AD7868BNZ [ROCHESTER]

SPECIALTY ANALOG CIRCUIT, PDIP24, 0.300 INCH, PLASTIC, DIP-24;
AD7868BNZ
型号: AD7868BNZ
厂家: Rochester Electronics    Rochester Electronics
描述:

SPECIALTY ANALOG CIRCUIT, PDIP24, 0.300 INCH, PLASTIC, DIP-24

光电二极管
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2
LC MOS  
a
Complete, 12-Bit Analog I/O System  
AD7868  
FEATURES  
FUNCTIO NAL BLO CK D IAGRAM  
Com plete 12-Bit I/ O System , Com prising:  
12-Bit ADC w ith Track/ Hold Am plifier  
83 kHz Throughout Rate  
72 dB SNR  
12-Bit DAC w ith Output Am plifier  
3 s Settling Tim e  
V
DD  
RI DAC  
R
R
72 dB SNR  
V
OUT  
12-BIT  
DAC  
On-Chip Voltage Reference  
Operates from ؎5 V Supplies  
Low Pow er – 130 m W typ  
Sm all 0.3" Wide DIP  
LDAC  
TFS  
TCLK  
DT  
DAC 3V  
REFERENCE  
RO DAC  
RO ADC  
DAC SERIAL  
INTERFACE  
ADC 3V  
REFERENCE  
CONTROL  
APPLICATIONS  
RFS  
RCLK  
Digital Signal Processing  
Speech Recognition and Synthesis  
Spectrum Analysis  
High Speed Modem s  
DSP Servo Control  
ADC SERIAL  
INTERFACE  
DR  
R
R
CLK  
CLOCK  
12-BIT  
ADC  
V
IN  
CONVST  
TRACK/HOLD  
AGND  
AD7868  
V
DGND  
GENERAL D ESCRIP TIO N  
SS  
T he AD7868 is a complete 12-bit I/O system containing a DAC  
and an ADC . T he ADC is a successive approximation type  
with a track-and-hold amplifier having a combined throughput  
rate of 83 kHz. T he DAC has an output buffer amplifier with a  
settling time of 3 µs to 12 bits. T emperature compensated 3 V  
buried Zener references provide precision references for the  
DAC and ADC.  
P RO D UCT H IGH LIGH TS  
1. Complete 12-Bit I/O System.  
T he AD7868 contains a 12-bit ADC with a track-and-hold  
amplifier and a 12-bit DAC with output amplifier. Also  
included are separate on-chip voltage references for the DAC  
and the ADC.  
Interfacing to both the DAC and ADC is serial, minimizing pin  
count and giving a small 24-pin package size. Standard control  
signals allow serial interfacing to most DSP machines. Asyn-  
chronous ADC conversion control and DAC updating is made  
possible with the CONVST and LDAC logic inputs.  
2. Dynamic Specifications for DSP Users.  
In addition to traditional dc specifications, the AD7868 is  
specified for ac parameters including signal-to-noise ratio  
and harmonic distortion. T hese parameters along with im-  
portant timing parameters are tested on every device.  
T he AD7868 operates from ±5 V power supplies, the analog in-  
put/output range of the ADC/DAC is ±3 V. T he part is fully  
specified for dynamic parameters such as signal-to-noise ratio  
and harmonic distortion as well as traditional dc specifications.  
3. Small Package.  
T he AD7868 is available in a 24-pin DIP and a 28-pin SOIC  
package.  
T he part is available in a 24-pin, 0.3" wide, plastic or hermetic  
dual-in-line package (DIP) and in a 28-pin, plastic SOIC  
package.  
REV. B  
Inform ation furnished by Analog Devices is believed to be accurate and  
reliable. However, no responsibility is assum ed by Analog Devices for its  
use, nor for any infringem ents of patents or other rights of third parties  
which m ay result from its use. No license is granted by im plication or  
otherwise under any patent or patent rights of Analog Devices.  
© Analog Devices, Inc., 1996  
One Technology Way, P.O. Box 9106, Norw ood, MA 02062-9106, U.S.A.  
Tel: 617/ 329-4700  
Fax: 617/ 326-8703  
AD7868–SPECIFICATIONS  
(V = +5 V ؎ 5%, V = –5 V ؎ 5%, AGND = DGND = 0 V, fCLK = 2.0 MHz external. All specifications TMIN to T  
MAX-  
DD  
SS  
unless otherwise noted.)  
