0  
0.6  
Vdc  
Vdc  
Vdc  
S
GS(th)  
(V = 10 Vdc, I = 150 μAdc)  
DS  
D
Gate Quiescent Voltage  
(V = 26 Vdc, I = 200 mAdc)  
V
GS(q)  
DS  
D
Drain-Source On-Voltage  
(V = 10 Vdc, I = 1.0 Adc)  
V
DS(on)  
GS  
D
Forward Transconductance  
(V = 10 Vdc, I = 1.0 Adc)  
g
fs  
DS  
D
Dynamic Characteristics  
Input Capacitance  
(V = 26 Vdc, V = 0, f = 1.0 MHz)  
DS  
C
43  
23  
pF  
pF  
pF  
iss  
GS  
Output Capacitance  
(V = 26 Vdc, V = 0, f = 1.0 MHz)  
C
oss  
DS  
GS  
Reverse Transfer Capacitance  
(V = 26 Vdc, V = 0, f = 1.0 MHz)  
C
rss  
1.4  
DS  
GS  
Functional Tests (in Freescale Test Fixture, 50 ohm system)  
Common-Source Power Gain  
G
9
30  
9
10.5  
35  
-29  
-9  
-9  
dB  
%
ps  
(V = 26 Vdc, P = 30 W, I = 200 mA,  
DD  
out  
DQ  
f1 = 2000.0 MHz, f2 = 2000.1 MHz)  
Drain Efficiency  
η
(V = 26 Vdc, P = 30 W, I = 200 mA,  
DD  
out  
DQ  
f1 = 2000.0 MHz, f2 = 2000.1 MHz)  
Intermodulation Distortion  
IMD  
IRL  
-32  
-15  
10.4  
35  
dBc  
dB  
dB  
%
(V = 26 Vdc, P = 30 W, I = 200 mA,  
DD  
out  
DQ  
f1 = 2000.0 MHz, f2 = 2000.1 MHz)  
Input Return Loss  
(V = 26 Vdc, P = 30 W, I = 200 mA,  
DD  
out  
DQ  
f1 = 2000.0 MHz, f2 = 2000.1 MHz)  
Common-Source Amplifier Power Gain  
G
ps  
(V = 26 Vdc, P = 30 W PEP, I = 200 mA,  
DD  
out  
DQ  
f1 = 1930.0 MHz, f2 = 1930.1 MHz)  
Drain Efficiency  
η
8.5  
35  
(V = 26 Vdc, P = 30 W PEP, I = 200 mA,  
DD  
out  
DQ  
f1 = 1930.0 MHz, f2 = 1930.1 MHz)  
Intermodulation Distortion  
IMD  
IRL  
-34  
-15  
9.5  
45  
dBc  
dB  
dB  
%
(V = 26 Vdc, P = 30 W PEP, I = 200 mA,  
DD  
out  
DQ  
f1 = 1930.0 MHz, f2 = 1930.1 MHz)  
Input Return Loss  
(V = 26 Vdc, P = 30 W PEP, I = 200 mA,  
DD  
out  
DQ  
f1 = 1930.0 MHz, f2 = 1930.1 MHz)  
Common-Source Amplifier Power Gain  
G
ps  
(V = 26 Vdc, P = 30 W CW, I = 200 mA,  
DD  
out  
DQ  
f1 = 2000.0 MHz)  
Drain Efficiency  
η
(V = 26 Vdc, P = 30 W CW, I = 200 mA,  
DD  
out  
DQ  
f1 = 2000.0 MHz)  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
2
R1  
R2  
B1  
R3  
B2  
R6  
R7  
R5  
B3  
V
V
DD  
GG  
W1  
W2  
W3  
+
+
+
C6  
R4  
C7  
C4  
C15  
C13  
C12  
C14  
C3  
C17  
C18  
L2  
L3  
L1  
RF  
OUTPUT  
C10  
Z11 Z12  
Z10  
Z13  
C11  
Z14 Z15  
Z16  
Z17  
RF  
INPUT  
C9  
Z9  
DUT  
C16  
Z1  
Z2  
Z3  
Z4  
Z5  
Z6  
Z7  
Z8  
C5  
C8  
C1  
C2  
Z1  
0.530x 0.080Microstrip  
0.255x 0.080Microstrip  
