AD5422ACPZ-REEL [ADI]
Single Channel, 12-/16-Bit, Serial Input, Current Source and Voltage Output DACs; 单通道, 12位/ 16位,串行输入,电流源和电压输出DAC型号: | AD5422ACPZ-REEL |
厂家: | ADI |
描述: | Single Channel, 12-/16-Bit, Serial Input, Current Source and Voltage Output DACs |
文件: | 总40页 (文件大小:1159K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Single Channel, 12-/16-Bit, Serial Input,
Current Source and Voltage Output DACs
AD5412/AD5422
FEATURES
GENERAL DESCRIPTION
12-/16-bit resolution and monotonicity
The AD5412/AD5422 are low-cost, precision, fully integrated
Current output ranges: 4 mA to 20 mA, 0 mA to 20 mA,
0 mA to 24 mA
12-/16-bit digital-to-analog converters (DAC) offering a pro-
grammable current source and programmable voltage output
designed to meet the requirements of industrial process control
applications.
0.01 ꢀ FSR typical total unadjusted error (TUE)
3 ppm/°C output drift
Voltage output ranges: 0 V to 5 V, 0 V to 10 V, 5 V, 10 V
10ꢀ overrange
The output current range is programmable at 4 mA to 20 mA,
0 mA to 20 mA, or an overrange function of 0 mA to 24 mA.
0.01 ꢀ FSR typical total unadjusted error (TUE)
2 ppm/°C output drift
Flexible serial digital interface
On-chip output fault detection
On-chip reference: 10 ppm/°C maximum
Asynchronous clear function
Power supply range
AVDD: 10.8 V to 40 V
AVSS: −26.4 V to −3 V/0 V
Voltage output is provided from a separate pin that can be
configured to provide 0 V to 5 V, 0 V to 10 V, 5 V, or 10 V
output ranges; an overrange of 10% is available on all ranges.
Analog outputs are short and open-circuit protected and can
drive capacitive loads of 1 μF.
The device operates with an AVDD power supply range from
10.8 V to 40 V. Output loop compliance is 0 V to AVDD – 2.5 V.
The flexible serial interface is SPI- and MICROWIRE™-
compatible and can be operated in 3-wire mode to minimize
the digital isolation required in isolated applications.
Output loop compliance: AVDD – 2.5 V
Temperature range: −40°C to +85°C
TSSOP and LFCSP packages
The device also includes a power-on-reset function, ensuring
that the device powers up in a known state. The part also
includes an asynchronous clear pin (CLEAR) that sets the
outputs to zero-scale/midscale voltage output or the low
end of the selected current range.
APPLICATIONS
Process control
Actuator control
PLC
The total output error is typically 0.01% in current mode and
0.01% in voltage mode.
Table 1. Pin-Compatible Devices
Part Number
Description
AD5410
Single channel, 12-bit, serial
input current source DAC
AD5420
Single channel, 16-bit, serial
input current source DAC
Rev. A
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registeredtrademarks arethe property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
Fax: 781.461.3113
www.analog.com
©2009 Analog Devices, Inc. All rights reserved.
AD5412/AD5422
TABLE OF CONTENTS
Features .............................................................................................. 1
AD5412/AD5422 Features ............................................................ 31
Fault Alert.................................................................................... 31
Voltage Output Short Circuit Protection ................................ 31
Voltage Output Overrange........................................................ 31
Voltage Output Force-Sense ..................................................... 31
Asynchronous Clear (CLEAR)................................................. 31
Internal Reference ...................................................................... 31
External Current Setting Resistor ............................................ 31
Digital Power Supply.................................................................. 32
External Boost Function ........................................................... 32
External Compensation Capacitor........................................... 32
Digital Slew Rate Control.......................................................... 32
IOUT Filtering Capacitors (LFCSP Package)............................. 33
Applications Information.............................................................. 35
Driving Inductive Loads............................................................ 35
Transient Voltage Protection .................................................... 35
Galvanically Isolated Interface ................................................. 35
Microprocessor Interfacing....................................................... 35
Layout Guidelines....................................................................... 35
Thermal and Supply Considerations....................................... 36
Industrial Analog Output Module........................................... 37
Outline Dimensions....................................................................... 38
Ordering Guide .......................................................................... 39
Applications....................................................................................... 1
General Description......................................................................... 1
Revision History ............................................................................... 2
Functional Block Diagram .............................................................. 3
Specifications..................................................................................... 4
AC Performance Characteristics................................................ 7
Timing Characteristics ................................................................ 8
Absolute Maximum Ratings.......................................................... 10
ESD Caution................................................................................ 10
Pin Configurations and Function Descriptions ......................... 11
Typical Performance Characteristics ........................................... 13
General......................................................................................... 13
Voltage Output............................................................................ 15
Current Output........................................................................... 20
Terminology .................................................................................... 24
Theory of Operation ...................................................................... 26
Architecture................................................................................. 26
Serial Interface ............................................................................ 27
Power-On State ........................................................................... 28
Data Register............................................................................... 29
Control Register.......................................................................... 29
Reset Register.............................................................................. 30
Status Register............................................................................. 30
REVISION HISTORY
8/09—Rev. 0 to Rev. A
Changes to Architecture Section.................................................. 26
Changes to AD5412/AD5422 Features Section ......................... 31
Added IOUT Filtering Capacitors (LFCSP Package)Section,
Including Figure 69 to Figure 72 and Table 24........................... 33
Changes to Thermal and Supply Considerations Section......... 36
Updated Outline Dimensions....................................................... 38
Changes to Ordering Guide.......................................................... 39
Changes to Table 2............................................................................ 4
Changes to Table 3............................................................................ 7
Changes to Introduction to Table 4................................................ 8
Changes to Introduction to Table 5 and to Table 5.................... 10
Changes to Pin Configurations and Function Descriptions
Section, Added Figure 6, Renumbered Subsequent Figures..... 11
Changes to Theory of Operation Section.................................... 26
5/09—Revision 0: Initial Version
Rev. A | Page 2 of 40
AD5412/AD5422
FUNCTIONAL BLOCK DIAGRAM
DV
CC
SELECT
DV
AV
AV
DD
CC
SS
CLEAR
SELECT
R2
R3
AD5412/AD5422
BOOST
CLEAR
LATCH
SCLK
SDIN
12/16
INPUT SHIFT
REGISTER
AND CONTROL
LOGIC
12-/16-BIT
DAC
I
OUT
SDO
FAULT
R
SET
POWER-ON
RESET
R
SET
VREF
+V
SENSE
RANGE
SCALING
V
OUT
–V
SENSE
REFOUT
REFIN
GND
C
COMP
Figure 1.
Rev. A | Page 3 of 40
AD5412/AD5422
SPECIFICATIONS
AVDD = 10.8 V to 26.4 V, AVSS = −26.4 V to −3 V/0 V, AVDD + |AVSS| < 52.8 V, GND = 0 V, REFIN = 5 V external; DVCC = 2.7 V to 5.5 V.
VOUT: RLOAD = 1 kΩ, CL = 200 pF, IOUT: RLOAD = 350 ꢀ; all specifications TMIN to TMAX, unless otherwise noted.
Table 2.
Parameter1
Min
Typ
Max
Unit
Test Conditions/Comments
VOLTAGE OUTPUT
Output Voltage Ranges
0
0
−5
−10
5
V
V
V
V
10
+5
+10
Accuracy
Resolution
Output unloaded
AD5422
AD5412
16
12
Bits
Bits
Total Unadjusted Error (TUE)
B Version
−0.1
−0.05
−0.3
−0.1
−0.008
−0.032
−1
+0.1
+0.05
+0.3
+0.1
+0.008
+0.032
+1
% FSR
% FSR
% FSR
% FSR
% FSR
% FSR
LSB
0.01
TA = 25°C
A Version
0.05
TA = 25°C
AD5422
AD5412
Relative Accuracy (INL)2
Differential Nonlinearity (DNL)
Bipolar Zero Error
Guaranteed monotonic
Bipolar output range
TA = 25°C, bipolar output range
Bipolar output range
−6
+6
mV
−1.5
0.2
3
+1.5
mV
ppm FSR/°C
Bipolar Zero Error Temperature
Coefficient (TC)3
Zero-Scale Error
−5
+5
mV
−3.5
0.3
2
+3.5
mV
ppm FSR/°C
TA = 25°C
Zero-Scale Error Temperature
Coefficient (TC)3
Offset Error
−4
+4
mV
Unipolar output range
−1.5
0.2
2
+1.5
mV
ppm FSR/°C
TA = 25°C, unipolar output range
Unipolar output range
Offset Error Temperature
