FAN3217TMX_12 [FAIRCHILD]
Dual-2A, High-Speed, Low-Side Gate Drivers; 双2A ,高速,低侧栅极驱动器型号: | FAN3217TMX_12 |
厂家: | FAIRCHILD SEMICONDUCTOR |
描述: | Dual-2A, High-Speed, Low-Side Gate Drivers |
文件: | 总18页 (文件大小:1309K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
May 2012
FAN3216 / FAN3217_F085
Dual-2A, High-Speed, Low-Side Gate Drivers
Features
Description
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.
.
.
.
.
Qualified to AEC Q-100
The FAN3216 and FAN3217 dual 2A gate drivers are
designed to drive N-channel enhancement-mode
MOSFETs in low-side switching applications by
providing high peak current pulses during the short
switching intervals. They are both available with TTL
input thresholds. Internal circuitry provides an under-
voltage lockout function by holding the output LOW until
the supply voltage is within the operating range. In
addition, the drivers feature matched internal
propagation delays between A and B channels for
applications requiring dual gate drives with critical
timing, such as synchronous rectifiers. This also
enables connecting two drivers in parallel to effectively
double the current capability driving a single MOSFET.
4.5 to 18V Operating Range
3A Peak Sink/Source at VDD = 12V
2.4A Sink / 1.6A Source at VOUT = 6V
TTL Input Thresholds
Two Versions of Dual Independent Drivers:
-
-
Dual Inverting (FAN3216)
Dual Non-Inverting (FAN3217)
.
.
.
.
Internal Resistors Turn Driver Off If No Inputs
MillerDrive™ Technology
12ns / 9ns Typical Rise/Fall Times with 1nF Load
The FAN3216/17 drivers incorporate MillerDrive™
architecture for the final output stage. This bipolar-
MOSFET combination provides high current during the
Miller plateau stage of the MOSFET turn-on / turn-off
process to minimize switching loss, while providing rail-
to-rail voltage swing and reverse current capability.
Typical Propagation Delay Under 20ns Matched
within 1ns to the Other Channel
.
.
.
Double Current Capability by Paralleling Channels
Standard SOIC-8 Package
Rated from –40°C to +125°C Ambient
The FAN3216 offers two inverting drivers and the
FAN3217 offers two non-inverting drivers. Both are
offered in a standard 8-pin SOIC package.
Applications
.
.
.
.
.
Switch-Mode Power Supplies
High-Efficiency MOSFET Switching
Synchronous Rectifier Circuits
DC-to-DC Converters
Motor Control
FAN3216
FAN3217
Figure 1. Pin Configurations
Ordering Information
Input
Threshold
Packing
Method
Quantity
per Reel
Eco
Status
Part Number
Logic
Package
Tape &
Reel
FAN3216TMX_F085 Dual Inverting Channels
TTL
TTL
SOIC-8
SOIC-8
RoHS
RoHS
2,500
2,500
Dual Non-Inverting
FAN3217TMX_F085
Tape &
Reel
Channels
For Fairchild’s definition of “green” Eco Status, please visit: http://www.fairchildsemi.com/company/green/rohs_green.html.
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
Package Outline
Figure 2. SOIC-8 (Top View)
Thermal Characteristics(1)
(2)
(3)
(4)
(5)
(6)
Package
Units
JL
JT
JA
JB
JT
40
31
89
43
3.0
°C/W
8-Pin Small Outline Integrated Circuit (SOIC)
Notes:
1. Estimates derived from thermal simulation; actual values depend on the application.
2. Theta_JL (JL): Thermal resistance between the semiconductor junction and the bottom surface of all the leads (including any
thermal pad) that are typically soldered to a PCB.
3. Theta_JT (JT): Thermal resistance between the semiconductor junction and the top surface of the package, assuming it is
held at a uniform temperature by a top-side heatsink.
4. Theta_JA (ΘJA): Thermal resistance between junction and ambient, dependent on the PCB design, heat sinking, and airflow.
