ZXMN2B14FH [ZETEX]

20V SOT23 N-channel enhancement mode MOSFET with low gate drive capability; SOT23封装的20V N沟道增强型MOSFET具有低栅极驱动能力
ZXMN2B14FH
型号: ZXMN2B14FH
厂家: ZETEX SEMICONDUCTORS    ZETEX SEMICONDUCTORS
描述:

20V SOT23 N-channel enhancement mode MOSFET with low gate drive capability
SOT23封装的20V N沟道增强型MOSFET具有低栅极驱动能力

晶体 栅极 小信号场效应晶体管 开关 光电二极管 栅极驱动 PC
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中文:  中文翻译
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ZXMN2B14FH  
20V SOT23 N-channel enhancement mode MOSFET  
with low gate drive capability  
Summary  
V
R
()  
I (A)  
(BR)DSS  
DS(on)  
D
0.055 @ V = 4.5V  
4.3  
3.7  
3.2  
GS  
0.075 @ V = 2.5V  
20  
GS  
0.100 @ V = 1.8V  
GS  
Description  
This new generation of trench MOSFETs from Zetex features low on-  
resistance achievable with low gate drive.  
Features  
D
S
Low on-resistance  
Fast switching speed  
Low gate drive capability  
SOT23 package  
G
Applications  
DC-DC converters  
Power management functions  
Disconnect switches  
Motor control  
S
D
Ordering information  
G
Device  
Reel size  
(inches)  
Tape width Quantity per reel  
(mm)  
Top view  
ZXMN2B14FHTA  
7
8
3,000  
Device marking  
2B4  
Issue 2 - March 2007  
© Zetex Semiconductors plc 2007  
1
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ZXMN2B14FH  
Absolute maximum ratings  
Parameter  
Symbol  
Limit  
Unit  
Drain-source voltage  
V
20  
V
DSS  
Gate-source voltage  
V
8
4.3  
3.5  
3.5  
21  
2.4  
21  
1
V
A
GS  
Continuous drain current  
Pulsed drain current (c)  
@ V = 4.5V; T  
=25°C (b)  
=70°C (b)  
=25°C (a)  
I
GS  
amb  
amb  
amb  
D
@ V = 4.5V; T  
GS  
@ V = 4.5V; T  
GS  
I
I
A
A
DM  
Continuous source current (body diode) (b)  
Pulsed source current (body diode) (c)  
I
S
A
SM  
Power dissipation at T  
=25°C (a)  
P
W
amb  
D
Linear derating factor  
Power dissipation at T  
8
mW/°C  
W
=25°C (b)  
P
1.5  
amb  
D
Linear derating factor  
12  
mW/°C  
°C  
Operating and storage temperature range  
T , T  
-55 to +150  
j
stg  
Thermal resistance  
Parameter  
Symbol  
Limit  
Unit  
Junction to ambient  
R
125  
°C/W  
JA  
JA  
Junction to ambient  
R
82  
°C/W  
NOTES:  
(a) For a device surface mounted on 25mm x 25mm FR4 PCB with high coverage of single sided 1oz copper, in still air  
conditions.  
(b)For a device surface mounted on FR4 PCB measured at t Յ5 sec.  
(c) Repetitive rating - 25mm x 25mm FR4 PCB, D=0.02, pulse width 300s - pulse width limited by maximum junction  
temperature.  