Coefficient (TC)3
Gain Error
−0.07
−0.05
+0.07
0.004 +0.05
1
% FSR
% FSR
ppm FSR/°C
TA = 25°C
TA = 25°C
Gain Error Temperature
Coefficient (TC)3
Full-Scale Error
−0.07
−0.05
+0.07
0.001 +0.05
1
% FSR
% FSR
ppm FSR/°C
Full-Scale Error Temperature
Coefficient (TC)3
OUTPUT CHARACTERISTICS3
Headroom
0.5
0.8
V
Output unloaded
Output Voltage Drift vs. Time
Short-Circuit Current
Load
90
20
ppm FSR
mA
kΩ
Drift after 1000 hours, TA = 125°C
1
Capacitive Load Stability
RLOAD = ∞
TA = 25°C
20
5
1
nF
nF
μF
RLOAD = 1 kΩ
RLOAD = ∞
External compensation capacitor of 4 nF
connected
DC Output Impedance
Power-On Time
0.3
10
Ω
μs
Rev. A | Page 4 of 40
AD5412/AD5422
Parameter1
Min
Typ
90
3
Max
130
12
Unit
μV/V
μV/V
Test Conditions/Comments
DC PSRR
Output unloaded
CURRENT OUTPUT
Output Current Ranges
0
0
4
24
20
20
mA
mA
mA
Accuracy (Internal RSET
Resolution
)
16
12
Bits
Bits
AD5422
AD5412
Total Unadjusted Error (TUE)
B Version
−0.3
−0.13
−0.5
+0.3
+0.13
+0.5
% FSR
% FSR
% FSR
% FSR
% FSR
% FSR
LSB
% FSR
% FSR
ppm FSR/°C
0.08
TA = 25°C
A Version
−0.3
0.15
+0.3
TA = 25°C
AD5422
AD5412
Guaranteed monotonic
Relative Accuracy (INL)4
−0.024
−0.032
−1
−0.27
−0.12
+0.024
+0.032
+1
+0.27
+0.12
Differential Nonlinearity (DNL)
Offset Error
0.08
16
TA = 25°C
Offset Error Temperature
Coefficient (TC)3
Gain Error
−0.18
−0.03
−0.22
−0.06
+0.18
0.006 +0.03
+0.22
0.006 +0.06
10
% FSR
% FSR
% FSR
% FSR
ppm FSR/°C
% FSR
% FSR
AD5422
AD5422, TA = 25°C
AD5412
AD5412, TA = 25°C
Gain Temperature Coefficient (TC)3
Full-Scale Error
−0.2
−0.1
+0.2
+0.1
0.08
6
TA = 25°C
Full-Scale Temperature Coefficient
(TC)3
ppm FSR/°C
Accuracy (External RSET
Resolution
)
16
12
Bits
Bits
AD5422
AD5412
Total Unadjusted Error (TUE)
B Version
−0.15
−0.06
−0.3
+0.15
+0.06
+0.3
% FSR
% FSR
% FSR
% FSR
% FSR
% FSR
LSB
0.01
0.02
TA = 25°C
A Version
−0.1
+0.1
TA = 25°C
AD5422
AD5412
Guaranteed monotonic
Relative Accuracy (INL)4
−0.012
−0.032
−1
+0.012
+0.032
+1
Differential Nonlinearity (DNL)
Offset Error
−0.1
+0.1
% FSR
−0.03
0.006 +0.03
3
TA = 25°C
Offset Error Temperature
Coefficient (TC)3
μA/°C
Gain Error
−0.08
−0.05
+0.08
0.003 +0.05
4
% FSR
% FSR
ppm FSR/°C
% FSR
% FSR
TA = 25°C
TA = 25°C
Gain Temperature Coefficient (TC)3
Full-Scale Error
−0.15
−0.06
+0.15
0.01
7
+0.06
Full-Scale Temperature Coefficient
(TC)3
ppm FSR/°C
Rev. A | Page 5 of 40
AD5412/AD5422
Parameter1
Min
Typ
Max
Unit
Test Conditions/Comments
OUTPUT CHARACTERISTICS3
Current Loop Compliance Voltage
Output Current Drift vs. Time
0
AVDD − 2.5
V
Drift after 1000 hours, TA = 125°C
Internal RSET
External RSET
50
20
ppm FSR
ppm FSR
Ω
mH
μA/V
MΩ
Resistive Load
Inductive Load
DC PSRR
Output Impedance
Output Current Leakage When
Output Is Disabled
1200
1
50
TA = 25 °C
50
60
pA
REFERENCE INPUT/OUTPUT
Reference Input3
Reference Input Voltage
DC Input Impedance
Reference Output
4.95
27
5
40
5.05
V
kΩ
For specified performance
TA = 25°C
Output Voltage
4.995
5
1.8
5.005
10
Reference Temperature
ppm/°C
Coefficient (TC)3, 5
Output Noise (0.1 Hz to 10 Hz)3
Noise Spectral Density3
Output Voltage Drift vs. Time3
Capacitive Load3
10
100
50
600
5
μV p-p
nV/√Hz
ppm
nF
mA
At 10 kHz
Drift after 1000 hours, TA = 125°C
Load Current3
Short-Circuit Current3
Load Regulation3
7
95
mA
ppm/mA
DIGITAL INPUTS3
JEDEC compliant
Input High Voltage, VIH
Input Low Voltage, VIL
Input Current
2
V
V
μA
pF
0.8
+1
−1
Per pin
Per pin
Pin Capacitance
10
DIGITAL OUTPUTS3
SDO
Output Low Voltage, VOL
Output High Voltage, VOH
High Impedance Leakage Current
High Impedance Output
Capacitance
0.4
+1
V
V
μA
pF
Sinking 200 μA
Sourcing 200 μA
DVCC − 0.5
−1
5
FAULT
Output Low Voltage, VOL
Output Low Voltage, VOL
Output High Voltage, VOH
POWER REQUIREMENTS
AVDD
0.4
V
V
V
10 kΩ pull-up resistor to DVCC
At 2.5 mA
10 kΩ pull-up resistor to DVCC
0.6
3.6
10.8
−26.4
10.8
40
0
52.8
V
V
V
AVSS
|AVSS| + AVDD
DVCC
Input Voltage
2.7
5.5
V
Internal supply disabled
Output Voltage
Output Load Current3
Short-Circuit Current3
4.5
5
20
V
mA
mA
DVCC, which can be overdriven up to 5.5 V
Rev. A | Page 6 of 40
AD5412/AD5422
Parameter1
Min
Typ
Max
Unit
Test Conditions/Comments
AIDD
Outputs unloaded
2.5
3.4
3.9
3
4
4.4
mA
mA
mA
Outputs disabled
Current output enabled
Voltage output enabled
Outputs unloaded
AISS
0.24
0.5
1.1
0.3
0.6
1.4
1
mA
mA
mA
mA
mW
mW
Outputs disabled
Current output enabled
Voltage output enabled
VIH = DVCC, VIL = GND
AVDD = 40 V, AVSS = 0 V, outputs unloaded
AVDD = +24 V, AVSS = −24 V, outputs
unloaded
DICC
Power Dissipation
128
120
1 Temperature range: −40°C to +85°C; typical at +25°C.
2 When the AD5412/AD5422 is powered with AVSS = 0 V, INL for the 0 V to 5 V and 0 V to 10 V ranges is measured beginning from Code 256 for the AD5422 and Code 16
for the AD5412.
3 Guaranteed by design and characterization; not production tested.
4 For 0 mA to 20 mA and 0 mA to 24 mA ranges, INL is measured beginning from Code 256 for the AD5422 and Code 16 for the AD5412.
5 The on-chip reference is production trimmed and tested at 25°C and 85°C. It is characterized from −40°C to +85°C.
AC PERFORMANCE CHARACTERISTICS
AVDD = 10.8 V to 26.4 V, AVSS = −26.4 V to −3 V/0 V, AVDD + |AVSS| < 52.8 V, GND = 0 V, REFIN = +5 V external; DVCC = 2.7 V to 5.5 V.
V
OUT: RLOAD = 1 kΩ, CL = 200 pF, IOUT: RLOAD = 350 ꢀ; all specifications TMIN to TMAX, unless otherwise noted.
Table 3.
Parameter1
Min Typ
Max
Unit
Test Conditions/Comments
DYNAMIC PERFORMANCE
Voltage Output
Output Voltage Settling Time
25
18
μs
μs
μs
10 V step to 0.03 % FSR
20 V step to 0.03 % FSR
5 V step to 0.03 % FSR
32
8
μs
512 LSB step to 0.03 % FSR (16-Bit LSB)
Slew Rate
0.8
10
10
20
1
V/μs
nV-sec
nV-sec
mV
nV-sec
LSB p-p
Power-On Glitch Energy
Digital-to-Analog Glitch Energy
Glitch Impulse Peak Amplitude
Digital Feedthrough
Output Noise (0.1 Hz to 10 Hz
Bandwidth)
0.1
16-bit LSB
Output Noise (100 kHz Bandwidth)
1/f Corner Frequency
200
1
μV rms
kHz
Output Noise Spectral Density
AC PSRR
150
−75
nV/√Hz
dB
Measured at 10 kHz, midscale output, 10 V range
200 mV 50 Hz/60 Hz sine wave superimposed on power
supply voltage
Current Output
Output Current Settling Time
10
40
−75
μs
μs
dB
16 mA step to 0.1% FSR
16 mA step to 0.1% FSR, L = 1 mH
200 mV 50 Hz/60 Hz sine wave superimposed on power
supply voltage
AC PSRR
1 Guaranteed by characterization, not production tested.
Rev. A | Page 7 of 40
AD5412/AD5422
TIMING CHARACTERISTICS
AVDD = 10.8 V to 26.4 V, AVSS = −26.4 V to −3 V/0 V, AVDD + |AVSS| < 52.8V, GND = 0 V, REFIN = +5 V external; DVCC = 2.7 V to 5.5 V.
VOUT: RLOAD = 1 kΩ, CL = 200 pF, IOUT: RLOAD = 300 ꢀ; all specifications TMIN to TMAX, unless otherwise noted.
Table 4.
Parameter1, 2, 3
Limit at TMIN, TMAX
Unit
Description
WRITE MODE
t1
t2
t3
t4
t5
t5
t6
t7
33
13
13
13
40
5
5
5
40
20
5
ns min
ns min
ns min
ns min
ns min
μs min
ns min
ns min
ns min
ns min
μs max
SCLK cycle time
SCLK low time
SCLK high time
LATCH delay time
LATCH high time
LATCH high time (after a write to the control register)
Data setup time
Data hold time
LATCH low time
t8
t9
t10
CLEAR pulse width
CLEAR activation time
READBACK MODE
t11
t12
t13
t14
t15
t16
t17
t18
90
40
40
13
40
5
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns max
ns max
SCLK cycle time
SCLK low time
SCLK high time
LATCH delay time
LATCH high time
Data setup time
Data hold time
LATCH low time
5
40
35
35
4
t19
t20
Serial output delay time (CL SDO = 15 pF)
LATCH rising edge to SDO tristate (CL SDO4 = 15 pF)
DAISY-CHAIN MODE
t21
t22
t23
t24
t25
t26
t27
t28
t29
90
40
40
13
40
5
5
40
35
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns min
ns max
SCLK cycle time
SCLK low time
SCLK high time
LATCH delay time
LATCH high time
Data setup time
Data hold time
LATCH low time
Serial output delay time (CL SDO4 = 15 pF)
1 Guaranteed by characterization; not production tested.
2 All input signals are specified with tR = tF = 5 ns (10% to 90% of DVCC) and timed from a voltage level of 1.2 V.
3 See Figure 2, Figure 3, and Figure 4.
4 CL SDO = capacitive load on SDO output.
Rev. A | Page 8 of 40
AD5412/AD5422
t1
SCLK
1
2
24
t2
t3
t4
t5
LATCH
SDIN
t7
t8
DB0
t6
DB23
t9
CLEAR
t10
I
/V
OUT OUT
Figure 2. Write Mode Timing Diagram
t11
SCLK
1
2
8
9
22
23
24
24
t14
1
2
t12
t13
t15
LATCH
SDIN
t17
t18
DB0
t16
DB23
DB23
X
DB0
NOP CONDITION
INPUT WORD SPECIFIES
REGISTER TO BE READ
t20
t19
SDO
X
X
X
DB15
DB0
FIRST 8 BITS ARE
DON’T CARE BITS
SELECTED REGISTER
DATA CLOCKED OUT
UNDEFINED DATA
Figure 3. Readback Mode Timing Diagram
t21
SCLK
26
48
25
1
2
24
t22
t23
t24
t25
LATCH
t27
t28
t26
SDIN
SDO
DB23
DB0
DB23
DB0
INPUT WORD FOR DAC N
UNDEFINED
INPUT WORD FOR DAC N – 1
t29
t20
DB23
DB0
DB0
DB23
INPUT WORD FOR DAC N
Figure 4. Daisy-Chain Mode Timing Diagram
Rev. A | Page 9 of 40
AD5412/AD5422
ABSOLUTE MAXIMUM RATINGS
TA = 25°C, unless otherwise noted. Transient currents of up to
80 mA do not cause SCR latch-up.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
Table 5.
Parameter
Rating
AVDD to GND
AVSS to GND
AVDD to AVSS
DVCC to GND
Digital Inputs to GND
−0.3 V to +48 V
+0.3 V to −48 V
−0.3 V to +60 V
−0.3 V to +7 V
−0.3 V to DVCC + 0.3 V or 7 V
(whichever is less)
ESD CAUTION
Digital Outputs to GND
−0.3 V to DVCC + 0.3 V or 7 V
(whichever is less)
REFIN/REFOUT to GND
VOUT to GND
−0.3 V to +7 V
AVSS to AVDD
IOUT to GND
−0.3 V to AVDD
Operating Temperature Range (TA)
Industrial1
−40°C to +85°C
−65°C to +150°C
125°C
Storage Temperature Range
Junction Temperature (TJ max)
24-Lead TSSOP Package
θJA Thermal Impedance
40-Lead LFCSP Package
θJA Thermal Impedance
Power Dissipation
42°C/W
28°C/W
(TJ max – TA)/θJA
JEDEC industry standard
J-STD-020
Lead Temperature
Soldering
ESD (Human Body Model)
2 kV
1 Power dissipated on chip must be derated to keep the junction temperature
below 125°C, assuming that the maximum power dissipation condition is
sourcing 24 mA into GND from IOUT with a 4 mA on-chip current.
