CD74HCT533E [TI]

High Speed CMOS Logic Octal Inverting Transparent Latch, Three-State Outputs; 高速CMOS逻辑八路反相透明锁存器,三态输出
CD74HCT533E
型号: CD74HCT533E
厂家: TEXAS INSTRUMENTS    TEXAS INSTRUMENTS
描述:

High Speed CMOS Logic Octal Inverting Transparent Latch, Three-State Outputs
高速CMOS逻辑八路反相透明锁存器,三态输出

总线驱动器 总线收发器 锁存器 逻辑集成电路 光电二极管
文件: 总9页 (文件大小:53K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
CD74HC533, CD74HCT533,  
CD74HC563, CD74HCT563  
Data sheet acquired from Harris Semiconductor  
SCHS187  
High Speed CMOS Logic Octal Inverting  
Transparent Latch, Three-State Outputs  
January 1998  
Features  
Description  
• Common Latch-Enable Control  
• Common Three-State Output Enable Control  
• Buffered Inputs  
The Harris CD74HC533, CD74HCT533, CD74HC563, and  
CD74HCT563 are high speed Octal Transparent Latches  
manufactured with silicon gate CMOS technology. They pos-  
sess the low power consumption of standard CMOS inte-  
grated circuits, as well as the ability to drive 15 LSTTL  
devices.  
[ /Title  
(CD74H  
C533,  
CD74H  
CT533,  
CD74H  
C563,  
CD74H  
CT563)  
/Subject  
(High  
• Three-State Outputs  
• Bus Line Driving Capacity  
The outputs are transparent to the inputs when the latch  
enable (LE) is high. When the latch enable (LE) goes low the  
data is latched. The output enable (OE) controls the three-  
state outputs. When the output enable (OE) is high the  
outputs are in the high impedance state. The latch operation  
• Typical Propagation Delay = 13ns at V  
CC  
= 5V,  
o
C = 15pF, T = 25 C (Data to Output)  
L
A
• Fanout (Over Temperature Range)  
- Standard Outputs. . . . . . . . . . . . . . . 10 LSTTL Loads  
- Bus Driver Outputs . . . . . . . . . . . . . 15 LSTTL Loads  
is independent to the state of the output enable.  
The CD74HC533 and CD74HCT533 are identical in function  
to the CD74HC563 and CD74HCT563 but have different  
pinouts. The CD74HC533 and CD74HCT533 are similar to  
the CD74HC373 and CD74HCT373; the latter are non-  
inverting types.  
o
o
• Wide Operating Temperature Range . . . -55 C to 125 C  
• Balanced Propagation Delay and Transition Times  
Speed  
• Significant Power Reduction Compared to LSTTL  
Logic ICs  
Ordering Information  
• HC Types  
- 2V to 6V Operation  
TEMP. RANGE  
PKG.  
NO.  
o
PART NUMBER  
CD74HC533E  
CD74HCT533E  
CD74HC563E  
CD74HCT563E  
CD74HCT563M  
NOTES:  
( C)  
PACKAGE  
20 Ld PDIP  
20 Ld PDIP  
20 Ld PDIP  
20 Ld PDIP  
20 Ld SOIC  
- High Noise Immunity: N = 30%, N = 30% of V  
IL IH CC  
at V  
= 5V  
CC  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
-55 to 125  
F20.3  
• HCT Types  
- 4.5V to 5.5V Operation  
- Direct LSTTL Input Logic Compatibility,  
E20.3  
E20.3  
E20.3  
M20.3  
V = 0.8V (Max), V = 2V (Min)  
IL IH  
- CMOS Input Compatibility, I 1µA at V , V  
OL OH  
l
1. When ordering, use the entire part number. Add the suffix 96 to  
obtain the variant in the tape and reel.  
2. Wafer and die for this part number are available which meets all  
electrical specifications. Please contact your local sales office or  
Harris customer service for ordering information.  
CAUTION: These devices are sensitive to electrostatic discharge. Users should follow proper IC Handling Procedures.  
