CXD1175AP [SONY]
8-bit 20MSPS Video A/D Converter (CMOS); 8位20MSPS视频A / D转换器( CMOS )型号: | CXD1175AP |
厂家: | SONY CORPORATION |
描述: | 8-bit 20MSPS Video A/D Converter (CMOS) |
文件: | 总20页 (文件大小:303K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
CXD1175AM/AP
8-bit 20MSPS Video A/D Converter (CMOS)
Description
CXD1175AM
CXD1175AP
The CXD1175A is an 8-bit CMOS A/D converter
for video use. The adoption of a 2-step parallel
system achieves low consumption at a maximum
conversion speed of 20MSPS minimum, 35MSPS
typical.
24 pin SOP (Plastic)
24 pin DIP (Plastic)
Features
• Resolution: 8 bit ± 1/2LSB (DL)
• Maximum sampling frequency: 20MSPS
• Low power consumption: 60mW (at 20MSPS typ.)
(reference current excluded)
Absolute Maximum Ratings (Ta = 25°C)
• Supply voltage VDD
• Reference voltage VRT,VRBVDD + 0.5 to Vss – 0.5V
7
V
• Built-in sampling and hold circuit
• Built-in reference voltage self-bias circuit
• 3-state TTL compatible output
• Power supply: 5V single
• Input voltage
(Analog)
VIN
VDD + 0.5 to Vss – 0.5V
VDD + 0.5 to Vss – 0.5V
VDD + 0.5 to Vss – 0.5V
• Input voltage
(Digital)
VI
• Low input capacitance: 11pF
• Reference impedance: 300Ω (typ.)
• Output voltage
(Digital)
VO
• Storage temperature
Tstg
Applications
–55 to +150
°C
V
TV, VCR digital systems and a wide range of fields
where high speed A/D conversion is required.
Recommended Operating Conditions
• Supply voltage AVDD, AVss 4.75 to 5.25
DVDD, DVss
| DVss – AVss | 0 to 100 mV
Structure
Silicon gate CMOS monolithic IC
• Reference input voltage
VRB
VRT
0 and above
2.8 and below
1.8Vp-p above
V
V
• Analog input
VIN
• Clock pulse width
TPW1, TPW0 23ns (min) to 1.1µs (max)
• Operating ambient temperature
Topr
–40 to +85
°C
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
– 1 –
E89321F78-PS
CXD1175AM/AP
Block Diagram and Pin Configuration
DVSS
VRB
1
2
24
23
22
21
20
19
18
17
16
15
14
13
OE
DVSS
D0 (LSB)
D1
Reference voltage
VRBS
AVSS
AVSS
VIN
3
4
Lower
comparators with
S/H (4 bit)
Lower data
latches
Lower encoder
(4 bit)
5
D2
6
D3
Lower
comparators with
S/H (4 bit)
AVDD
VRT
7
D4
Lower encoder
(4 bit)
8
D5
Upper data
latches
VRTS
AVDD
AVDD
DVDD
9
D6
Upper
comparators with
S/H (4 bit)
Upper encoder
(4 bit)
10
11
12
D7 (MSB)
DVDD
CLK
Clock generator
– 2 –
CXD1175AM/AP
Pin Description and Equivalent Circuits
No.
Symbol
Equivalent circuit
Description
DVDD
When OE = Low, Data is output.
When OE = High, D0 to D7 pins turn
to High impedance.
1
OE
1
DVSS
Digital ground
DVSS
2, 24
Di
3 to 10 D0 to D7
D0 (LSB) to D7 (MSB) output
11, 13
12
DVDD
Digital +5V
Clock input
DVDD
DVSS
CLK
12
AVDD
16
VRTS
Shorted with VRT generates, +2.6V.
Reference voltage (Top)
16
AVDD
17
23
VRT
VRB
23
17
Reference voltage (Bottom)
Analog +5V
AVSS
14, 15, 18 AVDD
AVDD
19
19
VIN
Analog input
AVSS
20, 21
22
AVSS
Analog GND
AVSS
VRBS
Shorted with VRB generates +0.6V.
22
– 3 –
CXD1175AM/AP
Digital output
Compatibility between analog input voltage and the digital output code is indicated in the chart below.