Rev. A | Page 10 of 40
AD5412/AD5422
PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS
1
2
3
4
5
6
7
8
24
23
22
21
20
19
18
17
16
15
14
13
AV
AV
–V
+V
SS
CC
DD
DV
SENSE
SENSE
FAULT
GND
PIN 1
NC
FAULT
GND
1
2
3
4
5
6
7
8
9
30 NC
V
OUT
AD5412/
AD5422
INDICATOR
29 CAP2
28 CAP1
CLEAR SELECT
CLEAR
LATCH
SCLK
BOOST
BOOST
27
26
25
24
CLEAR SELECT
CLEAR
TOP VIEW
AD5412/AD5422
TOP VIEW
I
OUT
(Not to Scale)
I
OUT
LATCH
NC
C
SCLK
(Not to Scale)
COMP
NC
SDIN
23 DV
22 NC
21 NC
SELECT
CC
SDO
C
COMP
NC 10
9
SDIN
DV SELECT
CC
REFIN
REFOUT
10
11
12
SDO
GND
GND
R
SET
NOTES
1. NC = NO CONNECT.
2. THE EXPOSED PADDLE CAN BE CONNECTED TO 0V IF THE OUTPUT
VOLTAGE RANGE IS UNIPOLAR. THE EXPOSED PADDLE CAN BE LEFT
ELECTRICALLY UNCONNECTED PROVIDED THAT A SUPPLY CONNECTION
NOTES
1. NC = NO CONNECT
2. THE PADDLE CAN BE CONNECTED TO 0V IF THE OUTPUT VOLTAGE RANGE
IS UNIPOLAR. THE PADDLE CAN BE LEFT ELECTRICALLY UNCONNECTED
PROVIDED THAT A SUPPLY CONNECTION IS MADE AT THE AV PIN. IT IS
IS MADE AT THE AV PIN. IT IS RECOMMENDED THAT THE PADDLE BE
SS
SS
RECOMMENDED THAT THE PADDLE BE THERMALLY CONNECTED TO A
COPPER PLANE FOR ENHANCED THERMAL PERFORMANCE.
THERMALLY CONNECTED TO A COPPER PLANE FOR ENHANCED
THERMAL PERFORMANCE.
Figure 5. TSSOP Pin Configuration
Figure 6. LFCSP Pin Configuration
Table 6. Pin Function Descriptions
Pin No.
TSSOP
LFCSP
Mnemonic
Description
1
14, 37
AVSS
Negative Analog Supply Pin. Voltage ranges from –3 V to –24 V. This pin can be
connected to 0 V if the output voltage range is unipolar.
2
3
39
2
DVCC
FAULT
Digital Supply Pin. Voltage ranges from 2.7 V to 5.5 V.
Fault Alert. This pin is asserted low when an open circuit is detected in current mode or
an overtemperature is detected. Open drain output must be connected to a pull-up resistor.
4, 12
18
3, 15
GND
These pins must be connected to 0 V.
No Connection. Do not connect to these pins.
1, 10, 11, 19, 20, NC
21, 22, 25, 30,
31, 35, 38, 40
5
6
7
8
4
5
6
7
CLEAR
SELECT
CLEAR
Selects the voltage output clear value, either zero-scale or midscale code (see Table 21).
Active High Input. Asserting this pin sets the current output to the bottom of the selected
range or sets the voltage output to the user selected value (zero-scale or midscale).
Positive Edge Sensitive Latch. A rising LATCH edge parallel loads the input shift register
data into the DAC register, also updating the output.
Serial Clock Input. Data is clocked into the shift register on the rising edge of SCLK. This
operates at clock speeds of up to 30 MHz.
LATCH
SCLK
9
10
8
9
SDIN
SDO
Serial Data Input. Data must be valid on the rising edge of SCLK.
Serial Data Output. Used to clock data from the serial register in daisy-chain or readback
mode. Data is valid on the rising edge of SCLK (see Figure 3 and Figure 4).
11
13
12, 13
16
GND
RSET
Ground Reference Pin.
An external, precision, low drift 15 kΩ current setting resistor can be connected to this
pin to improve the IOUT temperature drift performance. See the AD5412/AD5422 Features
section.
14
15
17
18
REFOUT
REFIN
Internal Reference Voltage Output. REFOUT = 5 V 2 mV.
External Reference Voltage Input. Reference input range is 4 V to 5 V. REFIN = 5 V for a
specified performance.
Rev. A | Page 11 of 40
AD5412/AD5422
Pin No.
TSSOP
LFCSP
Mnemonic
Description
16
23
DVCC
SELECT
When connected to GND, this pin disables the internal supply, and an external supply
must be connected to the DVCC pin. Leave this pin unconnected to enable the internal
supply. See the AD5412/AD5422 Features section.
17
24
CCOMP
Optional compensation capacitor connection for the voltage output buffer. Connecting
a 4 nF capacitor between this pin and the VOUT pin allows the voltage output to drive up
to 1 μF. It should be noted that the addition of this capacitor reduces the bandwidth of
the output amplifier, increasing the settling time.
19
20
26
27
IOUT
BOOST
Current Output Pin.
Optional External Transistor Connection. Connecting an external transistor reduces the
power dissipated in the AD5412/AD5422. See theAD5412/AD5422 Features section.
N/A
21
28, 29
32
CAP1, CAP2 Connection for Optional Output Filtering Capacitor. See the AD5412/AD5422 Features
section.
VOUT
Buffered Analog Output Voltage. The output amplifier is capable of directly driving a
1 kΩ, 2000 pF load.
22
23
24
33
34
36
+VSENSE
−VSENSE
AVDD
Sense connection for the positive voltage output load connection.
Sense connection for the negative voltage output load connection.
Positive Analog Supply Pin. Voltage ranges from 10.8 V to 60 V.
25 (EPAD)
41 (EPAD)
Exposed
paddle
Negative Analog Supply Pin. Voltage ranges from –3 V to –24 V. This paddle can be
connected to 0 V if the output voltage range is unipolar. The paddle can be left
electrically unconnected provided that a supply connection is made at the AVSS pin. It is
recommended that the paddle be thermally connected to a copper plane for enhanced
thermal performance.
Rev. A | Page 12 of 40
AD5412/AD5422
TYPICAL PERFORMANCE CHARACTERISTICS
GENERAL
900
9
8
7
6
5
4
3
2
1
0
T
= 25°C
A
T
= 25°C
800
700
600
500
400
300
200
100
0
A
DV
= 5V
CC
DV
= 3V
2.5
CC
0
0.5
1.0
1.5
2.0
3.0
3.5
4.0
4.5
5.0
–21 –19 –17 –15 –13 –11 –9
–7
–5
–3
–1
1
LOGIC VOLTAGE (V)
LOAD CURRENT (mA)
Figure 7. DICC vs. Logic Input Voltage
Figure 10. DVCC Output Voltage vs. Load Current
5
4
AI
DD
AV
DD
3
T
V
= 25°C
= 0V
A
2
OUT
OUTPUT UNLOADED
3
1
REFERENCE OUTPUT
0
AI
SS
–1
–2
1
CH1 2.00V
CH3 5.00V
M200µs
CH3
2.1V
10
12
14
16
18
20
22
24
26
28
AV /|AV | (V)
DD SS
Figure 8. AIDD/AISS vs. AVDD/|AVSS|
Figure 11. REFOUT Turn-on Transient
5.0
4.5
4.0
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0
T
OUT
= 25°C
A
I
= 0mA
1
CH1 2µV
M2.00s
LINE
1.8V
10
15
20
25
AV (V)
30
35
40
DD
Figure 9. AIDD vs. AVDD
Figure 12. REFOUT Output Noise (0.1 Hz to 10 Hz Bandwidth)
Rev. A | Page 13 of 40
AD5412/AD5422
45
40
35
30
25
20
15
10
5
AV
= 24V
DD
1
0
CH1 20µV
M2.00s
LINE
0V
0
1
2
3
4
5
6
7
8
9
10
TEMPERATURE COEFFICIENT (ppm/°C)
Figure 13. REFOUT Output Noise (100 kHz Bandwidth)
Figure 15. Reference Temperature Coefficient Histogram
5.003
5.0005
5.0000
4.9995
4.9990
4.9985
4.9980
4.9975
4.9970
4.9965
4.9960
4.9955
50 DEVICES SHOWN
AV = 24V
T
= 25°C
A
DD
AV
= 24V
DD
5.002
5.001
5.000
4.999
4.998
4.997
–40
–20
0
20
40
60
80
0
1
2
3
4
5
6
7
8
9
TEMPERATURE (°C)
LOAD CURRENT (mA)
Figure 14. Reference Voltage vs. Temperature
Figure 16. Reference Voltage vs. Load Current
Rev. A | Page 14 of 40
AD5412/AD5422
VOLTAGE OUTPUT
0.0025
1.0
0.8
AV
= +24V
DD
AV = –24V
AV
AV = 0V
= 24V
DD
+5V RANGE
+10V RANGE
0.0020
0.0015
0.0010
0.0005
0
SS
T
= 25°C
SS
= 25°C
A
T
A
0.6
0.4
0.2
0
–0.0005
–0.0010
–0.0015
–0.0020
–0.0025
–0.2
–0.4
–0.6
–0.8
–1.0
±10V RANGE
±5V RANGE
+5V RANGE
+10V RANGE
0
10,000
20,000
30,000 40,000
CODE
50,000
60,000
0
10,000
20,000
30,000
CODE
40,000
50,000
60,000
Figure 17. Integral Nonlinearity Error vs. DAC Code, Dual Supply
Figure 20. Differential Nonlinearity Error vs. DAC Code, Single Supply
0.0025
0.005
AV
= +24V
DD
AV = –24V
AV
AV = 0V
= 24V
DD
+5V RANGE
+10V RANGE
0.0020
0.0015
0.0010
0.0005
0
SS
SS
= 25°C
0.003
0.001
T
= 25°C
A
T
A
–0.001
–0.003
–0.005
–0.007
–0.009
–0.0005
–0.0010
–0.0015
–0.0020
–0.0025
±10V RANGE
±5V RANGE
+5V RANGE
+10V RANGE
0
10,000
20,000
30,000
CODE
40,000
50,000
60,000
0
10,000
20,000
30,000 40,000
CODE
50,000
60,000
Figure 18. Integral Nonlinearity Error vs. DAC Code, Single Supply
Figure 21. Total Unadjusted Error vs. DAC Code, Dual Supply
1.0
0.030
AV
= +24V
DD
AV = –24V
AV
AV = 0V
= 24V
+5V RANGE
+10V RANGE
0.8
0.6
DD
SS
0.025
0.020
0.015
0.010
0.005
0
T
= 25°C
SS
= 25°C
A
T
A
0.4
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
±10V RANGE
±5V RANGE
+10V RANGE
+5V RANGE
–0.005
–0.010
0
10,000
20,000
30,000 40,000
CODE
50,000
60,000
0
10,000
20,000
30,000
CODE
40,000
50,000
60,000
Figure 19. Differential Nonlinearity Error vs. DAC Code, Dual Supply
Figure 22. Total Unadjusted Error vs. DAC Code, Single Supply
Rev. A | Page 15 of 40
AD5412/AD5422
0.0015
0.012
0.010
0.008
0.006
0.004
0.002
0
AV = +24V
DD
AV = +24V
DD
AV = –24V
SS
AV = –24V
SS
0.0010
0.0005
0
OUTPUT UNLOADED
–0.0005
–0.0010
–0.0015
–0.002
–0.004
–0.006
–0.008
+5V RANGE
+10V RANGE
±5V RANGE
±10V RANGE
+5V RANGE MAX INL
+10V RANGE MAX INL
±10V RANGE MAX INL
+10V RANGE MIN INL
±10V RANGE MIN INL
±5V RANGE MAX INL
+5V RANGE MIN INL
±5V RANGE MIN INL
–40
–20
0
20
40
60
80
–40
–20
0
20
40
60
80
TEMPERATURE (°C)
TEMPERATURE (°C)
