TPS2561-Q1 [TI]

DUAL CHANNEL PRECISION ADJUSTABLE CURRENT-LIMITED POWER SWITCH; 双通道精密可调限流电源开关
TPS2561-Q1
型号: TPS2561-Q1
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

DUAL CHANNEL PRECISION ADJUSTABLE CURRENT-LIMITED POWER SWITCH
双通道精密可调限流电源开关

开关 电源开关
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TPS2561-Q1  
www.ti.com  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
DUAL CHANNEL PRECISION ADJUSTABLE CURRENT-LIMITED POWER SWITCH  
Check for Samples: TPS2561-Q1  
1
FEATURES  
DESCRIPTION  
The TPS2561-Q1 is a dual-channel power-distribution  
switch intended for applications where precision  
current limiting is required or heavy capacitive loads  
and short circuits are encountered. These devices  
offer a programmable current-limit threshold between  
250 mA and 2.8 A (typ) per channel through an  
external resistor. The power-switch rise and fall times  
are controlled to minimize current surges during turn  
on or off.  
2
Qualified for Automotive Applications  
Two Separate Current Limiting Channels  
Meets USB Current-Limiting Requirements  
Adjustable Current Limit, 250 mA–2.8 A (typ)  
± 7.5% Current-Limit Accuracy at 2.8 A  
Fast Overcurrent Response - 3.5-μS (typ)  
Two 44-mHigh-Side MOSFETs  
Operating Range: 2.5 V to 6.5 V  
Each channel of the TPS2561-Q1 device limits the  
output current to a safe level by switching into a  
constant-current mode when the output load exceeds  
the current-limit threshold. The FAULTx logic output  
for each channel independently asserts low during  
overcurrent and over temperature conditions.  
2-μA Maximum Standby Supply Current  
Built-in Soft-Start  
15 kV or 8 kV System-Level ESD Capable  
UL Listed – File No. E169910  
CB and Nemko Certified  
TPS2561-Q1  
DRC PACKAGE  
(TOP VIEW)  
TPS2561-Q1  
0.1 μF  
2.5 V 6.5 V  
VOUT1  
IN  
IN  
OUT1  
OUT2  
10  
9
8
7
6
1
2
3
4
5
GND  
IN  
IN  
EN1  
EN2  
FAULT1  
OUT1  
OUT2  
ILIM  
2x RFAULT  
100 kΩ  
VOUT2  
PAD  
RILIM  
2x CLOAD  
ILIM  
Fault Signal  
FAULT1  
FAULT2  
EN1  
FAULT2  
Fault Signal  
Control Signal  
Control Signal  
GND  
ENx = Active Low for the TPS2560  
ENx = Active High for the TPS2561-Q1  
EN2  
PowerPAD  
Figure 1. Typical Application as USB Power Switch  
1
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
2
PowerPAD is a trademark of Texas Instruments.  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of the Texas  
Instruments standard warranty. Production processing does not  
necessarily include testing of all parameters.  
Copyright © 2011–2012, Texas Instruments Incorporated  
 
TPS2561-Q1  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
www.ti.com  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with  
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more  
susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.  
ORDERING INFORMATION(1)  
(2)  
TA  
PACKAGE  
ORDERABLE PART NUMBER  
TOP-SIDE MARKING  
–40°C to 125°C  
SON - DRC Reel of 3000  
TPS2561QDRCRQ1  
PXPQ  
(1) For the most current package and ordering information, see the Package Option Addendum at the end of this document, or see the TI  
website at www.ti.com.  
(2) Maximum ambient temperature is a function of device junction temperature and system level considerations, such as power dissipation  
and board layout. See dissipation rating table and recommended operating conditions for specific information related to these devices.  
ABSOLUTE MAXIMUM RATINGS  
over operating free-air temperature range unless otherwise noted(1)  
(2)  
VALUE  
UNIT  
V
Voltage range on IN, OUTx, ENx or ENx, ILIM, FAULTx  
Voltage range from IN to OUTx  
Continuous output current  
–0.3 to 7  
–7 to 7  
V
Internally Limited  
Continuous total power dissipation  
Continuous FAULTx sink current  
ILIM source current  
See the Dissipation Rating Table  
25  
Internally Limited  
2
mA  
mA  
kV  
V
HBM  
ESD  
CDM  
1000  
ESD – system level (contact/air)(3)  
8/15  
–40 to 125(4)  
kV  
°C  
TJ  
Maximum junction temperature  
(1) Stresses beyond those listed under absolute maximum ratings may cause permanent damage to the device. These are stress ratings  
only, and functional operation of the device at these or any other conditions beyond those indicated under recommended operating  
conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) Voltages are referenced to GND unless otherwise noted.  
