DAC161P997CISQX/NOPB [TI]

DAC161P997 Single-Wire 16-bit DAC for 4- to 20-mA Loops;
DAC161P997CISQX/NOPB
型号: DAC161P997CISQX/NOPB
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
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DAC161P997 Single-Wire 16-bit DAC for 4- to 20-mA Loops

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DAC161P997  
SNAS515G JULY 2011REVISED DECEMBER 2014  
DAC161P997 Single-Wire 16-bit DAC for 4- to 20-mA Loops  
1 Features  
3 Description  
The DAC161P997 is a 16-bit ∑Δ digital-to-analog  
1
16-Bit Linearity  
converter (DAC) for transmitting an analog output  
current over an industry standard 4-20 mA current  
loop. It offers 16-bit accuracy with a low output  
current temperature coefficient (29 ppm/°C) and  
excellent long-term output current drift (90 ppmFS)  
while consuming less than 190 µA.  
Single-Wire Interface (SWIF), with Handshake  
Digital Data Transmission (No Loss of Fidelity)  
Pin Programmable Power-Up Condition  
Self Adjusting to Input Data Rate  
Loop Error Detection and Rreporting  
Programmable Output Current Error Level  
No External Precision Components  
Simple Interface to HART Modulator  
The data link to the DAC161P997 is a Single Wire  
Interface (SWIF) which allows sensor data to be  
transferred in digital format over an isolation  
boundary using a single isolation component. The  
DAC161P997’s digital input is compatible with  
standard isolation transformers and opto-couplers.  
Error detection and handshaking features within the  
SWIF protocol ensure error free communication  
across the isolation boundary. For applications where  
isolation is not required, the DAC161P997 interfaces  
directly to a microcontroller.  
Small Package: WQFN-16 (4 x 4 mm, 0.5 mm  
Pitch)  
Key Specifications  
Output Current TempCo: 29 ppmFS/°C (Max)  
Long-Term Output Current Drift: 90 ppmFS  
(Typ)  
The loop drive of the DAC161P997 interfaces to a  
HART (Highway Addressable Remote Transducer)  
modulator, allowing injection of FSK modulated digital  
data into the 4-20 mA current loop. This combination  
INL: 3.3/2.1 µA(Max)  
Total Supply Current: 190 µA (Max)  
2 Application  
of specifications  
and features  
makes  
the  
DAC161P997 ideal for 2- and 4-wire industrial  
transmitters.  
Two-Wire, 4-20 mA Current Loop Transmitter  
Industrial Process Control  
Actuator Control  
The DAC161P997 is available in a 16–lead WQFN  
package and is specified over the extended industrial  
temperature range of -40°C to 105°C.  
Factory Automation  
Building Automation  
Device Information(1)  
Precision Instruments  
Data Acquisition Systems  
Test Systems  
PART NUMBER  
PACKAGE  
BODY SIZE (NOM)  
DAC161P997  
WQFN (16)  
4.00 mm x 4.00 mm  
(1) For all available packages, see the orderable addendum at  
the end of the datasheet.  
Simplified Schematic  
Industrial 4-20mA Transmitter  
LOOP+  
LDO  
VD  
VA  
DAC161P997  
ERRB  
BASE  
DBACK  
LOOP  
SUPPLY  
0-24 mA Loop  
µC  
XFRMR  
DIN  
+
-
Sensor  
IN  
GPIO  
ÐÂ DAC  
+
-
16  
I
DAC  
ACKB  
COMD  
COMA  
ERRLVL  
LOOP  
RECEIVER  
80k  
40  
LOW  
OUT  
NC  
LOOP-  
C1  
C2  
C3  
COM  
Circuit common  
return node  
HART Modulator  
1
An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications,  
intellectual property matters and other important disclaimers. PRODUCTION DATA.  
 
 
 
 
DAC161P997  
SNAS515G JULY 2011REVISED DECEMBER 2014  
www.ti.com  
Table of Contents  
7.4 Device Functional Modes........................................ 11  
7.5 Programming .......................................................... 12  
7.6 Register Maps ........................................................ 18  
Application and Implementation ........................ 20  
8.1 Application Information............................................ 20  
8.2 Typical Application ................................................. 26  
Power Supply Recommendations...................... 30  
1
2
3
4
5
6
Features.................................................................. 1  
Application ............................................................. 1  
Description ............................................................. 1  
Revision History..................................................... 2  
Pin Configuration and Functions......................... 3  
Specifications......................................................... 4  
6.1 Absolute Maximum Ratings ...................................... 4  
6.2 ESD Ratings.............................................................. 5  
6.3 Recommended Operating Conditions....................... 5  
6.4 Thermal Information.................................................. 5  
6.5 Electrical Characteristics........................................... 5  
6.6 Timing Requirements ............................................... 7  
6.7 Typical Characteristics.............................................. 8  
Detailed Description ............................................ 10  
7.1 Overview ................................................................. 10  
7.2 Functional Block Diagram ....................................... 10  
7.3 Feature Description................................................. 10  
8
9
10 Layout................................................................... 30  
10.1 Layout Guidelines ................................................. 30  
10.2 Layout Example .................................................... 30  
11 Device and Documentation Support ................. 31  
11.1 Third-Party Products Disclaimer ........................... 31  
11.2 Trademarks........................................................... 31  
11.3 Electrostatic Discharge Caution............................ 31  
11.4 Glossary................................................................ 31  
7
12 Mechanical, Packaging, and Orderable  
Information ........................................................... 31  
4 Revision History  
Changes from Revision F (January 2013) to Revision G  
Page  
Added ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation  
section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and  
Mechanical, Packaging, and Orderable Information section ................................................................................................. 1  
Changed the second Thead to tbody/row and changed role to hdr in the Timing Requirements table ................................ 7  
Deleted the Related links subsection and checked for setting of single-part ...................................................................... 31  
Changes from Revision E (October 2013) to Revision F  
Page  
Changed O to Ω in table....................................................................................................................................................... 17  
Changes from Revision D (March, 2013) to Revision E  
Page  
Changed application circuit .................................................................................................................................................. 26  
2
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DAC161P997  
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SNAS515G JULY 2011REVISED DECEMBER 2014  
5 Pin Configuration and Functions  
WQFN (RGH0016A)  
16 pins  
Top View  
COMA  
COMD  
VD  
1
2
3
4
12  
11  
10  
9
C3  
NC  
DAP=COMA  
LOW  
OUT  
DIN  
Pin Functions  
PIN  
DESCRIPTION  
ESD PROTECTION  
NAME  
NO.  
ESD  
Clamp  
VA  
15  
Analog block positive supply rail  
COMA  
VA  
Analog block negative supply rail (local  
COMMMON)  
ESD  
Clamp  
COMA  
COMD  
1
2
COMA  
Digital block negative supply rail (local  
COMMON)  
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DAC161P997  
SNAS515G JULY 2011REVISED DECEMBER 2014  
www.ti.com  
Pin Functions (continued)  
PIN  
DESCRIPTION  
ESD PROTECTION  
NAME  
VD  
NO.  
3
Digital block positive supply rail  
SWIF input  
DIN  
4
DBACK  
5
SWIF input loop back  
VA  
SWIF acknowledge output - open drain,  
active LOW  
ACKB  
6
ERRLVL  
LOW  
C1  
8
Sets the output current level at power-up  
Must be tied to COMA, COMD potential  
External capacitor  
10  
14  
13  
12  
16  
11  
C2  
External capacitor, HART Input  
External capacitor  
COMA  
C3  
BASE  
N.C.  
External NPN base drive  
User must not connect to this pin  
ERRB  
OUT  
7
Error flag output open drain, active LOW  
COMA  
COMA  
9
-
Loop output current source  
Die Attach Pad. For best thermal  
conductivity and best noise immunity  
DAP should be soldered to the PCB pad  
which is connected directly to circuit  
common node (COMA, COMD)  
DAP  
-
6 Specifications  
6.1 Absolute Maximum Ratings  
over operating free-air temperature range (unless otherwise noted)  
(1)  
MIN  
MAX  
6
UNIT  
V
Supply relative to common (VA, VD to COMA, COMD)  
Voltage between any 2 pins(2)  
0.3  
6
V
Current IN or OUT of any pin - except OUT(2)  
5
mA  
mA  
Output current at OUT  
50  
Junction Temperature  
Storage temperature range, Tstg  
65  
150  
°C  
(1) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings  
only, which do not imply functional operation of the device at these or any other conditions beyond those indicated under Recommended  
Operating Conditions. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.  
