ISOW1044DFMR [TI]

ISOW1044 Isolated CAN FD Transceiver with Integrated Low-Emissions, Low-Noise, High-Efficiency DC-DC Converter;
ISOW1044DFMR
型号: ISOW1044DFMR
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

ISOW1044 Isolated CAN FD Transceiver with Integrated Low-Emissions, Low-Noise, High-Efficiency DC-DC Converter

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ISOW1044  
SLLSFF7A – MAY 2021 – REVISED DECEMBER 2021  
ISOW1044 Isolated CAN FD Transceiver with Integrated Low-Emissions, Low-Noise,  
High-Efficiency DC-DC Converter  
– UL 1577 component recognition program  
– IEC 62368-1, IEC 61010-1, IEC 60601-1 and  
1 Features  
Meets the requirements of ISO 11898-2:2016  
physical layer standards  
– Support of Classical CAN: 1 Mbps  
– Optimized for CAN FD: 2 and 5 Mbps  
Integrated DC-DC converter with low-emissions,  
low-noise  
– Meets CISPR 32 and EN 55032 Class B with  
greater than 6 dB margin on a two-layer PCB  
– Low frequency power converter at 25 MHz  
enabling low noise performance  
GB 4943.1-2011 certifications  
2 Applications  
Factory Automation  
Building Automation  
Industrial Transport  
Solar Inverters, Protection Relay  
Motor Drives  
3 Description  
The ISOW1044 device is a galvanically-isolated  
controller area network (CAN) transceiver with a  
built-in isolated DC-DC converter that eliminates the  
need for a separate isolated power supply in space-  
constrained isolated designs. The low-emissions,  
isolated DC-DC meets CISPR 32 radiated emissions  
Class B standard with just two ferrite beads on  
a simple two-layer PCB. Additional 20 mA output  
current can be used to power other circuits on the  
board. An integrated 10 Mbps GPIO channel is  
available and can help remove an additional digital  
isolator or optocoupler for diagnotstics, LED indication  
or supply monitoring.  
Additional 10 Mbps GPIO channel  
High efficiency output power  
– Typical efficiency: 47%  
– Isolated output voltage accuracy: ± 5%  
– Additional output current: 20 mA  
Independent power supply for CAN & DC-DC  
– Logic supply (VIO): 1.71 V to 5.5 V  
– Power converter supply ( VDD): 4.5 V to 5.5 V  
Fault-Protected CAN FD Transceiver  
– DC Bus fault protection voltage: ± 58V  
– Receiver common mode input voltage: ±12 V  
– Remote wakeup via BUS wake-up pattern  
Typical loop delay: 167 ns  
Device Information  
Reinforced and Basic isolation options  
High CMTI: 100-kV/µs (typical)  
High ESD bus protection w.r.t GND2  
FEATURE  
ISOW1044  
Reinforced  
10 kVPK  
ISOW1044B  
Basic  
Protection Level  
Surge Test Voltage  
Isolation Rating  
Working Voltage  
– HBM ESD: ±12 kV  
7.8 kVPK  
5000 VRMS  
– IEC 61000-4-2 contact discharge: ±8 kV  
Operating temperature range: -40°C to 125°C  
Current limit and thermal shutdown  
20-pin wide SOIC package  
5000 VRMS  
1000 VRMS/1500 1000 VRMS/1500 VPK  
VPK  
Package  
DFM (20)  
DFM (20)  
Safety-Related Certifications planned:  
Body Size (Nom)  
12.83mm × 7.5 mm 12.83mm × 7.5 mm  
– VDE Reinforced and Basic insulation per DIN  
VDE V 0884-11:2017-01  
VCC  
Must be connected on PCB,  
not connected internally  
VIO  
VISOIN  
TXD  
CANH  
CAN  
BUS  
STB  
Signal  
RXD  
CANL  
OUT  
Signal  
Isolation  
CAN  
MCU  
Isolation  
IN  
GNDIO  
GISOIN  
VDD  
VISOOUT  
GND2  
DC-DC  
Primary  
DC-DC  
Secondary  
GND1  
Galvanic Isolation  
Barrier  
Simplified Schematic  
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
 
 
 
ISOW1044  
SLLSFF7A – MAY 2021 – REVISED DECEMBER 2021  
www.ti.com  
Table of Contents  
1 Features............................................................................1  
2 Applications.....................................................................1  
3 Description.......................................................................1  
4 Revision History.............................................................. 2  
5 Description Continued....................................................2  
6 Device Comparison Table ..............................................2  
7 Pin Configuration and Functions...................................3  
8 Specifications.................................................................. 5  
8.1 Absolute Maximum Ratings........................................ 5  
8.2 ESD Ratings............................................................... 5  
8.3 Recommended Operating Conditions.........................5  
8.4 ThermalInformation.....................................................6  
8.5 Power Ratings.............................................................6  
8.6 Insulation Specifications............................................. 7  
8.7 Safety-Related Certifications...................................... 8  
8.8 Safety Limiting Values.................................................8  
8.9 Electrical Characteristics.............................................9  
8.10 Supply Current Characteristics............................... 12  
8.11 Switching Characteristics........................................13  
8.12 Insulation Characteristics Curves........................... 14  
8.13 Typical Characteristics............................................15  
9 Parameter Measurement Information..........................18  
10 Detailed Description....................................................22  
10.1 Overview.................................................................22  
10.2 Power Isolation....................................................... 22  
10.3 Signal Isolation........................................................22  
10.4 CAN Transceiver.....................................................22  
10.5 Functional Block Diagram.......................................24  
10.6 Feature Description.................................................24  
10.7 Device Functional Modes........................................28  
10.8 Device I/O Schematics............................................30  
11 Application and Implementation................................ 31  
11.1 Application Information............................................31  
11.2 Typical Application.................................................. 31  
12 Power Supply Recommendations..............................35  
13 Layout...........................................................................36  
13.1 Layout Guidelines................................................... 36  
13.2 Layout Example...................................................... 36  
14 Device and Documentation Support..........................37  
14.1 Documentation Support.......................................... 37  
14.2 Receiving Notification of Documentation Updates..37  
14.3 Support Resources................................................. 37  
14.4 Trademarks.............................................................37  
14.5 Electrostatic Discharge Caution..............................37  
14.6 Glossary..................................................................37  
15 Mechanical, Packaging, and Orderable  
Information.................................................................... 37  
4 Revision History  
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.  
Changes from Revision * (March 2021) to Revision A (December 2021)  
Page  
Updated device status to Production status....................................................................................................... 1  
5 Description Continued  
The device supports both classical CAN and CAN FD networks up to 5 Megabits per second (Mbps) data rate. It  
offers ±58-V DC bus fault protection and ±12-V common-mode voltage range. Both signal and power paths are  
5-kVRMS isolated per UL1577 and are qualified for reinforced and basic isolation per VDE, CSA, TUV and CQC.  
The bus pins of these devices can endure up to 8 kV of IEC 61000-4-2 electrostatic discharge (ESD),.  
The ISOW1044 device can operate from a single supply voltage of 4.5 V to 5.5 V by connecting VIO and VDD  
together on PCB. If lower logic levels are required, these devices support 1.71 V to 5.5 V logic supply (VIO)  
that can be independent from the power converter supply (VDD) of 4.5 V to 5.5 V. This device supports a wide  
operating ambient temperature range from –40°C to +125°C and are available in 20-pin DFM (SOIC-20 footprint  
compatible package) offering a minimum of 8-mm creepage and clearance.  
The ISOW1044 supports a standby mode and wake over CAN compliant to the ISO 11898-2:2016 defined wake-  
up pattern (WUP). The device also includes protection and diagnostic features supporting thermal-shutdown  
(TSD), TXD dominant time-out (DTO) and supply undervoltage detection.  
6 Device Comparison Table  
PART NUMBER  
ISOW1044  
ISOLATION  
Reinforced  
Basic  
PACKAGE  
BODY SIZE (NOM)  
12.83 mm x 7.5 mm  
12.83 mm x 7.5 mm  
20-DFM (SOIC)  
20-DFM (SOIC)  
ISOW1044B  
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ISOW1044  
SLLSFF7A – MAY 2021 – REVISED DECEMBER 2021  
www.ti.com  
7 Pin Configuration and Functions  
VIO  
VISOIN  
1
2
3
20  
19  
18  
IN  
CANH  
CANL  
TXD  
STB  
RXD  
GISOIN  
GISOIN  
GISOIN  
4
5
6
17  
16  
15  
GNDIO  
NC  
OUT  
7
14  
EN/FLT  
VDD  
VSIN  
VISOOUT  
GND2  
8
13  
12  
11  
9
GND1  
10  
Figure 7-1. ISOW1044 20-pin DFM Top View  
Table 7-1. Pin Functions  
PIN  
I/O  
DESCRIPTION  
NAME  
VIO  
NO.  
1
--  
I
Side 1 Logic supply  
IN  
2
General purpose logic (GPIO) input (internal pull-down)  
Driver enable. If this pin is floating, the driver is disabled (internal pull-down)  
TXD  
3
I
Standby enable. Connect this pin to GNDIO in normal mode. If this pin is floating or logic high,  
driver is in standby mode.  
STB  
4
5
6
7
I
RXD  
GNDIO  
NC  
O
--  
--  
Receiver data output  
Ground connection on side 1 for VIO. GNDIO and GND1 are not internally connected and need  
be shorted on PCB.  
Not connected internally  
Multi-function power converter enable input pin or fault output pin. Can only be used as either an  
input pin or an output pin.  
If it's used as Power converter enable input pin, it enables and disables the integrated  
DC-DC power converter. Connect directly to microcontroller or through a series current  
limiting resistor to use as an enable input pin. DC-DC power converted is enabled when EN  
is high (connected to VIO) and disabled when low (connected to GND1). If EN is floating,  
DC-DC converter is enabled (internal pull-up resistor)  
EN/FLT  
8
I/O  
If it's used as Fault output pin, it gives an alert signal if power converter is not operating  
properly. This pin is active low. Connect to microcontroller through a 5 kΩ or greater pull-up  
resistor in order to use as a fault outpin pin.  
VDD  
9
--  
--  
Side 1 DC-DC converter power supply  
Ground connections on side for VDD . GNDIO and GND1 are not internally connected and need  
be shorted on PCB.  
GND1  
10  
Ground connections on side for VISOOUT . GND2 and GISOIN are not internally connected and  
need be shorted direclty on PCB, or connected through a ferrite bead.  
GND2  
11  
--  
Isolated power converter output voltage. VISOOUT and VISOIN need be shorted directly on PCB, or  
connected through a ferrite bead.  
VISOOUT  
VSIN  
12  
13  
--  
I
Power converter input . Pin 12 and pin 13 need be shorted directly on PCB.  
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ISOW1044  
SLLSFF7A – MAY 2021 – REVISED DECEMBER 2021  
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Table 7-1. Pin Functions (continued)  
PIN  
I/O  
DESCRIPTION  
NAME  
NO.  
OUT  
14  
O
--  
General purpose logic (GPIO) output (default output is low)  
Ground connections for VISOIN. GND2 and GISOIN need be shorted direclty on PCB, or  
connected through a ferrite bead.  
GISOIN  
15, 16, 17  
CANL  
CANH  
18  
19  
I/O  
I/O  
Low-level CAN bus line  
High-level CAN bus line  
Power supply input for CAN tranceiver. VISOIN and VISOOUT need be shorted direclty on PCB, or  
connected through a ferrite bead.  
