TLV2543INE4 [TI]

12-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS; 12位模拟数字转换器带串行控制和11个模拟输入
TLV2543INE4
型号: TLV2543INE4
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

12-BIT ANALOG-TO-DIGITAL CONVERTERS WITH SERIAL CONTROL AND 11 ANALOG INPUTS
12位模拟数字转换器带串行控制和11个模拟输入

转换器 输入元件
文件: 总28页 (文件大小:536K)
中文:  中文翻译
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TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
12-Bit-Resolution A/D Converter  
DB, DW, OR N PACKAGE  
(TOP VIEW)  
10-µs Conversion Time Over Operating  
Temperature Range  
11 Analog Input Channels  
AIN0  
AIN1  
AIN2  
AIN3  
AIN4  
AIN5  
AIN6  
AIN7  
AIN8  
GND  
V
CC  
EOC  
1
2
3
4
5
6
7
8
9
10  
20  
19  
18  
17  
16  
15  
3 Built-In Self-Test Modes  
I/O CLOCK  
DATA INPUT  
DATA OUT  
CS  
Inherent Sample and Hold Function  
Linearity Error . . . ±1 LSB Max  
On-Chip System Clock  
End-of-Conversion (EOC) Output  
14 REF+  
13  
12  
11  
REF–  
AIN10  
AIN9  
Unipolar or Bipolar Output Operation  
(Signed Binary With Respect to Half of the  
Applied Referenced Voltage)  
Programmable MSB or LSB First  
Programmable Power Down  
Programmable Output Data Length  
CMOS Technology  
description  
The TLV2543C and TLV2543I are 12-bit, switched-capacitor, successive-approximation, analog-to-digital  
converters (ADCs). Each device has three control inputs [chip select (CS), the input-output clock (I/O CLOCK),  
and the address input (DATA INPUT)] and is designed for communication with the serial port of a host processor  
or peripheral through a serial 3-state output. The device allows high-speed data transfers from the host.  
In addition to the high-speed converter and versatile control capability, the device has an on-chip 14-channel  
multiplexer that can select any one of 11 inputs or any one of three internal self-test voltages. The  
sample-and-hold function is automatic. At the end of conversion, the end-of-conversion (EOC) output goes high  
to indicate that conversion is complete. The converter incorporated in the device features differential  
high-impedance reference inputs that facilitate ratiometric conversion, scaling, and isolation of analog circuitry  
from logic and supply noise. A switched-capacitor design allows low-error conversion over the full operating  
temperature range.  
The TLV2543 is available in the DW, DB, and N packages. The TLV2543C is characterized for operation from  
0°C to 70°C, and the TLV2543I is characterized for operation from 40°C to 85°C.  
AVAILABLE OPTIONS  
PACKAGE  
SMALL OUTLINE  
PLASTIC DIP  
N
T
A
DB  
DW  
0°C to 70°C  
TLV2543CDW  
TLV2543IDW  
TLV2543CDB  
TLV2543IDB  
TLV2543CN  
TLV2543IN  
40°C to 85°C  
Available in tape and reel and ordered as the TLV2543CDWR, TLV2543CDBLE, TLV2543IDBR, or  
TLV2543IDWR.  
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of  
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.  
Copyright 2000, Texas Instruments Incorporated  
PRODUCTION DATA information is current as of publication date.  
Products conform to specifications per the terms of Texas Instruments  
standard warranty. Production processing does not necessarily include  
testing of all parameters.  
1
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
functional block diagram  
REF+  
14  
REF–  
13  
12-Bit  
Analog-to-Digital  
Converter  
1
2
3
4
5
6
7
8
AIN0  
AIN1  
AIN2  
AIN3  
AIN4  
AIN5  
AIN6  
AIN7  
AIN8  
AIN9  
AIN10  
Sample and  
Hold  
(switched capacitors)  
14-Channel  
Analog  
Multiplexer  
12  
12  
Output  
Data  
Register  
12-to-1 Data  
Selector and  
Driver  
9
11  
12  
16  
DATA  
OUT  
4
Input Address  
Register  
4
3
Control Logic  
and I/O  
Counters  
Self-Test  
Reference  
19  
EOC  
17  
DATA  
INPUT  
18  
15  
I/O CLOCK  
CS  
2
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
Terminal Functions  
TERMINAL  
NAME  
I/O  
DESCRIPTION  
NO.  
AIN0 – AIN10  
1–9,  
11, 12  
I
Analog input. These 11 analog-signal inputs are internally multiplexed. The driving source impedance should  
be less than or equal to 50 for 4.1-MHz I/O CLOCK operation and capable of slewing the analog input  
voltage into a capacitance of 60 pF.  
CS  
15  
17  
16  
I
I
Chip select. A high-to-low transition on CS resets the internal counters and controls and enables DATA OUT,  
DATA INPUT, and I/O CLOCK. A low-to-high transition disables DATA INPUT and I/O CLOCK within a setup  
time.  
DATA INPUT  
DATA OUT  
Serial-data input. A 4-bit serial address selects the desired analog input or test voltage to be converted. The  
serial data is presented with the MSB first and is shifted in on the first four rising edges of I/O CLOCK. After  
the four address bits are read into the address register, I/O CLOCK clocks the remaining bits in order.  
O
Serial data output. This is the 3-state serial output for the A/D conversion result. DATA OUT is in the  
high-impedance state when CS is high and active when CS is low. With a valid CS, DATA OUT is removed  
from the high-impedance state and is driven to the logic level corresponding to the MSB/LSB value of the  
previous conversion result. The next falling edge of I/O CLOCK drives DATA OUT to the logic level  
corresponding to the next MSB/LSB, and the remaining bits are shifted out in order.  
EOC  
19  
10  
18  
O
I
End of conversion. EOC goes from a high to a low logic level after the falling edge of the last I/O CLOCK and  
remains low until the conversion is complete and data are ready for transfer.  
GND  
Ground. This is the ground return terminal for the internal circuitry. Unless otherwise noted, all voltage  
measurements are with respect to GND.  
I/O CLOCK  
Input/output clock. I/O CLOCK receives the serial input and performs the following four functions:  
1. It clocks the eight input data bits into the input data register on the first eight rising edges of I/O CLOCK  
with the multiplexer address available after the fourth rising edge.  
2. On the fourth falling edge of I/O CLOCK, the analog input voltage on the selected multiplexer input  
begins charging the capacitor array and continues to do so until the last falling edge of I/O  
CLOCK.  
3. It shifts the 11 remaining bits of the previous conversion data out on DATA OUT. Data changes on  
the falling edge of I/O CLOCK.  
4. It transfers control of the conversion to the internal state controller on the falling edge of the last  
I/O CLOCK.  
