WED3C7558M350BI [WEDC]

RISC Microprocessor Multichip Package; RISC微处理器的多芯片封装
WED3C7558M350BI
型号: WED3C7558M350BI
厂家: WHITE ELECTRONIC DESIGNS CORPORATION    WHITE ELECTRONIC DESIGNS CORPORATION
描述:

RISC Microprocessor Multichip Package
RISC微处理器的多芯片封装

外围集成电路 微处理器 时钟
文件: 总13页 (文件大小:531K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
WED3C7558M-XBX  
White Electronic Designs  
RISC Microprocessor Multichip Package  
OVERVIEW  
The WEDC 755/SSRAM multichip package is targeted for  
high performance, space sensitive, low power systems and  
supports the following power management features: doze,  
nap, sleep and dynamic power management.  
The WED3C7558M-XBX is offered in Commercial (0°C  
to +70°C), industrial (-40°C to +85°C) and military (-55°C  
to +125°C) temperature ranges and is well suited for  
embedded applications such as missiles, aerospace,  
flight computers, fire control systems and rugged critical  
systems.  
The WED3C7558M-XBX multichip package consists of:  
755 RISC processor  
Dedicated 1MB SSRAM L2 cache, configured as  
128Kx72  
* This product is subject to change without notice.  
21mmx25mm, 255 Ceramic Ball Grid Array (CBGA)  
FEATURES  
Core Frequency/L2 Cache Frequency (300MHz/  
150MHz, 350MHz/175MHz)  
Footprint compatible with WED3C750A8M-200BX  
Footprint compatible with Motorola MPC 745  
Maximum 60x Bus frequency = 66MHz  
FIGURE 1 – MULTI-CHIP PACKAGE DIAGRAM  
August 2002  
Rev. 7  
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WED3C7558M-XBX  
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FIGURE 2 – BLOCK DIAGRAM  
August 2002  
Rev. 7  
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FIGURE 3 – BLOCK DIAGRAM, L2 INTERCONNECT  
SSRAM 1  
L20VCC  
U1  
L2pin_DATA  
L2pin_DATA  
L2pin_DATA  
L2pin_DATA  
L2DP0-3  
DQa  
DQb  
DQc  
FT#  
SBd#  
SBc#  
SBb#  
SBa#  
SW#  
DQd  
DP0-3  
ADSP#  
ADV#  
SE2  
L2 CLK_OUT A  
L2WE#  
K
SGW#  
SE1#  
L2CE#  
ADSC#  
SE3#  
LBO#  
G#  
SA0-16  
ZZ  
A0-16  
µP  
755  
SSRAM 2  
L20VCC  
U2  
SA0-16  
FT#  
SBd#  
SBc#  
SBb#  
SBa#  
SW#  
SGW#  
SE1#  
K
ADSP#  
ADV#  
L2CLK_OUT B  
L2pin_DATA  
L2pin_DATA  
L2pin_DATA  
L2pin_DATA  
L2DP4-7  
DQa  
DQb  
DQc  
DQd  
SE2  
ADSC#  
SE3#  
LBO#  
G#  
DP0-3  
ZZ  
L2ZZ  
FIGURE 4 – BLOCK DIAGRAM, L2 INTERCONNECT  
TDI  
L2 Cache  
SSRAM  
U1  
L2 Cache  
SSRAM  
U2  
STDI  
STDO  
755  
TDO  
TMS TCK TRST  
STMS STCK  
August 2002  
Rev. 7  
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FIGURE 5 – PIN ASSIGNMENTS  
Ball assignments of the 255 CBGA package as viewed from the top surface.  
Side profile of the CBGA package to indicate the direction of the top surface view.  
