SN54CBT3383W [TI]
10-BIT FET BUS-EXCHANGE SWITCHES; 10位FET总线交换开关系列型号: | SN54CBT3383W |
厂家: | TEXAS INSTRUMENTS |
描述: | 10-BIT FET BUS-EXCHANGE SWITCHES |
文件: | 总5页 (文件大小:70K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
SN54CBT3383, SN74CBT3383
10-BIT FET BUS-EXCHANGE SWITCHES
SCDS003J – NOVEMBER 1992 – REVISED MAY 1999
SN54CBT3383 . . . JT OR W PACKAGE
SN74CBT3383 . . . DB, DBQ, DGV, DW, OR PW PACKAGE
(TOP VIEW)
Functionally Equivalent to QS3383 and
QS3L383
5-Ω Switch Connection Between Two Ports
BE
1B1
1A1
1A2
1B2
2B1
2A1
2A2
2B2
V
CC
1
2
3
4
5
6
7
8
9
24
23
22
21
TTL-Compatible Input Levels
5B2
5A2
5A1
Package Options Include Plastic
Small-Outline (DW), Shrink Small-Outline
(DB, DBQ), Thin Very Small-Outline (DGV),
and Thin Shrink Small-Outline (PW)
Packages, Ceramic DIPs (JT), and Ceramic
Flat (W) Package
20 5B1
4B2
19
18 4A2
17 4A1
16 4B1
15 3B2
14 3A2
13 BX
description
3B1 10
3A1 11
GND 12
The ’CBT3383 devices provide ten bits of
high-speed TTL-compatible bus switching or
exchanging. The low on-state resistance of the
switch allows connections to be made with
minimal propagation delay.
The devices operate as a 10-bit bus switch or a 5-bit bus exchanger, which provides swapping of the A and B
pairs of signals. The bus-exchange function is selected when BX is high. The switches are connected when BE
is low.
The SN54CBT3383 is characterized for operation over the full military temperature range of –55°C to 125°C.
The SN74CBT3383 is characterized for operation from 0°C to 70°C.
FUNCTION TABLE
INPUTS
INPUTS/OUTPUTS
BE
BX
L
1A1–5A1
1B1–5B1
1B2–5B2
Z
1A2–5A2
1B2–5B2
1B1–5B1
Z
L
L
H
H
X
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of
Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
Copyright 1999, Texas Instruments Incorporated
On products compliant to MIL-PRF-38535, all parameters are tested
unless otherwise noted. On all other products, production
processing does not necessarily include testing of all parameters.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
1
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54CBT3383, SN74CBT3383
10-BIT FET BUS-EXCHANGE SWITCHES
SCDS003J – NOVEMBER 1992 – REVISED MAY 1999
logic diagram (positive logic)
3
2
5
1A1
1B1
1B2
4
1A2
21
20
23
5A1
5B1
5B2
22
5A2
1
BE
13
BX
†
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
CC
Input voltage range, V (see Note 1) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –0.5 V to 7 V
I
Continuous channel current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 128 mA
Input clamp current, I (V < 0) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –50 mA
IK I/O
Package thermal impedance, θ (see Note 2): DB package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 104°C/W
JA
DBQ package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 113°C/W
DGV package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 139°C/W
DW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 81°C/W
PW package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 120°C/W
Storage temperature range, T
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . –65°C to 150°C
stg
†
Stresses beyond those listed under “absolute maximum ratings” may cause permanent damage to the device. These are stress ratings only, and
functional operation of the device at these or any other conditions beyond those indicated under “recommended operating conditions” is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTES: 1. The input and output negative-voltage ratings may be exceeded if the input and output clamp-current ratings are observed.
2. The package thermal impedance is calculated in accordance with JESD 51.
2
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54CBT3383, SN74CBT3383
10-BIT FET BUS-EXCHANGE SWITCHES
SCDS003J – NOVEMBER 1992 – REVISED MAY 1999
recommended operating conditions (see Note 3)
SN54CBT3383 SN74CBT3383
UNIT
MIN
4.5
2
MAX
MIN
4.5
2
MAX
V
V
V
Supply voltage
5.5
5.5
V
V
CC
IH
IL
High-level control input voltage
Low-level control input voltage
Operating free-air temperature
0.8
0.8
70
V
T
A
–55
125
0
°C
NOTE 3: All unused control inputs of the device must be held at V
or GND to ensure proper device operation. Refer to the TI application report,
CC
Implications of Slow or Floating CMOS Inputs, literature number SCBA004.