REF+  
REF–  
14  
I
I
Reference+. The upper reference voltage value (nominally V ) is applied to REF+. The maximum input  
CC  
voltage range is determined by the difference between the voltage applied to this terminal and the voltage  
applied to the REFterminal.  
13  
20  
Reference. The lower reference voltage value (nominally ground) is applied to REF.  
Positive supply voltage.  
V
CC  
detailed description  
Initially, with chip select (CS) high, I/O CLOCK and DATA INPUT are disabled and DATA OUT is in the  
high-impedance state. CS, going low, begins the conversion sequence by enabling I/O CLOCK and DATA  
INPUT and removes DATA OUT from the high-impedance state.  
The input data is an 8-bit data stream consisting of a 4-bit analog channel address (D7D4), a 2-bit data length  
select (D3D2), an output MSB or LSB first bit (D1), and a unipolar or bipolar output select bit (D0) that are  
applied to DATA INPUT. The I/O CLOCK sequence applied to the I/O CLOCK terminal transfers this data to the  
input data register.  
During this transfer, the I/O CLOCK sequence also shifts the previous conversion result from the output data  
register to DATA OUT. I/O CLOCK receives the input sequence of 8, 12, or 16 clocks long depending on the  
data-length selection in the input data register. Sampling of the analog input begins on the fourth falling edge  
of the input I/O CLOCK sequence and is held after the last falling edge of the I/O CLOCK sequence. The last  
falling edge of the I/O CLOCK sequence also takes EOC low and begins the conversion.  
3
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
converter operation  
The operation of the converter is organized as a succession of two distinct cycles: 1) the I/O cycle, and 2) the  
actual conversion cycle. The I/O cycle is defined by the externally provided I/O CLOCK and lasts 8, 12, or 16  
clock periods depending on the selected output data length.  
1. I/O cycle  
During the I/O cycle, two operations take place simultaneously.  
a. An8-bitdatastreamconsistingofaddressandcontrolinformationisprovidedtoDATAINPUT. Thisdata  
is shifted into the device on the rising edge of the first eight I/O CLOCKs. DATA INPUT is ignored after  
the first eight clocks during 12- or 16-clock I/O transfers.  
b. The data output with a length of 8, 12, or 16 bits is provided serially on DATA OUT. When CS is held low,  
thefirstoutputdatabitoccursontherisingedgeofEOC. WhenCSisnegatedbetweenconversions, the  
first output data bit occurs on the falling edge of CS. This data is the result of the previous conversion  
period, and after the first output data bit each succeeding bit is clocked out on the falling edge of each  
succeeding I/O CLOCK.  
2. Conversion cycle  
The conversion cycle is transparent to the user, and it is controlled by an internal clock synchronized to the  
I/O CLOCK. During the conversion period, the device performs a successive-approximation conversion on  
the analog input voltage. The EOC output goes low at the start of the conversion cycle and goes high when  
conversioniscompleteandtheoutputdataregisterislatched. AconversioncycleisstartedonlyaftertheI/O  
cycle is completed, which minimizes the influence of external digital noise on the accuracy of the  
conversion.  
power up and initialization  
After power up, CS must be taken from high to low to begin an I/O cycle. EOC is initially high, and the input data  
register is set to all zeros. The contents of the output data register are random, and the first conversion result  
should be ignored. To initialize during operation, CS is taken high and returned low to begin the next I/O cycle.  
The first conversion after the device has returned from the power-down state may not read accurately due to  
internal device settling.  
operational terminology  
Previous (N1) conversion cycle The conversion cycle prior to the current I/O cycle.  
Current (N) I/O cycle  
The entire I/O CLOCK sequence that transfers address and control data into the data register and clocks  
the digital result from the previous conversion cycle from DATA OUT. The last falling edge of the clock in  
the I/O CLOCK sequence signifies the end of the current I/O cycle.  
Current (N) conversion cycle  
Immediately after the current I/O cycle, the current conversion cycle starts. When the current conversion  
cycle is complete, the current conversion result is loaded into the output register.  
Current (N) conversion result  
Next (N+1) I/O cycle  
The result of the current conversion cycle that is serially shifted out during the next I/O cycle.  
The I/O cycle after the current conversion cycle.  
Example: Inthe12-bitmode, theresultofthecurrentconversioncycleisa12-bitserial-datastreamclockedoutduring  
the next I/O cycle. The current I/O cycle must be exactly 12 bits long to maintain synchronization, even  
when this corrupts the output data from the previous conversion. The current conversion begins  
immediately after the twelfth falling edge of the current I/O cycle.  
data input  
The data input is internally connected to an 8-bit serial-input address and control register. The register defines  
the operation of the converter and the output data length. The host provides the data word with the MSB first.  
Each data bit is clocked in on the rising edge of the I/O CLOCK sequence (see Table 1 for the data register  
format).  
4
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
data input (continued)  
Table 1. Input-Register Format  
INPUT DATA BYTE  
ADDRESS BITS  
L1  
D3  
L0  
D2  
LSBF  
D1  
BIP  
FUNCTION SELECT  
D7  
D6  
D5  
D4  
D0  
(MSB)  
(LSB)  
Select input channel  
AIN0  
AIN1  
AIN2  
AIN3  
AIN4  
AIN5  
AIN6  
AIN7  
AIN8  
AIN9  
AIN10  
0
0
0
0
0
0
0
0
1
1
1
0
0
0
0
1
1
1
1
0
0
0
0
0
1
1
0
0
1
1
0
0
1
0
1
0
1
0
1
0
1
0
1
0
Select test voltage  
(V  
ref+  
– V )/2  
ref–  
1
1
1
0
1
1
1
0
0
1
0
1
V
ref–  
V
ref+  
Software power down  
1
1
1
0
Output data length  
8 bits  
0
X
1
1
0
1
12 bits  
16 bits  
Output data format  
MSB first  
0
1
LSB first  
Unipolar (binary)  
0
1
Bipolar (BIP, 2s complement)  
data input address bits  
The four MSBs (D7 – D4) of the data register address one of the 11 input channels, a reference-test voltage,  
or the power-down mode. The address bits affect the current conversion, which is the conversion that  
immediately follows the current I/O cycle. The reference voltage is nominally equal to V  
– V  
.
ref+  
ref–  
data output length  
The next two bits (D3 and D2) of the data register select the output data length. The data-length selection is  
valid for the current I/O cycle (the cycle in which the data is read). The data-length selection, which is valid for  
the current I/O cycle, allows device start-up without losing I/O synchronization. A data length of 8, 12, or 16 bits  
can be selected. Since the converter has 12-bit resolution, a data length of 12 bits is suggested.  
