OPT3006 [TI]

超薄环境光传感器 (ALS);
OPT3006
型号: OPT3006
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

超薄环境光传感器 (ALS)

传感器
文件: 总41页 (文件大小:837K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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OPT3006  
ZHCSFL9 OCTOBER 2016  
OPT3006 超薄环境光传感器  
1 特性  
3 说明  
1
采用精密光学过滤以匹配人眼:  
可阻隔 99%(典型值)以上的红外线 (IR)  
OPT3006 是一款单芯片照度计,用于测量人眼的可见  
光强度。OPT3006 采用超小型 PicoStar 封装,因此该  
器件可在狭小空间内进行安装。  
自动满量程设置功能简化了软件并提供最优配置  
测量范围:0.01 lux 83k lux  
传感器的高精度光谱响应与人眼的白昼视觉响应紧密匹  
配。OPT3006 具有强烈的红外 (IR) 排斥反应,在所有  
光源条件下均可精确测量人眼的可见光强度。当设计需  
要将传感器安装到深色玻璃下时,这种强烈的红外 (IR)  
排斥反应还可有助于维持高精度。OPT3006 通常与背  
IC 或照明控制系统配合使用,能够为用户构建基于  
光的各项体验,可作为光电二极管、光敏电阻或低配环  
境光传感器的理想替代产品。  
23 位有效动态范围,  
支持自动设置增益范围  
12 种二进制权满量程范围设置:范围间匹配程度  
< 0.2%(典型值)  
低工作电流:1.8µA(典型值)  
工作温度范围:-40°C +85°C  
宽电源范围:1.6V 3.6V  
可耐受 5.5V 电压的 I/O  
灵活的中断系统  
凭借内置的满量程设置功能,无需手动选择满量程范围  
即可在 0.01 lux 83k lux 范围内进行测量。此功能允  
许在 23 位有效动态范围内进行光测量。  
小外形尺寸:  
0.856mm x 0.946mm x 0.226mm PicoStar™封  
数字操作可灵活用于系统集成。测量既可连续进行也可  
单次触发。控制和中断系统 具有 自主操作功能,允许  
处理器在传感器搜索相应唤醒事件并通过中断引脚进行  
报告时处于休眠状态。数字输出通过 I2C 以及兼容  
SMBus 的双线制串口进行报告。  
OPT3006 OPT3001 的缩小版  
2 应用  
智能手表  
可穿戴电子产品  
健身手环  
OPT3006 兼具低功耗和低电源电压特性,可延长电池  
供电系统的电池寿命。  
显示屏背光控制  
照明控制系统  
平板电脑和笔记本电脑  
摄像机  
器件信息(1)  
器件型号  
OPT3006  
封装  
封装尺寸(标称值)  
0.856mm x 0.946mm x  
0.226mm  
PicoStar (6)  
频谱响应:OPT3006 和人眼  
(1) 要了解所有可用封装,请见数据表末尾的封装选项附录。  
1
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
OPT3006  
Human Eye  
方框图  
VDD  
VDD  
OPT3006  
SCL  
Ambient  
Light  
SDA  
I2C  
Interface  
Optical  
Filter  
ADC  
INT  
ADDR  
GND  
300  
400  
500  
600  
700  
800  
900  
1000  
Wavelength (nm)  
D001  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
English Data Sheet: SBOS698  
 
 
 
OPT3006  
ZHCSFL9 OCTOBER 2016  
www.ti.com.cn  
目录  
7.6 Register Maps......................................................... 19  
Application and Implementation ........................ 27  
8.1 Application Information............................................ 27  
8.2 Typical Application .................................................. 28  
8.3 Do's and Don'ts ...................................................... 31  
Power-Supply Recommendations...................... 31  
1
2
3
4
5
6
特性.......................................................................... 1  
8
9
应用.......................................................................... 1  
说明.......................................................................... 1  
修订历史记录 ........................................................... 2  
Pin Configuration and Functions......................... 3  
Specifications......................................................... 4  
6.1 Absolute Maximum Ratings ...................................... 4  
6.2 ESD Ratings.............................................................. 4  
6.3 Recommended Operating Conditions....................... 4  
6.4 Thermal Information.................................................. 4  
6.5 Electrical Characteristics........................................... 5  
6.6 Timing Requirements................................................ 6  
6.7 Typical Characteristics.............................................. 7  
Detailed Description ............................................ 10  
7.1 Overview ................................................................. 10  
7.2 Functional Block Diagram ...................................... 10  
7.3 Feature Description................................................. 11  
7.4 Device Functional Modes........................................ 13  
7.5 Programming........................................................... 16  
10 Layout................................................................... 32  
10.1 Layout Guidelines ................................................. 32  
10.2 Soldering and Handling Recommendations.......... 32  
10.3 Layout Example .................................................... 34  
11 器件和文档支持 ..................................................... 35  
11.1 文档支持................................................................ 35  
11.2 接收文档更新通知 ................................................. 35  
11.3 社区资源................................................................ 35  
11.4 ....................................................................... 35  
11.5 静电放电警告......................................................... 35  
11.6 Glossary................................................................ 35  
12 机械、封装和可订购信息....................................... 35  
7
4 修订历史记录  
日期  
修订版本  
注释  
2016 10 月  
*
最初发布。  
2
Copyright © 2016, Texas Instruments Incorporated  
 
OPT3006  
www.ti.com.cn  
ZHCSFL9 OCTOBER 2016  
5 Pin Configuration and Functions  
YMF Package  
6-Pin PicoStar  
Top View  
1
2
A
B
GND  
SCL  
Optical  
Sensing  
Area  
ADDR  
VDD  
INT  
C
SDA  
Pin Functions  
PIN  
DESCRIPTION  
NO.  
A1  
B1  
C1  
A2  
B2  
NAME  
GND  
ADDR  
VDD  
SCL  
I/O  
Power  
Ground  
Digital input Address pin. This pin sets the LSBs of the I2C address.  
Power Device power. Connect to a 1.6-V to 3.6-V supply.  
Digital input I2C clock. Connect with a 10-kΩ resistor to a 1.6-V to 5.5-V supply.  
INT  
Digital output Interrupt output open-drain. Connect with a 10-kΩ resistor to a 1.6-V to 5.5-V supply.  
Digital  
input/output  
C2  
SDA  
I2C data. Connect with a 10-kΩ resistor to a 1.6-V to 5.5-V supply.  
Copyright © 2016, Texas Instruments Incorporated  
3
OPT3006  
ZHCSFL9 OCTOBER 2016  
www.ti.com.cn  
6 Specifications  
6.1 Absolute Maximum Ratings(1)  
MIN  
–0.5  
–0.5  
MAX  
6
UNIT  
V
VDD to GND  
Voltage  
SDA, SCL, INT, and ADDR to GND  
6
V
Current into any pin  
Temperature  
10  
mA  
°C  
Junction  
150  
150(2)  
Storage, Tstg  
–65  
°C  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, and do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended  
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) Long exposure to temperatures higher than 105°C can cause package discoloration, spectral distortion, and measurement inaccuracy.  
6.2 ESD Ratings  
VALUE  
±2000  
±500  
UNIT  
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)  
Charged-device model (CDM), per JEDEC specification JESD22-C101(2)  
Electrostatic  
discharge  
V(ESD)  
V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
MIN  
–40  
1.6  
NOM  
MAX  
85  
UNIT  
°C  
Operating temperature  
Operating power-supply voltage  
3.6  
V
6.4 Thermal Information  
OPT3006  
THERMAL METRIC(1)  
YMF (PicoStar)  
UNIT  
6 PINS  
122.8  
1.4  
RθJA  
RθJC(top)  
RθJB  
ψJT  
Junction-to-ambient thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
34.9  
0.8  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
ψJB  
35.3  
(1) For more information about traditional and new thermal metrics, see the Semiconductor and IC Package Thermal Metrics application  
report.  
4
Copyright © 2016, Texas Instruments Incorporated  
OPT3006  
www.ti.com.cn  
ZHCSFL9 OCTOBER 2016  
6.5 Electrical Characteristics  
At TA = 25°C, VDD = 3.3 V, 800-ms conversion time (CT = 1)(1), automatic full-scale range (RN[3:0] = 1100b(1)), white LED,  
and normal-angle incidence of light, unless otherwise specified.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
OPTICAL  
Peak irradiance spectral responsivity  
Resolution (LSB)  
550  
0.01  
nm  
lux  
lux  
Lowest full-scale range, RN[3:0] = 0000b(1)  
Full-scale illuminance  
83865.6  
3125  
2500  
1600  
3750 ADC codes  
0.64 lux per ADC code, 2620.80 lux full-scale  
(RN[3:0] = 0110)(1), 2000 lux input(2)  
Measurement output result  
2000  
2400  
lux  
Relative accuracy between gain  
ranges(3)  
Infrared response (850 nm)(2)  
0.2%  
0.2%  
4%  
Light source variation  
(incandescent, halogen, fluorescent)  
Bare device, no cover glass  
Input illuminance > 40 lux  
Input illuminance < 40 lux  
2%  
5%  
0.01  
0
Linearity  
Measurement drift across temperature Input illuminance = 2000 lux  
%/°C  
ADC codes  
lux  
3
Dark condition, ADC output  
0.01 lux per ADC code  
0
0.03  
Half-power angle  
50% of full-power reading  
VDD at 3.6 V and 1.6 V  
44  
degrees  
%/V(4)  
PSRR  
Power-supply rejection ratio  
0.1  
POWER SUPPLY  
VDD  
VI²C  
Operating range  
1.6  
1.6  
3.6  
5.5  
2.5  
V
V
Operating range of I2C pull-up resistor I2C pull-up resistor, VDD VI²C  
Active, VDD = 3.6 V  
Shutdown (M[1:0] = 00)(1)  
VDD = 3.6 V  
1.8  
0.3  
3.7  
0.4  
0.8  
µA  
Dark  
,
0.47  
µA  
µA  
µA  
V
IQ  
Quiescent current  
Active, VDD = 3.6 V  
Full-scale lux  
TA = 25°C  
Shutdown,  
(M[1:0] = 00)(1)  
POR  
Power-on-reset threshold  
DIGITAL  
I/O pin capacitance  
3
800  
100  
pF  
ms  
ms  
(CT = 1)(1), 800-ms mode, fixed lux range  
(CT = 0)(1), 100-ms mode, fixed lux range  
720  
90  
880  
110  
Total integration time(5)  
Low-level input voltage  
(SDA, SCL, and ADDR)  
VIL  
VIH  
IIL  
0
0.3 × VDD  
5.5  
V
V
High-level input voltage  
(SDA, SCL, and ADDR)  
0.7 × VDD  
Low-level input current  
(SDA, SCL, and ADDR)  
0.01  
0.01  
0.25(6)  
0.32  
µA  
V
Low-level output voltage  
(SDA and INT)  
VOL  
IZH  
IOL= 3 mA  
Pin at VDD  
Output logic high, high-Z leakage  
current (SDA, INT)  
0.25(6)  
µA  
TEMPERATURE  
Specified temperature range  
–40  
85  
°C  
(1) Refers to a control field within the configuration register.  
(2) Tested with the white LED calibrated to 2k lux and an 850-nm LED.  
(3) Characterized by measuring fixed near-full-scale light levels on the higher adjacent full-scale range setting.  