The value given is for natural convection with no heatsink using a 2S2P board, as specified in JEDEC standards JESD51-2,
JESD51-5, and JESD51-7, as appropriate.
5. Psi_JB (JB): Thermal characterization parameter providing correlation between semiconductor junction temperature and an
application circuit board reference point for the thermal environment defined in Note 4. For the SOIC-8 package, the board
reference is defined as the PCB copper adjacent to pin 6.
6. Psi_JT (JT): Thermal characterization parameter providing correlation between the semiconductor junction temperature and
the center of the top of the package for the thermal environment defined in Note 4.
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
2
Pin Configurations
FAN3216
FAN3217
Figure 3. Pin Configurations (Repeated)
Pin Definitions
Pin
1
Name
NC
Pin Description
No Connect. This pin can be grounded or left floating.
Input to Channel A.
2
INA
2
INA
Input to Channel A.
3
GND
INB
Ground. Common ground reference for input and output circuits.
Input to Channel B.
4
4
INB
Input to Channel B.
5
Gate Drive Output B (inverted from the input): Held LOW unless required input is
present and VDD is above UVLO threshold.
OUTB
(FAN3216)
5
Gate Drive Output B: Held LOW unless required input(s) are present and VDD is above
UVLO threshold.
OUTB
VDD
(FAN3217)
6
Supply Voltage. Provides power to the IC.
7
Gate Drive Output A (inverted from the input): Held LOW unless required input is
present and VDD is above UVLO threshold.
OUTA
(FAN3216)
7
Gate Drive Output A: Held LOW unless required input(s) are present and VDD is above
UVLO threshold.
OUTA
NC
(FAN3217)
8
No Connect. This pin can be grounded or left floating.
Output Logic
FAN3216 (x=A or B)
FAN3217 (x=A or B)
INx
INx
0(7)
1
OUTx
OUTx
1
0
0
0
1
1(7)
Note:
7. Default input signal if no external connection is made.
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
3
Block Diagrams
Figure 4. FAN3216 Block Diagram
Figure 5. FAN3217 Block Diagram
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
4
Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
VDD
Parameter
Min.
Max.
Unit
V
VDD to PGND
-0.3
20.0
VIN
INA and INB to GND
OUTA and OUTB to GND
GND - 0.3 VDD + 0.3
GND - 0.3 VDD + 0.3
+260
V
VOUT
TL
V
Lead Soldering Temperature (10 Seconds)
Junction Temperature
ºC
ºC
ºC
TJ
-55
-65
+150
+150
TSTG
Storage Temperature
ESD
Human Body Model, JEDEC JESD22-A114
3
kV
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
VDD
Parameter
Min.
4.5
0
Max.
18.0
VDD
Unit
V
Supply Voltage Range
VIN
Input Voltage INA and INB
V
TA
Operating Ambient Temperature
-40
+125
ºC
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
5
Electrical Characteristics
Unless otherwise noted, VDD=12V, TJ=-40°C to +125°C. Currents are defined as positive into the device and negative
out of the device.