0.600x 0.080Microstrip  
0.525x 0.080Microstrip  
0.015x 0.325Microstrip  
0.085x 0.325Microstrip  
0.165x 0.325Microstrip  
0.110x 0.515Microstrip  
0.095x 0.515Microstrip  
0.050x 0.515Microstrip  
Z11  
Z12  
Z13  
Z14  
Z15  
Z16  
Z17  
PCB  
0.155x 0.515Microstrip  
0.120x 0.325Microstrip  
0.150x 0.325Microstrip  
0.010x 0.325Microstrip  
0.505x 0.080Microstrip  
0.865x 0.080Microstrip  
0.525x 0.080Microstrip  
Z2  
Z3  
Z4  
Z5  
Z6  
Z7  
Z8  
Z9  
Arlon GX0300-55-22, 0.030,  
ε = 2.55  
r
Z10  
Figure 1. 1930-2000 MHz Broadband Test Circuit Schematic  
Table 4. 1930-2000 MHz Broadband Test Circuit Component Designations and Values  
Designators  
Description  
Ferrite Beads, Round, Ferroxcube #56-590-65-3B  
0.8-8.0 pF Gigatrim Variable Capacitors, Johanson #27291SL  
B1 - B3  
C1, C2, C8  
C3, C17  
C4, C14  
C5  
22 mF, 35 V Tantalum Surface Mount Chip Capacitors, Kemet #T491X226K035AS4394  
0.1 mF Chip Capacitors, Kemet #CDR33BX104AKWS  
220 pF Chip Capacitor, ATC #100B221KP500X  
C6, C12  
C7, C13  
C9  
1000 pF Chip Capacitors, ATC #100B102JCA50X  
5.1 pF Chip Capacitors, ATC #100B5R1CCA500X  
1.2 pF Chip Capacitor, ATC #100B1R2CCA500X  
C10  
2.7 pF Chip Capacitor, ATC #100B2R7CCA500X  
C11  
0.6-4.5 pF Gigatrim Variable Capacitors, Johanson #27271SL  
200 pF Chip Capacitors, ATC #100B201KP500X  
C15, C16  
C18  
10 mF, 35 V Tantalum Surface Mount Chip Capacitor, Kemet #T495X106K035AS4394  
4 Turns, #24 AWG, 0.120OD, 0.140Long, (12.5 nH), Coilcraft #A04T-5  
2 Turns, #24 AWG, 0.120OD, 0.140Long, (5.0 nH), Coilcraft #A02T-5  
12 Ω, 1/4 W Chip Resistors, 0.08x 0.13, Garrett Instruments #RM73B2B120JT  
560 kΩ, 1/4 W Chip Resistor, 0.08x 0.13″  
L1, L2  
L3  
R1, R2, R3, R5, R6, R7  
R4  
W1, W2, W3  
WS1, WS2  
Solid Copper Buss Wire, 16 AWG  
Beryllium Copper Wear Blocks 0.005x 0.250x 0.250″  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
3
C6  
R3  
C12  
C14  
R6  
C4  
R2  
R1  
W3  
R7  
W2  
B3  
C17  
C18  
W1  
B1  
R4  
B2  
R5  
C3  
C7  
L1  
C13  
C15  
L3  
C10  
WS2  
C9  
C5  
C16  
L2  
WS1  
C11  
C2  
C1  
C8  
MRF284  
Rev-0  
Freescale has begun the transition of marking Printed Circuit Boards (PCBs) with the Freescale Semiconductor  
signature/logo. PCBs may have either Motorola or Freescale markings during the transition period. These changes will have  
no impact on form, fit or function of the current product.  