(4) PSRR is the percent change of the measured lux output from its current value, divided by the change in power supply voltage, as  
characterized by results from 3.6-V and 1.6-V power supplies.  
(5) The conversion time, from start of conversion until the data are ready to be read, is the integration time plus 3 ms.  
(6) The specified leakage current is dominated by the production test equipment limitations. Typical values are much smaller.  
Copyright © 2016, Texas Instruments Incorporated  
5
OPT3006  
ZHCSFL9 OCTOBER 2016  
www.ti.com.cn  
MAX UNIT  
6.6 Timing Requirements(1)  
MIN  
TYP  
I2C FAST MODE  
fSCL  
SCL operating frequency  
Bus free time between stop and start  
Hold time after repeated start  
Setup time for repeated start  
Setup time for stop  
0.01  
1300  
600  
600  
600  
20  
0.4  
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tBUF  
tHDSTA  
tSUSTA  
tSUSTO  
tHDDAT  
tSUDAT  
tLOW  
Data hold time  
900  
Data setup time  
100  
1300  
600  
SCL clock low period  
tHIGH  
SCL clock high period  
Clock rise and fall time  
Data rise and fall time  
tRC and tFC  
tRD and tFD  
300  
300  
Bus timeout period. If the SCL line is held low for this duration of time, the bus  
state machine is reset.  
tTIMEO  
28  
ms  
I2C HIGH-SPEED MODE  
fSCL  
SCL operating frequency  
0.01  
160  
160  
160  
160  
20  
2.6  
MHz  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tBUF  
Bus free time between stop and start  
Hold time after repeated start  
Setup time for repeated start  
Setup time for stop  
tHDSTA  
tSUSTA  
tSUSTO  
tHDDAT  
tSUDAT  
tLOW  
Data hold time  
140  
Data setup time  
20  
SCL clock low period  
SCL clock high period  
Clock rise and fall time  
Data rise and fall time  
240  
60  
tHIGH  
tRC and tFC  
tRD and tFD  
40  
80  
Bus timeout period. If the SCL line is held low for this duration of time, the bus  
state machine is reset.  
tTIMEO  
28  
ms  
(1) All timing parameters are referenced to low and high voltage thresholds of 30% and 70%, respectively, of final settled value.  
1/fSCL  
tRC  
tFC  
70%  
30%  
SCL  
SDA  
tLOW  
tHIGH  
tSUSTA  
tSUSTO  
tHDSTA  
tHDDAT  
tSUDAT  
70%  
30%  
tBUF  
Start  
tRD  
tFD  
Stop  
Start  
Stop  
Figure 1. I2C Detailed Timing Diagram  
6
Copyright © 2016, Texas Instruments Incorporated  
OPT3006  
www.ti.com.cn  
ZHCSFL9 OCTOBER 2016  
6.7 Typical Characteristics  
At TA = 25°C, VDD = 3.3 V, 800-ms conversion time (CT = 1), automatic full-scale range (RN[3:0] = 1100b), white LED, and  
normal-angle incidence of light, unless otherwise specified.  
300  
250  
200  
150  
100  
50  
1
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
Fluorescent  
Halogen  
Incandescent  
OPT3006  
Human Eye  
0
300  
400  
500  
600  
700  
800  
900  
1000  
0
50  
100  
150  
200  
250  
300  
Wavelength (nm)  
Input Light (Lux)  
D001  
D002  
Figure 2. Spectral Response vs Wavelength  
Figure 3. Output Response vs Input Illuminance, Multiple  
Light Sources (Fluorescent, Halogen, Incandescent)  
100  
80  
60  
40  
20  
0
16000  
14000  
12000  
10000  
8000  
6000  
4000  
2000  
0
0
2000 4000 6000 8000 10000 12000 14000 16000  
Input Light (Lux)  
0
20  
40  
60  
80  
100  
Input Light (Lux)  
D003  
D004  
Figure 4. Output Response vs Input Illuminance  
(Higher Range = 0 lux to 16k lux)  
Figure 5. Output Response vs Input Illuminance  
(Mid Range = 0 lux to 100 lux)  
5
4
3
2
1
1.020  
1.010  
1.000  
0.990  
0.980  
1.005  
1.003  
1.001  
1.000  
1.000  
1.000  
0
0
1
2
3
4
5
40.95  
81.9  
163.8  
327.6  
655.2  
1310.4  
Input Light (Lux)  
D005  
D006  
Full-Scale Range (Lux)  
Input illuminance = 30 lux,  
normalized to response of 40.95 lux full-scale  
Figure 6. Output Response vs Input Illuminance  
(Low Range = 0 lux to 5 lux)  
Figure 7. Full-Scale-Range Matching (Lowest 7 Ranges)  
Copyright © 2016, Texas Instruments Incorporated  
7
OPT3006  
ZHCSFL9 OCTOBER 2016  
www.ti.com.cn  
Typical Characteristics (continued)  
At TA = 25°C, VDD = 3.3 V, 800-ms conversion time (CT = 1), automatic full-scale range (RN[3:0] = 1100b), white LED, and  
normal-angle incidence of light, unless otherwise specified.  
0.1  
1.020  
0.09  
0.08  
1.010  
0.07  
0.06  
1.000  
1.000 1.000  
0.999  
0.05  
0.04  
0.03  
0.02  
0.01  
0
1.000  
0.990  
0.980  
0.998  
0.997  
0.997  
-40  
-20  
0
20  
40  
60  
80  
100  
1310.4 2620.8 5241.6 10483.2 20966.4 41932.8 83865.6  
Full-Scale Range (Lux)  
Temperature (èC)  
D0016  
D007  
Average of 30 devices  
Input illuminance = 960 lux,  
normalized to response of 2560 lux full-scale  
Figure 9. Dark Response vs Temperature  
Figure 8. Full-Scale-Range Matching (Highest 6 Ranges)  
1.02  
1000  
900  
800  
700  
600  
1.01  
1
0.99  
0.98  
0.97  
-40  
-20  
0
20  
40  
60  
80  
100  
120  
1.6  
2
2.4  
2.8  
3.2  
3.6  
Temperature ( èC)  
Power Supply (V)  
D008  
D017  
Figure 10. Normalized Response vs Temperature  
Figure 11. Conversion Time vs Power Supply  
1.002  
1.001  
1
1
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
0.999  
0.998  
1.6  
2
2.4  
2.8  
3.2  
3.6  
-90 -75 -60 -45 -30 -15  
0
15 30 45 60 75 90  
Power Supply (V)  
Incidence Angle (Degrees)  
D009  
D010  
Figure 12. Normalized Response vs Power-Supply Voltage  
Figure 13. Normalized Response vs Illuminance Angle  
8
Copyright © 2016, Texas Instruments Incorporated  
 
OPT3006  
www.ti.com.cn  
ZHCSFL9 OCTOBER 2016  
Typical Characteristics (continued)  
At TA = 25°C, VDD = 3.3 V, 800-ms conversion time (CT = 1), automatic full-scale range (RN[3:0] = 1100b), white LED, and  
normal-angle incidence of light, unless otherwise specified.  
0.5  
0.45  
0.4  
4
3.5  
3
0.35  
0.3  
2.5  
2
1.5  
0.25  
0.2  
1
100  
1000  
10000  
100000  
0
20000  
40000  
60000  
80000  
Input Illuminance (Lux)  
Input Illuminance (Lux)  
D011  
D0112  
M[1:0] = 10b  
M[1:0] = 00b  
Figure 14. Supply Current vs Input Illuminance  
Figure 15. Shutdown Current vs Input Illuminance  
3.5  
3
1.6  
1.4  
1.2  
1
Vdd = 3.3V  
Vdd = 1.6V  
Vdd = 3.3V  
Vdd = 1.6V  
2.5  
2
0.8  
0.6  
0.4  
0.2  
1.5  
1
-40  
-20  
0
20  
40  
60  
80  
100  
-40  
-20  
0
20  
40  
60  
80  
100  
Temperature (èC)  
Temperature (èC)  
D013  
D014  
M[1:0] = 10b  
M[1:0] = 00b, input illuminance = 0 lux  
Figure 17. Shutdown Current vs Temperature  
Figure 16. Supply Current vs Temperature  
100  
Vdd = 3.3V  
Vdd = 1.6V  
10  
1
0.1  
0.01  
0.1  
1
10  
100  
1000  
10000  
Continuous I2C Frequency (KHz)  
D015  
Input illuminance = 80 lux, SCL = SDA,  
continuously toggled at I2C frequency  
Note: A typical application runs at a lower duty cycle and thus consumes a lower current.  
Figure 18. Supply Current vs Continuous I2C Frequency  
Copyright © 2016, Texas Instruments Incorporated  
9
OPT3006  
ZHCSFL9 OCTOBER 2016  
www.ti.com.cn  
7 Detailed Description  
7.1 Overview  
The OPT3006 measures the ambient light that illuminates the device. This device measures light with a spectral  
response very closely matched to the human eye, and with very good infrared rejection.  
Matching the sensor spectral response to that of the human eye response is vital because ambient light sensors  
are used to measure and help create ideal human lighting experiences. Strong rejection of infrared light, which a  
human does not see, is a crucial component of this matching. This matching makes the OPT3006 especially  
good for operation underneath windows that are visibly dark, but infrared transmissive.  
The OPT3006 is fully self-contained to measure the ambient light and report the result in lux digitally over the I2C  
bus. The result can also be used to alert a system and interrupt a processor with the INT pin. The result can also  
be summarized with a programmable window comparison and communicated with the INT pin.  
The OPT3006 can be configured into an automatic full-scale, range-setting mode that always selects the optimal  
full-scale range setting for the lighting conditions. This mode frees the user from having to program their software  
for potential iterative cycles of measurement and readjustment of the full-scale range until optimal for any given  
measurement. The device can be commanded to operate continuously or in single-shot measurement modes.  
The device integrates its result over either 100 ms or 800 ms, so the effects of 50-Hz and 60-Hz noise sources  
from typical light bulbs are nominally reduced to a minimum.  
The device starts up in a low-power shutdown state, such that the OPT3006 only consumes active-operation  
power after being programmed into an active state.  
The OPT3006 optical filtering system is not excessively sensitive to non-ideal particles and micro-shadows on  
the optical surface. This reduced sensitivity is a result of the relatively minor device dependency on uniform-  
density optical illumination of the sensor area for infrared rejection. Proper optical surface cleanliness is always  
recommended for best results on all optical devices.  
7.2 Functional Block Diagram  
VDD  
VDD  
OPT3006  
SCL  
Ambient  
Light  
SDA  
I2C  
Interface  
Optical  
Filter  
ADC  
INT  
ADDR  
GND  
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7.3 Feature Description  
7.3.1 Human Eye Matching  
The OPT3006 spectral response closely matches that of the human eye. If the ambient light sensor  
measurement is used to help create a good human experience, or create optical conditions that are optimal for a  
human, the sensor must measure the same spectrum of light that a human sees.  
The device also has excellent infrared light (IR) rejection. This IR rejection is especially important because many  
real-world lighting sources have significant infrared content that humans do not see. If the sensor measures  
infrared light that the human eye does not see, then a true human experience is not accurately represented.  