(3) Surges per EN61000-4-2, 1999 applied between USB and output ground of the TPS2561EVM (HPA424) evaluation module  
(documentation available on the web.) These were the test level, not the failure threshold.  
(4) Ambient over temperature shutdown threshold  
DISSIPATION RATING TABLE  
T
A 25°C  
THERMAL RESISTANCE(1)  
THERMAL RESISTANCE  
BOARD  
PACKAGE  
POWER  
RATING  
θJA  
θJC  
High-K(2)  
DRC  
41.6°C/W  
10.7°C/W  
2403 mW  
(1) Mounting per the PowerPADTM Thermally Enhanced Package application report (SLMA002)  
(2) The JEDEC high-K (2s2p) board used to derive this data was a 3in × 3in, multilayer board with 1-ounce internal power and ground  
planes and 2-ounce copper traces on top and bottom of the board.  
2
Copyright © 2011–2012, Texas Instruments Incorporated  
 
 
TPS2561-Q1  
www.ti.com  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
RECOMMENDED OPERATING CONDITIONS  
MIN  
MAX  
UNIT  
VIN  
Input voltage, IN  
Enable voltage  
2.5  
6.5  
V
VENx  
V/ENx  
VIH  
0
6.5  
V
V
High-level input voltage on ENx or ENx  
Low-level input voltage on ENx or ENx  
Continuous output current per channel, OUTx  
Continuous FAULTx sink current  
1.1  
VIL  
0.66  
2.5  
IOUTx  
0
0
A
10  
mA  
°C  
TJ  
Operating virtual junction temperature  
Recommended resistor limit range  
–40  
20  
125  
187  
RILIM  
k  
ELECTRICAL CHARACTERISTICS  
over recommended operating conditions, V/ENx = 0 V, or VENx = VIN (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS(1)  
MIN  
TYP MAX  
UNIT  
POWER SWITCH  
TJ = 25 °C  
44  
50  
79  
4
Static drain-source on-state resistance per  
channel, IN to OUTx(2)  
rDS(on)  
mΩ  
–40 °C TJ 125 °C  
VIN = 6.5 V  
2
1
3
2
tr  
tf  
Rise time, output(2)  
Fall time, output(2)  
VIN = 2.5 V  
3
CLx = 1 μF, RLx = 100 ,  
(see Figure 2)  
ms  
VIN = 6.5 V  
0.6  
0.4  
0.8  
0.6  
1
VIN = 2.5 V  
0.8  
ENABLE INPUT EN OR EN  
Enable pin turn on/off threshold  
0.66  
–0.5  
1.1  
V
Hysteresis  
55(3)  
mV  
μA  
ms  
ms  
IEN  
ton  
toff  
Input current  
Turn-on time(2)  
Turn-off time(2)  
VENx = 0 V or 6.5 V, V/ENx = 0 V or 6.5 V  
0.5  
9
CLx = 1 μF, RLx = 100 , (see Figure 2)  
6
CURRENT LIMIT  
RILIM = 20 kΩ  
2590 2800 3005  
Current-limit threshold per channel (Maximum DC output current IOUTx  
delivered to load) and Short-circuit current, OUTx connected to GND  
IOS  
RILIM = 61.9 kΩ  
RILIM = 100 kΩ  
800  
470  
900 1005  
mA  
560  
645  
tIOS  
Response time to short circuit  
VIN = 5.0 V (see Figure 3)  
3.5(3)  
μs  
(1) Pulse-testing techniques maintain junction temperature close to ambient temperature; thermal effects must be taken into account  
separately.  
(2) Not production tested.  
(3) These parameters are provided for reference only, and do not constitute part of TI's published specifications for purposes of TI's product  
warranty.  
Copyright © 2011–2012, Texas Instruments Incorporated  
3
 
TPS2561-Q1  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
www.ti.com  
ELECTRICAL CHARACTERISTICS (continued)  
over recommended operating conditions, V/ENx = 0 V, or VENx = VIN (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS(1)  
MIN  
TYP MAX  
UNIT  
SUPPLY CURRENT  
IIN_off  
IIN_on  
IREV  
Supply current, low-level output  
Supply current, high-level output  
Reverse leakage current  
VIN = 6.5 V, No load on OUTx, V ENx = 6.5 V or VENx = 0 V  
0.1  
100  
85  
2
125  
110  
1
μA  
μA  
μA  
μA  
RILIM = 20 kΩ  
VIN = 6.5 V, No load on OUT  
RILIM = 100 kΩ  
VOUTx = 6.5 V, VIN = 0 V  
TJ = 25°C  
0.01  
UNDERVOLTAGE LOCKOUT  
UVLO Low-level input voltage, IN  
Hysteresis, IN  
FAULTx FLAG  
VIN rising, TJ = 25°C  
TJ = 25°C  
2.35  
35  
2.45  
V
mV  
I FAULTx = 1 mA, FAULTx assertion or de-assertion due to  
overcurrent condition  
VOL  
Output low voltage, FAULTx  
180  
1
mV  
μA  
ms  
Off-state leakage  
FAULTx deglitch  
V FAULTx = 6.5 V  
I FAULTx = 1 mA, FAULTx assertion or de-assertion due to  
overcurrent condition  
6
9
13  
THERMAL SHUTDOWN  
OTSD2  
OTSD  
Thermal shutdown threshold(4)  
155  
135  
°C  
°C  
°C  
Thermal shutdown threshold in current-  
limit(4)  
Hysteresis  
20(5)  
(4) Not production tested.  
