X25F047S [XICOR]

SPI SerialFlash with Block Lock TM Protection; SPI SerialFlash带座锁TM保护
X25F047S
型号: X25F047S
厂家: XICOR INC.    XICOR INC.
描述:

SPI SerialFlash with Block Lock TM Protection
SPI SerialFlash带座锁TM保护

闪存 存储 内存集成电路 光电二极管 时钟
文件: 总14页 (文件大小:74K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
4K  
512 x 8 Bit  
X25F047  
SPI SerialFlash with Block LockTM Protection  
FEATURES  
DESCRIPTION  
• 1MHz Clock Rate  
• SPI Modes (0,0 & 1,1)  
• 512 x 8 Bits  
—16 Byte Small Sector Program Mode  
• Low Power CMOS  
The X25F047 is a CMOS 4K-bit SerialFlash, internally  
organized as 512 x 8. The X25F047 features a Serial  
Peripheral Interface (SPI) and software protocol  
allowing operation on a simple four-wire bus. The bus  
signals are a clock input (SCK) plus separate data in (SI)  
and data out (SO) lines. Access to the device is  
controlled through a chip select (CS) input, allowing any  
number of devices to share the same bus.  
—<1µA Standby Current  
—<3mA Active Current during Program  
—<400µA Active Current during Read  
• 1.8V to 3.6V or 5V “Univolt” Read and Program  
Power Supply Versions  
There are eight options for programmable, nonvolatile,  
Block Lock Protection available to the end user. These  
options are implemented via special instructions  
programmed to the part. The X25F047 also features a  
PP pin that can be used for hardwire protection of the  
part, disabling all programming attempts, as well as a  
ProgramEnableLatchthatmustbesetbeforeaprogram  
operation can be initiated.  
• Block Lock Protection  
—Block Lock Protect 0, any 1/4, 1st 1/2, First or  
Last Sector of SerialFlash Array  
• Built-in Inadvertent Program Protection  
Power-Up/Power-Down Protection Circuitry  
—Program Enable Latch  
—Program Protect Pin  
• Self-Timed Program Cycle  
—5ms Program Cycle Time (Typical)  
• High Reliability  
The X25F047 utilizes Xicor’s proprietary Direct WriteTM  
cell, providing a minimum endurance of 100,000 cycles  
per sector and a minimum data retention of 100 years.  
—Endurance: 100,000 Cycles/Byte  
—Data Retention: 100Years  
—ESD: 2000V on all pins  
• 8-Lead SOIC Package  
• 8-Lead MSOP Package  
• 8-Lead TSSOP Package  
• 8-Pin Mini-DIP Package  
FUNCTIONAL DIAGRAM  
DATA REGISTER  
Y DECODE LOGIC  
SI  
SO  
16  
8
COMMAND  
DECODE  
AND  
CONTROL  
LOGIC  
X
32  
SCK  
CS  
DECODE  
LOGIC  
SERIALFLASH  
ARRAY  
(512 x 8)  
HIGH VOLTAGE  
CONTROL  
PP  
PROGRAM CONTROL LOGIC  
7005 FRM 01.3  
Xicor, Inc. 1994, 1995, 1996 Patents Pending  
7005-0.9 5/7/97 T4/C0/D1  
Characteristics subject to change without notice  
1
X25F047  
PIN DESCRIPTIONS  
Serial Output (SO)  
PIN CONFIGURATION  
Not to scale  
8-LEAD SOIC/DIP  
SO is a push/pull serial data output pin. During a read  
cycle, data is shifted out on this pin. Data is clocked out  
by the falling edge of the serial clock.  
V
CS  
SO  
PP  
1
2
3
4
8
7
6
5
CC  
NC  
SCK  
SI  
*0.197"  
0.120"  
0.122"  
X25F047  
Serial Input (SI)  
V
SS  
SI is a serial data input pin. All opcodes, byte addresses,  
and data to be programmed to the memory are input on  
this pin. Data is latched by the rising edge of the serial  
clock.  