Furthermore, if the ambient light sensor is hidden underneath a dark window (such that the end-product user  
cannot see the sensor) the infrared rejection of the OPT3006 becomes significantly more important because  
many dark windows attenuate visible light but transmit infrared light. This attenuation of visible light and lack of  
attenuation of IR light amplifies the ratio of the infrared light to visible light that illuminates the sensor. Results  
can still be well matched to the human eye under this condition because of the high infrared rejection of the  
OPT3006.  
7.3.2 Automatic Full-Scale Range Setting  
The OPT3006 has an automatic full-scale range setting feature that eliminates the need to predict and set the  
optimal range for the device. In this mode, the OPT3006 automatically selects the optimal full-scale range for the  
given lighting condition. The OPT3006 has a high degree of result matching between the full-scale range  
settings. This matching eliminates the problem of varying results or the need for range-specific, user-calibrated  
gain factors when different full-scale ranges are chosen. For further details, see the Automatic Full-Scale Setting  
Mode section.  
7.3.3 Interrupt Operation, INT Pin, and Interrupt Reporting Mechanisms  
The device has an interrupt reporting system that allows the processor connected to the I2C bus to go to sleep,  
or otherwise ignore the device results, until a user-defined event occurs that requires possible action.  
Alternatively, this same mechanism can also be used with any system that can take advantage of a single digital  
signal that indicates whether the light is above or below levels of interest.  
The interrupt event conditions are controlled by the high-limit and low-limit registers, as well as the configuration  
register latch and fault count fields. The results of comparing the result register with the high-limit register and  
low-limit register are referred to as fault events. The fault count register dictates how many consecutive same-  
result fault events are required to trigger an interrupt event and subsequently change the state of the interrupt  
reporting mechanisms, which are the INT pin, the flag high field, and the flag low field. The latch field allows a  
choice between a latched window-style comparison and a transparent hysteresis-style comparison.  
The INT pin has an open-drain output, which requires the use of a pull-up resistor. This open-drain output allows  
multiple devices with open-drain INT pins to be connected to the same line, thus creating a logical NOR or AND  
function between the devices. The polarity of the INT pin can be controlled with the polarity of interrupt field in  
the configuration register. When the POL field is set to 0, the pin operates in an active low behavior that pulls the  
pin low when the INT pin becomes active. When the POL field is set to 1, the pin operates in an active high  
behavior and becomes high impedance, thus allowing the pin to go high when the INT pin becomes active.  
Additional details of the interrupt reporting registers are described in the Interrupt Reporting Mechanism Modes  
and Internal Registers sections.  
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Feature Description (continued)  
7.3.4 I2C Bus Overview  
The OPT3006 offers compatibility with both I2C and SMBus interfaces. The I2C and SMBus protocols are  
essentially compatible with one another. The I2C interface is used throughout this document as the primary  
example with the SMBus protocol specified only when a difference between the two protocols is discussed.  
The OPT3006 is connected to the bus with two pins: an SCL clock input pin and an SDA open-drain bidirectional  
data pin. The bus must be controlled by a master device that generates the serial clock (SCL), controls the bus  
access, and generates start and stop conditions. To address a specific device, the master initiates a start  
condition by pulling the data signal line (SDA) from a high logic level to a low logic level while SCL is high. All  
slaves on the bus shift in the slave address byte on the SCL rising edge, with the last bit indicating whether a  
read or write operation is intended. During the ninth clock pulse, the slave being addressed responds to the  
master by generating an acknowledge bit by pulling SDA low.  
Data transfer is then initiated and eight bits of data are sent, followed by an acknowledge bit. During data  
transfer, SDA must remain stable while SCL is high. Any change in SDA while SCL is high is interpreted as a  
start or stop condition. When all data are transferred, the master generates a stop condition, indicated by pulling  
SDA from low to high while SCL is high. The OPT3006 includes a 28-ms timeout on the I2C interface to prevent  
locking up the bus. If the SCL line is held low for this duration of time, the bus state machine is reset.  
7.3.4.1 Serial Bus Address  
To communicate with the OPT3006, the master must first initiate an I2C start command. Then, the master must  
address slave devices via a slave address byte. The slave address byte consists of seven address bits and a  
direction bit that indicates whether the action is to be a read or write operation.  
Four I2C addresses are possible by connecting the ADDR pin to one of four pins: GND, VDD, SDA, or SCL.  
Table 1 summarizes the possible addresses with the corresponding ADDR pin configuration. The state of the  
ADDR pin is sampled on every bus communication and must be driven or connected to the desired level before  
any activity on the interface occurs.  
Table 1. Possible I2C Addresses with Corresponding ADDR Configuration  
DEVICE I2C ADDRESS  
ADDR PIN  
GND  
1000100  
1000101  
VDD  
1000110  
SDA  
1000111  
SCL  
7.3.4.2 Serial Interface  
The OPT3006 operates as a slave device on both the I2C bus and SMBus. Connections to the bus are made via  
the SCL clock input line and the SDA open-drain I/O line. The OPT3006 supports the transmission protocol for  
standard mode (up to 100 kHz), fast mode (up to 400 kHz), and high-speed mode (up to 2.6 MHz). All data bytes  
are transmitted most-significant bits first.  
The SDA and SCL pins feature integrated spike-suppression filters and Schmitt triggers to minimize the effects of  
input spikes and bus noise. See the Electrical Interface section for further details of the I2C bus noise immunity.  
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7.4 Device Functional Modes  
7.4.1 Automatic Full-Scale Setting Mode  
The OPT3006 has an automatic full-scale-range setting mode that eliminates the need for a user to predict and  
set the optimal range for the device. This mode is entered when the configuration register range number field  
(RN[3:0]) is set to 1100b.  
The first measurement that the device takes in auto-range mode is a 10-ms range assessment measurement.  
The device then determines the appropriate full-scale range to take its first full measurement.  
For subsequent measurements, the full-scale range is set by the result of the previous measurement. If a  
measurement is towards the low side of full-scale, the full-scale range is decreased by one or two settings for the  
next measurement. If a measurement is towards the upper side of full-scale, the full-scale range is increased by  
one setting for the next measurement.  
If the measurement exceeds the full-scale range, resulting from a fast increasing optical transient event, the  
current measurement is aborted. This invalid measurement is not reported. A 10-ms measurement is taken to  
assess and properly reset the full-scale range. Then, a new measurement is taken with this proper full-scale  
range. Therefore, during a fast increasing optical transient in this mode, a measurement can possibly take longer  
to complete and report than indicated by the configuration register conversion time field (CT).  
7.4.2 Interrupt Reporting Mechanism Modes  
There are two major types of interrupt reporting mechanism modes: latched window-style comparison mode and  
transparent hysteresis-style comparison mode. The configuration register latch field (L) (see the configuration  
register, bit 4) controls which of these two modes is used. An end-of-conversion mode is also associated with  
each major mode type. The end-of-conversion mode is active when the two most significant bits of the threshold  
low register are set to 11b. The mechanisms report via the flag high and flag low fields, the conversion ready  
field, and the INT pin.  
7.4.2.1 Latched Window-Style Comparison Mode  
The latched window-style comparison mode is typically selected when using the OPT3006 to interrupt an  
external processor. In this mode, a fault is recognized when the input signal is above the high-limit register or  
below the low-limit register. When the consecutive fault events trigger the interrupt reporting mechanisms, these  
mechanisms are latched, thus reporting whether the fault is the result of a high or low comparison. These  
mechanisms remain latched until the configuration register is read, which clears the INT pin and flag high and  
flag low fields. The SMBus alert response protocol, described in detail in the SMBus Alert Response section,  
clears the pin but does not clear the flag high and flag low fields. The behavior of this mode, along with the  
conversion ready flag, is summarized in Table 2. Note that Table 2 does not apply when the two threshold low  
register MSBs (see the Transparent Hysteresis-Style Comparison Mode section for clarification on the MSBs) are  
set to 11b.  
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Device Functional Modes (continued)  
Table 2. Latched Window-Style Comparison Mode: Flag Setting and Clearing Summary(1)(2)  
FLAG HIGH  
FIELD  
FLAG LOW  
FIELD  
CONVERSION  
READY FIELD  
OPERATION  
INT PIN(3)  
The result register is above the high-limit register for fault count times.  
See the Result Register and the High-Limit Register for further details.  
1
X
1
Active  
1
1
The result register is below the low-limit register for fault count times.  
See the Result Register and the Low-Limit Register for further details.  
X
Active  
The conversion is complete with fault count criterion not met  
Configuration register read(4)  
X
0
X
0
X
Inactive  
X
1
0
Configuration register write, M[1:0] = 00b (shutdown)  
Configuration register write, M[1:0] > 00b (not shutdown)  
SMBus alert response protocol  
X
X
X
X
X
X
X
0
X
Inactive  
X
(1) X = no change from the previous state.  
(2) The high-limit register is assumed to be greater than the low-limit register. If this assumption is incorrect, the flag high field and flag low  
field can take on different behaviors.  
(3) The INT pin depends on the setting of the polarity field (POL). The INT pin is low when the pin state is active and POL = 0 (active low)  
or when the pin state is inactive and POL = 1 (active high).  
(4) Immediately after the configuration register is read, the device automatically resets the conversion ready field to its 0 state. Thus, if two  
configuration register reads are performed immediately after a conversion completion, the first reads 1 and the second reads 0.  
7.4.2.2 Transparent Hysteresis-Style Comparison Mode  
The transparent hysteresis-style comparison mode is typically used when a single digital signal is desired that  
indicates whether the input light is higher than or lower than a light level of interest. If the result register is higher  
than the high-limit register for a consecutive number of events set by the fault count field, the INT line is set to  
active, the flag high field is set to 1, and the flag low field is set to 0. If the result register is lower than the low-  
limit register for a consecutive number of events set by the fault count field, the INT line is set to inactive, the flag  
low field is set to 1, and the flag high field is set to 0. The INT pin and flag high and flag low fields do not change  
state with configuration reads and writes. The INT pin and flag fields continually report the appropriate  
comparison of the light to the low-limit and high-limit registers. The device does not respond to the SMBus alert  
response protocol while in either of the two transparent comparison modes (configuration register, latch field =  
0). The behavior of this mode, along with the conversion ready is summarized in Table 3. Note that Table 3 does  
not apply when the two threshold low register MSBs (LE[3:2] from Table 11) are set to 11.  
Table 3. Transparent Hysteresis-Style Comparison Mode: Flag Setting and Clearing Summary(1)(2)  
FLAG HIGH  
FIELD  
FLAG LOW  
FIELD  
CONVERSION  
READY FIELD  
OPERATION  
INT PIN(3)  
The result register is above the high-limit register for fault count times.  
See the Result Register and the High-Limit Register for further details.  
1
0
0
1
Active  
1
1
The result register is below the low-limit register for fault count times.  
See the Result Register and the Low-Limit Register for further details.  
Inactive  
The conversion is complete with fault count criterion not met  
Configuration register read(4)  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
1
0
Configuration register write, M[1:0] = 00b (shutdown)  
Configuration register write, M[1:0] > 00b (not shutdown)  
SMBus alert response protocol  
X
0
X
(1) X = no change from the previous state.  
(2) The high-limit register is assumed to be greater than the low-limit register. If this assumption is incorrect, the flag high field and flag low  
field can take on different behaviors.  
(3) The INT pin depends on the setting of the polarity field (POL). The INT pin is low when the pin state is active and POL = 0 (active low)  
or when the pin state is inactive and POL = 1 (active high).  