File Number 1599.1  
Copyright © Harris Corporation 1998  
1
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563  
Pinouts  
CD74HC533, CD74HCT533  
(PDIP, SOIC)  
CD74HC563, CD74HCT563  
(PDIP, SOIC)  
TOP VIEW  
TOP VIEW  
1
2
3
4
5
6
7
8
9
V
1
2
3
4
5
6
7
8
9
V
OE  
Q0  
D0  
D1  
Q1  
Q2  
D2  
D3  
Q3  
20  
19  
OE  
D0  
D1  
D2  
D3  
D4  
D5  
D6  
D7  
20  
19  
CC  
CC  
Q7  
Q0  
18 D7  
17 D6  
16 Q6  
18 Q1  
17 Q2  
16 Q3  
15  
Q5  
15  
Q4  
14 D5  
13 D4  
14 Q5  
13 Q6  
12  
12  
Q4  
Q7  
GND 10  
11 LE  
GND 10  
11 LE  
Functional Block Diagram  
CD74HC/HCT533  
D
D
D
D
D
D
D
D
7
0
1
2
3
4
5
6
D
G
O
D
G
O
D
G
O
D
G
O
D
G
O
D
G
O
D
G
O
D
G
O
LE  
OE  
O
O
O
O
O
O
O
O
7
0
1
2
3
4
5
6
TRUTH TABLE  
OUTPUT ENABLE  
LATCH ENABLE  
DATA  
Q OUTPUT  
L
L
L
L
H
H
H
L
H
L
l
L
H
H
L
L
h
X
X
Z
NOTE: H = High Voltage Level, L = Low Voltage Level, X = Don’t Care, Z = High Impedance State, l = Low voltage level one set-up time prior  
to the high to low latch enable transition, h = High voltage level one set-up time prior to the high to low latch enable transition.  
2
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563  
Absolute Maximum Ratings  
Thermal Information  
o
DC Supply Voltage, V  
. . . . . . . . . . . . . . . . . . . . . . . . -0.5V to 7V Thermal Resistance (Typical, Note 3)  
θ
( C/W)  
CC  
DC Input Diode Current, I  
JA  
IK  
PDIP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
SOIC Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . .  
125  
120  
For V < -0.5V or V > V  
+ 0.5V. . . . . . . . . . . . . . . . . . . . . .±20mA  
OK  
For V < -0.5V or V > V  
I
I
CC  
o
DC Output Diode Current, I  
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . 150 C  
Maximum Storage Temperature Range . . . . . . . . . .-65 C to 150 C  
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . . 300 C  
o
o
+ 0.5V . . . . . . . . . . . . . . . . . . . .±20mA  
O
O
CC  
o
DC Drain Current, per Output, I  
O
For -0.5V < V < V  
+ 0.5V. . . . . . . . . . . . . . . . . . . . . . . . . .±35mA  
O
CC  
(SOIC - Lead Tips Only)  
DC Output Source or Sink Current per Output Pin, I  
O
For V > -0.5V or V < V  
+ 0.5V . . . . . . . . . . . . . . . . . . . .±25mA  
O
O
CC  
DC V  
or Ground Current, I  
. . . . . . . . . . . . . . . . . . . . . . . . .±50mA  
CC  
CC  
Operating Conditions  
o
o
Temperature Range, T . . . . . . . . . . . . . . . . . . . . . . -55 C to 125 C  
A
Supply Voltage Range, V  
CC  
HC Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2V to 6V  
HCT Types . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .4.5V to 5.5V  
DC Input or Output Voltage, V , V . . . . . . . . . . . . . . . . . 0V to V  
I
O
CC  
Input Rise and Fall Time  
2V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1000ns (Max)  
4.5V. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 500ns (Max)  
6V . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 400ns (Max)  
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation  
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.  
NOTE:  
3. θ is measured with the component mounted on an evaluation PC board in free air.  