With D3 and D2 set to 00 or 10, the device is in the 12-bit data-length mode and the result of the current  
conversion is output as a 12-bit serial-data stream during the next I/O cycle. The current I/O cycle must be  
exactly12bitslongforpropersynchronization, evenwhenthismeanscorruptingtheoutputdatafromaprevious  
conversion. The current conversion is started immediately after the twelfth falling edge of the current I/O cycle.  
With bits D3 and D2 set to 11, the 16-bit data-length mode is selected, which allows convenient communication  
with 16-bit serial interfaces. In the 16-bit mode, the result of the current conversion is output as a 16-bit  
serial-data stream during the next I/O cycle with the four LSBs always set to 0 (pad bits). The current I/O cycle  
must be exactly 16 bits long to maintain synchronization even when this means corrupting the output data from  
the previous conversion. The current conversion is started immediately after the sixteenth falling edge of the  
current I/O cycle.  
5
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
data output length (continued)  
With bits D3 and D2 set to 01, the 8-bit data-length mode is selected, which allows fast communication with 8-bit  
serial interfaces. In the 8-bit mode, the result of the current conversion is output as an 8-bit serial-data stream  
during the next I/O cycle. The current I/O cycle must be exactly 8 bits long to maintain synchronization, even  
when this means corrupting the output data from the previous conversion. The four LSBs of the conversion  
result are truncated and discarded. The current conversion is immediately started after the eighth falling edge  
of the current I/O cycle.  
Since D3 and D2 take effect on the current I/O cycle when the data length is programmed, there can be a conflict  
with the previous cycle when the data-word length is changed from one cycle to the next. This may occur when  
the data format is selected to be least significant bit first, since at the time the data length change becomes  
effective (six rising edges of I/O CLOCK), the previous conversion result has already started shifting out.  
Inactualoperation, whendifferentdatalengthsarerequiredwithinanapplicationandthedatalengthischanged  
between two conversions, no more than one conversion result can be corrupted and only when it is shifted out  
in LSB first format.  
sampling period  
During the sampling period, one of the analog inputs is internally connected to the capacitor array of the  
converter to store the analog input signal. The converter starts sampling the selected input immediately after  
the four address bits have been clocked into the input data register. Sampling starts on the fourth falling edge  
of I/O CLOCK. The converter remains in the sampling mode until the eighth, twelfth, or sixteenth falling edge  
of the I/O CLOCK depending on the data-length selection. After the EOC delay time from the last I/O CLOCK  
falling edge, the EOC output goes low indicating that the sampling period is over and the conversion period has  
begun. After EOC goes low, the analog input can be changed without affecting the conversion result. Since the  
delay from the falling edge of the last I/O CLOCK to EOC low is fixed, time-varying analog input signals can be  
digitized at a fixed rate without introducing systematic harmonic distortion or noise due to timing uncertainty.  
After the 8-bit data stream has been clocked in, DATA INPUT should be held at a fixed digital level until EOC  
goes high (indicating that the conversion is complete) to maximize the sampling accuracy and minimize the  
influence of external digital noise.  
data register, LSB first  
D1 in the input data register (LSB first) controls the direction of the output binary data transfer. When D1 is set  
to 0, the conversion result shifts out MSB first. When set to 1, the data shifts out LSB first. Selection of MSB  
first or LSB first always affects the next I/O cycle and not the current I/O cycle. When changing from one data  
direction to another, the current I/O cycle is never disrupted.  
data register, bipolar format  
D0 in the input data register controls the binary data format used to represent the conversion result. When D0  
is set to 0, the conversion result is represented as unipolar (unsigned binary) data. Nominally, the conversion  
result of an input voltage equal to V  
is a code of all zeros (000 . . . 0), the conversion result of an input voltage  
ref–  
equal to V  
is a code of all ones (111 . . . 1), and the conversion result of (V  
+ V  
)/2 is a code of a one  
ref+  
ref +  
ref–  
followed by zeros (100 . . . 0).  
When D0 is set to 1, the conversion result is represented as bipolar data (signed binary). Nominally, conversion  
of an input voltage equal to V is a code of a 1 followed by zeros (100 . . . 0), conversion of an input voltage  
ref–  
equal to V  
is a code of a 0 followed by all ones (011 . . . 1), and the conversion of (V  
+ V  
)/2 is a code  
ref+  
ref+  
ref–  
of all zeros (000 . . . 0). The MSB is interpreted as the sign bit. The bipolar data format is related to the unipolar  
format in that the MSBs are always each other’s complement.  
Selection of the unipolar or bipolar format always affects the current conversion cycle, and the result is output  
during the next I/O cycle. When changing between unipolar and bipolar formats, the data output during the  
current I/O cycle is not affected.  
6
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
EOC output  
TheEOCsignalindicatesthebeginningandtheendofconversion. Intheresetstate, EOCisalwayshigh. During  
the sampling period (beginning after the fourth falling edge of the I/O CLOCK sequence), EOC remains high  
until the internal sampling switch of the converter is safely opened. The opening of the sampling switch occurs  
after the eighth, twelfth, or sixteenth I/O CLOCK falling edge, depending on the data-length selection in the input  
data register. After the EOC signal goes low, the analog input signal can be changed without affecting the  
conversion result.  
The EOC signal goes high again after the conversion completes and the conversion result is latched into the  
output data register. The rising edge of EOC returns the converter to a reset state and a new I/O cycle begins.  
On the rising edge of EOC, the first bit of the current conversion result is on DATA OUT when CS is low. When  
CS is negated between conversions, the first bit of the current conversion result occurs at DATA OUT on the  
falling edge of CS.  
data format and pad bits  
D3 and D2 of the input data register determine the number of significant bits in the digital output that represent  
the conversion result. The LSB-first bit determines the direction of the data transfer while the BIP bit determines  
the arithmetic conversion. The numerical data is always justified toward the MSB in any output format.  
The internal conversion result is always 12 bits long. When an 8-bit data transfer is selected, the four LSBs of  
the internal result are discarded to provide a faster one-byte transfer. When a 12-bit transfer is used, all bits are  
transferred. When a 16-bit transfer is used, four LSB pad bits are always appended to the internal conversion  
result. In the LSB-first mode, four leading zeros are output. In the MSB-first mode, the last four bits output are  
zeros.  
When CS is held low continuously, the first data bit of the just completed conversion occurs on DATA OUT on  
the rising edge of EOC. When a new conversion is started after the last falling edge of I/O CLOCK, EOC goes  
low and the serial output is forced to a logic zero until EOC goes high again.  
When CS is negated between conversions, the first data bit occurs on DATA OUT on the falling edge of CS.  
On each subsequent falling edge of I/O CLOCK after the first data bit appears, the data is changed to the next  
bit in the serial conversion result until the required number of bits has been output.  
chip-select input (CS)  
The chip-select input (CS) enables and disables the device. During normal operation, CS should be low.  
Although the use of CS is not necessary to synchronize a data transfer, it can be brought high between  
conversions to coordinate the data transfer of several devices sharing the same bus.  
