FAN3217TMX_12 [FAIRCHILD]

Dual-2A, High-Speed, Low-Side Gate Drivers; 双2A ,高速,低侧栅极驱动器
FAN3217TMX_12
型号: FAN3217TMX_12
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Dual-2A, High-Speed, Low-Side Gate Drivers
双2A ,高速,低侧栅极驱动器

驱动器 栅极 栅极驱动
文件: 总18页 (文件大小:1309K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
May 2012  
FAN3216 / FAN3217_F085  
Dual-2A, High-Speed, Low-Side Gate Drivers  
Features  
Description  
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Qualified to AEC Q-100  
The FAN3216 and FAN3217 dual 2A gate drivers are  
designed to drive N-channel enhancement-mode  
MOSFETs in low-side switching applications by  
providing high peak current pulses during the short  
switching intervals. They are both available with TTL  
input thresholds. Internal circuitry provides an under-  
voltage lockout function by holding the output LOW until  
the supply voltage is within the operating range. In  
addition, the drivers feature matched internal  
propagation delays between A and B channels for  
applications requiring dual gate drives with critical  
timing, such as synchronous rectifiers. This also  
enables connecting two drivers in parallel to effectively  
double the current capability driving a single MOSFET.  
4.5 to 18V Operating Range  
3A Peak Sink/Source at VDD = 12V  
2.4A Sink / 1.6A Source at VOUT = 6V  
TTL Input Thresholds  
Two Versions of Dual Independent Drivers:  
-
-
Dual Inverting (FAN3216)  
Dual Non-Inverting (FAN3217)  
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.
.
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Internal Resistors Turn Driver Off If No Inputs  
MillerDrive™ Technology  
12ns / 9ns Typical Rise/Fall Times with 1nF Load  
The FAN3216/17 drivers incorporate MillerDrive™  
architecture for the final output stage. This bipolar-  
MOSFET combination provides high current during the  
Miller plateau stage of the MOSFET turn-on / turn-off  
process to minimize switching loss, while providing rail-  
to-rail voltage swing and reverse current capability.  
Typical Propagation Delay Under 20ns Matched  
within 1ns to the Other Channel  
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.
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Double Current Capability by Paralleling Channels  
Standard SOIC-8 Package  
Rated from –40°C to +125°C Ambient  
The FAN3216 offers two inverting drivers and the  
FAN3217 offers two non-inverting drivers. Both are  
offered in a standard 8-pin SOIC package.  
Applications  
.
.
.
.
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Switch-Mode Power Supplies  
High-Efficiency MOSFET Switching  
Synchronous Rectifier Circuits  
DC-to-DC Converters  
Motor Control  
FAN3216  
FAN3217  
Figure 1. Pin Configurations  
Ordering Information  
Input  
Threshold  
Packing  
Method  
Quantity  
per Reel  
Eco  
Status  
Part Number  
Logic  
Package  
Tape &  
Reel  
FAN3216TMX_F085 Dual Inverting Channels  
TTL  
TTL  
SOIC-8  
SOIC-8  
RoHS  
RoHS  
2,500  
2,500  
Dual Non-Inverting  
FAN3217TMX_F085  
Tape &  
Reel  
Channels  
For Fairchild’s definition of “green” Eco Status, please visit: http://www.fairchildsemi.com/company/green/rohs_green.html.  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
Package Outline  
Figure 2. SOIC-8 (Top View)  
Thermal Characteristics(1)  
(2)  
(3)  
(4)  
(5)  
(6)  
Package  
Units  
JL  
JT  
JA  
JB  
JT  
40  
31  
89  
43  
3.0  
°C/W  
8-Pin Small Outline Integrated Circuit (SOIC)  
Notes:  
1. Estimates derived from thermal simulation; actual values depend on the application.  
2. Theta_JL (JL): Thermal resistance between the semiconductor junction and the bottom surface of all the leads (including any  
thermal pad) that are typically soldered to a PCB.  
3. Theta_JT (JT): Thermal resistance between the semiconductor junction and the top surface of the package, assuming it is  
held at a uniform temperature by a top-side heatsink.  
4. Theta_JA (ΘJA): Thermal resistance between junction and ambient, dependent on the PCB design, heat sinking, and airflow.  