August 2002  
Rev. 7  
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WED3C7558M-XBX  
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PACKAGE PINOUT LISTING  
Signal Name  
Pin Number  
Active  
I/O  
2.0V (7)  
3.3V (7)  
A[0-31]  
C16, E4, D13, F2, D14, G1, D15, E2, D16, D4, E13, G2, E15, H1, E16, H2, F13, J1,  
High  
I/O  
F14, J2, F15, H3, F16, F4, G13, K1, G15, K2, H16, M1, J15, P1  
AACK#  
ABB#  
AP[0-3]  
ARTRY#  
AVCC  
BG#  
BR#  
BVSEL (4, 5, 6)  
CI#  
L2  
K4  
Low  
Low  
High  
Low  
Low  
Low  
High  
Low  
Low  
Low  
Low  
Low  
Low  
Low  
High  
Input  
I/O  
C1, B4, B3, B2  
I/O  
J4  
I/O  
A10  
2.0V  
GND  
2.0V  
3.3V  
L1  
Input  
Output  
Input  
Output  
Input  
Ouput  
Output  
I/O  
B6  
B1  
E1  
CKSTP_IN#  
CKSTP_OUT#  
CLK_OUT  
DBB#  
D8  
A6  
D7  
J14  
DBG#  
N1  
Input  
Input  
Input  
I/O  
DBDIS#  
DBWO#  
DH[0-31]  
H15  
G4  
P14, T16, R15, T15, R13, R12, P11, N11, R11, T12, T11, R10, P9, N9, T10, R9, T9,  
P8, N8, R8, T8, N7, R7, T7, P6, N6, R6, T6, R5, N5, T5, T4  
DL[0-31]  
K13, K15, K16, L16, L15, L13, L14, M16, M15, M13, N16, N15, N13, N14, P16,  
High  
I/O  
P15, R16, R14, T14, N10, P13, N12, T13, P3, N3, N4, R3, T1, T2, P4, T3, R4  
DP[0-7]  
DRTRY#  
GBL#  
M2, L3, N2, L4, R1, P2, M4, R2  
G16  
High  
Low  
Low  
I/O  
Input  
I/O  
F1  
GND  
C5, C12, E3, E6, E8, E9, E11, E14, F5, F7, F10, F12, G6, G8, G9, G11, H5, H7,  
GND  
GND  
H10, H12, J5, J7, J10, J12, K6, K8, K9, K11, L5, L7, L10, L12, M3, M6, M8, M9,  
M11, M14, P5, P12  
HRESET#  
INT#  
A7  
Low  
Low  
High  
High  
Input  
Input  
Input  
Input  
B15  
L1_TSTCLK (1)  
L2_TSTCLK (1)  
L2AVCC (8)  
L2OVCC (9)  
L2VSEL (4, 5, 6, 7)  
LSSD_MODE# (1)  
MCP#  
NC (No-connect)  
OVCC (2)  
PLL_CFG[0-3]  
QACK#  
QREQ#  
D11  
D12  
L11  
2.0V  
2.0V  
*—  
2.0V  
3.3V  
3.3V  
E10, E12, M12, G12, G14, K12, K14  
B5  
B10  
C13  
High  
Low  
Low  
Input  
Input  
Input  
C3, C6, D5, D6, H4, A4, A5, A2, A3  
C7, E5, G3, G5, K3, K5, P7, P10, E7, M5, M7, M10  
A8, B9, A9, D9  
High  
Low  
Low  
Low  
Low  
Low  
Input  
Input  
Output  
Output  
Input  
Input  
Input  
Input  
Output  
D3  
J3  
RSRV#  
SMI#  
D1  
A16  
B14  
B7  
C8  
J16  
SRESET#  
STCK (10)  
STDI  
STDO  
* Not supported on this version  
August 2002  
Rev. 7  
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PACKAGE PINOUT LISTING (continued)  
Signal Name  
STMS  
SYSCLK  
TA#  
TBEN  
TBST#  
TCK  
TDI (6)  
TDO  
TEA#  
TLBISYNC#  
TMS (6)  
TRST# (6)  
TS#  
TSIZ[0-2]  
TT[0-4]  
WT  
Pin Number  
B8  
C9  
H14  
C2  
A14  
C11  
A11  
A12  
H13  
C4  
B11  
C10  
J13  
A13, D10, B12  
Active  
I/O  
Input  
Input  
Input  
Input  
I/O  
Input  
Input  
Output  
Input  
Input  
Input  
Input  
I/O  
2.0V (7)  
3.3V (7)  
Low  
High  
Low  
High  
High  
High  
Low  
Low  
High  
Low  
Low  
High  
High  
Low  
Output  
I/O  
Output  
B13, A15, B16, C14, C15  
D2  
VCC (2)  
F6, F8, F9, F11, G7, G10, H6, H8, H9, H11, J6, J8, J9, J11, K7, K10, L6, L8, L9  
F3  
2.0V  
2.0V  
VOLDET (3)  
Low  
Output  
NOTES:  
1. These are test signals for factory use only and must be pulled up to OVCC for  
normal machine operation.  