ADC SECTION  
A
B
T
P aram eter  
Version1 Version1 Version1 Units  
Test Conditions/Com m ents  
DYNAMIC PERFORMANCE2  
Signal-to-Noise Ratio3, 4 (SNR) @ +25°C  
T MIN to T MAX  
70  
70  
–78  
72  
71  
–78  
70  
70  
–76  
dB min  
dB min  
dB max  
VIN = 10 kHz Sine Wave, fSAMPLE = 83 kHz  
T ypically 71.5 dB for 0 < VIN < 41.5 kHz  
VIN = 10 kHz Sine Wave, fSAMPLE = 83 kHz  
T ypically 71.5 dB for 0 < VIN < 41.5 kHz  
VIN = 10 kHz Sine Wave, fSAMPLE = 83 kHz  
T ypically 71.5 dB for 0 < VIN < 41.5 kHz  
T otal Harmonic Distortion (T HD)  
Peak Harmonic or Spurious Noise  
–78  
–78  
–76  
dB max  
Intermodulation Distortion (IMD)  
Second Order T erms  
T hird Order T erms  
–78  
–80  
2
–78  
–80  
2
–76  
–78  
2
dB max  
dB max  
µs max  
fa = 9 kHz, fb = 9.5 kHz, fSAMPLE = 50 kHz  
fa = 9 kHz, fb = 9.5 kHz, fSAMPLE = 50 kHz  
T rack/Hold Acquisition T ime  
DC ACCURACY  
Resolution  
12  
12  
12  
Bits  
Minimum Resolution  
Integral Nonlinearity  
Integral Nonlinearity  
Differential Nonlinearity  
Bipolar Zero Error  
Positive Gain Error5  
Negative Gain Error5  
12  
±12  
12  
±12  
±1  
±0.9  
±5  
±5  
12  
±12  
±1  
±0.9  
±5  
±5  
Bits  
No Missing Codes Are Guaranteed  
LSB typ  
LSB max  
LSB max  
LSB max  
LSB max  
LSB max  
±0.9  
±5  
±5  
±5  
±5  
±5  
ANALOG INPUT  
Input Voltage Range  
Input Current  
±3  
±1  
±3  
±1  
±3  
±1  
Volts  
mA max  
REFERENCE OUT PUT6  
RO ADC @ +25°C  
2.99/3.01 2.99/3.01 2.99/3.01 V min/V max  
RO ADC T C  
RO ADC T C  
Reference Load Sensitivity (RO ADC vs. I)  
±25  
±25  
±40  
–1.5  
±25  
±50  
–1.5  
ppm/°C typ  
ppm/°C max  
mV max  
–1.5  
Reference Load Current Change (0 µA–500 µA),  
Reference Load Should Not Be Changed  
During Conversion  
LOGIC INPUTS (CONVST, CLK, CONTROL)  
Input High Voltage, VINH  
Input Low Voltage, VINL  
2.4  
0.8  
±10  
±10  
10  
2.4  
0.8  
±10  
±10  
10  
2.4  
0.8  
±10  
±10  
10  
V min  
VDD = 5 V ± 5%  
VDD = 5 V ± 5%  
VIN = 0 V to VDD  
VIN = VSS to DGND  
V max  
µA max  
µA max  
pF max  
Input Current, IIN  
Input Current7 (CONT ROL Input Only)  
8
Input Capacitance, CIN  
LOGIC OUT PUT S  
DR, RFS Outputs  
Output Low Voltage, VOL  
RCLK Output  
Output Low Voltage, VOL  
DR, RFS, RCLK Outputs  
Floating-State Leakage Current  
Floating-State Output Capacitance8  
0.4  
0.4  
0.4  
0.4  
0.4  
0.4  
V max  
V max  
ISINK = 1.6 mA, Pull-Up Resistor = 4.7 kΩ  
ISINK = 2.6 mA, Pull-Up Resistor = 2 kΩ  
±10  
15  
±10  
15  
±10  
15  
µA max  
pF max  
CONVERSION T IME  
External Clock  
Internal Clock  
10  
10  
10  
10  
10  
10  
µs max  
µs max  
T he Internal Clock Has a Nominal Value of 2.0 MHz  
POWER REQUIREMENT S  
For Both DAC and ADC  
VDD  
VSS  
IDD  
ISS  
+5  
–5  
22  
12  
+5  
–5  
22  
12  
+5  
–5  
25  
13  
V nom  
V nom  
mA max  
mA max  
±5% for Specified Performance  
±5% for Specified Performance  
Cumulative Current from the T wo VDD Pins  
Cumulative Current from the T wo VSS Pins  
T otal Power Dissipation  
170  
170  
190  
mW max  
T ypically 130 mW  
NOT ES  
1T emperature ranges are as follows: A/B Versions, –40°C to +85°C; T Version, –55°C to +125°C.  
2VIN = ±3 V  
3SNR calculation includes distortion and noise components.  
4SNR degradation due to asynchronous DAC updating during conversion is 0.1 dB typ.  
5Measured with respect to internal reference.  
6For capacitive loads greater than 50 pF a series resistor is required (see INT ERNAL REFERENCE section).  
7T ying the CONT ROL input to VDD places the device in a factory test mode where normal operation is not exhibited.  
8Sample tested @ +25°C to ensure compliance.  
Specifications subject to change without notice.  
–2–  
REV. B  
AD7868  
(V = +5 V ؎ 5%, V = –5 V ؎ 5%, AGND = DGND = 0 V, RI DAC = +3 V and decoupled as shown in Figure 2, V  
OUT  
DD  
SS  
DAC SECTION  
Load to AGND; R = 2 k, C = 100 pF. All specifications TMIN to TMAX unless otherwise noted.)  
