AS6VB51216-70BI [ALSC]

Standard SRAM, 512KX16, 70ns, CMOS, PBGA48, 7 X 9 MM, CSP, FBGA-48;
AS6VB51216-70BI
型号: AS6VB51216-70BI
厂家: ALLIANCE SEMICONDUCTOR CORPORATION    ALLIANCE SEMICONDUCTOR CORPORATION
描述:

Standard SRAM, 512KX16, 70ns, CMOS, PBGA48, 7 X 9 MM, CSP, FBGA-48

静态存储器 内存集成电路
文件: 总10页 (文件大小:158K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
January 2002  
Advance information  
AS6VB51216  
&
TM  
2.7V to 3.3V 512K X 16 Intelliwatt Super Low-Power CMOS SRAM  
Features  
• AS6VB51216  
• 1.5V data retention  
• Intelliwatt™ active power circuitry  
• Industrial and commercial temperature ranges available  
• Organization: 524,288 words × 16 bits  
• 2.7V to 3.3V power supply range  
• Fast access time of 55 ns  
• Equal access and cycle times  
• Easy memory expansion with CS1, CS2, OE inputs  
• Smallest footprint packages  
- 48-ball FBGA; 7.0 x 9.0 mm  
• ESD protection 2000 volts  
• Low power consumption: ACTIVE  
- 132 mW max at 3.3V and 55 ns  
• Low power consumption: STANDBY  
- 66 µW max at 3.3V  
• Latch-up current 200 mA  
Pin arrangement (top view)  
Logic block diagram  
48-CSP Ball-Grid-Array Package  
V
V
1
2
3
4
5
6
DD  
A
B
LB  
OE  
A0  
A3  
A1  
A4  
A2  
CS2  
512K × 16  
Array  
(8,388,608)  
SS  
I/O8 UB  
CS I/O0  
C
D
E
I/O9 I/O10 A5  
VSS I/O11 A17  
VCC I/O12 VSS  
A6 I/O1 I/O2  
A7 I/O3 VCC  
A16 I/O4 VSS  
I/O0–I/O7  
I/O8–I/O15  
I/O  
Control circuit  
buffer  
F
I/O14 I/O13 A14 A15 I/O5 I/O6  
I/O15 NC A12 A13 WE I/O7  
A18 A8 A9  
A10 A11 DNU1  
G
H
Column decoder  
WE  
ꢀꢁꢂꢃꢄꢁꢅꢁꢂꢆꢁꢃꢆꢇꢁꢄꢈꢉ  
A9~A18  
UB  
OE  
LB  
CS1  
CS2  
ꢀꢁꢂꢁꢃꢄꢅꢆꢇꢈꢉꢊꢅꢋꢁ  
VCC Range  
Power Dissipation  
Operating (ICC1 Standby (ISB2  
)
)
Min  
(V)  
Ty p 2  
(V)  
Max  
Speed  
(ns)  
Product  
(V)  
3.3  
3.3  
3.3  
Max (mA)  
Max (µA)  
AS6VB51216-55  
AS6VB51216-70  
AS6VB51216-85  
2.7  
2.7  
2.7  
3.0  
3.0  
3.0  
55  
4
4
4
25  
25  
25  
70  
85  
1/21/02; V.0.9.6  
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Copyright © Alliance Semiconductor. All rights reserved.  
AS6VB51216  
&
Functional description  
The AS6VB51216 is a low-power CMOS 8,388,608-bit Static Random Access Memory (SRAM) device organized as 524,288  
words × 16 bits. It is designed for memory applications where slow data access, low power, and simple interfacing are desired.  
Equal address access and cycle times (tAA, tRC, tWC) of 55/70/85 ns are ideal for low-power applications. Active high and low  
chip enables (CS1 and CS2) permit easy memory expansion with multiple-bank memory systems.  
When CS1 is high or CS2 is low, or UB and LB are high, the device enters standby mode: the AS6VB51216 is guaranteed not to  
exceed 66 µW power consumption at 3.3V. The device also retains data when VCC is reduced to 1.5V for even lower power  
consumption.  