(2) When the input voltage (VIN) at any pin exceeds power supplies (VIN < COMA or VIN > VA), the current at that pin must not exceed 5  
mA, and the voltage (VIN) at that pin relative to any other pin must not exceed 6.0V. See Pin Fuctions for additional details of input  
structures.  
4
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SNAS515G JULY 2011REVISED DECEMBER 2014  
6.2 ESD Ratings  
VALUE  
±5500  
±1250  
UNIT  
Human-body model (HBM), per ANSI/ESDA/JEDEC JS-001(1)  
V(ESD)  
Electrostatic discharge  
V
Charged-device model (CDM), per JEDEC specification JESD22-  
C101(2)  
(1) JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process.  
(2) JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process.  
6.3 Recommended Operating Conditions  
MIN  
MAX  
3.6  
0
UNIT  
V
Supply Voltage Range  
(VA - VD)  
2.7  
0
V
(COMA - COMD)  
0
0
V
BASE load to COMA  
OUT load to COMA  
Operating Temperature (TA)  
0
15  
-
pF  
-
-40  
105  
°C  
6.4 Thermal Information  
THERMAL METRIC(1)  
WQFN (16-PINS)  
UNIT  
°C/W  
RθJA  
Junction-to-ambient thermal resistance  
35  
(1) For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report, SPRA953.  
6.5 Electrical Characteristics  
Unless otherwise noted, these specifications apply for VA = VD = 2.7 V to 3.6 V, TA = 25°C, external bipolar transistor:  
2N3904, RE = 22Ω, C1 = C2 = C3 = 2.2 nF.  
PARAMETER  
POWER SUPPLY  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
VA, VD  
VPOR  
Supply Voltage  
VA = VD  
2.7  
3.6  
75  
V
VA Supply Current  
VD Supply Current  
Total Supply Current  
µA  
µA  
µA  
DACCODE=0x0200(1)  
-40 to 105°C  
115  
190  
Power On Reset supply rail  
potential threshold  
1.3  
1.9  
V
DC ACCURACY  
N
Resolution  
16  
Bits  
0x2AAA < DACCODE < 0xD555  
(4mA < ILOOP < 20 mA)  
-40 to 105°C  
See(3)  
INL  
Integral Non-Linearity(2)  
–2.1  
3.3  
µA  
DNL  
TUE  
OE  
Differential Non-Linearity  
Total Unadjusted Error  
Offset Error  
–0.2  
–0.23%  
9.16  
0.2  
0.23%  
9.16  
-40 to 105°C  
0x2AAA < DACCODE < 0xD555  
See(4)  
-40 to 105°C  
FS  
µA  
Offset Error Temp. Coefficient  
138  
nA/°C  
(1) At code 0x0200 the BASE current is minimal, i.e., device current contribution to power consumption is minimized. The SWIF link is  
inactive, i.e., after transmitting code 0x200 to the DAC161P997, there are no more transitions in the channel during the supply current  
measurement.  
(2) INL is measured using “best fit” method in the output current range of 4 mA to 20 mA.  
(3) Specified by design.  
(4) Here offset is the y-intercept of the straight line defined by 4-mA and 20-mA points of the measured transfer characteristic.  
Copyright © 2011–2014, Texas Instruments Incorporated  
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SNAS515G JULY 2011REVISED DECEMBER 2014  
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Electrical Characteristics (continued)  
Unless otherwise noted, these specifications apply for VA = VD = 2.7 V to 3.6 V, TA = 25°C, external bipolar transistor:  
2N3904, RE = 22Ω, C1 = C2 = C3 = 2.2 nF.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
See(5)  
-40 to 105°C  
GE  
Gain Error  
0.22%  
0.22%  
FS  
Gain Error Temp. Coefficient  
4 mA Loop Current Error  
5
29 ppmFS/°C  
18  
DACCODE = 0x2AAA  
-40 to 105°C  
18  
55  
DACCODE = 0xD555  
-40 to 105°C  
20 mA Loop Current Error  
LOW ERROR Current  
HIGH ERROR Current  
55  
µA  
ERR_LOW = default  
-40 to 105°C  
IERRL  
IERRH  
3361  
21702  
3375  
3391  
21817  
ERR_HIGH = default  
-40 to 105°C  
21750  
Long Term Drift — mean shift of  
12 mA output current after 1000  
hrs at 150°C  
LTD  
90  
ppmFS  
mA  
LOOP CURRENT OUTPUT (OUT)  
Minimum tested at DACCODE =  
0x01C2(6)  
-40 to 105°C  
Output Current  
0.18  
100  
24  
Output Impedance  
MΩ  
COMA to OUT voltage drop  
BASE OUTPUT  
BASE short circuit output current BASE forced to COMA potential  
DYNAMIC CHARACTERISTICS  
Output Noise Density  
Integrated Output Noise  
SWIF I/O CHARACTERISTICS  
IOUT = 24 mA  
960  
10  
mV  
mA  
1 kHz  
20  
nA/Hz  
1 Hz to 1 kHz band  
300  
nARMS  
VIH  
VIL  
DIN  
-40 to 105°C  
-40 to 105°C  
0.7* VD  
V
DIN  
0.3*VD  
CDIN  
DIN input capacitance  
10  
pF  
I = 3 mA  
-40 to 105°C  
VOH  
DBACK  
2216  
1783  
I = 5 mA  
-40 to 105°C  
mV  
I = 3 mA  
-40 to 105°C  
VOL  
TD  
DBACK  
547  
I = 5 mA  
-40 to 105°C  
1260  
8
DIN to DBACK delay  
ns  
OPEN DRAIN OUTPUTS  
I = 3 mA  
-40 to 105°C  
550  
1370  
66  
VOL  
VOL  
ACKB  
ERRB  
mV  
I = 5 mA  
-40 to 105°C  
I = 300 µA  
-40 to 105°C  
mV  
I = 3 mA  
-40 to 105°C  
602  
(5) Here Gain Error is the difference in slope of the straight line defined by measured 4-mA and 20-mA points of transfer characteristic, and  
that of the ideal characteristic.  
(6) This should be treated as the minimum LOOP current ensured specification.  
6
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DAC161P997  
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SNAS515G JULY 2011REVISED DECEMBER 2014  
Electrical Characteristics (continued)  
Unless otherwise noted, these specifications apply for VA = VD = 2.7 V to 3.6 V, TA = 25°C, external bipolar transistor:  
2N3904, RE = 22Ω, C1 = C2 = C3 = 2.2 nF.  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Leakage current when output device  
ACKB  
is off  
1
-40 to 105°C  
IOZ  
µA  
Leakage current when output device  
ERRB  
is off  
1
-40 to 105°C  
6.6 Timing Requirements  
MIN  
NOM  
MAX  
UNIT  
SWIF TIMING, INTERNAL TIMER  
Symbol rate: 1/TP  
0.3  
7/16  
3/16  
11/16  
1/16  
12/8  
90  
19.2  
9/16  
5/16  
13/16  
4/8  
kHz  
“D” symbol duty cycle: THD/TP  
“0” symbol duty cycle: TH0/TP  
"1” symbol duty cycle: TH1/TP  
ACKB assert: TA/TP  
1/2  
1/4  
3/4  
1/4  
7/4  
100  
ACKB deassert: TB/TP  
31/16  
110  
TM  
Timeout PeriodM  
ms  
pri_tx: ³0´  
TH0  
pri_tx: ³'´  
THD  
pri_tx: ³1´  
TH1  
TP  
TP  
ACKB: ³$´  
TA  
TB  
Figure 1. Single-Wire Interface (SWIF) Timing Diagram  
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SNAS515G JULY 2011REVISED DECEMBER 2014  
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6.7 Typical Characteristics  
Unless otherwise noted, data presented here was collected under these conditions VA = VD = 3.3V, TA = 25°C, external  
bipolar transistor: 2N3904, RE = 22Ω, C1 = C2 = C3 = 2.2 nF.  
