ACTQ964/868.3/QCC8C [ACT]

surface-acoustic-wave (SAW) resonator; 表面声波( SAW)谐振
ACTQ964/868.3/QCC8C
型号: ACTQ964/868.3/QCC8C
厂家: ADVANCED CRYSTAL TECHNOLOGY    ADVANCED CRYSTAL TECHNOLOGY
描述:

surface-acoustic-wave (SAW) resonator
表面声波( SAW)谐振

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中文:  中文翻译
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Tel : +44 118 979 1238  
Fax : +44 118 979 1283  
Email: info@actcrystals.com  
The ACTQ964/868.3/QCC8C is a two-port, 180° surface-acoustic-wave (SAW) resonator in a  
surface-mount ceramic QCC8C case. It provides reliable, fundamental-mode, quartz frequency  
stabilization i.e. in transmitters or local oscillators operating at 868.300 MHz.  
1.Package Dimension (QCC8C)  
2.  
Pin  
2
Configuration  
Input / Output  
Input / Output  
Case Ground  
NC  
6
4,8  
1,3,5,7  
Sign  
A
Data (unit: mm)  
Sign  
Data (unit: mm)  
2.08  
0.6  
E
F
1.2  
1.35  
5.0  
B
C
1.27  
2.54  
G
H
D
5.0  
3.Equivalent LC Model and Test Circuit  
4.Typical Application Circuits  
1) Low-Power Transmitter Application  
2) Local Oscillator Application  
In keeping with our ongoing policy of product evolvement and improvement, the above specification is subject to change without notice.  
ISO9001: 2000 Registered - Registration number 6830/2  
Issue : 1 C1  
Date : SEPT 04  
For quotations or further information please contact us at:  
3 The Business Centre, Molly Millars Lane, Wokingham, Berks, RG41 2EY, UK  
http://www.actcrystals.com  
1 OF 3  
Tel : +44 118 979 1238  
Fax : +44 118 979 1283  
Email: info@actcrystals.com  
5.Typical Frequency Response  
6.Temperature Characteristics  
7.Performance  
7-1.Maximum Ratings  
Rating  
Value  
Units  
CW RF Power Dissipation  
10  
dBm  
DC Voltage Between Terminals  
Case Temperature  
±30V  
VDC  
-40 to +85  
+250  
°C  
°C  
Soldering Temperature  
7-2.Electronic Characteristics  
Characteristics  
Sym  
Minimum  
Typical  
Maximum  
Units  
MHz  
kHz  
Absolute Frequency  
fC  
868.150  
868.450  
Centre Frequency  
(+25 °C)  
Tolerance from 868.300 MHz  
D
fC  
±150  
5.5  
Insertion Loss  
Quality Factor  
IL  
8.0  
55  
dB  
Unloaded Q  
QU  
QL  
6,820  
3,200  
50 W Loaded Q  
Turnover Temperature  
Turnover Frequency  
Frequency Temperature Coefficient  
T0  
25  
1.0  
°C  
Temperature  
Stability  
f0  
fc  
kHz  
2
FTC  
0.03  
10  
°
ppm/ C  
Frequency Aging - Absolute Value during the First Year  
DC Insulation Resistance Between Any Two Terminals  
Motional Resistance  
ppm/yr  
fA  
| |  
M
W
RM  
LM  
CM  
C0  
88.365  
110.5403  
0.3042  
1.45  
151  
W
Motional Inductance  
RF Equivalent  
m
H
RLC Model  
Motional Capacitance  
fF  
Shunt Static Capacitance  
1.20  
1.70  
pF  
In keeping with our ongoing policy of product evolvement and improvement, the above specification is subject to change without notice.  
ISO9001: 2000 Registered - Registration number 6830/2  
Issue : 1 C1  
For quotations or further information please contact us at:  
Date : SEPT 04  
3 The Business Centre, Molly Millars Lane, Wokingham, Berks, RG41 2EY, UK  
http://www.actcrystals.com  
2 OF 3  
Tel : +44 118 979 1238  
Fax : +44 118 979 1283  
Email: info@actcrystals.com  
CAUTION: Electrostatic Sensitive Device. Observe precautions for handling!  
i
1. The frequency fC is the frequency of minimum IL with the resonator in the specified test fixture in a 50 Ω test  
system with VSWR1.2:1.  
2. Unless noted otherwise, case temperature TC = +25°C±2°C.  
3. Frequency aging is the change in fC with time and is specified at +65°C or less. Aging may exceed the  
specification for prolonged temperatures above +65°C. Typically, aging is greatest the first year after  
manufacture, decreasing in subsequent years.  
4. Turnover temperature, T0, is the temperature of maximum (or turnover) frequency, f0. The nominal frequency at  
any case temperature, TC, may be calculated from: f = f0 [1 - FTC (T0 - TC)2].  
5. This equivalent RLC model approximates resonator performance near the resonant frequency and is provided  
for reference only. The capacitance C0 is the measured static (non-motional) capacitance between input terminal  
and ground or output terminal and ground. The measurement includes case parasitic capacitance.  
6. Derived mathematically from one or more of the following directly measured parameters: f C, IL, 3 dB bandwidth,  
fC versus TC, and C0.  
7. The specifications of this device are based on the test circuit shown above and subject to change or  
obsolescence without notice.  
8. Typically, equipment utilizing this device requires emissions testing and government approval, which is the  
responsibility of the equipment manufacturer.  
9. Our liability is only assumed for the Surface Acoustic Wave (SAW) component(s) per se, not for applications,  
processes and circuits implemented within components or assemblies.  
In keeping with our ongoing policy of product evolvement and improvement, the above specification is subject to change without notice.  
ISO9001: 2000 Registered - Registration number 6830/2  
Issue : 1 C1  
Date : SEPT 04  
For quotations or further information please contact us at:  
3 The Business Centre, Molly Millars Lane, Wokingham, Berks, RG41 2EY, UK  
http://www.actcrystals.com  
3 OF 3  

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