*0.244"  
8-LEAD MSOP  
V
SO  
CS  
1
2
3
4
8
7
6
5
Serial Clock (SCK)  
CC  
NC  
SI  
The Serial Clock controls the serial bus timing for data  
input and output. Opcodes, addresses, or data present  
on the SI pin are latched on the rising edge of the clock  
input, while data on the SO pin change after the falling  
edge of the clock input.  
X25F047  
V
SS  
PP  
SCK  
0.193"  
8-LEAD TSSOP  
Chip Select (CS)  
When CS is HIGH, the X25F047 is deselected and the  
SO output pin is at high impedance and unless a nonvol-  
atile write cycle is underway, the X25F047 will be in the  
standby power mode. CS LOW enables the X25F047,  
placing it in the active power mode. It should be noted  
that after power-up, a HIGH to LOW transition on CS is  
required prior to the start of any operation.  
NC  
SCK  
SI  
1
2
3
4
8
7
6
5
V
CC  
CS  
X25F047  
V
SS  
PP  
SO  
0.252"  
*SOIC Measurement  
7005 FRM 02  
Program Protect (PP)  
PRINCIPLES OF OPERATION  
When PP is LOW, nonvolatile writes to the X25F047 are  
disabled, but the part otherwise functions normally.When  
PP is held HIGH, all functions, including nonvolatile  
writes, operate normally. PP going LOW while CS is still  
LOW will interrupt a programming cycle to the X25F047.  
If the nonvolatile write cycle has already been initiated,  
PP going low will have no affect on this cycle.  
The X25F047 is a 512 x 8 SerialFlash designed to inter-  
face directly with the synchronous Serial Peripheral Inter-  
face (SPI) of many popular microcontroller families.  
The X25F047 contains an 8-bit instruction register. It is  
accessed via the SI input, with data being clocked in on  
the rising edge of SCK. CS must be LOW and the PP  
input must be HIGH during the entire operation. Table 1  
contains a list of the instructions and their opcodes. All  
instructions, addresses and data are transferred MSB first.  
PIN NAMES  
Symbol  
CS  
Description  
Chip Select Input  
Data input is sampled on the first rising edge of SCK  
after CS goes LOW. SCK is static, allowing the user to  
stop the clock and then start it again to resume opera-  
tions where left off.  
SO  
Serial Output  
SI  
Serial Input  
SCK  
PP  
Serial Clock Input  
Program Protect Input  
Program Enable Latch  
The X25F047 contains a “Program Enable” latch. This  
latch must be SET before a program operation is initi-  
ated. The PREN instruction will set the latch and the  
PRDI instruction will reset the latch (Figure 4). This latch  
is automatically reset upon a power-up condition and  
after the completion of a sector program cycle.  
V
Ground  
SS  
V
Supply Voltage  
No Connect  
CC  
NC  
7005 FRM T01  
2
X25F047  
Block Lock Protection  
clocks. CS must go LOW and remain LOW for the dura-  
tion of the operation. The host must program 16 bytes in  
each write with the restriction that these bytes reside on  
one sector. If the address counter reaches the end of the  
sector and the clock continues, or if fewer than 16 bytes  
are clocked in, the contents of the sector cannot be guar-  
anteed.  
There are eight Block Lock Protection options. The pre-  
defined blocks and associated address ranges are pro-  
tected by programming the appropriate two byte  
Program Status instruction to the device (Table 1 and  
Figure 6). Once a Block Lock protect instruction has  
been completed, that Block Lock Protection setup is held  
in a nonvolatile Status Register (Figure 1) until the next  
Program Status instruction is issued. The sections of the  
memory array that are Block Lock protected can be read  
but not programmed until Block Lock Protection is  
removed or changed.  
