FODM452V [FAIRCHILD]
5-Pin Mini Flat Package High Speed Transistor Optocoupler; 5引脚微型扁平封装高速晶体管光耦型号: | FODM452V |
厂家: | FAIRCHILD SEMICONDUCTOR |
描述: | 5-Pin Mini Flat Package High Speed Transistor Optocoupler |
文件: | 总11页 (文件大小:234K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
June 2007
FODM452, FODM453
tm
5-Pin Mini Flat Package High Speed Transistor
Optocoupler
Features
Description
■ Compact 5-pin mini flat package
■ High speed-1 MBit/s
The FODM452 and FODM453 optocouplers consist of
an AlGaAs LED optically coupled to a high speed photo-
detector transistor. The devices are housed in a compact
5-pin mini flat package for optimum mounting density.
The FODM453 features a high CMR rating for optimum
common mode transient immunity.
■ Superior CMR-15kV/µs at V
= 1500V (FODM453)
CM
■ Performance guaranteed over temperature (0–70°C)
■ U.L. recognized (File # E90700)
■ VDE0884 recognized (File # 136480)
– Ordering option V, e.g., FODM452V
Applications
■ Line receivers
■ Pulse transformer replacement
■ Output interface to CMOS-LSTTL-TTL
■ Wide bandwidth analog coupling
Package
Schematic
0.050 (1.27)
TYP
VCC
ANODE
1
6
5
0.181 (4.60)
0.165 (4.20)
VO
Pin 1
CATHODE
GND
3
4
0.169 (4.30)
0.153 (3.90)
0.008 (0.2)
TYP
0.094 (2.40)
0.079 (2.00)
0.287 (7.30)
0.248 (6.30)
0.008 (0.20)
0 (0.00)
0.020 (0.50)
0.011 (0.30)
Lead Coplanarity : 0.004 (0.10) MAX
Note:
All dimensions are in inches (millimeters).
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
Absolute Maximum Ratings (T = 25°C unless otherwise noted)
A
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameter
Value
Units
°C
T
Storage Temperature
Operating Temperature
-40 to +125
-40 to +85
STG
T
°C
OPR
EMITTER
I (avg)
DC/Average Forward Input Current
25
50
1.0
5
mA
mA
A
F
I (pk)
Peak Forward Input Current (50% duty cycle, 1ms P.W.)
Peak Transient Input Current (≤1µs P.W., 300pps)
Reverse Input Voltage
F
I (trans)
F
V
P
V
R
D
Input Power Dissipation
45
mW
(No derating required over specified operating temp range)
DETECTOR
I
(avg)
(pk)
Average Output Current
Peak Output Current
Supply Voltage
8
mA
mA
V
O
I
16
O
V
-0.5 to 30
-0.5 to 20
100
CC
V
Output Voltage
V
O
P
Output Power Dissipation
mW
D
(No derating required over specified operating temp range)
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
2
Electrical Characteristics (T = 0 to 70°C unless otherwise specified)
A
Individual Component Characteristics
Symbol
EMITTER
Parameter
Test Conditions
Min. Typ.* Max. Unit
V
Input Forward Voltage
I = 16mA, T = 25°C
1.60
1.7
1.8
V
F
F
A
I = 16mA
F
B
Input Reverse Breakdown Voltage
I
= 10µA
5.0
V
VR
R
∆V /∆T
Temperature Coefficient of
Forward Voltage
I = 16mA
-1.8
mV/°C
F
A
F
DETECTOR
I
Logic High Output Current
I = 0mA, V = V = 5.5V, T =25°C
.001
.001
0.5
1
µA
OH
F
O
CC
A
I = 0 mA, V = V = 15V, T =25°C
F
O
CC
A
I = 0mA, V = V = 15V
50
200
1
F
O
CC
I
Logic Low Supply Current
Logic high supply current
I = 16mA, V = Open, V = 15V
100
µA
µA
CCL
F
O
CC
I
I = 0 mA, V = Open, V = 15V,
0.05
CCH
F
O
CC
T = 25°C
A
I = 0mA, V = Open, V = 15V
2
F
O
CC
Transfer Characteristics
Symbol
COUPLED
CTR
Parameter
Test Conditions
Min. Typ.* Max Unit
(1)
Current Transfer Ratio
I = 16mA, V = 4.5V
T = 25°C V =0.4V
20
15
50
%
V
F
CC
A
OL
V
=0.5V
OL
V
Logic LOW Output
Voltage
I = 16mA, I = 3mA, V = 4.5V, T =2 5°C
0.4
0.5
OL
F
O
CC
A
I = 16mA, I = 2.4mA, V = 4.5 V
F
O
CC
Switching Characteristics (V = 5V)
CC
Symbol
Parameter
Test Conditions
Device Min. Typ.* Max. Unit
(2)
T
T
Propagation Delay
Time to Logic LOW