Issue 2 - March 2007  
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ZXMN2B14FH  
Thermal characteristics  
Issue 2 - March 2007  
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ZXMN2B14FH  
Electrical characteristics (at T  
= 25°C unless otherwise stated)  
amb  
Parameter  
Symbol Min. Typ. Max. Unit Conditions  
Static  
Drain-source breakdown voltage  
V
20  
V
A  
nA  
V
I = 250A, V =0V  
D GS  
(BR)DSS  
Zero gate voltage drain current  
Gate-body leakage  
I
I
1
V
= 20V, V =0V  
GS  
DSS  
DS  
GS  
100  
V
= 8V, V =0V  
DS  
GSS  
Gate-source threshold voltage  
Static drain-source on-state  
V
R
0.4  
1.0  
I = 250A, V =V  
D DS GS  
GS(th)  
DS(on)  
0.055  
0.075  
0.100  
V
= 4.5V, I = 3.5A  
D
GS  
GS  
GS  
DS  
(*)  
resistance  
V
V
V
= 2.5V, I = 3A  
D
= 1.8V, I = 2.6A  
D
(*) (‡)  
g
11  
S
= 10V, I = 3.5A  
Forward transconductance  
fs  
D
(‡)  
Dynamic  
Input capacitance  
C
872  
145  
90  
pF  
pF  
pF  
V
= 10V, V =0V  
DS GS  
iss  
f=1MHz  
Output capacitance  
C
C
oss  
rss  
Reverse transfer capacitance  
(†) (‡)  
Switching  
Turn-on-delay time  
Rise time  
t
t
t
t
3.7  
5.2  
30  
ns  
ns  
ns  
ns  
nC  
nC  
nC  
V
= 10V, V = 4.5V  
DD GS  
d(on)  
I = 1A  
D
r
R 6.0⍀  
G
Turn-off delay time  
Fall time  
d(off)  
f
5.5  
11  
Total gate charge  
Gate-source charge  
Gate drain charge  
Source-drain diode  
Q
Q
Q
V
= 10V, V = 4.5V  
DS GS  
g
I = 4.0A  
D
1.4  
2.1  
gs  
gd  
(*)  
V
0.69 0.95  
V
T =25°C, I = 1.45A,  
Diode forward voltage  
SD  
j
S
V
=0V  
GS  
(‡)  
t
9.4  
2.8  
ns T =25°C, I = 2.4A,  
j F  
Reverse recovery time  
rr  
di/dt=100A/s  
(‡)  
Q
nC  
Reverse recovery charge  
rr  
NOTES:  
(*) Measured under pulsed conditions. Pulse width Յ300s; duty cycle Յ2%.  
(†) Switching characteristics are independent of operating junction temperature.  
(‡) For design aid only, not subject to production testing.  
Issue 2 - March 2007  
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ZXMN2B14FH  
Typical characteristics  
Issue 2 - March 2007  
© Zetex Semiconductors plc 2007  
5
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ZXMN2B14FH  
Typical characteristics  
Current  
regulator  
QG  
50k  
Same as  
D.U.T  
12V  
QGS  
QGD  
VG  
VDS  
IG  
D.U.T  
ID  
VGS  
Charge  
Basic gate charge waveform  
Gate charge test circuit  
VDS  
90%  
RD  
VGS  
VDS  
RG  
VCC  
10%  
VGS  
td(on)  
tr  
td(off)  
tr  
t(on)  
t(on)  
Switching time waveforms  
Switching time test circuit  
Issue 2 - March 2007  
© Zetex Semiconductors plc 2007  
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ZXMN2B14FH  
Package outline - SOT23  
E
e
e1  
b
3 leads  
D
L1  
E1  
A
L
c
A1  
Dim.  
Millimeters  
Min. Max.  
Inches  
Dim.  
Millimeters  
Inches  
Max. Max.  
0.075 NOM  
Min.  
-
Max.  
0.044  
0.004  
0.020  
0.008  
0.120  
Min.  
Max.  
A
A1  
b
-
1.12  
0.10  
0.50  
0.120  
3.04  
e1  
E
1.90 NOM  
0.01  
0.30  
0.085  
2.80  
0.0004  
0.012  
0.003  
0.110  
2.10  
1.20  
0.25  
0.45  
-
2.64  
1.40  
0.62  
0.62  
-
0.083  
0.104  
0.055  
0.024  
0.024  
-
E1  
L
0.047  
0.018  
0.018  
-
C
D
L1  
-
e
0.95 NOM  
0.0375 NOM  
Note: Controlling dimensions are in millimeters. Approximate dimensions are provided in inches  
Issue 2 - March 2007  
© Zetex Semiconductors plc 2007  
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ZXMN2B14FH  
Definitions  
Product change  
Zetex Semiconductors reserves the right to alter, without notice, specifications, design, price or conditions of supply of any product or  
service. Customers are solely responsible for obtaining the latest relevant information before placing orders.  
Applications disclaimer  
The circuits in this design/application note are offered as design ideas. It is the responsibility of the user to ensure that the circuit is fit for  
the user’s application and meets with the user’s requirements. No representation or warranty is given and no liability whatsoever is  
assumed by Zetex with respect to the accuracy or use of such information, or infringement of patents or other intellectual property rights  
arising from such use or otherwise. Zetex does not assume any legal responsibility or will not be held legally liable (whether in contract,  
tort (including negligence), breach of statutory duty, restriction or otherwise) for any damages, loss of profit, business, contract,  
opportunity or consequential loss in the use of these circuit applications, under any circumstances.  