VISOIN  
20  
--  
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ISOW1044  
SLLSFF7A – MAY 2021 – REVISED DECEMBER 2021  
www.ti.com  
8 Specifications  
8.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)(1) (2)  
MIN  
–0.5  
–0.5  
–0.5  
–0.5  
-58  
MAX  
UNIT  
V
VDD  
Power converter supply voltage  
6
VISOIN  
VISOOUT  
VIO  
Isolated supply voltage, input supply for CAN transceiver  
Isolated supply voltage, Power converter output  
Logic supply voltage  
6
V
6
V
6
V
VBUS  
Voltage on bus pins (CANH, CANL with respect to GND2)  
58  
45  
V
VBUS_DIFF Max Differential voltage on bus pins (CANH-CANL)  
-45  
V
Logic I/O voltage level ( RXD, TXD, STB, EN, IN)  
–0.5  
-0.5  
–15  
–40  
–65  
VIO + 0.5(3)  
VISOIN + 0.5  
15  
V
Vlogic_IO  
OUT  
V
IO  
Output current on RXD, OUT pins  
Junction temperature  
mA  
°C  
°C  
TJ  
150  
Tstg  
Storage temperature  
150  
(1) Stresses beyond those listed under Absolute Maximum Rating may cause permanent damage to the device. These are stress  
ratings only, which do not imply functional operation of the deviceat these or any other conditions beyond those indicated under  
Recommended Operating Condition. Exposure to absolute-maximum-rated conditions for extended periods may affect device  
reliability.  
(2) All voltage values except differential I/O bus voltages are with respect to the local ground pin (GND1 or GND2). All voltage values  
except differential I/O bus voltages are peak voltage values.  
(3) The maximum voltage must not be greater than 6 V.  
8.2 ESD Ratings  
VALUE  
UNIT  
All pins except bus pins  
±2000  
Electrostatic  
discharge  
Human body model (HBM), per ANSI/  
ESDA/JEDEC JS-001(1)  
V(ESD)  
V
CANH, CANL Bus pins w.r.t  
GND2(pin15/16/17)  
±12000  
±1500  
±8000  
Electrostatic  
discharge  
V(ESD)  
V(ESD)  
Charged device model (CDM), per JEDEC specification JESD22-C101(2)  
V
V
Electrostatic  
discharge  
per IEC61000-4-2 contact discharge,  
CANH and CANL w.r.t. GND2  
per IEC61000-4-2 contact discharge,  
CANH and CANL w.r.t. GND1 (across  
Isolation barrier)  
Electrostatic  
discharge  
V(ESD)  
±8000  
V
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD controlprocess.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD controlprocess.  
8.3 Recommended Operating Conditions  
over operating free-air temperature range (unless otherwise noted)  
MIN  
1.71  
2.25  
4.5  
NOM  
MAX  
1.89  
5.5  
UNIT  
1.8-V operation  
VIO  
Logic supply voltage  
V
2.5-V, 3.3-V, and 5.5-V operation  
VDD  
Power converter supply voltage  
5.5  
V
V
VDD(UVLO+) Supply threshold when Power converter supply is rising  
VDD(UVLO-) Supply threshold when Power converter supply is falling  
VHYS1(UVLO) Power converter supply voltage hysteresis  
2.7  
2.55  
0.24  
2.95  
2.40  
0.15  
V
V
VIO(UVLO+)  
VIO(UVLO-)  
Rising threshold of Logic supply voltage  
Falling threshold of Logic supply voltage  
1.7  
V
1
V
VHYS2(UVLO) Logic supply voltage hysteresis  
75  
125  
mV  
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SLLSFF7A – MAY 2021 – REVISED DECEMBER 2021  
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over operating free-air temperature range (unless otherwise noted)  
MIN  
NOM  
MAX  
VIO  
UNIT  
V
VIH  
VIL  
High-level input voltage (TXD, STB, EN, and IN inputs)  
Low-level input voltage (TXD, STB, EN, and IN inputs)  
VIO = 5V  
0.7 × VIO  
0
-4  
-2  
-1  
0.3 × VIO  
V
mA  
mA  
mA  
mA  
mA  
mA  
mA  
mA  
Mbps  
Mbps  
IOH  
High-level output current RXD  
VIO = 3.3V  
VIO = 1.8 or 2.5V  
VIO = 5V  
4
2
1
IOL  
Low-level output current RXD  
VIO = 3.3V  
VIO = 1.8 or 2.5V  
VDD=4.5 to 5.5V  
VDD=4.5 to 5.5V  
CAN  
IOH  
IOL  
High-level output current OUT  
Low-level output current OUT  
Signaling rate  
-4  
4
5
1/tUI  
DR  
Data rate for extra GPIO channel  
GPIO  
10  
Power up time after applying input supply(Isolated output supply reaches 90%  
of setpoint and data transmission can start after this)  
Tpwrup  
TA  
5
ms  
≤ 50% of bits are dominant  
–40  
–40  
125  
105  
°C  
°C  
Ambient operating temperature  
8.4 ThermalInformation  
ISOW1044  
THERMAL METRIC(1)  
DFM  
20 PINS  
68.5  
20.9  
44.8  
13  
UNIT  
RθJA  
Junction-to-ambient thermal resistance  
Junction-to-case (top) thermal resistance  
Junction-to-board thermal resistance  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
RθJC(top)  
RθJB  
ΨJT  
Junction-to-top characterization parameter  
Junction-to-board characterization parameter  
Junction-to-case (bottom) thermal resistance  
ΨJB  
44  
RθJC(bot)  
--  
(1) For more informationabout traditional and new thermal metrics, see theSemiconductor andIC Package Thermal Metrics application  
report.  
8.5 Power Ratings  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
1060  
490  
UNIT  
mW  
mW  
mW  
PD  
Maximum power dissipation (both sides)  
Maximum power dissipation (side-1)  
Maximum power dissipation by (side-2)  
VIO = VDD = 5.5 V, STB= GND1, CAN Bus load  
RL= 60 Ω, TXD=repetitive pattern of 1 ms time  
period with 990 µs LOW time, 10 µs HIGH time,  
Extra load on VISOOUT= 20 mA  
PD1  
PD2  
570  
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SLLSFF7A – MAY 2021 – REVISED DECEMBER 2021  
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8.6 Insulation Specifications  
PARAMETER  
TEST CONDITIONS  
VALUE  
UNIT  
GENERAL  
CLR  
CPG  
External clearance(1)  
External creepage(1)  
Shortest terminal-to-terminal distance through air  
>8  
>8  
mm  
mm  
Shortest terminal-to-terminal distance across the package  
surface  
Minimum internal gap (internal clearance – capacitive  
signal isolation)  
DTI  
Distance through the insulation  
Distance through the insulation  
>17  
um  
Minimum internal gap (internal clearance- transformer  
power isolation)  
DTI  
CTI  
>120  
um  
V
Comparative tracking index  
Material group  
IEC 60112; UL 746A  
>600  
I
According to IEC 60664-1  
Rated mains voltage ≤ 600 VRMS  
Rated mains voltage ≤ 1000 VRMS  
I-IV  
I-III  
Overvoltage Category  
DIN VDE V 0884-11:2017-01(2)  
VIORM Maximum repetitive peak isolation voltage  
AC voltage (bipolar)  
1500  
1000  
1500  
7071  
VPK  
AC voltage (sine wave) Time dependent dielectric  
breakdown (TDDB) test  
VIOWM  
Maximum working isolation voltage  
VRMS  
DC voltage  
VTEST = VIOTM, t = 60s (qualification);  
VTEST = 1.2 × VIOTM, t = 1s (100% production)  
VIOTM  
VIOSM  
VIOSM  
Maximum transient isolation voltage  
VPK  
VPK  
VPK  
Test method per IEC 62368-1, 1.2/50 µs waveform,  
VTEST = 1.6 × VIOSM = 10000 VPK (qualification)  
Maximum surge isolation voltage ISOW1044(3)  
Maximum surge isolation voltage ISOW1044B(3)  
6250  
6000  
Test method per IEC 62368-1, 1.2/50 µs waveform,  
VTEST = 1.3 × VIOSM = 7800 VPK (qualification)  
Method a: After I/O safety test subgroup 2/3,  
Vini = VIOTM, tini = 60 s;  
Vpd(m) = 1.2 × VIORM , tm = 10 s  
≤5  
≤5  
Method a: After environmental tests subgroup 1,  
Vini = VIOTM, tini = 60 s;  
ISOW1044: Vpd(m) = 1.6 × VIORM, tm = 10 s. ISOW1044B:  
Vpd(m) = 1.2 × VIORM, tm = 10 s  
qpd  
Apparent charge(4)  
pC  
Method b1: At routine test (100% production) and  
preconditioning (type test)  
Vini = 1.2 × VIOTM, tini = 1 s;  
ISOW1044: Vpd(m) = 1.875 × VIORM, tm = 1  
≤5  
s.  
s
ISOW1044B: Vpd(m) = 1.5 × VIORM, tm = 1  
CIO  
RIO  
Barrier capacitance, input to output(5)  
Isolation resistance, input to output(5)  
VIO = 0.4 sin (2πft), f = 1 MHz  
VIO = 500 V, TA = 25°C  
~3.5  
> 1012  
> 1011  
> 109  
pF  
Ω
VIO = 500 V, 100°C ≤ TA ≤ 125°C  
VIO = 500 V at TS = 150°C  
Ω
Ω
Pollution degree  
Climatic category  
2
40/125/21  
UL 1577  
VTEST = VISO, t = 60 s (qualification); VTEST = 1.2 × VISO , t  
= 1 s (100% production)  
VISO  
Withstand isolation voltage  
5000  
VRMS  
(1) Creepage and clearance requirements should be applied accordingto the specific equipment isolation standards of an application.  
Care should be taken to maintainthe creepage and clearance distance of a board design to ensure that the mounting pads of  
theisolator on the printed-circuit board do not reduce this distance. Creepage and clearance on aprinted-circuit board become  
equal in certain cases. Techniques such as inserting grooves and/orribs on a printed circuit board are used to help increase these  
specifications.  
(2) This coupler is suitable for safe electrical insulation (ISOW1044) and basic electrical insulation (ISOW1044B) only within the maximum  
operating ratings. Compliance with the safety ratings shall be ensured by means of suitable protective circuits.  
(3) Testing is carried out in air or oil to determine the intrinsicsurge immunity of the isolation barrier.  
(4) Apparent charge is electrical discharge caused by a partialdischarge (pd).  
(5) All pins on each side of the barrier tied together creating atwo-terminal device  
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ISOW1044  
SLLSFF7A – MAY 2021 – REVISED DECEMBER 2021  
www.ti.com  
8.7 Safety-Related Certifications  
VDE  
CSA  
UL  
TUV  
CQC  
Plan to certifiy according  
to DIN VDE V  
0884-11 :2017-01  
Plan to certifiy according to Plan to certifiy under  
IEC 62368-1, IEC 61010-1 UL 1577 Component  
Plan to certifiy ccording to EN  
61010-1:2010/ A1:2019 and EN  
62368-1:2014  
Plan to certifiy according to  
GB4943.1-2011  
and IEC 60601-1  
Recognition Program  
Per CSA62368-1:19,  
IEC 62368-1:2018 Ed.  