(4) Immediately after the configuration register is read, the device automatically resets the conversion ready field to its 0 state. Thus, if two  
configuration register reads are performed immediately after a conversion completion, the first reads 1 and the second reads 0.  
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7.4.2.3 End-of-Conversion Mode  
An end-of-conversion indicator mode can be used when every measurement is desired to be read by the  
processor, prompted by the INT pin going active on every measurement completion. This mode is entered by  
setting the most significant two bits of the low-limit register (LE[3:2] from the Low-Limit Register) to 11b. This  
end-of-conversion mode is typically used in conjunction with the latched window-style comparison mode. The INT  
pin becomes inactive when the configuration register is read or the configuration register is written with a non-  
shutdown parameter or in response to an SMBus alert response. Table 4 summarizes the interrupt reporting  
mechanisms as a result of various operations.  
Table 4. End-of-Conversion Mode while in Latched Window-Style Comparison Mode:  
Flag Setting and Clearing Summary(1)  
FLAG HIGH  
FIELD  
FLAG LOW  
FIELD  
CONVERSION  
READY FIELD  
OPERATION  
INT PIN(2)  
The result register is above the high-limit register for fault count times.  
See the Result Register and the High-Limit Register for further details.  
1
X
1
Active  
1
1
The result register is below the low-limit register for fault count times.  
See the Result Register and the Low-Limit Register for further details.  
X
Active  
The conversion is complete with fault count criterion not met  
Configuration register read(3)  
X
0
X
0
Active  
Inactive  
X
1
0
Configuration register write, M[1:0] = 00b (shutdown)  
Configuration register write, M[1:0] > 00b (not shutdown)  
SMBus alert response protocol  
X
X
X
X
X
X
X
0
X
Inactive  
X
(1) X = no change from the previous state.  
(2) The INT pin depends on the setting of the polarity field (POL). The INT pin is low when the pin state is active and POL = 0 (active low)  
or when the pin state is inactive and POL = 1 (active high).  
(3) Immediately after the configuration register is read, the device automatically resets the conversion ready field to its 0 state. Thus, if two  
configuration register reads are performed immediately after a conversion completion, the first reads 1 and the second reads 0.  
Note that when transitioning from end-of-conversion mode to the standard comparison modes (that is,  
programming LE[3:2] from 11b to 00b) while the configuration register latch field (L) is 1, a subsequent write to  
the configuration register latch field (L) to 0 is necessary in order to properly clear the INT pin. The latch field can  
then be set back to 1 if desired.  
7.4.2.4 End-of-Conversion and Transparent Hysteresis-Style Comparison Mode  
The combination of end-of-conversion mode and transparent hysteresis-style comparison mode can also be  
programmed simultaneously. The behavior of this combination is shown in Table 5.  
Table 5. End-Of-Conversion Mode while in Transparent Hysteresis-Style Comparison Mode:  
Flag Setting and Clearing Summary(1)  
FLAG HIGH  
FIELD  
FLAG LOW  
FIELD  
CONVERSION  
READY FIELD  
OPERATION  
INT PIN(2)  
The result register is above the high-limit register for fault count times.  
See the Result Register and the High-Limit Register for further details.  
1
0
0
1
Active  
1
1
The result register is below the low-limit register for fault count times.  
See the Result Register and the Low-Limit Register for further details.  
Active  
The conversion is complete with fault count criterion not met  
Configuration register read(3)  
X
X
X
X
X
X
X
X
X
X
Active  
Inactive  
X
1
0
Configuration register write, M[1:0] = 00b (shutdown)  
Configuration register write, M[1:0] > 00b (not shutdown)  
SMBus alert response protocol  
X
0
Inactive  
X
X
(1) X = no change from the previous state.  
(2) The INT pin depends on the setting of the polarity field (POL). The INT pin is low when the pin state is active and POL = 0 (active low)  
or when the pin state is inactive and POL = 1 (active high).  
(3) Immediately after the configuration register is read, the device automatically resets the conversion ready field to its 0 state. Thus, if two  
configuration register reads are performed immediately after a conversion completion, the first reads 1 and the second reads 0.  
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7.5 Programming  
The OPT3006 supports the transmission protocol for standard mode (up to 100 kHz), fast mode (up to 400 kHz),  
and high-speed mode (up to 2.6 MHz). Fast and standard modes are described as the default protocol, referred  
to as F/S. High-speed mode is described in the High-Speed I2C Mode section.  
7.5.1 Writing and Reading  
Accessing a specific register on the OPT3006 is accomplished by writing the appropriate register address during  
the I2C transaction sequence. Refer to Table 6 for a complete list of registers and their corresponding register  
addresses. The value for the register address (as shown in Figure 19) is the first byte transferred after the slave  
address byte with the R/W bit low.  
1
9
1
9
SCL  
SDA  
RA RA RA RA RA RA RA RA  
1
0
0
0
1
A1 A0 R/W  
7
6
5
4
3
2
1
0
Stop by  
Master  
Start by  
Master  
ACK by  
Device  
ACK by  
Device  
(optional)  
Frame 1: Two-Wire Slave Address Byte (1)  
Frame 2: Register Address Byte  
(1) The value of the slave address byte is determined by the ADDR pin setting; see Table 1.  
Figure 19. Setting the I2C Register Address  
Writing to a register begins with the first byte transmitted by the master. This byte is the slave address with the  
R/W bit low. The OPT3006 then acknowledges receipt of a valid address. The next byte transmitted by the  
master is the address of the register that data are to be written to. The next two bytes are written to the register  
addressed by the register address. The OPT3006 acknowledges receipt of each data byte. The master may  
terminate the data transfer by generating a start or stop condition.  
When reading from the OPT3006, the last value stored in the register address by a write operation determines  
which register is read during a read operation. To change the register address for a read operation, a new partial  
I2C write transaction must be initiated. This partial write is accomplished by issuing a slave address byte with the  
R/W bit low, followed by the register address byte and a stop command. The master then generates a start  
condition and sends the slave address byte with the R/W bit high to initiate the read command. The next byte is  
transmitted by the slave and is the most significant byte of the register indicated by the register address. This  
byte is followed by an acknowledge from the master; then the slave transmits the least significant byte. The  
master acknowledges receipt of the data byte. The master may terminate the data transfer by generating a not-  
acknowledge after receiving any data byte, or by generating a start or stop condition. If repeated reads from the  
same register are desired, continually sending the register address bytes is not necessary; the OPT3006 retains  
the register address until that number is changed by the next write operation.  
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Programming (continued)  
Figure 20 and Figure 21 show the write and read operation timing diagrams, respectively. Note that register  
bytes are sent most significant byte first, followed by the least significant byte.  
1
9
1
9
1
9
1
9
SCL  
RA RA RA RA RA RA RA RA  
SDA  
1
0
0
0
1
A1 A0 R/W  
D15 D14 D13 D12 D11 D10 D9 D8  
D7 D6 D5 D4 D3 D2 D1 D0  
7
6
5
4
3
2
1
0
Start by  
Master  
ACK by  
Device  
ACK by  
Device  
ACK by  
Device  
Stop by  
Master  
ACK by  
Device  
Frame 1 Two-Wire Slave Address Byte (1)  
Frame 2 Register Address Byte  
Frame 3 Data MSByte  
Frame 4 Data LSByte  
(1) The value of the slave address byte is determined by the setting of the ADDR pin; see Table 1.  
Figure 20. I2C Write Example  
1
9
1
9
1
9
SCL  
SDA  
R/W  
1
0
0
0
1
A1 A0  
D15 D14 D13 D12 D11 D10 D9 D8  
D7 D6 D5 D4 D3 D2 D1 D0  
From Device  
No ACK  
by  
Master(2)  
Stop by  
Master  
Start by  
Master  
ACK by  
Device  
From  
Device  
ACK by  
Master  
Frame 1 Two-Wire Slave Address Byte (1)  
Frame 2 Data MSByte  
Frame 3 Data LSByte  
(1) The value of the slave address byte is determined by the ADDR pin setting; see Table 1.  
(2) An ACK by the master can also be sent.  
Figure 21. I2C Read Example  
7.5.1.1 High-Speed I2C Mode  
When the bus is idle, both the SDA and SCL lines are pulled high by the pull-up resistors or active pull-up  
devices. The master generates a start condition followed by a valid serial byte containing the high-speed (HS)  
master code 0000 1XXXb. This transmission is made in either standard mode or fast mode (up to 400 kHz). The  
OPT3006 does not acknowledge the HS master code but does recognize the code and switches its internal filters  
to support a 2.6-MHz operation.  
The master then generates a repeated start condition (a repeated start condition has the same timing as the start  
condition). After this repeated start condition, the protocol is the same as F/S mode, except that transmission  
speeds up to 2.6 MHz are allowed. Instead of using a stop condition, use repeated start conditions to secure the  
bus in HS mode. A stop condition ends the HS mode and switches all internal filters of the OPT3006 to support  
the F/S mode.  
7.5.1.2 General-Call Reset Command  
The I2C general-call reset allows the host controller in one command to reset all devices on the bus that respond  
to the general-call reset command. The general call is initiated by writing to the I2C address 0 (0000 0000b). The  
reset command is initiated when the subsequent second address byte is 06h (0000 0110b). With this transaction,  
the device issues an acknowledge bit and sets all of its registers to the power-on-reset default condition.  
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Programming (continued)  
7.5.1.3 SMBus Alert Response  
The SMBus alert response provides a quick identification for which device issued the interrupt. Without this alert  
response capability, the processor does not know which device pulled the interrupt line when there are multiple  
slave devices connected.  
The OPT3006 is designed to respond to the SMBus alert response address, when in the latched window-style  
comparison mode (configuration register, latch field = 1). The OPT3006 does not respond to the SMBus alert  
response when in transparent mode (configuration register, latch field = 0).  
The response behavior of the OPT3006 to the SMBus alert response is shown in Figure 22. When the interrupt  
line to the processor is pulled to active, the master can broadcast the alert response slave address (0001  
1001b). Following this alert response, any slave devices that generated an alert identify themselves by  
acknowledging the alert response and sending their respective I2C address on the bus. The alert response can  
activate several different slave devices simultaneously. If more than one slave attempts to respond, bus  
arbitration rules apply. The device with the lowest address wins the arbitration. If the OPT3006 loses the  
arbitration, the device does not acknowledge the I2C transaction and its INT pin remains in an active state,  
prompting the I2C master processor to issue a subsequent SMBus alert response. When the OPT3006 wins the  
arbitration, the device acknowledges the transaction and sets its INT pin to inactive. The master can issue that  
same command again, as many times as necessary to clear the INT pin. See the Interrupt Reporting Mechanism  
Modes section for additional details of how the flags and INT pin are controlled. The master can obtain  
information about the source of the OPT3006 interrupt from the address broadcast in the above process. The  
flag high field (configuration register, bit 6) is sent as the final LSB of the address to provide the master additional  
information about the cause of the OPT3006 interrupt. If the master requires additional information, the result  
register or the configuration register can be queried. The flag high and flag low fields are not cleared upon an  
SMBus alert response.  
INT  
1
9
1
9
SCL  
SDA  
FH(1)  
0
0
0
1
1
0
0
R/W  
1
0
0
0
1
A1  
A0  
Start By  
Master  
ACK By  
Device  
From  
Device  
NACK By Stop By  
Master Master  
Frame 2 Slave Address Byte(2)  
Frame 1 SMBus ALERT Response Address Byte  
(1) FH is the flag high field (FH) in the configuration register (see Table 10).  