Figure 2. 1930-2000 MHz Broadband Test Circuit Component Layout  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
4
V
SUPPLY  
+
R1  
P1  
C1  
R3  
V
DD  
B3  
R9  
B4  
B5  
V
DD  
B1  
R7  
B2  
R8  
+
Q1  
R4  
R10  
R11  
+
C11 C13  
C10  
C15 C16  
R6  
R5  
C9 C7  
C2 C4  
R2  
C8  
Q2  
L4  
RF  
OUTPUT  
L1  
L3  
Z10 Z11  
Z12  
Z13 Z14  
Z15  
Z16  
RF  
INPUT  
DUT  
C14  
Z1  
Z2  
Z3  
Z4 Z5  
Z6  
Z7  
Z8  
Z9  
C12  
C17  
C3  
L2  
C5  
C6  
Z1  
Z2  
Z3  
Z4  
Z5  
Z6  
Z7  
Z8  
Z9  
0.363x 0.080Microstrip  
0.080x 0.080Microstrip  
0.916x 0.080Microstrip  
0.517x 0.080Microstrip  
0.050x 0.325Microstrip  
0.050x 0.325Microstrip  
0.071x 0.325Microstrip  
0.125x 0.325Microstrip  
0.210x 0.515Microstrip  
Z10  
Z11  
Z12  
Z13  
Z14  
Z15  
Z16  
PCB  
0.210x 0.515Microstrip  
0.235x 0.325Microstrip  
0.02x 0.325Microstrip  
0.02x 0.325Microstrip  
0.510x 0.080Microstrip  
0.990x 0.080Microstrip  
0.390x 0.080Microstrip  
Arlon GX0300-55-22, 0.030,  
ε = 2.55  
r
Figure 3. 2000 MHz Class A Test Circuit Schematic  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
5
Table 5. 2000 MHz Class A Test Circuit Component Designations and Values  
Designators  
Description  
B1 - B5  
C1, C9, C16  
C2, C13  
C3, C14  
C4, C11  
C5  
Ferrite Beads, Round, Ferroxcube # 56-590-65-3B  
100 μF, 50 V Electrolytic Capacitors, Mallory #SME50VB101M12X25L  
51 pF Chip Capacitors, ATC #100B510JCA500x  
10 pF Chip Capacitors, ATC #100B100JCA500X  
12 pF Chip Capacitors, ATC #100B120JCA500X  
0.8 - 8.0 pF Variable Capacitor, Johansen Gigatrim #27291SL  
4.7 pF Chip Capacitor, ATC #100B4R7CCA500X  
C6  
C7, C15  
C8  
91 pF Chip Capacitors, ATC #100B910KP500X  
1000 pF Chip Capacitor, ATC #100B102JCA50X  
C10  
0.1 μF Chip Capacitor, Kemet #CDR33BX104AKWS  
C12, C17  
L1  
0.6 - 4.5 pF Variable Capacitors, Johansen Gigatrim #27271SL  
4 Turns, #27 AWG, 0.087OD, 0.050ID, 0.069Long, 10 nH  
5 Turns, #24 AWG, 0.083OD, 0.040ID, 0.128Long, 12.5 nH  
9 Turns, #26 AWG, 0.080OD, 0.046ID, 0.170Long, 30.8 nH  
1000 Ω Potentiometer, 1/2 W, 10 Turns, Bourns  
L2  
L3, L4  
P1  
Q1  
Transistor, NPN, #MJD31, Case 369A-10  
Q2  
Transistor, PNP, #MJD32, Case 369A-10  
R1  
360 Ω, Fixed Film Chip Resistor, 0.08x 0.13, Garrett Instruments #RM73B2B361JT  
2 x 12 kΩ, Fixed Film Chip Resistor, 0.08x 0.13, Garrett Instruments #RM73B2B122JT  
1 Ω, Wirewound, 5 W, 3% Resistor, Dale # RE60G1R00  
R2  
R3  
R4  
4 x 6.8 kΩ, Fixed Film Chip Resistor, 0.08x 0.13, Garrett Instruments #RM73B2B682JT  
2 x 1500 Ω, Fixed Film Chip Resistor, 0.08x 0.13, Garrett Instruments #RM73B2B152JT  
270 Ω, Fixed Film Chip Resistor, 0.08x 0.13, Garrett Instruments #RM73B2B271JT  
12 Ω, Fixed Film Chip Resistors, 0.08x 0.13, Garrett Instruments #RM73B2B120JT  
R5  
R6  
R7 - R11  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
6
TYPICAL CHARACTERISTICS  
14  
13  
12  
11  
10  
9
40  
35  
30  
25  
20  
15  
10  
5
45  
40  
35  
30  
25  
20  
15  
10  
P
4 W  
3 W  
out  
2 W  
G
ps  
P
= 1 W  
in  
8
V
I
= 26 Vdc  
= 200 mA  
V
I