When CS is brought high, the serial-data output is immediately brought to the high-impedance state, releasing  
its output data line to other devices that may share it. After an internally generated debounce time, the I/O  
CLOCK is inhibited, thus preventing any further change in the internal state.  
When CS is subsequently brought low again, the device is reset. CS must be held low for an internal debounce  
time before the reset operation takes effect. After CS is debounced low, I/O CLOCK must remain inactive (low)  
for a minimum time before a new I/O cycle can start.  
CS can be used to interrupt any ongoing data transfer or any ongoing conversion. When CS is debounced low  
long enough before the end of the current conversion cycle, the previous conversion result is saved in the  
internal output buffer and then shifted out during the next I/O cycle.  
7
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
power-down features  
When a binary address of 1110 is clocked into the input data register during the first four I/O CLOCK cycles,  
the power-down mode is selected. Power down is activated on the falling edge of the fourth I/O CLOCK pulse.  
During power down, all internal circuitry is put in a low-current standby mode. No conversions are performed,  
and the internal output buffer keeps the previous conversion cycle data results, provided that all digital inputs  
are held above V  
– 0.3 V or below 0.3 V. The I/O logic remains active so the current I/O cycle must be  
CC  
completed even when the power-down mode is selected. Upon power-on reset and before the first I/O cycle,  
the converter normally begins in the power-down mode. The device remains in the power-down mode until a  
valid (other than 1110) input address clocks in. Upon completion of that I/O cycle, a normal conversion is  
performed with the results being shifted out during the next I/O cycle.  
analog input, test, and power-down mode  
The 11 analog inputs, three internal voltages, and power-down mode are selected by the input multiplexer  
according to the input addresses shown in Tables 2, 3, and 4. The input multiplexer is a break-before-make type  
to reduce input-to-input noise rejection resulting from channel switching. Sampling of the analog input starts on  
the falling edge of the fourth I/O CLOCK and continues for the remaining I/O CLOCK pulses. The sample is held  
on the falling edge of the last I/O CLOCK pulse. The three internal test inputs are applied to the multiplexer,  
sampled, and converted in the same manner as the external analog inputs. The first conversion after the device  
has returned from the power-down state may not read accurately due to internal device settling.  
Table 2. Analog-Channel-Select Address  
VALUE SHIFTED INTO  
ANALOG INPUT  
DATA INPUT  
SELECTED  
BINARY  
0000  
0001  
0010  
0011  
0100  
0101  
0110  
0111  
HEX  
0
AIN0  
AIN1  
AIN2  
AIN3  
AIN4  
AIN5  
AIN6  
AIN7  
AIN8  
AIN9  
AIN10  
1
2
3
4
5
6
7
1000  
1001  
1010  
8
9
A
Table 3. Test-Mode-Select Address  
INTERNAL  
SELF-TEST  
VOLTAGE  
VALUE SHIFTED INTO  
UNIPOLAR OUTPUT  
RESULT (HEX)  
DATA INPUT  
BINARY HEX  
SELECTED  
V
ref+  
– V  
2
ref–  
1011  
B
200  
V
1100  
1101  
C
D
000  
3FF  
ref–  
V
ref+  
V
is the voltage applied to REF+, and V  
is the voltage applied to REF.  
ref+  
ref–  
The output results shown are the ideal values and may vary with the reference stability  
and with internal offsets.  
8
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
analog input, test, and power-down mode (continued)  
Table 4. Power-Down-Select Address  
VALUE SHIFTED INTO  
DATA INPUT  
INPUT COMMAND  
RESULT  
BINARY  
HEX  
Power down  
1110  
E
I
25 µA  
CC  
converter and analog input  
The CMOS threshold detector in the successive-approximation conversion system determines each bit by  
examining the charge on a series of binary-weighted capacitors (see Figure 1). In the first phase of the  
conversion process, the analog input is sampled by closing the S switch and all S switches simultaneously.  
C
T
This action charges all the capacitors to the input voltage.  
In the next phase of the conversion process, all S and S switches are opened and the threshold detector  
T
C
begins identifying bits by identifying the charge (voltage) on each capacitor relative to the reference (REF)  
voltage. In the switching sequence, 12 capacitors are examined separately until all 12 bits are identified and  
the charge-convert sequence is repeated. In the first step of the conversion phase, the threshold detector looks  
at the first capacitor (weight = 4096). Node 4096 of this capacitor is switched to the REF+ voltage, and the  
equivalent nodes of all the other capacitors on the ladder are switched to REF. When the voltage at the  
summing node is greater than the trip point of the threshold detector (approximately one-half V ), a bit 0 is  
CC  
placed in the output register and the 4096-weight capacitor is switched to REF. When the voltage at the  
summing node is less than the trip point of the threshold detector, a bit 1 is placed in the register and the  
4096-weight capacitor remains connected to REF+ through the remainder of the successive-approximation  
process. The process is repeated for the 2048-weight capacitor, the 1024-weight capacitor, and so forth down  
the line until all bits are determined. With each step of the successive-approximation process, the initial charge  
is redistributed among the capacitors. The conversion process relies on charge redistribution to determine the  
bits from MSB to LSB.  
S
C
Threshold  
Detector  
To Output  
Latches  
4096  
Node 4096  
2048  
1024  
16  
8
4
2
1
1
REF+  
REF+  
REF+  
REF+  
REF+  
REF+  
REF+  
REF–  
REF–  
REF–  
REF–  
REF–  
REF–  
REF–  
REF–  
REF–  
T
S
S
S
S
S
S
S
S
S
T
T
T
T
T
T
T
T
V
I
Figure 1. Simplified Model of the Successive-Approximation System  
9
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
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12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
reference voltage inputs  
There are two reference voltage inputs on the device, REF+ and REF. The voltage values on these terminals  
establish the upper and lower limits of the analog input to produce a full-scale and zero-scale reading  
respectively. These voltages and the analog input should not exceed the positive supply or be lower than ground  
consistent with the specified absolute maximum ratings. The digital output is at full scale when the input signal  
is equal to or higher than REF+ terminal voltage and at zero when the input signal is equal to or lower than REF–  
terminal voltage.  
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)  
Supply voltage range, V  
(see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.5 V to 6.5 V  
CC  
Input voltage range, V (any input) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to V  
+ 0.3 V  
+ 0.3 V  
+ 0.1 V  
I
CC  
CC  
CC  
Output voltage range, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.3 V to V  
O
Positive reference voltage, V  
Negative reference voltage, V  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . V  
ref+  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.1 V  
ref–  
Peak input current, I (any input) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±20 mA  
I
Peak total input current (all inputs) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . ±30 mA  
Operating free-air temperature range, T : TLV2543C . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0°C to 70°C  
A
TLV2543I . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40°C to 85°C  
Storage temperature range, T  
Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260°C  
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65°C to 150°C  
stg  
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and  
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not  
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
NOTE 1: All voltage values are with respect to the GND terminal with REFand GND wired together (unless otherwise noted).  