3, CSA 61010-1-12+A1  
and IEC 61010-1 3rd Ed.,  
Maximum transient isolation ISOW1044 (Reinforced):  
voltage 7071 VPK; Maximum 600 VRMS, ISOW1044B  
ISOW1044 (Reinforced): 5000  
Reinforced insulation, Altitude VRMS reinforced insulation per  
repetitive peak isolation  
voltage, 1500 VPK  
Maximum surge isolation  
voltage, ISOW1044:  
6250 VPK (Reinforced),  
ISOW1044B:  
(Basic): 1000 VRMS  
maximum working voltage  
(pollution degree 2,  
;
Single protection, 5000  
VRMS  
≤ 5000 m, Tropical Climate,  
700 VRMS maximum working  
voltage.  
EN 61010-1:2010/A1:2019 and EN  
62368-1:2014 up to working voltage  
of 600 VRMS . ISOW1044B (Basic):  
1000 VRMS  
material group I, ambient  
temperature 90 ),  
1 MOPP (Means of  
6000 VPK (Basic)  
Patient Protection) per CSA  
60601- 1:14 . IEC 60601-1  
(ISOW1044 only) Ed.3+A1,  
250 VRMS maximum  
working voltage  
Certification planned  
Certification planned  
Certification planned  
Certification planned  
Certification planned  
8.8 Safety Limiting Values  
Safety limiting intends to minimize potential damage to the isolation barrier uponfailure of input or output circuitry.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
RθJA = 68.5 °C/W, VI = 5.5 V, TJ = 150 °C, TA = 25 °C,  
See Figure 8-1  
332  
IS  
Safety input, output, or supply current(1)  
mA  
RθJA = 68.5 °C/W, VI = 3.6 V, TJ = 150 °C, TA = 25 °C,  
See Figure 8-1  
507  
PS  
TS  
Safety input, output, or total power(1)  
Safety temperature(1)  
RθJA = 68.5 °C/W, TJ = 150 °C, TA = 25 °C, See Figure 8-2  
1826  
150  
mA  
(1) The maximum safety temperature,TS, has the same value as the maximum junction temperature,TJ, specified for the device. The  
S andPS parameters represent the safety current and safety power respectively.The maximum limits of IS and PS should not  
I
beexceeded. These limits vary with the ambient temperature, TA.  
The junction-to-air thermal resistance, RθJA, in the table is that of a device installed on a high-K test board forleaded surface-mount  
packages. Use these equations to calculate the value for each parameter:  
TJ = TA + RθJA × P,where P is the power dissipated in the device.  
TJ(max) = TS = TA +RθJA × PS, where TJ(max) isthe maximum allowed junction temperature.  
PS = IS × VI, whereVI is the maximum input voltage.  
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8.9 Electrical Characteristics  
over recommended operating conditions, typical values are at VDD = 5V, GND1 = GNDIO, GND2 = GISOIN, VIO = 3.3 V and  
TA =25°C (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
Device  
VISOOUT  
Isolated Output supply voltage EN=VDD, STB, TXD, IN floating  
4.75  
5
5.25  
V
Extra current available on  
Visoout  
VDD = 4.5 to 5.5 V, CAN full loaded 60 Ω,  
TXD toggling 5 Mbps, IN toggling 10 Mbps  
Iout  
VOH  
VOL  
20  
mA  
Output high voltage on OUT  
pin  
VDD = 5 V ± 10%, IOH = –4 mA, IN = VIO  
VDD = 5 V ± 10%, IOL = 4 mA, IN = GND2  
VISOIN – 0.4  
V
V
Output low voltage on OUT  
pin  
0.4  
II  
II  
Input current, IN  
Input current, EN  
IN at GND1 or VIO  
EN at GND1 or VIO  
–25  
–25  
25  
25  
µA  
µA  
TXD TERMINAL  
II  
Input leakage current  
Input capacitance  
TXD = VIO or GND1  
–25  
25  
uA  
pF  
VIN = 0.4 x sin(2 x π x 1E+6 x t) + 1.65 V,  
VIO = 3.3 V  
CI  
2
RXD TERMINAL  
IO = -4 mA for 4.5 V ≤ VIO ≤ 5.5 V,  
See Figure 9-4  
VIO – 0.4  
VIO – 0.2  
V
V
V
V
V
V
V
V
IO = -2 mA for 3.0 V ≤ VIO ≤ 3.6 V,  
See Figure 9-4  
VIO – 0.2 VIO – 0.06  
VOH  
High level output voltage  
IO = -1 mA for 2.25 V ≤ VIO ≤ 2.75 V,  
See Figure 9-4  
VIO – 0.1 VIO – 0.04  
IO = -1 mA for 1.71 V ≤ VIO ≤ 1.89 V,  
See Figure 9-4  
VIO – 0.1 VIO – 0.04  
IO = 4 mA for 4.5 V ≤ VIO ≤ 5.5 V, See Figure  
9-4  
0.2  
0.07  
0.4  
0.2  
0.1  
0.1  
IO = 2 mA for 3.0 V ≤ VIO ≤ 3.6 V, See Figure  
9-4  
VOL  
Low level output voltage  
IO = 1 mA for 2.25 V ≤ VIO ≤ 2.75 V,  
See Figure 9-4  
0.035  
0.04  
IO = 1 mA for 1.71 V ≤ VIO ≤ 1.89 V,  
See Figure 9-4  
STB Terminal  
II  
Input leakage current  
Input capacitance  
STB = VIO or GND1  
-25  
25  
uA  
pF  
VIN = 0.4 x sin(2 x π x 1E+6 x t) + 1.65 V,  
VIO = 3.3 V  
CI  
2
DRIVER ELECTRICAL CHARACTERISTICS  
STB=GND1, TXD = 0 V, 50 Ω ≤ RL ≤ 65 Ω,  
and CL = open, See Figure 9-1 and Figure  
9-2  
Bus output voltage(Dominant),  
CANH  
2.75  
4.5  
V
VO(DOM)  
STB=GND1, TXD = 0 V, 50 Ω ≤ RL ≤ 65 Ω,  
and CL = open, See Figure 9-1 and Figure  
9-2  
Bus output voltage(Dominant),  
CANL  
0.5  
2.25  
3.0  
V
V
Bus output voltage(recessive), STB=GND1, TXD = VIO and RL =  
VO(REC)  
2.0 0.5 x VISOIN  
CANH and CANL  
open, See Figure 9-1 and Figure 9-2  
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over recommended operating conditions, typical values are at VDD = 5V, GND1 = GNDIO, GND2 = GISOIN, VIO = 3.3 V and  
TA =25°C (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
STB=GND1, TXD = 0 V, 45 Ω ≤ RL ≤ 70 Ω,  
and CL = open, See Figure 9-1 and Figure  
9-2  
Differential output  
voltage(dominant)  
1.4  
3.3  
3.0  
V
V
STB=GND1, TXD = 0 V, 50 Ω ≤ RL ≤ 65 Ω,  
and CL = open, See Figure 9-1 and Figure  
9-2  
VOD(DOM)  
Differential output  
voltage(dominant)  
1.5  
Differential output  
voltage(dominant)  
STB=GND1, TXD = 0 V, RL = 2240 Ω, and  
CL = open, See Figure 9-1 and Figure 9-2  
1.5  
–120.0  
–50.0  
–100  
5.0  
12.0  
50.0  
100  
V
Differential output  
voltage(recessive)  
TXD = VIO, RL = 60 Ω, and CL =  
open, See Figure 9-1 and Figure 9-2  
mV  
mV  
mV  
mV  
mV  
mV  
mA  
mA  
mA  
VOD(REC)  
Differential output  
voltage(recessive)  
TXD = VIO, RL = open, and CL =  
open, See Figure 9-1 and Figure 9-2  
Bus Output Voltage, CANH,  
Standby mode  
STB = VIO, RL = open, See Figure  
9-1 and Figure 9-2  
VO(STB)  
VO(STB)  
VOD(STB)  
VSYM_DC  
Bus Output Voltage, CANL,  
Standby mode  
STB = VIO, RL = open, See Figure  
9-1 and Figure 9-2  
–100  
100  
Bus Output Voltage, CANH-  
CANL, Standby mode  
STB=VIO, RL = open, See Figure  
9-1 and Figure 9-2  
-200  
200  
Output symmetry (VISOIN  
VO(CANH) - VO(CANL)  
-
RL = 60 Ω and CL = open, TXD = VIO or  
GND1, See Figure 9-1 and Figure 9-2  
–400.0  
–115.0  
400.0  
)
-15 V < CANH < 40 V, CANL = open, and  
TXD = 0 V, See Figure 9-8  
Short circuit current steady  
state output current, dominant  
IOS(SS_DOM)  
-15 V < CANL < 40 V, CANH = open, and  
TXD = 0 V, See Figure 9-8  
115.0  
5.0  
Short circuit current steady  
state output current, recessive CANL, and TXD = VIO , See Figure 9-8  
-27 V < VBUS < 32 V, VBUS = CANH =  
IOS(SS_REC)  
–5.0  
RECEIVER ELECTRICAL CHARACTERISTICS  
VCM  
VIT  
Input common mode range  
See Figure 9-4 and Table 9-1  
–12  
12  
V
Differential input threshold  
voltage, normal mode  
-12 V ≤ VCM ≤ 12 V, STB =  
GND1, See Figure 9-4 and Table 9-1  
500.0  
900.0  
mV  
Differential input threshold  
voltage, standby mode  
VIT(STB)  
-12 V ≤ VCM ≤ 12 V, STB = VIO  
-12 V ≤ VCM ≤ 12 V, STB = GND1  
400  
1150  
mV  
mV  
Hysteresis voltage for  
differential input threshold,  
normal mode  
VHYS  
100  
Dominant state differential  
VDIFF(DOM) input voltage range, normal  
mode  
-12 V ≤ VCM ≤ 12 V, STB =  
GND1, See Figure 9-4 and Table 9-1  
0.9  
1.15  
–4  
9
9
V
V
V
V
Dominant state differential  
VDIFF(DOM) input voltage range, standby  
mode  
-12 V ≤ VCM ≤ 12 V, STB = VIO, See Figure  
9-4 and Table 9-1  
Recessive state differential  
VDIFF(REC) input voltage range, normal  
mode  
-12 V ≤ VCM ≤ 12 V, STB =  
GND1, See Figure 9-4 and Table 9-1  
0.5  
0.4  
Recessive state differential  
VDIFF(REC) input voltage range, standby  
mode  
-12 V ≤ VCM ≤ 12 V, STB = VIO, See Figure  
9-4 and Table 9-1  
–4  
power-off bus input leakage  
IOFF(LKG)  
current  
CANH = CANL = 5 V, VDD = VIO = GND1  
TXD = VIO  
5
uA  
pF  
Input capacitance to ground  
(CANH or CANL)  
CI  
20  
CID  
RID  
Differential input capacitance TXD = VIO  
10  
90  
pF  
kΩ  
Differential input resistance  
TXD = VIO ; -12 V ≤ VCM ≤ +12 V  
40  
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over recommended operating conditions, typical values are at VDD = 5V, GND1 = GNDIO, GND2 = GISOIN, VIO = 3.3 V and  
TA =25°C (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX UNIT  