Digital output code
MSB LSB
Input signal
voltage
Step
VRT
:
0
:
1 1 1 1 1 1 1 1
:
:
:
:
127
128
:
1 0 0 0 0 0 0 0
0 1 1 1 1 1 1 1
:
VRB
255
0 0 0 0 0 0 0 0
TPW1
TPW0
Clock
Amalog input
N
N + 1
N – 2
N + 3
N
N + 4
N + 1
N + 2
Data output
N – 3
N – 1
Td = 18ns
: Point for analog signal sampling.
Timing Chart 1
tr = 4.5ns
tf = 4.5ns
90%
5V
2.5V
OE input
Output 1
10%
0V
tPLZ
tPHZ
tPZL
VOH
1.3V
1.3V
10%
90%
VOL (≠DVSS)
VOH (≠DVDD)
tPZH
Output 2
VOL
Timing Chart 2
– 4 –
CXD1175AM/AP
Electrical Characteristics
(Fc = 20MSPS, VDD = 5V, VRB = 0.5V, VRT = 2.5V, Ta = 25°C)
Analog characteristics
Item
Symbol
Conditions
Min.
Typ.
Max.
Unit
VDD = 4.75 to 5.25V
Ta = –40 to +85°C
VIN = 0.5 to 2.5V
fIN = 1kHz ramp
MSPS
0.5
20
Conversion speed
Fc
Analog input band width
(–1dB)
MHz
mV
Envelope
18
BW
Potential difference to VRT
Potential difference to VRB
–10
0
–35
+15
+0.5
±0.3
1.0
0.5
30
–60
+45
+1.3
±0.5
EOT
EOB
EL
1
Offset voltage
Integral non-linearity error
Differential non-linearity erro
Differential gain error
Differential phase error
Aperture jitter
LSB
End point
r
ED
%
deg
ps
DG
DP
taj
NTSC 40 IRE mod ramp
Fc = 14.3MSPS
ns
4
Sampling delay
tsd
1
The offset voltage EOB is a potential difference between VRB and a point of position where the voltage
drops equivalent to 1/2 LSB of the voltage when the output data changes from “00000000” to “00000001”.
EOT is a potential difference between VRT and a potential of point where the voltage rises equivalent to
1/2LSB of the voltage when the output data changes from “11111111” to “11111110”.
– 5 –
CXD1175AM/AP
DC characteristics
(Fc = 20MSPS, VDD = 5V, VRB = 0.5V, VRT = 2.5V, Ta = 25°C)
Item
Symbol
IDD
Conditions
Fc = 20MSPS
Min.
Typ.
12
Max.
17
Unit
mA
Supply current
NTSC ramp wave input
4.5
6.6
11
8.7
mA
pF
Reference pin current
IREF
CIN
Analog input capacitance
VIN = 1.5V + 0.07Vrms
Reference resistance
(VRT to VRB)
230
300
450
Ω
V
V
V
RREF
0.60
1.96
0.64
2.09
0.68
2.21
VRB1
Shorts VRB and VRBS
Shorts VRT and VRTS
Self-bias I
VRT1 – VRB1
VRB = AGND
Shorts VRT and VRTS
2.25
3.5
2.39
2.53
Self-bias II
VRT2
VIH
VIL
IIH
VDD = 4.75 to 5.25V
Ta = –40 to +85°C
Digital input voltage
1.0
5
VIH = VDD
µA
mA
µA
Digital input current
Digital output current
VDD = max
VIL = 0V
5
IIL
VOH = VDD – 0.5V
–1.1
3.7
IOH
IOL
IOZH
IOZL
OE = VSS
VDD = min
VOL = 0.4V
VOH = VDD
VOL = 0V
16
16
OE = VDD
VDD = max
Timing
(Fc = 20MSPS, VDD = 4.75 to 5.25V, VRB = 0.5V, VRT = 2.5V, Ta = –40 to +85°C)
Item
Symbol
Conditions
Min.
Typ.
18
Max.
30
Unit
ns
Output data delay
TDL
With TTL 1 gate and 10pF load
Tri-state output
enable time
t
PZH
RL = 1kΩ, CL = 20pF
OE = 5V → 0V
ns
ns
3
7
7
13
26
tPZL
Tri-state output
disable time
tPHZ
PLZ
RL = 1kΩ, CL = 20pF
OE = 0V → 5V
15
t
– 6 –
CXD1175AM/AP
Electrical Characteristics Measurement Circuit
Integral non-linearity error
3-state output measurement circuit
Differential non-linearity error measurement circuit
}
Offset voltage
+V
Measurement
point
DVDD
S2
S1: ON IF A < B
S2: ON IF B > A
RL
S1
To output pin
–V
CL
RL
A < B A > B
COMPARATOR
8
8
VIN
DUT
CXD1175A
A8
to
A1
A0
B8
to
B1
B0
BUFFER
Note) CL includes the capacitance of the probe
and others.