200  
190  
180  
170  
160  
150  
140  
130  
120  
110  
100  
25  
20  
15  
10  
5
Data Rate = 300Baud  
Data Rate = 19200Baud  
Tail of the distribution  
follows Gaussian PDF  
with: =2.0, 1=4.8  
0
0
2
4
6
8 10 12 14 16 18 20  
2.7 2.8 2.9 3.0 3.1 3.2 3.3 3.4 3.5 3.6  
SUPPLY VOLTAGE (V)  
GE TEMPERATURE COEFFICIENT (ppm/°C)  
Figure 2. Supply Current vs Supply Voltage  
Figure 3. Gain Error TC Distribution  
6
35  
30  
25  
Integration BW=1kHz  
Integration BW=10kHz  
5
4
3
2
1
0
20  
Tail of the distribution  
follows Gaussian PDF  
15  
10  
5
with: =3nA, 1=24nA/°C  
0
0
20  
40  
60  
80  
100  
0
4
8
12  
16  
20  
24  
OUTPUT CURRENT (mA)  
OE TEMPERATURE COEFFICIENT (nA/°C)  
Figure 5. Offset Error TC Distribution  
1M  
Figure 4. Integrated Noise vs ILOOP  
0
-10  
-20  
-30  
-40  
100k  
10k  
1k  
-50  
C1=C2=C3=2.2nF  
100  
HART Adaptation  
-60  
-70  
-80  
C1=C2=C3=1nF  
10  
C1=C2=C3=2.2nF  
HART Adaptation  
C1=C2=C3=1nF  
1
1
10  
100  
1k  
10k  
100k  
1
10  
100  
1k  
10k  
100k  
FREQUENCY (Hz)  
INPUT CODE STEP (lsb)  
Figure 6. ΣΔ Modulator Filter Response  
Figure 7. Settling Time vs Input Step Size  
8
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Typical Characteristics (continued)  
Unless otherwise noted, data presented here was collected under these conditions VA = VD = 3.3V, TA = 25°C, external  
bipolar transistor: 2N3904, RE = 22Ω, C1 = C2 = C3 = 2.2 nF.  
300  
250  
200  
150  
100  
50  
2.5  
2.0  
1.5  
1.0  
Min INL  
Max INL  
0.5  
0.0  
-0.5  
-1.0  
-1.5  
-2.0  
-2.5  
VA=VD=2.7V  
VA=VD=3.0V  
VA=VD=3.3V  
VA=VD=3.6V  
0
0
4
8
12  
16  
20  
24  
-40 -20  
0
20 40 60 80 100 120  
OUTPUT CURRENT (mA)  
TEMPERATURE (°C)  
Figure 8. Supply Current vs ILOOP  
Figure 9. Output Linearity vs Temperature  
120  
120  
C1=C2=C3=1nF  
C1=C2=C3=2.2nF  
C1=C2=C3=10nF  
C1=C2=C3=100nF  
C1=C2=C3=1nF  
C1=C2=C3=2.2nF  
C1=C2=C3=10nF  
C1=C2=C3=100nF  
100  
80  
60  
40  
20  
0
100  
80  
60  
40  
20  
0
1
10  
100  
1k  
10k 100k 1M  
1
10  
100  
1k  
10k 100k 1M  
FREQUENCY (Hz)  
FREQUENCY (Hz)  
Figure 10. PSRR: ILOOP=4 mA  
Figure 11. PSRR: ILOOP=20 mA  
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7 Detailed Description  
7.1 Overview  
The DAC161P997 is a 16-bit DAC realized as a ∑Δ modulator. The DAC’s output is a current pulse train that is  
filtered by the on-board low pass RC filter. The final output current is a multiplied copy of the filtered modulator  
output. This architecture ensures an excellent linearity performance, while minimizing power consumption of the  
device.  
The DAC161P997 eases the design of robust, precise, long-term stable industrial systems by integrating all  
precision elements on-chip. Only a few external components are needed to realize a low-power, high-precision  
industrial 4-20 mA transmitter.  
In case of a fault, or during initial power-up the DAC161P997 will output current in either upper or lower error  
current band. The choice of band is user selectable via a device pin. The error current value is user  
programmable via the SWIF link by the Master.  
7.2 Functional Block Diagram  
VD  
LOW  
ERRLVL  
DBACK  
DIN  
ERRB  
COMD  
SWIF  
CONTROLLER  
6'  
OSC  
POR  
ACKB  
COMD  
COMD  
VA  
NC  
VA  
15k  
15k  
15k  
+
-
BASE  
I
REF  
COMA  
COMA  
80k  
40  
OUT  
C1  
C2  
C3  
7.3 Feature Description  
7.3.1 Error Detection and Reporting  
The user can modify the CONFIG2:(LOOP | CHANNEL | PARITY | FRAME) bits to mask or enable the reporting  
of any of the detectable fault conditions. The DAC161P997 reports errors by asserting the ERRB signal, and by  
setting the current sourced by OUT to a value dictated by the state at ERRLVL pin and the contents of the  
ERR_HIGH and ERR_LOW registers. Once the condition causing the fault is removed the OUT will return to the  
last valid output level prior to the occurrence of the fault.  
10  
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SNAS515G JULY 2011REVISED DECEMBER 2014  
Feature Description (continued)  
Table 1 below summarizes the detectable faults, and means of reporting. The interval TM is governed by the  
internal timer and is specified in Electrical Characteristics.  
Table 1. Error Detection and Reporting  
REPORTING  
ERROR  
CAUSE  
Value used by the DAC to set OUT pin  
current  
ERRB  
The device cannot sustain the required output current at  
OUT pin, typically caused by drop in loop supply, or  
increased load impedance.  
LOOP  
LOW  
ERR_LOW  
The DAC161P997 automatically clears this fault after  
interval of TM and attempts to establish output current  
dictated by the value in the DACCODE register  
ERRLVL=1: ERR_HIGH  
ERRLVL=0: ERR_LOW  
ERRLVL=1: ERR_HIGH  
ERRLVL=0: ERR_LOW  
ERRLVL=1: ERR_HIGH  
ERRLVL=0: ERR_LOW  
no valid symbols have been received on DIN in last  
interval of TM  
CHANNEL  
PARITY  
FRAME  
LOW  
LOW  
LOW  
SWIF received a valid data frame, but a bit error has  
been detected by parity check  
invalid symbol received, or an incorrect number of valid  
symbols were detected in the frame  
7.3.2 Alarm Current  
The DAC161P997 reports faults to the plant controller by forcing the OUT current into one of the error bands.  
The error current bands are defined as either above 20 mA, or below 4mA. The error band selection is done via  
the ERRLVL pin. The exact value of the output current used to indicate fault is dictated by the contents of  
ERR_HIGH and ERR_LOW registers. See ERR_LOW and ERR_HIGH.  
The default settings for LOW ERROR CURRENT and HIGH ERROR CURRENT are specified in Electrical  
Characteristics  
7.4 Device Functional Modes  
SWIF is a versatile and robust solution for transmitting digital data over the galvanic isolation boundary using just  
one isolation element: a pulse transformer.  
Digital data format achieves the information transmission without the loss of fidelity which usually afflicts  
transmissions employing PWM (Pulse Width Modulation) schemes. Digital transmission format also makes  
possible data differentiation: user can specify whether given data word is a DAC input to be converted to loop  
current, or it is a device configuration word.  
SWIF was designed to use in conjunction with pulse transformer as an isolation element. The use of the  
transformers to cross the isolation boundary is typical in the legacy systems due to their robustness, low-power  
consumption, and low cost. However, system implementation is not limited to the transformer as a link since  
SWIF easily interfaces with opto-couplers, or it can be directly driven by a CMOS gate.  
SWIF incorporates a number of features that address robustness aspect of the data link design:  
Bidirectional signal flow the DAC161P997 can issue an ACKNOWLEDGE pulse back to the master  
transmitter, via the same physical channel, to confirm the reception of the valid data;  
Error Detection SWIF protocol incorporates frame length detection and parity checks as a method of verifying  
the integrity of the received data;  
Channel Activity Detection SWIF can monitor the data channel and raise an error flag should the expected  
activity drop below programmable threshold, due to , for example, damage to the physical channel.  
In the typical system the Master is a micro controller. SWIF has been implemented on a number of popular micro  
controllers where it places minimum demands on the hardware or software resources even of the simple 8-bit  
devices.  
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Device Functional Modes (continued)  
SWIF gives the system designer flexibility is balancing the trade-offs between the data rate, activity monitoring  
functionality and the power consumption in the transformer coupled data channel. At lowest data rates, with long  
inactive inter-frame periods, the power consumed by SWIF is negligible. See Inter-Frame Period.  
7.5 Programming  
7.5.1 Single-Wire Interface (SWIF)  
SWIF provides flexible and easy to implement digital data link between the Master (transmitter) and the Slave  
(receiver). The Master encodes the digital data into a square (NRZ) CMOS level waveform which can be  
generated using common microcontroller resources. The Slave (DAC161P997) translates the waveform back into  
a bit stream which is then interpreted as the output current update or configuration data.  
SWIF can operate in both Simplex (unidirectional) and Half-Duplex (bidirectional) modes. In the DAC161P997's  
implementation of SWIF, an Acknowledge pulse constitutes the reverse data flowing from the Slave back to the  
Master.  
In its simplest implementation, the waveform can be directly coupled to the DAC161P997 input. In typical  
systems, however, SWIF data is transmitted via the galvanic isolation element such as pulse transformer or an  
opto-coupler. The details of the circuit implementations are discussed in Interface Circuit.  