Input resistance (CANH or  
CANL)  
RIN  
TXD = VIO ; -12 V ≤ VCM ≤ +12 V  
20  
45  
1
kΩ  
%
Input resistance matching: (1 -  
RIN(CANH)/RIN(CANL)) x 100%  
RIN(M)  
VCANH = VCANL = 5 V  
–1  
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8.10 Supply Current Characteristics  
Typical values are at VDD=5V, VIO=3.3V, Min/Max over recommended operating conditions, GND1 = GNDIO, GND2 =  
GISOIN, VDD = 4.5 V to 5.5 V(unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Power converter disabled  
Power converter supply  
current  
IDD  
IIO  
EN = GND1, STB, TXD, IN floating  
EN = GND1, STB, TXD, IN floating  
0.23  
0.34  
0.27  
0.70  
mA  
mA  
Logic supply current  
Supply current: Normal Mode  
Power converter supply  
current  
IDD  
TXD = GND1, Bus dominant, RL= 60 Ω  
124  
26  
211  
46  
mA  
mA  
mA  
mA  
Power converter supply  
current  
IDD  
TXD = VIO, Bus recessive, RL = 60 Ω  
Power converter supply  
current  
IDD  
TXD = 1Mbps 50% duty square wave, RL = 60 Ω  
TXD = 5 Mbps 50% duty square wave, RL= 60 Ω  
76  
123  
136  
Power converter supply  
current  
IDD  
78  
IIO  
IIO  
IIO  
IIO  
IIO  
IIO  
Logic supply current  
Logic supply current  
Logic supply current  
Logic supply current  
Logic supply current  
Logic supply current  
TXD = GND1, Bus dominant, VIO = 1.71 to 1.89 V  
TXD = GND1, Bus dominant, VIO = 2.25 to 5.5 V  
TXD = VIO, Bus recessive, VIO = 1.71 to 1.89 V  
TXD = VIO, Bus recessive, VIO = 2.25 to 5.5 V  
TXD = 1 Mbps square wave 50% duty, VIO = 3 to 3.6V  
TXD = 5 Mbps square wave 50% duty, VIO = 3 to 3.6V  
4.3  
4.9  
3.3  
3.8  
4.4  
4.5  
5.5  
6.0  
5.4  
5.5  
5.3  
6.2  
mA  
mA  
mA  
mA  
mA  
mA  
Supply current: Standby mode  
Power converter supply  
current  
IDD  
STB = VIO , RL = 60 Ω  
16  
23  
mA  
mA  
IIO  
Logic supply current  
STB = VIO , VIO = 3 to 3.6 V  
2.7  
3.5  
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8.11 Switching Characteristics  
Typical specifications are at VIO = 3.3V, VDD = 5V, GND1 = GNDIO, GND2 = GISOIN, Min/Max are over recommended  
operating conditions (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
140  
167  
MAX  
205  
UNIT  
ns  
DEVICE SWITCHING CHARACTERISTICS  
RL = 60 Ω, CL = 100 pF, CL(RXD) = 15 pF;  
input rise/fall time (10% to 90%) on TXD  
= 1 ns; 1.71 V < VIO < 5.5 V, See Figure  
9-3  
tPROP(LOO Total loop delay, driver input TXD to  
receiver RXD, recessive to dominant  
P1)  
RL = 60 Ω, CL = 100 pF, CL(RXD) = 15 pF;  
input rise/fall time (10% to 90%) on TXD  
=1 ns; 1.71 V < VIO <5.5 V, See Figure  
9-3  
tPROP(LOO Total loop delay, driver input TXD to  
222  
ns  
receiver RXD, dominant to recessive  
P2)  
Mode change time, from Normal to  
tMODE  
20  
1.8  
5
us  
us  
Standby or from Standby to Normal  
tWK_FILTE  
Filter time for a valid wake-up pattern  
0.5  
0.8  
85  
R
tWK_TIME  
Bus wake-up timeout value  
ms  
OUT  
TXD = VIO or GND1, VCM = 1200 VPK  
See Figure 9-9  
,
CMTI  
Common mode transient immunity  
100  
kV/µs  
DRIVER SWITCHING CHARACTERISTICS  
Propagation delay time, LOW to HIGH  
tpHR  
TXD edge to driver recessive (dominant  
to recessive)  
87  
78  
110  
105  
Propagation delay time, HIGH TO LOW  
TXD edge to driver dominant (recessive  
to dominant)  
RL = 60 Ω and CL = 100 pF; input rise/  
fall time (10% to 90%) on TXD =1 ns,  
See Figure 9-3  
tpLD  
ns  
tsk(p)  
tR  
pulse skew (|tpHR - tpLD|)  
15  
27  
48  
Differential output signal rise time  
Differential output signal fall time  
tF  
RTERM = 60 Ω, CL = open, CSPLIT = 4.7nF,  
TXD = Dominant or receissive or toggling  
at 250khz, 1Mhz See Figure 9-3  
Driver symmetry (VO(CANH)  
VO(CANL))/VCC  
+
VSYM  
0.9  
1.2  
1.1  
3.8  
V/V  
ms  
RL = 60 Ω and CL = open,  
See GUID-20200710-SS0I-JPX8-LTFT-  
RNRQCRR6XDXR  
tTXD_DTO Dominant time out  
RECEIVER SWITCHING CHARACTERISTICS  
Propagation delay time, bus dominant to  
tpRH  
recessive transition to RXD high output  
(dominant to recessive)  
90  
80  
115  
105  
ns  
ns  
Propogation delay time, bus recessive to  
dominant transition to RXD low output  
(recessive to dominant)  
CL(RXD) = 15 pF, See Figure 9-5  
tpDL  
tR  
tF  
Output signal rise time(RXD)  
Output signal fall time(RXD)  
1
1
ns  
ns  
FD TIMING PARAMETERS  
RL = 60 Ω, CL = 100 pF, CL(RXD) = 15 pF;  
input rise/fall time (10% to 90%) on TXD  
=1 ns, See Figure 9-6  
Bit time on CAN bus output pins with  
tBIT(TXD) = 500 ns  
435  
155  
530  
210  
ns  
ns  
tBIT(BUS)  
RL = 60 Ω, CL = 100 pF, CL(RXD) = 15 pF;  
input rise/fall time (10% to 90%) on TXD  
=1 ns, See Figure 9-6  
Bit time on CAN bus output pins with  
tBIT(TXD) = 200 ns  
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Typical specifications are at VIO = 3.3V, VDD = 5V, GND1 = GNDIO, GND2 = GISOIN, Min/Max are over recommended  
operating conditions (unless otherwise noted)  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
RL = 60 Ω, CL = 100 pF, CL(RXD) = 15 pF;  
input rise/fall time (10% to 90%) on TXD  
=1 ns, See Figure 9-6  
Bit time on RXD bus output pins with  
tBIT(TXD) = 500 ns  
400  
550  
ns  
tBIT(RXD)  
RL = 60 Ω, CL = 100 pF, CL(RXD) = 15 pF;  
input rise/fall time (10% to 90%) on TXD  
=1 ns, See Figure 9-6  
Bit time on RXD bus output pins with  
tBIT(TXD) = 200 ns  
120  
-65  
220  
40  
ns  
ns  
RL = 60 Ω, CL = 100 pF, CL(RXD) = 15  
pF; input rise/fall time (10% to 90%) on  
Receiver timing symmetry with tBIT(TXD)  
500 ns  
=
=
TXD =1 ns; ΔtREC = tBIT(RXD) - tBIT(BUS)  
See Figure 9-6  
,
,
∆tREC  
RL = 60 Ω, CL = 100 pF, CL(RXD) = 15  
pF; input rise/fall time (10% to 90%) on  
TXD =1 ns; ΔtREC = tBIT(RXD) - tBIT(BUS)  
See Figure 9-6  
Receiver timing symmetry with tBIT(TXD)  
200 ns  
-45  
15  
ns  
GPIO Channel  
tPLH, tPHL Propagation delay time  
11  
3.5  
2.2  
2.2  
25  
10  
5
ns  
ns  
ns  
ns  
PWD  
Pulse Width distortion, |tPLH- tPHL|  
tr  
tf  
Output signal rise time  
Output signal fall time  
5
8.12 Insulation Characteristics Curves  
600  
2000  
1800  
1600  
1400  
1200  
1000  
800  
VI = 5.5 V  
VI = 3.6 V  
500  
400  
300  
200  
100  
0
600  
400  
200  
0
0
50  
100  
Ambient Temperature (èC)  
150  
200  
0
50  
100  
Ambient Temperature (èC)  
150  
200  
D002  
D001  
Figure 8-1. Thermal Derating Curve for Limiting  
Current per VDE  
Figure 8-2. Thermal Derating Curve for Limiting  
Power per VDE  
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8.13 Typical Characteristics  
VDD = VIO , VISOIN = VISOOUT, CL(RXD) = 15 pF , RL = 60 Ω, TA = 25°C unless otherwise noted.  
82  
80  
78  
76  
74  
72  
70  
68  
82  
80  
78  
76  
74  
72  
70  
68  
250kbps  
500kbps  
1Mbps  
2Mbps  
5Mbps  
VDD=4.5V  
VDD=5V  
VDD=5.5V  
-40  
-20  
VDD = 5 V  
0
20  
40  
60  
80  
100 120 140  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
Temperature (C)  
Data Rate (Mbps)  
STB = Low VISOOUT = 5 V  
VISOOUT = 5 V  
STB = Low  
Figure 8-4. VDD Supply Current vs Temperature  
Figure 8-3. VDD Supply Current vs Datarate  
5.5  
5.3  
5.1  
4.9  
4.7  
4.5  
4.3  
4.1  
3.9  
3.7  
3.5  
5.0  
4.8  
4.6  
4.4  
4.2  
4.0  
3.8  
3.6  
IN=Low  
IN=High  
VIO=1.8V  
VIO=2.5V  
VIO=3.3V  
VIO=5V  
-40  
-20  
0
20  
40  
60  
80  
100 120 140  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
Temperature (C)  
Data Rate (Mbps)  
VDD = 5 V  
STB = High VISOOUT = 5 V  
VISOOUT = 5 V  
STB = Low  
Figure 8-6. VIO Standby Current vs Temerature  
Figure 8-5. VIO Supply Current vs Datarate  
5.2  
5.0  
4.8  
4.6  
4.4  
4.2  
4.0  
155  
150  
145  
140  
135  
130  
250kbps  
500kbps  
1Mbps  
2Mbps  
5Mbps  
VIO=1.8V  
VIO=2.5V  
VIO=3.3V  
VIO=5V  
-40  
-20  
0
20  
40  
60  
80  
100 120 140  
-40  
-20  
0
20  
40  
60  
80  
100 120 140  
Temperature (C)  
Temperature (C)  
VDD = 5 V  
CL = 100 pF  
STB = Low VISOOUT = 5 V  
VDD = 5 V  
STB = Low VISOOUT = 5 V  
Figure 8-7. VIOI Non-standby Current vs Temperature  
Figure 8-8. Loop Delay (Recessive to Dominant) vs Temperature  
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8.13 Typical Characteristics (continued)  
VDD = VIO , VISOIN = VISOOUT, CL(RXD) = 15 pF , RL = 60 Ω, TA = 25°C unless otherwise noted.  
