74LCX273FT [TOSHIBA]

CMOS Logic ICs - 74LCX Series;
74LCX273FT
型号: 74LCX273FT
厂家: TOSHIBA    TOSHIBA
描述:

CMOS Logic ICs - 74LCX Series

光电二极管 逻辑集成电路 触发器
文件: 总12页 (文件大小:219K)
中文:  中文翻译
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74LCX273FT  
CMOS Digital Integrated Circuits Silicon Monolithic  
74LCX273FT  
1. Functional Description  
Low-Voltage Octal D-Type Flip-Flop with Clear with 5-V Tolerant Inputs and Outputs  
2. General  
The74LCX273FTisahigh-performanceCMOSoctalD-typeflip-flop. Designedforusein3.3Vsystems, itachieves  
high-speed operation while maintaining the CMOS low-power dissipation.  
The device is designed for low-voltage (3.3 V) VCC applications, but it could be used to interface to 5 V supply  
environment for both inputs and outputs.  
This 8 bit D-type flip-flop is controlled by a clock input (CK) and a clear input (CLR). When the CLR input is low,  
the eight outputs are at a low logic level.  
All inputs are equipped with protection circuits against static discharge.  
3. Features  
(1) AEC-Q100 (Rev. H) (Note 1)  
(2) Wide operating temperature range: Topr = -40 to 125  
(3) Low-voltage operation: VCC = 1.65 to 3.6 V  
(4) High-speed operation: tpd = 9.5 ns (max) (VCC = 3.3 ± 0.3 V)  
(5) Output current: |IOH|/IOL = 24 mA (min) (VCC = 3.0 V)  
(6) Power-down protection provided on all inputs and outputs  
(7) Pin and function compatible with the 74 series  
(74LVC/ALVC/ etc.) 273 type  
Note 1: This device is compliant with the reliability requirements of AEC-Q100. For details, contact your Toshiba sales  
representative.  
4. Packaging  
TSSOP20B  
Start of commercial production  
2014-12  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
1
74LCX273FT  
5. Pin Assignment  
6. Marking  
7. IEC Logic Symbol  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
2
74LCX273FT  
8. Truth Table  
X:  
Don't care  
9. System Diagram  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
3
74LCX273FT  
10. Absolute Maximum Ratings (Note)  
Characteristics  
Symbol  
Note  
Rating  
Unit  
Supply voltage  
Input voltage  
Output voltage  
VCC  
VIN  
-0.5 to 6.5  
-0.5 to 6.5  
-0.5 to 6.5  
V
V
V
VOUT  
(Note 1)  
(Note 2)  
-0.5 to VCC + 0.5  
Input diode current  
Output diode current  
Output current  
IIK  
IOK  
-50  
±50  
mA  
mA  
mA  
mW  
mA  
(Note 3)  
(Note 4)  
IOUT  
PD  
±50  
Power dissipation  
VCC/ground current  
Storage temperature  
180  
ICC/IGND  
Tstg  
±100  
-65 to 150  
Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even  
destruction.  
Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the  
significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even  
if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum  
ratings and the operating ranges.  
Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook  
(“HandlingPrecautions”/“DeratingConceptandMethods”)andindividualreliabilitydata(i.e. reliabilitytestreport  
and estimated failure rate, etc).  
Note 1: VCC = 0 V  
Note 2: High (H) or Low (L) state. IOUT absolute maximum rating must be observed.  
Note 3: VOUT < GND, VOUT > VCC  
Note 4: 180 mW in the range of Ta = -40 to 85 . From Ta = 85 to 125 a derating factor of -3.25 mW/shall be  
applied until 50 mW.  
11. Operating Ranges (Note)  
Characteristics  
Supply voltage  
Symbol  
VCC  
Note  
Rating  
Unit  
V
1.65 to 3.6  
1.5 to 3.6  
0 to 5.5  
0 to 5.5  
0 to VCC  
±24  
(Note 1)  
Input voltage  
VIN  
V
V
Output voltage  
VOUT  
(Note 2)  
(Note 3)  
(Note 4)  
(Note 5)  
Output current  
IOH,IOL  
mA  
±12  
Operating temperature  
Input rise and fall times  
Topr  
-40 to 125  
0 to 10  
dt/dv  
(Note 6)  
ns/V  
Note: The operating ranges must be maintained to ensure the normal operation of the device.  
Unused inputs must be tied to either VCC or GND.  
Note 1: Data retention only.  
Note 2: VCC = 0 V  
Note 3: High (H) or Low (L) state.  