For a sector program operation to be completed, CS can  
only be brought HIGH after bit 0 of the last data byte to  
be programmed is clocked in. If it is brought HIGH at any  
other time, the program operation will not be completed.  
(Figure 5)  
Figure 1. Status Register/Block Lock Protection Byte  
Read Status Operation  
If there is not a nonvolatile write in progress, the Read  
Status instruction returns the Block Lock Protection byte  
from the Status Register which contains the Block Lock  
Protection bits BL2-BL0 (Figure 1). The Block Lock Pro-  
tection bits define the Block Lock Protection condition  
(Figure 1 and Table1). The other bits are reserved and  
will return "0’s" when read (Figure 3).  
7
0
6
0
5
0
4
0
3
0
2
1
0
BL2 BL1 BL0  
Note: Bits [7:3] specified to be “0’s”  
7005 FRM T02.1  
Read Sequence  
When reading from the SerialFlash memory array, CS is  
first pulled LOW to select the device. The 8-bit READ  
instruction is transmitted to the X25F047, followed by the  
16-bit address, of which the last 9 bits are used (bits  
[15:9] specified to be "0’s"). After the READ opcode and  
address are sent, the data stored in the memory at the  
selected address is shifted out on the SO line. The data  
stored in memory at the next address can be read  
sequentially by continuing to provide clock pulses. The  
address is automatically incremented to the next higher  
address after each byte of data is shifted out. When the  
highest address is reached (01FFh), the address counter  
rolls over to address 0000h, allowing the read cycle to be  
continued indefinitely. The read operation is terminated  
by taking CS HIGH (Figure 2).  
If a nonvolatile write is in progress, the Read Status  
instruction returns the status of the internal write opera-  
tion on SO. When the nonvolatile write cycle is com-  
pleted, the status register data is again read out.  
During a nonvolatile write in progress, the SO pin will be  
set HIGH. At the end of the nonvolatile write cycle, SO is  
set to output the current bit from the status register.  
Clocking SCK is valid during a nonvolatile write in  
progress, but is not necessary. If the SCK line is clocked,  
the pointer to the status register is also clocked, even  
though the SO pin shows the status of the nonvolatile  
write operation (Figure 3). When the pointer reaches the  
end of the eight bit status register, it “rolls over” to the first  
bit of the register.  
Sector Program Sequence  
Program Status Operation  
Prior to any attempt to program data into the X25F047,  
the “Program Enable” latch must first be set by issuing  
the PREN instruction (Table 1 and Figure 4). CS is first  
taken LOW. Then the PREN instruction is clocked into  
the X25F047. After all eight bits of the instruction are  
transmitted, CS must then be taken HIGH. If the user  
continues the program operation without taking CS HIGH  
after issuing the PREN instruction, the program opera-  
tion will be ignored.  
Prior to any attempt to perform a Program Status Opera-  
tion, the PREN instruction must first be issued. This  
instruction sets the “Program Enable” latch and allows  
the part to respond to a Program Status sequence (Fig-  
ure 6). The Program Status instruction follows and con-  
sists of one command byte followed by one Block Lock  
Protection byte (Figure 1). This byte contains the Block  
Lock Protection bits BL2-BL0. The rest of the bits [7:3]  
are unused and must be programmed as “0’s”. Bringing  
CS HIGH after the two byte Program Status instruction  
initiates a nonvolatile write to the Status Register. Pro-  
gramming more than one byte to the Status Register will  
overwrite the previously programmed Block Lock Protec-  
tion byte (Table 1).  
To program data to the SerialFlash memory array, the  
user then issues the PROGRAM instruction, followed by  
the 16 bit address of the first location in the sector and  
then the 16 bytes of data to be programmed. Only the last  
9 bits of the address are used and bits [15:9] are speci-  
fied to be "0’s". The entire write operation takes 152  
3
X25F047  
Data Protection  
Operational Notes  
The following circuitry has been included to prevent inad-  
vertant programming of data:  
The X25F047 powers up in the following state:  
• The device is in the low power, standby state.  