(5) These parameters are provided for reference only, and do not constitute part of TI's published specifications for purposes of TI's product  
warranty.  
4
Copyright © 2011–2012, Texas Instruments Incorporated  
TPS2561-Q1  
www.ti.com  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
DEVICE INFORMATION  
Pin Functions  
PIN  
I/O  
DESCRIPTION  
NAME  
NO.  
EN1  
EN1  
EN2  
EN2  
GND  
IN  
-
4
I
I
I
I
Enable input, logic low turns on channel one power switch  
Enable input, logic high turns on channel one power switch  
Enable input, logic low turns on channel two power switch  
Enable input, logic high turns on channel two power switch  
Ground connection; connect externally to PowerPAD  
-
5
1
2, 3  
I
Input voltage; connect a 0.1 μF or greater ceramic capacitor from IN to GND as  
close to the IC as possible.  
FAULT1  
FAULT2  
10  
6
O
O
Active-low open-drain output, asserted during overcurrent or overtemperature  
condition on channel one.  
Active-low open-drain output, asserted during overcurrent or overtemperature  
condition on channel two  
OUT1  
OUT2  
ILIM  
9
8
7
O
O
O
Power-switch output for channel one  
Power-switch output for channel two  
External resistor used to set current-limit threshold; recommended 20 kΩ ≤ RILIM  
187 k.  
Internally connected to GND; used to heat-sink the part to the circuit board traces.  
Connect PowerPAD to GND pin externally.  
PowerPAD™  
PAD  
FUNCTIONAL BLOCK DIAGRAM  
Current  
Sense  
CS  
IN  
OUT1  
FAULT1  
9-ms Deglitch  
Thermal  
Sense  
Charge  
Pump  
Current  
EN1  
EN2  
Driver  
Limit  
ILIM  
FAULT2  
UVLO  
Thermal  
Sense  
9-ms Deglitch  
GND  
CS  
OUT2  
Current  
Sense  
Copyright © 2011–2012, Texas Instruments Incorporated  
5
TPS2561-Q1  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
www.ti.com  
PARAMETER MEASUREMENT INFORMATION  
OUTx  
tr  
tf  
RLx  
CLx  
90%  
10%  
VOUTx  
90%  
10%  
TEST CIRCUIT  
VENx  
50%  
50%  
50%  
ton  
50%  
VENx  
toff  
ton  
toff  
90%  
90%  
VOUTx  
VOUTx  
10%  
10%  
VOLTAGE WAVEFORMS  
Figure 2. Test Circuit and Voltage Waveforms  
IOS  
IOUTx  
tIOS  
Figure 3. Response Time to Short Circuit Waveform  
Decreasing  
Load Resistance  
V
OUTx  
Decreasing  
Load Resistance  
I
OUTx  
I
OS  
Figure 4. Output Voltage vs. Current-Limit Threshold  
6
Copyright © 2011–2012, Texas Instruments Incorporated  
 
TPS2561-Q1  
www.ti.com  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
TYPICAL CHARACTERISTICS  
TPS2561-Q1  
0.1 μF  
2.5 V 6.5 V  
VOUT1  
IN  
IN  
OUT1  
OUT2  
2x RFAULT  
100 kΩ  
VOUT2  
2x CLOAD  
R1  
187 kΩ  
Fault Signal  
FAULT1  
FAULT2  
EN1  
ILIM  
Fault Signal  
Control Signal  
Control Signal  
R2  
22.1 kΩ  
GND  
EN2  
PowerPAD  
Q1  
Current Limit  
Control Signal  
Figure 5. Typical Characteristics Reference Schematic  
V
OUT1  
5 V/div  
V
OUT1  
5 V/div  
V
OUT2  
5 V/div  
V
OUT2  
5 V/div  
VEN1_bar  
VEN1_bar  
5 V/div  
VEN1_bar = VEN2_bar  
VEN1_bar = VEN2_bar  
5 V/div  
I
I
IN  
2 A/div  
IN  
2 A/div  
t - Time - 2 ms/div  
t - Time - 2 ms/div  
Figure 6. Turn-on Delay and Rise Time  
Figure 7. Turn-off Delay and Fall Time  
V
V
OUT1  
5 V/div  
OUT1  
5 V/div  
V
OUT2  
5 V/div  
V
OUT2  
5 V/div  
FAULT2_bar  
5 V/div  
FAULT2_bar  
5 V/div  
I
I
IN  
2 A/div  
IN  
2 A/div  
t - Time - 20 ms/div  
t - Time - 20 ms/div  
Figure 8. Full-Load to Short-Circuit Transient Response  
Figure 9. Short-Circuit to Full-Load Recovery Response  
Copyright © 2011–2012, Texas Instruments Incorporated  