(2) A1 and A0 are determined by the ADDR pin; see Table 1.  
Figure 22. Timing Diagram for SMBus Alert Response  
18  
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7.6 Register Maps  
7.6.1 Internal Registers  
The device is operated over the I2C bus with registers that contain configuration, status, and result information. All registers are 16 bits long.  
There are four main registers: result, configuration, low-limit, and high-limit. There are also two ID registers: manufacturer ID and device ID. Table 6 lists  
these registers.  
Table 6. Register Map  
ADDRESS  
REGISTER  
BIT 15 BIT 14 BIT 13 BIT 12 BIT 11 BIT 10  
BIT 9  
BIT 8  
BIT 7  
BIT 6  
BIT 5  
BIT 4  
BIT 3  
BIT 2  
BIT 1  
BIT 0  
(Hex)(1)  
00h  
Result  
Configuration  
Low Limit  
E3  
RN3  
LE3  
E2  
RN2  
LE2  
E1  
RN1  
LE1  
E0  
RN0  
LE0  
R11  
CT  
R10  
M1  
R9  
M0  
R8  
OVF  
TL8  
TH8  
ID8  
R7  
CRF  
TL7  
TH7  
ID7  
R6  
FH  
R5  
FL  
R4  
L
R3  
POL  
TL3  
TH3  
ID3  
R2  
ME  
R1  
FC1  
TL1  
TH1  
ID1  
R0  
FC0  
TL0  
TH0  
ID0  
01h  
02h  
TL11  
TH11  
ID11  
DID11  
TL10  
TH10  
ID10  
DID10  
TL9  
TH9  
ID9  
TL6  
TH6  
ID6  
TL5  
TH5  
ID5  
TL4  
TH4  
ID4  
DID4  
TL2  
TH2  
ID2  
High Limit  
03h  
HE3  
ID15  
DID15  
HE2  
ID14  
DID14  
HE1  
ID13  
DID13  
HE0  
ID12  
DID12  
Manufacturer ID  
Device ID  
7Eh  
7Fh  
DID9  
DID8  
DID7  
DID6  
DID5  
DID3  
DID2  
DID1  
DID0  
(1) Register offset and register address are used interchangeably.  
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7.6.1.1 Register Descriptions  
NOTE  
Register offset and register address are used interchangeably.  
7.6.1.1.1 Result Register (offset = 00h)  
This register contains the result of the most recent light to digital conversion. This 16-bit register has two fields: a  
4-bit exponent and a 12-bit mantissa.  
Figure 23. Result Register (Read-Only)  
15  
E3  
R
14  
E2  
R
13  
E1  
R
12  
E0  
R
11  
R11  
R
10  
R10  
R
9
R9  
R
8
R8  
R
7
R7  
R
6
R6  
R
5
R5  
R
4
R4  
R
3
R3  
R
2
R2  
R
1
R1  
R
0
R0  
R
LEGEND: R = Read only  
Table 7. Result Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
Exponent.  
15:12  
E[3:0]  
R
0h  
These bits are the exponent bits. Table 8 provides further details.  
Fractional result.  
These bits are the result in straight binary coding (zero to full-scale).  
11:0  
R[11:0]  
R
000h  
Table 8. Full-Scale Range and LSB Size as a Function of Exponent Level  
E3  
0
0
0
0
0
0
0
0
1
1
1
1
E2  
0
0
0
0
1
1
1
1
0
0
0
0
E1  
0
0
1
1
0
0
1
1
0
0
1
1
E0  
0
1
0
1
0
1
0
1
0
1
0
1
FULL-SCALE RANGE (lux)  
40.95  
LSB SIZE (lux per LSB)  
0.01  
0.02  
0.04  
0.08  
0.16  
0.32  
0.64  
1.28  
2.56  
5.12  
10.24  
20.48  
81.90  
163.80  
327.60  
655.20  
1310.40  
2620.80  
5241.60  
10483.20  
20966.40  
41932.80  
83865.60  
The formula to translate this register into lux is given in Equation 1:  
lux = LSB_Size × R[11:0]  
(1)  
(2)  
(3)  
where:  
LSB_Size = 0.01 × 2E[3:0]  
LSB_Size can also be taken from Table 8. The complete lux equation is shown in Equation 3:  
lux = 0.01 × (2E[3:0]) × R[11:0]  
A series of result register output examples with the corresponding LSB weight and resulting lux are given in  
Table 9. Note that many combinations of exponents (E[3:0]) and fractional results (R[11:0]) can map onto the  
same lux result, as shown in the examples of Table 9.  
20  
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Table 9. Examples of Decoding the Result Register into lux  
FRACTIONAL  
RESULT  
(R[11:0], Hex)  
RESULT REGISTER  
(Bits 15:0, Binary)  
EXPONENT  
(E[3:0], Hex)  
LSB WEIGHT  
(lux, Decimal)  
RESULTING LUX  
(Decimal)  
0000 0000 0000 0001b  
0000 1111 1111 1111b  
0011 0100 0101 0110b  
0111 1000 1001 1010b  
1000 1000 0000 0000b  
1001 0100 0000 0000b  
1010 0010 0000 0000b  
1011 0001 0000 0000b  
1011 0000 0000 0001b  
1011 1111 1111 1111b  
00h  
00h  
03h  
07h  
08h  
09h  
0Ah  
0Bh  
0Bh  
0Bh  
001h  
FFFh  
456h  
89Ah  
800h  
400h  
200h  
100h  
001h  
FFFh  
0.01  
0.01  
0.01  
40.95  
0.08  
88.80  
1.28  
2818.56  
5242.88  
5242.88  
5242.88  
5242.88  
20.48  
2.56  
5.12  
10.24  
20.48  
20.48  
20.48  
83865.60  
Note that the exponent field can be disabled (set to zero) by enabling the exponent mask (configuration register,  
ME field = 1) and manually programming the full-scale range (configuration register, RN[3:0] < 1100b (0Ch)),  
allowing for simpler operation in a manually-programmed, full-scale mode. Calculating lux from the result register  
contents only requires multiplying the result register by the LSB weight (in lux) associated with the specific  
programmed full-scale range (see Table 8). See the Low-Limit Register for details.  
See the configuration register conversion time field (CT, bit 11) description for more information on lux resolution  
as a function of conversion time.  
7.6.1.1.2 Configuration Register (offset = 01h) [reset = C810h]  
This register controls the major operational modes of the device. This register has 11 fields, which are  
documented below. If a measurement conversion is in progress when the configuration register is written, the  
active measurement conversion immediately aborts. If the new configuration register directs a new conversion,  
that conversion is subsequently started.  
Figure 24. Configuration Register  
15  
14  
13  
12  
11  
CT  
10  
M1  
9
8
OVF  
R
RN3  
R/W  
RN2  
R/W  
RN1  
R/W  
RN0  
R/W  
M0  
R/W  
R/W  
R/W  
7
CRF  
R
6
FH  
R
5
FL  
R
4
L
3
2
1
0
POL  
R/W  
ME  
R/W  
FC1  
R/W  
FC0  
R/W  
R/W  
LEGEND: R/W = Read/Write; R = Read only  
Table 10. Configuration Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
Range number field (read or write).  
The range number field selects the full-scale lux range of the device. The format of this field is  
the same as the result register exponent field (E[3:0]); see Table 8. When RN[3:0] is set to  
1100b (0Ch), the device operates in automatic full-scale setting mode, as described in the  
Automatic Full-Scale Setting Mode section. In this mode, the automatically chosen range is  
reported in the result exponent (register 00h, E[3:0]).  
15:12  
RN[3:0]  
R/W  
1100b  
The device powers up as 1100 in automatic full-scale setting mode. Codes 1101b, 1110b, and  
1111b (0Dh, 0Eh, and 0Fh) are reserved for future use.  
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Table 10. Configuration Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
Conversion time field (read or write).  
The conversion time field determines the length of the light to digital conversion process. The  
choices are 100 ms and 800 ms. A longer integration time allows for a lower noise  
measurement.  
The conversion time also relates to the effective resolution of the data conversion process. The  
800-ms conversion time allows for the fully specified lux resolution. The 100-ms conversion  
time with full-scale ranges above 0101b for E[3:0] in the result and configuration registers also  
allows for the fully specified lux resolution. The 100-ms conversion time with full-scale ranges  
below and including 0101b for E[3:0] can reduce the effective result resolution by up to three  
bits, as a function of the selected full-scale range. Range 0101b reduces by one bit. Ranges  
0100b, 0011b, 0010b, and 0001b reduces by two bits. Range 0000b reduces by three bits.  
The result register format and associated LSB weight does not change as a function of the  
conversion time.  
11  
CT  
R/W  
1b  
0 = 100 ms  
1 = 800 ms  
Mode of conversion operation field (read or write).  
The mode of conversion operation field controls whether the device is operating in continuous  
conversion, single-shot, or low-power shutdown mode. The default is 00b (shutdown mode),  
such that upon power-up, the device only consumes operational level power after appropriately  
programming the device.  
When single-shot mode is selected by writing 01b to this field, the field continues to read 01b  
while the device is actively converting. When the single-shot conversion is complete, the mode  
of conversion operation field is automatically set to 00b and the device is shut down.  
When the device enters shutdown mode, either by completing a single-shot conversion or by a  
manual write to the configuration register, there is no change to the state of the reporting flags  
(conversion ready, flag high, flag low) or the INT pin. These signals are retained for  
subsequent read operations while the device is in shutdown mode.  
00 = Shutdown (default)  
10:9  
M[1:0]  
R/W  
00b  
01 = Single-shot  
10, 11 = Continuous conversions  
Overflow flag field (read-only).  
The overflow flag field indicates when an overflow condition occurs in the data conversion  
process, typically because the light illuminating the device exceeds the programmed full-scale  
range of the device. Under this condition OVF is set to 1, otherwise OVF remains at 0. The  
field is reevaluated on every measurement.  
If the full-scale range is manually set (RN[3:0] field < 1100b), the overflow flag field can be set  
while the result register reports a value less than full-scale. This result occurs if the input light  
has a temporary high spike level that temporarily overloads the integrating ADC converter  
circuitry but returns to a level within range before the conversion is complete. Thus, the  
overflow flag reports a possible error in the conversion process. This behavior is common to  
integrating-style converters.  
8
OVF  
R
0b  
If the full-scale range is automatically set (RN[3:0] field = 1100b), the only condition that sets  
the overflow flag field is if the input light is beyond the full-scale level of the entire device.  
When there is an overflow condition and the full-scale range is not at maximum, the OPT3006  
aborts its current conversion, sets the full-scale range to a higher level, and starts a new  
conversion. The flag is set at the end of the process. This process repeats until there is either  
no overflow condition or until the full-scale range is set to its maximum range.  
Conversion ready field (read-only).  
The conversion ready field indicates when a conversion completes. The field is set to 1 at the  
end of a conversion and is cleared (set to 0) when the configuration register is subsequently  
read or written with any value except one containing the shutdown mode (mode of operation  
field, M[1:0] = 00b). Writing a shutdown mode does not affect the state of this field; see the  
Interrupt Reporting Mechanism Modes section for more details.  