"0"
"1"
DVM
000 · · · 00
8
to
CLK (20MHz)
111 · · · 10
CONTROLLER
Maximum operational speed
Differential gain error
measurement circuit
}
Differential phase error
2.5V
ERROR RATE
Fc – 1kHz
CX20202A-1
S.G.
H.P.F
COUNTER
0.5V
1
2
1
2
TTL
ECL
10bit
D/A
VIN
8
8
CXD
1175A
AMP
620
–5.2V
100
40 IRE
MODULATION
2.5V
VECTOR
SCOPE
NTSC
SIGNAL
SOURCE
CLK
BURST
0
0.5V
D.G
D.P.
–40
SYNC
620
–5.2V
TTL
ECL
S.G.
(CW)
FC
Digital output current measurement circuit
VDD
VRT
VIN
VDD
VRT
2.5V
0.5V
2.5V
0.5V
IOL
IOH
VIN
VRB
VRB
CLK
OE
GND
CLK
OE
GND
+
–
+
VOL
VOH
–
– 7 –
CXD1175AM/AP
Timing Chart 3
Vi (1)
Vi (2)
Vi (3)
Vi (4)
Analog input
External clock
Upper comparators block
Upper data
S (1)
C (1)
S (2)
C (2)
S (3)
C (3)
S (4)
C (4)
MD (0)
MD (1)
MD (2)
MD (3)
Lower reference voltage
RV (0)
RV (1)
RV (2)
RV (3)
Lower comparators A block
Lower data A
S (1)
H (1)
C (1)
S (3)
H (3)
C (3)
LD (–1)
LD (1)
Lower comparators B block
Lower data B
H (0)
C (0)
S (2)
H (2)
C (2)
S (4)
H (4)
LD (–2)
LD (0)
LD (2)
Digital output
Out (–2)
Out (–1)
Out (0)
Out (1)
Operation (See Block Diagram and Timing Chart)
1. The CXD1175AM/AP is a 2-step parallel system A/D converter featuring a 4-bit upper comparators group
and 2 lower comparators groups of 4-bit each. The reference voltage that is equal to the voltage between
VRT – VRB/16 is constantly applied to the upper 4-bit comparator block. Voltage that corresponded to the
upper data is fed through the reference supply to the lower data. VRTS and VRBS pins serve for the self
generation of VRT (Reference voltage top) and VRB (Reference voltage bottom).
– 8 –
CXD1175AM/AP
2. This IC uses an offset cancel type comparator and operates synchronously with an external clock. It
features the following operating modes which are respectively indicated on the timing chart with S, H, C
symbols. That is input sampling (auto zero) mode, input hold mode and comparison mode.
3. The operation of respective parts is as indicated in the chart. For instance input voltage Vi (1) is sampled
with the falling edge of the first clock by means of the upper comparator block and the lower comparator A
block.
The upper comparators block finalizes comparison data MD (1) with the rising edge of the first clock.
Simultaneously the reference supply generates the lower reference voltage RV (1) that corresponded to
the upper results. The lower comparator block finalizes comparison data LD (1) with the rising edge of the
second clock. MD (1) and LD (1) are combined and output as Out (1) with the rising edge of the 3rd clock.
Accordingly there is a 2.5 clock delay from the analog input sampling point to the digital data output.
Operation Notes
1. VDD, VSS
To reduce noise effects, separate the analog and digital systems close to the device. For both the digital
and analog VDD pins, use a ceramic capacitor of about 0.1µF set as close as possible to the pin to bypass
to the respective GND’s.
2. Analog input
Compared with the flash type A/D converter, the input capacitance of the analog input is rather small.
However it is necessary to conduct the drive with an amplifier featuring sufficient band and drive capability.
When driving with an amplifier of low output impedance, parasite oscillation may occur. That may be
prevented by inserting a resistance of about 100Ω in series between the amplifier output and A/D input.
3. Clock input
The clock line wiring should be as short as possible also, to avoid any interference with other signals,
separate it from other circuits.
