LF411MWGRLQMLV [TI]
航天级、单路、30V、3MHz、低失调电压运算放大器 | NAC | 10 | -55 to 125;型号: | LF411MWGRLQMLV |
厂家: | TEXAS INSTRUMENTS |
描述: | 航天级、单路、30V、3MHz、低失调电压运算放大器 | NAC | 10 | -55 to 125 放大器 CD 运算放大器 |
文件: | 总20页 (文件大小:699K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
LF411QML
LF411QML Low Offset, Low Drift JFET Input Operational Amplifier
Literature Number: SNOSAO6B
June 30, 2011
LF411QML
Low Offset, Low Drift JFET Input Operational Amplifier
General Description
Features
This device is a low cost, high speed, JFET input operational
amplifier with very low input offset voltage and guaranteed
input offset voltage drift. It requires low supply current yet
maintains a large gain bandwidth product and fast slew rate.
In addition, well matched high voltage JFET input devices
provide very low input bias and offset currents. The
LF411QML is pin compatible with the standard LM741 allow-
ing designers to immediately upgrade the overall perfor-
mance of existing designs.
Available with radiation guarantee
■
ELDRS FREE
100 krad(Si)
0.5 mV(Typ)
—
Internally trimmed offset voltage:
Input offset voltage drift:
Low input bias current:
Low input noise current:
Wide gain bandwidth:
High slew rate:
Low supply current:
High input impedance:
Low total harmonic distortion:
■
■
■
■
■
■
■
■
■
10 μV/°C
50 pA
0.01 pA/√Hz
3 MHz
10V/μs
1.8 mA
1012Ω
This amplifier may be used in applications such as high speed
integrators, fast D/A converters, sample and hold circuits and
many other circuits requiring low input offset voltage and drift,
low input bias current, high input impedance, high slew rate
and wide bandwidth.
<0.0
2%
AV = 10, RL = 10KΩ,
VO = 20VP-P, BW = 20Hz - 20KHz
Low 1/f noise corner:
50 Hz
■
■
Fast settling time to 0.01%:
2 μs
Ordering Information
NS Part Number
LF411MH/883
SMD Part Number
NS Package Number
H08C
Package Description
8LD T0–99 Can
LF411MWG/883
WG10A
10LD Ceramic SOIC
10LD Ceramic SOIC
LF411MWG-MLS
50 krad(Si)
WG10A
(Note 9)
LF411MWGRLQMLV
100 krad(Si)
5962R1122201VZA
ELDRS Free
WG10A
10LD Ceramic SOIC
(Note 10)
Connection Diagrams
Metal Can Package
10LD Ceramic SOIC Package
20149244
Top View
See NS Package Number WG10A
20149205
Note: Pin 4 connected to case.
Top View
See NS Package Number H08A
BI-FET II™ is a trademark of National Semiconductor Corporation.
© 2011 National Semiconductor Corporation
201492
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Simplified Schematic
20149206
Detailed Schematic
20149234
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2
Absolute Maximum Ratings (Note 1)
Supply Voltage
±18V
±30V
±15V
Differential Input Voltage
Input Voltage Range (Note 4)
Output Short Circuit Duration
Power Dissipation (Note 2), (Note 3)
H Package
Continuous
670mW
670mW
WG Package
TJmax
H Package
WG Package
150°C
150°C
Thermal Resistance
ꢀθJA
H Package Still Air
H Package 500LF/Min Air Flow
WG Package Still Air
WG Package 500LF/Min Air Flow
ꢀθJC
162°C/W
65°C/W
170°C/W
120°C/W
H Package
WG Package
20°C/W
26°C/W
Operating Temperature Range
−55°C ≤ TA ≤ 125°C
Storage Temperature Range
−65°C ≤ TA ≤ 150°C
Lead Temperature (Soldering, 10 seconds)
Package Weight (Typical)
H Package
WG Package
ESD Tolerance (Note 5)
260°C
TBD
220mg
750V
Quality Conformance Inspection
Mil-Std-883, Method 5005 - Group A
Subgroup
Description
Static tests at
Temp °C
+25
1
2
Static tests at
+125
-55
3
Static tests at
4
Dynamic tests at
Dynamic tests at
Dynamic tests at
Functional tests at
Functional tests at
Functional tests at
Switching tests at
Switching tests at
Switching tests at
Settling time at
Settling time at
Settling time at
+25
5
+125
-55
6
7
+25
8A
8B
9
+125
-55
+25
10
11
12
13
14
+125
-55
+25
+125
-55
3
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LF411 883 Electrical Characteristics
DC Parameters
The following conditions apply, unless otherwise specified.