Note 4: VCC = 3.0 to 3.6 V  
Note 5: VCC = 2.7 to 3.0 V  
Note 6: VIN =0.8 to 2.0 V , VCC = 3.0 V  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
4
74LCX273FT  
12. Electrical Characteristics  
12.1. DC Characteristics (Unless otherwise specified, Ta = -40 to 85 )  
Characteristics  
Symbol  
VIH  
Test Condition  
VCC (V)  
Min  
Max  
Unit  
V
High-level input voltage  
1.65 to 2.3 VCC × 0.9  
2.3 to 2.7  
2.7 to 3.6  
1.65 to 2.3  
2.3 to 2.7  
2.7 to 3.6  
1.7  
2.0  
Low-level input voltage  
High-level output voltage  
VIL  
VCC × 0.1  
0.7  
V
V
0.8  
VOH  
VIN = VIH or VIL  
IOH = -100 µA  
IOH = -4 mA  
IOH = -8 mA  
IOH = -12 mA  
IOH = -18 mA  
IOH = -24 mA  
IOL = 100 µA  
IOL = 4 mA  
1.65 to 3.6 VCC - 0.2  
1.65  
2.3  
1.05  
1.7  
2.2  
2.4  
2.2  
2.7  
3.0  
3.0  
Low-level output voltage  
VOL  
VIN = VIH or VIL  
1.65 to 3.6  
1.65  
0.2  
V
0.45  
0.7  
IOL = 8 mA  
2.3  
IOL = 12 mA  
IOL = 16 mA  
IOL = 24 mA  
2.7  
0.4  
3.0  
0.4  
3.0  
0.55  
±5.0  
10.0  
10.0  
±10.0  
500  
Input leakage current  
IIN  
IOFF  
ICC  
ICC  
VIN = 0 to 5.5 V  
VIN/VOUT = 5.5 V  
VIN = VCC or GND  
VIN = 3.6 to 5.5 V  
1.65 to 3.6  
0
µA  
µA  
µA  
Power-OFF leakage current  
Quiescent supply current  
1.65 to 3.6  
1.65 to 3.6  
2.7 to 3.6  
Quiescent supply current  
ICC VIH = VCC - 0.6 V  
µA  
(per 1 input)  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
5
74LCX273FT  
12.2. DC Characteristics (Unless otherwise specified, Ta = -40 to 125 )  
Characteristics  
Symbol  
VIH  
Test Condition  
VCC (V)  
Min  
Max  
Unit  
V
High-level input voltage  
1.65 to 2.3 VCC × 0.9  
2.3 to 2.7  
2.7 to 3.6  
1.65 to 2.3  
2.3 to 2.7  
2.7 to 3.6  
1.7  
2.0  
Low-level input voltage  
High-level output voltage  
VIL  
VCC × 0.1  
0.7  
V
V
0.8  
VOH  
VIN = VIH or VIL  
IOH = -100 µA 1.65 to 3.6 VCC - 0.2  
IOH = -4 mA  
IOH = -8 mA  
IOH = -12 mA  
IOH = -18 mA  
IOH = -24 mA  
IOL = 100 µA  
IOL = 4 mA  
1.65  
2.3  
0.9  
1.55  
2.0  
2.2  
2.0  
2.7  
3.0  
3.0  
Low-level output voltage  
VOL  
VIN = VIH or VIL  
1.65 to 3.6  
1.65  
0.2  
V
0.65  
0.9  
IOL = 8 mA  
2.3  
IOL = 12 mA  
IOL = 16 mA  
IOL = 24 mA  
2.7  
0.6  
3.0  
0.6  
3.0  
0.75  
±20.0  
40.0  
40.0  
±40.0  
5.0  
Input leakage current  
IIN  
IOFF  
ICC  
ICC  
VIN = 0 to 5.5 V  
VIN/VOUT = 5.5 V  
VIN = VCC or GND  
VIN = 3.6 to 5.5 V  
1.65 to 3.6  
0
µA  
µA  
µA  
Power-OFF leakage current  
Quiescent supply current  
1.65 to 3.6  
1.65 to 3.6  
2.7 to 3.6  
Quiescent supply current  
ICC VIH = VCC - 0.6 V  
mA  
(per 1 input)  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
6
74LCX273FT  
12.3. AC Characteristics (Unless otherwise specified, Ta = -40 to 85 )  
Characteristics  
Symbol  
Note  
Test Condition  
VCC (V)  
Min  
Max  
Unit  
Maximum clock frequency  
fMAX  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
50  
100  
150  
150  
MHz  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
Propagation delay time(CK-Q)  
Propagation delay time(CLR-Q)  
Minimum pulse width(CK)  
Minimum pulse width(CLR)  
Minimum setup time  
tPLH,tPHL  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
30.0  
10.5  
9.5  
8.5  
30.0  
10.5  
9.5  
8.5  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
1.5  
tPHL  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.2  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
1.5  
10.0  
5.0  
3.3  
3.3  
10.0  
5.0  
3.3  
3.3  
10.0  
5.0  
2.5  
2.5  
1.5  
1.5  
1.5  
1.5  
8.0  
4.0  
2.5  
2.0  
tw(L),tw(H)  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
tw(L)  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.2  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
tS  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
Minimum hold time  
th  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
Minimum removal time  
trem  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.3  
3.3 ± 0.3  
2.7  
Output skew  
tosLH,tosHL (Note 1)  
3.3 ± 0.3  
1.0  
Note 1: Parameter guaranteed by design. (tosLH = |tPLHm-tPLHn|, tosHL = |tPHLm-tPHLn|)  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
7
74LCX273FT  
12.4. AC Characteristics (Unless otherwise specified, Ta = -40 to 125 )  
Characteristics  
Symbol  
Note  
Test Condition  
VCC (V)  
Min  
Max  
Unit  
Maximum clock frequency  
fMAX  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
45  
90  
MHz  
135  
135  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