Figure 23. Integral Nonlinearity Error vs. Temperature
Figure 26. Full-Scale Error vs. Temperature
1.5
1.0
1.0
0.8
AV
= +24V
DD
AV = +24V
DD
AV = –24V
ALL RANGES
SS
AV = –24V
SS
OUTPUT UNLOADED
+10V RANGE
0.6
0.4
0.5
0.2
0
+5V RANGE
0
–0.2
–0.4
–0.6
–0.8
–1.0
–0.5
–1.0
–1.5
–40
–20
0
20
40
60
80
–40
–20
0
20
40
60
80
TEMPERATURE (°C)
TEMPERATURE (°C)
Figure 27. Offset Error vs. Temperature
Figure 24. Differential Nonlinearity Error vs. Temperature
1.5
1.0
0.015
AV = +24V
DD
AV = +24V
DD
AV = –24V
SS
AV = –24V
SS
OUTPUT UNLOADED
+10V RANGE
0.010
0.005
0
OUTPUT UNLOADED
0.5
0
+5V RANGE
–0.5
–1.0
–1.5
–0.005
–0.010
–0.015
+5V RANGE
+10V RANGE
±5V RANGE
±10V RANGE
–40
–20
0
20
40
60
80
–40
–20
0
20
40
60
80
TEMPERATURE (°C)
TEMPERATURE (°C)
Figure 25. Total Unadjusted Error vs. Temperature
Figure 28. Bipolar Zero Error vs. Temperature
Rev. A | Page 16 of 40
AD5412/AD5422
0.014
0.012
0.010
0.008
0.006
0.004
0.002
0
1.0
0.8
AVDD = +24V
AVSS = –24V
OUTPUT UNLOADED
T
= 25°C
A
±10V RANGE
0.6
0.4
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
–0.002
–0.004
–0.006
–0.008
+5V RANGE
+10V RANGE
±5V RANGE
±10V RANGE
–40
–20
0
20
40
60
80
10
12
14
16
18
20
22
24
26
28
TEMPERATURE (°C)
AV /|AV | (V)
DD SS
Figure 32. Differential Nonlinearity Error vs. AVDD/|AVSS|
Figure 29. Gain Error vs. Temperature
0.0050
0.0045
0.0040
0.0035
0.0030
0.0025
0.0020
0.0015
0.0010
0.0005
0
1.3
0.8
AV = +24V
DD
AV = –24V
SS
OUTPUT UNLOADED
T
= 25°C
A
±10V RANGE
0.3
–0.2
–0.7
–1.2
+5V RANGE
+10V RANGE
±5V RANGE
±10V RANGE
10
12
14
16
18
20
22
24
26
28
–40
–20
0
20
40
60
80
TEMPERATURE (°C)
AV /|AV | (V)
DD SS
Figure 33. Total Unadjusted Error vs. AVDD/|AVSS|
Figure 30. Zero-Scale Error vs. Temperature
0.05
0.04
0.03
0.02
0.01
0
0.0015
0.0010
0.0005
0
T
= 25°C
A
AV = +15V
DD
AV = –15V
SS
±10V RANGE
T
= 25°C
A
±10V RANGE
–0.01
–0.02
–0.03
–0.04
–0.05
–0.0005
–0.0010
–0.0015
10
12
14
16
18
20
22
24
26
28
–20
–15
–10
–5
0
5
10
15
20
AV /|AV | (V)
SOURCE/SINK CURRENT (mA)
DD SS
Figure 34. Source and Sink Capability of Output Amplifier,
Full-Scale Code Loaded
Figure 31. Integral Nonlinearity Error vs. AVDD/|AVSS|
Rev. A | Page 17 of 40
AD5412/AD5422
0.05
12
8
AV
= +15V
DD
AV = –15V
0.04
0.03
0.02
0.01
0
SS
= 25°C
T
A
±10V RANGE
AV
= +24V
4
DD
AV = –24V
SS
±10V RANGE
T
= 25°C
A
0
OUTPUT UNLOADED
–0.01
–0.02
–0.03
–0.04
–0.05
–4
–8
–12
–20
–15
–10
–5
0
5
10
15
20
–10
–5
0
5
10
15
20
25
30
SOURCE/SINK CURRENT (mA)
TIME (µs)
Figure 35. Source and Sink Capability of Output Amplifier,
Zero-Scale Loaded
Figure 37. Full-Scale Negative Step
12
8
4
2
AV
= +24V
DD
SS
AV = –24V
±10V RANGE
0
T
= 25°C
A
OUTPUT UNLOADED
–2
4
0x8000 TO 0x7FFF
0x7FFF TO 0x8000
–4
0
–6
–8
–4
–8
–12
–10
–12
–14
–16
AV
= +24V
DD
AV = –24V
SS
= 25°C
T
A
±10V RANGE
–1
1
3
5
7
9
11
13
15
–10
–5
0
5
10
15
20
25
30
TIME (µs)
TIME (µs)
Figure 36. Full-Scale Positive Step
Figure 38. Digital-to-Analog Glitch
Rev. A | Page 18 of 40
AD5412/AD5422
35
30
25
20
15
10
5
AV = +15V
DD
AV = –15V
SS
T
= 25°C
A
1
AV
= +24V
SS
= 25°C
DD
AV = –24V
T
A
0
CH1 5.0µV
M 5.00ms
LINE
1.8V
0
2
4
6
8
10
12
14
16
18
20
TIME (µs)
Figure 39. Peak-to-Peak Noise (0.1 Hz to 10 Hz Bandwidth)
Figure 41. VOUT vs. Time on Power-Up
1
AV
= +24V
DD
SS
AV = –24V
T
= 25°C
A
CH1 50.0µV
M 5.00ms
LINE
0V
Figure 40. Peak-to-Peak Noise (100 kHz Bandwidth)
Rev. A | Page 19 of 40
AD5412/AD5422
CURRENT OUTPUT
0.004
0.002
0
EXTERNAL R
SET
0.004
0.002
0
AV
= 24V
DD
INTERNAL R
SET
AV = –24V/0V
SS
EXTERNAL R
, BOOST TRANSISTOR
0mA TO 24mA RANGE
SET
INTERNAL R
, BOOST TRANSISTOR
SET
–0.002
–0.004
–0.006
–0.008
–0.010
–0.002
–0.004
–0.006
–0.008
–0.010
DD
AV = –24V/0V
SS
T
= 25°C
A
R
= 250Ω
LOAD
0
10,000 20,000
30,000
CODE
40,000
50,000
60,000
–40
–20
0
20
40
60
80
TEMPERATURE (°C)
Figure 42. Integral Nonlinearity vs. Code
Figure 45. Integral Nonlinearity vs. Temperature, Internal RSET
1.0
0.8
0.003
AV
= 24V
DD
AV
= 24V
DD
AV = –24V/0V
0mA TO 24mA RANGE
SS
AV = –24V/0V
SS
T
= 25°C
A
0.002
0.001
0
R
= 250Ω
0.6
LOAD
0.4
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
–0.001
–0.002
–0.003
EXTERNAL R
INTERNAL R
EXTERNAL R
INTERNAL R
SET
SET
SET
, BOOST TRANSISTOR
SET
, BOOST TRANSISTOR
0
10,000 20,000
30,000
CODE
40,000
50,000
60,000
–40
–20
0
20
40
60
80
TEMPERATURE (°C)
Figure 43. Differential Nonlinearity vs. Code
Figure 46. Integral Nonlinearity vs. Temperature, External RSET
0.05
0.03
1.0
AV
= 24V
DD
AV = –24V/0V
SS
0.8
0.6
ALL RANGES
INTERNAL AND EXTERNAL R
SET
0.01
–0.01
–0.03
–0.05
–0.07
–0.09
–0.11
–0.13
–0.15
0.4
0.2
AV
= 24V
0
DD
AV = –24V/0V
SS
= 25°C
T
–0.2
–0.4
–0.6
–0.8
–1.0
A
R
= 250Ω
LOAD
EXTERNAL R
SET
INTERNAL R
SET
EXTERNAL R
, BOOST TRANSISTOR
SET
, BOOST TRANSISTOR
INTERNAL R
SET
0
10,000 20,000
30,000
CODE
40,000
50,000
60,000
–40
–20
0
20
40
60
80
TEMPERATURE (°C)
Figure 44. Total Unadjusted Error vs. Code
Figure 47. Differential Nonlinearity vs. Temperature
Rev. A | Page 20 of 40
AD5412/AD5422
0.10
0.05
0.015
0.010
0.005
0
AV
= 24V
DD
T
= 25°C
A
AV = –24V/0V
SS
0mA TO 24mA RANGE
AV = 0V
SS
0
–0.05
–0.10
–0.15
–0.20
–0.25
4mA TO 20mA INTERNAL R
0mA TO 20mA INTERNAL R
0mA TO 24mA INTERNAL R
4mA TO 20mA EXTERNAL R
0mA TO 20mA EXTERNAL R
0mA TO 24mA EXTERNAL R
SET
SET
SET
–0.005
–0.010
–0.015
SET
SET
SET
–40
–20
0
20
40
60
80
10
15
20
25
DD
30
35
40
AV
(V)
TEMPERATURE (°C)
Figure 48. Total Unadjusted Error vs. Temperature
Figure 51. Integral Nonlinearity Error vs. AVDD, External RSET
0.10
0.05
0.020
AV
= 24V
DD
0.015
0.010
0.005
0
AV = –24V/0V
T
= 25°C
SS
A
0mA TO 24mA RANGE
AV = 0V
SS
0
–0.05
–0.10
–0.15
–0.20
–0.25
–0.005
–0.010
–0.015
–0.020
4mA TO 20mA INTERNAL R
0mA TO 20mA INTERNAL R
0mA TO 24mA INTERNAL R
4mA TO 20mA EXTERNAL R
0mA TO 20mA EXTERNAL R
0mA TO 24mA EXTERNAL R
SET
SET
SET
SET
SET
SET
–40
–20
0
20
40
60
80
10
15
20
25
DD
30
35
40
AV
(V)
TEMPERATURE (°C)
Figure 49. Offset Error vs. Temperature
Figure 52. Integral Nonlinearity Error vs. AVDD, Internal RSET
0.06
0.04
1.0
0.8
AV
= 24V
DD
T
= 25°C
A
AV = –24V/0V
SS
0mA TO 24mA RANG
0.6
AV = 0V
SS
0.02
0.4
0
0.2
0
–0.02
–0.04
–0.06
–0.08
–0.10
–0.2
–0.4
–0.6
–0.8
–1.0
4mA TO 20mA INTERNAL R
0mA TO 20mA INTERNAL R
0mA TO 24mA INTERNAL R
4mA TO 20mA EXTERNAL R
0mA TO 20mA EXTERNAL R
0mA TO 24mA EXTERNAL R
SET
SET
SET
SET
SET
SET
–40
–20
0
20
40
60
80
10
15
20
25
30
35
40
AV (V)
DD
TEMPERATURE (°C)
Figure 50. Gain Error vs. Temperature
Figure 53. Differential Nonlinearity Error vs. AVDD, External RSET
Rev. A | Page 21 of 40
AD5412/AD5422
1.0
0.8
2.5
2.0
1.5
1.0
0.5
0
AV
AV = 0V
= 15V
DD
SS
= 24mA
I
OUT
T
= 25°C
A
R
= 500Ω
LOAD
0.6
0.4
0mA TO 24mA RANGE
AV = 0V
SS
0.2
0
–0.2
–0.4
–0.6
–0.8
–1.0
10
15
20
25
DD
30
35
40
–40
–20
0
20
40
60
80
AV
(V)
TEMPERATURE (°C)
Figure 54. Differential Nonlinearity Error vs. AVDD, Internal RSET
Figure 57. Compliance Voltage Headroom vs. Temperature
3.5
3.0
2.5
2.0
1.5
1.0
0.5
0
0.025
AV
AV = 0V
= 24V
T
= 25°C
DD
A
0.020
0.015
0.010
0.005
0
0mA TO 24mA RANGE
AV = 0V
SS
= 25°C
T
A
SS
R
= 250Ω
LOAD
–0.005
–0.010
–0.015
0
100
200
300
400
500
600
10
15
20
25
DD
30
35
40
TIME (µs)
AV
(V)
Figure 55. Total Unadjusted Error vs. AVDD, External RSET
Figure 58. Output Current vs. Time on Power-Up
20
10
0.05
0.03
0.01
AV
= 24V
DD
AV = 0V
0
–0.01
–0.03
–0.05
–0.07
–0.09
–0.11
–0.13
–0.15
SS
= 25°C
T
A
R
= 250Ω
–10
–20
–30
–40
–50
LOAD
T
= 25°C
A
0mA TO 24mA RANGE
AV = 0V
SS
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
4.5
5.0
10
15
20
25
AV (V)
30
35
40
TIME (µs)
DD
Figure 56. Total Unadjusted Error vs. AVDD, Internal RSET
Figure 59. Output Current vs. Time on Output Enable
Rev. A | Page 22 of 40
AD5412/AD5422
70
60
50
40
30
20
10
0
25
20
15
10
5
T
= 25°C
= 24V
A
AV
DD
AV = 0V
SS
R
= 300Ω
LOAD
T
AV
= 25°C
A
= 40V
DD
AV = 0V
OUTPUT DISABLED
SS
–10
0
0
5
10
15
20
25
30
35
40
45
–1
0
1
2
3
4
5
6
7
8
COMPLIANCE VOLTAGE (V)
TIME (µs)
Figure 60. Output Leakage Current vs. Compliance Voltage
Figure 62. 4 mA to 20 mA Output Current Step
30
0x8000 TO 0x7FFF
0x7FFF TO 0x8000
AV
AV = 0V
= 24V
DD
SS
= 25°C
20
10
T
A
R
= 250Ω
LOAD
0
–10
–20
–30
0
2
4
6
8
10
12
14
16
18
20
TIME (µs)
Figure 61. Digital to Analog Glitch
Rev. A | Page 23 of 40
AD5412/AD5422
TERMINOLOGY
Slew Rate
Relative Accuracy or Integral Nonlinearity (INL)
For the DAC, relative accuracy, or INL, is a measure of the
maximum deviation, in LSBs, from a straight line passing
through the endpoints of the DAC transfer function. A typical
INL vs. code plot can be seen in Figure 17.