The value given is for natural convection with no heatsink using a 2S2P board, as specified in JEDEC standards JESD51-2,  
JESD51-5, and JESD51-7, as appropriate.  
5. Psi_JB (JB): Thermal characterization parameter providing correlation between semiconductor junction temperature and an  
application circuit board reference point for the thermal environment defined in Note 4. For the SOIC-8 package, the board  
reference is defined as the PCB copper adjacent to pin 6.  
6. Psi_JT (JT): Thermal characterization parameter providing correlation between the semiconductor junction temperature and  
the center of the top of the package for the thermal environment defined in Note 4.  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
2
Pin Configurations  
FAN3216  
FAN3217  
Figure 3. Pin Configurations (Repeated)  
Pin Definitions  
Pin  
1
Name  
NC  
Pin Description  
No Connect. This pin can be grounded or left floating.  
Input to Channel A.  
2
INA  
2
INA  
Input to Channel A.  
3
GND  
INB  
Ground. Common ground reference for input and output circuits.  
Input to Channel B.  
4
4
INB  
Input to Channel B.  
5
Gate Drive Output B (inverted from the input): Held LOW unless required input is  
present and VDD is above UVLO threshold.  
OUTB  
(FAN3216)  
5
Gate Drive Output B: Held LOW unless required input(s) are present and VDD is above  
UVLO threshold.  
OUTB  
VDD  
(FAN3217)  
6
Supply Voltage. Provides power to the IC.  
7
Gate Drive Output A (inverted from the input): Held LOW unless required input is  
present and VDD is above UVLO threshold.  
OUTA  
(FAN3216)  
7
Gate Drive Output A: Held LOW unless required input(s) are present and VDD is above  
UVLO threshold.  
OUTA  
NC  
(FAN3217)  
8
No Connect. This pin can be grounded or left floating.  
Output Logic  
FAN3216 (x=A or B)  
FAN3217 (x=A or B)  
INx  
INx  
0(7)  
1
OUTx  
OUTx  
1
0
0
0
1
1(7)  
Note:  
7. Default input signal if no external connection is made.  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
3
Block Diagrams  
Figure 4. FAN3216 Block Diagram  
Figure 5. FAN3217 Block Diagram  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
4
Absolute Maximum Ratings  
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be  
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.  
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.  
The absolute maximum ratings are stress ratings only.  
Symbol  
VDD  
Parameter  
Min.  
Max.  
Unit  
V
VDD to PGND  
-0.3  
20.0  
VIN  
INA and INB to GND  
OUTA and OUTB to GND  
GND - 0.3 VDD + 0.3  
GND - 0.3 VDD + 0.3  
+260  
V
VOUT  
TL  
V
Lead Soldering Temperature (10 Seconds)  
Junction Temperature  
ºC  
ºC  
ºC  
TJ  
-55  
-65  
+150  
+150  
TSTG  
Storage Temperature  
ESD  
Human Body Model, JEDEC JESD22-A114  
3
kV  
Recommended Operating Conditions  
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended  
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not  
recommend exceeding them or designing to Absolute Maximum Ratings.  
Symbol  
VDD  
Parameter  
Min.  
4.5  
0
Max.  
18.0  
VDD  
Unit  
V
Supply Voltage Range  
VIN  
Input Voltage INA and INB  
V
TA  
Operating Ambient Temperature  
-40  
+125  
ºC  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
5
Electrical Characteristics  
Unless otherwise noted, VDD=12V, TJ=-40°C to +125°C. Currents are defined as positive into the device and negative  
out of the device.  