Propagation delay time(CK-Q)  
Propagation delay time(CLR-Q)  
Minimum pulse width(CK)  
Minimum pulse width(CLR)  
Minimum setup time  
tPLH,tPHL  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
33.0  
12.0  
10.5  
9.5  
33.0  
12.0  
10.5  
9.5  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
1.5  
tPHL  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.2  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
1.5  
10.0  
5.0  
3.3  
3.3  
10.0  
5.0  
3.3  
3.3  
10.0  
5.0  
2.5  
2.5  
1.5  
1.5  
1.5  
1.5  
8.0  
4.0  
2.5  
2.0  
tw(L),tw(H)  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
tw(L)  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.2  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
tS  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
Minimum hold time  
th  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.1  
3.3 ± 0.3  
1.8 ± 0.15  
2.5 ± 0.2  
2.7  
Minimum removal time  
trem  
See 12.7 AC Test Circuit,  
Table 12.8.1, Fig. 12.8.3  
3.3 ± 0.3  
2.7  
Output skew  
tosLH,tosHL (Note 1)  
3.3 ± 0.3  
1.0  
Note 1: Parameter guaranteed by design. (tosLH = |tPLHm-tPLHn|, tosHL = |tPHLm-tPHLn|)  
12.5. Dynamic Switching Characteristics (Unless otherwise specified, Ta = 25 , Input: tr  
= tf = 2.5 ns, CL = 50 pF, RL = 500 )  
Characteristics  
Symbol  
Test Condition  
VIH = 3.3 V, VIL = 0 V  
VCC (V)  
Typ.  
Unit  
Quiet output maximum dynamic VOL  
Quiet output minimum dynamic VOL  
VOLP  
3.3  
3.3  
0.8  
0.8  
V
V
|VOLV| VIH = 3.3 V, VIL = 0 V  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
8
74LCX273FT  
12.6. Capacitive Characteristics (Unless otherwise specified, Ta = 25 )  
Characteristics  
Input capacitance  
Symbol  
Note  
Test Condition  
VCC (V)  
Typ.  
Unit  
CIN  
COUT  
CPD  
3.3  
0
7
8
pF  
pF  
pF  
Output capacitance  
Power dissipation capacitance  
(Note 1) fIN = 10 MHz  
3.3  
25  
Note 1: CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current  
consumption without load. Average operating current can be obtained by the equation.  
ICC(opr) = CPD × VCC × fIN + ICC/8 (per 1 bit)  
12.7. AC Test Circuit  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
9
74LCX273FT  
12.8. AC Waveform  
Fig. 12.8.1 tPLH, tPHL, tw, ts, th  
Fig. 12.8.2 tPHL, tw  
Fig. 12.8.3 trem  
Table 12.8.1 AC Waveform Symbols  
VCC = 3.3 ± 0.3 V  
VCC = 2.5 ± 0.2 V  
VCC = 2.7 V  
Symbol  
VCC = 1.8 ± 0.15 V  
Input  
VIH  
VIM  
tr, tf  
VOM  
CL  
2.7 V  
1.5 V  
2.5 ns  
1.5 V  
50 pF  
500 Ω  
VCC  
VCC  
VCC/2  
2.0 ns  
VOH/2  
30 pF  
500 Ω  
VCC/2  
2.0 ns  
VOH/2  
30 pF  
1 kΩ  
Output  
Load  
RL  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
10  
74LCX273FT  
Package Dimensions  
Unit: mm  
Weight: 0.071 g (typ.)  
Package Name(s)  
Nickname: TSSOP20B  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
11  
74LCX273FT  
RESTRICTIONS ON PRODUCT USE  
Toshiba Corporation, and its subsidiaries and affiliates (collectively "TOSHIBA"), reserve the right to make changes to the information  
in this document, and related hardware, software and systems (collectively "Product") without notice.  
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written permission, reproduction is permissible only if reproduction is without alteration/omission.  
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for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which  
minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage  
to property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate  
the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA  
information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the  
precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application  
with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications,  
including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating  
and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample  
application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications.  
TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR APPLICATIONS.  
PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE  
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including without limitation, the EU RoHS Directive. TOSHIBA ASSUMES NO LIABILITY FOR DAMAGES OR LOSSES OCCURRING  
AS A RESULT OF NONCOMPLIANCE WITH APPLICABLE LAWS AND REGULATIONS.  
©2016 Toshiba Corporation  
2016-09-26  
Rev.3.0  
12  

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