The slew rate of a device is a limitation in the rate of change
of the output voltage. The output slewing speed of a voltage-
output DAC is usually limited by the slew rate of the amplifier
used at its output. Slew rate is measured from 10% to 90% of the
output signal and is expressed in V/μs.
Differential Nonlinearity (DNL)
Gain Error
DNL is the difference between the measured change and the
ideal 1 LSB change between any two adjacent codes. A specified
differential nonlinearity of 1 LSB maximum ensures monoton-
icity. This DAC is guaranteed monotonic by design. A typical
DNL vs. code plot can be seen in Figure 19.
Gain error is a measure of the span error of the DAC. It is the
deviation in slope of the DAC transfer characteristic from the
ideal expressed in % FSR. A plot of gain error vs. temperature
can be seen in Figure 29.
Gain Error Temperature Coefficient (TC)
Gain error TC is a measure of the change in gain error with
changes in temperature. Gain error TC is expressed in ppm
FSR/°C.
Monotonicity
A DAC is monotonic if the output either increases or remains
constant for increasing digital input code. The AD5412/AD5422
are monotonic over their full operating temperature range.
Total Unadjusted Error (TUE)
Bipolar Zero Error
TUE is a measure of the output error taking all the various
errors into account, namely INL error, offset error, gain error,
and output drift over supplies, temperature, and time. TUE is
expressed in % FSR.
Bipolar zero error is the deviation of the analog output from the
ideal half-scale output of 0 V when the DAC register is loaded
with 0x8000 (straight binary coding) or 0x0000 (twos comple-
ment coding). A plot of bipolar zero error vs. temperature can
be seen in Figure 28.
Current Loop Voltage Compliance
The maximum voltage at the IOUT pin for which the output
current is equal to the programmed value.
Bipolar Zero Temperature Coefficient (TC)
Bipolar zero TC is a measure of the change in the bipolar zero
error with a change in temperature. It is expressed in ppm FSR/°C.
Power-On Glitch Energy
Power-on glitch energy is the impulse injected into the analog
output when the AD5412/AD5422 is powered on. It is specified
as the area of the glitch in nV-sec. See Figure 41 and Figure 58.
Full-Scale Error
Full-scale error is a measure of the output error when full-scale
code is loaded to the DAC register. Ideally, the output should be
full-scale − 1 LSB. Full-scale error is expressed in percent of
full-scale range (% FSR).
Digital-to-Analog Glitch Impulse
Digital-to-analog glitch impulse is the impulse injected into the
analog output when the input code in the DAC register changes
state, but the output voltage remains constant. It is normally
specified as the area of the glitch in nV-sec and is measured
when the digital input code is changed by 1 LSB at the major
carry transition (0x7FFF to 0x8000). See Figure 38 and
Figure 61.
Negative Full-Scale Error/Zero-Scale Error
Negative full-scale error is the error in the DAC output voltage
when 0x0000 (straight binary coding) or 0x8000 (twos comple-
ment coding) is loaded to the DAC register. Ideally, the output
voltage should be negative full-scale − 1 LSB. A plot of zero-
scale error vs. temperature can be seen in Figure 30.
Glitch Impulse Peak Amplitude
Zero-Scale Temperature Coefficient (TC)
Zero-scale TC is a measure of the change in zero-scale error
with a change in temperature. Zero-scale error TC is expressed
in ppm FSR/°C.
Glitch impulse peak amplitude is the peak amplitude of the
impulse injected into the analog output when the input code in
the DAC register changes state. It is specified as the amplitude
of the glitch in millivolt and is measured when the digital input
code is changed by 1 LSB at the major carry transition (0x7FFF
to 0x8000). See Figure 38 and Figure 61.
Output Voltage Settling Time
Output voltage settling time is the amount of time it takes for the
output to settle to a specified level for a full-scale input change.
Digital Feedthrough
Digital feedthrough is a measure of the impulse injected into
the analog output of the DAC from the digital inputs of the
DAC but is measured when the DAC output is not updated.
It is specified in nV-sec and measured with a full-scale code
change on the data bus.
Rev. A | Page 24 of 40
AD5412/AD5422
Power Supply Rejection Ratio (PSRR)
PSRR indicates how the output of the DAC is affected by changes
in the power supply voltage.
where:
REFmax is the maximum reference output measured over the
total temperature range.
REFmin is the minimum reference output measured over the total
temperature range.
REFnom is the nominal reference output voltage, 5 V.
V
V
Voltage Reference TC
Voltage reference TC is a measure of the change in the reference
output voltage with a change in temperature. The reference TC
is calculated using the box method, which defines the TC as the
maximum change in the reference output over a given temperature
range expressed in ppm/°C, as follows:
V
TempRange is the specified temperature range, −40°C to +85°C.
Load Regulation
Load regulation is the change in reference output voltage due to
a specified change in load current. It is expressed in ppm/mA.
⎡
⎢
⎣
⎤
⎥
⎦
VREFmax −VREFmin
REFnom ×TempRange
TC =
×106
V
Rev. A | Page 25 of 40
AD5412/AD5422
THEORY OF OPERATION
The AD5412/AD5422 are precision digital-to-current loop and
voltage output converters designed to meet the requirements of
industrial process control applications. They provide a high
precision, fully integrated, low cost single-chip solution for
generating current loop and unipolar/bipolar voltage outputs.
Current ranges are 0 mA to 20 mA, 0 mA to 24 mA, and 4 mA
to 20 mA; the voltage ranges available are 0 V to 5 V, 5 V, 0 V
to 10 V, and 10 V; a 10% overrange is available on all voltage
output ranges. The current and voltage outputs are available on
separate pins, and only one is active at any time. The desired
output configuration is user selectable via the control register.
+V
–V
AD5412/AD5422
SENSE
R1
V
OUT
RANGE
SCALING
12-/16-BIT
DAC
R
LOAD
SENSE
REFIN
V
–1V TO +3V
CM
Figure 65. Voltage Output
Voltage Output Amplifier
The voltage output amplifier is capable of generating both
ARCHITECTURE
unipolar and bipolar output voltages. It is capable of driving
a load of 1 kΩ in parallel with 1 μF (with an external compen-
sation capacitor) to GND. The source and sink capabilities of
the output amplifier can be seen in Figure 35. The slew rate
is 1 V/μs with a full-scale settling time of 25 μs maximum (10 V
The DAC core architecture of the AD5412/AD5422 consists
of two matched DAC sections. A simplified circuit diagram is
shown in Figure 63. The four MSBs of the 12-/16-bit data-word
are decoded to drive 15 switches, E1 to E15. Each of these switches
connects one of 15 matched resistors to either ground or the
reference buffer output. The remaining 8/12 bits of the data-
word drive the S0 to S7/S11 switches of an 8-/12-bit voltage
mode R-2R ladder network.
step). Figure 65 shows the voltage output driving a load, RLOAD
on top of a common-mode voltage (VCM) of −1 V to +3 V. In
output module applications where a cable could possibly
become disconnected from +VSENSE, resulting in the amplifier
loop being broken and possibly resulting in large destructive
voltages on VOUT, include an optional resistor (R1) between
+VSENSE and VOUT, as shown in Figure 65, of a value between
2 kꢀ and 5 kꢀ to ensure the amplifier loop is kept closed. If
remote sensing of the load is not required, connect +VSENSE
directly to VOUT and connect −VSENSE directly to GND. When
,
V
OUT
2R 2R
S0
2R
S1
2R
2R
E1
2R
E2
2R
S7/S11
E15
changing ranges on the voltage output, a glitch may occur. For
this reason, it is recommended that the output be disabled by
setting the OUTEN bit of the control register to logic low before
changing the output voltage range; this prevents a glitch from
occurring.
8-12 BIT R-2R LADDER
FOUR MSBs DECODED INTO
15 EQUAL SEGMENTS
Figure 63. DAC Ladder Structure
The voltage output from the DAC core is either converted to
a current (see Figure 64) which is then mirrored to the supply
rail so that the application simply sees a current source output
with respect to ground or it is buffered and scaled to output a
software selectable unipolar or bipolar voltage range (see
Figure 65). The current and voltage are output on separate
pins and cannot be output simultaneously.
Driving Large Capacitive Loads
The voltage output amplifier is capable of driving capacitive
loads of up to 1 μF with the addition of a nonpolarized 4 nF
compensation capacitor between the CCOMP and VOUT pins.
Without the compensation capacitor, up to 20 nF capacitive
loads can be driven.
AV
DD
R2
R3
T2
A2
T1
12-/16-BIT
DAC
I
A1
OUT
R
SET
Figure 64. Voltage-to-Current Conversion Circuitry
Rev. A | Page 26 of 40
AD5412/AD5422
SERIAL INTERFACE
CONTROLLER
AD5412/
AD54221
The AD5412/AD5422 are controlled over a versatile 3-wire
serial interface that operates at clock rates of up to 30 MHz. It is
compatible with SPI, QSPI™, MICROWIRE, and DSP standards.
DATA OUT
SDIN
SERIAL CLOCK
CONTROL OUT
SCLK
LATCH
Input Shift Register
DATA IN
SDO
The input shift register is 24 bits wide. Data is loaded into the
device MSB first as a 24-bit word under the control of a serial
clock input, SCLK. Data is clocked in on the rising edge of
SCLK. The input register consists of eight address bits and
16 data bits, as shown in Table 7. The 24-bit word is uncondi-
tionally latched on the rising edge of the LATCH pin. Data
continues to be clocked in irrespective of the state of LATCH.
On the rising edge of LATCH, the data that is present in the
input register is latched; in other words, the last 24 bits to be
clocked in before the rising edge of LATCH is the data that is
latched. The timing diagram for this operation is shown in
Figure 2.
SDIN
AD5412/
AD54221
SCLK
LATCH
SDO
SDIN
AD5412/
AD54221
Table 7. Input Shift Register Format
MSB
SCLK
LATCH
LSB
D23 to D16
Address byte
D15 to D0
SDO
Data-word
1
ADDITIONAL PINS OMITTED FOR CLARITY.
Table 8. Address Byte Functions
Address Word Function
Figure 66. Daisy Chaining the AD5412/AD5422
00000000
00000001
00000010
No operation (NOP)
Data register
Readback register value as per read address
(see Table 9)
Daisy-Chain Operation
For systems that contain several devices, the SDO pin can be
used to daisy-chain the devices together as shown in Figure 66.