185  
180  
175  
170  
165  
2.35  
2.30  
2.25  
2.20  
2.15  
VIO=1.8V  
VIO=2.5V  
VIO=3.3V  
VIO=5V  
-40  
-20  
0
20  
40  
60  
80  
100 120 140  
-40  
-20  
0
20  
40  
60  
80  
100 120 140  
Temperature (C)  
Temperature (C)  
VDD = 5 V  
STB = Low  
VDD = 5 V  
CL = 100 pF  
STB = Low VISOOUT = 5 V  
Figure 8-10. Dominant state differential output voltage vs  
Temperature  
Figure 8-9. Loop Delay (Dominant to Recessive) vs Temperature  
800  
700  
600  
500  
VITR  
VITF  
Vhys  
400  
300  
200  
100  
0
-40  
-20  
0
20  
40  
60  
80  
100  
120  
Temperature (C)  
VDD = 5 V  
STB = Low  
VDD = 5 V  
STB = Low  
Figure 8-12. Dominant Timeout vs Temperature  
Figure 8-11. Receiver differential threshold voltage vs  
Temperature  
Figure 8-13. Glitch Free Power Up on VDD  
Figure 8-14. Typical TXD, RXD, CANH and CANL Waveforms at  
500 kbps  
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8.13 Typical Characteristics (continued)  
VDD = VIO , VISOIN = VISOOUT, CL(RXD) = 15 pF , RL = 60 Ω, TA = 25°C unless otherwise noted.  
Figure 8-16. Typical TXD, RXD, CANH and CANL Waveforms at  
5 Mbps  
Figure 8-15. Typical TXD, RXD, CANH and CANL Waveforms at  
2 Mbps  
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9 Parameter Measurement Information  
IO(CANH)  
CANH  
II  
TXD  
0 or  
VISOIN  
VOD  
RL  
VO(CANH)  
V
O(CANL)  
+
2
CANL  
IO(CANL)  
GND1  
GND2  
VI  
VOC  
VO(CANH)  
VO(CANL )  
GND1  
GND2  
Figure 9-1. Driver Voltage, Current and Test Definitions  
Dominant  
V
O
(CANH)  
» 3.5 V  
Recessive  
2.5 V  
»
V
1.5 V  
O (CANL)  
»
Figure 9-2. Bus Logic State Voltage Definitions  
Vcc  
0 V  
CANH  
CANL  
V
Vcc/2  
Vcc/2  
I
TXD  
RL  
VO  
CL  
t
t
PLH  
PHL  
V
O(D)  
90%  
10%  
0.9V  
VI  
V
O
0.5V  
(SEE NOTE A)  
V
t
t
f
O(R)  
r
A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 125 kHz, 50% duty  
cycle, tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω.  
Figure 9-3. Driver Test Circuit and Voltage Waveforms  
CANH  
IO  
VI(CANH) VI(CANL)  
RXD  
+
VIC  
VID  
CANL  
=
2
VI(CANH)  
VO  
VI(CANL)  
GND2  
GND1  
Figure 9-4. Receiver Voltage and Current Definitions  
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CANH  
CANL  
I
O
3.5 V  
RXD  
V
2.4 V  
I
2 V  
1.5 V  
t
t
pHL  
pLH  
V
V
OH  
O
V
CL(RXD)  
90 %  
I
0.7 Vcc 1  
(SEE NOTE A)  
0.3 Vcc 1  
1 .5 V  
V
O
10 %  
V
t
t
OL  
f
r
GND 1  
GND 2  
A. The input pulse is supplied by a generator having the following characteristics: PRR ≤ 125 kHz, 50% duty cycle,  
tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω.  
Figure 9-5. Receiver Test Circuit and Voltage Waveforms  
Table 9-1. Receiver Differential Input Voltage Threshold Test  
INPUT  
VCANL  
OUTPUT  
VCANH  
-11.5 V  
12.5 V  
-8.55 V  
9.45 V  
-8.75 V  
9.25 V  
-11.8 V  
12.2 V  
Open  
|VID|  
1000 mV  
1000 mV  
900 mV  
900 mV  
500 mV  
500 mV  
400 mV  
400 mV  
X
RXD  
-12.5 V  
11.5 V  
-9.45 V  
8.55 V  
-9.25 V  
8.75 V  
-12.2 V  
11.8 V  
Open  
L
L
VOL  
L
L
H
H
H
H
H
VOH  
VI  
70%  
TXD  
CANH  
30%  
30%  
0V  
tBIT(TXD)  
TXD  
5 x tBIT  
VI  
CL  
RL  
CANL  
tBIT(BUS)  
900 mV  
VDIFF  
RXD  
500 mV  
CL(RXD)  
GND1  
VO  
VOH  
70%  
RXD  
30%  
tBIT(RXD)  
VOL  
Figure 9-6. tLOOP and CAN FD Timing Parameter Measurement  
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V
ISOIN  
V
I
CANH  
TXD  
0 V  
R
V
C
OD  
L
L
V
OD(D)  
CANH  
(see Note A)  
GND 1  
900 mV  
V
I
V
OD  
500 mV  
tTXD_DTO  
0 V  
A. The input pulse is supplied by a generator having the following characteristics: tr ≤ 6 ns, tf ≤ 6 ns, ZO = 50 Ω.  
Figure 9-7. Dominant Time-out Test Circuit and Voltage Waveforms  
IOS  
200 s  
IOS  
CANH  
TXD  
VBUS  
IOS  
+
VBUS  
CANL  
VBUS  
0V  
0V  
œ
GND2  
or  
VBUS  
VBUS  
Figure 9-8. Driver Short-Circuit Current Test Circuit and Waveforms  
(Connectedto VISOO UT onPCB)  
VIO  
VISOIN  
10 µF  
0.1 µF  
CANH  
0.1 µF  
10 µF  
VIO  
+
VOH or VOL  
œ
TXD  
GND1  
60  
S 1  
CANL  
GND1  
RXD  
STB  
+
VOH or VOL  
CL  
15 pF(1)  
œ
GND1  
GND2  
+ VCM  
œ
Figure 9-9. Common-Mode Transient Immunity Test Circuit  
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V
CCI  
V
50%  
I
50%  
IN  
OUT  
0 V  
V
t
t
PHL  
PLH  
Input Generator  
(See Note A)  
C
L
V
I
V
50  
O
See Note B  
OH  
90%  
10%  
50%  
50%  
V
O
V
OL  
t
r
t
f
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A. VCCI and VCCO refers to the power supplies VIO and VISOIN, respectively. CL = 15 pF and The input pulse is supplied by a generator  
having the following characteristics: PRR ≤ 50 kHz, 50% duty cycle, tr ≤ 3 ns, tf ≤ 3ns, ZO = 50 Ω. At the input, 50 Ω resistor is required  
to terminate Input Generator signal. It is not needed in actual application.  
B. B. CL = 15 pF and includes instrumentation and fixture capacitance within ±20%.  
Figure 9-10. Switching Characteristics Test Circuit and Voltage Waveforms  
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10 Detailed Description  
10.1 Overview  
The ISOW1044 has signal isolation channels, power isolation with integrated transformer and CAN transceiver  
all integrated in one package. ISOW1044 supports maximum signaling rate up to 1Mbps for CAN, and 5 Mbps  
for CAN FD. Functional Block Diagram shows functional block diagram of ISOW1044.  
10.2 Power Isolation  
The integrated isolated DC-DC converter uses advanced circuit and on-chip layout techniques to reduce  
radiated emissions and achieve upto 47% typical efficiency. The integrated transformer uses thin film polymer  
as the insulation barrier. In case bus communication is not needed, the DC-DC converter can be switched off  
using EN pin to save power. The output voltage, VISOOUT, is monitored and feedback information is conveyed to  
the primary side through a dedicated isolation channel. The duty cycle of the primary switching stage is adjusted  
accordingly. The fast feedback control loop of the power converter ensures low overshoots and undershoots  
during load transients. Undervoltage lockout (UVLO) with hysteresis is integrated on the VIO, VDD and VISOOUT  
supplies which ensures robust fails-safe system performance under noisy conditions. An integrated soft-start  
mechanism ensures controlled inrush current and avoids any overshoot on the output during power up.  
10.3 Signal Isolation  
The integrated signal isolation channels for CAN tranceiver and GPIIO employ an ON-OFF keying (OOK)  
modulation scheme to transmit the digital data across a silicon-dioxide based isolation barrier. The transmitter  
sends a high frequency carrier across the barrier to represent one state and sends no signal to represent the  
other state. The receiver demodulates the signal after signal conditioning and produces the output through  
a buffer stage. The signal-isolation channels incorporate advanced circuit techniques to maximize the CMTI  
performance and minimize the radiated emissions from the high frequency carrier and IO buffer switching. Figure  
10-3 shows a functional block diagram of a typical signal isolation channel.  
In order to keep any noise coupling from power converter away from signal path, power supplies on side1  
for power converter (VDD) and signal path(VIO) are kept separate. Similarly on side2, power converter output  
(VISOOUT ) needs to be connected to power supply for CAN (VISOIN) externally on PCB. For more details, refer to  
Layout guidelines section.  
10.4 CAN Transceiver  
The ISOW1044 device includes a digitally isolated CAN transceiver that offers ±58-V DC bus fault protection  
and ±12-V common-mode voltage range. The device supports up to 5-Mbps data rate in CAN FD mode allowing  
much faster transfer of payload compared to classic CAN. The power converter operates from a 5-V supply on  
side 1 (VDD) and a 5-V supply on side 2 (VISOOUT). The logic supply VIO on side 1 can operate from 1.71-V  
up to 5.5-V. This wide VIO supply range is of particular advantage for applications operating in harsh industrial  
environments because the low voltage on side 1 enables the connection to low voltage microcontrollers for  
power conservation, whereas the 5 V on side 2 maintains a high signal-to-noise ratio of the bus signals.  
The ISOW1044 supports a standby mode and remote BUS Wake-UP (WUP). The STB pin can be supplied from  
either the system processor or from a static system voltage source. In standby mode, the CAN driver and main  
receiver are switched off and bidirectional CAN communication is not possible. The DC-DC converter, low-power  
receiver, and bus monitor circuits are still enabled to allow for RXD wake-up requests via the CAN bus. The CAN  
bus pins are weakly pulled to GND in this mode. If normal mode is the only intended mode of operation than the  
STB pin can be tied directly to GND.  
10.4.1 Remote Wake Request via Wake-Up Pattern (WUP) in Standby Mode  
The ISOW1044 supports a remote wake-up request that is used to indicate to the host controller that the bus is  
active and the node should return to normal operation.  
The device uses the multiple filtered dominant wake-up pattern (WUP) from the ISO 11898-2:2016 standard to  
qualify bus activity. Once a valid WUP has been received, the wake request is indicated to the controller by a  
falling edge and low period corresponding to a filtered dominant on the RXD output of the ISOW1044.  
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The WUP consists of a filtered dominant pulse, followed by a filtered recessive pulse, and finally by a second  
filtered dominant pulse. The first filtered dominant initiates the WUP, and the bus monitor then waits on a filtered  
recessive; other bus traffic does not reset the bus monitor. Once a filtered recessive is received the bus monitor  
is waiting for a filtered dominant and again, other bus traffic does not reset the bus monitor. Immediately upon  
reception of the second filtered dominant the bus monitor recognizes the WUP and drives the RXD output low  
every time an additional filtered dominant signal is received from the bus.  