7
6
5
CRF  
FH  
R
R
R
0b  
0b  
0b  
Flag high field (read-only).  
The flag high field (FH) identifies that the result of a conversion is larger than a specified level  
of interest. FH is set to 1 when the result is larger than the level in the high-limit register  
(register address 03h) for a consecutive number of measurements defined by the fault count  
field (FC[1:0]). See the Interrupt Reporting Mechanism Modes section for more details on  
clearing and other behaviors of this field.  
Flag low field (read-only).  
The flag low field (FL) identifies that the result of a conversion is smaller than a specified level  
of interest. FL is set to 1 when the result is smaller than the level in the low-limit register  
(register address 02h) for a consecutive number of measurements defined by the fault count  
field (FC[1:0]). See the Interrupt Reporting Mechanism Modes section for more details on  
clearing and other behaviors of this field.  
FL  
22  
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Table 10. Configuration Register Field Descriptions (continued)  
Bit  
Field  
Type  
Reset  
Description  
Latch field (read or write).  
The latch field controls the functionality of the interrupt reporting mechanisms: the INT pin, the  
flag high field (FH), and flag low field (FL). This bit selects the reporting style between a  
latched window-style comparison and a transparent hysteresis-style comparison.  
0 = The device functions in transparent hysteresis-style comparison operation, where the three  
interrupt reporting mechanisms directly reflect the comparison of the result register with the  
high- and low-limit registers with no user-controlled clearing event. See the Interrupt Operation,  
INT Pin, and Interrupt Reporting Mechanisms section for further details.  
4
L
R/W  
1b  
1 = The device functions in latched window-style comparison operation, latching the interrupt  
reporting mechanisms until a user-controlled clearing event.  
Polarity field (read or write).  
The polarity field controls the polarity or active state of the INT pin.  
0 = The INT pin reports active low, pulling the pin low upon an interrupt event.  
1 = Operation of the INT pin is inverted, where the INT pin reports active high, becoming high  
impedance and allowing the INT pin to be pulled high upon an interrupt event.  
3
2
POL  
ME  
R/W  
R/W  
0b  
0b  
Mask exponent field (read or write).  
The mask exponent field forces the result register exponent field (register 00h, bits E[3:0]) to  
0000b when the full-scale range is manually set, which can simplify the processing of the  
result register when the full-scale range is manually programmed. This behavior occurs when  
the mask exponent field is set to 1 and the range number field (RN[3:0]) is set to less than  
1100b. Note that the masking is only performed to the result register. When using the interrupt  
reporting mechanisms, the result comparison with the low-limit and high-limit registers is  
unaffected by the ME field.  
Fault count field (read or write).  
The fault count field instructs the device as to how many consecutive fault events are required  
to trigger the interrupt reporting mechanisms: the INT pin, the flag high field (FH), and flag low  
field (FL). The fault events are described in the latch field (L), flag high field (FH), and flag low  
1:0  
FC[1:0]  
R/W  
00b  
field (FL) descriptions.  
00 = One fault count (default)  
01 = Two fault counts  
10 = Four fault counts  
11 = Eight fault counts  
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7.6.1.1.3 Low-Limit Register (offset = 02h) [reset = C0000h]  
This register sets the lower comparison limit for the interrupt reporting mechanisms: the INT pin, the flag high  
field (FH), and flag low field (FL), as described in the Interrupt Reporting Mechanism Modes section.  
Figure 25. Low-Limit Register  
15  
14  
13  
12  
11  
10  
9
8
LE3  
R/W  
LE2  
R/W  
LE1  
R/W  
LE0  
R/W  
TL11  
R/W  
TL10  
R/W  
TL9  
R/W  
TL8  
R/W  
7
6
5
4
3
2
1
0
TL7  
R/W  
TL6  
R/W  
TL5  
R/W  
TL4  
R/W  
TL3  
R/W  
TL2  
R/W  
TL1  
R/W  
TL0  
R/W  
LEGEND: R/W = Read/Write  
Table 11. Low-Limit Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
Exponent.  
15:12  
LE[3:0]  
R/W  
0h  
These bits are the exponent bits. Table 12 provides further details.  
Result.  
11:0  
TL[11:0]  
R/W  
000h  
These bits are the result in straight binary coding (zero to full-scale).  
The format of this register is nearly identical to the format of the result register described in the Result Register.  
The low-limit register exponent (LE[3:0]) is similar to the result register exponent (E[3:0]). The low-limit register  
result (TL[11:0]) is similar to result register result (R[11:0]).  
The equation to translate this register into the lux threshold is given in Equation 4, which is similar to the  
equation for the result register, Equation 3.  
lux = 0.01 × (2LE[3:0]) × TL[11:0]  
(4)  
Table 12 gives the full-scale range and LSB size as it applies to the low-limit register. The detailed discussion  
and examples given in for the Result Register apply to the low-limit register as well.  
Table 12. Full-Scale Range and LSB Size as a Function of Exponent Level  
LE3  
0
LE2  
0
LE1  
0
LE0  
0
FULL-SCALE RANGE (lux)  
40.95  
LSB SIZE (lux per LSB)  
0.01  
0.02  
0.04  
0.08  
0.16  
0.32  
0.64  
1.28  
2.56  
5.12  
10.24  
20.48  
0
0
0
1
81.90  
0
0
1
0
163.80  
0
0
1
1
327.60  
0
1
0
0
655.20  
0
1
0
1
1310.40  
0
1
1
0
2620.80  
0
1
1
1
5241.60  
1
0
0
0
10483.20  
20966.40  
41932.80  
83865.60  
1
0
0
1
1
0
1
0
1
0
1
1
NOTE  
The result and limit registers are all converted into lux values internally for comparison.  
These registers can have different exponent fields. However, when using a manually-set  
full-scale range (configuration register, RN < 0Ch, with mask enable (ME) active),  
programming the manually-set full-scale range into the LE[3:0] and HE[3:0] fields can  
simplify the choice of programming the register. This simplification results in the user only  
having to think about the fractional result and not the exponent part of the result.  
24  
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7.6.1.1.4 High-Limit Register (offset = 03h) [reset = BFFFh]  
The high-limit register sets the upper comparison limit for the interrupt reporting mechanisms: the INT pin, the  
flag high field (FH), and flag low field (FL), as described in the Interrupt Operation, INT Pin, and Interrupt  
Reporting Mechanisms section. The format of this register is almost identical to the format of the low-limit register  
(described in the Low-Limit Register) and the result register (described in the Result Register). To explain the  
similarity in more detail, the high-limit register exponent (HE[3:0]) is similar to the low-limit register exponent  
(LE[3:0]) and the result register exponent (E[3:0]). The high-limit register result (TH[11:0]) is similar to the low-  
limit result (TH[11:0]) and the result register result (R[11:0]). Note that the comparison of the high-limit register  
with the result register is unaffected by the ME bit.  
When using a manually-set, full-scale range with the mask enable (ME) active, programming the manually-set,  
full-scale range into the HE[3:0] bits can simplify the choice of values required to program into this register. The  
formula to translate this register into lux is similar to Equation 4. The full-scale values are similar to Table 8.  
Figure 26. High-Limit Register  
15  
14  
13  
12  
11  
10  
9
8
HE3  
R/W  
HE2  
R/W  
HE1  
R/W  
HE0  
R/W  
TH11  
R/W  
TH10  
R/W  
TH9  
R/W  
TH8  
R/W  
7
6
5
4
3
2
1
0
TH7  
R/W  
TH6  
R/W  
TH5  
R/W  
TH4  
R/W  
TH3  
R/W  
TH2  
R/W  
TH1  
R/W  
TH0  
R/W  
LEGEND: R/W = Read/Write  
Table 13. High-Limit Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
Exponent.  
These bits are the exponent bits.  
15:12  
HE[3:0]  
R/W  
Bh  
Result.  
11:0  
TH[11:0]  
R/W  
FFFh  
These bits are the result in straight binary coding (zero to full-scale).  
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7.6.1.1.5 Manufacturer ID Register (offset = 7Eh) [reset = 5449h]  
This register is intended to help uniquely identify the device.  
Figure 27. Manufacturer ID Register  
15  
ID15  
R
14  
ID14  
R
13  
ID13  
R
12  
ID12  
R
11  
ID11  
R
10  
ID10  
R
9
ID9  
R
8
ID8  
R
7
ID7  
R
6
ID6  
R
5
ID5  
R
4
ID4  
R
3
ID3  
R
2
ID2  
R
1
ID1  
R
0
ID0  
R
LEGEND: R = Read only  
Table 14. Manufacturer ID Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
Manufacturer ID.  
15:0  
ID[15:0]  
R
5449h  
The manufacturer ID reads 5449h. In ASCII code, this register reads TI.  
7.6.1.1.6 Device ID Register (offset = 7Fh) [reset = 3001h]  
This register is also intended to help uniquely identify the device.  
Figure 28. Device ID Register  
15  
DID15  
R
14  
DID14  
R
13  
DID13  
R
12  
DID12  
R
11  
DID11  
R
10  
DID10  
R
9
DID9  
R
8
DID8  
R
7
DID7  
R
6
DID6  
R
5
DID5  
R
4
DID4  
R
3
DID3  
R
2
DID2  
R
1
DID1  
R
0
DID0  
R
LEGEND: R = Read only  
Table 15. Device ID Register Field Descriptions  
Bit  
Field  
Type  
Reset  
Description  
Device ID.  
The device ID reads 3001h.  
15:0  
DID[15:0]  
R
3001h  
26  
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8 Application and Implementation  
NOTE  
Information in the following applications sections is not part of the TI component  
specification, and TI does not warrant its accuracy or completeness. TI’s customers are  
responsible for determining suitability of components for their purposes. Customers should  
validate and test their design implementation to confirm system functionality.  
8.1 Application Information  
Ambient light sensors are used in a wide variety of applications that require control as a function of ambient light.  
Because ambient light sensors nominally match the human eye spectral response, they are superior to  
photodiodes when the goal is to create an experience for human beings. Very common applications include  
display optical-intensity control and industrial or home lighting control.  
There are two categories of interface to the OPT3006: electrical and optical.  
8.1.1 Electrical Interface  
The electrical interface is quite simple, as illustrated in Figure 29. Connect the OPT3006 I2C SDA and SCL pins  
to the same pins of an applications processor, microcontroller, or other digital processor. If that digital processor  
requires an interrupt resulting from an event of interest from the OPT3006, then connect the INT pin to either an  
interrupt or general-purpose I/O pin of the processor. There are multiple uses for this interrupt, including signaling  
the system to wake up from low-power mode, processing other tasks while waiting for an ambient light event of  
interest, or alerting the processor that a sample is ready to be read. Connect pullup resistors between a power  
supply appropriate for digital communication and the SDA and SCL pins (because they have open-drain output  
structures). If the INT pin is used, connect a pullup resistor to the INT pin. A typical value for these pullup  
resistors is 10 kΩ. The resistor choice can be optimized in conjunction to the bus capacitance to balance the  
system speed, power, noise immunity, and other requirements.  
The power supply and grounding considerations are discussed in the Power-Supply Recommendations section.  
Although spike suppression is integrated in the SDA and SCL pin circuits, use proper layout practices to  
minimize the amount of coupling into the communication lines. One possible introduction of noise occurs from  
capacitively coupling signal edges between the two communication lines themselves. Another possible noise  
introduction comes from other switching noise sources present in the system, especially for long communication  
lines. In noisy environments, shield communication lines to reduce the possibility of unintended noise coupling  
into the digital I/O lines that could be incorrectly interpreted.  