Symbol  
Supply  
VDD  
Parameter  
Conditions  
Min. Typ. Max. Unit  
Operating Range  
4.5  
18.0  
1.20  
4.60  
4.30  
V
mA  
V
IDD  
Supply Current, Inputs Not Connected  
Turn-On Voltage  
0.75  
3.90  
3.70  
VON  
INA = VDD, INB = 0V  
INA = VDD, INB = 0V  
3.40  
3.20  
VOFF  
Turn-Off Voltage  
V
Inputs  
VIL_T  
INx Logic Low Threshold  
0.8  
1.2  
1.6  
V
VIH_T  
IINx_T  
IINx_T  
IINx_T  
IINx_T  
VHYS_T  
INx Logic High Threshold  
Non-Inverting Input Current  
Non-Inverting Input Current  
Inverting Input Current  
2.0  
1.5  
175  
-90  
1.5  
0.8  
V
IN = 0V  
IN = VDD  
IN = 0V  
IN = VDD  
-1.5  
90  
µA  
µA  
µA  
µA  
V
120  
-175  
-1.5  
0.15  
-120  
Inverting Input Current  
TTL Logic Hysteresis Voltage  
0.4  
Output  
OUTx at VDD/2, CLOAD=0.22µF,  
f=1kHz  
ISINK  
OUT Current, Mid-Voltage, Sinking(8)  
2.4  
A
A
OUTx at VDD/2,  
CLOAD=0.1µF, f=1kHz  
ISOURCE  
IPK_SINK  
OUT Current, Mid-Voltage, Sourcing(8)  
OUT Current, Peak, Sinking(8)  
-1.6  
CLOAD=0.1µF, f=1kHz  
CLOAD=0.1µF, f=1kHz  
3
A
A
IPK_SOURCE OUT Current, Peak, Sourcing(8)  
-3  
VOH  
High Level Output Voltage  
15  
35  
mV  
VOH = VDD VOUT, IOUT = 1mA  
VOL  
tRISE  
Low Level Output Voltage  
Output Rise Time(9)  
IOUT = 1mA  
10  
12  
9
25  
22  
17  
34  
mV  
ns  
CLOAD=1000pF  
tFALL  
Output Fall Time(9)  
CLOAD=1000pF  
ns  
tD1, tD2  
Output Propagation Delay, TTL Inputs(9)  
0 - 5VIN, 1V/ns Slew Rate  
4.5  
19  
ns  
INA=INB, OUTA and OUTB at 50%  
Point  
Propagation Matching Between Channels  
Output Reverse Current Withstand(8)  
2
4
ns  
IRVS  
500  
mA  
Notes:  
8. Not tested in production.  
9. See Timing Diagrams of Figure 6 and Figure 7.  
Figure 6. Non-Inverting Timing Diagram  
Figure 7. Inverting Timing Diagram  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
6
Typical Performance Characteristics  
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.  
Figure 8. IDD (Static) vs. Supply Voltage(10)  
Figure 9. IDD (Static) vs. Temperature(10)  
Figure 10. IDD (No-Load) vs. Frequency  
Figure 11. IDD (1nF Load) vs. Frequency  
Figure 12. Input Thresholds vs. Supply Voltage  
Figure 13. Input Thresholds vs. Temperature  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
7
Typical Performance Characteristics  
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.  
Figure 14. UVLO Threshold vs. Temperature  
Figure 15. Propagation Delay vs. Supply Voltage  
Figure 16. Propagation Delay vs. Supply Voltage  
Figure 17. Propagation Delays vs. Temperature  
Figure 18. Propagation Delays vs. Temperature  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
8
Typical Performance Characteristics  
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.  
Figure 19. Fall Time vs. Supply Voltage  
Figure 20. Rise Time vs. Supply Voltage  
Figure 21. Rise and Fall Times vs. Temperature  
Figure 22. Rise/Fall Waveforms with 2.2nF Load  
Figure 23. Rise/Fall Waveforms with 10nF Load  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
9
Typical Performance Characteristics  
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.  
Figure 24. Quasi-Static Source Current  
Figure 25. Quasi-Static Sink Current with VDD=12V(11)  
with VDD=12V(11)  
Figure 26. Quasi-Static Source Current  
with VDD=8V(11)  
Figure 27. Quasi-Static Sink Current with VDD=8V(11)  
Notes:  
10. For any inverting inputs pulled LOW, non-inverting inputs pulled HIGH, or outputs driven HIGH; static IDD  
increases by the current flowing through the corresponding pull-up/down resistor shown in Figure 4 and Figure 5.  
11. The initial spike in each current waveform is a measurement artifact caused by the stray inductance of the  
current-measurement loop.  