7
 
TPS2561-Q1  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
www.ti.com  
TYPICAL CHARACTERISTICS (continued)  
2.335  
2.33  
700  
600  
2.325  
500  
400  
300  
200  
100  
UVLO Rising  
2.32  
2.315  
2.31  
V
= 6.5 V  
IN  
2.305  
V
= 2.5 V  
IN  
UVLO Falling  
2.3  
2.295  
2.29  
0
-100  
-50  
0
50  
- Junction Temperature - °C  
100  
150  
-50  
0
50  
100  
150  
T
J
T
J
- Junction Temperature - °C  
Figure 10. UVLO – Undervoltage Lockout – V  
Figure 11. IIN – Supply Current, Output Disabled – nA  
120  
100  
80  
120  
110  
100  
V
= 6.5 V  
V
= 5 V  
IN  
IN  
RILIM = 20kΩ  
TJ = 125°C  
V
= 3.3 V  
V
= 2.5 V  
IN  
IN  
60  
40  
90  
80  
TJ = -40°C  
R
= 20 kΩ  
TJ = 25°C  
ILIM  
20  
0
70  
60  
-50  
0
50  
- Junction Temperature - °C  
100  
150  
2
3
4
5
6
7
T
J
Input Voltage - V  
Figure 12. IIN – Supply Current, Output Enabled – µA  
Figure 13. IIN – Supply Current, Output Enabled – µA  
70  
60  
0.6  
0.5  
0.4  
T
= -40°C  
= 25°C  
A
50  
40  
T
A
T
= 125°C  
0.3  
0.2  
A
30  
20  
10  
0
R
= 100 kW  
ILIM  
0.1  
0
0
50  
100  
150  
200  
-50  
0
50  
100  
150  
V
- V  
- mV/div  
OUT  
IN  
T
- Junction Temperature - °C  
J
Figure 14. MOSFET rDS(on) vs. Junction Temperature  
Figure 15. Switch Current vs. Drain-Source Voltage Across  
Switch  
8
Copyright © 2011–2012, Texas Instruments Incorporated  
TPS2561-Q1  
www.ti.com  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
TYPICAL CHARACTERISTICS (continued)  
3.0  
1.0  
0.9  
0.8  
0.7  
2.5  
TJ = -40°C  
TJ = 25°C  
T
= -40°C  
= 25°C  
2.0  
1.5  
A
0.6  
0.5  
0.4  
0.3  
0.2  
T
A
T
= 125°C  
A
1.0  
0.5  
0
TJ = 125°C  
RILIM = 20kΩ  
R
= 61.9 kW  
ILIM  
0.1  
0
0
0
50  
100  
150  
200  
20  
40  
60  
80  
100  
- mV/div  
120  
140  
160  
V
- V  
OUT  
VIN-VOUT - mV  
IN  
Figure 16. Switch Current vs. Drain-Source Voltage Across  
Switch  
Figure 17. Switch Current vs. Drain-Source Voltage Across  
Switch  
Copyright © 2011–2012, Texas Instruments Incorporated  
9
TPS2561-Q1  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
www.ti.com  
DETAILED DESCRIPTION  
OVERVIEW  
The TPS2561-Q1 is a dual-channel, current-limited power-distribution switch using N-channel MOSFETs for  
applications where short circuits or heavy capacitive loads are encountered. This device allows the user to  
program the current-limit threshold between 250 mA and 2.8 A (typ) per channel through an external resistor.  
This device incorporates an internal charge pump and gate drive circuitry necessary to drive the N-channel  
MOSFETs. The charge pump supplies power to the driver circuit for each channel and provides the necessary  
voltage to pull the gate of the MOSFET above the source. The charge pump operates from input voltages as low  
as 2.5 V and requires little supply current. The driver controls the gate voltage of the power switch. The driver  
incorporates circuitry that controls the rise and fall times of the output voltage to limit large current and voltage  
surges and provides built-in soft-start functionality. Each channel of the TPS2561-Q1 limits the output current to  
the programmed current-limit threshold IOS during an overcurrent or short-circuit event by reducing the charge  
pump voltage driving the N-channel MOSFET and operating it in the linear range of operation. The result of  
limiting the output current to IOS reduces the output voltage at OUTx because the N-channel MOSFET is no  
longer fully enhanced.  