The device can also be put into standby mode when deselected (CS1 is high or CS2 is low, or UB and LB are high). The input/  
output pins (I/O0 through I/O15) are placed in a high-impedance state when: deselected ( CS1 is high or CS2 is low, or UB and  
LB are high), outputs are disabled (OE High), UB and LB are disabled (UB, LB High), or during a write operation ( CS1 is low or  
CS2 is high and WE Low).  
Writing to the device is accomplished by taking Chip Enables CS1 Low, CS2 High and Write Enable (WE) input Low. If Byte Low  
Enable (LB) is Low, then data from I/O pins (I/O0 through I/O7), is written into the location specified on the address pins (A0  
through A18). If Byte High Enable (UB) is Low, then data from I/O pins (I/O8 through I/O15) is written into the location spec-  
ified on the address pins (A0 through A18). To avoid bus contention, external devices should drive I/O pins only after outputs  
have been disabled with output enable (OE) or write enable (WE).  
Reading from the device is accomplished by taking Chip Enable CS1 Low, CS2 High and Output Enable (OE) Low while forcing  
the Write Enable (WE) High. If Byte Low Enable (LB) is Low, then data from the memory location specified by the address pins  
will appear on I/O0 to I/O7. If Byte High Enable (UB) is Low, then data from memory will appear on I/O8 to I/O15.  
These devices provide multiple center power and ground pins, and separate byte enable controls, allowing individual bytes to be  
written and read. LB controls the lower bits, I/O0–I/O7, and UB controls the higher bits, I/O8–I/O15.  
All chip inputs and outputs are CMOS-compatible, and operation is from a single 2.7V to 3.3V supply. Device is available in the  
JEDEC 48-ball FBGA package.  
ꢌꢍꢎꢆꢂꢊꢄꢁꢈꢏꢐꢑꢅꢏꢊꢏꢈꢒꢐꢄꢅꢇꢉꢎ  
Parameter  
Voltage on VCC relative to VSS  
Voltage on any I/O pin relative to GND  
Power dissipation  
Symbol  
VtIN  
Min  
–0.5  
–0.5  
Max  
VCC + 0.5  
VCC + 0.5  
1.0  
Unit  
V
VtI/O  
PD  
V
W
Storage temperature (plastic)  
Temperature with VCC applied  
DC output current (low)  
Tstg  
–65  
–55  
+150  
°C  
°C  
mA  
Tbias  
IOUT  
+125  
20  
Note: Stresses greater than those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only and functional oper-  
ation of the device at these or any other conditions outside those indicated in the operational sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect reliability.  
1/21/02; V.0.9.6  
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P. 2 of 10  
AS6VB51216  
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ꢓꢒꢊꢄꢔꢈꢄꢐꢍꢂꢁ  
Supply  
CS1  
H
CS2  
X
WE  
X
OE  
X
LB  
X
H
X
X
L
UB  
X
H
X
X
H
L
Current I/O0–I/O7 I/O8–I/O15  
Mode  
Standby  
X
X
X
X
ISB  
ICC  
ICC  
High Z  
High Z  
X
L
X
X
L
X
H
H
High Z  
DOUT  
High Z  
DOUT  
DIN  
High Z  
High Z  
DOUT  
DOUT  
High Z  
DIN  
Output disable  
Read  
L
L
H
H
H
L
L
H
L
L
L
H
L
X
H
L
ICC  
High Z  
DIN  
Write  
L
DIN  
Key: X = Don’t care, L = Low, H = High.  
ꢕꢖꢈꢗꢁꢃꢆꢏꢏꢁꢇꢋꢁꢋꢈꢆꢘꢁꢒꢐꢄꢅꢇꢉꢈꢃꢆꢇꢋꢅꢄꢅꢆꢇꢈꢙꢆꢚꢁꢒꢈꢄꢔꢁꢈꢆꢘꢁꢒꢐꢄꢅꢇꢉꢈꢒꢐꢇꢉꢁꢛ  
Parameter  
Vcc  
Description  
Test Conditions  
Min  
Max  
Unit  
V
Supply voltage  
-
2.7  
2.4  
3.3  
VOH  
VOL  
Output HIGH Voltage  
Output LOW Voltage  
Input HIGH Voltage  
Input LOW Voltage  
Input Load Current  
Output Load Current  
IOH = –1.0mA  
V
IOL = 2.1mA  
0.4  
VCC + 0.2  
0.6  
V
VIH  
-
2.2  
–0.2  
–1  
V
VIL  
-
V
IIX  
GND < VIN < VCC  
+1  
µA  
µA  
IOZ  
GND < VO < VCC; Outputs High Z  
–1  
+1  
IOUT = 0mA,  
f = 0  
ICC  
VCC Operating Supply Current  
3
4
mA  
mA  
ICC1  
@
Average VCC Operating Supply  
Current at 1 MHz  
IOUT = 0mA,  
f =1MHz  
1 MHz  
40 mA at 55ns  
30 mA at 70ns  
25 mA at 85ns  
Average VCC Operating Supply  
Current  
ICC2  
IOUT = 0mA, f = fMax  
mA  
CS1 > VCC – 0.2V or CS2< 0.2V  
or UB = LB. > Vcc -0.2V.  