DC: VCC = ±15V, VCM = 0V, RS = 0Ω
Sub-
groups
Symbol
VIO
Parameter
Conditions
RS = 10KΩ
Notes
Min Max
Unit
Input Offset Voltage
-2.0
-3.7
-3.3
-0.1
-25
2.0
3.7
3.3
0.1
25
mV
mV
mV
nA
nA
nA
nA
V
1
2
3
IIO
Input Offset Current
Input Bias Current
1
(Note 8)
2
±IIB
-0.2
-50
0.2
50
1
2
(Note 8)
(Note 6)
VCM
Input Common Mode Voltage
Range
±9.0
1, 2, 3
CMRR
Common Mode Rejection Ratio
70
dB
1, 2, 3
RS ≤ 10KΩ, VCM = ±9V
+PSRR
-PSRR
IS
Supply Voltage Rejection Ratio +VCC = 6V, -VCC = -15V
Supply Voltage Rejection Ratio +VCC = 15V, -VCC = -6V
Supply Current
70
70
dB
dB
1, 2, 3
1, 2, 3
3.4
50
mA
mA
mA
mA
mA
mV
mV
V/mV
1, 2, 3
-IOS
Output Short Circuit Current
+VI = -11V, -VI = 11V,
RS = 10KΩ
13
6.0
-50
-60
8.0
1
2, 3
1
60
+IOS
Output Short Circuit Current
+VI = 11V, -VI = -11V,
RS = 10KΩ
-13
-6.0
2, 3
1
+VIO Adj
-VIO Adj
+AVS
Input Offset Voltage Adjustment
Input Offset Voltage Adjustment
Large Signal Voltage Gain
-8.0
1
(Note 7)
(Note 7)
(Note 7)
(Note 7)
25
15
25
15
12
4
VO = 0 to 10V, RL = 2KΩ
VO = 0 to 10V, RL = 2KΩ
VO = 0 to -10V, RL = 2KΩ
VO = 0 to -10V, RL = 2KΩ
V/mV
V/mV
V/mV
V
5, 6
4
-AVS
Large Signal Voltage Gain
5, 6
4, 5, 6
VO+
VO-
Output Voltage Swing
Output Voltage Swing
RL = 10KΩ, +VI = 11V,
-VI = -11V, RS = 10KΩ
-12
V
4, 5, 6
RL = 10KΩ, +VI = -11V,
-VI = 11V, RS = 10KΩ
AC Parameters
The following conditions apply, unless otherwise specified.
AC: VCC = ±15V, VCM = 0V, RS = 0Ω
Sub-
groups
Symbol
SR+
Parameter
Conditions
Notes
Min Max
Unit
Slew Rate
Slew Rate
VO = -5V to 5V
VO = 5V to -5V
8.0
8.0
2.7
V/µS
V/µS
MHz
7
7
7
SR-
GBW
Gain Bandwidth Product
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4
Space Level Electrical Characteristics
DC Parameters
The following conditions apply, unless otherwise specified.