OVERCURRENT CONDITIONS  
The TPS2561-Q1 responds to overcurrent conditions by limiting the output current per channel to IOS. When an  
overcurrent condition is detected, the device maintains a constant output current and reduces the output voltage  
accordingly. Two possible overload conditions can occur.  
The first condition is when a short circuit or partial short circuit is present when the device is powered-up or  
enabled. The output voltage is held near zero potential with respect to ground and the TPS2561-Q1 ramps the  
output current to IOS. The TPS2561-Q1 devices will limit the current to IOS until the overload condition is removed  
or the device begins to thermal cycle.  
The second condition is when a short circuit, partial short circuit, or transient overload occurs while the device is  
enabled and powered on. The device responds to the overcurrent condition within time tIOS (see Figure 3). The  
current-sense amplifier is overdriven during this time and momentarily disables the internal current-limit  
MOSFET. The current-sense amplifier recovers and ramps the output current to IOS. Similar to the previous case,  
the TPS2561-Q1 device limits the current to IOS until the overload condition is removed or the device begins to  
thermal cycle.  
The TPS2561-Q1 thermal cycles if an overload condition is present long enough to activate thermal limiting in  
any of the above cases. The device turns off when the junction temperature exceeds 135°C (min) while in current  
limit. The device remains off until the junction temperature cools 20°C (typ) and then restarts. The TPS2561-Q1  
cycles on and off until the overload is removed (see Figure 9) .  
10  
Copyright © 2011–2012, Texas Instruments Incorporated  
TPS2561-Q1  
www.ti.com  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
FAULTx RESPONSE  
The FAULTx open-drain outputs are asserted (active low) on an individual channel during an overcurrent or  
overtemperature condition. The TPS2561-Q1 asserts the FAULTx signal until the fault condition is removed and  
the device resumes normal operation on that channel. The TPS2561-Q1 is designed to eliminate false FAULTx  
reporting by using an internal delay deglitch circuit (9-ms typ) for overcurrent conditions without the need for  
external circuitry. This ensures that FAULTx is not accidentally asserted due to normal operation such as starting  
into a heavy capacitive load. The deglitch circuitry delays entering and leaving current-limited induced fault  
conditions. The FAULTx signal is not deglitched when the MOSFET is disabled due to an overtemperature  
condition but is deglitched after the device has cooled and begins to turn on. This unidrectional deglitch prevents  
FAULTx oscillation during an overtemperature event.  
UNDERVOLTAGE LOCKOUT (UVLO)  
The undervoltage lockout (UVLO) circuit disables the power switch until the input voltage reaches the UVLO turn-  
on threshold. Built-in hysteresis prevents unwanted on and off cycling due to input voltage droop during turn on.  
ENABLE (ENx OR ENx)  
The logic enables control the power switches and device supply current. The supply current is reduced to less  
than 2-μA when a logic high is present on ENx or when a logic low is present on ENx. A logic low input on ENx  
or a logic high input on ENx enables the driver, control circuits, and power switches. The enable inputs are  
compatible with both TTL and CMOS logic levels.  
THERMAL SENSE  
The TPS2561-Q1 self protects by using two independent thermal sensing circuits that monitor the operating  
temperature of the power switch and disable operation if the temperature exceeds recommended operating  
conditions. Each channel of the TPS2561-Q1 operates in constant-current mode during an overcurrent  
conditions, which increases the voltage drop across the power switch. The power dissipation in the package is  
proportional to the voltage drop across the power switch, which increases the junction temperature during an  
overcurrent condition. The first thermal sensor (OTSD) turns off the individual power switch channel when the die  
temperature exceeds 135°C (min) and the channel is in current limit. Hysteresis is built into the thermal sensor,  
and the switch turns on after the device has cooled approximately 20°C.  
The TPS2561-Q1 also has a second ambient thermal sensor (OTSD2). The ambient thermal sensor turns off  
both power switch channels when the die temperature exceeds 155°C (min) regardless of whether the power  
switch channels are in current limit and will turn on the power switches after the device has cooled approximately  
20°C. The TPS2561-Q1 continues to cycle off and on until the fault is removed.  
Copyright © 2011–2012, Texas Instruments Incorporated  
11  
TPS2561-Q1  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
www.ti.com  
APPLICATION INFORMATION  
INPUT AND OUTPUT CAPACITANCE  
Input and output capacitance improves the performance of the device; the actual capacitance should be  
optimized for the particular application. For all applications, a 0.1-μF or greater ceramic bypass capacitor  
between IN and GND is recommended as close to the device as possible for local noise decoupling. This  
precaution reduces ringing on the input due to power-supply transients. Additional input capacitance may be  
needed on the input to reduce voltage overshoot from exceeding the absolute maximum voltage of the device  
during heavy transient conditions. This is especially important during bench testing when long, inductive cables  
are used to connect the evaluation board to the bench power supply.  