For a dominant or recessive to be considered filtered, the bus must be in that state for more than the  
tWK_FILTER time. Due to variability in tWK_FILTER the following scenarios are applicable. Bus state times less than  
tWK_FILTER(MIN) are never detected as part of a WUP and thus no wake request is generated. Bus state times  
between tWK_FILTER(MIN) and tWK_FILTER(MAX) may be detected as part of a WUP and a wake-up request may be  
generated. Bus state times greater than tWK_FILTER(MAX) are always detected as part of a WUP, and thus a wake  
request is always generated. See Figure 10-1 for the timing diagram of the wake-up pattern.  
The pattern and tWK_FILTER time used for the WUP prevents noise and bus stuck dominant faults from causing  
false wake-up requests while allowing any valid message to initiate a wake-up request.  
The ISO 11898-2:2016 standard has defined times for a short and long wake-up filter time. The tWK_FILTER timing  
for the device has been picked to be within the minimum and maximum values of both filter ranges. This timing  
has been chosen such that a single bit time at 500 kbps, or two back-to-back bit times at 1 Mbps triggers the  
filter in either bus state. Any CAN frame at 500 kbps or less would contain a valid WUP.  
For an additional layer of robustness and to prevent false wake-ups, the device implements a wake-up timeout  
feature. For a remote wake-up event to successfully occur, the entire WUP must be received within the timeout  
value t ≤ tWK_TIMEOUT. If not, the internal logic is reset and the transceiver remains in its current state without  
waking up. The full pattern must then be transmitted again, conforming to the constraints mentioned in this  
section. See Figure 10-1 for the timing diagram of the wake-up pattern with wake timeout feature.  
Bus Wake via RXD  
Wake Up Pattern (WUP) received in t < tWK_Timeout  
Request  
Filtered  
Dominant  
Filtered  
Dominant  
Filtered  
Recessive  
Waiting for  
Filtered  
Dominant  
Waiting for  
Filtered  
Recessive  
Bus  
Bus VDiff  
RXD  
tWK_FILTER  
tWK_FILTER  
tWK_FILTER  
tWK_FILTER  
Filtered Dominant RXD Output  
Bus Wake Via RXD Requests  
Figure 10-1. Wake-Up Pattern (WUP) with tWK_TIMEOUT  
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10.5 Functional Block Diagram  
VISOIN  
VIO  
IN  
Tx  
Tx  
Tx  
Rx  
Rx  
Rx  
Rx  
Tx  
OUT  
TXD  
STB  
RXD  
CANH  
CANL  
D
R
GNDIO  
GISOIN  
VISOOUT  
VDD  
VSIN  
EN/FLT  
DC-DC Secondary  
DC-DC Primary  
GND1  
GND2  
Galvanic Isolation  
Barrier  
Figure 10-2. Block Diagram  
Receiver  
Transmitter  
TX IN  
OOK  
Modulation  
TX IN  
SiO based  
2
RX OUT  
TX Signal  
Conditioning  
RX Signal  
Conditioning  
Envelope  
Detection  
Capacitive  
Isolation  
Barrier  
Carrier signal through  
isolation barrier  
Emissions  
Reduction  
Techniques  
RX OUT  
Oscillator  
Figure 10-3. Signal Isolation channel  
10.6 Feature Description  
10.6.1 CAN Bus States  
The CAN bus has two logical states during operation: recessive and dominant. A dominant bus state occurs  
when the bus is driven differentially and corresponds to a logic low on the TXD and RXD pins. A recessive bus  
state occurs when the bus is biased to VCC/2 via the high-resistance internal input resistors (RIN) of the receiver  
and corresponds to a logic high on the TXD and RXD pins.  
A dominant state overwrites the recessive state during arbitration. Multiple CAN nodes may be transmitting a  
dominant bit at the same time during arbitration, and in this case the differential voltage of the bus is greater than  
the differential voltage of a single driver.  
The ISOW1044 transceiver implements a standby (STB ) mode which enables a third bus state where the bus  
pins are weakly biased to ground via the high resistance internal resistors of the receiver.  
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Normal Mode  
Standby Mode  
CANH  
VDIFF  
VDIFF  
CANL  
Recessive  
Dominant  
Recessive  
Time, t  
Figure 10-4. Bus States (Physical Bit Representation)  
CANH  
2.5V  
A
RXD  
Bias  
Unit  
B
GND  
CANL  
Figure 10-5. Simplified Recessive Common Mode Bias and Receiver  
A. A - Normal Mode B - Standby Mode  
10.6.2 Digital Inputs and Outputs: TXD (Input) and RXD (Output)  
The VIO supply for the isolated digital input and output side of the device can be supplied by 1.8-V, 2.5-V, 3.3-V,  
and 5-V supplies and therefore the digital inputs and outputs are 1.8-V, 2.5-V, 3.3-V, and 5-V compatible.  
10.6.3 TXD Dominant Timeout (DTO)  
The TXD DTO circuit prevents the transceiver from blocking network communication in the event of a hardware  
or software failure where the TXD pin is held dominant longer than the timeout period, tTXD_DTO. The DTO circuit  
timer starts on a falling edge on the TXD pin. The DTO circuit disables the CAN bus driver if no rising edge  
occurs before the timeout period expires, which frees the bus for communication between other nodes on the  
network. The CAN driver is activated again when a recessive signal occurs on the TXD pin, clearing the TXD  
DTO condition. The receiver and RXD pin still reflect activity on the CAN bus, and the bus terminals are biased  
to the recessive level during a TXD dominant timeout.  
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TXD fault stuck dominant  
Example: PCB failure or bad software  
Fault is repaired and transmission  
capability is restored  
TXD  
(driver)  
tTXD_DTO  
Driver disabled freeing bus for other nodes  
Bus would be stuck dominant, blocking communication for the  
whole network but TXD DTO prevents this and frees the bus for  
communication after the tTXD_DTO time.  
Normal CAN  
communication  
CAN  
Bus  
Signal  
tTXD_DTO  
Communication from  
other bus nodes  
Communication from  
repaired nodes  
RXD  
(receiver)  
Communication from  
local node  
Communication from  
other bus nodes  
Communication from  
repaired nodes  
Figure 10-6. Example Timing Diagram for TXD DTO  
Note  
The minimum dominant TXD time (tTXD_DTO) allowed by the TXD DTO circuit limits the minimum  
possible transmitted data rate of the device. The CAN protocol allows a maximum of eleven  
successive dominant bits (on TXD) for the worst case, where five successive dominant bits are  
followed immediately by an error frame. This, along with the tTXD_DTO minimum, limits the minimum  
data rate. Calculate the minimum transmitted data rate with Equation 1.  
Minimum Data Rate = 11 / tTXD_DTO  
(1)  
10.6.4 Power-Up and Power-Down Behavior  
The ISOW1044 has built-in under-voltage lockout (UVLO) on all supplies (VDD, VIO and VISOOUT) with positive-  
going and negative-going thresholds and hysteresis. Both the power converter supply (VDD) and Logic supply  
(VIO) need to be present for the device to work. If either of them is below its UVLO, both the signal path and the  
power converter are disabled.  
Assuming VIO is above its UVLO+, when the VDD voltage crosses the positive-going UVLO threshold during  
power-up, the DC-DC converter initializes and the power converter duty cycle is increased in a controlled  
manner. This soft-start scheme limits primary peak currents drawn from the VDD supply and charges the VISOOUT  
output in a controlled manner, avoiding overshoots. CAN BUS is in high impedance state in this duration.  
When the UVLO positive-going threshold is crossed on the secondary side VISOOUT pin, the feedback channel  
starts providing feedback to the primary controller. The regulation loop takes over and CAN drive output,  
Received data output (RXD) and gneral purpose logic channel (OUT) take their respective states defined by the  
inputs to the device i.e. Standby (STB), Driver data to be transmitted TXD, and general purpose logic input IN  
respectively. Designers should consider a sufficient time margin (typically 5 ms with 10-µF load capacitance) to  
allow this power up sequence before any usable system functionality.  
When either of VDD or VIO is lost, the primary side DC-DC controller turns off when the UVLO lower threshold is  
reached. The VISOOUT capacitor then discharges depending on the isolation channels and BUS load.  
10.6.5 Protection Features  
The ISOW1044 device has multiple protection features to create a robust system level solution.  
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The first feature is an Enable/Fault protection feature. This EN/FLT pin can be used as either an input pin to  
enable or disable the integrated DC-DC power converter or as an output pin which works as an alert signal if  
the power converter is not operating properly. In the /Fault use case, a fault is reported if VDD > 7 V, VDD < 2.5  
V, or if the junction temperature >170°C. When a fault is detected, this pin will go low, disabling the DC-DC  
converter to prevent any damage.  
5 kΩ  
Powers Down CAN Transceiver  
and DC-DC Converter.  
EN/FLT  
MCU OUTPUT  
IQ < 1 mA Typical  
MCU INPUT  
Fault Reported If  
VDD < 2.5 V  
VDD > 7 V  
Junction Temp > 170° C  
Figure 10-7. EN Fault Pin Diagram  
An over-voltage clamp feature is present on VISOOUT which will clamp the voltage at 6 V if there is an increase  
in voltage seen. For device reliability, it is recommended that VISOOUT stays lower than the over-clamp voltage  
for device reliability.  
Over-Voltage Lock Out (OVLO) on VDD will occur when a voltage higher than 7 V on VDD is seen. At OVLO,  
the device will go into a low power state and the EN/FLT pin will go low.  
In cases of overload or short on power converter output VISOOUT, maximum duty cycle of power converter is  
limited. In cases of driver bus short circuit due to the external power supply cable shorting to the bus cable,  
short circuit current protection on CAN chip restricts the bus current to ±115 mA maximum.  
Thermal protection is also integrated to help prevent the device from getting damaged under such scenarios.  
An increase in the die temperature is monitored and the device is disabled when the die temperature  
becomes 165 (typical), thus disabling the short condition. The device is re-enabled when the junction  
temperature becomes 155 (typical). If an overload or output short-circuit condition prevails, this protection  
cycle is repeated. Care should be taken in the system design to prevent repeated or prolonged exposure to  
bus shorts as this exposes the device to high junction temperatures for extreme amounts of time affecting  
device reliability.  
10.6.6 Floating Pins, Unpowered Device  
The ISOW1044 is designed to be ideal passive or no load to the CAN bus if it is unpowered. The bus pins  
(CANH, CANL) have extremely low leakage currents when the device is unpowered to avoid loading down the  
bus which is critical if some nodes of the network are unpowered while the rest of the of network remains in  
operation.  
The device has internal pull-ups on critical pins (TXD and STB) which places the device into known states if the  
pin floats. This internal bias should not be relied upon by design though, especially in noisy environments, but  
instead should be considered a failsafe protection feature. When a CAN controller supporting open drain outputs  
is used, an adequate external pull-up resistor must be used to ensure that the TXD output of the CAN controller  
maintains adequate bit timing to the input of the CAN transceiver. See Table 10-3 for more details.  
10.6.7 Glitch-Free Power Up and Power Down  
Communication on the bus that already exist between a master node and slave node in a CAN network must not  
be disturbed when a new node is swapped in or out of the network. No glitches on the bus should occur when  
the device is:  
Hot plugged into the network in an unpowered state  
Hot plugged into the network in a powered state and recessive state  
Powered up or powered down in a recessive state when already connected to the bus  
The ISOW1044 device meets above criteria and does not cause any false data toggling on the bus when  
powered up or powered down in a recessive state with supply ramp rates >= 50 us.  