Symbol
Supply
VDD
Parameter
Conditions
Min. Typ. Max. Unit
Operating Range
4.5
18.0
1.20
4.60
4.30
V
mA
V
IDD
Supply Current, Inputs Not Connected
Turn-On Voltage
0.75
3.90
3.70
VON
INA = VDD, INB = 0V
INA = VDD, INB = 0V
3.40
3.20
VOFF
Turn-Off Voltage
V
Inputs
VIL_T
INx Logic Low Threshold
0.8
1.2
1.6
V
VIH_T
IINx_T
IINx_T
IINx_T
IINx_T
VHYS_T
INx Logic High Threshold
Non-Inverting Input Current
Non-Inverting Input Current
Inverting Input Current
2.0
1.5
175
-90
1.5
0.8
V
IN = 0V
IN = VDD
IN = 0V
IN = VDD
-1.5
90
µA
µA
µA
µA
V
120
-175
-1.5
0.15
-120
Inverting Input Current
TTL Logic Hysteresis Voltage
0.4
Output
OUTx at VDD/2, CLOAD=0.22µF,
f=1kHz
ISINK
OUT Current, Mid-Voltage, Sinking(8)
2.4
A
A
OUTx at VDD/2,
CLOAD=0.1µF, f=1kHz
ISOURCE
IPK_SINK
OUT Current, Mid-Voltage, Sourcing(8)
OUT Current, Peak, Sinking(8)
-1.6
CLOAD=0.1µF, f=1kHz
CLOAD=0.1µF, f=1kHz
3
A
A
IPK_SOURCE OUT Current, Peak, Sourcing(8)
-3
VOH
High Level Output Voltage
15
35
mV
VOH = VDD – VOUT, IOUT = –1mA
VOL
tRISE
Low Level Output Voltage
Output Rise Time(9)
IOUT = 1mA
10
12
9
25
22
17
34
mV
ns
CLOAD=1000pF
tFALL
Output Fall Time(9)
CLOAD=1000pF
ns
tD1, tD2
Output Propagation Delay, TTL Inputs(9)
0 - 5VIN, 1V/ns Slew Rate
4.5
19
ns
INA=INB, OUTA and OUTB at 50%
Point
Propagation Matching Between Channels
Output Reverse Current Withstand(8)
2
4
ns
IRVS
500
mA
Notes:
8. Not tested in production.
9. See Timing Diagrams of Figure 6 and Figure 7.
Figure 6. Non-Inverting Timing Diagram
Figure 7. Inverting Timing Diagram
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
6
Typical Performance Characteristics
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.
Figure 8. IDD (Static) vs. Supply Voltage(10)
Figure 9. IDD (Static) vs. Temperature(10)
Figure 10. IDD (No-Load) vs. Frequency
Figure 11. IDD (1nF Load) vs. Frequency
Figure 12. Input Thresholds vs. Supply Voltage
Figure 13. Input Thresholds vs. Temperature
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
7
Typical Performance Characteristics
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.
Figure 14. UVLO Threshold vs. Temperature
Figure 15. Propagation Delay vs. Supply Voltage
Figure 16. Propagation Delay vs. Supply Voltage
Figure 17. Propagation Delays vs. Temperature
Figure 18. Propagation Delays vs. Temperature
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
8
Typical Performance Characteristics
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.
Figure 19. Fall Time vs. Supply Voltage
Figure 20. Rise Time vs. Supply Voltage
Figure 21. Rise and Fall Times vs. Temperature
Figure 22. Rise/Fall Waveforms with 2.2nF Load
Figure 23. Rise/Fall Waveforms with 10nF Load
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
9
Typical Performance Characteristics
Typical characteristics are provided at TA=25°C and VDD=12V unless otherwise noted.
Figure 24. Quasi-Static Source Current
Figure 25. Quasi-Static Sink Current with VDD=12V(11)
with VDD=12V(11)
Figure 26. Quasi-Static Source Current
with VDD=8V(11)
Figure 27. Quasi-Static Sink Current with VDD=8V(11)
Notes:
10. For any inverting inputs pulled LOW, non-inverting inputs pulled HIGH, or outputs driven HIGH; static IDD
increases by the current flowing through the corresponding pull-up/down resistor shown in Figure 4 and Figure 5.
11. The initial spike in each current waveform is a measurement artifact caused by the stray inductance of the
current-measurement loop.
Test Circuit
Figure 28. Quasi-Static IOUT / VOUT Test Circuit
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
10
Applications Information
Input Thresholds
The FAN3216 and the FAN3217 drivers consist of two
identical channels that may be used independently at
rated current or connected in parallel to double the
individual current capacity.