10  
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WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
recommended operating conditions  
MIN NOM  
MAX  
UNIT  
V
Supply voltage, V  
CC  
3
3.3  
3.6  
Positive reference voltage, V  
ref+  
(see Note 2)  
(see Note 2)  
– V (see Note 2)  
V
V
V
CC  
0
Negative reference voltage, V  
ref–  
V
Differential reference voltage, V  
ref+  
2.5  
0
V +0.1  
CC  
V
ref–  
CC  
Analog input voltage (see Note 2)  
High-level control input voltage, V  
V
CC  
V
V
V
= 3 V to 3.6 V  
= 3 V to 3.6 V  
2.1  
V
IH  
CC  
Low-level control input voltage, V  
Clock frequency at I/O CLOCK  
0.6  
4.1  
V
IL  
CC  
0
100  
0
3
MHz  
ns  
ns  
ns  
µs  
ns  
ns  
µs  
µs  
Setup time, address bits at DATA INPUT before I/O CLOCK, t  
(see Figure 5)  
su(A)  
(see Figure 5)  
Hold time, address bits at DATA INPUT after I/O CLOCK, t  
h(A)  
(see Figure 6)  
Hold time, CS low after last I/O CLOCK, t  
h(CS)  
Setup time, CS low before clocking in first address bit, t  
0
(see Note 3 and Figure 6)  
1.425  
190  
190  
su(CS)  
Pulse duration, I/O CLOCK high, t  
wH(I/O)  
Pulse duration, I/O CLOCK low, t  
wL(I/O)  
Transition time, I/O CLOCK, t  
t(I/O)  
Transition time, DATA INPUT and CS, t  
(see Note 4 and Figure 7)  
t(CS)  
1
10  
70  
85  
TLV2543C  
TLV2543I  
0
Operating free-air temperature, T  
°C  
A
40  
NOTES: 2. Analog input voltages greater than the voltage applied to REF+ convert as all ones (111111111111), while input voltages less than  
the voltage applied to REF– convert as all zeros (000000000000).  
3. To minimize errors caused by noise at the CS input, the internal circuitry waits for a setup time after CSbefore responding to control  
input signals. No attempt should be made to clock in an address until the minimum CS setup time elapses.  
4. This is the time required for the clock input signal to fall from V min to V max or to rise from V max to V min. In the vicinity of  
IH  
IL  
IL  
IH  
normalroomtemperature, thedevicesfunctionwithinputclocktransitiontimeasslowas1µsforremotedataacquisitionapplications  
where the sensor and the A/D converter are placed several feet away from the controlling microprocessor.  
11  
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12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
electrical characteristics over recommended operating free-air temperature range,  
V
= V  
= 3 V to 3.6 V (unless otherwise noted)  
CC  
ref+  
TYP  
PARAMETER  
TEST CONDITIONS  
MIN  
MAX  
UNIT  
V
V
V
V
V
V
= 3 V,  
I
I
I
I
= 0.2 mA  
= 20 µA  
= 0.8 mA  
= 20 µA  
2.4  
CC  
CC  
CC  
CC  
OH  
OH  
OL  
OL  
V
High-level output voltage  
V
OH  
= 3 V to 3.6 V,  
= 3 V,  
V
CC  
0.1  
0.4  
V
OL  
Low-level output voltage  
V
= 3 V to 3.6 V,  
0.1  
1
= V  
CC  
= 0,  
,
CS at V  
CS at V  
2.5  
2.5  
2.5  
Off-state (high-impedance-state)  
output current  
O
O
CC  
CC  
I
µA  
OZ  
1
I
I
I
High-level input current  
Low-level input current  
Operating supply current  
V = V  
I CC  
1
µA  
µA  
IH  
V = 0  
I
1
2.5  
2.5  
IL  
CS at 0 V  
For all digital inputs,  
0 V 0.3 V or V V – 0.3 V  
CC  
1
mA  
CC  
I
Power-down current  
4
25  
µA  
µA  
µA  
pF  
CC(PD)  
lkg  
I
I
Selected channel at V , Unselected channel at 0 V  
CC  
1
Selected channel leakage  
current  
I
Selected channel at 0 V, Unselected channel at V  
CC  
–1  
Maximum static analog  
reference current into REF+  
V
ref+  
= V  
,
V = GND  
ref–  
1
2.5  
CC  
Analog inputs  
Control inputs  
30  
5
60  
15  
Input  
capacitance  
C
i
All typical values are at V  
= 5 V, T = 25°C.  
A
CC  
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TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
operating characteristics over recommended operating free-air temperature range,  
= V = 3 V to 3.6 V, I/O CLOCK frequency = 4.1 MHz, (unless otherwise noted)  
V
CC  
ref+  
PARAMETER  
Linearity error (see Note 6)  
Differential linearity error  
TEST CONDITIONS  
See Figure 2  
MIN TYP  
MAX  
±1  
UNIT  
LSB  
LSB  
E
L
E
D
See Figure 2  
±1  
E
E
E
See Note 2 and  
Figure 2  
O
Offset error (see Note 7)  
±1.5  
±1  
LSB  
See Note 2 and  
Figure 2  
G
T
Gain error (see Note 7)  
LSB  
LSB  
Total unadjusted error (see Note 8)  
±1.75  
2058  
10  
DATA INPUT = 1011  
DATA INPUT = 1100  
DATA INPUT = 1101  
See Figures 1015  
2038  
4075  
2048  
0
Self-test output code (see Table 3 and Note 9)  
Conversion time  
4095  
8
t
t
10  
µs  
µs  
(conv)  
10 + total  
I/O CLOCK  
periods +  
See Figures 1015  
and Note 10  
Total cycle time (access, sample, and conversion)  
c
t
d(I/O-EOC)  
I/O  
CLOCK  
periods  
See Figures 1015  
and Note 10  
t
Channel acquisition time (sample)  
4
12  
acq  
t
t
t
t
t
t
t
t
t
t
Valid time, DATA OUT remains valid after I/O CLOCK↓  
Delay time, I/O CLOCKto DATA OUT valid  
Delay time, last I/O CLOCKto EOC↓  
Delay time, EOCto DATA OUT (MSB/LSB)  
Enable time, CSto DATA OUT (MSB/LSB driven)  
Disable time, CSto DATA OUT (high impedance)  
Rise time, EOC  
See Figure 7  
See Figure 7  
See Figure 8  
See Figure 9  
See Figure 4  
See Figure 4  
See Figure 9  
See Figure 8  
See Figure 7  
See Figure 7  
10  
ns  
ns  
µs  
ns  
µs  
ns  
ns  
ns  
ns  
ns  
v
250  
2.2  
200  
1.3  
150  
50  
d(I/O-DATA)  
d(I/O-EOC)  
1.5  
d(EOC-DATA)  
, t  
PZH PZL  
0.7  
70  
15  
15  
15  
15  
, t  
PHZ PLZ  
r(EOC)  
f(EOC)  
r(bus)  
f(bus)  
Fall time, EOC  
50  
Rise time, data bus  
50  
Fall time, data bus  
50  
Delay time, last I/O CLOCKto CSto abort conversion  
(see Note 11)  
t
5
µs  
d(I/O-CS)  
All typical values are at T = 25°C.  