R = 1.9kΩ, I = 16mA, T = 25°C (Fig. 9)
0.40
0.8
1.0
0.8
1.0
µs
µs
PHL
PLH
L
F
A
(2)
R = 1.9kΩ, I = 16mA (Fig. 9)
L
F
(2)
Propagation Delay
Time to Logic HIGH
R = 1.9kΩ, I = 16mA, T = 25°C (Fig. 9)
0.35
µs
L
F
A
(2)
R = 1.9kΩ, I = 16mA (Fig. 9)
µs
L
F
|CM |
Common Mode
Transient Immunity
at Logic HIGH
I = 0mA, V
= 10V , R = 1.9kΩ,
FODM452
FODM453
5
15
40
KV/µs
H
F
CM
P-P
L
(3)
T = 25°C (Fig. 10)
A
I = 0mA, V
= 1500V , R = 1.9kΩ
15
KV/µs
KV/µs
KV/µs
MHz
F
CM
(3)
P-P
L
T = 25°C (Fig. 10)
A
|CM |
Common Mode
Transient Immunity
at Logic LOW
I = 16mA, V
= 10V , R = 1.9kΩ,
FODM452
FODM453
5
15
40
3
L
F
CM
P-P
L
(3)
T = 25°C (Fig. 10)
A
I = 16mA, V
= 1500V , R = 1.9kΩ,
15
F
CM
P-P
L
(3)
T = 25°C (Fig. 10)
A
BW
Bandwidth
R = 100Ω
L
Isolation Characteristics
Symbol Characteristics
Test Conditions
Min. Typ.* Max. Unit
(4)
V
Withstand Insulation Test Voltage
Capacitance (Input to Output)
RH ≤ 50%, T = 25°C, t = 1 min.
3750
V
RMS
ISO
A
(4)
C
f = 1MHz
0.2
pF
I-O
*All Typicals at T = 25°C
A
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
3
Notes:
1. Current Transfer Ratio is defined as a ratio of output collector current, I , to the forward LED input current, I ,
O
F
times 100%.
2. The 1.9kΩ load represents 1 TTL unit load of 1.6mA and 5.6kΩ pull-up resistor.
3. Common mode transient immunity in logic high level is the maximum tolerable (positive) dV /dt on the
cm
leading edge of the common mode pulse signal V , to assure that the output will remain in a logic high state
CM
(i.e., V > 2.0V). Common mode transient immunity in logic low level is the maximum tolerable (negative) dV /dt
O
cm
on the trailing edge of the common mode pulse signal, V , to assure that the output will remain in a logic low
CM
state (i.e., V < 0.8V).
O
4. Device is considered a two terminal device: Pins 1, and 3 are shorted together and Pins 4, 5, and 6 are shorted
together.
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
4
Typical Performance Curves
Fig. 1 Input Forward Current vs Forward Voltage
Fig. 2 Normalized Current Transfer Ratio vs. Input Current
100
10
1.20
1.15
1.10
1.05
1.00
0.95
0.90
V
V
= 0.4V
O
T
= 25°C
A
= 5V
CC
T
= 25°C
A
Normalized to IF = 16mA
1
0.1
0.01
0.001
1.1
1.2
1.3
1.4
1.5
1.6
1.7
1.8
1
10
VF – FORWARD CURRENT (mA)
I
– INPUT CURRENT (mA)
F
Fig. 3 Normalized Current Transfer Ratio
vs. Ambient Temperature
Fig. 4 Logic High Output Current
vs. Ambient Temperature
1.6
1.4
1.2
1.0
0.8
0.6
0.4
0.2
0.0
IF = 16mA
V
= V
= 0V
= 5V
O
CC
V
V
= 0.4V
O
I
F
= 5V
CC
Normalized to T = 25°C
A
10
1
0.1
-40
-20
0
20
40
60
80
100
-40
-20
0
20
40
60
80
100
T
– TEMPERATURE (°C)
T
A
– AMBIENT TEMPERATURE
A
Fig. 5 DC and Pulsed Transfer Characteristics
Fig. 6 Propagation Delay vs. Load Resistance
10
14
12
T
V
= 25°C
A
T
V
= 25°C
= 5V
A
CC
= 5V
CC
I
I
= 16mA
= 10mA
F
F
I
F
= 40mA
10
8
35mA
30mA
t
PLH
25mA
20mA
1
6
4
15mA
t
PHL
10mA
5mA
2
0
0.1
0
2
4
6
8
10
12
14
16
1
2
3
4
5
6
7
8
9 10
V
O
– OUTPUT VOLTAGE (V)
R
– LOAD RESISTANCE (kΩ)
L
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
5
Typical Performance Curves (Continued)
Fig. 8 Frequency Response
Fig. 7 Propagation Delay vs. Ambient Temperature
1400
5
0
I
V
T
= 16mA
= 5V
I
V
R
= 16mA
= 5V
F
F
CC
CC
= 25°C
= 1.9kΩ
1200
1000
800
A
L
R
= 220Ω
L
R
= 100Ω
L
-5
600
R
= 470Ω
L
t
PHL
400
-10
-15
t
PLH
R
= 1kΩ
L
200
0
-40
-20
0
20
40
60
80
100
0.01
0.1
1
10
T
A
– AMBIENT TEMPERATURE (°C)
f – FREQUENCY (MHz)
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
6
Pulse
Generator
tr = 5ns
ZO= 50
10% D.C.