DC: VCC = ±15V, VCM = 0V, RS = 0Ω
Sub-
groups
Symbol
VIO
Parameter
Conditions
RS = 10KΩ
Notes
Min Max
Unit
Input Offset Voltage
-2.0
-3.7
-3.3
-0.1
-25
2.0
3.7
3.3
0.1
25
mV
mV
mV
nA
nA
nA
nA
V
1
2
3
IIO
Input Offset Current
Input Bias Current
1
(Note 8)
2
±IIB
-0.2
-50
0.2
50
1
2
(Note 8)
(Note 6)
VCM
Input Common Mode Voltage
Range
±9.0
1, 2, 3
CMRR
Common Mode Rejection Ratio
70
dB
1, 2, 3
RS ≤ 10KΩ, VCM = ±9V
+PSRR
-PSRR
IS
Supply Voltage Rejection Ratio +VCC = 6V, -VCC = -15V
Supply Voltage Rejection Ratio +VCC = 15V, -VCC = -6V
Supply Current
70
70
dB
dB
1, 2, 3
1, 2, 3
3.4
50
mA
mA
mA
mA
mA
mV
mV
V/mV
1, 2, 3
-IOS
Output Short Circuit Current
+VI = -11V, -VI = 11V,
RS = 10KΩ
13
6.0
-50
-60
8.0
1
2, 3
1
60
+IOS
Output Short Circuit Current
+VI = 11V, -VI = -11V,
RS = 10KΩ
-13
-6.0
2, 3
1
+VIO Adj
-VIO Adj
+AVS
Input Offset Voltage Adjustment
Input Offset Voltage Adjustment
Large Signal Voltage Gain
-8.0
1
(Note 7)
(Note 7)
(Note 7)
(Note 7)
25
15
25
15
12
4
VO = 0 to 10V, RL = 2KΩ
VO = 0 to 10V, RL = 2KΩ
VO = 0 to -10V, RL = 2KΩ
VO = 0 to -10V, RL = 2KΩ
V/mV
V/mV
V/mV
V
5, 6
4
-AVS
Large Signal Voltage Gain
5, 6
4, 5, 6
VO+
VO-
Output Voltage Swing
Output Voltage Swing
RL = 10KΩ, +VI = 11V,
-VI = -11V, RS = 10KΩ
-12
V
4, 5, 6
RL = 10KΩ, +VI = -11V,
-VI = 11V, RS = 10KΩ
AC Parameters
The following conditions apply, unless otherwise specified.
AC: VCC = ±15V, VCM = 0V, RS = 0Ω
Sub-
groups
Symbol
SR+
Parameter
Conditions
Notes
Min Max
Unit
Slew Rate
Slew Rate
VO = -5V to 5V
VO = 5V to -5V
8.0
8.0
2.7
V/µS
V/µS
MHz
7
7
7
SR-
GBW
Gain Bandwidth Product
5
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Space Level Electrical Characteristics (Continued)
DC Parameters - Drift Values
The following conditions apply, unless otherwise specified.
DC: VCC = ±15V, VCM = 0V, RS = 0Ω “Delta calculations performed on Space Level devices at Group B Subgroup 5 ONLY”
Sub-
groups
Symbol
VIO
Parameter
Conditions
Notes
Min Max
Unit
Input Offset Voltage
Input Bias Current
Input Bias Current
−1
1
mV
nA
nA
1
1
1
+IIB
−IIB
−0.1
−0.1
0.1
0.1
LF411–MLS 50k Radiation Electrical Characteristics
DC Parameters - Post Radiation Limits (Note 9)
The following conditions apply, unless otherwise specified.
DC: VCC = ±15V, VCM = 0V, RS = 0Ω Post Radiation Limits +25°C
Sub-
groups
Symbol
Parameter
Conditions
Notes
Min Max
Unit
IIO
IIB+
IIB-
Input Offset Current
Input Bias Current
Input Bias Current
−0.25 0.25
nA
nA
nA
1
1
1
−1.0
−1.0
1.0
1.0
LF411MWGRLQMLV 100k Radiation Electrical Characteristics —
ELDRS Free Only SMD# 5962R1122201
DC Parameters - Post Radiation Limits (Note 10)
The following conditions apply, unless otherwise specified.