A
NOTES: 2. Analog input voltages greater than that applied to REF+ convert as all ones (111111111111), while input voltages less than that  
applied to REF convert as all zeros (000000000000).  
6. Linearity error is the maximum deviation from the best straight line through the A/D transfer characteristics.  
7. Gain error is the difference between the actual midstep value and the nominal midstep value in the transfer diagram at the specified  
gain point after the offset error has been adjusted to zero. Offset error is the difference between the actual midstep value and the  
nominal midstep value at the offset point.  
8. Total unadjusted error comprises linearity, zero-scale, and full-scale errors.  
9. Both the input address and the output codes are expressed in positive logic.  
10. I/O CLOCK period = 1/(I/O CLOCK frequency) (see Figure 7).  
11. Any transitions of CS are recognized as valid only when the level is maintained for a setup time. CS must be taken low at 5 µs  
of the tenth I/O CLOCK falling edge to ensure that a conversion is aborted. Between 5 µs and 10 µs, the result is uncertain as to  
whether the conversion is aborted or the conversion results are valid.  
13  
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TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
PARAMETER MEASUREMENT INFORMATION  
15 V  
50 Ω  
C1  
10 µF  
C2  
0.1 µF  
C3  
470 pF  
TLV2543  
_
U1  
+
10 Ω  
AIN0AIN10  
V
I
C1  
10 µF  
C3  
470 pF  
C2  
0.1 µF  
50 Ω  
15 V  
LOCATION  
DESCRIPTION  
PART NUMBER  
U1  
C1  
C2  
C3  
OP27  
10-µF 35-V tantalum capacitor  
0.1-µF ceramic NPO SMD capacitor  
AVX 12105C104KA105 or equivalent  
470-pF porcelain high-Q SMD capacitor  
Johanson 201S420471JG4L or equivalent  
Figure 2. Analog Input Buffer to Analog Inputs AIN0AIN10  
I
source  
0.8 mA  
Test Point  
See Note A  
Output  
Under Test  
V
cp  
= 2 V  
C
= 100 pF  
L
I
sink  
0.2 mA  
NOTE A: Equivalent load circuit of the Teradyne A580 tester for timing  
parameter measurement.  
Figure 3. Timing Load Circuits  
Data  
Valid  
2 V  
2 V  
0.8 V  
CS  
DATA INPUT  
I/O CLOCK  
0.8 V  
t
, t  
PZH PZL  
t
h(A)  
t
, t  
PHZ PLZ  
t
su(A)  
2.4 V  
0.4 V  
90%  
10%  
DATA  
OUT  
0.8 V  
Figure 5. DATA INPUT and I/O CLOCK  
Voltage Waveforms  
Figure 4. DATA OUT to Hi-Z Voltage Waveforms  
14  
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TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
PARAMETER MEASUREMENT INFORMATION  
2 V  
CS  
0.8 V  
t
su(CS)  
0.8 V  
t
h(CS)  
I/O CLOCK  
Last  
Clock  
0.8 V  
Figure 6. CS and I/O CLOCK Voltage Waveforms  
To ensure full conversion accuracy, it is recommended that no input signal change occurs while  
a conversion is ongoing.  
t
t(I/O)  
t
t(I/O)  
2 V  
2 V  
0.8 V  
I/O CLOCK  
0.8 V  
0.8 V  
I/O CLOCK Period  
t
d(I/O-DATA)  
t
v
2.4 V  
0.4 V  
2.4 V  
0.4 V  
DATA OUT  
t
, t  
r(bus) f(bus)  
Figure 7. I/O CLOCK and DATA OUT Voltage Waveforms  
I/O CLOCK  
Last  
0.8 V  
Clock  
t
d(I/O-EOC)  
2.4 V  
EOC  
0.4 V  
t
f(EOC)  
Figure 8. I/O CLOCK and EOC Voltage Waveforms  
t
r(EOC)  
EOC  
2.4 V  
0.4 V  
t
d(EOC-DATA)  
2.4 V  
0.4 V  
DATA OUT  
Valid MSB  
Figure 9. EOC and DATA OUT Voltage Waveforms  
15  
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TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
PARAMETER MEASUREMENT INFORMATION  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
11  
12  
1
Access Cycle B  
Sample Cycle B  
Hi-Z State  
DATA  
OUT  
A11  
A10  
A9  
A8  
A7  
A6  
A5  
A4  
A1  
A0  
B11  
Previous Conversion Data  
MSB  
LSB  
DATA  
INPUT  
C7  
B7  
B6  
B5  
B4  
B3  
B2  
B1  
B0  
MSB  
LSB  
EOC  
t
Shift in New Multiplexer Address,  
Simultaneously Shift Out Previous  
Conversion Value  
(conv)  
A/D Conversion  
Interval  
Initialize  
Initialize  
Figure 10. Timing for 12-Clock Transfer Using CS With MSB First  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
11  
12  
1
Access Cycle B  
Sample Cycle B  
DATA  
OUT  
A11  
A10  
A9  
A8  
A7  
A6  
A5  
A4  
A1  
A0  
B11  
Low Level  
Previous Conversion Data  
MSB  
LSB  
DATA  
INPUT  
B7  
B6  
B5  
B4  
C7  
B3  
B2  
B1  
B0  
MSB  
LSB  
EOC  
t
Shift in New Multiplexer Address,  
Simultaneously Shift Out Previous  
Conversion Value  
(conv)  
A/D Conversion  
Interval  
Initialize  
Initialize  
Figure 11. Timing for 12-Clock Transfer Not Using CS With MSB First  
NOTE A: TominimizeerrorscausedbynoiseatCS, theinternalcircuitrywaitsforasetuptimeafterCSbeforerespondingtocontrolinputsignals.  
Therefore, no attempt should be made to clock in an address until the minimum CS setup time has elapsed.  