• A HIGH to LOW transition on CS is required to enter  
an active state and receive an instruction.  
• SO pin is at high impedance.  
• The “Program Enable” latch is reset upon power-up.  
• A PREN instruction must be issued to set the “Program  
Enable” latch.  
• CS must come HIGH at the proper clock count in order  
to start a program cycle.  
• The “Program Enable” latch is reset.  
Table 1. Instruction Set and Block Lock Protection Byte Definition  
Instruction  
Format*  
0000 0110  
0000 0100  
0000 0001  
Instruction Name and Operation  
PREN: Set the Program Enable Latch (Program Enable Operation)  
PRDI: Reset the Program Enable Latch (Program Disable Operation)  
PROGRAM STATUS Instruction - followed by:  
Block Lock Protection Byte: (Figure 1)  
0000 0000 --->NO PROTECT: ---------------------------------->None of the Array  
0000 0001 --->PROTECT Q1: --- 0000h - 007Fh ---------->Lower Quadrant (Q1)  
0000 0010 --->PROTECT Q2: --- 0080h - 00FFh----------->Q2  
0000 0011 --->PROTECT Q3: --- 0100h - 017Fh----------->Q3  
0000 0100 --->PROTECT Q4: --- 0180h - 01FFh----------->Upper Quadrant (Q4)  
0000 0101 --->PROTECT H1: --- 0000h - 00FFh----------->Lower Half of the Array (H1)  
0000 0110 --->PROTECT S0: --- 0000h - 000Fh----------->Lower Sector (S0)  
0000 0111 --->PROTECT Sn: --- 01F0h - 01FFh----------->Upper Sector (Sn)  
0000 0101  
0000 0010  
0000 0011  
READ STATUS: Reads Block Lock Protection & nonvolatile write in progress status on SO Pin  
PROGRAM: Program operation followed by address and data  
READ: Read operation followed by address  
7005 FRM T03.1  
*Instructions are shown with MSB in leftmost position. Instructions are transferred MSB first.  
Figure 2. Read Operation Sequence  
CS  
0
1
2
3
4
5
6
7
8
9
20 21 22 23 24 25 26 27 28 29 30  
SCK  
SI  
READ INSTRUCTION  
(1 BYTE)  
BYTE ADDRESS (2 BYTE)  
15 14 0  
DATA OUT  
3
2
1
HIGH IMPEDANCE  
7
6
5
4
3
2
1
0
SO  
7005 FRM F03.1  
4
X25F047  
Figure 3. Read Status Operation Sequence  
CS  
0
1
2
3
4
5
6
7
SCK  
SI  
...  
...  
...  
READ STATUS  
INSTRUCTION  
NONVOLATILE WRITE IN PROGRESS  
B
L
1
B
L
2
B
L
0
SO  
SO HIGH DURING  
NONVOLATILE  
WRITE CYCLE  
SO = STATUS REG BIT  
WHEN NO NONVOLATILE  
WRITE CYCLE  
7005 FRM 04.2  
Figure 4. Program Enable/Program Disable Sequence  
CS  
0
1
2
3
4
5
6
7
SCK  
INSTRUCTION  
(1 BYTE)  
SI  
HIGH IMPEDANCE  
SO  
7005 FRM 05.1  
5
X25F047  
Figure 5. Sector Program Operation Sequence  
CS  
0
1
2
3
4
5
6
7
8
9
10  
20 21 22 23 24 25 26 27 28 29 30 31  
SCK  
SI  
PROGRAM  
INSTRUCTION  
BYTE ADDRESS  
(2 BYTE)  
DATA BYTE 1  
15 14 13  
3
2
1
0
7
6
5
4
3
2
1
0
CS  
SCK  
SI  
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47  
DATA BYTE 2  
DATA BYTE 3  
DATA BYTE 16  
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
6
5
4
3
2
1
0
7005 FRM 07.3  
Figure 6. Program Status Operation Sequence  
CS  
0
1
2
3
4
5
6
7
8
0
9
0
10 11 12 13 14 15  
BLOCK LOCK  
SCK  
PROGRAM STATUS  
INSTRUCTION  
PROTECTION BYTE  
B
L
2
B
L
1
B
L
0
SI  
0
0
0
HIGH IMPEDANCE  
SO  
7005 ILL F08.2  
ABSOLUTE MAXIMUM RATINGS*  
*COMMENT  
Temperature under Bias ...................–65°C to +135°C  
Storage Temperature........................–65°C to +150°C  
Voltage on any Pin with  
Stresses above those listed under “Absolute Maximum  
Ratings” may cause permanent damage to the device.  
