AO4456L [AOS]

Transistor;
AO4456L
型号: AO4456L
厂家: ALPHA & OMEGA SEMICONDUCTORS    ALPHA & OMEGA SEMICONDUCTORS
描述:

Transistor

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中文:  中文翻译
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AO4456  
N-Channel Enhancement Mode Field Effect Transistor  
TM  
SRFET  
General Description  
Features  
SRFETTM AO4456/L uses advanced trench technology  
with a monolithically integrated Schottky diode to  
provide excellent RDS(ON),and low gate charge. This  
device is suitable for use as a low side FET in SMPS,  
load switching and general purpose applications.  
AO4456 and AO4456L are electrically identical.  
-RoHS Compliant  
VDS (V) = 30V  
ID =20A  
(VGS = 10V)  
R
DS(ON) < 4.6m(VGS = 10V)  
DS(ON) < 5.6m(VGS = 4.5V)  
R
UIS TESTED!  
Rg,Ciss,Coss,Crss Tested  
-AO4456L is Halogen Free  
D
S
S
S
G
D
D
D
D
SRFETTM  
Soft Recovery MOSFET:  
Integrated Schottky Diode  
G
S
Absolute Maximum Ratings TA=25°C unless otherwise noted  
Parameter  
Symbol  
Maximum  
Units  
VDS  
Drain-Source Voltage  
30  
V
VGS  
Gate-Source Voltage  
Continuous Drain  
Current AF  
±12  
20  
V
TA=25°C  
TA=70°C  
A
IDSM  
IDM  
16  
Pulsed Drain Current B  
120  
TA=25°C  
TA=70°C  
3.1  
PDSM  
W
Power Dissipation  
2.0  
Avalanche Current B, G  
IAR  
55  
A
Repetitive avalanche energy L=0.1mH B, G  
EAR  
151  
mJ  
°C  
TJ, TSTG  
Junction and Storage Temperature Range  
-55 to 150  
Thermal Characteristics  
Parameter  
Symbol  
Typ  
31  
Max  
40  
Units  
°C/W  
°C/W  
°C/W  
Maximum Junction-to-Ambient A  
t 10s  
RθJA  
RθJL  
Maximum Junction-to-Ambient A  
Maximum Junction-to-Lead C  
59  
75  
Steady-State  
Steady-State  
16  
24  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4456  
Electrical Characteristics (TJ=25°C unless otherwise noted)  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
STATIC PARAMETERS  
BVDSS  
Drain-Source Breakdown Voltage  
ID=1mA, VGS=0V  
VDS=30V, VGS=0V  
30  
V
0.1  
20  
IDSS  
Zero Gate Voltage Drain Current  
mA  
µA  
TJ=125°C  
TJ=125°C  
IGSS  
Gate-Body leakage current  
Gate Threshold Voltage  
On state drain current  
VDS=0V, VGS= ±12V  
0.1  
2.4  
VGS(th)  
ID(ON)  
V
DS=VGS ID=250µA  
VGS=10V, VDS=5V  
GS=10V, ID=20A  
1.4  
1.8  
V
A
120  
V
3.8  
5.9  
4.6  
7.4  
5.6  
mΩ  
mΩ  
RDS(ON)  
Static Drain-Source On-Resistance  
VGS=4.5V, ID=20A  
VDS=5V, ID=20A  
IS=1A,VGS=0V  
4.5  
gFS  
VSD  
IS  
Forward Transconductance  
Diode Forward Voltage  
112  
0.37  
S
V
A
0.5  
5
Maximum Body-Diode + Schottky Continuous Current  
DYNAMIC PARAMETERS  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
6430 7716  
756  
pF  
pF  
pF  
V
GS=0V, VDS=15V, f=1MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate resistance  
352  
493  
VGS=0V, VDS=0V, f=1MHz  
0.3  
0.6  
0.9  
SWITCHING PARAMETERS  
Qg(10V)  
Total Gate Charge  
Total Gate Charge  
Gate Source Charge  
Gate Drain Charge  
Turn-On DelayTime  
Turn-On Rise Time  
Turn-Off DelayTime  
Turn-Off Fall Time  
80  
36  
96  
44  
115  
53  
nC  
nC  
nC  
nC  
ns  
Qg(4.5V)  
Qgs  
Qgd  
tD(on)  
tr  
V
GS=10V, VDS=15V, ID=20A  
17  
13  
17.5  
10  
VGS=10V, VDS=15V, RL=0.75,  
GEN=3Ω  
ns  
R
tD(off)  
tf  
56  
ns  
10.5  
20  
ns  
trr  
IF=20A, dI/dt=300A/µs  
IF=20A, dI/dt=300A/µs  
IF=20A, dI/dt=500A/µs  
IF=20A, dI/dt=500A/µs  
25  
23  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
Body Diode Reverse Recovery Time  
Body Diode Reverse Recovery Charge  
ns  
Qrr  
26  
nC  
trr  
18  
ns  
Qrr  
38  
nC  
A: The value of R θJA is measured with the device mounted on 1in 2 FR-4 board with 2oz. Copper, in a still air environment with  
A=25°C. The value in any given application depends on the user's specific board design.  