Frame Format through Symbol Set describe the data encoding and the SWIF protocol.  
7.5.1.1 Frame Format  
A frame begins with a minimum of one idle symbol. There can be more than one and each has the effect of  
resetting the frame buffer of the DAC161P997. After idle symbol “D” a Tag Bit specifies the destination of the  
frame. If the tag is symbol ‘0’ then frame’s destination is the DACCODE register. If tag is a ‘1’ the destination is  
one of the configuration registers.  
The following 16 symbols constitute the data payload. If current frame is a DAC frame, the entire payload is a  
single DACCODE word. If it is a configuration frame, the first byte is the register address and the second byte is  
the register data. Words are transmitted MSB first.  
Two parity symbols follow the payload. The first parity symbol is determined by the bit parity of the tag bit and the  
first byte of payload (HIGH Slice) – a total of nine symbols. The second parity symbol corresponds to bit parity of  
the second byte of payload only (LOW Slice) – a total of 8 symbols.  
P0 = [ ( Number of ones in LOW Slice ) mod 2 == 0 ]  
P1 = [ ( Number of ones in HIGH Slice ) mod 2 == 0 ]  
Symbol ‘D’ after the parity bits completes a valid frame.  
The symbol “A” is optional, but if present it has to immediately follow the last “D” symbol of the frame. The  
duration of acknowledge symbol “A” is always twice the duration of P0 symbol preceding it. See Figure 12.  
SWIF does not require that all symbols in valid frames are sent by the Master at a fixed Baud rate. Each symbol  
is evaluated individually and is recognized as valid as long as it conforms to the duration requirement (Tp) and its  
duty cycle falls outside of noise margins. (See Table 2 below.)  
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Programming (continued)  
DAC Input Data Frame  
Tag Bit  
Parity Bits  
D
0
DATA[15:8]  
DATA[7:0]  
P1 P0  
D
A
³+,*+ꢀVOLFH´  
³/2:ꢀVOLFH´  
Configuration Data Frame  
Tag Bit  
Parity Bits  
D
1
REG. ADDRESS[7:0]  
DATA[7:0]  
P1 P0  
D
A
³+,*+ꢀVOLFH´  
³/2:ꢀVOLFH´  
Figure 12. Data Frame Format  
7.5.1.2 Inter-Frame Period  
The fastest DAC update rate is achieved when Master sends the valid frames back to back, Continuous Mode, at  
the fastest Baud rate. This, however, results in the least power efficient implementation.  
Frame  
Frame  
Frame  
SWIF is designed to operate in the Burst Mode as well, where the valid frames are separated by the inter-frame  
periods that do not carry any data. The inter-frame period can be occupied by a stream of idle ‘D’ or ‘L’ symbols.  
Interframe  
Period  
Frame  
D
D
D
D
Frame  
Sending the ‘D’ symbol in the inter-frame period provides continuous verification of integrity of the data link. The  
device by default monitors the activity of the SWIF link, and if the activity ceases the ERRB flag is asserted. See  
CONFIG2 and Error Detection and Reporting.  
Interframe  
Period  
Frame  
Frame  
Sending the ‘L’ in the inter-frame period results in the transmission line being inactive (transition-free) except  
when the data frames are being transmitted. This is the most power efficient implementation of SWIF link, but it  
does not facilitate link integrity reporting. To avoid ERRB being asserted due to the channel inactivity,  
CONFIG2.CHANNEL should be cleared.  
7.5.1.3 Symbol Set  
The digital data encoding scheme is outlined in the table below. The signal names in the table correspond to the  
nodes shown in Figure 27.  
The signal waveforms due to a random symbol stream are shown in Figure 13.  
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Programming (continued)  
Table 2. Symbol Set Table  
Character Mnemonic  
SWIF Symbol  
Comments  
Occupies one symbol period  
Transmit from Master only  
25% duty-cycle square waveform  
Terminates LOW  
Symbol Period  
pri_tx  
“0”  
pri_tx_en_n  
25 50 75  
Occupies one symbol period  
Transmit from Master only  
75% duty-cycle square waveform  
Terminates LOW  
Symbol Period  
pri_tx  
“1”  
pri_tx_en_n  
25 50 75  
Occupies one symbol period  
Transmit from Master only  
50% duty-cycle square waveform  
Terminates LOW  
Symbol Period  
pri_tx  
“D”  
pri_tx_en_n  
25 50 75  
Occupies two symbol periods  
Master stops driving the SWIF and “listens” for  
acknowledge pulse from the Slave  
Slave pulls ACKB LOW to reverse the direction of  
data flow through the transformer  
Slave's DBACK will drive the SWIF pri_rx line  
between 50% points of the adjacent periods - in  
this interval Master must de-assert pri_tx_en_n  
Symbol Period Symbol Period  
driven by Slave  
pri_tx  
“A”  
pri_rx  
pri_tx_en_n  
Terminates with pri_tx = LOW and pri_tx_en_n =  
LOW  
25 50 75  
25 50 75  
Occupies one symbol period, but can be repeated  
indefinitely  
Symbol Period  
Transmit from Master only  
Always LOW  
Does not carry any meaningful information  
Used as an inter-frame symbol, i.e., sent by the  
Master between valid data frames  
pri_tx  
“L”  
pri_tx_en_n  
25 50 75  
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³'011'$'´  
Symbol  
Period  
Symbol  
Period  
Symbol  
Period  
Symbol  
Period  
Symbol  
Period  
Symbol  
Period  
Symbol  
Period  
Symbol  
Period  
pri_tx  
pri_tx_en_n  
pri_rx  
25 50 75  
25 50 75  
25 50 75  
25 50 75  
25 50 75  
25 50 75  
25 50 75  
25 50 75  
driven by Slave  
driven by Master  
Figure 13. Symbol Stream Example  
7.5.1.4 Interface Circuit  
SWIF interface components are shown in Figure 14. The buffers A and B comprise a square waveform recovery  
circuit in applications where a pulse transformer is used to cross the galvanic isolation boundary, see  
Transformer Coupled Interface - Data Flow to the DAC. The ACKB output and its internal NMOS switch provide  
the means of reversing the direction of data flow through the coupling transformer see Transformer Coupled  
Interface - Acknowledge Pulse. In simple cases where the data link is DC coupled buffer A alone acts as a data  
receiver. The buffer C is provided for cases where improved noise immunity is required, see DC-Coupled  
Interface.  
DAC161P997  
DBACK  
B
C
8k  
to SWIF  
decoder  
DIN  
A
ACKB  
COMD  
Figure 14. SWIF Front End  
7.5.1.4.1 Transformer Coupled Interface - Data Flow to the DAC  
In systems requiring galvanic isolation between the transmitter (micro-controller) and the receiver, the commonly  
used coupling element is a pulse transformer. Transformer passes only the AC components of the square input  
waveform resulting in an impulse train across the secondary winding. Buffers A and B form a latch circuit around  
the secondary winding that recovers the square waveform from the impulse train.  
Figure 15 shows the details of the square waveform transmission from the primary side and recovery of the  
signal on the secondary side. Transmitter’s DC component is blocked by the capacitor CP. The transmitter’s  
output waveform VO results in the impulse train VP across the primary winding. Similar impulse train then  
appears across the secondary winding. If the magnitude of the impulse exceeds the threshold on the A buffer,  
the latch formed by A and B buffers will change state. The new latch state will persist until an opposite polarity  
impulse appears across the secondary winding.  
Note that in Figure 15 the capacitor CS bottom plate floats, and thus does not affect the operation of this circuit.  
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PRIMARY SIDE  
SECONDARY SIDE  
to SWIF  
decoder  
V
P
O
DBACK  
DIN  
Tx  
B
+
-
V
P
V
A
C
C
S
P
ACKB  
FET OFF  
COMD  
DAC161P997  
Figure 15. Transformer-Coupled SWIF Link With the DAC161P997 as Receiver  
7.5.1.4.2 Transformer Coupled Interface - Acknowledge Pulse  
Since the transformer is a symmetrical device (particularly one with 1:1 winding ratio), it is simple to reverse the  
data flow through it.  
Figure 16 shows the SWIF interface circuit during the transmission of the Acknowledge pulse from the  
DAC161P997 on the secondary side back to the micro-controller on the primary side.  
On the secondary side buffer B drives the square waveform across the transformer. Capacitor CS, whose bottom  
plate is now grounded via the ACKB pin, blocks the DC component of the square waveform. Buffer A is inactive.  
On the primary side a square waveform recovery is performed by the now familiar latch.  