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10.7 Device Functional Modes  
Table 10-1 lists the supply configuration for these devices:  
Table 10-1. Supply configuration Function Table  
INPUTS  
VIO  
OUTPUTS  
BUS OUTPUT (CANH/  
CANL)  
(2)  
VDD  
< VDD(UVLO+)  
>VDD(UVLO+)  
5 V  
EN/FLT  
RXD  
VISOOUT  
Recessive  
(Default High)  
>VIO(UVLO+)  
<VIO(UVLO+)  
X
High-Z  
OFF  
Recessive  
(Default High)  
X
H or Open  
L
High-Z  
Invalid Operation  
Per Device Mode (1) and  
TXD  
1.71 V to 5.5 V  
1.71 V to 5.5 V  
Mirrors Bus  
5 V  
Recessive  
(Default High)  
5 V  
High-Z  
OFF  
(1) At Normal mode (STB = L), BUS OUTPUT follows TXD. Otherwise if at Standby mode (STB = H or Open), BUS OUTPUT is High-Z.  
(2) VISOOUT shorted to VISOIN on PCB. GND2 and GISOIN pins are shorted together and EN/FLT = High.  
Table 10-2 shows the different driver functional modes:  
Table 10-2. Driver Functional Table  
INPUTS  
EN/FLT  
OUTPUTS  
CANL (3)  
(1)  
VDD  
VIO  
STB  
INPUT TXD  
L
CANH (3)  
DRIVEN BUS STATE  
Dominant  
H
Z
L
Z
L
H or Open  
Recessive  
H or Open  
L
Weak pull-down to  
ground  
PU  
PU  
H or Open  
X
X
X
Hi-Z  
Hi-Z  
Hi-Z  
Hi-Z  
Weak pull-down to  
ground  
Weak pull-down to  
ground  
PD  
PU  
PU  
X
X
X
X
X
X
Hi-Z  
Hi-Z  
PD(2)  
Invalid Operation  
(1) PU=Powered up, PD=Powered down; H=high level; L=Low level; X=Irrelevant; Z = common-mode (recessive) biased to VISOIN/2 ,  
Hi-Z=High impedance state  
(2) A strongly driven input signal on TXD can weakly power the floating VIO through an internal protection diode and cause an  
undetermined output.  
(3) VISOOUT shorted to VISOIN on PCB and GND2 and GISOIN pins are shorted together and EN/FLT = High  
At Normal mode (STB = L), the CAN outputs follow the logic states at data input, TXD. A logic low at the TXD  
input causes the CAN output to go dominant. Therefore the differential output voltage defined by Equation 2 is  
positive. A logic high at the TXD input causes the CAN BUS to go recessive. Therefore the differential output  
voltage defined by Equation 2 is negative.  
VOD = VCANH – VCANL  
(2)  
At Standby mode (STB = H or Open), both outputs go to the high-impedance (Hi-Z) state. The logic state at the  
TXD pin is irrelevant when this mode. The driver is disabled (bus outputs are in the Hi-Z) by default when the  
STB pin is left open. The TXD pin has an internal pullup resistor.  
Table 10-3 shows the different receiver functional modes:  
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Table 10-3. Receiver Functional Table  
INPUTS  
OUTPUT  
CAN DIFFERENTIAL  
(1)  
VDD  
VIO  
EN/FLT  
STB  
INPUTS VID = VCANH  
VCANL  
-
BUS STATE  
RXD (3)  
VID > 0.9 V  
Dominant  
Undefined  
Recessive  
Dominant  
Undefined  
Recessive  
Open  
L
Undefined  
H
L
0.5 V< VID < 0.9 V  
VID < 0.5 V  
H or Open  
VID > 1.15 V  
PU  
PU  
H (L if a remote wake  
event occurred)  
H or Open  
0.4 V< VID < 1.15 V  
VID < 0.4 V  
X
X
X
X
Open (VID = 0 V)  
H
Hi-Z  
L
X
X
X
X
X
X
PD  
PU  
PU  
X
Hi-Z  
PD(2)  
X
Invalid Operation  
(1) PU=Powered up, PD=Powered down; H=high level; L=Low level; X=Irrelevant; Hi-Z=High impedance state  
(2) A strongly driven input signal on TXD can weakly power the floating VIO through an internal protection diode and cause an  
undetermined output.  
(3) VISOOUT shorted to VISOIN on PCB. GND2 and GISOIN pins are shorted together and EN/FLT = High  
At Normal mode (STB = L), the receiver output, RXD, goes low when the differential input voltage defined by  
Equation 3 is greater than the positive input threshold, VIT+. The receiver output, RXD, goes high when the  
differential input voltage defined by Equation 3 is less than the negative input threshold, VIT– . If the VID voltage  
is between the VIT+ and VIT– thresholds, the output is indeterminate.  
VID = VCANH – VCANL  
(3)  
At Standby mode (STB = H or Open), RXD output goes high and if a remote wake-up event occurs, it goes low.  
Other device feature functional states are shown inTable 10-4 and Table 10-5 below:  
Table 10-4. DC-DC Converter Enable/Disable  
INPUTS  
OUTPUT  
VISOOUT  
5 V  
VDD  
PU  
PU  
VIO  
PU  
PU  
EN/FLT  
H or Open  
L
OFF  
Table 10-5. General Purpose Logic Input/Output  
INPUTS  
OUTPUT  
CommentsComments  
(1) (2)  
VDD  
VIO  
EN/FLT  
IN  
H
OUT  
H
Output channel assumes  
logic state governed by IN  
H or Open  
L
L
PU  
PU  
Open  
X
L
Hi-Z  
Default state  
L
X
X
Device is in disabled state  
when either of VDD or VIO is  
missing  
PD  
PU  
PU  
PD  
X
Hi-Z  
X
Invalid Operation  
(1) PU = Powered Up; PD = Powered Down; H = Logic High; L= Logic Low; X = Irrelevant, Hi-Z = High Impedance (OFF) state  
(2) VISOOUT shorted to VISOIN on PCB. GND2 and GISOIN pins are shorted together and EN=High  
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10.8 Device I/O Schematics  
TXD, STB  
VIO  
VIO  
IN  
VIO  
VIO  
VIO  
VIO  
VIO  
500 k  
985  
985 ꢀ  
IN  
TXD, STB  
500 kꢀ  
GNDIO  
GNDIO  
GNDIO  
GNDIO  
GNDIO  
GNDIO  
EN/FLT  
VIO  
RXD  
VIO  
VIO  
VIO  
VIO  
550 kꢀ  
EN/FLT  
~20 ꢀ  
RXD  
1mA  
GND1  
GND1  
GND1  
GND1  
GNDIO  
OUT  
VISOIN  
~20 ꢀ  
OUT  
GISOIN  
Figure 10-8. Device I/O schematics  
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11 Application and Implementation  
Note  
Information in the following applications sections is not part of the TI component specification, and  
TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining  
suitability of components for their purposes. Customers should validate and test their design  
implementation to confirm system functionality.  
11.1 Application Information  
The ISOW1044 device can be used with other components from Texas Instruments such as a microcontroller  
and a linear voltage regulator to form a fully isolated CAN interface. Typically two power supplies isolated from  
each other are needed to power up both sides of Isolated CAN device. Due to the integrated DC-DC converter in  
the device, the isolated supply is generated inside the device that can be used to power isolated side of the CAN  
device and peripherals on isolated side, thus saving board space.  
11.2 Typical Application  
The ISOW1044 device is suitable for applications that have limited board space and desire more integration.  
It is also suitable for very high voltage applications, where power transformers meeting the required isolation  
specifications are bulky and expensive. The device can be used in applications with a host micro-controller  
or FPGA that includes the link layer portion of the CAN protocol. Figure 11-1 shows a typical application  
configuration for 5 V controller applications. The bus termination is shown for illustrative purposes. The  
ISOW1044 device meets 8 kV contact ESD (Electrostatic discharge) per IEC 61000-4-2 standalone with no  
external components on bus. If the application requires the usage of Common mode choke (CMC) , then use of  
Transient voltage suppressor (TVS) is a must to achieve 8kV IEC ESD.  
4.7k  
Extra current  
~20mA  
8
FB  
10μF  
0.1μF  
1
EN/FLT  
20  
V
VISOIN  
IO  
Other field  
circuitry  
0.1μF  
15  
6
4
3
GISOIN  
GNDIO
VIO  
16  
17  
GISOIN  
GISOIN  
GPIO1  
MCU  
STB  
ISOW1044  
Optional  
Termination  
TXD  
TXD  
19  
CANH  
CAN  
BUS  
5
2
RXD  
RXD  
18  
14  
CANL  
GPIO2  
IN  
NC  
L1  
N
OUT  
7
DGND  
13  
VSIN  
PSU  
FB  
FB  
FB  
FB  
9
12  
11  
VDD  
VISOOUT  
5V  
PE  
10  
GND  
GND1  
GND2  
10µF  
1µF 10nF  
10nF 1µF 10µF  
Optional bus protection  
Galvanic  
Isolation Barrier  
Notes:  
1. Keep 10 nF bypass capacitors close to VDD and VISOOUT pins (< 1 mm) for opmum Radiated emissions performance  
2. GND1 and GNDIO need be shorted directcly. GND2 and GISOIN need be shorted directly, or through ferrite beads.  
3. All GISOIN pins (pin 15, 16, 17) need be shorted on PCB for opmum IEC-ESD performance.  
4. VSIN and VISOOUT must be shorted on PCB.  
Figure 11-1. Application circuit for ISOW1044  
11.2.1 Design Requirements  
Unlike an optocoupler-based solution, which requires several external components to improve performance,  
provide bias, or limit current, the ISOW1044 device only requires external bypass capacitors to operate as  
shown in above application diagram.  
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Because of very-high current flowing through the device VDD and VISOOUT supplies, higher decoupling capacitors  
typically provide better noise and ripple performance. Although a 10-µF capacitor is adequate, higher decoupling  
capacitors (such as 47 µF) on both the VDD and VISOOUT pins to the respective grounds are strongly  
recommended to achieve the best performance.  
11.2.2 Detailed Design Procedure  
11.2.2.1 Bus Loading, Length and Number of Nodes  
The ISO 11898-2 Standard specifies a maximum bus length of 40 m and maximum stub length of 0.3 m.  
However, with careful design, users can have longer cables, longer stub lengths, and many more nodes to  
a bus. A large number of nodes requires transceivers with high input impedance such as the ISOW1044  
transceiver.  
Many CAN organizations and standards have scaled the use of CAN for applications outside the original ISO  
11898-2 Standard. These organizations and standards have made system-level trade-offs for data rate, cable  
length, and parasitic loading of the bus. Examples of some of these specifications are ARINC825, CANopen,  
DeviceNet, and NMEA2000.  