This daisy-chain mode can be useful in system diagnostics and
in reducing the number of serial interface lines. Daisy-chain
mode is enabled by setting the DCEN bit of the control register
to 1. The first rising edge of SCLK that clocks in the MSB of the
data-word marks the beginning of the write cycle. SCLK is
continuously applied to the input shift register. If more than 24
clock pulses are applied, the data ripples out of the shift register
and appears on the SDO line. This data is valid on the rising
edge of SCLK, having been clocked out on the previous falling
SCLK edge. By connecting the SDO of the first device to the
SDIN input of the next device in the chain, a multidevice
interface is constructed. Each device in the system requires
24 clock pulses. Therefore, the total number of clock cycles
must equal 24 × n, where n is the total number of AD5412/
AD5422 devices in the chain. When the serial transfer to all
devices is complete, LATCH is taken high. This latches the
input data in each device in the daisy chain. The serial clock can
be a continuous or a gated clock.
01010101
01010110
Control register
Reset register
Standalone Operation
The serial interface works with both a continuous and noncon-
tinuous serial clock. A continuous SCLK source can be used
only if LATCH is taken high after the correct number of data
bits have been clocked in. In gated clock mode, a burst clock
containing the exact number of clock cycles must be used, and
LATCH must be taken high after the final clock to latch the
data. The rising edge of SCLK that clocks in the MSB of the
data-word marks the beginning of the write cycle. Exactly 24
rising clock edges must be applied to SCLK before LATCH is
brought high. If LATCH is brought high before the 24th rising
SCLK edge, the data written is invalid. If more than 24 rising
SCLK edges are applied before LATCH is brought high, the
input data is also invalid.
A continuous SCLK source can be used only if LATCH is taken
high after the correct number of clock cycles. In gated clock
mode, a burst clock containing the exact number of clock cycles
must be used, and LATCH must be taken high after the final
clock to latch the data (see Figure 4 for a timing diagram).
Rev. A | Page 27 of 40
AD5412/AD5422
Readback Operation
calibration registers and ensures specified operation of the
AD5412/AD5422.
Readback mode is invoked by setting the address byte and
read address when writing to the input register (see Table 9 and
Table 11). The next write to the AD5412/AD5422 should be a
NOP command, which clocks out the data from the previously
addressed register as shown in Figure 3.
Voltage Output
For a unipolar voltage output range, the output voltage can be
expressed as
D
2
VOUT VREFIN Gain
By default the SDO pin is disabled after having addressed the
AD5412/AD5422 for a read operation; a rising edge on LATCH
enables the SDO pin in anticipation of data being clocked out.
After the data has been clocked out on SDO, a rising edge on
LATCH disables (tristate) the SDO pin. To read back the data
register, for example, implement the following sequence:
N
For a bipolar voltage output range, the output voltage can be
expressed as
Gain VREFIN
D
2
VOUT VREFIN Gain
N
2
1. Write 0x020001 to the input register. This configures the
part for read mode with the data register selected.
2. Follow this with a second write: a NOP condition, which is
0x000000. During this write, the data from the register is
clocked out on the SDO line.
where:
D is the decimal equivalent of the code loaded to the DAC.
N is the bit resolution of the DAC.
VREFIN is the reference voltage applied at the REFIN pin.
Gain is an internal gain whose value depends on the output
range selected by the user as shown in Table 10.
Table 9. Read Address Decoding
Read Address
Function
Table 10. Internal Gain Value
00
01
10
Read status register
Read data register
Read control register
Output Range
Gain Value
+5 V
+10 V
5 V
1
2
2
4
POWER-ON STATE
10 V
During power-on of the AD5412/AD5422, the power-on-reset
circuit ensures that all registers are loaded with zero-code. As
such, both outputs are disabled; that is, the VOUT and IOUT pins
are in tristate. The +VSENSE pin is internally connected to ground
through a 40 kΩ resistor. Therefore, if the VOUT and +VSENSE pins
are connected together, VOUT is effectively clamped to ground
through a 40 kΩ resistor. Also upon power-on, internal
calibration registers are read, and the data is applied to internal
calibration circuitry. For a reliable read operation, there must be
sufficient voltage on the AVDD supply when the read event is
triggered by the DVCC power supply powering up. Powering up
the DVCC supply after the AVDD supply ensures this. If DVCC and
AVDD are powered up simultaneously or the internal DVCC is
enabled, the supplies should be powered up at a rate greater
than, typically, 500 V/sec or 24 V/50 ms. If this cannot be
achieved, issue a reset command to the AD5412/AD5422 after
power-on; this performs a power-on-reset event, reading the
Current Output
For the 0 mA to 20 mA, 0 mA to 24 mA, and 4 mA to 20 mA
current output ranges, the output current is respectively
expressed as
20 mA
2N
IOUT
IOUT
IOUT
D
24 mA
2N
D
16 mA
2N
D 4 mA
where:
D is the decimal equivalent of the code loaded to the DAC.
N is the bit resolution of the DAC.
Table 11. Input Shift Register Contents for a Read Operation
MSB
LSB
D0
Read address
D23
D22
D21
D20
D19
D18
D17
D16
D15 to D2
D1
0
0
0
0
0
0
1
0
X1
1 X = don’t care.
Rev. A | Page 28 of 40
AD5412/AD5422
DATA REGISTER
The data register is addressed by setting the address word of the input shift register to 0x01. The data to be written to the data register is
entered in the D15 to D4 positions for the AD5412 and the D15 to D0 positions for the AD5422, as shown in Table 12 and Table 13.
Table 12. Programming the AD5412 Data Register
MSB
LSB
D0
X
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D6
D5
D5
D4
D4
D3
D2
D1
12-bit data-word
X
X
X
Table 13. Programming the AD5422 Data Register
MSB
LSB
D0
D15
D14
D13
D12
D11
D10
D9
D8
D7
D3
D2
D1
16-bit data-word
CONTROL REGISTER
The control register is addressed by setting the address word of the input shift register to 0x55. The data to be written to the control
register is entered in the D15 to D0 positions, as shown in Table 14. The control register functions are shown in Table 15.
Table 14. Programming the Control Register
MSB
LSB
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
D0
CLRSEL
OVRRNG
REXT
OUTEN
SR clock
SR step
SREN
DCEN
R2
R1
R0
Table 15. Control Register Functions
Option
CLRSEL
OVRRNG
REXT
Description
See Table 21 for a description of the CLRSEL operation.
Setting this bit increases the voltage output range by 10% (see the AD5412/AD5422 Features section).
Setting this bit selects the external current setting resistor (see the AD5412/AD5422 Features section).
OUTEN
SR clock
SR step
SREN
Output enable. This bit must be set to enable the outputs. The range bits select which output is functional.
Digital slew rate control (see the AD5412/AD5422 Features section).
Digital slew rate control (see the AD5412/AD5422 Features section).
Digital slew rate control enable.
DCEN
Daisy chain enable.
R2, R1, R0
Output range select (see Table 16).
Table 16. Output Range Options
R2
R1
R0
0
1
Output Range Selected
0 V to 5 V voltage range
0 V to 10 V voltage range
5 V voltage range
0
0
0
0
0
1
0
0
1
1
10 V voltage range
1
1
1
0
1
1
1
0
1
4 mA to 20 mA current range
0 mA to 20 mA current range
0 mA to 24 mA current range
Rev. A | Page 29 of 40
AD5412/AD5422
RESET REGISTER
The reset register is addressed by setting the address word of the input shift register to 0x56. The data to be written to the reset register is
entered in the D0 position as shown in Table 17. The reset register options are shown in Table 17 and Table 18.
Table 17. Programming the Reset Register
MSB
LSB
D0
D15
D14
D13
D12
D11
D10
D9
D8
D7
D6
D5
D4
D3
D2
D1
Reserved
Reset
Table 18. Reset Register Functions
Option
Description
Reset
Setting this bit performs a reset operation, restoring the AD5412/AD5422 to its power-on state.
STATUS REGISTER
The status register is a read-only register. The status register functionality is shown in Table 19 and Table 20.
Table 19. Decoding the Status Register
MSB
LSB
D15
D14
D13
D12
D11
D10
D9
D8 D7
D6 D5
D4
D3
D2
D1
D0
Reserved
IOUT fault
Slew active
Over temp
Table 20. Status Register Functions
Option
Description
IOUT Fault
This bit is set if a fault is detected on the IOUT pin.
Slew Active
Over Temp
This bit is set while the output value is slewing (slew rate control enabled).
This bit is set if the AD5412/AD5422 core temperature exceeds ~150°C.
Rev. A | Page 30 of 40
AD5412/AD5422
AD5412/AD5422 FEATURES
FAULT ALERT
ASYNCHRONOUS CLEAR (CLEAR)
The CLEAR pin is an active high clear that allows the voltage
output to be cleared to either zero-scale code or midscale code,
user selectable via the CLEAR SELECT pin, or the CLRSEL bit
of the control register, as described in Table 21. (The clear select
feature is a logical OR function of the CLEAR SELECT pin and
the CLRSEL bit.) The current output clears to the bottom of its
programmed range. It is necessary for CLEAR to be high for a
minimum amount of time to complete the operation (see
Figure 2). When the CLEAR signal is returned low, the output
remains at the cleared value. The preclear value can be restored
by pulsing the LATCH signal low without clocking any data. A
new value cannot be programmed until the CLEAR pin is
returned low.
FAULT
The AD5412/AD5422 are equipped with a
is an open-drain output allowing several AD5412/AD5422
devices to be connected together to one pull-up resistor for
pin, which
FAULT
global fault detection. The
of the following fault scenarios:
pin is forced active by one
•
The voltage at IOUT attempts to rise above the compliance
range, due to an open-loop circuit or insufficient power
supply voltage. The IOUT current is controlled by a PMOS
transistor and internal amplifier, as shown in Figure 64.
The internal circuitry that develops the fault output avoids
using a comparator with window limits because this would
FAULT
require an actual output error before the
output
becomes active. Instead, the signal is generated when the
internal amplifier in the output stage has less than ~1 V
of remaining drive capability (when the gate of the output
Table 21. CLRSEL Options
Output Value
CLRSEL Unipolar Output Range
Bipolar Output Range
0 V
Negative full scale
FAULT
PMOS transistor nearly reaches ground). Thus, the
0
1
0 V
Midscale
output activates slightly before the compliance limit is
reached. Because the comparison is made within the
feedback loop of the output amplifier, the output accuracy
is maintained by its open-loop gain, and an output error
In addition to defining the output value for a clear operation,
the CLRSEL bit and CLEAR SELECT pin also define the default
output value. During selection of a new voltage range, the
output value is as defined in Table 21. To avoid glitches on the
output, it is recommended that, before changing voltage ranges,
the user disable the output by setting the OUTEN bit of the
control register to logic low. When OUTEN is set to logic high,
the output goes to the default value as defined by CLRSEL and
CLEAR SELECT.
FAULT
does not occur before the
output becomes active.
•
If the core temperature of the AD5412/AD5422 exceeds
approximately 150°C.
The IOUT fault and over temp bits of the status register are used
FAULT
in conjunction with the
pin to inform the user which
FAULT
one of the fault conditions caused the
(see Table 19 and Table 20).
pin to be asserted
VOLTAGE OUTPUT SHORT CIRCUIT PROTECTION
INTERNAL REFERENCE
Under normal operation, the voltage output sinks/sources
10 mA. The maximum current that the voltage output delivers
is ~20 mA; this is the short-circuit current.
The AD5412/AD5422 contain an integrated 5 V voltage
reference with initial accuracy of 5 mV maximum and a
temperature drift coefficient of 10 ppm/°C maximum. The
reference voltage is buffered and externally available for use
elsewhere within the system. See Figure 16 for a load regulation
graph of the integrated reference.
VOLTAGE OUTPUT OVERRANGE
An overrange facility is provided on the voltage output. When
enabled via the control register, the selected output range is
overranged by, typically, 10%.
EXTERNAL CURRENT SETTING RESISTOR
VOLTAGE OUTPUT FORCE-SENSE
RSET is an internal sense resistor as part of the voltage-to-current
conversion circuitry (see Figure 64). The stability of the output
current over temperature is dependent on the stability of the
value of RSET. As a method of improving the stability of the
output current over temperature, an external precision 15 kꢀ
low drift resistor can be connected to the RSET pin of the
AD5412/AD5422 to be used instead of the internal resistor
(RSET). The external resistor is selected via the control register
(see Table 14).