This is a stress rating only and the functional operation of  
the device at these or any other conditions above those  
indicated in the operational sections of this specification  
is not implied. Exposure to absolute maximum rating con-  
ditions for extended periods may affect device reliability.  
Respect to V .................................... –1V to +7V  
SS  
D.C. Output Current..............................................5mA  
Lead Temperature  
(Soldering, 10 seconds) ..............................300°C  
6
X25F047  
RECOMMENDED OPERATING CONDITIONS  
Supply Voltage  
X25F047  
Limits  
Temperature  
Commercial  
Industrial  
Min.  
0°C  
Max.  
+70°C  
+85°C  
1.8V to 3.6V  
4.5V to 5.5V  
X25F047-5  
–40°C  
7005 FRM T05  
7005 FRM T04  
D.C. OPERATING CHARACTERISTICS (Over the recommended operating conditions, unless otherwise specified.)  
Limits  
Symbol  
Parameter  
Min.  
Max.  
Units  
mA SCK = V x 0.1/V  
CC  
Test Conditions  
I
V
V
V
Read Current (Active)  
1
x 0.9 @ 1MHz,  
CC1  
CC  
CC  
CC  
CC  
SO = Open, CS = V  
SS  
I
Write Current (Active)  
3
mA SCK = V x 0.1/V  
CC  
x 0.9 @ 1MHz,  
CC2  
CC  
SO = Open, CS = V  
SS  
I
I
I
Supply Current (Standby)  
1
µA  
µA  
µA  
V
CS = V - 0.1, V = V or V  
SB  
CC  
IN  
SS  
CC  
Input Leakage Current  
Output Leakage Current  
Input LOW Voltage  
10  
10  
V
= V to V  
SS  
LI  
IN  
CC  
V
= V to V  
LO  
OUT  
SS  
CC  
(1)  
–0.5  
V
x 0.3  
CC  
V
V
V
V
V
V
V
V
IL  
(1)  
IH  
Input HIGH Voltage  
Output LOW Voltage  
Output HIGH Voltage  
Output LOW Voltage  
Output HIGH Voltage  
Output LOW Voltage  
Output HIGH Voltage  
V
V
V
V
x 0.7  
V
+ 0.5  
CC  
V
CC  
CC  
CC  
CC  
0.4  
V
V
V
V
V
V
V
= 5.5V, I = 2.1mA  
OL  
OL1  
OH1  
OL2  
OH2  
OL3  
OH3  
CC  
CC  
CC  
CC  
CC  
CC  
– 0.8  
– 0.4  
– 0.2  
V
= 5.5V, I  
= –1.0mA  
OH  
0.4  
0.4  
V
= 3.6V, I = 1.0mA  
OL  
V
= 3.6V, I  
= –0.4mA  
OH  
V
= 1.8V, I = 0.5mA  
OL  
V
= 1.8V, I  
= –0.25mA  
OH  
7005 FRM T06  
POWER-UPTIMING  
Symbol  
Parameter  
Power-up to Read Operation  
Power-up to Write Operation  
Min.  
Max.  