DC: VCC = ±15V, VCM = 0V, RS = 0Ω Post Radiation Limits +25°C
Sub-
groups
Symbol
Parameter
Conditions
Notes
Min Max
−1.0 1.0
Unit
IIO
IIB+
IIB-
Input Offset Current
Input Bias Current
Input Bias Current
nA
nA
nA
1
1
1
−0.20 6.0
−0.20 6.0
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
functional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed
specifications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test
conditions.
Note 2: The maximum power dissipation must be derated at elevated temperatures and is dictated by TJmax (maximum junction temperature), θJA (package
junction to ambient thermal resistance), and TA (ambient temperature). The maximum allowable power dissipation at any temperature is PDmax = (TJmax - TA)/
θ
JA or the number given in the Absolute Maximum Ratings, whichever is lower.
Note 3: Max. Power Dissipation is defined by the package characteristics. Operating the part near the Max. Power Dissipation may cause the part to operate
outside guaranteed limits.
Note 4: Unless otherwise specified the absolute maximum negative input voltage is equal to the negative power supply voltage.
Note 5: Human body model, 100pF discharged through 1.5KΩ.
Note 6: Parameters guaranteed by CMRR test.
Note 7: Datalog in K = V/mV.
Note 8: RS = 10KΩ @ +125°C.
Note 9: Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table.
These parts may be dose rate sensitive in a space environment and demonstrate enhanced low dose rate effect. Radiation end point limits for the noted parameters
are guaranteed only for the conditions as specified in MIL-STD-883, Method 1019
Note 10: Pre and post irradiation limits are identical to those listed under AC and DC electrical characteristics except as listed in the Post Radiation Limits Table.
These parts may be sensitive in a high dose rate environment. Low dose rate testing has been performed on a wafer-by-wafer basis, per Test Method 1019,
Condition D of MIL-STD-883, with no enhanced low dose rate sensitivity (ELDRS).
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6
Typical Connection
20149201
Typical Performance Characteristics
Input Bias Current
Input Bias Current
20149211
20149212
Supply Current
Positive Common-Mode
Input Voltage Limit
20149213
20149214
7
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Negative Common-Mode
Input Voltage Limit
Positive Current Limit
20149216
20149215
Negative Current Limit
Output Voltage Swing
20149217
20149218
Output Voltage Swing
Gain Bandwidth
20149219
20149220
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8
Bode Plot
Slew Rate
20149222
20149221
Distortion vs Frequency
Undistorted Output
Voltage Swing
20149223
20149224
Open Loop Frequency
Response
Common-Mode Rejection
Ratio
20149225
20149226
9
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Power Supply
Rejection Ratio
Equivalent Input Noise
Voltage
20149227
20149228
Open Loop Voltage Gain
Output Impedance
20149229
20149230
Inverter Settling Time
20149231
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10
Pulse Response
RL=2 kΩ, CL10 pF
Small Signal Inverting
Small Signal Non-Inverting
20149240
20149239
Large Signal Inverting
Large Signal Non-Inverting
20149241
20149242
Current Limit (RL=100Ω)
20149243
11
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The LF411QML will drive a 2 kΩ load resistance to ±10V over
the full temperature range. If the amplifier is forced to drive
heavier load currents, however, an increase in input offset
voltage may occur on the negative voltage swing and finally
reach an active current limit on both positive and negative
swings.
Application Hints
The LF411QML series of internally trimmed JFET input op
amps ( BI-FET II™ ) provide very low input offset voltage and
guaranteed input offset voltage drift. These JFETs have large
reverse breakdown voltages from gate to source and drain
eliminating the need for clamps across the inputs. Therefore,
large differential input voltages can easily be accommodated
without a large increase in input current. The maximum dif-
ferential input voltage is independent of the supply voltages.