8. Uses one of 20 existing VCC pins in WEDC's WED3C750A8M-200BX, no board  
level design changes are necessary. For new designs of WED3C7558M-XBX refer  
to PLL power supply filtering.  
9. L20VCC for future designs that will require 2.0V L2 cache power supply - compatible  
with existing design using WED3C750A8M-200BX.  
10. To disable SSRAM TAP controllers without interfering with the normal operation of  
the devices, STCK should be tied low (GND) to prevent clocking the devices.  
11. STDI and STMS are internally pulled up and may be left unconnected. Upon  
power-up the SSRAM devices will come up in a reset state which will not interfere  
with the operation of the device.  
2. OVCC inputs supply power to the I/O drivers and VCC inputs supply power to the  
processor core.  
3. Internally tied to GND in the BGA package to indicate to the power supply that a  
low-voltage processor is present. This signal is not a power supply pin.  
4. To allow processor bus I/0 voltage changes, provide the option to connect BVSEL  
and L2VSEL independently to either OVCC (Selects 3.3V Interface) or to GND  
(Selects 2.0V Interface).  
5. Uses one of 15 existing no-connects in WEDC’s WED3C750A8M-200BX.  
6. Internal pull up on die.  
7. OVCC supplies power to the processor bus, JTAG, and all control signals except  
the L2 cache controls (L2CE, L2WE, and L2ZZ); L2OVCC supplies power to the L2  
cache I/O interface (L2ADDR (0-16], L2DATA (0-63), L2DP{0-7] and L2SYNC-OUT)  
and the L2 control signals and the SSRAM power supplies; and VCC supplies power  
to the processor core and the PLL and DLL (after filtering to become AVCC and  
L2AVCC respectively). These columns serve as a reference for the nominal voltage  
supported on a given signal as selected by the BVSEL/L2VSEL pin configurations  
and the voltage supplied. For actual recommended value of Vin or supply voltages  
see Recommended Operating Conditions.  
August 2002  
Rev. 7  
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ABSOLUTE MAXIMUM RATINGS  
Characteristic  
Symbol  
VCC  
Value  
Unit  
V
Notes  
(4)  
Core supply voltage  
PLL supply voltage  
L2 DLL supply voltage  
60x bus supply voltage  
L2 bus supply voltage  
Input supply  
-0.3 to 2.5  
AVCC  
L2AVCC  
OVCC  
L2OVCC  
VIN  
-0.3 to 2.5  
V
(4)  
-0.3 to 2.5  
V
(4)  
-0.3 to 3.465  
-0.3 to 3.465  
-0.3 to 0VCC +0.3  
-0.3 to L20VCC +0.3  
-0.3 to 3.6  
V
(3)  
V
(3)  
Processor Bus  
L2 bus  
V
(2)  
VIN  
V
(2)  
JTAG Signals  
VIN  
V
(2)  
Storage temperature range  
TSTG  
-55 to 150  
°C  
NOTES:  
1. Functional and tested operating conditions are given in Operating Conditions table. Absolute maximum ratings are stress ratings only, and functional operation at the maximums is  
not guaranteed. Stresses beyond those listed may affect device reliability or cause permanent damage to the device.  
2. Caution: Vin must not exceed OVCC by more than 0.3V at any time including during power-on reset.  
3. Caution: OVCC/L2OVCC must not exceed VCC/AVCC/L2AVCC by more than 1.6 V at any time including during power-on reset.  
4. Caution: VCC/AVCC/L2AVCC must not exceed L2OVCC/OVCC by more than 0.4 V at any time including during power-on reset.  
RECOMMENDED OPERATING CONDITIONS  
Characteristic  
Symbol  
VCC  
Recommended Value  
2.0 100mV  
2.0 100mV  
2.0 100mV  
2.0 100mV  
3.3 165mV  
3.3 165mV  
GND to OVCC  
GND to OVCC  
Unit  
V
Core supply voltage  
PLL supply voltage  
AVCC  
L2AVCC  
OVCC  
OVCC  
L20VCC  
VIN  
V
L2 DLL supply voltage  
Processor bus supply voltage  
V
BVSEL = 0  
BVSEL = 1  
V
V
L2 bus supply voltage  
Input Voltage  
L2VSEL = 1  
Processor bus  
JTAG Signals  
V
V
VIN  
V
NOTE: These are the recommended and tested operating conditions. Proper device operation outside of these conditions is not guaranteed.  
