2SK3498(2-7B1B) [TOSHIBA]

TRANSISTOR 1 A, 450 V, 5.5 ohm, N-CHANNEL, Si, POWER, MOSFET, 2-7B1B, SC-64, 3 PIN, FET General Purpose Power;
2SK3498(2-7B1B)
型号: 2SK3498(2-7B1B)
厂家: TOSHIBA    TOSHIBA
描述:

TRANSISTOR 1 A, 450 V, 5.5 ohm, N-CHANNEL, Si, POWER, MOSFET, 2-7B1B, SC-64, 3 PIN, FET General Purpose Power

开关 脉冲 晶体管
文件: 总3页 (文件大小:198K)
中文:  中文翻译
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2SK3498  
TOSHIBA Field Effect Transistor Silicon N Channel MOS Type (π-MOSV)  
2SK3498  
DC-DC Converter, Relay Drive and Motor Drive  
Unit: mm  
Applications  
Low drain-source ON resistance: R  
= 4.0 (typ.)  
DS (ON)  
High forward transfer admittance: |Y | = 0.6 S (typ.)  
fs  
= 100 µA (max) (V  
Low leakage current: I  
= 400 V)  
DSS  
DS  
Enhancement-model: V = 2.0 to 4.0 V (V  
= 10 V, I = 1 mA)  
th DS  
D
Maximum Ratings (Ta = 25°C)  
Characteristics  
Symbol  
Rating  
Unit  
Drain-source voltage  
V
400  
400  
±30  
1
V
V
V
DSS  
Drain-gate voltage (R  
= 20 k)  
V
GS  
DGR  
Gate-source voltage  
V
GSS  
DC (Note 1)  
Pulse (Note 1)  
I
D
Drain current  
A
I
3
DP  
Drain power dissipation (Tc = 25°C)  
P
20  
W
D
AS  
AR  
Single pulse avalanche energy  
E
113  
mJ  
JEDEC  
JEITA  
(Note 2)  
SC-64  
2-7B1B  
Avalanche current  
I
1
2
A
TOSHIBA  
Repetitive avalanche energy (Note 3)  
Channel temperature  
E
mJ  
°C  
°C  
AR  
T
150  
ch  
Weight: 0.36 g (typ.)  
Storage temperature range  
T
55 to150  
stg  
Thermal Characteristics  
Characteristics  
Symbol  
Max  
Unit  
Thermal resistance, channel to case  
Thermal resistance, channel to ambient  
R
R
6.25  
125  
°C/W  
°C/W  
th (ch-c)  
th (ch-a)  
Note 1: Please use devices on condition that the channel temperature  
is below 150°C.  
Note 2: V  
DD  
= 90 V, T = 25°C (initial), L = 183 mH, R = 25 ,  
ch  
G
I
= 1 A  
AR  
Note 3: Repetitive rating: pulse width limited by maximum channel  
temperature  
This transistor is an electrostatic sensitive device. Please handle with  
caution.  
JEDEC  
JEITA  
TOSHIBA  
2-7J1B  
Weight: 0.36 g (typ.)  
1
2002-09-04  
2SK3498  
Electrical Characteristics (Ta = 25°C)  
Characteristics  
Gate leakage current  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
I
V
= ±25 V, V = 0 V  
±30  
±10  
µA  
V
GSS  
GS  
DS  
Drain-source breakdown voltage  
Drain cut-OFF current  
V
V
I = ±10 µA, V = 0 V  
G DS  
(BR) GSS  
I
V
= 400 V, V = 0 V  
GS  
100  
µA  
V
DSS  
(BR) DSS  
DS  
Drain-source breakdown voltage  
Gate threshold voltage  
I
= 10 mA, V  
= 0 V  
GS  
450  
2.0  
D
V
V
V
V
= 10 V, I = 1 mA  
4.0  
5.5  
V
th  
DS  
GS  
DS  
D
Drain-source ON resistance  
R
= 10 V, I = 0.5 A  
4.2  
0.6  
145  
35  
80  
S
DS (ON)  
D
Y   
fs  
= 10 V, I = 0.5 A  
0.3  
Forward transfer admittance  
Input capacitance  
D
C
C
iss  
V
= 10 V, V  
= 0 V, f = 1 MHz  
GS  
pF  
ns  
Reverse transfer capacitance  
DS  
rss  
C
oss  
Output capacitance  
Rise time  
10 V  
I = 0.5 A  
D
t
14  
56  
26  
75  
5.7  
r
V
GS  
V
OUT  
0 V  
Turn-ON time  
Switching time  
t
on  
R
= 400 Ω  
L
Fall time  
t
f
V
200 V  
DD  
<
Duty 1%, t = 10 µs  
Turn-OFF time  
t
=
w
off  
Total gate charge  
Q
g
(gate-source plus gate-drain)  
V
320 V, V  
= 10 V, I = 1 A  
GS D  
nC  
DD  
Q
Q
Gate-source charge  
3.0  
2.7  
gs  
Gate-drain (“miller”) charge  
gd  
Source-Drain Ratings and Characteristics (Ta = 25°C)  
Characteristics  
Symbol  
Test Condition  
Min  
Typ.  
Max  
Unit  
I
A
A
Continuous drain reverse current (Note 1)  
1
3
DR  
Pulse drain reverse current  
Forward voltage (diode)  
Reverse recovery time  
Reverse recovery charge  
(Note 1)  
I
DRP  
V
I
I
= 1 A, V  
= 1 A, V  
= 0 V  
1.7  
V
DSF  
DR  
DR  
GS  
GS  
t
= 0 V,  
650  
14.6  
ns  
µC  
rr  
dI /dt = 100 A/µs  
Q
DR  
rr  
Marking  
Lot Number  
Type  
K3498  
Month (starting from alphabet A)  
Year  
(last number of the christian era)  
2
2002-09-04  
2SK3498  
RESTRICTIONS ON PRODUCT USE  
000707EAA  
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor  
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical  
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of  
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of  
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.  
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as  
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and  
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability  
Handbook” etc..  
The TOSHIBA products listed in this document are intended for usage in general electronics applications  
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,  
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires  
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or  
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or  
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,  
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this  
document shall be made at the customer’s own risk.  
The information contained herein is presented only as a guide for the applications of our products. No  
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other  
rights of the third parties which may result from its use. No license is granted by implication or otherwise under  
any intellectual property or other rights of TOSHIBA CORPORATION or others.  
The information contained herein is subject to change without notice.  
3
2002-09-04  

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