The input thresholds meet industry-standard TTL-logic
thresholds independent of the VDD voltage, and there is
a hysteresis voltage of approximately 0.4V. These levels
permit the inputs to be driven from a range of input logic
signal levels for which a voltage over 2V is considered
logic HIGH. The driving signal for the TTL inputs should
have fast rising and falling edges with a slew rate of
6V/µs or faster, so a rise time from 0 to 3.3V should be
550ns or less. With reduced slew rate, circuit noise
could cause the driver input voltage to exceed the
hysteresis voltage and retrigger the driver input, causing
erratic operation.
Figure 29. MillerDrive™ Output Architecture
Under-Voltage Lockout
The FAN321x startup logic is optimized to drive ground-
referenced N-channel MOSFETs with an under-voltage
lockout (UVLO) function to ensure that the IC starts up
in an orderly fashion. When VDD is rising, yet below the
3.9V operational level, this circuit holds the output LOW,
regardless of the status of the input pins. After the part
is active, the supply voltage must drop 0.2V before the
part shuts down. This hysteresis helps prevent chatter
when low VDD supply voltages have noise from the
power switching. This configuration is not suitable for
driving high-side P-channel MOSFETs because the low
output voltage of the driver would turn the P-channel
MOSFET on with VDD below 3.9V.
Static Supply Current
In the IDD (static) typical performance characteristics
shown in Figure 8 and Figure 9, each curve is produced
with both inputs floating and both outputs LOW to
indicate the lowest static IDD current. For other states,
additional current flows through the 100k resistors on
the inputs and outputs shown in the block diagram of
each part (see Figure 4 and Figure 5). In these cases,
the actual static IDD current is the value obtained from
the curves plus this additional current.
MillerDrive™ Gate Drive Technology
FAN3216 and FAN3217 gate drivers incorporate the
MillerDrive™ architecture shown in Figure 29. For the
output stage, a combination of bipolar and MOS devices
provide large currents over a wide range of supply
voltage and temperature variations. The bipolar devices
carry the bulk of the current as OUT swings between 1/3
to 2/3 VDD and the MOS devices pull the output to the
HIGH or LOW rail.
VDD Bypass Capacitor Guidelines
To enable this IC to turn a device ON quickly, a local
high-frequency bypass capacitor, CBYP, with low ESR
and ESL should be connected between the VDD and
GND pins with minimal trace length. This capacitor is in
addition to bulk electrolytic capacitance of 10µF to 47µF
commonly found on driver and controller bias circuits.
A typical criterion for choosing the value of CBYP is to
keep the ripple voltage on the VDD supply to ≤ 5%. This
is often achieved with a value ≥ 20 times the equivalent
The purpose of the MillerDrive™ architecture is to
speed up switching by providing high current during the
Miller plateau region when the gate-drain capacitance of
the MOSFET is being charged or discharged as part of
the turn-on / turn-off process.
load capacitance CEQV, defined here as QGATE/VDD
.
Ceramic capacitors of 0.1µF to 1µF or larger are
common choices, as are dielectrics, such as X5R and
X7R, with good temperature characteristics and high
pulse current capability.
For applications with zero voltage switching during the
MOSFET turn-on or turn-off interval, the driver supplies
high peak current for fast switching even though the
Miller plateau is not present. This situation often occurs
in synchronous rectifier applications because the body
diode is generally conducting before the MOSFET is
switched ON.
If circuit noise affects normal operation, the value of
CBYP may be increased, to 50-100 times the CEQV, or
CBYP may be split into two capacitors. One should be a
larger value, based on equivalent load capacitance, and
the other a smaller value, such as 1-10nF mounted
closest to the VDD and GND pins to carry the higher-
frequency components of the current pulses. The
bypass capacitor must provide the pulsed current from
both of the driver channels and, if the drivers are
switching simultaneously, the combined peak current
sourced from the CBYP would be twice as large as when
a single channel is switching.
The output pin slew rate is determined by VDD voltage
and the load on the output. It is not user adjustable, but
a series resistor can be added if a slower rise or fall time
at the MOSFET gate is needed.