4. Reference input
Voltage between VRT to VRB is compatible with the dynamic range of the analog input. Bypassing VRT and
VRB pins to GND, by means of a capacitor about 0.1µF, stable characteristics are obtained. By shorting VRT
and VRTS, VRB and VRBS, the self-bias function that generates VRT = 2.6V and VRB = 0.6V, is activated.
5. Timing
Analog input is sampled with the falling edge of CLK and output as digital data with a delay of 2.5 clocks
and with the following rising edge. The delay from the clock rising edge to the data output is about 18ns.
6. OE pin
By connecting OE to GND output mode is obtained. By connecting to VDD high impedance is obtained.
7. About latch up
It is necessary that AVDD and DVDD pins be the common source of power supply.
This is to avoid latch up due to the voltage difference between AVDD and DVDD pins when power is ON.
– 9 –
CXD1175AM/AP
Application Circuit
+5V
R11
1k
IC1
µPC254
R12
1k
Q4
Q5
HC04
CLK
CLOCK IN
+5V
C9
47µ
R13
500
IC2
µPC254
13
12
11
10
9
+12V
C10
0.1µ
+5V
+12V
14
15
16
17
18
19
20
21
22
23
24
R6
500
D7 (MSB)
D6
R8
100
C6
47µ
C5
R3
Q2
C12
0.1µ
0.1µ
500
C2
D5
8
10µ
C8
Q3
Q1
D4
7
CXD1175AM/AP
R7
D3
6
500
V IN
R10
75
D2
R4
1k
5
R5
2k
R2
180
C1
470µ
R9
5k
D1
4
R1
120
C13
10p
C3
D0 (LSB)
3
47µ
C4
0.1µ
2
C7
47µ
C11
0.1µ
1
–12V
–12V
–12V
+5V
: Ceramic Chip Condenser
0.1µF
: Analog GND
: Digital GND
Note) It is necessary that AVDD and DVDD pins the common source of power supply.
The gain of analog input signal can be variable by adjustment of value of R3.
Application circuits shown are typical examples illustrating the operation of the devices. Sony cannot assume responsibility for
any problems arising out of the use of these circuits or for any infringement of third party patent and other right due to same.
– 10 –
CXD1175AM/AP
8-bit 20MSPS ADC and DAC Evaluation Board
The CXD1175AP/CXA1106P PCB is evaluation PCB for the 8-bit high speed and low power consumption
CMOS A/D converter CXD1175AP and the 8-bit high speed bipolar D/A converter CXD1106P. This PCB
features a high speed and low power consumption CMOS A/D converter, analog input buffer, clock buffer,
latch and high speed bipolar D/A converter designed to fully enhance the performance of A/D and D/A
converters.
Block Diagram
V OUT
ANALOG CIRCUIT
MOUNT PORTION
8
V REF
8
ANALOG INPUT
BUFFER/DRIVER
V IN
CLOCK
BUFFER
Unnecessary during
self-bias usage
ANALOG CIRCUIT
MOUNT PORTION
OSC
SW
CLOCK
GND +5V –5V
Characteristics
• Resolution
8bit
• Maximum conversion rate
• Digital input level
20MHz
TTL level
±5.0V
• Supply voltage
Supply voltage
Item
Min.
Typ.
Max.
Unit
mA
+5V
–5V
150
20
Analog input
AC input voltage
Item
Min.
0.5
0
Typ.
Max.
Unit
V
Gain (VIN = 2Vp-p input)
Offset voltage
2
5
Clock input
TTL compatible
Pulse width
TCW1 25ns (min.)
TCW0 25ns (min.)
– 11 –
CXD1175AM/AP
Analog Output (CXA1106)
(RL > 10kΩ)
Item
Min.
0.9
Typ.
1.0
Max.
1.1
Unit
V
Analog output
Output Format (CXD1175A)
The table shows the output format of A/D converter.
Input signal
voltage
Digital output code
MSB LSB
Step
VRT
:
:
:
:
0
:
127
128
:
1
1
1 1
1
1
1 1
:
:
1
0
0
1
0 0
1 1
0
1
0
1
0 0
1 1
VRB
255
0
0
0 0
0
0
0 0
Timing Chart
Analog input
Tpw0
External clock
AD clock
Tpw1
Tdc
tPD (AD)
AD output
tDD
Latch output
DA input
ts
th
DA clock
DA output
tPD (DA)
Item
Symbol
Min.