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
SN54CBT3383
SN74CBT3383
PARAMETER
TEST CONDITIONS
I = –18 mA
UNIT
†
†
MIN TYP
MAX
–1.2
±5
MIN TYP
MAX
–1.2
±1
V
V
V
V
V
= 4.5 V,
= 5.5 V,
= 5.5 V,
V
IK
CC
CC
CC
CC
I
I
I
V = 5.5 V or GND
I
µA
µA
I
I
O
= 0,
V = V or GND
I CC
50
50
CC
= 5.5 V, One input at 3.4 V,
or GND
‡
∆I
CC
Control inputs
Control inputs
2.5
2.5
mA
pF
Other inputs at V
CC
V = 3 V or 0
I
3
6
C
C
i
V = 2.5 V
I
5
V
= 3 V or 0,
= 2.5 V,
BE = V
O
O
CC
CC
pF
io(OFF)
§
V
BE = V
6
I = 64 mA
I
5
9.2
5
5
7
7
V = 0
I
V
CC
= 4.5 V
I = 30 mA
I
Ω
r
on
V = 2.4 V,
I
I = 15 mA
I
10
17
10
15
†
‡
§
All typical values are at V
= 5 V, T = 25°C.
A
CC
This is the increase in supply current for each input that is at the specified TTL voltage level rather than V
or GND.
CC
Measured by the voltage drop between the input terminal and the output terminal at the indicated current through the switch. On-state resistance
is determined by the lowest voltage of the two (A or B) terminals.
switching characteristics over recommended operating free-air temperature range, C = 50 pF
L
(unless otherwise noted) (see Figure 1)
SN54CBT3383 SN74CBT3383
FROM
(INPUT)
TO
(OUTPUT)
PARAMETER
UNIT
MIN
MAX
MIN
MAX
¶
t
t
t
t
A or B
BX
B or A
A or B
A or B
A or B
1.5
0.25
ns
ns
ns
ns
pd
pd
en
1
1
1
10.2
10.8
8.2
1
1
1
9.2
8.6
7.5
BE
BE
dis
¶
Thepropagation delay is the calculated RC time constant of the typical on-state resistance of the switch and the specified load capacitance, when
driven by an ideal voltage source (zero output impedance).
3
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
SN54CBT3383, SN74CBT3383
10-BIT FET BUS-EXCHANGE SWITCHES
SCDS003J – NOVEMBER 1992 – REVISED MAY 1999
PARAMETER MEASUREMENT INFORMATION
7 V
Open
TEST
S1
S1
500 Ω
t
Open
7 V
pd
/t
From Output
Under Test
t
PLZ PZL
/t
GND
t
Open
PHZ PZH
C
= 50 pF
L
500 Ω
(see Note A)
Output
Control
(low-level
enabling)
3 V
0 V
1.5 V
1.5 V
LOAD CIRCUIT
t
PZL
t
PLZ
Output
Waveform 1
S1 at 7 V
3.5 V
3 V
0 V
1.5 V
Input
V
+ 0.3 V
1.5 V
1.5 V
OL
(see Note B)
V
OL
t
PHZ
t
PZH
t
t
PHL
PLH
Output
Waveform 2
S1 at Open
(see Note B)
V
OH
V
V
OH
V
OH
– 0.3 V
1.5 V
Output
1.5 V
1.5 V
0 V
OL
VOLTAGE WAVEFORMS
VOLTAGE WAVEFORMS
ENABLE AND DISABLE TIMES
PROPAGATION DELAY TIMES
C includes probe and jig capacitance.
L
NOTES: A.
B. Waveform 1 is for an output with internal conditions such that the output is low except when disabled by the output control.
Waveform 2 is for an output with internal conditions such that the output is high except when disabled by the output control.
C. All input pulses are supplied by generators having the following characteristics: PRR ≤ 10 MHz, Z = 50 Ω, t ≤ 2.5 ns, t ≤ 2.5 ns.
O
r
f
D. The outputs are measured one at a time with one transition per measurement.
E.
F.
G.
t
t
t
and t
and t
and t
PHL
are the same as t
.
dis
PLZ
PZL
PLH
PHZ
PZH
are the same as t
.
en
are the same as t .
pd
Figure 1. Load Circuit and Voltage Waveforms
4
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
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pertaining to warranty, patent infringement, and limitation of liability.
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
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Copyright 1999, Texas Instruments Incorporated
相关型号:
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TI
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