PRIMARY SIDE  
SECONDARY SIDE  
Handshake pulse  
(Acknowledge)  
(Tx)  
DBACK  
DIN  
B
A
N.C.  
C
S
ACKB  
FET ON  
COMD  
DAC161P997  
Figure 16. Transformer-Coupled SWIF Link With the DAC161P997 as Transmitter  
7.5.1.4.3 DC-Coupled Interface  
DC coupled signal path between the transmitter and the receiver is shown in Figure 17. Such circuit as the  
internal buffer A is sufficient for the signal recovery as the signal presented at the DIN input is a square CMOS  
level waveform.  
In noisy environments it may be necessary to implement a Hysteresis loop around the DIN input to improve noise  
immunity of the input circuit. Presence of the buffer C and its output resistor facilitate this. The Hysteresis can be  
easily realized by inserting RIN between the transmitter and DIN input.  
Note that when RIN = 0 the presence of the buffer C can be ignored.  
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to SWIF  
decoder  
C
8k  
DIN  
Tx  
A
R
IN  
DAC161P997  
Figure 17. DC-Coupled SWIF Input  
7.5.1.4.4 Transformer Selection and SWIF Data Link Circuit Design  
In general, the transformers developed for T1/E1 telecom applications are well suited as the interface element for  
the DAC161P997 in the galvanically isolated industrial transmitter. The application circuit schematic utilizing  
T1/E1 transformer as the isolation element is shown in Typical Application. A number of suggested off the shelf  
transformers are listed in Table 3.  
Table 3. Examples of Transformers Suitable in the DAC161P997 Applications  
Manufacturer  
Pulse  
P/N  
LM (mH)  
1.2  
LLP/LLS (µH)  
1.2  
RP/RS (Ω)  
2.7  
CWW (pF)  
Isolation Voltage (Vrms)  
TX1491  
35  
0.92  
1500  
1500  
1500  
1500  
Coilcraft  
Halo  
S5394–CLB  
TG02-1205  
XF7856-GD11  
0.4  
Not Specified  
Not Specified  
0.5  
0.95  
1.2  
0.7  
30  
XFMRS  
0.785  
0.52  
Not Specified  
Model suitable for simulating the behavior of the pulse transformer is shown in Figure 18. The model parameters  
are readily available in the datasheets provided by the transformer manufacturers, see Table 3 for examples.  
I
1
L
L
I
2
I ' = I  
LP  
LS  
1
2
R
P
R
S
+
+
+
-
V
= V  
P
C
WP  
I
C
WS  
V
S
P
L
M
-
-
Figure 18. Pulse Transformer Model - Winding Ratio 1:1  
Table 4. Transformer Model Parameters' Legend  
Parameter  
LM  
Description  
Magnetizing inductance, in Data Sheets shown as OCL (open circuit inductance)  
Leakage inductance of the primary (secondary) winding  
LLP/S  
Winding capacitance. Dominated by the CWW (winding to winding) component. Here it is assumed  
that CWS=CWP=½CWW  
CWP/S  
RP/S  
Winding resistance  
The circuit behavior will be dominated by the DC blocking capacitance CP and the magnetizing inductance LM. In  
the example circuit shown in Figure 19 the rising edge of VO ultimately results in an impulse at the input DIN,  
see Figure 20. Once voltage at DIN is above VIH of the A buffer, the A buffer will change its state. However, the  
latch will acquire a new state only if the voltage at DIN persists above VIH for TPEAK > TD.  
The parasitic elements in the transformer model: LLS, LSP, CWS, CWP may result in the oscillating component  
superimposed on the dominant impulse response waveform shown in Figure 20. The oscillation should be  
controlled so that the condition TPEAK> TD is maintained. The typical method for controlling this parasitic  
oscillation is to insert a damping element into the signal path. A small resistance in series with transformer  
winding is such damping element. The typical application example in Typical Application illustrates this.  
The delay around the SWIF input latch, from DIN to DBACK, TD is specified in Electrical Characteristics.  
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A
CP  
RO  
DIN  
Tx  
DELAY=TD  
+
+
+
Transformer  
Model  
VS  
CDIN  
VP  
VO  
B
-
-
-
DBACK  
Use IDEAL  
device models  
DAC161P997  
Figure 19. NRZ Waveform Transmission and Recovery Circuit Model  
VDD  
V
O
0V  
Response due to  
parasitics  
Dominant response  
V
IH  
V
S
0V  
T
PEAK  
Figure 20. SWIF Link Circuit Response to Step-Input  
7.6 Register Maps  
7.6.1 LCK  
Address=0x00; Default=0x00  
Bit Field  
Name  
Description  
0x95 - registers unlocked  
0x** - any value written locks registers  
A register lock prevents inadvertent changes to the configuration. The DAC output cannot be  
updated while software configuration registers are unlocked.  
7:0  
7.6.2 CONFIG1  
Address=0x01; Default=0x08  
Description  
Bit Field  
Name  
7:5  
RESERVED. Always write 0.  
0b00 - NOP  
0b01 - set error  
0b10 - clear error  
0b11 - NOP  
4:3  
SERR  
Sets or clears the error condition. At power-on the error is set. Error is also cleared after  
reception of valid SWIF frame. These bits are self clearing.  
This functionality can be used for diagnostic purposes, e.g. Master can use SERR to force  
ILOOP into an error band, and then return it to previously held output level.  
2:1  
0
RESERVED. Always write 0.  
0 - NOP  
RST  
1- same as power-on reset. Once device is reset to default state the bit clears automatically  
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7.6.3 CONFIG2  
Address=0x02; Default=0x1F  
Bit Field  
Name  
Description  
7:5  
RESERVED. Always write 0.  
Set to enable ACK  
4
ACK_EN  
When enabled, an acknowledgement is indicated on the serial interface upon detection of  
each valid frame. See Frame Format.  
3
2
1
0
FRAME  
PARITY  
CHANNEL  
LOOP  
Set to enable framing error reporting. See table in Error Detection and Reporting.  
Set to enable parity error reporting. See table in Error Detection and Reporting.  
Set to enable channel-inactive reporting. See table in Error Detection and Reporting.  
Set to enable loop error reporting. See table in Error Detection and Reporting.  
7.6.4 CONFIG3  
Address=0x03; Default=0x08  
Description  
Bit Field  
Name  
7:4  
RESERVED. Always write 0.  
0 <= RX_ERR_CNT 15 Threshold = 1 + RX_ERR_CNT  
The slave enters the error state once ‘Threshold’ number of consecutive FRAME or PARITY  
errors are counted. The threshold is programmable to prevent occasional errors from being  
reported. See table in Error Detection and Reporting.  
3:0  
RX_ERR_CNT  
7.6.5 ERR_LOW  
Address=0x04; Default=0x24  
Description  
Bit Field  
Name  
8-bit value. If ERRLVL = LOW, the DAC will use the value stored in ERR_LOW register to set  
the output current sourced from OUT pin when reporting an error condition. The ERR_LOW  
value is used as the upper byte of the DACCODE, while the lower byte is forced to 0x00. At  
power up the ERR_LOW defaults to a value which forces IERRL output current. See Electrical  
Characteristics.  
7:0  
7.6.6 ERR_HIGH  
Address=0x05; Default=0xE8  
Description  
Bit Field  
Name  
If ERRLVL = HIGH, the DAC will use the value stored in ERR_HIGH register to set the output  
current sourced from OUT pin when reporting an error condition. The ERR_HIGH value is used  
as the upper byte of the DACCODE, while the lower byte is forced to 0x00. At power-up the  
ERR_HIGH defaults to a value which forces IERRH output current. See Electrical  
Characteristics.  
7:0  
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8 Application and Implementation  
NOTE  
Information in the following applications sections is not part of the TI component  
specification, and TI does not warrant its accuracy or completeness. TI’s customers are  
responsible for determining suitability of components for their purposes. Customers should  
validate and test their design implementation to confirm system functionality.  
8.1 Application Information  
8.1.1 16-BIT DAC and Loop Drive  
8.1.1.1 DC Characteristics  
The DAC converts the 16-bit input code in the DACCODE register to an equivalent current output. The ∑Δ DAC  
output is a current pulse which is then filtered by a 3rd order RC low-pass filter and boosted to produce the loop  
current ILOOP at the device OUT pin.  
Figure 21 shows the principle of operation of the DAC161P997 in the Loop Powered Transmitter - the circuit  
details were omitted for clarity. In this figure ID and IA represent supply (quiescent) currents of the internal digital  
and analog blocks. IAUX represents supply (quiescent) current of companion devices present in the system, such  
as the voltage regulator and the SWIF channel.  