25
Typ.
18
Max.
Unit
ns
ns
ns
ns
ns
ns
ns
ns
Clock high time
Clock low time
Clock delay
TPW1
TPW0
25
Tdc
24
30
17
Data delay AD
t
t
t
PD (AD)
Data delay (latch)
Set up time
DD
S
10
2
Hold time
th
Data delay DA
t
PD (DA)
11
– 12 –
CXD1175AM/AP
( I N V B u f f e r )
7 4 S 0 4 o r 7 4 H C 0 4
C X A 1 1 0 6 ( D A C )
C X D 1 1 7 5 A ( A D C )
D D D V
D D A V
G N D
+ 5 V
– 5 V
– 13 –
CXD1175AM/AP
List of Parts
transistor
Q1
Q2
Q3
Q4
resistor
R1
R2
R3
R4
R5
R6
R7
2SC2785
2SC2785
2SC2785
2SC2785
2SC2785
51Ω
120Ω
680Ω
510Ω
390Ω
2.2kΩ
75Ω
Q5
IC
IC1
IC2
IC3
74S174
74S174
74S04
R8
R9
2.2kΩ
510Ω
510Ω
75Ω
100Ω
10kΩ
2kΩ
R10
R11
VR1
VR2
VR3
VR4
VR5
oscillator
OSC
others
connector BNC071
SW AT1D2M3
2kΩ
5kΩ
capacitor
C1
C2
470µF/6.3V (chemical)
22µF/16V (chemical)
0.01µF
C3
C4
C5
10µF/16V (tamtalate)
0.1µF
C6
0.1µF
C7
0.1µF
C8
0.1µF
C9
0.1µF
C10
C11
C12
C13
C14
0.1µF
47µF/10V (chemical)
47µF/10V (chemical)
47µF/10V (chemical)
0.1µF
Method of Adjustment
1. Vgain (VR1)
Gain adjustment of the analog input.
2. Voffset (VR2)
Offset adjustment of the analog input.
3. Vref (VR3, VR4)
Adjustment of the A/D converter reference voltage.
VRB is adjusted at VR3, and VRT at VR4. Reference voltage is given with self-bias for PCB shipment.
4. Analog output gain (VR5)
Full-scale voltage of the D/A converter output is adjusted.
– 14 –
CXD1175AM/AP
Points on the PCB Pattern Layout
1. Layout so that digital current does not flow to analog GND (part 1).
(See Component Side on page 19 for part 1.)
2. Capacitor C6 (between AVSS and AVDD) and capacitor C14 (between DVSS and DVDD) are important
factors to enhance the CXD1175A performance. Those capacitors should feature good high frequency
characteristics over 0.1µF (ceramic capacitor). Layout as close to the IC as possible.
3. Analog GND (AVSS) and Digital GND (DVSS) have a common voltage and a supply source. The DVSS of
A/D converter (part 2) location as close to the voltage source is possible will give even better results. That
is, a layout where the A/D converter is close to the voltage source is recommended. (See Component Side
on page 19 for part 2.)
4. AVDD (Pins 14, 15 and 18) and DVDD (Pins 11 and 13) are provided in the CXD1175A, and a common
voltage source should be used for them as for part 3. (See the paragraph for Latch Up Prevention.) (See
Soldering Side on page 19 for part 3.)
5. The A/D converter samples analog signals at the falling edge of clock. Accordingly, clocks fed to the A/D
converter should not be affected by jitter.
6. In this PCB, to evaluate A/D and D/A converters independently, an independent layout has been adopted
for the analog GND of A/D and D/A converters, from the voltage generation source. For the user’s actual
PCB even a common source poses no problems. For the CXA1106, as analog signals are output with the
supply voltage as reference, take care not to let noise interfere with the analog VDD of D/A converter.
– 15 –
CXD1175AM/AP
Notes on Operation
1. Reference voltage
The self-bias function where VRT = 2.6V and VRB = 0.6V is available by shorting VRT and VRTS, VRB and
VRBS in the CXD1175A. At the PCB, either self-bias or external reference voltage can be selected
according to the way the jumper wire is connected. For shipment, the reference voltage is provided by the
self-bias. Also, when reference voltage is to be provided from the exterior, adjust the dynamic range (VRT –
VRB) to 1.8Vp-p or over.
2. Clock input
There are two modes for the PCB clock input.