= 26 Vdc  
DD  
= 200 mA  
DD  
7
DQ  
DQ  
f = 2000 MHz Single Tone  
1.5 2.0 2.5  
P , INPUT POWER (WATTS)  
Single Tone  
6
4.0  
0
0
0.5  
1.0  
3.0  
3.5  
1800 1820 1840 1860 1880 1900 1920 1940 1960 1980 2000  
f, FREQUENCY (MHz)  
in  
Figure 4. Output Power & Power Gain  
versus Input Power  
Figure 5. Output Power versus Frequency  
12  
−10  
−ꢀ20  
−ꢀ30  
−ꢀ40  
−ꢀ50  
−ꢀ60  
−ꢀ70  
−ꢀ80  
V
= 26 Vdc  
= 200 mA  
DD  
I
DQ  
f = 2000.0 MHz  
−15  
−20  
11  
10  
1
G
ps  
f = 2000.1 MHz  
2
3rd Order  
5th Order  
−25  
−30  
9
8
7
6
P
= 30 W (PEP)  
= 200 mA  
out  
7th Order  
I
DQ  
IMD −35  
f1 = 2000.0 MHz  
f2 = 2000.1 MHz  
−40  
28  
0.1  
1.0  
10  
16  
18  
20  
V , DRAIN SUPPLY VOLTAGE (Vdc)  
DD  
22  
24  
26  
P
, OUTPUT POWER (WATTS) PEP  
out  
Figure 6. Intermodulation Distortion Products  
versus Output Power  
Figure 7. Power Gain and Intermodulation  
Distortion versus Supply Voltage  
−ꢀ20  
−ꢀ30  
−ꢀ40  
−ꢀ50  
−ꢀ60  
13  
V
= 26 Vdc  
f = 2000.0 MHz  
I
= 400 mA  
DD  
DQ  
1
f = 2000.1 MHz  
300 mA  
2
12  
11  
10  
9
100 mA  
300 mA  
200 mA  
200 mA  
V
= 26 Vdc  
f = 2000.0 MHz  
100 mA  
DD  
I
= 400 mA  
DQ  
1
f = 2000.1 MHz  
2
8
0.1  
0.1  
1.0  
10  
1.0  
10  
P
, OUTPUT POWER (WATTS) PEP  
P , OUTPUT POWER (WATTS) PEP  
out  
out  
Figure 8. Intermodulation Distortion  
versus Output Power  
Figure 9. Power Gain versus Output Power  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
7
TYPICAL CHARACTERISTICS  
3
2
100  
T
= 75°C  
flange  
C
iss  
T
= 100°C  
flange  
C
oss  
10  
1
0
T = 175°C  
C
J
rss  
1
0
4
8
12  
16  
20  
24  
28  
0
4
8
12  
V , DRAIN SOURCE VOLTAGE (VOLTS)  
DS  
16  
20  
24  
28  
V
, DRAIN SUPPLY VOLTAGE (Vdc)  
DD  
Figure 10. DC Safe Operating Area  
Figure 11. Capacitance versus  
Drain Source Voltage  
60  
50  
40  
30  
11  
10  
9
45  
G
ps  
40  
FUNDAMENTAL  
35  
20  
10  
η
V
= 26 Vdc  
DD  
out  
8
30  
0
P
= 30 W (PEP), I = 200 mA  
DQ  
−10  
−ꢁ20  
−ꢁ30  
−ꢀ40  
−ꢀ50  
−ꢁ60  
−70  
−ꢁ80  
−ꢁ90  
3rd Order  
Two−Tone  
Frequency Delta = 100 kHz  
3.0  
2.0  
7
−32  
6
IMD  
V
= 26 Vdc  
= 1.8 Adc  
5
−36  
−40  
DD  
I
DQ  
f = 2000.0 MHz  
4
3
1
VSWR  
f = 2000.1 MHz  
2
1.0  
0
5
10 15 20 25 30 35 40 45 50 55 60  
P , INPUT POWER (dBm)  
1920  
1940  
1960  
1980  
2000  
f, FREQUENCY (MHz)  
in  
Figure 12. Class A Third Order Intercept Point  
Figure 13. 1920-2000 MHz Broadband Circuit Performance  
1.E+10  
1.E+09  
1.E+08  
1.E+07  
1.E+06  
1.E+05  
1.E+04  
0
50  
100  
150  
200  
250  
T , JUNCTION TEMPERATURE (°C)  
J
2
This graph displays calculated MTTF in hours x ampere drain current.  
Life tests at elevated temperature have correlated to better than 10%  
2
of the theoretical prediction for metal failure. Divide MTTF factor by I  
for MTTF in a particular application.  
D
Figure 14. MTTF Factor versus Junction Temperature  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
8
1800 MHz  
1800 MHz  
Z
load  
f = 2000 MHz  
Z
source  
Z = 5 Ω  
o
f = 2000 MHz  
V
= 26 V, I = 200 mA, P = 15 W Avg.  