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
11
Layout and Connection Guidelines
The FAN3216 and FAN3217 gate drivers incorporate
fast-reacting input circuits, short propagation delays,
and powerful output stages capable of delivering current
peaks over 2A to facilitate voltage transition times from
under 10ns to over 150ns. The following layout and
connection guidelines are strongly recommended:
Figure 31 shows the current path when the gate driver
turns the MOSFET OFF. Ideally, the driver shunts the
current directly to the source of the MOSFET in a small
circuit loop. For fast turn-off times, the resistance and
inductance in this path should be minimized.
.
Keep high-current output and power ground paths
separate from logic input signals and signal ground
paths. This is especially critical for TTL-level logic
thresholds at driver input pins.
.
Keep the driver as close to the load as possible to
minimize the length of high-current traces. This
reduces the series inductance to improve high-
speed switching, while reducing the loop area that
can radiate EMI to the driver inputs and
surrounding circuitry.
.
.
If the inputs to a channel are not externally
connected, the internal 100k resistors indicated
on block diagrams command a low output. In noisy
environments, it may be necessary to tie inputs of
an unused channel to VDD or GND using short
traces to prevent noise from causing spurious
output switching.
Figure 31. Current Path for MOSFET Turn-Off
Many high-speed power circuits can be susceptible
to noise injected from their own output or other
external sources, possibly causing output re-
triggering. These effects can be obvious if the
circuit is tested in breadboard or non-optimal circuit
layouts with long input or output leads. For best
results, make connections to all pins as short and
direct as possible.
.
.
FAN3216 and FAN3217 are pin-compatible with
many other industry-standard drivers.
The turn-on and turn-off current paths should be
minimized, as discussed in the following section.
Figure 30 shows the pulsed gate drive current path
when the gate driver is supplying gate charge to turn the
MOSFET on. The current is supplied from the local
bypass capacitor, CBYP, and flows through the driver to
the MOSFET gate and to ground. To reach the high
peak currents possible, the resistance and inductance in
the path should be minimized. The localized CBYP acts
to contain the high peak current pulses within this driver-
MOSFET circuit, preventing them from disturbing the
sensitive analog circuitry in the PWM controller.
Figure 30. Current Path for MOSFET Turn-On
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217 • Rev. 1.0.0
www.fairchildsemi.com
12
Operational Waveforms
At power-up, the driver output remains LOW until the
VDD voltage reaches the turn-on threshold. The
magnitude of the OUT pulses rises with VDD until
steady-state VDD is reached. The non-inverting
operation illustrated in Figure 32 shows that the output
remains LOW until the UVLO threshold is reached, then
the output is in-phase with the input.
The inverting configuration of startup waveforms are
shown in Figure 33. With IN+ tied to VDD and the input
signal applied to IN–, the OUT pulses are inverted with
respect to the input. At power-up, the inverted output
remains LOW until the VDD voltage reaches the turn-on
threshold, then it follows the input with inverted phase.
Figure 33. Inverting Startup Waveforms
Figure 32. Non-Inverting Startup Waveforms
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
13
Thermal Guidelines
Gate drivers used to switch MOSFETs and IGBTs at
high frequencies can dissipate significant amounts of
power. It is important to determine the driver power
dissipation and the resulting junction temperature in the
application to ensure that the part is operating within
acceptable temperature limits.