[Other inputs = VIL or VIH, f = 0]  
CS Power Down Current; TTL  
Inputs  
ISB  
300  
20  
µA  
µA  
CS1 > VCC – 0.2V or CS2< 0.2V or  
UB = LB > VCC – 0.2V.  
[Other inputs = 0V – VCC, f = fMax  
CS Power Down Current;  
CMOS Inputs  
ISB1  
]
1/21/02; V.0.9.6  
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AS6VB51216  
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ꢅꢆ  
Capacitance (f = 1 MHz, T = Room temperature, V = NOMINAL)  
a
CC  
Parameter  
Input capacitance  
I/O capacitance  
Symbol  
CIN  
Signals  
A, CS, CS2, WE, OE, LB, UB  
I/O  
Test conditions  
Max  
5
Unit  
pF  
VIN = 0V  
CI/O  
VIN = VOUT = 0V  
7
pF  
ꢀꢁꢄ  
Read cycle (over the operating range)  
–55  
–70  
–85  
Parameter  
Symbol  
tRC  
Min  
Max  
Min  
70  
Max  
Min  
85  
Max  
Unit  
Notes  
Read cycle time  
55  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address access time  
tAA  
55  
55  
25  
70  
70  
35  
85  
85  
35  
3
3
Chip enable (CS) access time  
Output enable (OE) access time  
Output hold from address change  
CSꢁꢊꢆꢋꢁꢇo output in low Z  
CS high to output in high Z  
OE low to output in low Z  
UB/LB access time  
tACS  
tOE  
tOH  
tCLZ  
tCHZ  
tOLZ  
tBA  
10  
10  
0
10  
10  
0
10  
10  
0
5
4, 5  
4, 5  
4, 5  
20  
25  
25  
5
5
5
55  
70  
85  
UB/LB low to low Z  
tBLZ  
tBHZ  
tOHZ  
tPU  
10  
0
10  
0
10  
0
4, 5  
4, 5  
4, 5  
4, 5  
4, 5  
UB/LB high to high Z  
OE high to output in high Z  
Power up time  
20  
20  
25  
25  
25  
25  
0
0
0
0
0
0
Power down time  
tPD  
55  
70  
85  
Key to switching waveforms  
Rising input  
Falling input  
Undefined/don’t care  
ꢀꢁꢂꢁꢃꢁꢄ  
Read waveform 1 (address controlled)  
(CS1  
=
OE  
=
LB  
=
UB=Low, CS2=High)  
t
RC  
Address  
t
AA  
t
t
OH  
OH  
D
Previous data valid  
Data valid  
OUT  
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AS6VB51216  
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ꢀꢁꢂꢁꢇꢁꢄ ꢆ  
Read waveform 2 (CS1, CS2, OE, UB, LB controlled)  
[WE=High]  
t
RC  
Address  
t
AA  
OE  
t
OE  
t
t
OH  
OLZ  
CS1  
t
OHZ  
t
ACS  
CS2  
t
t
HZ  
LZ  
LB, UB  
t
t
BA  
BHZ  
t
BLZ  
D
Data valid  
OUT  
ꢈꢈ  
Write cycle (over the operating range)  
–55  
–70  
–85  
Parameter  
Symbol  
Min  
55  
45  
45  
0
Max  
Min  
Max  
Min  
85  
60  
60  
0
Max  
Unit  
ns  
Notes  
12  
Write cycle time  
tWC  
tCW  
tAW  
tAS  
70  
60  
60  
0
Chip enable to write end  
Address setup to write end  
Address setup time  
ns  
ns  
ns  
ns  
12  
Write pulse width  
tWP  
tAH  
tDW  
tDH  
tWZ  
tOW  
tBW  
40  
0
50  
0
50  
0
Address hold from end of write  
Data valid to write end  
Data hold time  
ns  
ns  
25  
0
30  
0
30  
0
ns  
ns  
ns  
ns  
4, 5  
4, 5  
4, 5  
Write enable to output in high Z  
Output active from write end  
UB/LB low to end of write  
0
20  
0
20  