However, neither of the input voltages should be allowed to
exceed the negative supply as this will cause large currents
to flow which can result in a destroyed unit.
Precautions should be taken to ensure that the power supply
for the integrated circuit never becomes reversed in polarity
or that the unit is not inadvertently installed backwards in a
socket as an unlimited current surge through the resulting
forward diode within the IC could cause fusing of the internal
conductors and result in a destroyed unit.
As with most amplifiers, care should be taken with lead dress,
component placement and supply decoupling in order to en-
sure stability. For example, resistors from the output to an
input should be placed with the body close to the input to
minimize “pick-up” and maximize the frequency of the feed-
back pole by minimizing the capacitance from the input to
ground.
Exceeding the negative common-mode limit on either input
will force the output to a high state, potentially causing a re-
versal of phase to the output. Exceeding the negative com-
mon-mode limit on both inputs will force the amplifier output
to a high state. In neither case does a latch occur since raising
the input back within the common-mode range again puts the
input stage and thus the amplifier in a normal operating mode.
A feedback pole is created when the feedback around any
amplifier is resistive. The parallel resistance and capacitance
from the input of the device (usually the inverting input) to AC
ground set the frequency of the pole. In many instances the
frequency of this pole is much greater than the expected
3 dB frequency of the closed loop gain and consequently
there is negligible effect on stability margin. However, if the
feedback pole is less than approximately 6 times the expected
3 dB frequency, a lead capacitor should be placed from the
output to the input of the op amp. The value of the added
capacitor should be such that the RC time constant of this
capacitor and the resistance it parallels is greater than or
equal to the original feedback pole time constant.
Exceeding the positive common-mode limit on a single input
will not change the phase of the output; however, if both inputs
exceed the limit, the output of the amplifier may be forced to
a high state.
The amplifier will operate with a common-mode input voltage
equal to the positive supply; however, the gain bandwidth and
slew rate may be decreased in this condition. When the neg-
ative common-mode voltage swings to within 3V of the neg-
ative supply, an increase in input offset voltage may occur.
The LF411QML is biased by a zener reference which allows
normal circuit operation on ±4.5V power supplies. Supply
voltages less than these may result in lower gain bandwidth
and slew rate.
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12
Typical Applications
High Speed Current Booster
20149209
PNP=2N2905
NPN=2N2219 unless noted
TO-5 heat sinks for Q6-Q7
13
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10-Bit Linear DAC with No VOS Adjust
20149232
where AN=1 if the AN digital input is high
AN=0 if the AN digital input is low
Single Supply Analog Switch with Buffered Output
20149233
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14
Revision History
Date Released Revision
Section
Originator
Changes
10/11/05
A
B
C
New Release to corporate format
L. Lytle
1 MDS data sheet was converted into the
corporate data sheet format. MDS
MNLF411M-X Rev 2A2 will be archived.
05/07/07
Features, Ordering Information Table, L. McGee
LF411-MLS Electricals
Added reference to Radiation and Radiation
Electricals for LF411-MLS device. Revision A
will be archived.
06/30/11
Features, Ordering Information Table, L. McGee &
Added LF411MWGRLQMLV to Ordering Info
LF411-MLS 50k Post Radiation
Electricals, LF411MWGRLQMLV Post
Radiation Electricals
K.Kruckmeyer and modified Radiation Electricals to
“Radiation” devices. Added 50k and 100k Post
Radiation DC parameter tables. Revision B will
be archived.
15
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Physical Dimensions inches (millimeters) unless otherwise noted
Metal Can Package (H)
NS Package Number H08C
10 Lead Ceramic SOIC (WG))
NS Package Number WG10A
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16
Notes
17
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相关型号:
LF412 MD8
Military-grade, dual, 30-V, 4-MHz, FET-input operational amplifier | Y | 0 | -55 to 125
TI
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