Life support  
Zetex products are specifically not authorized for use as critical components in life support devices or systems without the express written  
approval of the Chief Executive Officer of Zetex Semiconductors plc. As used herein:  
A. Life support devices or systems are devices or systems which:  
1. are intended to implant into the body  
or  
2. support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the  
labeling can be reasonably expected to result in significant injury to the user.  
B. A critical component is any component in a life support device or system whose failure to perform can be reasonably expected to  
cause the failure of the life support device or to affect its safety or effectiveness.  
Reproduction  
The product specifications contained in this publication are issued to provide outline information only which (unless agreed by the  
company in writing) may not be used, applied or reproduced for any purpose or form part of any order or contract or be regarded as a  
representation relating to the products or services concerned.  
Terms and Conditions  
All products are sold subjects to Zetex’ terms and conditions of sale, and this disclaimer (save in the event of a conflict between the two  
when the terms of the contract shall prevail) according to region, supplied at the time of order acknowledgement.  
For the latest information on technology, delivery terms and conditions and prices, please contact your nearest Zetex sales office.  
Quality of product  
Zetex is an ISO 9001 and TS16949 certified semiconductor manufacturer.  
To ensure quality of service and products we strongly advise the purchase of parts directly from Zetex Semiconductors or one of our  
regionally authorized distributors. For a complete listing of authorized distributors please visit: www.zetex.com/salesnetwork  
Zetex Semiconductors does not warrant or accept any liability whatsoever in respect of any parts purchased through unauthorized sales channels.  
ESD (Electrostatic discharge)  
Semiconductor devices are susceptible to damage by ESD. Suitable precautions should be taken when handling and transporting devices.  
The possible damage to devices depends on the circumstances of the handling and transporting, and the nature of the device. The extent  
of damage can vary from immediate functional or parametric malfunction to degradation of function or performance in use over time.  
Devices suspected of being affected should be replaced.  
Green compliance  
Zetex Semiconductors is committed to environmental excellence in all aspects of its operations which includes meeting or exceeding reg-  
ulatory requirements with respect to the use of hazardous substances. Numerous successful programs have been implemented to reduce  
the use of hazardous substances and/or emissions.  
All Zetex components are compliant with the RoHS directive, and through this it is supporting its customers in their compliance with  
WEEE and ELV directives.  
Product status key:  
“Preview”  
“Active”  
Future device intended for production at some point. Samples may be available  
Product status recommended for new designs  
“Last time buy (LTB)”  
Device will be discontinued and last time buy period and delivery is in effect  
“Not recommended for new designs” Device is still in production to support existing designs and production  
“Obsolete”  
Production has been discontinued  
Datasheet status key:  
“Draft version”  
This term denotes a very early datasheet version and contains highly provisional information, which  
may change in any manner without notice.  
“Provisional version”  
“Issue”  
This term denotes a pre-release datasheet. It provides a clear indication of anticipated performance.  
However, changes to the test conditions and specifications may occur, at any time and without notice.  
This term denotes an issued datasheet containing finalized specifications. However, changes to  
specifications may occur, at any time and without notice.  
Zetex sales offices  
Europe  
Americas  
Asia Pacific  
Corporate Headquarters  
Zetex GmbH  
Kustermann-park  
Balanstraße 59  
D-81541 München  
Germany  
Zetex Inc  
Zetex (Asia Ltd)  
Zetex Semiconductors plc  
Zetex Technology Park, Chadderton  
Oldham, OL9 9LL  
700 Veterans Memorial Highway  
Hauppauge, NY 11788  
USA  
3701-04 Metroplaza Tower 1  
Hing Fong Road, Kwai Fong  
Hong Kong  
United Kingdom  
Telefon: (49) 89 45 49 49 0  
Fax: (49) 89 45 49 49 49  
europe.sales@zetex.com  
Telephone: (1) 631 360 2222  
Fax: (1) 631 360 8222  
usa.sales@zetex.com  
Telephone: (852) 26100 611  
Fax: (852) 24250 494  
asia.sales@zetex.com  
Telephone: (44) 161 622 4444  
Fax: (44) 161 622 4446  
hq@zetex.com  
© 2007 Published by Zetex Semiconductors plc  
Issue 2 - March 2007  
© Zetex Semiconductors plc 2007  
8
www.zetex.com  

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