Test Circuit  
Figure 28. Quasi-Static IOUT / VOUT Test Circuit  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
10  
Applications Information  
Input Thresholds  
The FAN3216 and the FAN3217 drivers consist of two  
identical channels that may be used independently at  
rated current or connected in parallel to double the  
individual current capacity.  
The input thresholds meet industry-standard TTL-logic  
thresholds independent of the VDD voltage, and there is  
a hysteresis voltage of approximately 0.4V. These levels  
permit the inputs to be driven from a range of input logic  
signal levels for which a voltage over 2V is considered  
logic HIGH. The driving signal for the TTL inputs should  
have fast rising and falling edges with a slew rate of  
6V/µs or faster, so a rise time from 0 to 3.3V should be  
550ns or less. With reduced slew rate, circuit noise  
could cause the driver input voltage to exceed the  
hysteresis voltage and retrigger the driver input, causing  
erratic operation.  
Figure 29. MillerDrive™ Output Architecture  
Under-Voltage Lockout  
The FAN321x startup logic is optimized to drive ground-  
referenced N-channel MOSFETs with an under-voltage  
lockout (UVLO) function to ensure that the IC starts up  
in an orderly fashion. When VDD is rising, yet below the  
3.9V operational level, this circuit holds the output LOW,  
regardless of the status of the input pins. After the part  
is active, the supply voltage must drop 0.2V before the  
part shuts down. This hysteresis helps prevent chatter  
when low VDD supply voltages have noise from the  
power switching. This configuration is not suitable for  
driving high-side P-channel MOSFETs because the low  
output voltage of the driver would turn the P-channel  
MOSFET on with VDD below 3.9V.  
Static Supply Current  
In the IDD (static) typical performance characteristics  
shown in Figure 8 and Figure 9, each curve is produced  
with both inputs floating and both outputs LOW to  
indicate the lowest static IDD current. For other states,  
additional current flows through the 100kresistors on  
the inputs and outputs shown in the block diagram of  
each part (see Figure 4 and Figure 5). In these cases,  
the actual static IDD current is the value obtained from  
the curves plus this additional current.  
MillerDrive™ Gate Drive Technology  
FAN3216 and FAN3217 gate drivers incorporate the  
MillerDrive™ architecture shown in Figure 29. For the  
output stage, a combination of bipolar and MOS devices  
provide large currents over a wide range of supply  
voltage and temperature variations. The bipolar devices  
carry the bulk of the current as OUT swings between 1/3  
to 2/3 VDD and the MOS devices pull the output to the  
HIGH or LOW rail.  
VDD Bypass Capacitor Guidelines  
To enable this IC to turn a device ON quickly, a local  
high-frequency bypass capacitor, CBYP, with low ESR  
and ESL should be connected between the VDD and  
GND pins with minimal trace length. This capacitor is in  
addition to bulk electrolytic capacitance of 10µF to 47µF  
commonly found on driver and controller bias circuits.  
A typical criterion for choosing the value of CBYP is to  
keep the ripple voltage on the VDD supply to 5%. This  
is often achieved with a value 20 times the equivalent  
The purpose of the MillerDrive™ architecture is to  
speed up switching by providing high current during the  
Miller plateau region when the gate-drain capacitance of  
the MOSFET is being charged or discharged as part of  
the turn-on / turn-off process.  
load capacitance CEQV, defined here as QGATE/VDD  
.
Ceramic capacitors of 0.1µF to 1µF or larger are  
common choices, as are dielectrics, such as X5R and  
X7R, with good temperature characteristics and high  
pulse current capability.  
For applications with zero voltage switching during the  
MOSFET turn-on or turn-off interval, the driver supplies  
high peak current for fast switching even though the  
Miller plateau is not present. This situation often occurs  
in synchronous rectifier applications because the body  
diode is generally conducting before the MOSFET is  
switched ON.  
If circuit noise affects normal operation, the value of  
CBYP may be increased, to 50-100 times the CEQV, or  
CBYP may be split into two capacitors. One should be a  
larger value, based on equivalent load capacitance, and  
the other a smaller value, such as 1-10nF mounted  
closest to the VDD and GND pins to carry the higher-  
frequency components of the current pulses. The  
bypass capacitor must provide the pulsed current from  
both of the driver channels and, if the drivers are  
switching simultaneously, the combined peak current  
sourced from the CBYP would be twice as large as when  
a single channel is switching.  