The +VSENSE and −VSENSE pins are provided to facilitate remote
sensing of the load connected to the voltage output. If the load
is connected at the end of a long or high impedance cable,
sensing the voltage at the load allows the output amplifier to
compensate and ensure that the correct voltage is applied across
the load. This function is limited only by the available power
supply headroom.
Rev. A | Page 31 of 40
AD5412/AD5422
SR step bits. SR clock defines the rate at which the digital slew is
updated; SR step defines by how much the output value changes
at each update. Both parameters together define the rate of
change of the output voltage or current. Table 22 and Table 23
outline the range of values for both the SR clock and SR step
parameters. Figure 68 shows the output current changing for
ramp times of 10 ms, 50 ms, and 100 ms.
DIGITAL POWER SUPPLY
By default, the DVCC pin accepts a power supply of 2.7 V to
5.5 V. Alternatively, via the DVCC SELECT pin, an internal 4.5 V
power supply can be output on the DVCC pin for use as a digital
power supply for other devices in the system or as a termination
for pull-up resistors. This facility offers the advantage of not
having to bring a digital supply across an isolation barrier. The
internal power supply is enabled by leaving the DVCC SELECT
pin unconnected. To disable the internal supply, tie DVCC
SELECT to 0 V. DVCC is capable of supplying up to 5 mA of
current (for a load regulation graph, see Figure 10).
Table 22. Slew Rate Step Size Options
AD5412 Step Size
(LSB)
AD5422 Step
Size (LSB)
SR Step
000
001
010
011
100
101
110
111
1/16
1/8
1/4
1/2
1
2
4
8
1
2
4
8
16
32
64
128
EXTERNAL BOOST FUNCTION
The addition of an external boost transistor, as shown in
Figure 67, reduces the power dissipated in the AD5412/AD5422
by reducing the current flowing in the on-chip output transistor
(dividing it by the current gain of the external circuit). A
discrete NPN transistor with a breakdown voltage, BVCEO
,
greater than 40 V can be used. The external boost capability
has been developed for users who may wish to use the
AD5412/AD5422 at the extremes of the supply voltage, load
current, and temperature range. The boost transistor can also
be used to reduce the amount of temperature-induced drift in
the part. This minimizes the temperature-induced drift of the
on-chip voltage reference, which improves on drift and
linearity.
Table 23. Slew Rate Update Clock Options
SR Clock
0000
0001
0010
0011
0100
0101
0110
0111
1000
1001
1010
1011
1100
1101
1110
1111
Update Clock Frequency (Hz)
257,730
198,410
152,440
131,580
115,740
69,440
37,590
25,770
20,160
16,030
10,290
8280
BOOST
MJD31C
OR
AD5412/
PBSS8110Z
AD5422
I
OUT
1kΩ
0.022µF
R
LOAD
Figure 67. External Boost Configuration
6900
5530
4240
3300
EXTERNAL COMPENSATION CAPACITOR
The voltage output can ordinarily drive capacitive loads of up to
20 nF; if there is a requirement to drive greater capacitive loads,
of up to 1 μF, an external compensation capacitor can be con-
nected between the CCOMP and VOUT pins. The addition of the
capacitor keeps the output voltage stable but also reduces the
bandwidth and increases the settling time of the voltage output.
The time it takes for the output to slew over a given output
range can be expressed as follows:
Output Change
Slew Time =
(1)
Step Size ×Update Clock Frequency × LSB Size
DIGITAL SLEW RATE CONTROL
The slew rate control feature of the AD5412/AD5422 allows the
user to control the rate at which the output voltage or current
changes. With the slew rate control feature disabled, the output
changes at a rate limited by the output drive circuitry and the
attached load. See Figure 62 for current output step and
Figure 36 for voltage output step. To reduce the slew rate, enable
the slew rate control feature. With the feature enabled via the
SREN bit of the control register (see Table 14), the output, instead
of slewing directly between two values, steps digitally at a rate
defined by two parameters accessible via the control register, as
shown in Table 14. The parameters are set by the SR clock and
where:
Slew Time is expressed in seconds.
Output Change is expressed in amps for IOUT or volts for VOUT
.
When the slew rate control feature is enabled, all output
changes change at the programmed slew rate; if the CLEAR
pin is asserted, the output slews to the zero-scale value at the
programmed slew rate. The output can be halted at its current
value with a write to the control register. To avoid halting the
output slew, the slew active bit (see Table 19) can be read to
check that the slew has completed before writing to any of the
Rev. A | Page 32 of 40
AD5412/AD5422
AD5410/AD5420 registers. The update clock frequency for any
given value is the same for all output ranges. The step size,
however, varies across output ranges for a given value of step
size because the LSB size is different for each output range.
Table 24 shows the range of programmable slew times for a full-
scale change on any of the output ranges. The values in Table 24
were obtained using Equation 1.
smoothing out the steps caused by the digital code increments,
as shown in Figure 72.
C1
C2
AV
CAP1
CAP2
DD
The digital slew rate control feature results in a staircase
formation on the current output, as shown in Figure 72. This
figure also shows how the staircase can be removed by
connecting capacitors to the CAP1 and CAP2 pins, as described
in the IOUT Filtering Capacitors (LFCSP Package) section.
4kΩ
40Ω
BOOST
DAC
12.5kΩ
I
OUT
25
R1
T
= 25°C
A
AV
= 24V
DD
R
= 300Ω
LOAD
20
15
10
5
Figure 70. IOUT Filter Circuitry
25
20
15
10
5
T
AV
R
= 25°C
A
= 24V
DD
= 300Ω
LOAD
10ms RAMP, SR CLOCK = 0x1, SR STEP = 0x5
50ms RAMP, SR CLOCK = 0xA, SR STEP = 0x7
100ms RAMP, SR CLOCK = 0x8, SR STEP = 0x5
0
–10
NO CAPACITOR
10nF ON CAP1
10nF ON CAP2
47nF ON CAP1
47nF ON CAP2
0
10 20 30 40 50 60 70 80 90 100 110
TIME (ms)
Figure 68. Output Current Slewing Under Control of the Digital Slew Rate
Control Feature
0
–0.5
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
IOUT FILTERING CAPACITORS (LFCSP PACKAGE)
TIME (ms)
Capacitors can be placed between CAP1 and AVDD, and CAP2
and AVDD, as shown in Figure 69.
Figure 71. Slew Controlled 4 mA to 20 mA Output Current Step Using
External Capacitors on the CAP1 and CAP2 Pins
AV
DD
6.8
T
= 25°C
C1
C2
A
AV
= 24V
= 300Ω
6.7
6.6
6.5
6.4
6.3
6.2
6.1
AV
DD
DD
R
LOAD
CAP1
CAP2
AD5412/
AD5422
I
GND
OUT
Figure 69. IOUT Filtering Capacitors
The CAP1 and CAP2 pins are available only on the LFCSP
package. The capacitors form a filter on the current output
circuitry, as shown in Figure 70, reducing the bandwidth and
the slew rate of the output current. Figure 71 shows the effect
the capacitors have on the slew rate of the output current. To
achieve significant reductions in the rate of change, very large
capacitor values are required, which may not be suitable in
some applications. In this case, the digital slew rate control
feature can be used. The capacitors can be used in conjunction
with the digital slew rate control feature as a means of
NO EXTERNAL CAPS
10nF ON CAP1
10nF ON CAP2
–1
0
1
2
3
4
5
6
7
8
TIME (ms)
Figure 72. Smoothing Out the Steps Caused by the Digital Slew
Rate Control Feature
Rev. A | Page 33 of 40
AD5412/AD5422
Table 24. Programmable Slew Time Values in Seconds for a Full-Scale Change on Any Output Range
Update Clock
Step Size (LSB)
Frequency (Hz)
1
2
4
8
16
32
64
128
257,730
198,410
152,440
131,580
115,740
69,440
37,590
25,770
20,160
16,030
10,290
8280
0.25
0.33
0.43
0.50
0.57
0.9
1.7
2.5
3.3
4.1
6.4
7.9
9.5
12
0.13
0.17
0.21
0.25
0.28
0.47
0.87
1.3
1.6
2.0
3.2
4.0
0.06
0.08
0.11
0.12
0.14
0.24
0.44
0.64
0.81
1.0
1.6
2.0
2.4
3.0
3.9
5.0
0.03
0.04
0.05
0.06
0.07
0.12
0.22
0.32
0.41
0.51
0.80
1.0
0.016
0.021
0.027
0.031
0.035
0.06
0.11
0.16
0.20
0.26
0.40
0.49
0.59
0.74
0.97
1.24
0.008
0.010
0.013
0.016
0.018
0.03
0.05
0.08
0.10
0.13
0.20
0.25
0.30
0.37
0.48
0.62
0.004
0.005
0.007
0.008
0.009
0.015
0.03
0.04
0.05
0.06
0.10
0.12
0.15
0.19
0.24
0.31
0.0020
0.0026
0.0034
0.0039
0.0044
0.007
0.014
0.020
0.025
0.03
0.05
0.06
0.07
0.09
0.12
0.16
6900
5530
4240
3300
4.8
5.9
7.7
9.9
1.2
1.5
1.9
2.5
15
20
Rev. A | Page 34 of 40
AD5412/AD5422
APPLICATIONS INFORMATION
ADuM14001
ENCODE
CONTROLLER
DRIVING INDUCTIVE LOADS
V
V
V
V
V
V
V
V
IA
IB
IC
ID
OA
OB
OC
OD
TO
SERIAL
CLOCK IN
When driving inductive or poorly defined loads, connect a
0.01 μF capacitor between IOUT and GND. This ensures stability
with loads above 50 mH. There is no maximum capacitance
limit. The capacitive component of the load may cause slower
settling. The digital slew rate control feature may also prove
useful in this situation.
DECODE
DECODE
DECODE
DECODE
SCLK
TO
SDIN
SERIAL
DATA OUT
ENCODE
ENCODE
ENCODE
TO
LATCH
SYNC OUT
TRANSIENT VOLTAGE PROTECTION
CONTROL
OUT
TO
CLEAR
The AD5412/AD5422 contain ESD protection diodes that
prevent damage from normal handling. The industrial control
environment can, however, subject I/O circuits to much higher
transients. To protect the AD5412/AD5422 from excessively
high voltage transients, external power diodes and a surge
current limiting resistor are required, as shown in Figure 73.
The constraint on the resistor value is that, during normal
operation, the output level at IOUT must remain within its voltage
compliance limit of AVDD – 2.5 V, and the two protection diodes
and resistor must have appropriate power ratings. Further
protection can be provided with transient voltage suppressors or
transorbs; these are available as both unidirectional suppressors
(protect against positive high voltage transients) and
1
ADDITIONAL PINS OMITTED FOR CLARITY.
Figure 74. Isolated Interface
MICROPROCESSOR INTERFACING
Microprocessor interfacing to the AD5412/AD5422 is via a serial
bus that uses a protocol compatible with microcontrollers and
DSP processors. The communications channel is a 3-wire
minimum interface consisting of a clock signal, a data signal,
and a latch signal. The AD5412/AD5422 require a 24-bit data-
word with data valid on the rising edge of SCLK.
bidirectional suppressors (protect against both positive and
negative high voltage transients) and are available in a wide
range of standoff and breakdown voltage ratings. It is
For all interfaces, the DAC output update is initiated on the
rising edge of LATCH. The contents of the registers can be
read using the readback function.
recommended that all field connected nodes be protected.
LAYOUT GUIDELINES
AV
DD
In any circuit where accuracy is important, careful consider-
ation of the power supply and ground return layout helps to
ensure the rated performance. Design the printed circuit board
(PCB) on which the AD5412/AD5422 is mounted so that the
analog and digital sections are separated and confined to
certain areas of the board. If the AD5412/AD5422 is in a system
where multiple devices require an analog ground-to-digital
ground connection, make the connection at one point only.