By observing that the control loop formed by the amplifier and the bipolar transistor forces the voltage across R1  
and R2 to be equal, it can be shown that, under normal conditions, the ILOOP is dependent only on IDAC through  
the following relationship:  
(1)  
While ILOOP has a number of component currents, ILOOP = IDAC+ID+IA+IAUX+IE, it is only IE that is regulated by the  
loop to maintain the relationship shown above.  
Since it is only IE’s magnitude that is controlled, not its direction, there is a lower limit to ILOOP. This limit is  
dependent on the fixed components IA and ID, and on system implementation through IAUX  
.
LOOP+  
VD  
VA  
I
DAC  
AUX  
+
-
BASE  
I
I
LOOP  
DAC  
I
I
D
A
RE  
IE  
COMA  
I
2
R = 40  
2
R
1
= 80k  
OUT  
DAC161P997  
LOOP-  
Figure 21. Loop-Powered Transmitter  
Figure 22 shows the variant of the transmitter where the supply currents to the system blocks are provided by the  
local supply, and not the 4 - 20 mA loop Self-Powered Transmitter. Same basic relationship between the ILOOP  
and IDAC holds, but the component currents of ILOOP are only IDAC and IE.  
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Application Information (continued)  
LOOP+  
VD  
VA  
+
-
V
I
DAC  
LOCAL  
AUX  
+
-
BASE  
I
I
LOOP  
DAC  
I
I
A
D
RE  
I
E
COMA  
R
1
= 80k  
R = 40  
2
I
2
OUT  
DAC161P997  
LOOP-  
Figure 22. Self-Powered Transmitter  
8.1.1.1.1 DC Input-Output Transfer Function  
The output current sourced by the OUT pin of the device is expressed by:  
(2)  
The valid DACCODE range is the full 16-bit code space (0x0000 to 0xFFFF), which results in the IDAC range of 0  
to approximately 12 μA. This, however, does not result in the ILOOP range of 0 to 24 mA.  
The maximum output current sourced out of OUT pin, ILOOP, is 24 mA. The minimum output current is dependent  
on the system implementation. The minimum output current is the sum of supply currents of the DAC161P997  
internal blocks, IA, ID, and companion devices present in the system, IAUX. The last component current IE can  
theoretically be controlled down to 0 but, due to the stability considerations of the control loop, it is advised not to  
allow the IE to drop below 200 μA.  
The graph in Figure 23 shows the DC transfer characteristic of the 4 - 20 mA transmitter, including minimum  
current limits. The minimum current limit for the Loop-Powered Transmitter is typically around 400 μA  
(ID+IA+IAUX+IE). The minimum current limit for the Self-Powered Transmitter is typically around 200 μA (IE).  
Typical values for ID and IA are listed in Electrical Characteristics. IE depends on the BJT device used.  
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Application Information (continued)  
24.0  
21.5  
20.0  
Programmable I  
ERROR  
4.0  
3.5  
Programmable I  
ERROR  
0.4  
0.2  
MIN(I  
MIN(I  
) ± Loop Powered  
) ± Self Powered  
LOOP  
LOOP  
DACCODE (hex)  
Figure 23. DAC-DC Transfer Function  
8.1.1.1.2 Loop Interface  
The DAC161P997 cannot directly interface to the typical 4 - 20 mA loop due to the excessive loop supply  
voltage. The loop interface has to provide the means of stepping down the LOOP Supply down to 3.6V. This can  
be accomplished with either a linear regulator (LDO) or switching regulator while keeping in mind that the  
regulator’s quiescent current will have direct effect on the minimum achievable ILOOP (see DC Input-Output  
Transfer Function).  
The second component of the loop interface is the external NPN transistor (BJT). This device is part of the  
control circuit that regulates the transmitter’s output current (ILOOP). Since the BJT operates over the wide current  
range, spanning at least 4 - 20 mA, it is necessary to degenerate the emitter in order to stabilize transistor’s  
transconductance (gm). The degeneration resistor of 22is suggested in typical applications. For circuit details,  
see Typical Application.  
The NPN BJT should not be replaced with an N-channel FET (Field Effect Transistor) for the following reasons:  
discrete FET’s typically have high threshold voltages (VT), in the order of 1.5 V to 2 V, which is beyond the  
BASE output maximum range; discrete FET’s present higher load capacitance which may degrade system  
stability margins; and BASE output relies on the BJT’s base current for biasing.  
8.1.1.1.3 Loop Compliance  
The maximum V(LOOP+,LOOP-) potential is limited by the choice of step-down regulator, and the external BJT’s  
Collector Emitter breakdown voltage. For minimum V(LOOP+, LOOP) potential consider Figure 22. Here,  
observe that V(LOOP+,LOOP) min(VCE) + ILOOPRE + ILOOPR2 = min(VCE) + 0.53V + 0.96V = 3.66V, at ILOOP  
24mA. The voltage drop across internal R2 is specified in Electrical Characteristics.  
=
8.1.1.2 AC Characteristics  
The approximate frequency dependent characteristics of the loop drive circuit can be analyzed using the circuit in  
Figure 24:  
22  
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Application Information (continued)  
LOOP+  
R
X1  
DAC161P997  
G
m
I
AUX  
+
-
BASE  
g
r
o
A(s)  
m
C
X1  
C
X2  
C
X3  
I
DAC  
RE  
COMA  
OUT  
R
R
2
1
C
X4  
LOOP-  
Figure 24. Capacitances Affecting Control Loop  
Here it is assumed that the internal amplifier dominates the frequency response of the system, and it has a single  
pole response. The BJT’s response, in the bandwidth of the control loop, is assumed to be frequency  
independent and is characterized by the transconductance gm and the output resistance ro.  
As in previous sections IDAC and IAUX represent the filtered output of the ∑Δ modulator and the quiescent current  
of the companion devices.  
The circuit in Figure 24 can be further simplified by omitting the on-board capacitances, whose effect will be  
discussed in Stability, and by combining the amplifier, the external transistor and resistor RE into one Gm block.  
The resulting circuit is shown in Figure 25.  
By assuming that the BJT’s output resistance (ro) is large, the loop current ILOOP can be expressed as:  
(3)  
LOOP+  
I
LOOP  
A(s)G  
v
m e  
A(s)G  
m
+
-
r
o
v
I
e
AUX  
I
DAC  
R
R
2
1
I
LOOP  
LOOP-  
Figure 25. AC Analysis Model of a Transmitter  
The sum of voltage drops around the path containing R1, R2 and ve is:  
(4)  
an assumption is made on the response of the internal amplifier::  
Ao&o  
A(s) =  
s
(5)  
23  
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Application Information (continued)  
By combining the above the final expression for the ILOOP as a function of 2 inputs IDAC and IAUX is:  
R1  
AoGmR2&o  
s
)
ILOOP = IDAC (1 +  
+ IAUX  
R2 s + AoGmR2&o  
s + AoGmR2&o  
R1  
R2  
20 log (1 +  
)
0 dB  
&
AoGmR2&o  
(6)  
The result above reveals that there are 2 distinct paths from the inputs IDAC and IAUX to the output ILOOP. IDAC  
follows the low-pass, and the IAUX follows the high-pass path.  
In both cases the corner frequency is dependent on the effective transconductance, Gm, of the external  
transistor. This implies that control loop dynamics could vary with the output current ILOOP if Gm were allowed to  
be just native device transconductance gm. This undesirable behavior is mitigated by the degenerating resistor  
RE which stabilizes Gm as follows:  
(7)  
This results in the frequency response which is largely independent of the output current ILOOP  
:
R2  
Ao  
&
o
R1  
R2  
RE  
R2  
s
R2  
)
ILOOP = IDAC (1 +  
+ IAUX  
s + Ao  
&
s + Ao  
&
o
o
RE  
RE  
(8)  
While the bandwidth of the IDAC path may not be of great consequence given the low frequency nature of the 4-  
20 mA current loop systems, the location of the pole in the IAUX path directly affects PSRR of the transmitter  
circuit. This is further discussed in PSRR.  
8.1.1.2.1 Step Response  
The transient input-output characteristics of the DAC161P997 are dominated by the response of the RC filter at  
the output of the ∑Δ DAC. Settling times due to step input are shown in Typical Characteristics.  
8.1.1.2.2 Output Impedance  
The output impedance is described as:  
(9)  
By considering the circuit in Figure 25, and setting IDAC = IAUX = 0, the following expression can be obtained:  
(10)  
As in AC Characteristics an assumption can be made on the frequency response of the internal amplifier, and  
the effective transconductance Gm should be stabilized with external RE leading to:  
(11)  
The output impedance of the transmitter is a product of the external BJT's output resistance ro, and the frequency  
characteristics of the internal amplifier. At low frequencies this results in a large impedance that does not  
significantly affect the output current accuracy.  