JA  
DC Electrical Specifications  
TEST  
CONDITIONS  
o
o
o
o
o
25 C  
-40 C TO 85 C  
-55 C TO 125 C  
PARAMETER  
HC TYPES  
SYMBOL V (V)  
I
(mA)  
V
(V) MIN TYP MAX  
MIN  
MAX  
MIN  
MAX  
UNITS  
I
O
CC  
High Level Input  
Voltage  
V
-
-
-
2
1.5  
3.15  
4.2  
-
-
-
-
-
-
-
-
-
-
-
-
-
1.5  
3.15  
4.2  
-
-
1.5  
3.15  
4.2  
-
-
V
V
V
V
V
V
V
V
V
V
V
IH  
4.5  
-
-
-
6
2
-
-
-
Low Level Input  
Voltage  
V
-
0.5  
0.5  
0.5  
IL  
4.5  
6
-
1.35  
-
1.35  
-
1.35  
-
1.8  
-
1.8  
-
1.8  
High Level Output  
Voltage  
CMOS Loads  
V
V
V
or  
-0.02  
2
1.9  
4.4  
5.9  
3.98  
5.48  
-
-
-
-
-
1.9  
4.4  
5.9  
3.84  
5.34  
-
-
-
-
-
1.9  
4.4  
5.9  
3.7  
5.2  
-
-
-
-
-
OH  
IH  
V
IL  
-0.02  
-0.02  
-6  
4.5  
6
High Level Output  
Voltage  
TTL Loads  
4.5  
6
-7.8  
Low Level Output  
Voltage  
CMOS Loads  
V
or  
0.02  
0.02  
0.02  
6
2
4.5  
6
-
-
-
-
-
-
-
-
-
-
0.1  
0.1  
-
-
-
-
-
0.1  
0.1  
-
-
-
-
-
0.1  
0.1  
0.1  
0.4  
0.4  
V
V
V
V
V
OL  
IH  
V
IL  
0.1  
0.1  
Low Level Output  
Voltage  
TTL Loads  
4.5  
6
0.26  
0.26  
0.33  
0.33  
7.8  
Input Leakage  
Current  
I
V
or  
-
6
6
-
-
-
-
±0.1  
-
-
±1  
-
-
±1  
µA  
µA  
I
CC  
GND  
Quiescent Device  
Current  
I
V
or  
0
8
80  
160  
CC  
CC  
GND  
3
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563  
DC Electrical Specifications  
(Continued)  
TEST  
CONDITIONS  
o
o
o
o
o
25 C  
-40 C TO 85 C  
-55 C TO 125 C  
PARAMETER  
SYMBOL V (V)  
I
(mA)  
V
(V) MIN TYP MAX  
MIN  
MAX  
MIN  
MAX  
UNITS  
I
O
CC  
Three-State Leakage  
Current  
-
V
V
or  
V
=
or  
6
-
-
±0.5  
-
±5  
-
±10  
µA  
IL  
O
V
IH  
CC  
GND  
HCT TYPES  
High Level Input  
Voltage  
V
-
-
-
-
4.5 to  
5.5  
2
-
-
-
-
-
0.8  
-
2
-
-
0.8  
-
2
-
-
0.8  
-
V
V
V
IH  
Low Level Input  
Voltage  
V
4.5 to  
5.5  
IL  
High Level Output  
Voltage  
CMOS Loads  
V
V
V
or  
-0.02  
4.5  
4.5  
4.5  
4.5  
4.4  
4.4  
4.4  
OH  
IH  
V
IL  
High Level Output  
Voltage  
TTL Loads  
-6  
0.02  
6
3.98  
-
-
-
-
3.84  
-
3.7  
-
V
V
V
Low Level Output  
Voltage  
CMOS Loads  
V
or  
-
-
0.1  
0.26  
-
-
0.1  
0.33  
-
-
0.1  
0.4  
OL  
IH  
V
IL  
Low Level Output  
Voltage  
TTL Loads  
Input Leakage  
Current  
I
V
to  
-
5.5  
5.5  
5.5  
-
-
-
-
-
-
±0.1  
8
-
-
-
±1  
80  
±5  
-
-
-
±1  
µA  
µA  
µA  
I
CC  
GND  
Quiescent Device  
Current  
I
V
or  
0
160  
±10  
CC  
CC  
GND  
Three-State Leakage  
Current  
-
V
or  
V
V
=
or  
±0.5  
IL  
V
O
IH  
CC  
GND  
Additional Quiescent  
Device Current Per  
Input Pin: 1 Unit Load  
(Note 4)  
I  
CC  
V
-
4.5 to  
5.5  
-
100  
360  
-
450  
-
490  
µA  
CC  
-2.1  
NOTE:  
4. For dual-supply systems theoretical worst case (V = 2.4V, V  
I
= 5.5V) specification is 1.8mA.  