August 2002  
Rev. 7  
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POWER CONSUMPTION  
VCC = AVCC = 2.0 0.1V Vdc, OVCC = 3.3V 5ꢀ Vdc, GND = 0 Vdc, 0 ꢁ TJ < 105°C  
Processor (CPU) Frequency/L2 Frequency  
300/150 MHz  
350/175MHz  
4.6  
Unit  
W
W
Notes  
1, 3  
1, 2  
1, 2  
1, 2  
1, 2  
1, 2  
Full-on Mode  
Typical  
4.1  
6.7  
2.5  
1700  
1200  
500  
Maximum  
Maximum  
Maximum  
Maximum  
Maximum  
7.9  
2.8  
1800  
1300  
500  
Doze Mode  
Nap Mode  
Sleep Mode  
Sleep Mode–PLL and DLL Disabled  
W
mW  
mW  
mW  
NOTES:  
1. These values apply for all valid 60x bus and L2 bus ratios. The values do not include OVCC; AVCC and L2AVCC suppling power. OVCC power is system dependent, but is typically  
<10ꢀ of VCC power. Worst case power consumption, for AVCC=15mW and L2AVCC=15mW.  
2. Maximum power is measured at VCC=2.1V while running an entirely cache-resident, contrived sequence of instructions which keep the execution units maximally busy.  
3. Typical power is an average value measured at VCC=AVCC=L2AVCC=2.0V, OVCC=L2OVCC=3.3V in a system, executing typical applications and benchmark sequences.  
L2 CACHE CONTROL REGISTER (L2CR)  
The L2 cache control register, shown in Figure 5, is a supervisor-level, implementation-specific SPR used to configure  
and operate the L2 cache. It is cleared by hard reset or power-on reset.  
FIGURE 5 – L2 CACHE CONTROL REGISTER (L2CR)  
L2WT  
L2DF  
L2CS  
L2PE  
L2E  
L2DO L2CTL L2TS  
L2SL L2BYP  
L2IO L2DRO  
L2IP  
L2SIZ L2CLK L2RAM  
L2I  
L20H  
0
0
L2CTR  
0
1
2
3
4
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24  
30 31  
The L2CR bits are described in Table 1.  
Reserved  
August 2002  
Rev. 7  
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TABLE 1: L2CR BIT SETTINGS  
Bit  
0
Name  
L2E  
Function  
L2 enable. Enables L2 cache operation (including snooping) starting with the next transaction the L2 cache unit receives. Before  
enabling the L2 cache, the L2 clock must be configured through L2CR[2CLK], and the L2 DLL must stabilize. All other L2CR bits  
must be set appropriately. The L2 cache may need to be invalidated globally.  
1
L2PE  
L2 data parity checking enable. Enables parity generation and checking for the L2 data RAM interface. When disabled, generated  
parity is always zeros. L2 Parity is supported by WEDC’s WED3C7558M-XBX, but is dependent on application.  
2–3  
4–6  
L2SIZ  
L2CLK  
L2 size — Should be set according to the size of the L2 data RAMs used.  
11 1 Mbyte - Setting for WED3C7558M-XBX  
L2 clock ratio (core-to-L2 frequency divider). Specifies the clock divider ratio based from the core clock frequency that the L2 data  
RAM interface is to operate at. When these bits are cleared, the L2 clock is stopped and the on-chip DLL for the L2 interface is  
disabled. For nonzero values, the processor generates the L2 clock and the on-chip DLL is enabled. After the L2 clock ratio is chosen,  
the DLL must stabilize before the L2 interface can be enabled. The resulting L2 clock frequency cannot be slower than the clock  
frequency of the 60x bus interface.  
000 L2 clock and DLL disabled  
001 ÷ 1  
010 ÷ 1.5  
011 Reserved  
100 ÷ 2  
101 ÷ 2.5  
110 ÷ 3  
111 Reserved  
7–8  
9
L2RAM  
L2DO  
L2 RAM type — Configures the L2 RAM interface for the type of synchronous SRAMs used:  
• Pipelined (register-register) synchronous burst SRAMs that clock addresses in and clock data out  
The 755 does not burst data into the L2 cache, it generates an address for each access.  