Units  
(3)  
PUR  
1
5
ms  
t
(3)  
PUW  
ms  
t
7005 FRM T07.1  
CAPACITANCE T = +25°C, f = 1MHz, V =5V.  
A
CC  
Symbol  
Parameter  
Max.  
Units  
Conditions  
= 0V  
(2)  
C
Output Capacitance (SO)  
Input Capacitance (SCK, SI, CS, PP)  
8
6
pF  
V
OUT  
OUT  
(2)  
C
pF  
V
= 0V  
IN  
IN  
7005 FRM T08  
Notes: (1) V Min. and V Max. are for reference only and are not 100% tested.  
IL  
IH  
(2) This parameter is periodically sampled and not 100% tested.  
(3) t and t are the delays required from the time V is stable until the specified operation can be initiated. These parameters  
PUR  
PUW  
CC  
are periodically sampled and not 100% tested.  
7
X25F047  
A.C. TEST CONDITIONS  
EQUIVALENT A.C. LOAD CIRCUIT  
Input Pulse Levels  
V
x 0.1 to V x 0.9  
CC  
CC  
5V  
3.3V  
Input Rise and Fall Times  
10ns  
2061Ω  
OUTPUT  
3025Ω  
2696Ω  
OUTPUT  
5288Ω  
Input and Output Timing Level  
V
X 0.5  
CC  
7005 FRM T09  
30pF  
30pF  
7005 FRM 09.1  
A.C. CHARACTERISTICS (Over the recommended operating conditions, unless otherwise specified.)  
Data Input Timing  
Symbol  
SCK  
CYC  
LEAD  
LAG  
WH  
Parameter  
Min.  
Max.  
Units  
f
t
t
t
t
t
t
t
Clock Frequency  
0
1
MHz  
Cycle Time  
1000  
500  
500  
400  
400  
100  
100  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
µs  
CS Lead Time  
CS Lag Time  
Clock HIGH Time  
Clock LOW Time  
Data Setup Time  
Data Hold Time  
Data In Rise Time  
WL  
SU  
H
(4)  
RI  
2
2
t
(4)  
FI  
Data In Fall Time  
µs  
t
t
CS Deselect Time  
Write Cycle Time  
2.0  
µs  
CS  
(5)  
WC  
10  
ms  
t
7005 FRM T10  
Data Output Timing  
Symbol  
Parameter  
Min.  
Max.  
Units  
f
t
t
t
Clock Frequency  
0
1
MHz  
ns  
SCK  
DIS  
V
Output Disable Time  
Output Valid from Clock LOW  
Output Hold Time  
500  
400  
ns  
0
ns  
HO  
(4)  
Output Rise Time  
300  
300  
ns  
t
RO  
(4)  
Output Fall Time  
ns  
t
FO  
7005 FRM T11  
Notes: (4) This parameter is periodically sampled and not 100% tested.  
(5) t is the time from the rising edge of CS after a valid program sequence has been sent to the end of the self-timed internal nonvol-  
WC  
atile write cycle.  