The output pin slew rate is determined by VDD voltage  
and the load on the output. It is not user adjustable, but  
a series resistor can be added if a slower rise or fall time  
at the MOSFET gate is needed.  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
11  
Layout and Connection Guidelines  
The FAN3216 and FAN3217 gate drivers incorporate  
fast-reacting input circuits, short propagation delays,  
and powerful output stages capable of delivering current  
peaks over 2A to facilitate voltage transition times from  
under 10ns to over 150ns. The following layout and  
connection guidelines are strongly recommended:  
Figure 31 shows the current path when the gate driver  
turns the MOSFET OFF. Ideally, the driver shunts the  
current directly to the source of the MOSFET in a small  
circuit loop. For fast turn-off times, the resistance and  
inductance in this path should be minimized.  
.
Keep high-current output and power ground paths  
separate from logic input signals and signal ground  
paths. This is especially critical for TTL-level logic  
thresholds at driver input pins.  
.
Keep the driver as close to the load as possible to  
minimize the length of high-current traces. This  
reduces the series inductance to improve high-  
speed switching, while reducing the loop area that  
can radiate EMI to the driver inputs and  
surrounding circuitry.  
.
.
If the inputs to a channel are not externally  
connected, the internal 100kresistors indicated  
on block diagrams command a low output. In noisy  
environments, it may be necessary to tie inputs of  
an unused channel to VDD or GND using short  
traces to prevent noise from causing spurious  
output switching.  
Figure 31. Current Path for MOSFET Turn-Off  
Many high-speed power circuits can be susceptible  
to noise injected from their own output or other  
external sources, possibly causing output re-  
triggering. These effects can be obvious if the  
circuit is tested in breadboard or non-optimal circuit  
layouts with long input or output leads. For best  
results, make connections to all pins as short and  
direct as possible.  
.
.
FAN3216 and FAN3217 are pin-compatible with  
many other industry-standard drivers.  
The turn-on and turn-off current paths should be  
minimized, as discussed in the following section.  
Figure 30 shows the pulsed gate drive current path  
when the gate driver is supplying gate charge to turn the  
MOSFET on. The current is supplied from the local  
bypass capacitor, CBYP, and flows through the driver to  
the MOSFET gate and to ground. To reach the high  
peak currents possible, the resistance and inductance in  
the path should be minimized. The localized CBYP acts  
to contain the high peak current pulses within this driver-  
MOSFET circuit, preventing them from disturbing the  
sensitive analog circuitry in the PWM controller.  
Figure 30. Current Path for MOSFET Turn-On  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217 • Rev. 1.0.0  
www.fairchildsemi.com  
12  
Operational Waveforms  
At power-up, the driver output remains LOW until the  
VDD voltage reaches the turn-on threshold. The  
magnitude of the OUT pulses rises with VDD until  
steady-state VDD is reached. The non-inverting  
operation illustrated in Figure 32 shows that the output  
remains LOW until the UVLO threshold is reached, then  
the output is in-phase with the input.  
The inverting configuration of startup waveforms are  
shown in Figure 33. With IN+ tied to VDD and the input  
signal applied to IN–, the OUT pulses are inverted with  
respect to the input. At power-up, the inverted output  
remains LOW until the VDD voltage reaches the turn-on  
threshold, then it follows the input with inverted phase.  
Figure 33. Inverting Startup Waveforms  
Figure 32. Non-Inverting Startup Waveforms  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
13  
Thermal Guidelines  
Gate drivers used to switch MOSFETs and IGBTs at  
high frequencies can dissipate significant amounts of  
power. It is important to determine the driver power  
dissipation and the resulting junction temperature in the  
application to ensure that the part is operating within  
acceptable temperature limits.  