Output capacitance is not required, but placing a high-value electrolytic capacitor on the output pin is  
recommended when large transient currents are expected on the output.  
PROGRAMMING THE CURRENT-LIMIT THRESHOLD  
The overcurrent threshold is user programmable through an external resistor, RILIM. RILIM sets the current-limit  
threshold for both channels. The TPS2561-Q1 use an internal regulation loop to provide a regulated voltage on  
the ILIM pin. The current-limit threshold is proportional to the current sourced out of ILIM. The recommended 1%  
resistor range for RILIM is 20 kΩ ≤ RILIM 187 kto ensure stability of the internal regulation loop. Many  
applications require that the minimum current limit is above a certain current level or that the maximum current  
limit is below a certain current level, so it is important to consider the tolerance of the overcurrent threshold when  
selecting a value for RILIM. The following equations calculates the resulting overcurrent threshold for a given  
external resistor value (RILIM). The traces routing the RILIM resistor to the TPS2561-Q1 should be as short as  
possible to reduce parasitic effects on the current-limit accuracy.  
52850 V  
0.957  
IOSmax (mA) =  
RILIM  
kΩ  
56000 V  
RILIM kΩ  
IOSnom (mA) =  
IOSmin (mA) =  
61200 V  
1.056  
RILIM  
kΩ  
(1)  
3000  
2750  
2500  
2250  
2000  
1750  
1500  
1250  
1000  
750  
IOS(max)  
IOS(typ)  
500  
IOS(min)  
250  
0
20  
30  
40  
50  
60  
70  
80  
90  
100  
110  
RILIM – Current Limit Resistor – kΩ  
120  
130  
140  
150  
Figure 18. Current-Limit Threshold vs. RILIM  
12  
Copyright © 2011–2012, Texas Instruments Incorporated  
 
TPS2561-Q1  
www.ti.com  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
APPLICATION 1: DESIGNING ABOVE A MINIMUM CURRENT LIMIT  
Some applications require that current limiting cannot occur below a certain threshold. For this example, assume  
that 2 A must be delivered to the load so that the minimum desired current-limit threshold is 2000 mA. Use the  
IOS equations and Figure 18 to select RILIM  
IOSmin (mA) = 2000 mA  
.
61200 V  
1.056  
IOSmin (mA) =  
RILIM  
kΩ  
1
1.056  
æ
ö
÷
ø
61200 V  
RILIM (kΩ) =  
ç
I
mA  
è OSmin  
RILIM (kΩ) = 25.52 kΩ  
(2)  
Select the closest 1% resistor less than the calculated value: RILIM = 25.5 k. This sets the minimum current-limit  
threshold at 2 A . Use the IOS equations, Figure 18, and the previously calculated value for RILIM to calculate the  
maximum resulting current-limit threshold.  
RILIM (kΩ) = 25.52 kΩ  
52850 V  
0.957  
IOSmax (mA) =  
RILIM  
kΩ  
52850 V  
25.50.957 kΩ  
IOSmax (mA) =  
IOSmax (mA) = 2382 mA  
(3)  
The resulting maximum current-limit threshold is 2382 mA with a 25.5-kresistor.  
APPLICATION 2: DESIGNING BELOW A MAXIMUM CURRENT LIMIT  
Some applications require that current limiting must occur below a certain threshold. For this example, assume  
that the desired upper current-limit threshold must be below 1000 mA to protect an up-stream power supply. Use  
the IOS equations and Figure 18 to select RILIM  
IOSmax (mA) = 1000 mA  
.
52850 V  
0.957  
IOSmax (mA) =  
RILIM  
kΩ  
1
0.957  
æ
ö
÷
ø
52850 V  
RILIM (kW) =  
ç
I
mA  
è OSmax  
RILIM (kW) = 63.16 kW  
(4)  
Select the closest 1% resistor greater than the calculated value: RILIM = 63.4 k. This sets the maximum current-  
limit threshold at 1000 mA . Use the IOS equations, Figure 18, and the previously calculated value for RILIM to  
calculate the minimum resulting current-limit threshold.  
RILIM (kW) = 63.4 kW  
61200 V  
1.056  
IOSmin (mA) =  
RILIM  
kΩ  
61200 V  
63.41.056 kΩ  
IOSmin (mA) =  
IOSmin (mA) = 765 mA  
(5)  
13  
The resulting minimum current-limit threshold is 765 mA with a 63.4-kresistor.  