I/f< 100µs
Noise
Shield
IF
+
VCC
+5 V
VO
1
3
Ω
6
5
4
RL
VO
0.1 µF
C
L = 1.5 µF
IF Monitor
GND
Rm
IF
0
5 V
VO
1.5 V
1.5 V
VOL
TPHL
TPLH
Fig. 9 Switching Time Test Circuit
IF
Noise
Shield
+
VCC
+5 V
1
3
6
5
4
RL
A
VO
VO
0.1 µF
B
VFF
GND
-
VCM
+
-
Pulse Gen
VCM 10 V
0 V
90% 90%
10%
tr
10%
tf
VO
5 V
Switch at A : IF = 0 mA
VO
VOL
Switch at A : IF = 16 mA
Fig. 10 Common Mode Immunity Test Circuit
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
7
Footprint Drawing for PCB Layout
0.050 0.050 0.050
(1.27) (1.27) (1.27)
0.024 (0.61)
0.190
(4.83)
0.310
(7.87)
Device
‘A’
Device
‘B’
Pin 1
Pin 1
0.060
(1.52)
0.100
(2.54)
End Stacking Configuration
Unutilized Solder Pad
Dimensions in inches (mm)
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
8
Ordering Information
Order Entry Identifier
(example)
Option
R1
Description
FODM452R1
FODM452R2
FODM452V
Tape and Reel (500 per reel)
R2
Tape and Reel (2500 per reel)
VDE0884
V
R1V
R2V
FODM452R1V
FODM452R2V
VDE0884, Tape and Reel (500 per reel)
VDE0884, Tape and Reel (2500 per reel)
Marking Information
1
2
M453
6
V X YY M
5
3
4
Definitions
1
Fairchild logo
Device number
2
VDE mark (Note: Only appears on parts ordered with VDE
option – See order entry table)
3
4
5
6
One digit year code, e.g., ‘7’
Two digit work week ranging from ‘01’ to ‘53’
Assembly package code
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
9
Carrier Tape Specifications
8.0 ± 0.1
2 ± 0.05
3.5 ± 0.2
Ø1.5 MIN
1.75 ± 0.10
4.0 ± 0.1
0.3 MAX
5.5 ± 0.05
12.0 ± 0.3
5.2 ± 0.2
8.3 ± 0.1
6.4 ± 0.2
User Direction of Feed
Ø1.5 + 0.1/-0
0.1 MAX
Note:
All dimensions are in millimeters.
Reflow Profile
(Heating)
to 30 s
230°C (peak temperature)
210°C
180°C
to 60 s
150 s
90 s
80 s
Time (s)
• Peak reflow temperature: 230°C (package surface temperature) for 30 seconds
• Time of temperature higher than 210°C: 60 seconds or less
• One time soldering reflow is recommended
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
10
TRADEMARKS
The following are registered and unregistered trademarks and service marks Fairchild Semiconductor owns or is authorized to use and is not
intended to be an exhaustive list of all such trademarks.
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The Power Franchise®
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TinyWire™
µSerDes™
UHC®
ISOPLANAR™
MegaBuck™
MICROCOUPLER™
MicroFET™
Current Transfer Logic™
EcoSPARK®
FACT Quiet Series™
FACT®
QS™
QT Optoelectronics™
Quiet Series™
RapidConfigure™
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DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS
HEREIN TO IMPROVE RELIABILITY, FUNCTION, OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE
APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS
PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. THESE SPECIFICATIONS DO NOT EXPAND THE TERMS OF FAIRCHILD’S
WORLDWIDE TERMS AND CONDITIONS, SPECIFICALLY THE WARRANTY THEREIN, WHICH COVERS THESE PRODUCTS.
LIFE SUPPORT POLICY
FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR
SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems 2. A critical component in any component of a life support,
which, (a) are intended for surgical implant into the body or
(b) support or sustain life, and (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in a significant injury of the user.
device, or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In Design
This datasheet contains the design specifications for product
development. Specifications may change in any manner without notice.
First Production
Full Production
Not In Production
Preliminary
This datasheet contains preliminary data; supplementary data will be
published at a later date. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve design.
No Identification Needed
Obsolete
This datasheet contains final specifications. Fairchild Semiconductor
reserves the right to make changes at any time without notice to improve
design.
This datasheet contains specifications on a product that has been
discontinued by Fairchild Semiconductor. The datasheet is printed for
reference information only.
Rev. I29
©2003 Fairchild Semiconductor Corporation
FODM452, FODM453 Rev. 1.0.0
www.fairchildsemi.com
11
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