In the forward converter with synchronous rectifier  
shown in the typical application diagrams, the  
FDMS8660S is a reasonable MOSFET selection. The  
gate charge for each SR MOSFET would be 60nC with  
VGS = VDD = 7V. At a switching frequency of 500kHz, the  
total power dissipation is:  
The total power dissipation in a gate driver is the sum of  
PGATE = 60nC • 7V • 500kHz • 2 = 0.42W  
PDYNAMIC = 3mA • 7V • 2 = 0.042W  
PTOTAL = 0.46W  
(5)  
(6)  
(7)  
two components, PGATE and PDYNAMIC  
:
PTOTAL = PGATE + PDYNAMIC  
(1)  
Gate Driving Loss: The most significant power loss  
results from supplying gate current (charge per unit  
time) to switch the load MOSFET on and off at the  
switching frequency. The power dissipation that  
results from driving a MOSFET at a specified gate-  
The SOIC-8 has  
characterization parameter of  
a
junction-to-board thermal  
JB  
= 43°C/W. In a  
system application, the localized temperature around  
the device is a function of the layout and construction of  
the PCB along with airflow across the surfaces. To  
ensure reliable operation, the maximum junction  
temperature of the device must be prevented from  
exceeding the maximum rating of 150°C; with 80%  
derating, TJ would be limited to 120°C. Rearranging  
Equation 4 determines the board temperature required  
to maintain the junction temperature below 120°C:  
source voltage, VGS  
, with gate charge, QG, at  
switching frequency, fSW, is determined by:  
PGATE = QG • VGS • fSW • n  
(2)  
where n is the number of driver channels in use (1 or 2).  
Dynamic Pre-Drive / Shoot-through Current: A power  
loss resulting from internal current consumption under  
dynamic operating conditions, including pin pull-up /  
pull-down resistors, can be obtained using the graphs  
in Typical Performance Characteristics to determine  
the current IDYNAMIC drawn from VDD under actual  
operating conditions:  
TB = TJ - PTOTAL  
(8)  
(9)  
JB  
TB = 120°C – 0.46W • 43°C/W = 100°C  
PDYNAMIC = IDYNAMIC • VDD • n  
(3)  
Once the power dissipated in the driver is determined,  
the driver junction rise with respect to circuit board can  
be evaluated using the following thermal equation,  
JB  
assuming  
was determined for a similar thermal  
design (heat sinking and air flow):  
TJ  
= PTOTAL  
JB + TB  
(4)  
where:  
TJ  
= driver junction temperature;  
JB  
= (psi) thermal characterization parameter  
relating temperature rise to total power  
dissipation; and  
TB  
= board temperature in location as defined in  
the Thermal Characteristics table.  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
14  
Typical Application Diagrams  
Figure 34. Forward Converter  
with Synchronous Rectification  
Figure 35.  
Primary-side Dual Driver  
in a Push-pull Converter  
Figure 36. Phase-shifted Full-bridge with Two Gate Drive Transformers (Simplified)  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
15  
Table 1. Related Products  
Part  
Number  
Gate Drive(12)  
(Sink/Src) Threshold  
Input  
Type  
Logic  
Package  
SOT23-5  
Single 1A FAN3111C +1.1A / -0.9A  
Single 1A FAN3111E +1.1A / -0.9A  
Single 2A FAN3100C +2.5A / -1.8A  
Single 2A FAN3100T +2.5A / -1.8A  
CMOS  
Single Channel of Dual-Input/Single-Output  
External(13) Single Non-Inverting Channel with External Reference SOT23-5  
CMOS  
TTL  
Single Channel of Two-Input/One-Output  
Single Channel of Two-Input/One-Output  
Dual Inverting Channels  
SOT23-5  
SOT23-5  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
Dual 2A  
Dual 2A  
Dual 2A  
Dual 2A  
Dual 2A  
Dual 2A  