24  
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Application Information (continued)  
8.1.1.2.3 PSRR  
Power Supply Rejection Ratio is defined as the ability of the current control loop to reject the variations in the  
supply current of the companion devices, IAUX. Specifically:  
(12)  
It was shown in AC Characteristics that the IAUX affects ILOOP via the high-pass path whose corner frequency is  
dependent on the effective Gm of the external BJT. If that dependence were not mitigated with the degenerating  
resistor RE, the PSRR would be degraded at low output current ILOOP  
.
The typical PSRR performance of the transmitter shown in Typical Application is shown in Typical  
Characteristics.  
8.1.1.2.4 Stability  
The current control loop's stability is affected by the impedances present in the system. Figure 24 shows the  
simplified diagram of the control loop, formed by the on-board amplifier and an external BJT, and the lumped  
capacitances CX1 through CX4 that model any other external elements.  
CX1 typically represents a local step-down regulator, or LDO, and any other companion devices powered from the  
LOOP+. This capacitance reduces the stability margins of the control loop, and therefore it should be limited.  
RX1 can be used to isolate CX1 from LOOP+ node and thus remedy the stability margin reduction. If RX1 = 0, CX1  
cannot exceed 10 nF. RX1 = 200is recommended if it can be tolerated. Minimum RX1 = 40if CX1 exceeds 10  
nF.  
CX3 also adversely affects stability of the loop and it must be limited to 20 pF. CX4 affects the control loop in the  
same way as CX1, and it should be treated in the same way as CX1. CX2 is the only capacitance that improves  
stability margins of the control loop. Its maximum size is limited only by the safety requirements.  
Stability is a function of ILOOP as well. Since ILOOP is approximately equal to the collector current of the external  
BJT, Gm of the BJT, and thus loop dynamics, depend on ILOOP. This dependence can be reduced by  
degenerating the emitter of the BJT with a small resistance as discussed in Loop Interface. Inductance in series  
with the LOOP+ and LOOPdo not significantly affect the control loop.  
8.1.1.2.5 Noise and Ripple  
The output of the DAC is a current pulse train. The transition density varies throughout the DAC input code range  
(ILOOP range). At the extremes of the code range, the transition density is the lowest which results in low  
frequency components of the DAC output passing through the RC filter. Hence, the magnitude of the ripple  
present in ILOOP is the highest at the ends of the transfer characteristic of the device (see Typical  
Characteristics).  
It should be noted that at wide noise measurement bandwidth, it is the ripple due to the ∑Δ modulator that  
dominates the noise performance of the device throughout the entire code range of the DAC. This results in the  
“U” shaped noise characteristic as a function of output current. At narrow bandwidths, and particularly at mid-  
scale output currents, it is the amplifier driving the external BJT that starts to dominate as a noise source.  
8.1.1.2.6 Digital Feedthrough  
Digital feedthrough is indiscernible from the ripple induced by the ∑Δ modulator.  
8.1.1.2.7 HART Signal Injection  
The HART specification requires minimum suppression of the sensor signal in the HART signal band (1-2 kHz) of  
about 60 dB. The filter in Figure 26 below meets that requirement.  
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Application Information (continued)  
LOOP+  
DAC161P997  
15 mV  
V
H
I
DAC  
15k  
15k  
virtual ground  
V
H
15k  
BASE  
I
HART  
500 nA  
RE  
C1  
390n  
C2  
6.8n 220n  
C3  
1n  
COMA  
80k  
40  
1 mA  
I
LOOP  
OUT  
LOOP-  
V
HART  
500 mV  
Figure 26. HART Signal Injection  
8.1.1.2.8 RC Filter Limitation  
In an effort to speed up the transient response of the device the user can reduce the capacitances associated  
with the low-pass filter at the output of the ∑Δ modulator. However, to maintain stability margins of the current  
control loop it is necessary to have at least C1 = C2 = C3 = 1nF.  
8.2 Typical Application  
OUT  
IN  
EN  
TPS79801  
3.3P  
100  
300p  
22P  
158k  
100k  
FB  
GND  
20  
100n  
100n  
LOOP+  
4.1V  
VD  
VA  
BASE  
74LVC125  
40  
A1  
Y1  
1P  
100n  
OE1  
1n  
Y2  
A2  
DBACK  
22  
OE2  
Coilcraft  
S5394  
DAC161P997  
1k  
A3  
Y3  
A4  
DIN  
OE3  
1n  
PRI_RX  
PRI_TX_EN  
PRI_TX  
ACKB  
OUT  
IN  
OUT  
OUT  
Y4  
LOOP-  
40  
C1  
C2  
C3  
ERRLVL  
OE4  
LOW  
PC  
COMD  
COMA  
2.2n  
2.2n  
2.2n  
26  
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Typical Application (continued)  
8.2.1 Design Requirements  
An example of implementation of the SWIF data link is shown in Detailed Design Procedure below. This  
implementation uses the components already present in the systems employing the standard methods for PWM  
signal transmission over an isolation boundary. Additional configuration examples show how the system can be  
expanded or simplified depneding on the requirements of hte system and capabilities of the Master controller.  
8.2.2 Detailed Design Procedure  
In this example Master uses 2 digital I/Os:  
One bidirectional port for transmitting encoded data to, and receiving the acknowledge signal from the slave –  
pri_tx/pri_rx.  
One output sourcing the pri_tx_en_n signal that governs the direction of the data flow over the SWIF link.  
While transmitting, Master drives the pri_tx_en_n LOW and sources data stream onto the pri_tx. The circuit path  
is through buffer ‘a’, transformer primary winding, DC blocking capacitor to GND.  
While receiving, Master drives the pri_tx_en_n HIGH and ‘listens’ for acknowledge signal pri_rx. In this mode the  
buffers ‘a’ and ‘b’ form the latch around the transformer winding, and buffer ‘c’ floats the DC blocking capacitor.  
1:1  
DBACK  
a
pri_tx / pri_rx  
DIN  
b
c
Master  
ACKB  
pri_tx_en_n  
d
DAC161P997  
(Slave)  
74LVC125  
COMD  
Figure 27. Typical SWIF Implementation  
The interface implementation shown in Figure 27 can be expanded or simplified depending on the requirements  
of the system and capabilities of the Master controller. A number of other possible implementations are shown in  
the figures below.  
Figure 28 shows the circuit analogous in its functionality to the circuit in Figure 27 but with fewer active  
components. Here instead of disabling ‘b’ buffer during data transmission, its output impedance is increased to  
the point where its drive is significant only during the data reception form the Slave.  
1:1  
DBACK  
a
pri_tx / pri_rx  
DIN  
b
c
Master  
ACKB  
pri_tx_en_n  
d
DAC161P997  
(Slave)  
74LVC125  
COMD  
Figure 28. SWIF Link With Simplified Control  
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Typical Application (continued)  
Figure 29 shows the SWIF link circuit when the Master does not have a bidirectional I/O available. The Master  
output driving pri_tx is split away from the Master receiving pri_rx input by using a buffer ‘d’, until now unused, on  
74LVC125.  
DBACK  
1:1  
a
pri_rx  
DIN  
b
Master  
ACKB  
c
pri_tx_en_n  
pri_tx  
d
DAC161P99  
(Slave)  
74LVC125  
COMD  
Figure 29. Master Without Bidirectional I/O  
Figure 30 shows the trivial circuit realization of the SWIF link in simplex mode, unidirectional data flow.  
DBACK  
1:1  
pri_tx  
DIN  
Master  
ACKB  
DAC161P997  
(Slave)  
COMD  
Figure 30. SWIF Without Acknowledge Capability  
Figure 31 shows the DC coupled SWIF link realization. In this example ACKB output is used to generate the  
Acknowledge pulse. This is equivalent to the Acknowledge pulse generated at DBACK, since in transformer  
coupled application both ACKB and DBACK have to be pulsed to transmit back to the Master. Note that the  
pulse generated by ACKB is active LOW.  
DBACK  
DIN  
pri_tx  
Master  
ACKB  
ackb  
DAC161P997  
(Slave)  
COMD  
Figure 31. DC-Coupled SWIF Link  
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Typical Application (continued)  
The SWIF link realization using opto-couplers (opto-isolators) is shown in Figure 32. Points of note here are: the  
opto-couplers invert the SWIF symbol waveform, and there is increased power consumption due to the relatively  
large currents required to turn on the internal diodes and standing current in the pull-up resistors.  