1) Through an external signal generator (external clock)
2) Using a crystal oscillator (internal clock)
These two modes can be selected with a switch on the PCB.
They are given from the external clock for shipment.
3. Peripheral through hole
There is a number of through holes at the analog input, output and LOGIC areas. Those are used when
additional circuits are to be mounted on the PCB circuit.
4
The two latch ICs (74S174) on the circuit diagram are not absolutely necessary for the A/D and D/A
converter evaluation. That is, when the A/D converter output data is directly input to D/A converter input,
normal operation is maintained. However, as A/D converter output data is hardly ever subject to D/A
conversion without the digital signal processing, the PCB has been fitted with the 74S174 to show a layout
example for digital signal processing IC.
5. Analog input buffer & driver block is designed to handle conventional video band signals. Accordingly, for
tests involving frequencies higher than that, methods shown in the figure below are recommended.
R7 75Ω
V IN
19
50Ω
D1175A
S.G.
High frequency input measurement circuit
– 16 –
CXD1175AM/AP
Latch Up Prevention
The CXD1175A is a CMOS IC which requires latch up precautions. Latch up is mainly generated by the lag in
the voltage rising time of AVDD (Pins 14, 15 and 18) and DVDD (Pins 11 and 13), when power supply is ON.
1. Correct usage
a. When analog and digital supplies are from different sources
DVDD
AVDD
18
13
11
14 15
AVDD
DVDD
C14
+5V
+5V
CXD1175A
C6
DIGITAL IC
AVSS
DVSS
20 21
2
24
AVSS
DVSS
b. When analog and digital supplies are from a common source
(i)
DVDD
18
13
11
14 15
AVDD
DVDD
C14
+5V
CXD1175A
DIGITAL IC
C6
AVSS
DVSS
20 21
2
24
AVSS
DVSS
(ii)
DVDD
18
13
11
14 15
AVDD
DVDD
C14
+5V
CXD1175A
DIGITAL IC
C6
AVSS
DVSS
20 21
2
24
AVSS
DVSS
– 17 –
CXD1175AM/AP
2. Example when latch up easily occurs
a. When analog and digital supplies are from different sources
DVDD
AVDD
18
13
11
14 15
AVDD
DVDD
+5V
+5V
CXD1175A
C6
DIGITAL IC
AVSS
DVSS
20 21
2
24
AVSS
DVSS
b. When analog and digital supplies are from common source
(i)
DVDD
AVDD
18
13
11
14 15
AVDD
DVDD
+5V
CXD1175A
DIGITAL IC
C6
AVSS
DVSS
20 21
2
24
AVSS
DVSS
(ii)
DVDD
AVDD
18
13
14 15
11
AVDD
DVDD
+5V
CXD1175A
DIGITAL IC
AVSS
DVSS
20 21
2
24
AVSS
DVSS
– 18 –
CXD1175AM/AP
Silk Side
Component side
1
Soldering side
– 19 –
CXD1175AM/AP
Package Outline
CXD1175AM
Unit: mm
24PIN SOP (PLASTIC)
+ 0.4
15.0 – 0.1
+ 0.4
1.85 – 0.15
24
13
0.15
+ 0.2
0.1 – 0.05
1
0.45 ± 0.1
12
+ 0.1
0.2 – 0.05
1.27
± 0.12
M
PACKAGE STRUCTURE
MOLDING COMPOUND
EPOXY/PHENOL RESIN
SOLDER PLATING
COPPER ALLOY / 42ALLOY
0.3g
LEAD TREATMENT
LEAD MATERIAL
SONY CODE
EIAJ CODE
SOP-24P-L01
SOP024-P-0300-A
JEDEC CODE
PACKAGE WEIGHT
CXD1175AP
24PIN DIP(PLASTIC)
+ 0.4
30.2 – 0.1
24
13
0° to 15°
1
12
2.54
Two kinds of package surface:
1.All mat surface type.
2.All mirror surface type.
0.5 ± 0.1
1.2 ± 0.15
PACKAGE STRUCTURE
PACKAGE MATERIAL
LEAD TREATMENT
LEAD MATERIAL
EPOXY RESIN
SOLDER PLATING
42/COPPER ALLOY
2.0g
SONY CODE
EIAJ CODE
DIP-24P-01
DIP024-P-0400
JEDEC CODE
PACKAGE MASS
– 20 –
相关型号:
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