8
X25F047  
Figure 7. Serial Output Timing  
CS  
tCYC  
tLAG  
tWH  
SCK  
tV  
MSB OUT  
tHO  
tWL  
tDIS  
MSB–1 OUT  
LSB OUT  
SO  
SI  
ADDR  
LSB IN  
7005 FRM 10  
Figure 8. Serial Input Timing  
tCS  
CS  
tLEAD  
tLAG  
SCK  
tFI  
tSU  
tH  
tRI  
SI  
MSB IN  
LSB IN  
HIGH IMPEDANCE  
SO  
7005 FRM 11  
SYMBOL TABLE  
WAVEFORM  
INPUTS  
OUTPUTS  
Must be  
steady  
Will be  
steady  
May change  
from Low to  
High  
Will change  
from Low to  
High  
May change  
from High to  
Low  
Will change  
from High to  
Low  
Don’t Care:  
Changes  
Allowed  
Changing:  
State Not  
Known  
N/A  
Center Line  
is High  
Impedance  
9
X25F047  
PACKAGING INFORMATION  
8-LEAD PLASTIC SMALL OUTLINE GULL WING PACKAGE TYPE S  
0.150 (3.80)  
0.158 (4.00)  
0.228 (5.80)  
0.244 (6.20)  
PIN 1 INDEX  
PIN 1  
0.014 (0.35)  
0.019 (0.49)  
0.188 (4.78)  
0.197 (5.00)  
(4X) 7°  
0.053 (1.35)  
0.069 (1.75)  
0.004 (0.19)  
0.010 (0.25)  
0.050 (1.27)  
0.010 (0.25)  
0.020 (0.50)  
0.050" TYPICAL  
X 45°  
0.050"  
TYPICAL  
0° – 8°  
0.0075 (0.19)  
0.010 (0.25)  
0.250"  
0.016 (0.410)  
0.037 (0.937)  
0.030"  
TYPICAL  
8 PLACES  
FOOTPRINT  
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)  
10  
X25F047  
PACKAGING INFORMATION  
8-LEAD MINIATURE SMALL OUTLINE GULLWING PACKAGE TYPE M  
0.118 ± 0.002  
(3.00 ± 0.05)  
0.012 + 0.006 / -0.002  
(0.30 + 0.15 / -0.05)  
0.0256 (0.65) TYP  
R 0.014 (0.36)  
0.118 ± 0.002  
(3.00 ± 0.05)  
0.030 (0.76)  
0.0216 (0.55)  
7° TYP  
0.036 (0.91)  
0.032 (0.81)  
0.040 ± 0.002  
(1.02 ± 0.05)  
0.008 (0.20)  
0.004 (0.10)  
0.150 (3.81)  
0.007 (0.18)  
0.005 (0.13)  
REF.  
0.193 (4.90)  
REF.  
NOTE:  
1. ALL DIMENSIONS IN INCHES AND (MILLIMETERS)  
3003 FRM 01  
11  
X25F047  
PACKAGING INFORMATION  
8-LEAD PLASTIC, TSSOP, PACKAGE TYPE V  
.025 (.65) BSC  
.169 (4.3)  
.252 (6.4) BSC  
.177 (4.5)  
.114 (2.9)  
.122 (3.1)  
.047 (1.20)  
.0075 (.19)  
.002 (.05)  
.0118 (.30)  
.006 (.15)  
.010 (.25)  
Gage Plane  
0° – 8°  
Seating Plane  
.019 (.50)  
.029 (.75)  
DetailA (20X)  
.031 (.80)  
.041 (1.05)  
See Detail “A”  
NOTE: ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)  
12  
X25F047  
PACKAGING INFORMATION  
8-LEAD PLASTIC DUAL IN-LINE PACKAGE TYPE P  
0.430 (10.92)  
0.360 (9.14)  
0.260 (6.60)  
0.240 (6.10)  
PIN 1 INDEX  
PIN 1  
0.060 (1.52)  
0.300  
(7.62) REF.  
0.020 (0.51)  
HALF SHOULDER WIDTH ON  
ALL END PINS OPTIONAL  
0.145 (3.68)  
0.128 (3.25)  
SEATING  
PLANE  
0.025 (0.64)  
0.015 (0.38)  
0.150 (3.81)  
0.125 (3.18)  
0.065 (1.65)  
0.045 (1.14)  
0.110 (2.79)  
0.090 (2.29)  
0.020 (0.51)  
0.016 (0.41)  
0.325 (8.25)  
0.300 (7.62)  
0.015 (0.38)  
MAX.  