Copyright © 2011–2012, Texas Instruments Incorporated  
TPS2561-Q1  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
www.ti.com  
ACCOUNTING FOR RESISTOR TOLERANCE  
The previous sections described the selection of RILIM given certain application requirements and the importance  
of understanding the current-limit threshold tolerance. The analysis focused only on the TPS2561-Q1  
performance and assumed an exact resistor value. However, resistors sold in quantity are not exact and are  
bounded by an upper and lower tolerance centered around a nominal resistance. The additional RILIM resistance  
tolerance directly affects the current-limit threshold accuracy at a system level. The following table shows a  
process that accounts for worst-case resistor tolerance assuming 1% resistor values. Step one follows the  
selection process outlined in the application examples above. Step two determines the upper and lower  
resistance bounds of the selected resistor. Step three uses the upper and lower resistor bounds in the IOS  
equations to calculate the threshold limits. It is important to use tighter tolerance resistors, for example, 0.5% or  
0.1%, when precision current limiting is desired.  
Table 1. Common RILIM Resistor Selections  
Resistor Tolerance  
Actual Limits  
Desired Nominal  
Current Limit (mA)  
Ideal Resistor Closest 1%  
IOS Nom  
(mA)  
IOS MAX  
(mA)  
(k)  
Resistor (k)  
1% low (k) 1% high (k) IOS MIN (mA)  
300  
400  
186.7  
140  
93.3  
70  
187  
140  
93.1  
69.8  
56.2  
46.4  
40.2  
34.8  
30.9  
28  
185.1  
138.6  
92.2  
69.1  
55.6  
45.9  
39.8  
34.5  
30.6  
27.7  
25.2  
23  
188.9  
141.4  
94  
241.6  
328  
299.5  
400  
357.3  
471.4  
600  
504.6  
684  
601.5  
802.3  
996.4  
1206.9  
1393  
696.5  
800  
70.5  
56.8  
46.9  
40.6  
35.1  
31.2  
28.3  
25.8  
23.4  
21.7  
20.2  
917.6  
1000  
1200  
1400  
1600  
1800  
2000  
2200  
2400  
2600  
2800  
56  
859.9  
1052.8  
1225  
1129.1  
1356.3  
1555.9  
1786.2  
2001.4  
2199.3  
2405.3  
2633  
46.7  
40  
35  
1426.5  
1617.3  
1794.7  
1981  
1609.2  
1812.3  
2000  
31.1  
28  
25.5  
23.3  
21.5  
20  
25.5  
23.2  
21.5  
20  
2196.1  
2413.8  
2604.7  
2800  
2188.9  
2372.1  
2560.4  
21.3  
19.8  
2831.9  
3034.8  
14  
Copyright © 2011–2012, Texas Instruments Incorporated  
TPS2561-Q1  
www.ti.com  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
POWER DISSIPATION AND JUNCTION TEMPERATURE  
The low on-resistance of the N-channel MOSFET allows small surface-mount packages to pass large currents. It  
is good design practice to estimate power dissipation and junction temperature. The below analysis gives an  
approximation for calculating junction temperature based on the power dissipation in the package. However, it is  
important to note that thermal analysis is strongly dependent on additional system level factors. Such factors  
include air flow, board layout, copper thickness and surface area, and proximity to other devices dissipating  
power. Good thermal design practice must include all system level factors in addition to individual component  
analysis.  
Begin by determining the rDS(on) of the N-channel MOSFET relative to the input voltage and operating  
temperature. As an initial estimate, use the highest operating ambient temperature of interest and read rDS(on)  
from the typical characteristics graph. Using this value, the power dissipation can be calculated by:  
2
PD = (RDS(on) ´ IOUT12 ) + (RDS(on) ´ IOUT2  
)
Where:  
PD = Total power dissipation (W)  
rDS(on) = Power switch on-resistance of one channel ()  
IOUTx = Maximum current-limit threshold set by RILIM(A)  
This step calculates the total power dissipation of the N-channel MOSFET.  
Finally, calculate the junction temperature:  
TJ = PD ´ θJA + TA  
Where:  
TA = Ambient temperature (°C)  
θJA = Thermal resistance (°C/W)  
PD = Total power dissipation (W)  
Compare the calculated junction temperature with the initial estimate. If they are not within a few degrees, repeat  
the calculation using the refined rDS(on) from the previous calculation as the new estimate. Two or three iterations  
are generally sufficient to achieve the desired result. The final junction temperature is highly dependent on  
thermal resistance θJA, and thermal resistance is highly dependent on the individual package and board layout.  
The Dissipating Rating Table provides example thermal resistances for specific packages and board layouts.  
Copyright © 2011–2012, Texas Instruments Incorporated  
15  
TPS2561-Q1  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
www.ti.com  
AUTO-RETRY FUNCTIONALITY  
Some applications require that an overcurrent condition disables the part momentarily during a fault condition  
and re-enables after a pre-set time. This auto-retry functionality can be implemented with an external resistor and  
capacitor. During a fault condition, FAULTx pulls ENx low disabling the part. The part is disabled when ENx is  
pulled below the turn-off threshold, and FAULTx goes high impedance allowing CRETRY to begin charging. The  
part re-enables when the voltage on ENx reaches the turn-on threshold, and the auto-retry time is determined by  
the resistor/capacitor time constant. The part will continue to cycle in this manner until the fault condition is  
removed.  