CC  
HCT Input Loading Table  
INPUT  
UNIT LOADS  
0.15  
D0 - D7  
LE  
OE  
0.30  
0.55  
NOTE: Unit Load is I  
tions table, e.g., 360µA max at 25 C.  
limit specified in DC Electrical Specifica-  
CC  
o
4
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563  
Prerequisite For Switching Specifications  
o
o
o
o
o
25 C  
-40 C TO 85 C -55 C TO 125 C  
TEST  
V
CC  
PARAMETER  
HC TYPES  
SYMBOL CONDITIONS (V)  
MIN TYP MAX  
MIN  
MAX  
MIN  
MAX  
UNITS  
LE Pulse Width  
t
-
-
-
-
2
80  
16  
14  
50  
10  
9
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
100  
20  
17  
65  
13  
11  
45  
9
-
-
-
-
-
-
-
-
-
-
-
-
120  
24  
20  
75  
15  
13  
55  
11  
7
-
-
-
-
-
-
-
-
-
-
-
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
W
4.5  
6
Set-up Time Data to LE  
t
2
SU  
4.5  
6
Hold Time, Data to LE  
(533)  
t
t
2
35  
7
H
H
4.5  
6
6
8
Hold Time, Data to LE  
(563)  
2
4
4
4
4.5  
6
4
4
4
4
4
4
HCT TYPES  
LE Pulse Width  
t
t
t
t
-
-
-
-
4.5  
4.5  
4.5  
4.5  
16  
10  
8
-
-
-
-
-
-
-
-
20  
13  
10  
5
-
-
-
-
24  
15  
12  
5
-
-
-
-
ns  
ns  
ns  
ns  
w
w
H
H
Set-up Time Data to LE  
Hold Time, Data to LE (533)  
Hold Time, Data to LE (563)  
5
Switching Specifications Input t , t = 6ns  
r
f
o
-55 C TO  
125 C  
o
o
o
o
25 C  
-40 C TO 85 C  
MAX  
TEST  
PARAMETER  
HC TYPES  
SYMBOL  
CONDITIONS  
V
(V)  
TYP  
MAX  
MAX  
UNITS  
CC  
Propagation Delay,  
Data to Qn  
(HC533)  
t
, t  
C = 50pF  
2
4.5  
6
-
-
165  
33  
28  
-
205  
41  
35  
-
250  
50  
43  
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
PLH PHL  
L
-
C = 15pF  
5
13  
-
L
Propagation Delay,  
Data to Qn  
(HC563)  
t
t
t
t
C = 50pF  
2
150  
30  
26  
-
190  
38  
33  
-
225  
45  
38  
-
PLH, PHL  
L
4.5  
6
-
-
C = 15pF  
5
12  
-
L
Propagation Delay,  
LE to Qn  
(HC533)  
t
C = 50pF  
2
175  
35  
30  
-
220  
44  
37  
-
265  
53  
45  
-
PLH, PHL  
L
4.5  
6
-
-
C = 15pF  
5
14  
-
L
Propagation Delay,  
LE to Qn  
(HC563)  
t
C = 50pF  
2
165  
33  
28  
-
205  
41  
35  
-
250  
50  
43  
-
PLH, PHL  
L
4.5  
6
-
-
C = 15pF  
5
13  
L
5
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563  
Switching Specifications Input t , t = 6ns (Continued)  
r
f
o
-55 C TO  
125 C  
o
o
o
o
25 C  
-40 C TO 85 C  
TEST  
PARAMETER  
Enable Times  
SYMBOL  
CONDITIONS  
V
(V)  
TYP  
MAX  
150  
30  
26  
-
MAX  
190  
38  
33  
-
MAX  
225  
45  
38  
-
UNITS  
ns  
CC  
t
t
C = 50pF  
2
-
-
PZH, PZL  
L
(HC533)  
4.5  
ns  
6
5
2
-
ns  
C = 15pF  
12  
-
ns  
L
