TPC6D03 [TOSHIBA]

High-Speed Switching Applications; 高速开关应用
TPC6D03
型号: TPC6D03
厂家: TOSHIBA    TOSHIBA
描述:

High-Speed Switching Applications
高速开关应用

开关
文件: 总7页 (文件大小:200K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
TPC6D03  
TOSHIBA Multi-Chip Device Silicon PNP Epitaxial Type, Schottky Barrier Diode  
TPC6D03  
High-Speed Switching Applications  
DC-DC Converter Applications  
Unit: mm  
A PNP transistor and a Schottky barrier diode are mounted on a  
compact and slim package.  
Maximum Ratings  
Transistor (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Collector-base voltage  
Collector-emitter voltage  
Emitter-collector voltage  
Emitter-base voltage  
V
V
V
V
20  
20  
V
V
CBO  
CEO  
ECO  
EBO  
9.5  
9.5  
1.2  
2.0  
120  
V
V
DC  
Collector current  
Pulse  
I
A
C
I
A
CP  
Base current  
I
B
mA  
Collector power dissipation  
(Q1 single-device operation)  
P
C
400  
150  
mW  
°C  
(Note 1)  
Junction temperature  
T
j
JEDEC  
JEITA  
Diode (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
TOSHIBA  
2-3T1F  
Repetitive peak reverse voltage  
Average forward current  
V
30  
V
A
RRM  
Weight: 0.011 g (typ.)  
I
0.7  
F (AV)  
Peak one cycle surge forward current  
(sine wave)  
I
7.0  
A
FSM  
Power dissipation  
(D1 single-device operation)  
P
D
320  
125  
mW  
°C  
(Note 1)  
Junction temperature  
T
j
Maximum Ratings for Transistor and Diode (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Total power dissipation  
(simultaneous operation)  
P
T
(Note 2)  
600  
mW  
°C  
Storage temperature range  
T
stg  
55~150  
Thermal Resistance Characteristics  
(for transistor and diode)  
Characteristics  
Symbol  
Max  
312  
Unit  
Thermal resistance, junction to  
ambient (single-device operation)  
R
th (j-a)  
(Note 1)  
°C/W  
Note 1: Mounted on an FR4 board (glass epoxy, 1.6 mm thick,  
Cu area: 645 mm2)  
Note 2: Mounted on an FR4 board (glass epoxy, 1.6 mm thick, Cu area: 645 mm2)  
Total power dissipation value when two devices are operated at the same time  
1
2004-09-02  
TPC6D03  
Electrical Characteristics (Ta = 25°C)  
Transistor  
Characteristics  
Collector cut-off current  
Symbol  
Test Condition  
= −20 V, I = 0  
Min  
Typ.  
Max  
Unit  
I
I
V
V
100  
100  
nA  
nA  
V
CBO  
CB  
EB  
E
Emitter cut-off current  
= −9.5 V, I = 0  
C
EBO  
Collector-emitter breakdown voltage  
V
I
= −10 mA, I = 0  
20  
140  
85  
(BR) CEO  
C
B
h
h
(1)  
(2)  
V
V
= −2 V, I = −0.15 A  
350  
FE  
CE  
CE  
C
DC current gain  
= −2 V, I = −0.5 A  
FE  
C
Collector-emitter saturation voltage  
Base-emitter saturation voltage  
Rise time  
V
I
I
= −0.5 A, I = −16.7 mA  
0.17  
1.10  
V
V
CE (sat)  
BE (sat)  
C
C
B
V
= −0.5 A, I = −16.7 mA  
B
t
r
40  
135  
37  
See Figure 1 circuit diagram.  
Switching time  
V
I
12 V, R = 24 Ω  
ns  
Storage time  
Fall time  
t
CC  
L
stg  
= −I = −16.7 mA  
t
f
B1  
B2  
V
CC  
20 µs  
I
I
B1  
B2  
I
Output  
B2  
Input  
I
B1  
Duty cycle < 1%  
Figure 1 Switching Time Test Circuit & Timing Chart  
Circuit Configuration Marking  
Lot No.  
6
5
2
4
Lot code (month)  
Q1  
D1  
Part No.  
(or abbreviation code)  
H8C  
Product-specific code  
Pin #1  
Lot code  
(year)  
A line indicates  
lead (Pb)-free package or  
lead (Pb)-free finish.  
1
3
Diode  
Characteristics  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
Peak forward voltage  
V
V
I
I
I
= 0.5 A  
= 0.7 A  
= 3 mA  
30  
0.35  
0.38  
40  
0.4  
0.43  
V
V
FM (1)  
FM (2)  
F
F
R
Peak forward voltage  
Repetitive peak reverse voltage  
Repetitive peak reverse current  
Junction capacitance  
V
V
RRM  
I
V
V
= 10 V  
25  
100  
µA  
pF  
RRM  
R
R
C
j
= 10 V, f = 1 MHz  
19  
Handling Precaution  
Schottky barrier diodes have large-reverse-current-leakage characteristic compared to other rectifier products.  
This current leakage and not proper operating temperature or voltage may cause thermal runaway.  
Please take forward and reverse loss into consideration during design.  
2
2004-09-02  
TPC6D03  
Transistor  
I
– V  
h – I  
FE C  
C
CE  
1.6  
1000  
100  
10  
Common emitter  
Ta = 25°C  
Single  
nonrepetitive pulse  
30  
20  
Ta = 100°C  
15  
25  
1.2  
0.8  
0.4  
0
55  