L
L
A
B
T
P aram eter  
Version1 Version1 Version1  
Units  
Test Conditions/Com m ents  
DYNAMIC PERFORMANCE2  
Signal-to-Noise Ratio3 (SNR) @ +25°C  
T MIN to T MAX  
70  
70  
–78  
72  
71  
–78  
70  
70  
–76  
dB min  
dB min  
dB max  
VOUT = 1 kHz Sine Wave, fSAMPLE = 83 kHz  
T ypically 71.5 dB at +25°C for 0 < VOUT < 20 kHz4  
VOUT = 1 kHz Sine Wave, fSAMPLE = 83 kHz  
T otal Harmonic Distortion (T HD)  
T ypically –84 dB at +25°C for 0 < VOUT < 20 kHz4  
VOUT = 1 kHz Sine Wave, fSAMPLE = 83 kHz  
Peak Harmonic or Spurious Noise  
–78  
–78  
–76  
dB max  
T ypically –84 dB at +25°C for 0 < VOUT < 20 kHz4  
DC ACCURACY  
Resolution  
12  
12  
12  
Bits  
Integral Nonlinearity  
Integral Nonlinearity  
Differential Nonlinearity  
Bipolar Zero Error  
±1/2  
±1/2  
±1  
±0.9  
±5  
±5  
±5  
±1/2  
±1  
±0.9  
±5  
±5  
±5  
LSB typ  
LSB max  
LSB max  
LSB max  
LSB max  
LSB max  
±0.9  
±5  
±5  
Guaranteed Monotonic  
Positive Full-Scale Error5  
Negative Full-Scale Error5  
±5  
REFERENCE OUT PUT6  
RO ADC @ +25°C  
RO ADC T C  
RO ADC T C  
Reference Load Change (RO DAC vs. I)  
2.99/3.01 2.99/3.01 2.99/3.01  
V min/V max  
ppm/°C typ  
ppm/°C max  
mV max  
±25  
±25  
±40  
–1.5  
±25  
±50  
–1.5  
–1.5  
Reference Load Current Change (0–500 µA)  
REFERENCE INPUT  
RI DAC Input Range  
Input Current  
2.85/3.15 2.85/3.15 2.85/3.15  
V min/V max 3 V ± 5%  
µA max  
1
1
1
LOGIC INPUT S (LDAC, TFS, T CLK, DT )  
Input High Voltage, VINH  
Input Low Voltage, VINL  
2.4  
0.8  
±10  
10  
2.4  
0.8  
±10  
10  
2.4  
0.8  
±10  
10  
V min  
VDD = 5 V ± 5%  
VDD = 5 V ± 5%  
VIN = 0 V to VDD  
V max  
µA max  
pF max  
Input Current, IIN  
Input Capacitance, CIN  
7
ANALOG INPUT  
Output Voltage Range  
dc Output Impedance  
Short-Circuit Current  
±3  
0.3  
20  
±3  
0.3  
20  
±3  
0.3  
20  
V nom  
typ  
mA typ  
AC CHARACT ERIST ICS7  
Voltage Output Settling-T ime  
Positive Full-Scale Change  
Negative Full-Scale Change  
Digital-to-Analog Glitch Impulse  
Digital Feedthrough  
Settling T ime to Within ±1/2 LSB of Final Value  
T ypically 2 µs  
T ypically 2.5 µs  
3
3
10  
2
100  
3
3
10  
2
100  
3
3
10  
2
100  
µs max  
µs max  
nV secs typ  
nV secs typ  
dB typ  
DAC Code Change All 1s to All 0s  
VIN to VOUT Isolation  
VIN = ±3 V, 41.5 kHz Sine Wave  
POWER REQUIREMENT S  
As per ADC Section  
NOT ES  
1T emperature ranges are as follows: A/B Versions, –40°C to +85°C; T Version, –55°C to +125°C.  
2VOUT (pk–pk) = ±3 V.  
3SNR calculation includes distortion and noise components.  
4Using external sample and hold.  
O RD ERING GUID E  
Relative  
5Measured with respect to RI DAC and includes bipolar offset error.  
6For capacitive loads greater than 50 pF a series resistor is required  
(see INT ERNAL REFERENCE section).  
Tem perature  
Range  
Accuracy P ackage  
(LSB)  
7Sample tested @ +25°C to ensure compliance.  
Model  
SNR  
O ption*  
Specifications subject to change without notice.  
AD7868AN  
–40°C to +85°C 70 dB  
–40°C to +85°C 70 dB  
–40°C to +85°C 72 dB  
–40°C to +85°C 72 dB  
–40°C to +85°C 70 dB  
–40°C to +85°C 72 dB  
±1/2 typ  
±1/2 typ  
±1 max  
±1 max  
±1/2 typ  
±1 max  
N-24  
Q-24  
N-24  
Q-24  
R-28  
R-28  
AD7868AQ  
AD7868BN  
AD7868BQ  
AD7868AR  
AD7868BR  
*N = Plastic DIP; Q = Cerdip; R = SOIC (Small Outline IC).  