Disable Times  
(HC533)  
t
t
C = 50pF  
150  
30  
26  
-
190  
38  
33  
-
225  
45  
38  
-
ns  
PHZ, PLZ  
L
4.5  
6
-
ns  
-
ns  
C = 15pF  
5
12  
-
ns  
L
Enable and Disable Times  
(HC563)  
t
t
C = 50pF  
2
150  
30  
26  
-
190  
38  
33  
-
225  
45  
38  
-
ns  
PZH, PZL,  
L
t
t
PHZ, PLZ  
4.5  
6
-
ns  
-
ns  
C = 15pF  
L
5
12  
-
ns  
Input Capacitance  
C
-
-
-
10  
20  
10  
20  
10  
20  
pF  
pF  
I
Three-State Output  
Capacitance  
C
-
-
O
Power Dissipation  
Capacitance  
C
-
5
42  
-
-
-
pF  
PD  
(Notes 5, 6)  
HCT TYPES  
Propagation Delay,  
Data to Qn  
(HC/HCT533)  
t
t
t
, t  
C = 50pF  
4.5  
5
-
34  
-
43  
-
51  
-
ns  
ns  
PLH PHL  
L
C = 15pF  
14  
L
Propagation Delay,  
Data to Qn  
(HC/HCT563)  
, t  
PLH PHL  
C = 50pF  
4.5  
5
-
30  
-
38  
-
45  
-
ns  
ns  
L
C = 15pF  
12  
L
Propagation Delay,  
LE to Qn  
(HC/HCT533)  
, t  
PLH PHL  
C = 50pF  
4.5  
5
-
38  
-
48  
-
57  
-
ns  
ns  
L
C = 15pF  
16  
L
Propagation Delay,  
LE to Qn  
(HC/HCT563)  
t , t  
PZL PZH  
C = 50pF  
4.5  
5
-
35  
-
44  
-
53  
-
ns  
ns  
L
C = 15pF  
14  
L
Enable Times  
(HC/HCT533)  
t
, t  
PLZ PZH  
C = 50pF  
4.5  
5
-
14  
-
35  
-
44  
-
53  
-
ns  
ns  
ns  
ns  
ns  
ns  
pF  
pF  
L
C = 15pF  
L
Disable Times  
(HC/HCT533)  
t
, t  
TLH THL  
C = 50pF  
4.5  
5
30  
-
38  
-
45  
-
L
C = 15pF  
12  
-
L
Enable and Disable Times  
(HC/HCT563)  
t
t
C = 50pF  
4.5  
5
35  
-
44  
-
53  
-
PZH, PZL,  
L
t
t
PHZ, PLZ  
C = 15pF  
L
14  
-
Input Capacitance  
C
-
-
-
10  
-
10  
-
10  
-
I
Power Dissipation  
Capacitance  
C
5
42  
PD  
(Notes 5, 6)  
NOTES:  
5. C  
PD  
is used to determine the no-load dynamic power consumption, per latch.  
2
2
6. P (total power per latch) = C  
V
f + Σ C V f where f = Input Frequency, f = Output Frequency, C = Output Load  
CC o i o L  
D
PD CC  
i
L
Capacitance, V  
= Supply Voltage.  
CC  
6
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563  
Test Circuits and Waveforms  
I
t
+ t =  
WH  
WL  
I
t C = 6ns  
fC  
r
L
t
+ t  
=
L
WL  
WH  
t C = 6ns  
t C  
f
L
fC  
t C  
f
L
L
r
L
3V  
V
CC  
90%  
10%  
2.7V  
0.3V  
CLOCK  
CLOCK  
50%  
10%  
1.3V  
0.3V  
50%  
t
50%  
1.3V  
t
1.3V  
GND  
GND  
t
t
WH  
WL  
WH  
WL  
NOTE: Outputs should be switching from 10% V  
to 90% V  
in  
NOTE: Outputs should be switching from 10% V  
to 90% V  
in  
CC  
CC  
CC  
CC  
accordance with device truth table. For f  
, input duty cycle = 50%. accordance with device truth table. For f , input duty cycle = 50%.  