8.1.2 Optical Interface  
The optical interface is physically located on the same side of the device as the electrical interface, as shown in  
the Sensing Area of the mechanical packages at the end of this data sheet. At a system level, this configuration  
requires that the light that illuminates the sensor must come through the PCB or FPCB. Typically, the best  
solution is to create a cutout area in the PCB. Other solutions are possible, but with associated design trade-offs.  
This cutout must be carefully designed because the dimensions and tolerances impact the net-system, optical  
field-of-view performance. The design of this cutout is discussed more in the Design Requirements section.  
Physical components, such as a plastic housing and a window that allows light from outside of the design to  
illuminate the sensor (see Figure 30), can help protect the OPT3006 and neighboring circuitry. Sometimes, a  
dark or opaque window is used to further enhance the visual appeal of the design by hiding the sensor from  
view. This window material is typically transparent plastic or glass.  
Any physical component that affects the light that illuminates the sensing area of a light sensor also affects the  
performance of that light sensor. Therefore, for optimal performance, make sure to understand and control the  
effect of these components. Design a window width and height to permit light from a sufficient field of view to  
illuminate the sensor. For best performance, use a field of view of at least ±35°, or ideally ±45° or more.  
Understanding and designing the field of view is discussed further in application report SBEA002, OPT3001:  
Ambient Light Sensor Application Guide.  
Copyright © 2016, Texas Instruments Incorporated  
27  
OPT3006  
ZHCSFL9 OCTOBER 2016  
www.ti.com.cn  
Application Information (continued)  
The visible-spectrum transmission for dark windows typically ranges between 5% to 30%, but can be less than  
1%. Specify a visible-spectrum transmission as low as, but no more than, necessary to achieve sufficient visual  
appeal because decreased transmission decreases the available light for the sensor to measure. The windows  
are made dark by either applying an ink to a transparent window material, or including a dye or other optical  
substance within the window material itself. This attenuating transmission in the visible spectrum of the window  
creates a ratio between the light on the outside of the design and the light that is measured by the OPT3006. To  
accurately measure the light outside of the design, compensate the OPT3006 measurement for this ratio.  
Ambient light sensors are used to help create ideal lighting experiences for humans; therefore, the matching of  
the sensor spectral response to that of the human eye response is vital. Infrared light is not visible to the human  
eye, and can interfere with the measurement of visible light when sensors lack infrared rejection. Therefore, the  
ratio of visible light to interfering infrared light affects the accuracy of any practical system that represents the  
human eye. The strong rejection of infrared light by the OPT3006 allows measurements consistent with human  
perception under high-infrared lighting conditions, such as from incandescent, halogen, or sunlight sources.  
Although the inks and dyes of dark windows serve their primary purpose of being minimally transmissive to  
visible light, some inks and dyes can also be very transmissive to infrared light. The use of these inks and dyes  
further decreases the ratio of visible to infrared light, and thus decreases sensor measurement accuracy.  
However, because of the excellent infrared rejection of the OPT3006, this effect is minimized, and good results  
are achieved under a dark window with similar spectral responses to those shown in Figure 32.  
For best accuracy, avoid grill-like window structures, unless the designer understands the optical effects  
sufficiently. These grill-like window structures create a nonuniform illumination pattern at the sensor that make  
light measurement results vary with placement tolerances and angle of incidence of the light. If a grill-like  
structure is desired, the OPT3006 is an excellent sensor choice because it is minimally sensitive to illumination  
uniformity issues disrupting the measurement process.  
Light pipes can appear attractive for aiding in the optomechanical design that brings light to the sensor; however,  
do not use light pipes with any ambient light sensor unless the system designer fully understands the  
ramifications of the optical physics of light pipes within the full context of his design and objectives.  
8.2 Typical Application  
Measuring the ambient light with the OPT3006 mounted on a flexible printed circuit board (FPCB) is described in  
this section. The schematic for this design is shown in Figure 29.  
VDD  
VDD  
OPT3006  
Digital Processor  
SCL  
SDA  
INT  
SCL  
SDA  
Ambient  
Light  
I2C  
Interface  
Optical  
Filter  
ADC  
INT or GPIO  
ADDR  
GND  
Figure 29. Measuring Ambient Light on an FPCB  
28  
Copyright © 2016, Texas Instruments Incorporated  
 
OPT3006  
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ZHCSFL9 OCTOBER 2016  
Typical Application (continued)  
8.2.1 Design Requirements  
This design focuses on the field of view, or angular response, of an OPT3006 mounted on an FPCB with an area  
cut out that permits light to illuminate the sensor. As a result of the geometry of this cutout, the system field of  
view (angular response) depends on the axis of rotation. One axis of rotation has a less restricted field of view,  
and the other axis of rotation has a more restricted field of view. The basic requirements of this design are:  
Mount the OPT3006 onto an FPCB with a cutout that allows light to illuminate the sensor.  
The field of view along the axis of rotation with the less restricted field of view must match the device  
performance.  
The field of view for the more restricted axis of rotation must be minimum of ±30°.  
Field of view is traditionally defined as the angle at which the angular response is 50% of the maximum value of  
the system response.  
8.2.2 Detailed Design Procedure  
8.2.2.1 Optomechanical Design  
After completing the electrical design (see Figure 29), the next task is the optomechanical design of the FPCB  
cutout. Design this cutout in conjunction with the tolerance capabilities of the FPCB manufacturer. Or,  
conversely, choose the FPCB manufacturer for its capabilities of optimally creating this cutout. A semi-  
rectangular shape of the cutout, created with a standard FPCB laser, is presented here. There are many  
alternate approaches with different cost, tolerance, and performance tradeoffs.  
An image of the created FPCB with the rectangular cutout is shown in Figure 30. The long (vertical) direction of  
the cutout obviously has no effect on the angular response because any shadows created from the FPCB do not  
come near the sensor. The long cutout direction defines the axis of rotation with the less restricted field of view.  
The narrow (horizontal) direction of the cutout, which is limited by the electrical connections to OPT3006, can  
create shadows that can have a minor impact on the angular response. The narrow cutout direction defines the  
axis of rotation of the more restricted view. The possibility of shadows are illustrated in Figure 31, a cross-  
sectional diagram showing the OPT3006 device, with the sensing area, soldered to the FPCB with the cutout.  
Figure 30. Image of FPCB With OPT3006 Mounted, Receiving Light Through the Cutout  
Device  
Illuminated  
Sensor  
Shadowed  
Sensor  
Copper Pillar Electrical Connection  
Solder  
Sensing Area  
Shadow  
FPCB  
FPCB  
Shadow Limiting  
Point  
Light entering from  
30 degree angle  
Figure 31. Cross-Sectional Diagram of OPT3006 Soldered to an FPCB With a Cutout, Including Light  
Entering From an Angle  
Copyright © 2016, Texas Instruments Incorporated  
29  
 
 
 
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Typical Application (continued)  
To design the angular response to have greater than 50% response at 30°, the optical mechanisms must be  
understood. This analysis is simplified by assuming a perfectly rectangular cutout. The concepts for this  
rectangular cutout apply to nonrectangular cutouts, but require a more complex 3D analysis. The analysis  
performed here is approximate because the actual cutout is not perfectly rectangular.  
The net system response is the response of the device without the shadowing effect, multiplied by the  
percentage of the device that is illuminated, per Equation 5:  
Net System Response (%) = Device Response (%) × Device Illumination (%)  
(5)  
The shadow impacts the percentage of the sensor that can be illuminated, as seen in Figure 31. The percent  
response of a shadowed sensor is the percent of the sensor that is illuminated.  
The percent of the sensor that must be illuminated to achieve > 50% response is derived by the sequence of  
Equation 6 through Equation 8.  
Net System Response > 50%  
(6)  
(7)  
(8)  
Device Response × Device Illumination > 50%  
Device Illumination > 50% / Device Response  
The device has a 75% response at 30°, as shown in Figure 13, and is a little less than the expected cosine of  
30°. The resulting device illumination is shown inEquation 9.  
Device Illumination > 66%  
(9)  
Hence, the 3-dimensional geometry illustrated in Figure 31 must permit greater than 66% of the sensor to be  
illuminated at a 30° angle of incident light. To quantify the geometry of this design, the post-SMT solder thickness  
is approximately 37 µm (half the thickness of the pre-SMT solder paste thickness), the copper pillar electrical  
connection is 7 µm, and the FPCB is 105 µm. Therefore, the shadow limiting point is 37 µm + 7 µm + 105 µm =  
149 µm, higher than the sensing surface. The 30° angle shadow extends beyond that shadow limiting point per  
Equation 10.  
Shadow = Tan (Illumination_Angle) × Shadow_limiting_height = Tan (30degrees) × 149 µm = 86 µm  
(10)  
For this instance of the design and tolerance, the shadow limiting point of FPCB cutout is roughly even with the  
sensor edge, so 86 µm of the sensor is under shadow. If the shadow limiting point was not even with the sensor  
edge because of either the design or the tolerances, an extra term is added per the system geometry. Given that  
the sensor width is 381 µm (per the attached mechanical drawing at the end of this data sheet), the amount of  
illuminated sensor is 381 µm – 86 µm = 295 µm = 77.4%.  
The net response at the 30° angle is predicted byEquation 11  
Net System Response = Device Response × Device Illumination = 75% × 77.4% = 58%  
(11)  
There might be an additional need to put a product casing over the assembly of OPT3006 and the FPCB. The  
window sizing and placement for such an assembly is discussed in more rigorous detail in application report  
OPT3001: Ambient Light Sensor Application Guide (SBEA002).  
30  
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OPT3006  
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Typical Application (continued)  
8.2.3 Application Curves  
To validate the angular response of the design, put a light source in a fixed position, allow the device assembly  
to rotate, and take device measurements at a series of angles. The resulting angular response of this design  
along the less-restricted rotational axis is shown in Figure 32. The resulting angular response of the more-  
restricted rotational axis is shown in Figure 33. The response of the device at a 30° angle is approximately 60%,  
and is very close to the 58% predicted by Equation 11 in the preceding analysis.  
1
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
1
0.9  
0.8  
0.7  
0.6  
0.5  
0.4  
0.3  
0.2  
0.1  
0
-90 -75 -60 -45 -30 -15  
0
15 30 45 60 75 90  
-90 -75 -60 -45 -30 -15  
0
15 30 45 60 75 90  
Incidence Angle (Degrees)  
Incidence Angle (Degrees)  
D010  
D022  
Figure 32. Angular Response of this FPCB Design Along  
the Less-Restricted Rotational Axis  
Figure 33. Angular Response of this FPCB Design Along  
the More-Restricted Rotational Axis  
8.3 Do's and Don'ts  
As with any optical product, take special care when handling the OPT3006. The OPT3006 is a piece of active  
silicon, without the mechanical protection of an epoxy-like package or other reenforcement. This design allows  
the device to be as thin as possible. Take extra care to handle the device gently in order to not crack or break  
the device. Use a properly-sized vacuum manipulation tool to handle the device.  
Although the OPT3006 has low sensitivity to dust and scratches, proper optical device handling procedures are  
still required.  