REV. B  
–3–  
AD7868  
TIMING CHARACTERISTICS  
1, 2  
(V = +5 V ؎ 5%, V = –5 V ؎ 5%, AGND = DGND = 0 V)  
DD  
SS  
Lim it at TMIN, TMAX  
(A, B Versions)  
Lim it at TMIN, TMAX  
(T Version)  
P aram eter  
Units  
Conditions/Com m ents  
ADC T IMING  
t1  
t2  
t3  
t4  
50  
440  
100  
20  
100  
155  
4
100  
50  
440  
100  
20  
100  
155  
4
100  
ns min  
ns min  
ns min  
ns min  
ns max  
ns max  
ns min  
ns max  
ns typ  
CONVST Pulse Width  
3
RCLK Cycle T ime, Internal Clock  
RFS to RCLK Falling Edge Setup T ime  
RCLK Rising Edge to RFS  
4
t5  
RCLK to Valid Data Delay, CL = 35 pF  
Bus Relinquish T ime after RCLK  
t6  
5
t13  
2 RCLK +200 to  
3 RCLK + 200  
2 RCLK +200 to  
3 RCLK + 200  
CONVST to RFS Delay  
DAC T IMING  
t7  
t8  
t9  
t10  
t11  
t12  
50  
75  
150  
30  
75  
40  
50  
ns min  
ns min  
ns min  
ns min  
ns min  
ns min  
TFS to T CLK Falling Edge  
T CLK Falling Edge to TFS  
T CLK Cycle T ime  
Data Valid to T CLK Setup T ime  
Data Valid to T CLK Hold T ime  
LDAC Pulse Width  
100  
200  
40  
100  
40  
6
NOT ES  
1T iming specifications are sample tested at +25°C to ensure compliance. All input signals are specified with tr = tf = 5 ns (10% to 90% of 5 V) and timed from a  
voltage level of 1.6 V.  
2Serial timing is measured with a 4.7 kpull-up resistor on DR and RFS and a 2 kpull-up resistor on RCLK . T he capacitance on all three output is 35 pF.  
3When using internal clock, RCLK mark/space ratio (measured from a voltage level of 1.6 V) range is 40/60 to 60/40. For external clock, RCLK mark/space ratio =  
external clock mark/space ratio.  
4DR will drive higher capacitance loads but this will add to t 5 since it increases the external RC time constant (4.7 k/CL) and hence the time to reach 2.4 V.  
5T ime 2 RCLK to 3 RCLK depends on conversion start to ADC clock synchronization.  
6T CLK mark/space ratio is 40/60 to 60/40.  
ABSO LUTE MAXIMUM RATINGS*  
P IN CO NFIGURATIO NS  
(T A = +25°C unless otherwise noted)  
VDD to AGND . . . . . . . . . . . . . . . . . . . . . . . . . –0.3 V to +7 V  
D IP  
SO IC  
VSS to AGND . . . . . . . . . . . . . . . . . . . . . . . . . +0.3 V to –7 V  
AGND to DGND . . . . . . . . . . . . . . . . . 0.3 V to VDD +0.3 V  
VOUT to AGND . . . . . . . . . . . . . . . . . . . . . . . . . . . VSS to VDD  
VIN to AGND . . . . . . . . . . . . . . . . VSS –0.3 V to VDD + 0.3 V  
RO ADC to AGND . . . . . . . . . . . . . . . 0.3 V to VDD + 0.3 V  
RO DAC to AGND . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V  
RI DAC to AGND . . . . . . . . . . . . . . . –0.3 V to VDD + 0.3 V  
Digital Inputs to AGND . . . . . . . . . . . –0.3 V to VDD + 0.3 V  
Digital Outputs to AGND . . . . . . . . . . –0.3 V to VDD + 0.3 V  
Operating T emperature Range  
A, B Versions . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C  
T Version . . . . . . . . . . . . . . . . . . . . . . . . . –55°C to +125°C  
Storage T emperature Range . . . . . . . . . . . . –65°C to +150°C  
Lead T emperature (Soldering, 10 secs) . . . . . . . . . . . +300°C  
Power Dissipation (Any Package) to +75°C . . . . . . . . 450 mW  
Derates above +75°C by . . . . . . . . . . . . . . . . . . . . 10 mW/°C  
1
CONTROL  
28  
27  
1
2
24  
23  
22  
21  
CONVST  
CLK  
CONTROL  
VDD  
CONVST  
CLK  
2
V
DD  
V
3
4
5
26  
25  
24  
23  
SS  
RFS  
VSS  
VIN  
3
RFS  
NC  
NC  
4
RCLK  
DR  
V
RCLK  
IN  
5
20 RO ADC  
RO ADC  
DR  
6
7
6
19  
DGND  
VDD  
AD7868  
TOP VIEW  
(Not to Scale)  
AGND  
AD7868  
TOP VIEW  
22  
21  
DGND  
AGND  
DGND  
18  
7
NC  
(Not to Scale)  
V
8
9
DD  
17 DGND  
16 TCLK  
8
AGND  
VOUT  
VSS  
TCLK  
20  
AGND  
9
V
10  
19  
18  
17  
16  
OUT  
NC  
NC  
DT  
15  
10  
11  
12  
DT  
11  
12  
NC  
RO DAC  
RI DAC  
14  
TFS  
V
SS  
13  
LDAC  
RO DAC 13  
TFS  
14  
15  
RI DAC  
LDAC  
NC = NO CONNECT  
*Stresses above those listed under “Absolute Maximum Ratings” may cause  
permanent damage to the device. T his is a stress rating only and functional  
operation of the device at these or any other conditions above those listed in the  
operational sections of this specification is not implied. Exposure to absolute  
maximum rating conditions for extended periods may affect device reliability.  
