STK22N06 [STMICROELECTRONICS]
N - CHANNEL ENHANCEMENT MODE POWER MOS TRANSISTOR; N - 沟道增强型功率MOS晶体管
| 型号： | STK22N06 |
| 厂家： | 
ST |
| 描述： | N - CHANNEL ENHANCEMENT MODE POWER MOS TRANSISTOR |
| 文件： | 总10页 (文件大小：185K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
STK22N06
N - CHANNEL ENHANCEMENT MODE
POWER MOS TRANSISTOR
TYPE
VDSS
RDS(on)
< 0.065 Ω
ID
STK22N06
60 V
22 A
■
■
■
■
■
■
■
■
TYPICAL RDS(on) = 0.048 Ω
AVALANCHE RUGGED TECHNOLOGY
100% AVALANCHE TESTED
REPETITIVE AVALANCHE DATA AT 100oC
LOW GATE CHARGE
HIGH CURRENT CAPABILITY
175oC OPERATING TEMPERATURE
APPLICATION ORIENTED
3
2
1
3
2
1
CHARACTERIZATION
SOT-82
SOT-194
(option)
APPLICATIONS
■
■
■
■
■
■
HIGH CURRENT, HIGH SPEED SWITCHING
SOLENOID AND RELAY DRIVERS
REGULATORS
DC-DC & DC-AC CONVERTERS
MOTOR CONTROL, AUDIO AMPLIFIERS
AUTOMOTIVE ENVIRONMENT (INJECTION,
ABS, AIR-BAG, LAMPDRIVERS, Etc.)
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
VDS
Parameter
Value
60
Unit
Drain-source Voltage (VGS = 0)
Drain- gate Voltage (RGS = 20 kΩ)
Gate-source Voltage
Drain Current (continuous) at Tc = 25 oC
Drain Current (continuous) at Tc = 100 oC
Drain Current (pulsed)
V
V
VDG R
VGS
60
± 20
22
V
ID
A
ID
15
A
IDM(•)
Ptot
88
A
Total Dissipation at Tc = 25 oC
65
W
Derating Factor
0.43
-65 to 175
175
W/oC
oC
oC
Tstg
Tj
Storage Temperature
Max. Operating Junction Temperature
(•) Pulse width limited by safe operating area
1/7
May 1993
STK22N06
THERMAL DATA
Rthj-case Thermal Resistance Junction-case
Rthj-amb Thermal Resistance Junction-ambient
Rthj-amb Thermal Resistance Case-sink
Max
Max
Typ
2.31
80
0.7
275
oC/W
oC/W
oC/W
oC
Tl
Maximum Lead Temperature For Soldering Purpose
AVALANCHE CHARACTERISTICS
Symbol
Parameter
Max Value
Unit
IAR
Avalanche Current, Repetitive or Not-Repetitive
22
A
(pulse width limited by Tj max, δ < 1%)
EAS
EAR
IAR
Single Pulse Avalanche Energy
100
25
mJ
mJ
A
(starting Tj = 25 oC, ID = IAR, VDD = 25 V)
Repetitive Avalanche Energy
(pulse width limited by Tj max, δ < 1%)
Avalanche Current, Repetitive or Not-Repetitive
15
(Tc = 100 oC, pulse width limited by Tj max, δ < 1%)
ELECTRICAL CHARACTERISTICS (Tcase = 25 oC unless otherwise specified)
OFF
Symbol
V(BR)DSS Drain-source
Breakdown Voltage
Zero Gate Voltage
Drain Current (VGS = 0) VDS = Max Rating x 0.8 Tc = 125 C
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
ID = 250 µA VGS = 0
60
V
IDSS
IGSS
VDS = Max Rating
250
1000
µA
µA
o
Gate-body Leakage
Current (VDS = 0)
VGS = ± 20 V
± 100
nA
ON ( )
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
VGS(th)
Gate Threshold Voltage VDS = VGS ID = 250 µA
2
2.9
4
V
RDS(on) Static Drain-source On VGS = 10V ID = 11 A
0.048 0.065
0.13
Ω
Ω
Resistance
VGS = 10V ID = 11 A Tc = 100oC
ID(on)
On State Drain Current VDS > ID(on) x RDS(on)max
VGS = 10 V
22
A
DYNAMIC
Symbol
Parameter
Forward
Test Conditions
Min.
Typ.
Max.