Establish the star ground point as close as possible to the device.
AV
DD
R
P
AD5412/
AD5422
I
OUT
R
LOAD
GND
Figure 73. Output Transient Voltage Protection
The AD5412/AD5422 should have ample supply bypassing
of 10 μF in parallel with 0.1 μF on each supply located as close
to the package as possible, ideally right up against the device.
The 10 μF capacitors are the tantalum bead type. The 0.1 μF
capacitor should have low effective series resistance (ESR)
and low effective series inductance (ESI), such as the common
ceramic types, which provide a low impedance path to ground
at high frequencies to handle transient currents due to internal
logic switching.
GALVANICALLY ISOLATED INTERFACE
In many process control applications, it is necessary to provide
an isolation barrier between the controller and the unit being
controlled to protect and isolate the controlling circuitry from
any hazardous common-mode voltages that may occur. The
iCoupler® products from Analog Devices, Inc., provide voltage
isolation in excess of 2.5 kV. The serial loading structure of the
AD5412/AD5422 makes the parts ideal for isolated interfaces
because the number of interface lines is kept to a minimum.
Figure 74 shows a 4-channel isolated interface to the AD5412/
AD5422 using an ADuM1400. For further information, visit
http://www.analog.com/icouplers.
Rev. A | Page 35 of 40
AD5412/AD5422
The power supply lines of the AD5412/AD5422 should use as
large a trace as possible to provide low impedance paths and
reduce the effects of glitches on the power supply line. Fast
switching signals such as clocks should be shielded with a
digital ground to avoid radiating noise to other parts of the
board. Never run these near the reference inputs. A ground line
routed between the SDIN and SCLK lines helps reduce crosstalk
between them (this is not required on a multilayer board that
has a separate ground plane, but separating the lines helps). It
is essential to minimize noise on the REFIN line because it
couples through to the DAC output.
To ensure that the junction temperature does not exceed 125°C
while driving the maximum current of 24 mA directly into
ground (also adding an on-chip current of 3 mA), reduce AVDD
from the maximum rating to ensure that the package is not
required to dissipate more power than previously stated (see
Table 25, Figure 75, and Figure 76).
2.5
LFCSP
2.0
1.5
Avoid crossover of digital and analog signals. Traces on
opposite sides of the PCB should run at right angles to each
other. This reduces the effects of feed through the board. A
microstrip technique is by far the best but not always possible
with a double-sided board. In this technique, the component
side of the board is dedicated to the ground plane, and signal
traces are placed on the solder side.
TSSOP
1.0
0.5
0
40
45
50
55
60
65
70
75
80
85
THERMAL AND SUPPLY CONSIDERATIONS
AMBIENT TEMPERATURE (°C)
The AD5412/AD5422 are designed to operate at a maximum
junction temperature of 125°C. It is important that the devices
not be operated under conditions that cause the junction
temperature to exceed this value. Excessive junction tempera-
ture can occur if the AD5412/AD5422 are operated from the
maximum AVDD while driving the maximum current (24 mA)
directly to ground. In this case, control the ambient temperature
or reduce AVDD. The conditions depend on the device package.
Figure 75. Maximum Power Dissipation vs. Ambient Temperature
45
43
LFCSP
41
39
TSSOP
37
35
33
31
29
27
25
At the maximum ambient temperature of 85°C, the 24-lead
TSSOP package can dissipate 950 mW, and the 40-lead LFCSP
package can dissipate 1.42 mW.
25
35
45
55
65
75
85
AMBIENT TEMPERATURE (°C)
Figure 76. Maximum Supply Voltage vs. Ambient Temperature
Table 25. Thermal and Supply Considerations for Each Package
Considerations
TSSOP
LFCSP
TJ max − TA 125 − 85
TJ max − TA
Maximum Allowed Power
Dissipation When Operating
at an Ambient Temperature
of 85°C
125 − 85
=
= 950 mW
=
= 1.42 mW
θ JA
28
θJA
42
Maximum Allowed Ambient
Temperature When
TJ max − PD ×θJA =125−(40× 0.028) × 42 = 78°C
TJ max − PD ×θJA =125 − (40 × 0.028) × 28 = 94°C
Operating from a Supply of
40 V and Driving 24 mA
Directly to Ground
Maximum Allowed Supply
Voltage When Operating at
an Ambient Temperature of
85°C and Driving 24 mA
Directly to Ground
TJ max − TA
AIDD ×θJA
125 − 85
0.028× 28
TJ max − TA
AIDD ×θJA
125 − 85
0.028× 42
=
= 51V
=
= 34 V
Rev. A | Page 36 of 40
AD5412/AD5422
Isolation between the AD5412/AD5422 and the backplane
circuitry is provided with ADuM1400 and ADuM1200
iCoupler digital isolators; further information on iCoupler
products is available at www.analog.com/icouplers. The
internally generated digital power supply of the AD5412/
AD5422 powers the field side of the digital isolaters, removing
the need to generate a digital power supply on the field side of
the isolation barrier. The AD5412/AD5422 digital supply
output supplies up to 5 mA, which is more than enough to
supply the 2.8 mA requirements of the ADuM1400 and
ADuM1200 operating at a logic signal frequency of up to
1 MHz. To reduce the number of isolators required, nonessen-
INDUSTRIAL ANALOG OUTPUT MODULE
Many industrial control applications have requirements for
accurately controlled current and voltage output signals. The
AD5412/AD5422 are ideal for such applications. Figure 77
shows the AD5412/AD5422 in a circuit design for an output
module, specifically for use in an industrial control application.
The design provides for a current or voltage output. The module
is powered from a field supply of 24 V. This supplies AVDD directly.
An inverting buck regulator generates the negative supply for
AVSS. For transient overvoltage protection, transient voltage
suppressors (TVS) are placed on all field accessible connections.
A 24 V volt TVS is placed on each IOUT, VOUT, +VSENSE, and
−VSENSE connection, and a 36 V TVS is placed on the field
supply input. For added protection, clamping diodes are
connected from the IOUT, VOUT, +VSENSE, and −VSENSE pins to the
AVDD and AVSS power supply pins. If remote voltage load sensing
is not required, the +VSENSE pin can be directly connected to the
FAULT
tial signals such as CLEAR can be connected to GND.
and SDO can be left unconnected, reducing the isolation
requirements to just three signals.
VOUT pin and the –VSENSE pin can be connected to GND.
–15V
INVERTING
BUCK
REGULATOR
24V FIELD SUPPLY
FIELD GROUND
10µF
36V
SMAJ36CA
0.1µF
BACKPLANE
SUPPLY
0.1µF
ADuM1400
4nF
0.1µF
10kΩ
V
V
DD1
DD2
NC
V
E2
AV
C
COMP
DV
CC
DV
SELECT
DD
CC
V
V
IA
OA
OB
OC
OD
+V
SENSE
+V
SENSE
V
V
V
V
IB
CLEAR SELECT
V
4.7kΩ
100Ω
IC
V
ID
V
+V
–V
I
OUT
OUT
CLEAR
LATCH
SCLK
SDIN
GND
GND
GND
GND
2
2
1
1
AD5412/
AD54221
–V
SENSE
SENSE
V
V
V
V
DD1
V
V
DD2
18Ω
I
FAULT
OUT
OA
OB
IA
OUT
SDO
GND
IB
24V
SMAJ24CA
AV
SS
REFIN
REFOUT
GND GND
2
1
ADuM1200
0.1µF
10µF
0.1µF
–15V
1
ADDITIONAL PINS OMITTED FOR CLARITY.
Figure 77. AD5412/AD5422 in an Industrial Analog Output Module Application
Rev. A | Page 37 of 40
AD5412/AD5422
OUTLINE DIMENSIONS
5.02
5.00
4.95
7.90
7.80
7.70
24
13
12
4.50
4.40
4.30
3.25
3.20
3.15
EXPOSED
PAD
(Pins Up)
6.40 BSC
1
BOTTOM VIEW
TOP VIEW
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
1.05
1.00
0.80
1.20 MAX
8°
0°
SECTION OF THIS DATA SHEET.
0.20
0.09
0.15
0.05
0.30
0.19
0.65
BSC
0.75
0.60
0.45
SEATING
PLANE
0.10 COPLANARITY
COMPLIANT TO JEDEC STANDARDS MO-153-ADT
Figure 78. 24-Lead Thin Shrink Small Outline Package, Exposed Pad [TSSOP_EP]
(RE-24)
Dimensions shown in millimeters
6.00
BSC SQ
0.60 MAX
0.60 MAX
PIN 1
INDICATOR
31
40
1
30
PIN 1
INDICATOR
0.50
BSC
TOP
VIEW
4.25
4.10 SQ
3.95
5.75
BSC SQ
EXPOSED
PAD
(BOT TOM VIEW)
0.50
0.40
0.30
21
10
20
11
0.25 MIN
4.50
REF
12° MAX
0.80 MAX
0.65 TYP
FOR PROPER CONNECTION OF
THE EXPOSED PAD, REFER TO
THE PIN CONFIGURATION AND
FUNCTION DESCRIPTIONS
0.05 MAX
0.02 NOM
1.00
0.85
0.80
0.30
0.23
0.18
COPLANARITY
0.08
0.20 REF
SECTION OF THIS DATA SHEET.
SEATING
PLANE
COMPLIANT TO JEDEC STANDARDS MO-220-VJJD-2
Figure 79. 40-Lead Lead Frame Chip Scale Package [LFCSP_VQ]
6 mm × 6 mm Body, Very Thin Quad
(CP-40-1)
Dimensions shown in millimeters
Rev. A | Page 38 of 40
AD5412/AD5422
ORDERING GUIDE
Model
Resolution IOUT TUE
12 Bits
VOUT TUE
Temperature Range Package Description Package Option
AD5412AREZ1
0.5% FSR max 0.3% FSR max −40°C to +85°C
0.5% FSR max 0.3% FSR max −40°C to +85°C
0.5% FSR max 0.3% FSR max −40°C to+85°C
0.5% FSR max 0.3% FSR max −40°C to+85°C
0.5% FSR max 0.3% FSR max −40°C to+85°C
0.5% FSR max 0.3% FSR max −40°C to+85°C
0.3% FSR max 0.1% FSR max −40°C to+85°C
0.3% FSR max 0.1% FSR max −40°C to+85°C
0.5% FSR max 0.3% FSR max −40°C to+85°C
0.5% FSR max 0.3% FSR max −40°C to+85°C
0.3% FSR max 0.1% FSR max −40°C to+85°C
0.3% FSR max 0.1% FSR max −40°C to+85°C
24 Lead TSSOP_EP
24 Lead TSSOP_EP
40 Lead LFCSP_VQ
40 Lead LFCSP_VQ
24 Lead TSSOP_EP
24 Lead TSSOP_EP
24 Lead TSSOP_EP
24 Lead TSSOP_EP
40 Lead LFCSP_VQ
40 Lead LFCSP_VQ
40 Lead LFCSP_VQ
40 Lead LFCSP_VQ
Evaluation Board
RE-24
RE-24
CP-40-1
CP-40-1
RE-24
RE-24
RE-24
RE-24
CP-40-1
CP-40-1
CP-40-1
CP-40-1
AD5412AREZ-REEL71 12 Bits
AD5412ACPZ-REEL1
AD5412ACPZ-REEL71 12 Bits
AD5422AREZ1
AD5422AREZ-REEL1
AD5422BREZ1
AD5422BREZ-REEL1
AD5422ACPZ-REEL1
AD5422ACPZ-REEL71 16 Bits
AD5422BCPZ-REEL1
16 Bits
AD5422BCPZ-REEL71 16 Bits
12 Bits
16 Bits
16 Bits
16 Bits
16 Bits
16 Bits
EVAL-AD5422EBZ
1 Z = RoHS Compliant Part.
Rev. A | Page 39 of 40
AD5412/AD5422
NOTES
©2009 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D06996-0-8/09(A)
Rev. A | Page 40 of 40
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