The optical surface of the device must be kept clean for optimal performance, both when prototyping with the  
device, and during mass production manufacturing procedures. Keep the optical surface clean of fingerprints,  
dust, and other optical-inhibiting contaminants.  
If the optical surface of the device requires cleaning, use a few gentle brushes with a soft swab of deionized  
water or isopropyl alcohol. Avoid potentially abrasive cleaning and manipulating tools and excessive force that  
can scratch the optical surface.  
If the OPT3006 performs less than optimally, inspect the optical surface for dirt, scratches, or other optical  
artifacts.  
9 Power-Supply Recommendations  
Although the OPT3006 has low sensitivity to power-supply issues, good practices are always recommended. For  
best performance, the OPT3006 VDD pin must have a stable, low-noise power supply with a 100-nF bypass  
capacitor close to the device, and solid grounding. There are many options for powering the OPT3006 because  
the device current consumption levels are very low.  
Copyright © 2016, Texas Instruments Incorporated  
31  
 
 
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10 Layout  
10.1 Layout Guidelines  
The PCB layout design for the OPT3006 requires a couple of considerations. The design of the cutout to allow  
light to illuminate the sensor is a critical part of this design. See the Optomechanical Design section for a more  
detailed discussion of creating this cutout.  
The device layout is also critical for optimal SMT assembly. Two types of land pattern pads can be used for this  
package: solder mask defined pads (SMD) and non-solder mask defined pads (NSMD). SMD pads have a solder  
mask opening that is smaller than the metal pads, whereas NSMD has a solder mask opening that is larger than  
the metal pad.Figure 34 illustrates these types of landing-pattern pads. SMD is preferred because it provides a  
more accurate soldering-pad dimension with the trace connections. For further discussion of SMT and PCB  
recommendations, see the Soldering and Handling Recommendations section.  
Figure 34. Soldermask Defined Pad (SMD) and Non-Soldermask Defined Pad (NSMD)  
Stabilize the power supply with a capacitor placed close to the OPT3006 VDD and GND pins. Note that optically  
reflective surfaces of components also affect the performance of the design. The three-dimensional geometry of  
all components and structures around the sensor must be taken into consideration to prevent unexpected results  
from secondary optical reflections. Placing capacitors and components at a distance of at least twice the height  
of the component is usually sufficient, although further placement can still achieve good results. The most  
optimal optical layout is to place all close components on the opposite side of the PCB from the OPT3006.  
However, this approach may not be practical for the constraints of every design.  
An example PCB layout with the OPT3006 is shown in Figure 36.  
10.2 Soldering and Handling Recommendations  
The OPT3006 is a very small device with special soldering and handling considerations. See Optomechanical  
Design for implications of alignment between the device and the cutout area. See Layout Guidelines for  
considerations of the soldering pads.  
As with most optical devices, handle the OPT3006 with special care to make sure optical surfaces stay clean and  
free from damage. See the Do's and Don'ts section for more detailed recommendations. For best optical  
performance, clean solder flux and any other possible debris after soldering processes.  
32  
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Soldering and Handling Recommendations (continued)  
10.2.1 Solder Paste  
For solder-paste deposition, use a stencil-printing process that involves the transfer of solder paste through  
predefined apertures with the application of pressure. Stencil parameters, such as aperture area ratio and  
fabrication process, have a significant impact on paste deposition. Cut the stencil apertures using a laser with an  
electropolish-fabrication method. Taper the stencil aperture walls by 5° to facilitate paste release. Shifting the  
solder-paste towards the outside of the device minimizes the possibility of solder getting into the device sensing  
area. See the mechanical packages attached to the end of this data sheet.  
Use solder paste selection type 4 or higher, no-clean, lead-free solder paste. If solder splatters in the reflow  
process, choose a solder paste with normal- or low-flux contents, or alter the reflow profile per the Reflow Profile  
section.  
10.2.2 Package Placement  
Use a pick-and-place nozzle with a size number larger than 0.6 mm. If the placement method is done by  
programming the component thickness, add 0.04 mm to the actual component thickness so that the package sits  
halfway into the solder paste. If placement is by force, then choose minimum force no larger than 3N in order to  
avoid forcing out solder paste, or free falling the package, and to avoid soldering problems such as bridging and  
solder balling.  
10.2.3 Reflow Profile  
Use the profile in Figure 35, and adjust if necessary. Use a slow solder reflow ramp rate of 1°C to 1.2°C/s to  
minimize chances of solder splattering onto the sensing area.  
Figure 35. Recommended Solder Reflow Temperature Profile  
Copyright © 2016, Texas Instruments Incorporated  
33  
 
 
OPT3006  
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Soldering and Handling Recommendations (continued)  
10.2.4 Special Flexible Printed Circuit Board (FPCB) Recommendations  
Special flexible printed circuit board (FPCB) design recommendations include:  
Fabricate per IPC-6013.  
Use material of flexible copper clad per IPC 4204/11 (Define polyimide and copper thickness per product  
application).  
Finish: All exposed copper will be electroless Ni immersion gold (ENIG) per IPC 4556.  
Solder mask per IPC SM840.  
Use a laser to create the cutout for light sensing for better accuracy, and to avoid affecting the soldering pad  
dimension. Other options, such as punched cutouts, are possible. See the Optomechanical Design section for  
further discussion ranging from the implications of the device to cutout region size and alignment. The full  
design must be considered, including the tolerances.  
To assist the handling of the very thin flexible circuit, design and fabricate a fixture to hold the flexible circuit  
through the paste-printing, pick-and-place, and reflow processes. Contact the factory for examples of such  
fixtures.  
10.2.5 Rework Process  
If the OPT3006 must be removed from a PCB, discard the device and do not reattach. To remove the package  
from the PCB/Flexi cable, heat the solder joints above liquidus temperature. Bake the board at 125°C for 4 hours  
prior to rework to remove moisture that may crack the PCB or causing delamination. Use a thermal heating  
profile to remove a package that is close to the profile that mounts the package. Clean the site to remove any  
excess solder and residue to prepare for installing a new package. Use a mini stencil (localized stencil) to apply  
solder paste to the land pattern. In case a mini stencil cannot be used because of spacing or other reasons,  
apply solder paste on the package pads directly, then mount, and reflow.  
10.3 Layout Example  
SCL  
INT  
GND  
OPT3006  
ADDR  
Microcontoller  
Capacitor  
VDD  
SDA  
Cutout  
Figure 36. Example FPCB Layout With the OPT3006  
34  
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OPT3006  
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ZHCSFL9 OCTOBER 2016  
11 器件和文档支持  
11.1 文档支持  
11.1.1 相关文档ꢀ  
相关文档如下:  
OPT3001:环境光传感器应用指南》(文献编号:SBEA002)  
OPT3006EVM 用户指南》(文献编号:SBOU181)  
应用报告《QFN/SON PCB 连接》(文献编号:SLUA271)  
11.2 接收文档更新通知  
如需接收文档更新通知,请访问 www.ti.com.cn 网站上的器件产品文件夹。点击右上角的提醒我 (Alert me) 注册  
后,即可每周定期收到已更改的产品信息。有关更改的详细信息,请查阅已修订文档中包含的修订历史记录。  
11.3 社区资源  
The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective  
contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of  
Use.  
TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration  
among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help  
solve problems with fellow engineers.  
Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and  
contact information for technical support.  
11.4 商标  
PicoStar, E2E are trademarks of Texas Instruments.  
All other trademarks are the property of their respective owners.  
11.5 静电放电警告  
ESD 可能会损坏该集成电路。德州仪器 (TI) 建议通过适当的预防措施处理所有集成电路。如果不遵守正确的处理措施和安装程序 , 可  
能会损坏集成电路。  
ESD 的损坏小至导致微小的性能降级 , 大至整个器件故障。 精密的集成电路可能更容易受到损坏 , 这是因为非常细微的参数更改都可  
能会导致器件与其发布的规格不相符。  
11.6 Glossary  
SLYZ022 TI Glossary.  
This glossary lists and explains terms, acronyms, and definitions.  
12 机械、封装和可订购信息  
以下页中包括机械、封装和可订购信息。这些信息是针对指定器件可提供的最新数据。这些数据会在无通知且不对  
本文档进行修订的情况下发生改变。欲获得该数据表的浏览器版本,请查阅左侧的导航栏。  
版权 © 2016, Texas Instruments Incorporated  
35  
PACKAGE OPTION ADDENDUM  
www.ti.com  
11-Jan-2022  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
OPT3006YMFR  
OPT3006YMFT  
ACTIVE  
ACTIVE  
PICOSTAR  
PICOSTAR  
YMF  
YMF  
6
6
3000 RoHS & Green  
250 RoHS & Green  
CUNIPD  
Level-1-260C-UNLIM  
Level-1-260C-UNLIM  
-40 to 85  
-40 to 85  
6F  
6F  
CUNIPD  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
www.ti.com  
11-Jan-2022  
Addendum-Page 2  
PACKAGE OUTLINE  
YMF0006A  
PicoStar TM - 0.226 mm max height  
S
C
A
L
E
1
5
.
0
0
0
PicoStar  
0.886  
0.826  
A
B
PIN A1  
CORNER  
0.976  
0.916  
C
0.226 MAX  
0.0087 TYP  
SEATING PLANE  
0.007  
OPTICAL FILTER  
(0.04) TYP  
ALL AROUND  
(0.381)  
SENSING AREA PULL BACK  
C
SENSING AREA  
(0.378)  
PKG  
B
0.7  
TYP  
(0.298)  
D: Max = 0.976 mm, Min =0.916 mm  
0.35  
TYP  
E: Max = 0.886 mm, Min =0.826 mm  
(0.005)  
OPTICAL FILTER  
OFFSET OF PKG CENTER  
A
0.18  
6X  
1
2
0.12  
(0.461)  
0.6  
0.015  
C A B  
4222902/A 05/2016  
PicoStar is a trademark of Texas Instruments.  
NOTES:  
1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
www.ti.com  
EXAMPLE BOARD LAYOUT  
YMF0006A  
PicoStar TM - 0.226 mm max height  
PicoStar  
(0.3) TYP  
(
0.15) TYP  
SOLDER MASK  
OPENING  
1
2
A
(0.35) TYP  
SYMM  
B
C
(
0.25)  
METAL UNDER  
SOLDER MASK  
PCB CUTOUT  
SYMM  
(REFER TO THE LAYOUT GUIDELINES  
SECTION OF THE DATASHEET)  
LAND PATTERN EXAMPLE  
SCALE: 55X  
4222902/A 05/2016  
NOTES: (continued)  
3. Final dimensions may vary due to manufacturing tolerance considerations and also routing constraints.  
For more information, see Texas Instruments literature number SLUA271 (www.ti.com/lit/slua271).  
www.ti.com  
EXAMPLE STENCIL DESIGN  
YMF0006A  
PicoStar TM - 0.226 mm max height  
PicoStar  
(0.315)  
TYP  
(0.21)  
TYP  
2
1
A
B
(0.35)  
TYP  
SYMM  
(R0.05)  
TYP  
C
6X ( 0.15)  
SOLDER MASK  
OPENING  
6X METAL UNDER  
SOLDER MASK  
SYMM  
SOLDER PASTE EXAMPLE  
BASED on 0.075 mm THICK STENCIL  
SCALE: 55X  
4222902/A 05/2016  
NOTES: (continued)  
4. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release.  
www.ti.com  
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