TPS2561-Q1  
Input  
0.1 μF  
VOUT1  
VOUT2  
OUT1  
OUT2  
IN  
RFAULT  
2x 100 kΩ  
2x CLOAD  
ILIM  
RILIM  
20 kΩ  
FAULT1  
EN1  
GND  
FAULT2  
EN2  
CRETRY  
2x 0.22 µF  
PowerPAD  
Figure 19. Auto-Retry Functionality  
Some applications require auto-retry functionality and the ability to enable or disable with an external logic signal.  
The figure below shows how an external logic signal can drive EN through RFAULT and maintain auto-retry  
functionality. The resistor/capacitor time constant determines the auto-retry time-out period.  
TPS2561-Q1  
Input  
0.1 μF  
OUT1  
OUT2  
VOUT1  
VOUT2  
IN  
External Logic  
Signal & Drivers  
2x CLOAD  
RFAULT  
2x 100 kΩ  
ILIM  
RILIM  
20 kΩ  
FAULT1  
EN1  
GND  
FAULT2  
EN2  
CRETRY  
2x 0.22 µF  
PowerPAD  
Figure 20. Auto-Retry Functionality With External EN Signal  
16  
Copyright © 2011–2012, Texas Instruments Incorporated  
TPS2561-Q1  
www.ti.com  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
TWO-LEVEL CURRENT-LIMIT CIRCUIT  
Some applications require different current-limit thresholds depending on external system conditions. Figure 21  
shows an implementation for an externally controlled, two-level current-limit circuit. The current-limit threshold is  
set by the total resistance from ILIM to GND (see previously discussed Programming the Current-Limit Threshold  
section). A logic-level input enables or disables MOSFET Q1 and changes the current-limit threshold by  
modifying the total resistance from ILIM to GND. Additional MOSFET and resistor combinations can be used in  
parallel to Q1 and R2 to increase the number of additional current-limit levels.  
NOTE  
ILIM should never be driven directly with an external signal.  
TPS2561-Q1  
VIN = 5 V  
0.1 µF  
VOUT1  
IN  
IN  
OUT1  
OUT2  
2x RFAULT  
100 kΩ  
VOUT2  
24.9 kΩ  
2x 150 µF  
ILIM  
FAULT 1  
FAULT 2  
EN1  
Faultx Signals  
Control Signals  
GND  
EN2  
PowerPAD  
Figure 21. Two-Level Current-Limit Circuit  
Copyright © 2011–2012, Texas Instruments Incorporated  
17  
 
TPS2561-Q1  
SLVSB51A DECEMBER 2011REVISED AUGUST 2012  
www.ti.com  
REVISION HISTORY  
Changes from Original (December 2011) to Revision A  
Page  
Changed the revision to A, August 2012 and aligned FEATURES and DESCRIPTION to top aligned .............................. 1  
Changed part number from TPS2561 to TPS2561-Q1 in all images where part number appears. ..................................... 2  
Changed the First 2 rows of TYP and MAX columns of the ELEC CHAR table from 110 / 290 to 44 / 50, second row  
320 / 79 and added cross reference to second column 'Not producton tested.' .................................................................. 3  
18  
Copyright © 2011–2012, Texas Instruments Incorporated  
PACKAGE OPTION ADDENDUM  
www.ti.com  
3-Aug-2012  
PACKAGING INFORMATION  
Status (1)  
Eco Plan (2)  
MSL Peak Temp (3)  
Samples  
Orderable Device  
Package Type Package  
Drawing  
Pins  
Package Qty  
Lead/  
Ball Finish  
(Requires Login)  
TPS2561QDRCRQ1  
ACTIVE  
SON  
DRC  
10  
3000  
Green (RoHS  
& no Sb/Br)  
CU NIPDAU Level-3-260C-168 HR  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
OTHER QUALIFIED VERSIONS OF TPS2561-Q1 :  
Catalog: TPS2561  
NOTE: Qualified Version Definitions:  
Catalog - TI's standard catalog product  
Addendum-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
3-Aug-2012  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
TPS2561QDRCRQ1  
SON  
DRC  
10  
3000  
330.0  
12.4  
3.3  
3.3  
1.1  
8.0  
12.0  
Q2  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
3-Aug-2012  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SON DRC 10  
SPQ  
Length (mm) Width (mm) Height (mm)  
367.0 367.0 35.0  
TPS2561QDRCRQ1  
3000  
Pack Materials-Page 2  
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