16  
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TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
PARAMETER MEASUREMENT INFORMATION  
CS  
(see Note A)  
1
2
3
4
5
6
7
8
1
I/O CLOCK  
DATA OUT  
Access Cycle B  
Sample Cycle B  
Hi-Z  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
B7  
Previous Conversion Data  
MSB  
LSB  
B0  
DATA INPUT  
B3  
B2  
B1  
B7  
B6  
B5  
B4  
C7  
MSB  
LSB  
EOC  
t
Shift in New Multiplexer Address,  
Simultaneously Shift Out Previous  
Conversion Value  
(conv)  
A/D Conversion  
Interval  
Initialize  
Initialize  
Figure 12. Timing for 8-Clock Transfer Using CS With MSB First  
CS  
(see Note A)  
1
2
3
4
5
6
7
8
1
I/O CLOCK  
Access Cycle B  
Sample Cycle B  
A7  
A6  
A5  
A4  
A3  
A2  
A1  
A0  
B7  
Low Level  
DATA OUT  
Previous Conversion Data  
MSB  
LSB  
B0  
DATA INPUT  
B7  
B6  
B5  
B4  
C7  
B3  
B2  
B1  
MSB  
LSB  
EOC  
t
Shift in New Multiplexer Address,  
(conv)  
Simultaneously Shift Out Previous  
Conversion Value  
A/D Conversion  
Interval  
Initialize  
Initialize  
Figure 13. Timing for 8-Clock Transfer Not Using CS With MSB First  
NOTE A: TominimizeerrorscausedbynoiseatCS, theinternalcircuitrywaitsforasetuptimeafterCSbeforerespondingtocontrol  
input signals. Therefore, no attempt should be made to clock in an address until the minimum CS setup time has elapsed.  
17  
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TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
PARAMETER MEASUREMENT INFORMATION  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
15  
16  
1
Access Cycle B  
Sample Cycle B  
Hi-Z State  
DATA  
OUT  
A15  
A14  
A13  
A12  
A11  
A10  
A9  
A8  
B0  
A1  
A0  
B15  
Previous Conversion Data  
MSB  
LSB  
DATA  
INPUT  
B7  
B6  
B5  
B4  
B3  
B2  
B1  
C7  
MSB  
LSB  
EOC  
t
Shift in New Multiplexer Address,  
Simultaneously Shift Out Previous  
Conversion Value  
(conv)  
A/D Conversion  
Interval  
Initialize  
Initialize  
Figure 14. Timing for 16-Clock Transfer Using CS With MSB First  
CS  
(see Note A)  
I/O  
CLOCK  
1
2
3
4
5
6
7
8
15  
16  
1
Access Cycle B  
Sample Cycle B  
DATA  
OUT  
Low Level  
A15  
A14  
A13  
A12  
A11  
A10  
A9  
A8  
A1  
A0  
B15  
Previous Conversion Data  
MSB  
LSB  
DATA  
INPUT  
B3  
B2  
B1  
B0  
B7  
B6  
B5  
B4  
C7  
MSB  
LSB  
EOC  
Shift in New Multiplexer Address,  
Simultaneously Shift Out Previous  
Conversion Value  
t
(conv)  
A/D Conversion  
Interval  
Initialize  
Figure 15. Timing for 16-Clock Transfer Not Using CS With MSB First  
NOTE A: TominimizeerrorscausedbynoiseatCS, theinternalcircuitrywaitsforasetuptimeafterCSbeforerespondingtocontrolinputsignals.  
Therefore, no attempt should be made to clock in an address until the minimum CS setup time has elapsed.  
18  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
APPLICATION INFORMATION  
4095  
4094  
4093  
111111111111  
111111111110  
111111111101  
V
FS  
See Notes A and B  
V
FSnom  
V
FT  
= V  
– 1/2 LSB  
FS  
2049  
2048  
100000000001  
100000000000  
V
ZT  
= V  
+ 1/2 LSB  
ZS  
2047  
011111111111  
V
ZS  
2
1
0
000000000010  
000000000001  
000000000000  
0
0.0008 0.0016  
1.6376 1.6384 1.6392  
V – Analog Input Voltage – V  
3.2752  
3.2760 3.2768  
I
NOTES: A. This curve is based on the assumption that V  
ref+  
and V have been adjusted so that the voltage at the transition from digital 0  
ref–  
to 1 (V ) is 0.0004 V and the transition to full scale (V ) is 3.2756 V. 1 LSB = 0.8 mV.  
ZT FT  
B. The full-scale value (V ) is the step whose nominal midstep value has the highest absolute value. The zero-scale value (V ) is  
FS  
ZS  
the step whose nominal midstep value equals zero.  
Figure 16. Ideal Conversion Characteristics  
TLV2543  
15  
1
AIN0  
AIN1  
AIN2  
AIN3  
AIN4  
AIN5  
AIN6  
AIN7  
AIN8  
AIN9  
AIN10  
CS  
18  
17  
2
I/O CLOCK  
3
DATA INPUT  
Control  
Circuit  
4
Processor  
5
16  
19  
DATA OUT  
EOC  
6
Analog  
Inputs  
7
8
9
14  
13  
3-V DC Regulated  
REF+  
REF–  
11  
12  
GND  
10  
To Source  
Ground  
Figure 17. Serial Interface  
19  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
APPLICATIONS INFORMATION  
simplified analog input analysis  
Using the equivalent circuit in Figure 18, the time required to charge the analog input capacitance from 0 to V  
within 1/2 LSB can be derived as follows:  
S
The capacitance charging voltage is given by  
–t R C  
(1)  
c
t
i
V
V
1–e  
C
S
Where:  
R = R + r  
t
s
i
The final voltage to 1/2 LSB is given by  
V (1/2 LSB) = V – (V /8192)  
(2)  
C
S
S
Equating equation 1 to equation 2 and solving for time t gives  
c
–t R C  
c
t
i
V
V
58192  
V
1–e  
(3)  
(4)  
S
S
S
and  
t (1/2 LSB) = R × C × ln(8192)  
c
t
i
Therefore, with the values given the time for the analog input signal to settle is  
t (1/2 LSB) = (R + 1 k) × 60 pF × ln(8192)  
(5)  
c
s
This time must be less than the converter sample time shown in the timing diagrams.  
Driving Source  
TLV2543  
R
r
i
s
V
I
V
S
V
C
1 kMAX  
C
i
50 pF MAX  
V
V
= Input Voltage at AIN  
= External Driving Source Voltage  
I
S
s
R = Source Resistance  
r
= Input Resistance  
i
C = Input Capacitance  
i
Driving source requirements:  
Noise and distortion for the source must be equivalent to the  
resolution of the converter.  