10 Pipelined (register-register) synchronous burst SRAM – Setting for WED3C7558M-XBX  
L2 data only. Setting this bit enables data-only operation in the L2 cache. For this operation, instruction transactions from the L1  
Instruction cache already cached in the L2 cache can hit in the L2, but new instruction transactions from the L1 instruction cache are  
treated as cache-inhibited (bypass L2 cache, no L2 checking done). When both L2DO adn L2IO are set, the L2 cache is effectively  
locked (cache misses do not cause new entries to be allocated but write hits use the L2).  
10  
11  
L2I  
L2 global invalidate. Setting L2I invalidates the L2 cache globally by clearing the L2 status bits. This bit must not be set while the L2  
cache is enabled. See Motorola’s User manual for L2 Invalidation procedure.  
L2CTL  
L2 RAM control (ZZ enable). Setting L2CTL enables the automatic operation of the L2ZZ (low-power mode) signal for cache RAMs.  
Sleep mode is supported by the WED3C7558M-XBX. While L2CTL is asserted, L2ZZ asserts automatically when the device enters  
nap or sleep mode and negates automatically when the device exits nap or sleep mode. This bit should not be set when the device is  
in nap mode and snooping is to be performed through deassertion of QACK#.  
12  
13  
L2WT  
L2TS  
L2 write-through. Setting L2WT selects write-through mode (rather than the default write-back mode) so all writes to the L2 cache also  
write through to the system bus. For these writes, the L2 cache entry is always marked as exclusive rather than modified. This bit  
must never be asserted after the L2 cache has been enabled as previously-modified lines can get remarked as exclusive during  
normal operation.  
L2 test support. Setting L2TS causes cache block pushes from the L1 data cache that result from dcbf and dcbst instructions to be  
written only into the L2 cache and marked valid, rather than being written only to the system bus and marked invalid in the L2 cache  
in case of hit. This bit allows a dcbz/dcbf instruction sequence to be used with the L1 cache enabled to easily initialize the L2 cache  
with any address and data information. This bit also keeps dcbz instructions from being broadcast on the system and single-beat  
cacheable store misses in the L2 from being written to the system bus.  
0: Setting for the L2 Test support as this bit is reserved for tests.  
14–15  
L2OH  
L2 output hold. These bits configure output hold time for address, data, and control signals driven to the L2 data RAMs.  
00: Least Hold Time – Setting for WED3C7558M-XBX  
August 2002  
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TABLE 1: L2CR BIT SETTINGS  
Bit  
16  
Name  
L2SL  
Function  
L2 DLL slow. Setting L2SL increases the delay of each tap of the DLL delay line. It is intended to increase the delay through the DLL  
to accommodate slower L2 RAM bus frequencies.  
0: Setting for WED3C7558M-XBX because L2 RAM interface is operated above 100 MHz.  
17  
18  
L2DF  
L2 differential clock. This mode supports the differential clock requirements of late-write SRAMs.  
0: Setting for WED3C7558M-XBX because late-write SRAMs are not used.  
L2BYP  
L2 DLL bypass is reserved.  
0: Setting for WED3C7558M-XBX  
19-20  
21  
Reserved. These bits are implemented but not used; keep at 0 for future compatibility.  
L2IO  
L2 Instruction-only. Setting this bit enables instruction-only operation in the L2 cache. For this operation, data transactions from the L1  
data cache already cached in the L2 cache can hit in the L2 (including writes), but new data transactions (transactions that miss in the  
L2) from the L1 data cashe are treated as cache-inhibited (bypass L2 cache, no L2 checking done). When both L2DO and L2IO are  
set, the L2 cache is effectively locked (cache misses do not cause new entries to be allocated but write hits use the L2). Note that this  
bit can be programmed dynamically.  
22  
23  
L2CS  
L2 Clock Stop. Setting this bit causes the L2 clocks to the SRAMs to automatically stop whenever the MPC755 enters nap or sleep  
modes, and automatically restart when exiting those modes (including for snooping during nap mode). It operates by asynchronously  
gating off the L2CLK_OUT [A:B] signals while in nap or sleep mode. The L2SYNC_OUT/SYNC_IN path remains in operation, keeping  
the DLL synchronized. This bit is provided as a power-saving alternative to the L2CTL bit and its corresponding ZZ pin, which may not  
be useful for dynamic stopping/restarting of the L2 interface from nap and sleep modes due to the relatively long recovery time from  
ZZ negation that the SRAM requires.  