NC = NO CONNECT  
CAUTIO N  
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily  
accumulate on the human body and test equipment and can discharge without detection.  
Although the AD7868 features proprietary ESD protection circuitry, permanent damage may  
occur on devices subjected to high energy electrostatic discharges. T herefore, proper ESD  
precautions are recommended to avoid performance degradation or loss of functionality.  
WARNING!  
ESD SENSITIVE DEVICE  
REV. B  
–4–  
AD7868  
P IN FUNCTIO N D ESCRIP TIO N  
D IP P in  
Num ber  
Mnem onic  
Function  
POWER SUPPLY  
7 & 23  
10 & 22  
8 & 19  
6 &17  
VDD  
Positive Power Supply, 5 V ± 5%. Both VDD pins must be tied together.  
Negative Power Supply, –5 V ± 5%. Both VSS pins must be tied together.  
Analog Ground. Both AGND pins must be tied together.  
VSS  
AGND  
DGND  
Digital Ground. Both DGND pins must be tied together.  
ANALOG SIGNAL AND REFERENCE  
21  
VIN  
ADC Analog Input. T he ADC input range is ±3 V.  
9
VOUT  
Analog Output Voltage from DAC. T his output comes from a buffer amplifier. T he range is  
bipolar, ±3 V with RI DAC = +3 V.  
20  
11  
12  
RO ADC  
RO DAC  
RI DAC  
Voltage Reference Output. T he internal ADC 3 V reference is provided at this pin. T his output may be  
used as a reference for the DAC by connecting it to the RI DAC input. T he external load capability of  
this reference is 500 µA.  
DAC Voltage Reference Output. T his is one of two internal voltage references. T o operate the DAC  
with this internal reference, RO DAC should be connected to RI DAC. T he external load capability of  
the reference is 500 µA.  
DAC Voltage Reference Input. T he voltage reference for the DAC must be applied to this pin. It is  
internally buffered before being applied to the DAC. T he nominal reference voltage for correct  
operation of the AD7868 is 3 V.  
ADC INT ERFACE AND CONT ROL  
2
3
4
CLK  
Clock Input. An external T T L-compatible clock may be applied to this input. Alternatively, tying pin to  
VSS enables the internal laser-trimmed oscillator.  
RFS  
Receive Frame Synchronization, Logic Output. T his is an active low open-drain output which provides  
a framing pulse for serial data. An external 4.7 kpull-up resistor is required on RFS.  
RCLK  
Receive Clock, Logic Output. RCLK is the gated serial clock output which is derived from the internal  
or external ADC clock. If the CONT ROL input is at VSS the clock runs continuously. With the  
CONT ROL input at DGND the RCLK output is gated off (three-stated) after serial transmission is  
complete. RCLK is an open-drain output and requires an external 2 kpull-up resistor.  
5
DR  
Receive Data, Logic Output. T his is an open-drain data output used in conjunction with RFS and  
RCLK to transmit data from the ADC. Serial data is valid on the falling edge of RCLK when RFS is  
low. An external 4.7 kresistor is required on the DR output.  
1
CONVST  
Convert Start, Logic Input. A low to high transition on this input puts the track-and-hold amplifier into  
the hold mode and starts an ADC conversion. T his input in asynchronous to the CLK input.  
24  
CONT ROL  
Control, Logic Input. With this pin at 0 V, the RCLK is noncontinuous. With this pin at –5 V, the  
RCLK is continuous. Note, tying this pin to VDD places the part in a factory test mode where normal  
operation is not exhibited.  
DAC INT ERFACE AND CONT ROL  
14  
TFS  
T ransmit Frame Synchronization, Logic Input. T his is a frame or synchronization signal for the DAC  
with serial data expected after the falling edge of this signal.  
15  
DT  
T ransmit Data, Logic Input. T his is the data input which is used in conjunction with TFS and T CLK  
to transfer serial data to the input latch.  
16  
13  
T CLK  
T ransmit Clock, Logic Input. Serial data bits are latched on the falling edge of T CLK when TFS is low.  
LDAC  
Load DAC, Logic Input. A new word is transferred into the DAC latch from the input latch on the  
falling edge of this signal.  
No Connect.  