Dual 2A  
Dual 2A  
Dual 2A  
Dual 2A  
FAN3216T +2.4A / -1.6A  
FAN3217T +2.4A / -1.6A  
FAN3226C +2.4A / -1.6A  
FAN3226T +2.4A / -1.6A  
FAN3227C +2.4A / -1.6A  
FAN3227T +2.4A / -1.6A  
FAN3228C +2.4A / -1.6A  
FAN3228T +2.4A / -1.6A  
FAN3229C +2.4A / -1.6A  
FAN3229T +2.4A / -1.6A  
TTL  
TTL  
Dual Non-Inverting Channels  
CMOS  
TTL  
Dual Inverting Channels + Dual Enable  
Dual Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
CMOS  
TTL  
CMOS  
TTL  
Dual Channels of Two-Input/One-Output, Pin Config.1 SOIC8  
Dual Channels of Two-Input/One-Output, Pin Config.1 SOIC8  
Dual Channels of Two-Input/One-Output, Pin Config.2 SOIC8  
Dual Channels of Two-Input/One-Output, Pin Config.2 SOIC8  
CMOS  
TTL  
20V Non-Inverting Channel (NMOS) and Inverting  
SOIC8  
Dual 2A  
Dual 2A  
FAN3268T +2.4A / -1.6A  
FAN3278T +2.4A / -1.6A  
TTL  
TTL  
Channel (PMOS) + Dual Enables  
30V Non-Inverting Channel (NMOS) and Inverting  
SOIC8  
Channel (PMOS) + Dual Enables  
Dual 4A  
Dual 4A  
Dual 4A  
Dual 4A  
Dual 4A  
Dual 4A  
Dual 4A  
Dual 4A  
FAN3213T +2.5A / -1.8A  
FAN3214T +2.5A / -1.8A  
FAN3223C +4.3A / -2.8A  
FAN3223T +4.3A / -2.8A  
FAN3224C +4.3A / -2.8A  
FAN3224T +4.3A / -2.8A  
FAN3225C +4.3A / -2.8A  
FAN3225T +4.3A / -2.8A  
TTL  
Dual Inverting Channels  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
SOIC8  
TTL  
Dual Non-Inverting Channels  
CMOS  
TTL  
Dual Inverting Channels + Dual Enable  
Dual Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Non-Inverting Channels + Dual Enable  
Dual Channels of Two-Input/One-Output  
Dual Channels of Two-Input/One-Output  
Single Inverting Channel + Enable  
Single Inverting Channel + Enable  
Single Non-Inverting Channel + Enable  
Single Non-Inverting Channel + Enable  
CMOS  
TTL  
CMOS  
TTL  
Single 9A FAN3121C +9.7A / -7.1A  
Single 9A FAN3121T +9.7A / -7.1A  
Single 9A FAN3122T +9.7A / -7.1A  
Single 9A FAN3122C +9.7A / -7.1A  
Notes:  
CMOS  
TTL  
CMOS  
TTL  
12. Typical currents with OUTx at 6V and VDD=12V.  
13. Thresholds proportional to an externally supplied reference voltage.  
© 2012 Fairchild Semiconductor Corporation  
www.fairchildsemi.com  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
16  
Physical Dimensions  
5.00  
4.80  
A
0.65  
3.81  
8
5
B
1.75  
6.20  
5.80  
4.00  
3.80  
5.60  
1
4
PIN ONE  
INDICATOR  
1.27  
1.27  
(0.33)  
M
0.25  
C B A  
LAND PATTERN RECOMMENDATION  
SEE DETAIL A  
0.25  
0.10  
0.25  
0.19  
C
1.75 MAX  
0.10  
C
0.51  
0.33  
OPTION A - BEVEL EDGE  
0.50  
0.25  
x 45  
R0.10  
R0.10  
GAGE PLANE  
OPTION B - NO BEVEL EDGE  
0.36  
NOTES: UNLESS OTHERWISE SPECIFIED  
8ٛ  
0ٛ  
0.90  
A) THIS PACKAGE CONFORMS TO JEDEC  
MS-012, VARIATION AA, ISSUE C,  
B) ALL DIMENSIONS ARE IN MILLIMETERS.  
C) DIMENSIONS DO NOT INCLUDE MOLD  
FLASH OR BURRS.  
SEATING PLANE  
(1.04)  
0.406  
D) LANDPATTERN STANDARD: SOIC127P600X175-8M.  
E) DRAWING FILENAME: M08AREV13  
DETAIL A  
SCALE: 2:1  
Figure 37. 8-Lead Small Outline Integrated Circuit (SOIC)  
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner  
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or  
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,  
specifically the warranty therein, which covers Fairchild products.  
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:  
http://www.fairchildsemi.com/packaging/.  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
17  
© 2012 Fairchild Semiconductor Corporation  
FAN3216 / FAN3217_F085 • Rev. 1.0.0  
www.fairchildsemi.com  
18  

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