The ISOW1044 device is specified to meet the 1.5-V requirement with a 50-Ω load, incorporating the worst  
case including parallel transceivers. The differential input resistance of the device is a minimum of 30 kΩ. If 100  
ISOW1044 transceivers are in parallel on a bus, this requirement is equivalent to a 300-Ω differential load worst  
case. That transceiver load of 300 Ω in parallel with the 60 Ω gives an equivalent loading of 50 Ω. Therefore,  
the ISOW1044 device theoretically supports up to 100 transceivers on a single bus segment. However, for CAN  
network design margin must be given for signal loss across the system and cabling, parasitic loadings, network  
imbalances, ground offsets and signal integrity, therefore a practical maximum number of nodes is typically much  
lower. Bus length may also be extended beyond the original ISO 11898 standard of 40 m by careful system  
design and data-rate tradeoffs. For example, CAN open network design guidelines allow the network to be up to  
1 km with changes in the termination resistance, cabling, less than 64 nodes, and a significantly lowered data  
rate.  
This flexibility in CAN network design is one of the key strengths of the various extensions and additional  
standards that have been built on the original ISO 11898-2 CAN standard. Using this flexibility requires the  
responsibility of good network design and balancing these tradeoffs.  
11.2.2.2 CAN Termination  
The ISO11898 standard specifies the interconnect to be a single twisted pair cable (shielded or unshielded) with  
120-Ω characteristic impedance (ZO). Resistors equal to the characteristic impedance of the line should be used  
to terminate both ends of the cable to prevent signal reflections. Unterminated drop-lines (stubs) connecting  
nodes to the bus should be kept as short as possible to minimize signal reflections. The termination may be in a  
node, but if nodes are removed from the bus, the termination must be carefully placed so that it is not removed  
from the bus.  
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Node 1  
Node 2  
Node 3  
Node n  
(with termination)  
MCU or DSP  
MCU or DSP  
MCU or DSP  
MCU or DSP  
CAN  
Controller  
CAN  
Controller  
CAN  
Controller  
CAN  
Controller  
CAN  
Transceiver  
CAN  
Transceiver  
CAN  
Transceiver  
CAN  
Transceiver  
RTERM  
RTERM  
Figure 11-2. Typical CAN Bus  
Termination may be a single 120-Ω resistor at the end of the bus, either on the cable or in a terminating  
node. If filtering and stabilization of the common-mode voltage of the bus is desired, then split termination can  
be used as below termination concepts. Split termination improves the electromagnetic emissions behavior of  
the network by eliminating fluctuations in the bus common-mode voltages at the start and end of message  
transmissions.  
Standard Termination  
Split Termination  
CANH  
CANH  
RTERM / 2  
CAN  
Transceiver  
CAN  
Transceiver  
RTERM  
CSPLIT  
RTERM / 2  
CANL  
CANL  
Figure 11-3. CAN Bus Termination Concepts  
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11.2.3 Application Curve  
Red: Peak vertical scan. Green: Peak horizontal scan  
VDD = 5 V  
VISOOUT = 5 V  
Data rate = 1 Mbps  
Figure 11-4. ISOW1044 Radiated Emissions versus CISPR32B line  
11.2.4 Insulation Lifetime  
Insulation lifetime projection data is collected by using industry-standard Time Dependent Dielectric Breakdown  
(TDDB) test method. In this test, all pins on each side of the barrier are tied together creating a two-terminal  
device and high voltage applied between the two sides; See Figure 11-5 for TDDB test setup. The insulation  
breakdown data is collected at various high voltages switching at 60 Hz over temperature. For reinforced  
insulation, VDE standard requires the use of TDDB projection line with failure rate of less than 1 part per million  
(ppm). Even though the expected minimum insulation lifetime is 20 years at the specified working isolation  
voltage, VDE reinforced certification requires additional safety margin of 20% for working voltage and 87.5% for  
lifetime which translates into minimum required insulation lifetime of 37.5 years at a working voltage that's 20%  
higher than the specified value. Figure 11-6 shows the intrinsic capability of the isolation barrier to withstand high  
voltage stress over its lifetime. Based on the TDDB data, the intrinsic capability of the insulation is 1000 VRMS  
with a lifetime of 1184 years.  
A
Vcc 1  
Vcc 2  
Time Counter  
> 1 mA  
DUT  
GND 1  
GND 2  
V
S
Oven at 150 °C  
Figure 11-5. Test Setup for Insulation Lifetime Measurement  
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Figure 11-6. Insulation Lifetime Projection Data  
12 Power Supply Recommendations  
To make sure that operation is reliable at all data rates and supply voltages, adequate decoupling capacitors  
must be located as close to supply pins as possible. Power converter input VDD and output VISOOUT supply pins  
should have high frequency ceramic capacitors 10 nF and bulk capacitors 10 μF atleast close to the pins. Signal  
path supply pins, VIO and VISOIN , should have 100 nF or higher value ceramic bypass capacitors close to device  
pins. ISOW10144 can consume typical peak pulse currents of upto 250mA under fully loaded conditions for short  
durations (10s of µs) from the power source that is powering VDD of ISOW1044. Please make sure the current  
limit of upstream power device is atleast 300mA typical.  
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13 Layout  
13.1 Layout Guidelines  
Figure 11-1 shows the recommended placement and routing of device bypass capacitors. Below guidelines must  
be followed to achieve low emissions design:  
1. High frequency bypass capacitors 10 nF must be placed close to VDD and VISOOUT pins, within 1 mm  
distance away from device pins. This is very essential for optimised radiated emissions performance. Ensure  
that these capacitors are 0402 size so that they offer least inductance (ESL).  
2. Bulk capacitors of atleast 10 μF must be placed on power converter input (VDD) and output (VISOOUT) supply  
pins after the 10 nF capacitor with a distance of 2 - 4 mm, as shown in Layout Example.  
3. Traces on VDD and GND1 must be symmetric till bypass capacitors. Similarly traces on VISOOUT and GND2  
must be symmetric.  
4. Place two 0402 size Ferrite beads (Part number: BLM15EX331SN1) on power supply pins, one between  
VISOOUT and VISOIN and the other between GND2 (pin 11) and GND2(pin 15), as shown in example PCB  
layout, so that any high frequency noise from power converter output sees a high impedance before it goes  
to other components on PCB.  
5. Do not have any metal traces or ground pour within 4 mm of power converter output terminals VISOOUT  
(pin12) and GND2 (pin11).  
6. Place the CAN BUS protection and filtering circuitry close to the bus connector to prevent transients,  
ESD, and noise from propagating onto the board. This layout example shows an optional transient voltage  
suppression (TVS) diode, D1, which may be implemented if the system-level requirements exceed the  
specified rating of the transceiver. This example also shows two optional 68pF bus filter capacitors  
7. Common mode choke or ferrite beads on bus terminals (CANH/CANL) can minimise any high frequency  
noise that can couple of CAN bus cable which can act as antenna and amplify that noise. This will improve  
Radiated emissions performance on a system level.  
8. Following the layout guidelines of EVM as much as possible is highly recommended for a low radiated  
emissions design. EVM Link is available in Related Documentation.  
13.2 Layout Example  
Optional  
Protection and  
Termination  
Ground plane on side2  
0.1 µF  
10 µF  
68 pF  
C
ISOW1044  
<2mm  
VIO  
<2mm  
VISOIN  
0.1 µF  
C
C
FB5  
Input Supply 1  
20  
19  
1
C
IN  
CANH  
CANL  
2
CAN  
BUS  
D1  
TXD  
3
4
18  
17  
STB  
GISOIN  
C
RXD  
GNDIO  
5
68 pF  
16 GISOIN  
6
GISOIN  
OUT  
15  
14  
13  
12  
11  
NC  
EN/FLT  
VDD  
7
Ground  
plane on  
side2  
VSIN  
8
2-4mm  
1 µF  
<1mm  
10 nF  
10 nF  
1 µF 10 µF  
10 µF  
FB4  
Input Supply 2  
Input Ground  
FB1  
FB2  
9
VISOOUT  
GND2  
C
C
C
C
C
C
FB3  
GND1  
10  
Ground plane on  
side 1  
2-4mm  
<1mm  
Keep-out zone  
for any metal  
Figure 13-1. Layout example  
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14 Device and Documentation Support  
14.1 Documentation Support  
14.1.1 Related Documentation  
For related documentation see the following:  
Texas Instruments, Digital Isolator Design Guide  
Texas Instruments, Isolation Glossary  
ISOW1044DFM Evaluation board  
14.2 Receiving Notification of Documentation Updates  
To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper  
right corner, click on Alert me to register and receive a weekly digest of any product information that has  
changed. For change details, review the revision history included in any revised document.  
14.3 Support Resources  
TI E2Esupport forums are an engineer's go-to source for fast, verified answers and design help — straight  
from the experts. Search existing answers or ask your own question to get the quick design help you need.  
Linked content is provided "AS IS" by the respective contributors. They do not constitute TI specifications and do  
not necessarily reflect TI's views; see TI's Terms of Use.  
14.4 Trademarks  
TI E2Eis a trademark of Texas Instruments.  
All trademarks are the property of their respective owners.  
14.5 Electrostatic Discharge Caution  
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled  
with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.  
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may  
be more susceptible to damage because very small parametric changes could cause the device not to meet its published  
specifications.  
14.6 Glossary  
TI Glossary  
This glossary lists and explains terms, acronyms, and definitions.  
15 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical packaging and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
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PACKAGE OPTION ADDENDUM  
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29-Jan-2022  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead finish/  
Ball material  
MSL Peak Temp  
Op Temp (°C)  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(3)  
(4/5)  
(6)  
ISOW1044BDFMR  
ISOW1044DFMR  
XISOW1044DFMR  
ACTIVE  
ACTIVE  
ACTIVE  
SOIC  
SOIC  
SOIC  
DFM  
DFM  
DFM  
20  
20  
20  
850  
850  
850  
RoHS & Green  
RoHS & Green  
TBD  
NIPDAU  
Level-3-260C-168 HR  
Level-3-260C-168 HR  
Call TI  
-40 to 125  
-40 to 125  
-40 to 125  
ISOW1044  
ISOW1044  
NIPDAU  
Call TI  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) RoHS: TI defines "RoHS" to mean semiconductor products that are compliant with the current EU RoHS requirements for all 10 RoHS substances, including the requirement that RoHS substance  
do not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, "RoHS" products are suitable for use in specified lead-free processes. TI may  
reference these types of products as "Pb-Free".  
RoHS Exempt: TI defines "RoHS Exempt" to mean products that contain lead but are compliant with EU RoHS pursuant to a specific EU RoHS exemption.  
Green: TI defines "Green" to mean the content of Chlorine (Cl) and Bromine (Br) based flame retardants meet JS709B low halogen requirements of <=1000ppm threshold. Antimony trioxide based  
flame retardants must also meet the <=1000ppm threshold requirement.  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6)  
Lead finish/Ball material - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead finish/Ball material values may wrap to two  
lines if the finish value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
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29-Jan-2022  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
30-Jan-2022  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
ISOW1044BDFMR  
ISOW1044DFMR  
SOIC  
SOIC  
DFM  
DFM  
20  
20  
850  
850  
330.0  
330.0  
24.4  
24.4  
10.85 13.4  
10.85 13.4  
4.0  
4.0  
16.0  
16.0  
16.0  
16.0  
Q1  
Q1  
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
30-Jan-2022  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
ISOW1044BDFMR  
ISOW1044DFMR  
SOIC  
SOIC  
DFM  
DFM  
20  
20  
850  
850  
350.0  
350.0  
350.0  
350.0  
43.0  
43.0  
Pack Materials-Page 2  
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These resources are intended for skilled developers designing with TI products. You are solely responsible for (1) selecting the appropriate  
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Copyright © 2022, Texas Instruments Incorporated  

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