18  
NC  
REV. B  
–5–  
AD7868  
CO NVERTER D ETAILS  
T he operation of the track/hold amplifier is essentially transpar-  
ent to the user. T he track/hold amplifier goes from its track  
mode to its hold mode at the start of conversion on the rising  
edge of CONVST.  
T he AD7868 is a complete 12-bit I/O port, the only external  
components required for normal operation are pull-up resistors  
for the ADC data outputs and power supply decoupling capaci-  
tors. It is comprised of a 12-bit successive approximation ADC  
with a track/hold amplifier, a 12-bit DAC with a buffered output  
and two 3 V buried Zener references, a clock oscillator and con-  
trol logic.  
INTERNAL REFERENCES  
T he AD7868 has two on-chip temperature compensated buried  
Zener references which are factory trimmed to 3 V ± 10 mV.  
One reference provides the appropriate biasing for the ADC,  
while the other is available as a reference of the DAC. Both ref-  
erence outputs are available (labeled RO DAC and RO ADC)  
and are capable of providing up to 500 µA to an external load.  
AD C CLO CK  
T he AD7868 has an internal clock oscillator which can be used  
for the ADC conversion procedure. T he oscillator is enabled by  
tying the CLK input to VSS. T he oscillator in laser trimmed at  
the factory to give a conversion time of between 8.5 and 10 µs.  
T he mark/space ratio can vary from 40/60 to 60/40. Alterna-  
tively, an external T T L compatible clock may be applied to this  
input. T he allowable mark/space ratio of an external clock is  
40/60 to 60/40. RCLK is a clock output, used for the serial in-  
terface. T his output is derived directly from the ADC clock  
source and can be switched off at the end of conversion with the  
CONT ROL input.  
T he DAC input reference (RI DAC) can be stored externally or  
connected to any of the two on-chip references. Applications  
requiring good full-scale error matching between the DAC and  
the ADC should use the ADC reference as shown in Figure 4.  
T he maximum recommended capacitance on either of the refer-  
ence output pins for normal operation is 50 pF. If either of the  
reference outputs is required to drive a capacitive load greater  
than 50 pF, then a 200 resistor must be placed in series with  
the capacitive load. T he addition of decoupling capacitors,  
10 µF in parallel with 0.1 µF, as shown in Figure 2, improves  
noise performance. T he improvement in noise performance can  
be seen from the graph in Figure 3. Note, this applies for the  
DAC output only; reference decoupling components do not af-  
fect ADC performance. So, a typical application will have just  
the DAC reference source decoupled with the other one open  
circuited.  
AD C CO NVERSIO N TIMING  
T he conversion time for both external clock and continuous in-  
ternal clock can vary from 19 to 20 rising clock edges depending  
on the conversion start to ADC clock synchronization. If a con-  
version is initiated within 30 ns prior to a rising edge of the ADC  
clock, the conversion time will consist of 20 rising clock edges,  
i.e., 9.5 µs conversion time. For noncontinuous internal clock,  
the conversion time is always 19 rising clock edges.  
200Ω  
RO DAC  
or  
RO ADC*  
EXT LOAD  
AD C TRACK-AND -H O LD AMP LIFIER  
GREATER THAN 50pF  
T he track-and-hold amplifier on the analog input of the AD7868  
allows the ADC to accurately convert an input sine wave of 6 V  
peak–peak amplitude to 12-bit accuracy. T he input impedance is  
typically 9 k, an equivalent circuit is shown in Figure 1. T he  
input bandwidth of the track/hold amplifier is much greater than  
the Nyquist rate of the ADC, even when the ADC is operated at  
its maximum throughput rate. T he 0.1 dB cutoff frequency oc-  
curs typically at 500 kHz. T he track/hold amplifier acquires an  
input signal to 12-bit accuracy in less than 2 µs.  
0.1µF  
10µF  
RI DAC  
*RO DAC/RO ADC CAN BE LEFT  
OPEN CIRCUIT IF NOT USED  
Figure 2. Reference Decoupling Circuitry  
D AC O UTP UT AMP LIFIER  
T he output from the voltage-mode DAC is buffered by a nonin-  
verting amplifier. T he buffer amplifier is capable of developing  
±3 V across 2 kand 100 pF load to ground and can produce  
6 V peak-to-peak sine wave signals to a frequency of 20 kHz.  
T he output is updated on the falling edge of the LDAC input.  
T he output voltage settling time, to within 1/2 LSB of its final  
value, is typically less than 2 µs.  
TRACK/HOLD  
AMPLIFIER  
4.5kΩ  
TO INTERNAL  
COMPARATOR  
VIN  
AD7868*  
4.5kΩ  
TO INTERNAL  
3V REFERENCE  
T he small signal (200 mV p-p) bandwidth of the output buffer  
amplifier is typically 1 MHz. T he output noise from the ampli-  
fier is low with a figure of 30 nV/Hz at a frequency of 1 kHz.  
T he broadband noise from the amplifier exhibits a typical peak-  
to-peak figure of 150 µV for a 1 MHz output bandwidth. Fig-  
ure 3 shows a typical plot of noise spectral density versus fre-  
quency for the output buffer amplifier and for either of the  
on-chip references.  
*ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 1. ADC Analog Input  
T he overall throughput rate is equal to the conversion time plus  
the track/hold amplifier acquisition time. For a 2.0 MHz input  
clock the throughput time is 12 µs max.  
REV. B  
–6–  
AD7868  
the input signal is within the full dynamic range of the ADC. For  
applications which require that the input signal range match the  
full analog input dynamic range of the ADC, offset and full-scale  
errors have to be adjusted to zero.  
500  
TA = +25°C  
VDD = +5V  
VSS = –5V  
200  
100  
REF OUT  
AD C AD JUSTMENT  
Figure 6 has signal conditioning at the input and output of the  
AD7868 for trimming the end points of the transfer functions of  
both the ADC and the DAC. Offset error must be adjusted be-  
fore full-scale error. For the ADC, this is achieved by trimming  
the offset of A1 while the input voltage, V1, is 1/2 LSB below  
ground. T he trim procedure is as follows: apply a voltage of  
–0.73 mV (–1/2 LSB) at V1 in Figure 6 and adjust the offset  
voltage of A1 until the ADC output code flickers between 1111  
1111 1111 (FFF HEX) and 0000 0000 0000 (000 HEX).  
50  
DAC OUTPUT  
WITH ALL 0s  
LOADED  
REF OUT DECOUPLED  
AS SHOWN IN  
FIGURE 2  
20  
10  
50  
100  
200  
10k  
100k  
1k  
2k  
20k  
FREQUENCY – Hz  
Figure 3. Noise Spectral Density vs. Frequency  
ADC gain error can be adjusted at either the first code transi-  
tion (ADC negative full scale) or the last code transition (ADC  
positive full scale). T he trim procedures for both cases are as  
follows (see Figure 6).  
INP UT/O UTP UT TRANSFER FUNCTIO NS  
A bipolar circuit for the AD7868 is shown in Figure 4. T he ana-  
log input/output voltage range of the AD7868 is ±3 V. T he de-  
signed code transitions for the ADC occur midway between  
successive integer LSB values (i.e., 1/2 LSB, 3/2 LSB, 5/2 LSB  
. . . FS – 3/2 LSBs). T he input/output code is 2s complement  
binary with 1 LSB = FS/4096 = 1.46 mV. T he ideal transfer  
function is shown in Figure 5.  
AD C P ositive Full-Scale Adjustm ent  
Apply a voltage of 2.9978 V (FS/2 – 3/2 LSBs) at V1. Adjust R2  
until the ADC output code flickers between 0111 1111 1110  
(7FE HEX) and 0111 1111 1111 (7FF HEX).  
AD C Negative Full-Scale Adjustm ent  
Apply a voltage of –2.9993 V (–FS/2 + 1/2 LSB) at V1 and  
adjust R2 until the ADC output code flickers between 1000  
0000 0000 (800 HEX) and 1000 0000 0001 (801 HEX).  
AD7868*  
ANALOG OUTPUT  
RANGE = ±3V  
V
IN  
V
OUT  
ANALOG INPUT  
RANGE = ±3V  
RI DAC  
D AC AD JUSTMENT  
R1  
200  
Op amp A2 is included in Figure 6 for the DAC transfer func-  
tion adjustment. Again offset must be adjusted before full scale.  
T o adjust offset: load the DAC with 0000 0000 0000 (000  
HEX) and trim the offset of A2 to 0 V. As with the ADC adjust-  
ment, gain error can be adjusted at either the first code transi-  
tion (DAC negative full scale) or the last code transition (DAC  
positive full scale). T he trim procedures for both cases are as  
follows:  
RO ADC  
C2  
0.1µF  
C1  
10µF  
AGND  
*ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 4. AD7868 Basic Bipolar Operation Using RO ADC  
as a Reference Input for the DAC  
D AC P ositive Full-Scale Adjustm ent  
OUTPUT  
CODE  
Load the DAC with 0111 1111 1111 (7FF HEX) and adjust R7  
until the op amp output voltage is equal to 2.9985 V, (FS/2 –  
1 LSB).  
011...111  
011...110  
D AC Negative Full-Scale Adjustm ent  
Load the DAC with 1000 0000 0000 (800 HEX) and adjust R7  
until the op amp output voltage is equal to 3.0 V (–FS/2).  
000...010  
-FS  
000...001  
2
V1  
000...000  
+
FS  
INPUT VOLTAGE  
RANGE = ±3V  
-1LSB  
111...111  
2
111...110  
FS = 6V  
FS  
4096  
R1  
10k  
1LSB =  
100...001  
100...000  
R2  
500  
A1  
VIN  
VOUT  
R3  
10k  
0V  
R6  
10k  
R4  
10k  
INPUT VOLTAGE  
AD7868*  
R5  
10k  
V0  
OUTPUT VOLTAGE  
RANGE = ± 3V  
Figure 5. AD7868 Input/Output Transfer Function  
R7  
500  
A2  
AGND  
R8  
10k  
O FFSET AND FULL-SCALE AD JUSTMENT  
In most digital signal processing (DSP) applications, offset and  
full-scale errors have little or no effect on system performance.  