R must be real at the input frequency.  
s
Figure 18. Equivalent Input Circuit Including the Driving Source  
20  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
MECHANICAL DATA  
DB (R-PDSO-G**)  
PLASTIC SMALL-OUTLINE PACKAGE  
28 PIN SHOWN  
0,38  
0,22  
0,65  
28  
M
0,15  
15  
0,15 NOM  
5,60  
5,00  
8,20  
7,40  
Gage Plane  
1
14  
0,25  
A
0°8°  
1,03  
0,63  
Seating Plane  
0,10  
2,00 MAX  
0,05 MIN  
PINS **  
14  
16  
20  
24  
28  
30  
38  
DIM  
6,50  
5,90  
6,50  
5,90  
7,50  
8,50  
7,90  
10,50  
9,90  
10,50 12,90  
A MAX  
A MIN  
6,90  
9,90  
12,30  
4040065 /B 10/94  
NOTES: A. All linear dimensions are in millimeters.  
B. This drawing is subject to change without notice.  
C. Body dimensions do not include mold flash or protrusion not to exceed 0,15.  
D. Falls within JEDEC MO-150  
21  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
MECHANICAL DATA  
DW (R-PDSO-G**)  
PLASTIC SMALL-OUTLINE PACKAGE  
16 PIN SHOWN  
PINS **  
0.050 (1,27)  
16  
20  
24  
28  
DIM  
0.020 (0,51)  
0.014 (0,35)  
0.010 (0,25)  
M
0.410  
0.510  
0.610  
0.710  
A MAX  
(10,41) (12,95) (15,49) (18,03)  
16  
9
0.400  
0.500  
0.600  
0.700  
A MIN  
(10,16) (12,70) (15,24) (17,78)  
0.419 (10,65)  
0.400 (10,15)  
0.010 (0,25) NOM  
0.299 (7,59)  
0.293 (7,45)  
Gage Plane  
0.010 (0,25)  
1
8
0°8°  
0.050 (1,27)  
0.016 (0,40)  
A
Seating Plane  
0.004 (0,10)  
0.012 (0,30)  
0.004 (0,10)  
0.104 (2,65) MAX  
4040000/B 10/94  
NOTES: A. All linear dimensions are in inches (millimeters).  
B. This drawing is subject to change without notice.  
C. Body dimensions do not include mold flash or protrusion not to exceed 0.006 (0,15).  
D. Falls within JEDEC MS-013  
22  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
TLV2543C, TLV2543I  
12-BIT ANALOG-TO-DIGITAL CONVERTERS  
WITH SERIAL CONTROL AND 11 ANALOG INPUTS  
SLAS096C – MARCH 1995 – REVISED JUNE 2000  
MECHANICAL DATA  
N (R-PDIP-T**)  
PLASTIC DUAL-IN-LINE PACKAGE  
16 PIN SHOWN  
A
PINS **  
14  
16  
18  
20  
16  
9
DIM  
0.775  
0.775  
0.920  
0.975  
A MAX  
(19,69) (19,69) (23.37) (24,77)  
0.260 (6,60)  
0.240 (6,10)  
0.745  
0.745  
0.850  
0.940  
A MIN  
(18,92) (18,92) (21.59) (23,88)  
1
8
0.070 (1,78) MAX  
0.020 (0,51) MIN  
0.310 (7,87)  
0.290 (7,37)  
0.035 (0,89) MAX  
0.200 (5,08) MAX  
0.125 (3,18) MIN  
Seating Plane  
0.100 (2,54)  
0°15°  
0.021 (0,53)  
0.015 (0,38)  
0.010 (0,25)  
M
0.010 (0,25) NOM  
14 Pin Only  
4040049/C 7/95  
NOTES: A. All linear dimensions are in inches (millimeters).  
B. This drawing is subject to change without notice.  
C. Falls within JEDEC MS-001 (20-pin package is shorter than MS-001)  
23  
POST OFFICE BOX 655303 DALLAS, TEXAS 75265  
PACKAGE OPTION ADDENDUM  
www.ti.com  
8-Jan-2007  
PACKAGING INFORMATION  
Orderable Device  
TLV2543CDB  
Status (1)  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
ACTIVE  
Package Package  
Pins Package Eco Plan (2) Lead/Ball Finish MSL Peak Temp (3)  
Qty  
Type  
Drawing  
SSOP  
DB  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
20  
70 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TLV2543CDBG4  
TLV2543CDBR  
TLV2543CDBRG4  
TLV2543CDW  
TLV2543CDWG4  
TLV2543CDWR  
TLV2543CDWRG4  
TLV2543CN  
SSOP  
SSOP  
SSOP  
SOIC  
SOIC  
SOIC  
SOIC  
PDIP  
PDIP  
SSOP  
SSOP  
SSOP  
SSOP  
SOIC  
SOIC  
SOIC  
SOIC  
PDIP  
PDIP  
DB  
DB  
DB  
DW  
DW  
DW  
DW  
N
70 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
25 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
25 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
20  
Pb-Free  
(RoHS)  
CU NIPDAU N / A for Pkg Type  
TLV2543CNE4  
TLV2543IDB  
N
20  
Pb-Free  
(RoHS)  
CU NIPDAU N / A for Pkg Type  
DB  
DB  
DB  
DB  
DW  
DW  
DW  
DW  
N
70 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TLV2543IDBG4  
TLV2543IDBR  
TLV2543IDBRG4  
TLV2543IDW  
70 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
25 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
TLV2543IDWG4  
TLV2543IDWR  
TLV2543IDWRG4  
TLV2543IN  
25 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
2000 Green (RoHS & CU NIPDAU Level-1-260C-UNLIM  
no Sb/Br)  
20  
Pb-Free  
(RoHS)  
CU NIPDAU N / A for Pkg Type  
TLV2543INE4  
N
20  
Pb-Free  
(RoHS)  
CU NIPDAU N / A for Pkg Type  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in  
a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2)  
Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check  
http://www.ti.com/productcontent for the latest availability information and additional product content details.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
8-Jan-2007  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements  
for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered  
at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and  
package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS  
compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame  
retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material)  
(3)  
MSL, Peak Temp. -- The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder  
temperature.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is  
provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the  
accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take  
reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on  
incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited  
information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI  
to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
9-Apr-2009  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0 (mm)  
B0 (mm)  
K0 (mm)  
P1  
W
Pin1  
Diameter Width  
(mm) W1 (mm)  
(mm) (mm) Quadrant  
TLV2543CDBR  
TLV2543IDBR  
SSOP  
SSOP  
DB  
DB  
20  
20  
2000  
2000  
330.0  
330.0  
16.4  
16.4  
8.2  
8.2  
7.5  
7.5  
2.5  
2.5  
12.0  
12.0  
16.0  
16.0  
Q1  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
9-Apr-2009  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
TLV2543CDBR  
TLV2543IDBR  
SSOP  
SSOP  
DB  
DB  
20  
20  
2000  
2000  
346.0  
346.0  
346.0  
346.0  
33.0  
33.0  
Pack Materials-Page 2  
IMPORTANT NOTICE  
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