DBACK  
pri_rx_b  
Master  
DIN  
pri_tx_b  
ACKB  
DAC161P997  
(Slave)  
COMD  
Figure 32. SWIF Link Realized With Octo-Couplers  
8.2.3 Application Curve  
Unless otherwise noted, these specifications apply for VA = VD = 3.3 V, COMA = COMD = 0 V, TA= 25°C, external bipolar  
transistor: 2N3904, RE = 22 Ω, C1 = C2 = C3 = 2.2 nF.  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
-0.5  
-1.0  
-1.5  
4
6
8
10 12 14 16 18 20  
OUTPUT CURRENT (mA)  
Figure 33. Linearity vs ILOOP  
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9 Power Supply Recommendations  
The DAC161P997 requires a voltage supply within 2.7 V and 3.6 V. Multilayer ceramic bypass X7R capacitors of  
0.1μF between the VA and GND pins, and between the VD and GND pins are recommended. If the supply is  
located more than a few inches from the DAC161P997, additional bulk capacitance may be required in addition  
to the ceramic bypass capacitors. An electrolytic capacitor with a value of 10 μF or 22 μF is a typical choice  
10 Layout  
10.1 Layout Guidelines  
To maximize the performance of the DAC161S997 in any application, good layout practices and proper circuit  
design must be followed. A few recommendations specific to the DAC161S997 are:  
Make sure that VD and VA have decoupling capacitors local to the respective terminals.  
Minimize trace length between the C1, C2, and C3 capacitors and the DAC161S997 pins.  
10.2 Layout Example  
Figure 34 and Figure 35 show the DAC161S997 evaluation module (EVM) layout  
Figure 34. Example PCB layout: Top Layer  
Figure 35. Example PCB layout: Bottom Layer  
30  
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11 Device and Documentation Support  
11.1 Third-Party Products Disclaimer  
TI'S PUBLICATION OF INFORMATION REGARDING THIRD-PARTY PRODUCTS OR SERVICES DOES NOT  
CONSTITUTE AN ENDORSEMENT REGARDING THE SUITABILITY OF SUCH PRODUCTS OR SERVICES  
OR A WARRANTY, REPRESENTATION OR ENDORSEMENT OF SUCH PRODUCTS OR SERVICES, EITHER  
ALONE OR IN COMBINATION WITH ANY TI PRODUCT OR SERVICE.  
11.2 Trademarks  
All trademarks are the property of their respective owners.  
11.3 Electrostatic Discharge Caution  
These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam  
during storage or handling to prevent electrostatic damage to the MOS gates.  
11.4 Glossary  
SLYZ022 TI Glossary.  
This glossary lists and explains terms, acronyms, and definitions.  
12 Mechanical, Packaging, and Orderable Information  
The following pages include mechanical, packaging, and orderable information. This information is the most  
current data available for the designated devices. This data is subject to change without notice and revision of  
this document. For browser-based versions of this data sheet, refer to the left-hand navigation.  
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PACKAGE OPTION ADDENDUM  
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13-Sep-2014  
PACKAGING INFORMATION  
Orderable Device  
Status Package Type Package Pins Package  
Eco Plan  
Lead/Ball Finish  
MSL Peak Temp  
Op Temp (°C)  
-40 to 105  
Device Marking  
Samples  
Drawing  
Qty  
(1)  
(2)  
(6)  
(3)  
(4/5)  
DAC161P997CISQ/NOPB  
DAC161P997CISQX/NOPB  
ACTIVE  
WQFN  
WQFN  
RGH  
16  
16  
1000  
Green (RoHS  
& no Sb/Br)  
CU SN  
Level-3-260C-168 HR  
161P997  
161P997  
ACTIVE  
RGH  
4500  
Green (RoHS  
& no Sb/Br)  
CU SN  
Level-3-260C-168 HR  
-40 to 105  
(1) The marketing status values are defined as follows:  
ACTIVE: Product device recommended for new designs.  
LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect.  
NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design.  
PREVIEW: Device has been announced but is not in production. Samples may or may not be available.  
OBSOLETE: TI has discontinued the production of the device.  
(2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability  
information and additional product content details.  
TBD: The Pb-Free/Green conversion plan has not been defined.  
Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that  
lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes.  
Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between  
the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above.  
Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight  
in homogeneous material)  
(3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature.  
(4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device.  
(5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation  
of the previous line and the two combined represent the entire Device Marking for that device.  
(6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish  
value exceeds the maximum column width.  
Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information  
provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and  
continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals.  
TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release.  
Addendum-Page 1  
PACKAGE OPTION ADDENDUM  
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13-Sep-2014  
In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis.  
Addendum-Page 2  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
14-Nov-2014  
TAPE AND REEL INFORMATION  
*All dimensions are nominal  
Device  
Package Package Pins  
Type Drawing  
SPQ  
Reel  
Reel  
A0  
B0  
K0  
P1  
W
Pin1  
Diameter Width (mm) (mm) (mm) (mm) (mm) Quadrant  
(mm) W1 (mm)  
DAC161P997CISQ/NOPB WQFN  
RGH  
RGH  
16  
16  
1000  
4500  
178.0  
330.0  
12.4  
12.4  
4.3  
4.3  
4.3  
4.3  
1.3  
1.3  
8.0  
8.0  
12.0  
12.0  
Q1  
Q1  
DAC161P997CISQX/NOP WQFN  
B
Pack Materials-Page 1  
PACKAGE MATERIALS INFORMATION  
www.ti.com  
14-Nov-2014  
*All dimensions are nominal  
Device  
Package Type Package Drawing Pins  
SPQ  
Length (mm) Width (mm) Height (mm)  
DAC161P997CISQ/NOPB  
WQFN  
WQFN  
RGH  
RGH  
16  
16  
1000  
4500  
213.0  
367.0  
191.0  
367.0  
55.0  
35.0  
DAC161P997CISQX/NOP  
B
Pack Materials-Page 2  
PACKAGE OUTLINE  
RGH0016A  
WQFN - 0.8 mm max height  
S
C
A
L
E
3
.
5
0
0
WQFN  
4.1  
3.9  
B
A
0.5  
0.3  
PIN 1 INDEX AREA  
0.3  
0.2  
4.1  
3.9  
DETAIL  
OPTIONAL TERMINAL  
TYPICAL  
C
0.8 MAX  
SEATING PLANE  
(0.1)  
TYP  
2.6 0.1  
5
8
SEE TERMINAL  
DETAIL  
12X 0.5  
4
9
4X  
1.5  
1
12  
0.3  
16X  
0.2  
0.1  
0.05  
PIN 1 ID  
(OPTIONAL)  
C A  
C
B
13  
16  
0.5  
0.3  
16X  
4214978/A 10/2013  
NOTES:  
1. All linear dimensions are in millimeters. Dimensions in parenthesis are for reference only. Dimensioning and tolerancing  
per ASME Y14.5M.  
2. This drawing is subject to change without notice.  
3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance.  
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EXAMPLE BOARD LAYOUT  
RGH0016A  
WQFN - 0.8 mm max height  
WQFN  
(
2.6)  
SYMM  
16  
13  
SEE DETAILS  
16X (0.6)  
16X (0.25)  
1
12  
(0.25) TYP  
SYMM  
(3.8)  
(1)  
9
4
12X (0.5)  
5X ( 0.2)  
VIA  
5
8
(1)  
(3.8)  
LAND PATTERN EXAMPLE  
SCALE:15X  
0.07 MAX  
ALL AROUND  
0.07 MIN  
ALL AROUND  
METAL  
SOLDER MASK  
OPENING  
METAL  
SOLDER MASK  
OPENING  
NON SOLDER MASK  
SOLDER MASK  
DEFINED  
DEFINED  
(PREFERRED)  
SOLDER MASK DETAILS  
4214978/A 10/2013  
NOTES: (continued)  
4. This package is designed to be soldered to a thermal pad on the board. For more information, see QFN/SON PCB application report  
in literature No. SLUA271 (www.ti.com/lit/slua271).  
www.ti.com  
EXAMPLE STENCIL DESIGN  
RGH0016A  
WQFN - 0.8 mm max height  
WQFN  
SYMM  
(0.675)  
METAL  
TYP  
13  
16  
16X (0.6)  
16X (0.25)  
12  
1
(0.675)  
(0.25) TYP  
SYMM  
(3.8)  
9
4
12X (0.5)  
8
5
4X (1.15)  
(3.8)  
SOLDER PASTE EXAMPLE  
BASED ON 0.125 mm THICK STENCIL  
EXPOSED PAD  
78% PRINTED SOLDER COVERAGE BY AREA  
SCALE:15X  
4214978/A 10/2013  
NOTES: (continued)  
5. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate  
design recommendations.  
www.ti.com  
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