DQ out  
CC  
f
Z
Z
load  
source  
MHz  
Ω
Ω
1800  
1860  
1900  
1960  
2000  
1.0 - j0.4  
1.0 - j0.8  
1.0 - j1.1  
1.0 - j1.4  
1.0 - j2.3  
2.1 + j0.4  
2.2 - j0.2  
2.3 - j0.5  
2.5 - j0.9  
2.6 - j0.92  
Z
Z
=
Test circuit impedance as measured from  
gate to ground.  
source  
=
Test circuit impedance as measured  
from drain to ground.  
load  
Output  
Matching  
Network  
Device  
Under Test  
Input  
Matching  
Network  
Z
Z
source  
load  
Figure 15. Series Equivalent Source and Load Impedence  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
9
NOTES  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
10  
PACKAGE DIMENSIONS  
2X  
Q
M
M
M
B
NOTES:  
1. INTERPRET DIMENSIONS AND TOLERANCES  
PER ASME Y14.5M−1994.  
G
1
aaa  
T A  
B
2. CONTROLLING DIMENSION: INCH.  
3. DIMENSION H IS MEASURED 0.030 (0.762) AWAY  
FROM PACKAGE BODY.  
3
INCHES  
DIM MIN MAX  
MILLIMETERS  
B
MIN  
20.19  
5.72  
3.18  
5.33  
1.40  
0.10  
MAX  
20.45  
5.97  
4.45  
5.59  
1.65  
0.15  
2
(FLANGE)  
A
B
0.795  
0.225  
0.125  
0.210  
0.055  
0.004  
0.805  
0.235  
0.175  
0.220  
0.065  
0.006  
2X K  
2X D  
bbb  
C
M
M
M
T A  
B
R
D
(LID)  
E
F
M
M
M
B
ccc  
T A  
G
0.562 BSC  
14.28 BSC  
H
0.077  
0.220  
0.355  
0.357  
0.125  
0.227  
0.225  
0.087  
0.250  
0.365  
0.363  
0.135  
0.233  
0.235  
1.96  
5.59  
9.02  
9.07  
3.18  
5.77  
5.72  
2.21  
6.35  
9.27  
9.22  
3.43  
5.92  
5.97  
F
K
H
M
M
M
B
M
ccc  
T A  
N
N
(LID)  
Q
C
E
R
S
aaa  
bbb  
ccc  
0.005 REF  
0.010 REF  
0.015 REF  
0.13 REF  
0.25 REF  
0.38 REF  
S
(INSULATOR)  
M
M
M
B
aaa  
T A  
SEATING  
PLANE  
T
STYLE 1:  
PIN 1. DRAIN  
2. GATE  
3. SOURCE  
M
M
M
B
bbb  
T A  
M
(INSULATOR)  
CASE 360B-05  
ISSUE G  
A
A
NI-360  
MRF284LR1  
A
A
(FLANGE)  
B
B
1
2
NOTES:  
1. INTERPRET DIMENSIONS AND TOLERANCES  
PER ASME Y14.5M−1994.  
2. CONTROLLING DIMENSION: INCH.  
3. DIMENSION H IS MEASURED 0.030 (0.762) AWAY  
FROM PACKAGE BODY.  
2X K  
(FLANGE)  
2X D  
M
M
M
bbb  
T A  
B
INCHES  
DIM MIN MAX  
MILLIMETERS  
R
MIN  
9.53  
5.72  
2.67  
5.33  
0.89  
0.10  
1.45  
2.16  
9.02  
9.07  
5.77  
5.72  
MAX  
9.78  
5.97  
3.94  
5.59  
1.14  
0.15  
1.70  
2.92  
9.27  
9.22  
5.92  
5.97  
(LID)  
A
B
0.375  
0.225  
0.105  
0.210  
0.035  
0.004  
0.057  
0.085  
0.355  
0.357  
0.227  
0.225  
0.385  
0.235  
0.155  
0.220  
0.045  
0.006  
0.067  
0.115  
0.365  
0.363  
0.23  
M
M
M
ccc  
T A  
B
C
N
F
D
(LID)  
H
E
M
M
M
B
ccc  
T A  
F
H
K
E
M
N
C
S
R
(INSULATOR)  
S
0.235  
aaa  
bbb  
ccc  
0.005 REF  
0.010 REF  
0.015 REF  
0.13 REF  
0.25 REF  
0.38 REF  
M
M
M
B
aaa  
T A  
SEATING  
PLANE  
PIN 3  
T
M
(INSULATOR)  
STYLE 1:  
M
M
M
bbb  
T A  
B
PIN 1. DRAIN  
2. GATE  
3. SOURCE  
CASE 360C-05  
ISSUE E  
NI-360S  
MRF284LSR1  
MRF284LR1 MRF284LSR1  
RF Device Data  
Freescale Semiconductor  
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Document Number: MRF284  
Rev. 17, 5/2006  

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