In the forward converter with synchronous rectifier
shown in the typical application diagrams, the
FDMS8660S is a reasonable MOSFET selection. The
gate charge for each SR MOSFET would be 60nC with
VGS = VDD = 7V. At a switching frequency of 500kHz, the
total power dissipation is:
The total power dissipation in a gate driver is the sum of
PGATE = 60nC • 7V • 500kHz • 2 = 0.42W
PDYNAMIC = 3mA • 7V • 2 = 0.042W
PTOTAL = 0.46W
(5)
(6)
(7)
two components, PGATE and PDYNAMIC
:
PTOTAL = PGATE + PDYNAMIC
(1)
Gate Driving Loss: The most significant power loss
results from supplying gate current (charge per unit
time) to switch the load MOSFET on and off at the
switching frequency. The power dissipation that
results from driving a MOSFET at a specified gate-
The SOIC-8 has
characterization parameter of
a
junction-to-board thermal
JB
= 43°C/W. In a
system application, the localized temperature around
the device is a function of the layout and construction of
the PCB along with airflow across the surfaces. To
ensure reliable operation, the maximum junction
temperature of the device must be prevented from
exceeding the maximum rating of 150°C; with 80%
derating, TJ would be limited to 120°C. Rearranging
Equation 4 determines the board temperature required
to maintain the junction temperature below 120°C:
source voltage, VGS
, with gate charge, QG, at
switching frequency, fSW, is determined by:
PGATE = QG • VGS • fSW • n
(2)
where n is the number of driver channels in use (1 or 2).
Dynamic Pre-Drive / Shoot-through Current: A power
loss resulting from internal current consumption under
dynamic operating conditions, including pin pull-up /
pull-down resistors, can be obtained using the graphs
in Typical Performance Characteristics to determine
the current IDYNAMIC drawn from VDD under actual
operating conditions:
TB = TJ - PTOTAL
•
(8)
(9)
JB
TB = 120°C – 0.46W • 43°C/W = 100°C
PDYNAMIC = IDYNAMIC • VDD • n
(3)
Once the power dissipated in the driver is determined,
the driver junction rise with respect to circuit board can
be evaluated using the following thermal equation,
JB
assuming
was determined for a similar thermal
design (heat sinking and air flow):
TJ
= PTOTAL
•
JB + TB
(4)
where:
TJ
= driver junction temperature;
JB
= (psi) thermal characterization parameter
relating temperature rise to total power
dissipation; and
TB
= board temperature in location as defined in
the Thermal Characteristics table.
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
14
Typical Application Diagrams
Figure 34. Forward Converter
with Synchronous Rectification
Figure 35.
Primary-side Dual Driver
in a Push-pull Converter
Figure 36. Phase-shifted Full-bridge with Two Gate Drive Transformers (Simplified)
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
15
Table 1. Related Products
Part
Number
Gate Drive(12)
(Sink/Src) Threshold
Input
Type
Logic
Package
SOT23-5
Single 1A FAN3111C +1.1A / -0.9A
Single 1A FAN3111E +1.1A / -0.9A
Single 2A FAN3100C +2.5A / -1.8A
Single 2A FAN3100T +2.5A / -1.8A
CMOS
Single Channel of Dual-Input/Single-Output
External(13) Single Non-Inverting Channel with External Reference SOT23-5
CMOS
TTL
Single Channel of Two-Input/One-Output
Single Channel of Two-Input/One-Output
Dual Inverting Channels
SOT23-5
SOT23-5
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