10  
8  
6  
4  
I
B
= −2 mA  
Common emitter  
= −2 V  
V
CE  
Single nonrepetitive pulse  
0
1
0
0.1  
0.2  
0.3  
0.4  
0.5  
0.6  
0.7  
0.001  
0.01  
0.1  
1  
(A)  
10  
Collector-emitter voltage  
V
(V)  
Collector current  
I
C
CE  
V
– I  
C
V
– I  
CE (sat)  
BE (sat) C  
1  
0.1  
10  
Common emitter  
/I = 30  
Common emitter  
/I = 30  
I
C
B
I
C
B
Single nonrepetitive pulse  
Single nonrepetitive pulse  
25  
25  
55  
1  
Ta = 100°C  
55  
0.01  
0.001  
Ta = 100°C  
0.1  
0.001  
0.001  
0.01  
0.1  
1  
(A)  
10  
0.01  
0.1  
1  
(A)  
10  
Collector current  
I
C
Collector current  
I
C
Safe Operating Area  
10  
*: Single nonrepetitive pulse Ta = 25°C  
Q1 single-device operation.  
I
– V  
BE  
C
1.5  
1.2  
0.9  
0.6  
0.3  
0
When the device is mounted on an FR4 board  
(glass epoxy, 1.6 mm thick, Cu area: 645 mm2)  
Common emitter  
= −2 V  
V
CE  
I
max (pulsed) *  
10 ms* 1 ms*  
100 ms*  
100 µs*  
C
Single nonrepetitive pulse  
I
max (continuous)  
C
1  
10 s*  
DC operation  
(Ta = 25°C)  
Ta = 100°C  
25 55  
0.1  
Note that the curves for 100  
ms, 10 s and DC operation will  
be different when the devices  
aren’t mounted on an FR4  
board (glass epoxy, 1.6 mm  
thick, Cu area: 645 mm2).  
These characteristic curves  
must be derated linearly with  
increase in temperature.  
0.01  
0.1  
0
0.3  
0.6  
0.9  
1.2  
(V)  
1.5  
1  
10  
100  
Base-emitter voltage  
V
BE  
Collector-emitter voltage  
V
(V)  
CE  
3
2004-09-02  
TPC6D03  
Diode  
I
– V  
P
– I  
F (AV)  
F
F
F (AV)  
10  
0.5  
0.4  
0.3  
0.2  
0.1  
0
DC  
180  
1
0.1  
120  
90  
60  
125  
α = 30°  
Rectangular  
waveform  
Ta = 25°C  
0.01  
0.001  
0°  
α 360°  
Conduction angle α  
0
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
1.6  
0
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
Instantaneous forward voltage  
V
(V)  
Average forward current  
I
(A)  
F
F (AV)  
Ta max – I  
C – V  
j
(typical)  
F (AV)  
R
140  
120  
100  
80  
100  
10  
1
Rectangular  
waveform  
f = 1 MHz  
Ta = 25°C  
DC  
0°  
α 360°  
I
F (AV)  
Conduction angle α  
V
R
= 15 V  
60  
180  
40  
α = 120°  
20  
0
0
0.2  
0.4  
0.6  
0.8  
1.0  
I
1.2  
1.4  
Average forward current  
(A)  
1
10  
100  
F (AV)  
Reverse voltage  
V
(V)  
R
4
2004-09-02  
TPC6D03  
Diode  
Surge forward current (non-repetitive)  
I
– T  
(typical)  
R
j
8
6
4
2
0
100  
10  
f = 50 Hz  
Ta = 25°C  
Pulse measurement  
(one cell)  
30  
20  
15  
10  
5
1
0.1  
0.01  
V
R
= 3 V  
1
10  
100  
0
50  
Junction temperature  
100  
150  
Number of cycles  
T
j
(°C)  
P
– V  
(typical)  
R (AV)  
R
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0
Rectangular waveform  
360°  
0°  
DC  
300  
V
R
α
Conduction angle α  
T = 125°C  
240  
180  
j
120  
α = 60°  
0
10  
Reverse voltage  
20  
30  
V
(V)  
R
5
2004-09-02  
TPC6D03  
Transistor and Diode  
r
– t  
w
th (j-a)  
1000  
100  
10  
Curves should be applied in thermal limited area.  
Single nonrepetitive pulse Ta = 25°C  
Mounted on an FR4 board  
(glass epoxy, 1.6 mm thick, Cu area: 645 mm2)  
Either at Q1 or D1 single-operation  
1
0.001  
0.01  
0.1  
1
10  
100  
1000  
Pulse width  
t
w
(s)  
Permissible Power Dissipation for  
Simultaneous Operation  
0.5  
0.4  
0.3  
0.2  
0.1  
0
(0.25, 0.35)  
DC operation  
Ta = 25°C  
Mounted on an FR4  
board (glass epoxy,  
1.6 mm thick,  
Cu area: 645 mm2)  
0
0.1  
0.2  
0.3  
0.4  
0.5  
Permissible power dissipation for D1  
P
(W)  
D
6
2004-09-02  
TPC6D03  
RESTRICTIONS ON PRODUCT USE  
030619EAA  
The information contained herein is subject to change without notice.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which  
may result from its use. No license is granted by implication or otherwise under any patent or patent rights of  
TOSHIBA or others.  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc..  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this  
document shall be made at the customer’s own risk.  
TOSHIBA products should not be embedded to the downstream products which are prohibited to be produced  
and sold, under any law and regulations.  
7
2004-09-02  

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