L2DRO  
L2 DLL rollover. Setting this bit enables a potential rollover (or actual rollover) condition of the DLL to cause a checkstop for the  
processor. A potential rollover condition occurs when the DLL is selecting the last tap of the delay line, and thus may risk rolling over  
to the first tap with one adjustment while in the process of keeping synchronized. Such a condition is improper operation for the DLL,  
and, while this condition is not expected, it allows detection for added security. This bit can be set when the DLL is first enabled (set  
with the L2CLK bits) to detect rollover during initial synchronization. It could also be set when the L2 cache is enabled (with L2E bit)  
after the DLL has achieved its initial lock.  
24–30  
31  
L2CTR  
L2IP  
L2 DLL counter (read-only). These bits indicate the current value of the DLL counter (0 to 127). They are asynchronously read when  
the L2CR is read, and as such should be read at least twice with the same value in case the value is asynchronously caught in  
transition. These bits are intended to provide observability of where in the 128-bit delay chain the DLL is at any given time. Generally,  
the DLL operation should be considered at risk if it is found to be within a couple of taps of its beginning or end point (tap 0 or tap  
128).  
L2 global invalidate in progress (read only)—See the Motorola user’s manual for L2 Invalidation procedure.  
August 2002  
Rev. 7  
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PLL POWER SUPPLY FILTERING  
The AVCC and L2AVCC power signals are provided on  
are recommended over a single large value capacitor.  
The circuit should be placed as close as possible to the  
AVCC pin to minimize noise coupled from nearby circuits.  
An identical but separate circuit should be placed as close  
as possible to the L2AVCC pin. It is often possible to route  
directly from the capacitors to theAVCC pin, which is on the  
periphery of the 255 BGAfootprint, without the inductance  
of vias. The L2AVCC pin may be more difficult to route but  
is proportionately less critical.  
the WED3C7558M-XBX to provide power to the clock  
generation phase-locked loop and L2 cache delay-locked  
loop respectively. To ensure stability of the internal clock,  
the power supplied to the AVCC input signal should be  
filtered of any noise in the 500kHz to 10 MHz resonant  
frequency range of the PLL. A circuit similar to the  
one shown in Figure 6 using surface mount capacitors  
with minimum Effective Series Inductance (ESL) is  
recommended. Multiple small capacitors of equal value  
FIGURE 6 – POWER SUPPLY FILTER CIRCUIT  
10  
Vcc  
AVcc (or L2AVcc)  
2.2 µF  
2.2 µF  
Low ESL surface mount capacitors  
GND  
August 2002  
Rev. 7  
11  
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
WED3C7558M-XBX  
White Electronic Designs  
PACKAGE DESCRIPTION  
Package Outline  
21x25mm  
Interconnects  
Pitch  
255 (16x16 ball array less one)  
1.27mm  
3.90mm  
0.8mm  
Maximum module height  
Ball diameter  
PACKAGE DIMENSIONS 255 BALL GRID ARRAY  
TOP VIEW  
BOTTOM VIEW  
T
R
P
N
M
L
K
J
H
G
F
E
D
C
B
A
1
2 3 4 5 6 7 8 9 10 111213141516  
NOTES:  
1. Dimensions in millimeters and paranthetically in inches.  
2. A1 corner is designated with a ball missing the array.  
August 2002  
Rev. 7  
12  
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  
WED3C7558M-XBX  
White Electronic Designs  
Ordering Information  
WED 3 C 755 8M X B X  
DEVICE GRADE:  
M = Military Screened  
I = Industrial  
-55°C to +125°C  
-40°C to +85°C  
0°C to +70°C  
C = Commercial  
PACKAGE TYPE:  
B = 255 Ceramic Ball Grid Array  
CORE FREQUENCY (MHz)  
350 = 350MHz/175MHz L2 cache  
300 = 300MHz/150MHz L2 cache  
L2 CACHE DENSITY:  
8Mbits = 128K x 72 SSRAM  
PowerPC:  
Type 755 (D - Die Revision)  
C = MULTICHIP PACKAGE  
3 = PowerPC™  
WHITE ELECTRONIC DESIGNS CORP.  
PowerPCis a trademark of International Business Machine Corp.  
August 2002  
Rev. 7  
13  
White Electronic Designs Corporation • (602) 437-1520 • www.wedc.com  

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