Dual 2A
Dual 2A
Dual 2A
Dual 2A
Dual 2A
Dual 2A
Dual 2A
Dual 2A
Dual 2A
Dual 2A
FAN3216T +2.4A / -1.6A
FAN3217T +2.4A / -1.6A
FAN3226C +2.4A / -1.6A
FAN3226T +2.4A / -1.6A
FAN3227C +2.4A / -1.6A
FAN3227T +2.4A / -1.6A
FAN3228C +2.4A / -1.6A
FAN3228T +2.4A / -1.6A
FAN3229C +2.4A / -1.6A
FAN3229T +2.4A / -1.6A
TTL
TTL
Dual Non-Inverting Channels
CMOS
TTL
Dual Inverting Channels + Dual Enable
Dual Inverting Channels + Dual Enable
Dual Non-Inverting Channels + Dual Enable
Dual Non-Inverting Channels + Dual Enable
CMOS
TTL
CMOS
TTL
Dual Channels of Two-Input/One-Output, Pin Config.1 SOIC8
Dual Channels of Two-Input/One-Output, Pin Config.1 SOIC8
Dual Channels of Two-Input/One-Output, Pin Config.2 SOIC8
Dual Channels of Two-Input/One-Output, Pin Config.2 SOIC8
CMOS
TTL
20V Non-Inverting Channel (NMOS) and Inverting
SOIC8
Dual 2A
Dual 2A
FAN3268T +2.4A / -1.6A
FAN3278T +2.4A / -1.6A
TTL
TTL
Channel (PMOS) + Dual Enables
30V Non-Inverting Channel (NMOS) and Inverting
SOIC8
Channel (PMOS) + Dual Enables
Dual 4A
Dual 4A
Dual 4A
Dual 4A
Dual 4A
Dual 4A
Dual 4A
Dual 4A
FAN3213T +2.5A / -1.8A
FAN3214T +2.5A / -1.8A
FAN3223C +4.3A / -2.8A
FAN3223T +4.3A / -2.8A
FAN3224C +4.3A / -2.8A
FAN3224T +4.3A / -2.8A
FAN3225C +4.3A / -2.8A
FAN3225T +4.3A / -2.8A
TTL
Dual Inverting Channels
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
SOIC8
TTL
Dual Non-Inverting Channels
CMOS
TTL
Dual Inverting Channels + Dual Enable
Dual Inverting Channels + Dual Enable
Dual Non-Inverting Channels + Dual Enable
Dual Non-Inverting Channels + Dual Enable
Dual Channels of Two-Input/One-Output
Dual Channels of Two-Input/One-Output
Single Inverting Channel + Enable
Single Inverting Channel + Enable
Single Non-Inverting Channel + Enable
Single Non-Inverting Channel + Enable
CMOS
TTL
CMOS
TTL
Single 9A FAN3121C +9.7A / -7.1A
Single 9A FAN3121T +9.7A / -7.1A
Single 9A FAN3122T +9.7A / -7.1A
Single 9A FAN3122C +9.7A / -7.1A
Notes:
CMOS
TTL
CMOS
TTL
12. Typical currents with OUTx at 6V and VDD=12V.
13. Thresholds proportional to an externally supplied reference voltage.
© 2012 Fairchild Semiconductor Corporation
www.fairchildsemi.com
FAN3216 / FAN3217_F085 • Rev. 1.0.0
16
Physical Dimensions
5.00
4.80
A
0.65
3.81
8
5
B
1.75
6.20
5.80
4.00
3.80
5.60
1
4
PIN ONE
INDICATOR
1.27
1.27
(0.33)
M
0.25
C B A
LAND PATTERN RECOMMENDATION
SEE DETAIL A
0.25
0.10
0.25
0.19
C
1.75 MAX
0.10
C
0.51
0.33
OPTION A - BEVEL EDGE
0.50
0.25
x 45
R0.10
R0.10
GAGE PLANE
OPTION B - NO BEVEL EDGE
0.36
NOTES: UNLESS OTHERWISE SPECIFIED
8ٛ
0ٛ
0.90
A) THIS PACKAGE CONFORMS TO JEDEC
MS-012, VARIATION AA, ISSUE C,
B) ALL DIMENSIONS ARE IN MILLIMETERS.
C) DIMENSIONS DO NOT INCLUDE MOLD
FLASH OR BURRS.
SEATING PLANE
(1.04)
0.406
D) LANDPATTERN STANDARD: SOIC127P600X175-8M.
E) DRAWING FILENAME: M08AREV13
DETAIL A
SCALE: 2:1
Figure 37. 8-Lead Small Outline Integrated Circuit (SOIC)
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions,
specifically the warranty therein, which covers Fairchild products.
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:
http://www.fairchildsemi.com/packaging/.
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
17
© 2012 Fairchild Semiconductor Corporation
FAN3216 / FAN3217_F085 • Rev. 1.0.0
www.fairchildsemi.com
18
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