T
B: Repetitive rating, pulse width limited by junction temperature.  
C. The RθJA is the sum of the thermal impedence from junction to lead R θJL and lead to ambient.  
D. The static characteristics in Figures 1 to 6 are obtained using <300 µs pulses, duty cycle 0.5% max.  
E. These tests are performed with the device mounted on 1 in 2 FR-4 board with 2oz. Copper, in a still air environment with T A=25°C. The SOA  
curve provides a single pulse rating.  
F. The current rating is based on the t10s junction to ambient thermal resistance rating.  
G: L=100uH, VDD=0V, RG=0, rated VDS=30V and VGS=10V  
Rev8: July 2008  
THIS PRODUCT HAS BEEN DESIGNED AND QUALIFIED FOR THE CONSUMER MARKET. APPLICATIONS OR USES AS CRITICAL  
COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS ARE NOT AUTHORIZED. AOS DOES NOT ASSUME ANY LIABILITY ARISING  
OUT OF SUCH APPLICATIONS OR USES OF ITS PRODUCTS. AOS RESERVES THE RIGHT TO IMPROVE PRODUCT DESIGN,  
FUNCTIONS AND RELIABILITY WITHOUT NOTICE.  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4456  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
150  
120  
90  
60  
30  
0
30  
25  
20  
15  
10  
5
6V  
VDS=5V  
10V  
4.5V  
125°  
VGS=3.5V  
25°C  
0
0
1
2
3
4
5
1
1.5  
2
2.5  
3
3.5  
4
V
DS (Volts)  
VGS(Volts)  
Figure 1: On-Region Characteristics  
Figure 2: Transfer Characteristics  
6
5
4
3
1.8  
1.6  
1.4  
1.2  
1
VGS=10V  
ID=20A  
VGS=4.5V  
VGS=4.5V  
VGS=10V  
2
0
0.8  
5
10  
15  
20  
25  
30  
0
30  
60  
90  
120  
150  
180  
I
D (A)  
Temperature (°C)  
Figure 4: On-Resistance vs. Junction  
Temperature  
Figure 3: On-Resistance vs. Drain Current and  
Gate Voltage  
10  
8
1.0E+02  
1.0E+01  
1.0E+00  
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
ID=20A  
125°C  
125°C  
25°C  
6
4
25°C  
2
0.0  
0.2  
0.4  
SD (Volts)  
Figure 6: Body-Diode Characteristics  
0.6  
0.8  
1.0  
2
4
6
8
10  
V
V
GS (Volts)  
Figure 5: On-Resistance vs. Gate-Source Voltage  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4456  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
12000  
10  
8
10000  
8000  
6000  
4000  
2000  
0
VDS=15V  
ID=20A  
Ciss  
6
4
Crss  
2
Coss  
0
0
20  
40  
60  
80  
100  
0
5
10  
15  
20  
25  
30  
Qg (nC)  
V
DS (Volts)  
Figure 7: Gate-Charge Characteristics  
Figure 8: Capacitance Characteristics  
1000  
100  
10  
1000.0  
100.0  
10.0  
1.0  
In descending order  
TA=25°C, 100°C, 125°C, 150°C  
10µs  
100µ  
RDS(ON)  
limited  
1ms  
0.1s  
1s  
10s  
0.1  
DC  
10  
TJ(Max)=150°C  
TA=25°C  
1
0.0  
0.001  
0.01  
0.1  
1
10  
100  
1000  
0.1  
1
100  
VDS (Volts)  
Figure 10: Maximum Forward Biased  
Safe Operating Area (Note E)  
Time in Avalache, tA (ms)  
Figure 9: Single Pulse Avalanche Capability  
100  
TJ(Max)=150°C  