0
20  
5
5
5
45  
60  
60  
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AS6VB51216  
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ꢈꢉꢁꢈꢈ  
Write waveform 1 (WE controlled)  
t
t
WC  
Address  
CS1  
t
AH  
CW  
t
BW  
CS2  
LB, UB  
t
AW  
t
t
WP  
AS  
WE  
t
t
DH  
DW  
Data valid  
D
IN  
t
WZ  
t
OW  
D
Data undefined  
OUT  
High Z  
ꢈꢉꢁꢈꢈ  
Write waveform 2 (CS controlled)  
t
WC  
Address  
t
t
AH  
AS  
t
CW  
CS1  
CS2  
LB, UB  
WE  
t
AW  
t
BW  
t
WP  
t
t
DH  
DW  
Data valid  
High Z  
D
IN  
t
t
CLZ  
WZ  
t
OW  
D
Data undefined  
OUT  
High Z  
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AS6VB51216  
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ꢈꢀꢁꢊ  
Data retention characteristics (over the operating range)  
Parameter  
Symbol  
Test conditions  
Min  
1.5  
Max  
3.3  
10  
Unit  
V
VCC for data retention  
VDR  
VCC = 1.5V  
CS VCC – 0.1V or  
UB = LB = > VCC – 0.1V  
VIN VCC – 0.1V or  
VIN 0.1V  
Data retention current  
ICCDR  
tCDR  
µA  
ns  
Chip deselect to data retention time  
Operation recovery time  
0
tR  
tRC  
ns  
Data retention waveform  
CS1 controlled  
t
t
R
CDR  
Data retention mode  
V
CC  
1.65V  
1.4V  
V
DR  
CS1,  
LB/UB  
GND  
CS1VCC -0.2, LB=UB VCC -0.2V  
CS2 controlled  
Data retention mode  
V
CC  
1.65V  
CS2  
t
t
CDR  
R
V
DR  
CS20.2V  
0.4V  
GND  
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AS6VB51216  
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AC test loads and waveforms  
Thevenin equivalent:  
R1  
R1  
V
R
CC  
V
TH  
CC  
V
OUTPUT  
OUTPUT  
OUTPUT  
30 pF  
5 pF  
ALL INPUT PULSES  
90%  
V
Typ  
R2  
CC  
R2  
90%  
10%  
10%  
INCLUDING  
JIG AND  
INCLUDING  
JIG AND  
SCOPE  
< 5 ns  
GND  
(a)  
SCOPE  
(b)  
(c)  
Parameters  
VCC = 2.7V  
Unit  
Ohms  
Ohms  
Ohms  
Volts  
R1  
R2  
992  
1842  
645  
RTH  
VTH  
1.755V  
Notes  
1
2
3
4
5
6
7
8
9
During V power-up, a pull-up resistor to V on CS is required to meet I specification.  
CC CC SB  
This parameter is sampled, but not 100% tested.  
For test conditions, see AC Test Conditions.  
t
and t are specified with C = 5pF as in Figure C. Transition is measured 500 mV from steady-state voltage.  
CHZ L  
CLZ  
This parameter is guaranteed, but not tested.  
WE is HIGH for read cycle.  
CS and OE are LOW for read cycle.  
Address valid prior to or coincident with CS transition LOW.  
All read cycle timings are referenced from the last valid address to the first transitioning address.  
10 CS or WE must be HIGH during address transitions. Either CS or WE asserting high terminates a write cycle.  
11 All write cycle timings are referenced from the last valid address to the first transitioning address.  
12 N/A.  
13 1.5V data retention applies to commercial and industrial temperature range operations.  