0°  
TYP. 0.010 (0.25)  
15°  
NOTE:  
1. ALL DIMENSIONS IN INCHES (IN PARENTHESES IN MILLIMETERS)  
2. PACKAGE DIMENSIONS EXCLUDE MOLDING FLASH  
13  
X25F047  
ORDERING INFORMATION  
X25F047  
P
T
–X  
V
Range  
CC  
Device  
Blank = 1.8V to 3.6V  
5 = 4.5V to 5.5V  
Temperature Range  
Blank = Commercial = 0°C to +70°C  
I = Industrial = –40°C to +85°C  
Package  
S = 8-Lead SOIC  
M = 8-Lead MSOP  
V = 8-Lead TSSOP  
P = 8-Lead Plastic DIP  
Part Mark Convention  
8-Lead MSOP  
8-Lead TSSOP  
8-Lead SOIC/PDIP  
Blank = 8-Lead SOIC  
P = 8-Lead Plastic DIP  
EYWW  
XXX  
EYWW  
5F47XX  
X25F047 X  
XX  
AAH = 1.8 to 3.6V, 0°C to +70°C  
AAI = 1.8 to 3.6V, -20°C to +85°C  
AAJ = 1.8 to 3.6V, -40°C to +85°C  
AAK = 2.5 to 5.5V, 0°C to +70°C  
AAL = 2.5 to 5.5V, -40°C to +85°C  
AAM = 4.5 to 5.5V, 0°C to +70°C  
AAN = 4.5 to 5.5V, -40°C to +85°C  
Blank = 1.8 to 3.6V, 0°C to +70°C  
I = 1.8 to 3.6V, -40°C to +85°C  
AE = 2.5 to 5.5V, 0°C to +70°C  
AF = 2.5 to 5.5V, -40°C to +85°C  
5 = 4.5 to 5.5V, 0°C to +70°C  
I5 = 4.5 to 5.5V, -40°C to +85°C  
Blank = 1.8 to 3.6V, 0°C to +70°C  
I = 1.8 to 3.6V, -40°C to +85°C  
AE = 2.5 to 5.5V, 0°C to +70°C  
AF = 2.5 to 5.5V, -40°C to +85°C  
5 = 4.5 to 5.5V, 0°C to +70°C  
I5 = 4.5 to 5.5V, -40°C to +85°C  
LIMITED WARRANTY  
Devices sold by Xicor, Inc. are covered by the warranty and patent indemnification provisions appearing in its Terms of Sale only. Xicor, Inc.  
makes no warranty, express, statutory, implied, or by description regarding the information set forth herein or regarding the freedom of the  
described devices from patent infringement. Xicor, Inc. makes no warranty of merchantability or fitness for any purpose. Xicor, Inc. reserves the  
right to discontinue production and change specifications and prices at any time and without notice.  
Xicor, Inc. assumes no responsibility for the use of any circuitry other than circuitry embodied in a Xicor, Inc. product. No other circuits, patents,  
licenses are implied.  
U.S. PATENTS  
Xicor products are covered by one or more of the following U.S. Patents: 4,263,664; 4,274,012; 4,300,212; 4,314,265; 4,326,134; 4,393,481;  
4,404,475; 4,450,402; 4,486,769; 4,488,060; 4,520,461; 4,533,846; 4,599,706; 4,617,652; 4,668,932; 4,752,912; 4,829, 482; 4,874, 967;  
4,883, 976. Foreign patents and additional patents pending.  
LIFE RELATED POLICY  
In situations where semiconductor component failure may endanger life, system designers using this product should design the system with  
appropriate error detection and correction, redundancy and back-up features to prevent such an occurence.  
Xicor's products are not authorized for use in critical components in life support devices or systems.  
1. Life support devices or systems are devices or systems which, (a) are intended for surgical implant into the body, or (b) support or sustain  
life, and whose failure to perform, when properly used in accordance with instructions for use provided in the labeling, can be reasonably  
expected to result in a significant injury to the user.  
2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the  
failure of the life support device or system, or to affect its safety or effectiveness.  
14  

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