TA=25°C  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
0.0001  
0.001  
0.01  
0.1  
Pulse Width (s)  
Figure11: Single Pulse Power Rating Junction-to-Ambient (Note E)  
1
10  
100  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4456  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
10  
D=Ton/T  
In descending order  
D=0.5, 0.3, 0.1, 0.05, 0.02, 0.01, single pulse  
TJ,PK=TA+PDM.ZθJA.RθJA  
RθJA=40°C/W  
1
0.1  
PD  
Ton  
T
Single Pulse  
0.01  
0.00001  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse Width (s)  
Figure 12: Normalized Maximum Transient Thermal Impedance (Note E)  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4456  
TYPICAL ELECTRICAL AND THERMAL CHARACTERISTICS  
1.0E-01  
0.9  
0.8  
20A  
1.0E-02  
10A  
0.7  
VDS=24V  
0.6  
1.0E-03  
VDS=12V  
0.5  
5A  
0.4  
1.0E-04  
0.3  
0.2  
0.1  
0
1.0E-05  
1.0E-06  
IS=1A  
0
50  
100  
150  
200  
0
50  
100  
Temperature (°C)  
150  
200  
Temperature (°C)  
Figure 12: Diode Reverse Leakage Current vs.  
Junction Temperature  
Figure 13: Diode Forward voltage vs. Junction  
Temperature  
70  
60  
50  
40  
30  
20  
10  
8
25  
3
125ºC  
di/dt=800A/us  
di/dt=800A/us  
125ºC  
2.5  
2
20  
15  
10  
5
7
6
5
4
25ºC  
trr  
25ºC  
Qrr  
Irm  
1.5  
1
125ºC  
25ºC  
S
25ºC  
0.5  
0
125ºC  
0
0
0
0
5
10  
15  
20  
25  
30  
5
10  
15  
20  
25  
30  
Is (A)  
Is (A)  
Figure 15: Diode Reverse Recovery Time and Soft  
Coefficient vs. Conduction Current  
Figure 14: Diode Reverse Recovery Charge and  
Peak Current vs. Conduction Current  
60  
8
35  
30  
25  
20  
15  
10  
5
3
2
1
0
125ºC  
25ºC  
Is=20A  
7
6
5
4
3
2
1
0
Is=20A  
50  
40  
30  
20  
10  
0
125ºC  
25ºC  
125ºC  
25ºC  
25ºC  
trr  
Qrr  
S
125ºC  
Irm  
0
0
200  
400  
600  
800  
1000  
0
200  
400  
600  
800  
1000  
di/dt (A)  
di/dt (A)  
Figure 16: Diode Reverse Recovery Charge and  
Peak Current vs. di/dt  
Figure 17: Diode Reverse Recovery Time and Soft  
Coefficient vs. di/dt  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  
AO4456  
Gate Charge Test Circuit & Waveform  
Vgs  
Qg  
10V  
+
VDC  
+
Qgs  
Qgd  
Vds  
VDC  
-
-
DUT  
Vgs  
Vds  
Ig  
Charge  
Resistive Switching Test Circuit& Waveforms  
RL  
Vds  
90%  
10%  
+
DUT  
Vdd  
Vgs  
VDC  
Rg  
-
Vgs  
Vgs  
t d(on)  
t
r
t d(off)  
t
f
t on  
toff  
Unclamped Inductive Switching (UIS) Test Circuit & Waveforms  
L
2
EAR= 1/2 LI  
AR  
BVDSS  
Vds  
Id  
Vds  
+
Vgs  
Vdd  
IAR  
Vgs  
VDC  
Id  
Rg  
-
DUT  
Vgs  
Vgs  
Diode RecoveryTest Circuit & Waveforms  
Qrr = - Idt  
Vds +  
Vds -  
Ig  
DUT  
Vgs  
Isd  
trr  
L
IF  
Isd  
dI/dt  
+
IRM  
Vdd  
Vgs  
VDC  
Vdd  
-
Vds  
Alpha & Omega Semiconductor, Ltd.  
www.aosmd.com  

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