14 C = 30pF, except at high Z and low Z parameters, where C = 5pF.  
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AS6VB51216  
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Package diagrams and dimensions  
48-ball FBGA  
Top View  
Bottom View  
Ball #A1 Index  
6
5
4
3
2
1
Ball #A1  
A
B
SRAM Die  
C
D
E
C1  
C
F
A
G
H
Elastomer  
A
B
B1  
Detail View  
A
Side View  
D
Ε2  
Ε
E2  
Y
E
Die  
Die  
Ε1  
0.3/Typ  
Minimum Ty pi c a l Maximum  
Notes  
A
6.90  
0.75  
7.00  
3.75  
9.0  
1. Bump counts: 48 (8 row × 6 column).  
2. Pitch: (x,y) = 0.75 mm × 0.75 mm (typ).  
3. Units: millimeters.  
B
B1  
C
7.10  
8.4  
8.6  
4. All tolerance are 0.050 unless otherwise specified.  
5. Typ: typical.  
C1  
D
5.25  
0.35  
0.30  
0.40  
1.20  
6. Y is coplanarity: 0.08 (max).  
E
E1  
E2  
Y
0.68  
0.25  
0.22  
0.27  
0.08  
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AS6VB51216  
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Ordering codes  
Speed (ns)  
Ordering Code  
AS6VB51216-55BI  
AS6VB51216-70BI  
AS6VB51216-85BI  
AS6VB51216-55BC  
AS6VB51216-70BC  
AS6VB51216-85BC  
Package Type  
Operating Range  
55  
70  
85  
55  
70  
85  
48-ball fine pitch BGA  
48-ball fine pitch BGA  
48-ball fine pitch BGA  
48-ball fine pitch BGA  
48-ball fine pitch BGA  
48-ball fine pitch BGA  
Industrial  
Commercial  
Part numbering system  
AS6UA  
51216  
-55/70/85  
B
C or I  
Temperature range:  
C: Commercial: 0° C to 70° C  
I: Industrial: –40° C to 85° C  
SRAM Intelliwatt™  
Package:  
B: CSP BGA  
Device number  
Nano-seconds  
prefix  
1/21/02; V.0.9.6  
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© Copyright Alliance Semiconductor Corporation. All rights reserved. Our three-point logo, our name and Intelliwatt are trademarks or registered trademarks of Alliance. All other brand and product names may be the trademarks  
of their respective companies. Alliance reserves the right to make changes to this document and its products at any time without notice. Alliance assumes no responsibility for any errors that may appear in this document. The data  
contained herein represents Alliance's best data and/or estimates at the time of issuance. Alliance reserves the right to change or correct this data at any time, without notice. If the product described herein is under development,  
significant changes to these specifications are possible. The information in this product data sheet is intended to be general descriptive information for potential customers and users, and is not intended to operate as, or provide,  
any guarantee or warrantee to any user or customer. Alliance does not assume any responsibility or liability arising out of the application or use of any product described herein, and disclaims any express or implied warranties  
related to the sale and/or use of Alliance products including liability or warranties related to fitness for a particular purpose, merchantability, or infringement of any intellectual property rights, except as express agreed to in  
Alliance's Terms and Conditions of Sale (which are available from Alliance). All sales of Alliance products are made exclusively according to Alliance's Terms and Conditions of Sale. The purchase of products from Alliance does not  
convey a license under any patent rights, copyrights, mask works rights, trademarks, or any other intellectual property rights of Alliance or third parties. Alliance does not authorize its products for use as critical components in life-  
supporting systems where a malfunction or failure may reasonably be expected to result in significant injury to the user, and the inclusion of Alliance products in such life-supporting systems implies that the manufacturer assumes  
all risk of such use and agrees to indemnify Alliance against all claims arising from such use.  

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3.0V to 3.6V 256K?6 IntelliwattTM low-power CMOS SRAM with one chip enable
ETC

AS6WA5128

3.0V to 3.6V 512K 】 8 Intelliwatt low-power CMOS SRAM
ALSC

AS6WA5128-55BC

Standard SRAM, 512KX8, 55ns, CMOS, PBGA36, CSP, FBGA-48/36
ALSC