MAX  
MAX  
FIGURE 1. HC CLOCK PULSE RISE AND FALL TIMES AND  
PULSE WIDTH  
FIGURE 2. HCT CLOCK PULSE RISE AND FALL TIMES AND  
PULSE WIDTH  
t = 6ns  
t = 6ns  
t = 6ns  
t = 6ns  
r
f
r
f
V
3V  
CC  
90%  
50%  
10%  
2.7V  
1.3V  
0.3V  
INPUT  
INPUT  
GND  
GND  
t
t
t
t
THL  
TLH  
THL  
TLH  
90%  
1.3V  
90%  
50%  
10%  
INVERTING  
OUTPUT  
INVERTING  
OUTPUT  
10%  
t
t
PLH  
PHL  
t
t
PLH  
PHL  
FIGURE 3. HC TRANSITION TIMES AND PROPAGATION  
DELAY TIMES, COMBINATION LOGIC  
FIGURE 4. HCT TRANSITION TIMES AND PROPAGATION  
DELAY TIMES, COMBINATION LOGIC  
t C  
t C  
t C  
t C  
r
L
f
L
f
L
r
L
V
3V  
CC  
90%  
10%  
2.7V  
0.3V  
CLOCK  
INPUT  
CLOCK  
INPUT  
50%  
1.3V  
GND  
GND  
t
t
t
t
H(L)  
H(H)  
H(H)  
H(L)  
V
3V  
CC  
DATA  
INPUT  
DATA  
INPUT  
50%  
1.3V  
t
SU(L)  
1.3V  
1.3V  
GND  
GND  
t
t
t
SU(H)  
SU(H)  
SU(L)  
t
t
90%  
50%  
t
t
THL  
TLH  
THL  
TLH  
90%  
1.3V  
90%  
90%  
1.3V  
OUTPUT  
OUTPUT  
10%  
10%  
t
t
t
PLH  
t
PHL  
PHL  
PLH  
t
REM  
t
REM  
V
3V  
CC  
SET, RESET  
OR PRESET  
SET, RESET  
OR PRESET  
50%  
1.3V  
GND  
GND  
IC  
IC  
C
C
L
L
50pF  
50pF  
FIGURE 5. HC SETUP TIMES, HOLD TIMES, REMOVAL TIME,  
AND PROPAGATION DELAY TIMES FOR EDGE  
TRIGGERED SEQUENTIAL LOGIC CIRCUITS  
FIGURE 6. HCT SETUP TIMES, HOLD TIMES, REMOVAL TIME,  
AND PROPAGATION DELAY TIMES FOR EDGE  
TRIGGERED SEQUENTIAL LOGIC CIRCUITS  
7
CD74HC533, CD74HCT533, CD74HC563, CD74HCT563  
Test Circuits and Waveforms (Continued)  
6ns  
6ns  
t
6ns  
t
6ns  
r
f
V
3V  
CC  
OUTPUT  
DISABLE  
OUTPUT  
DISABLE  
90%  
2.7  
50%  
t
1.3  
10%  
0.3  
GND  
GND  
t
t
t
t
PZL  
PZL  
PLZ  
PLZ  
OUTPUT LOW  
TO OFF  
OUTPUT LOW  
TO OFF  
50%  
50%  
1.3V  
10%  
90%  
10%  
90%  
t
t
PZH  
PHZ  
PHZ  
t
PZH  
OUTPUT HIGH  
TO OFF  
OUTPUT HIGH  
TO OFF  
1.3V  
OUTPUTS  
ENABLED  
OUTPUTS  
ENABLED  
OUTPUTS  
DISABLED  
OUTPUTS  
ENABLED  
OUTPUTS  
DISABLED  
OUTPUTS  
ENABLED  
FIGURE 7. HC THREE-STATE PROPAGATION DELAY  
WAVEFORM  
FIGURE 8. HCT THREE-STATE PROPAGATION DELAY  
WAVEFORM  
OTHER  
OUTPUT  
= 1kΩ  
INPUTS  
TIED HIGH  
OR LOW  
IC WITH  
THREE-  
STATE  
R
L
V
FOR t AND t  
PLZ  
CC  
GND FOR t  
PZL  
AND t  
PHZ  
PZH  
C
L
OUTPUT  
50pF  
OUTPUT  
DISABLE  
NOTE: Open drain waveforms t  
PLZ  
and t are the same as those for three-state shown on the left. The test circuit is Output R = 1kto  
PZL L  
V
, C = 50pF.  
CC  
L
FIGURE 9. HC AND HCT THREE-STATE PROPAGATION DELAY TEST CIRCUIT  
8
IMPORTANT NOTICE  
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any product or service without notice, and advise customers to obtain the latest version of relevant information  
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pertaining to warranty, patent infringement, and limitation of liability.  
TI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with TI’s standard warranty. Testing and other quality control techniques are utilized to the extent  
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except those mandated by government requirements.  
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF  
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In order to minimize risks associated with the customer’s applications, adequate design and operating  
safeguards must be provided by the customer to minimize inherent or procedural hazards.  
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent  
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