Unit
gfs ( )
VDS > ID(on) x RDS(on)max
ID = 11 A
6
10
S
Transconductance
Ciss
Coss
Crss
Input Capacitance
Output Capacitance
Reverse Transfer
Capacitance
VDS = 25 V f = 1 MHz VGS = 0
700
320
90
900
450
150
pF
pF
pF
2/7
STK22N06
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symbol
Parameter
Turn-on Time
Rise Time
Test Conditions
VDD = 30 V ID = 3 A
RG = 50 Ω VGS = 10 V
(see test circuit, figure 3)
(di/dt)on Turn-on Current Slope VDD = 40 V ID = 22 A
Min.
Typ.
Max.
Unit
td(on)
tr
30
90
45
130
ns
ns
230
A/µs
RG = 50 Ω
VGS = 10 V
(see test circuit, figure 5)
Qg
Qgs
Qgd
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
VDD = 40 V ID = 22 A VGS = 10 V
26
8
9
40
nC
nC
nC
SWITCHING OFF
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Unit
tr(Voff)
tf
tc
Off-voltage Rise Time
Fall Time
Cross-over Time
VDD = 40 V ID = 22 A
RG = 50 Ω VGS = 10 V
(see test circuit, figure 5)
80
80
170
120
120
250
ns
ns
ns
SOURCE DRAIN DIODE
Symbol
Parameter
Source-drain Current
Test Conditions
Min.
Typ.
Max.
Unit
ISD
22
88
A
A
ISDM(• ) Source-drain Current
(pulsed)
VSD ( ) Forward On Voltage
ISD = 22 A VGS = 0
1.5
V
trr
Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current
ISD = 22 A
VDD = 30 V
(see test circuit, figure 5)
di/dt = 100 A/µs
80
0.22
5.5
ns
Tj = 150 oC
Qrr
µC
IRRM
A
( ) Pulsed: Pulse duration = 300 µs, duty cycle 1.5 %
(•) Pulse width limited by safe operating area
Safe Operating Area
Thermal Impedance
3/7
STK22N06
Derating Curve
Output Characteristics
Transfer Characteristics
Transconductance
Static Drain-source On Resistance
Gate Charge vs Gate-source Voltage
4/7
STK22N06
Capacitance Variations
Normalized Gate Threshold Voltage vs
Temperature
Normalized On Resistance vs Temperature
Turn-on Current Slope
Turn-off Drain-source Voltage Slope
Cross-over Time
5/7
STK22N06
Switching Safe Operating Area
Accidental Overload Area
Source-drain Diode Forward Characteristics
Fig. 1: Unclamped Inductive Load Test Circuits
Fig. 2: Unclamped Inductive Waveforms
6/7
STK22N06
Fig. 3: Switching Times Test Circuits For
Fig. 4: Gate Charge Test Circuit
Resistive Load
Fig. 5: Test Circuit For Inductive Load Switching
And Diode Recovery Times
7/7
STK22N06
SOT-82 MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
7.4
TYP.
MAX.
7.8
MIN.
0.291
0.413
0.028
0.019
0.04
MAX.
0.307
0.445
0.035
0.030
0.106
A
B
10.5
0.7
11.3
0.9
b
b1
C
c1
D
e
0.49
2.4
0.75
2.7
1.2
15.7
2.2
0.047
0.618
0.087
0.173
0.150
0.100
e3
F
4.4
3.8
H
2.54
C
A
c1
e
b
b1
e3
P032A
8/7
STK22N06
SOT-194 MECHANICAL DATA
mm
inch
TYP.
DIM.
MIN.
7.4
TYP.
MAX.
7.8
MIN.
0.291
0.413
0.028
0.019
0.094
MAX.
0.307
0.445
0.035
0.030
0.106
A
B
10.5
0.7
11.3
0.9
b
b1
C
0.49
2.4
0.75
2.7
c1
c2
D
1.2
1.3
6
0.047
0.051
0.236
0.087
0.173
0.150
e
2.2
4.4
3.8
e3
F
H
2.54
0.100
P
45° (typ.)
S
4
2
0.157
0.079
0.004
S1
T
0.1
C
A
C1
T
P
e
b1
b
c2
e3
P032B
9/7
STK22N06
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specificationsmentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronicsproductsare notauthorized foruse ascritical componentsin life support devices or systems without express
written approval of SGS-THOMSON Microelectonics.
1994 SGS-THOMSON Microelectronics - All Rights Reserved
SGS-THOMSON Microelectronics GROUP OF COMPANIES
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10/7
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