Offset error can always be eliminated in the analog domain by  
ac coupling. Full-scale errors do not cause problems as long as  
R9  
10k  
R10  
10k  
*ADDITIONAL PINS  
OMITTED FOR CLARITY  
Figure 6. AD7868 with Input/Output Adjustm ent  
REV. B  
–7–  
AD7868  
TIMING AND CO NTRO L  
serial clock which runs continuously. Both options are available  
on the AD7868 ADC. With the CONTROL input at 0 V, RCLK  
is noncontinuous and when it is at –5 V, RCLK is continuous.  
Communication with the AD7868 is managed by 6 dedicated  
pins. T hese consist of separate serial clocks, word framing or  
strobe pulses and data signals for both receiving and transmit-  
ting data. Conversion starts and DAC updating are controlled  
by two digital inputs; CONVST and LDAC. T hese inputs can  
be asserted independently of the microprocessor by an external  
timer when precise sampling intervals are required. Alterna-  
tively, the LDAC and CONVST can be driven from a decoded  
address bus allowing the microprocessor control over conversion  
start and DAC updating as well as data communication to the  
AD7868.  
D AC Tim ing  
T he AD7868 DAC contains two latches, an input latch and a  
DAC latch. Data must be loaded to the input latch under the  
control of the T CLK, TFS and DT serial logic inputs. Data is  
then transferred from the input latch to the DAC latch under  
the control of the LDAC signal. Only the data in the DAC latch  
determines the analog output of the AD7868.  
Data is loaded to the input latch under control of T CLK, TFS  
and DT . T he AD7868 DAC expects a 16-bit stream of serial  
data on its DT input. Data must be valid on the falling edge of  
T CLK. T he TFS input provides the frame synchronization sig-  
nal which tells the AD7868 DAC that valid serial data will be  
available for the next 16 falling edges of T CLK. Figure 8 shows  
the timing diagram for the serial data format.  
AD C Tim ing  
Conversion control is provided by the CONVST input. A low to  
high transition on CONVST input starts conversion and drives  
the track/hold amplifier into its hold mode. Serial data then be-  
comes available while conversion is in progress. T he correspond-  
ing timing diagram is shown in Figure 7. T he word length is 16  
bits; 4 leading zeros, followed by the 12-bit conversion result  
starting with the MSB. T he data is synchronized to the serial  
clock output (RCLK) and is framed by the serial strobe (RFS).  
Data is clocked out on a low to high transition of the serial clock  
and is valid on the falling edge of this clock while the RFS out-  
put is low. RFS goes low at the start of conversion and the first  
serial data bit (which is the first leading zero) is valid on the first  
falling edge of RCLK. All the ADC serial lines are open-drain  
outputs and require external pull-up resistors.  
Although 16 bits of data are clocked into the input latch, only  
12 bits are transferred into the DAC latch. T herefore, 4 bits in  
the stream are don’t cares since their value does not affect the  
DAC latch data. T he bit positions are 4 don’t cares followed by  
the 12-bit DAC data starting with the MSB.  
T he LDAC signal controls the transfer of data to the DAC  
latch. Normally, data is loaded to the DAC latch on the falling  
edge of LDAC. However, if LDAC is held low, then serial data  
is loaded to the DAC latch on the sixteenth falling edge of  
T CLK. If LDAC goes low during the loading of serial data to  
the input latch, no DAC latch update takes place on the falling  
edge of LDAC. If LDAC stays low until the serial transfer is  
completed, then the update takes place on the sixteenth falling  
edge of T CLK. If LDAC returns high before the serial data  
transfer is completed, no DAC latch update takes place.  
T he serial clock out is derived from the ADC master clock  
source which may be internal or external. Normally, RCLK is  
required during the serial transmission only. In these cases it can  
be shut down (i.e., placed into high impedance) at the end of  
conversion to allow multiple ADCs to share a common serial  
bus. However, some serial systems (e.g., T MS32020) require a  
CONVERSION TIME  
t1  
CONVST  
t13  
1
RFS  
t3  
t2  
t4  
2, 3  
RCLK  
t5  
t6  
1
DB11  
DB10  
DB9  
DB1  
DB0  
DR  
NOTES  
1
EXTERNAL 4.7k  
PULL-UP RESISTOR  
2
3
EXTERNAL 2k  
PULL-UP RESISTOR  
CONTINUOUS RCLK (DASHED LINE) WHEN THE CONTROL INPUT = –5V AND  
NONCONTINUOUS WHEN THE CONTROL INPUT = 0V  
Figure 7. ADC Control Tim ing Diagram  
t
t
7
8
TFS  
t
9
TCLK  
DT  
t
11  
t
10  
DON'T DON'T DON'T DON'T  
CARE CARE CARE CARE  
DB11 DB10  
DB1  
DB0  
Figure 8. DAC Control Tim ing Diagram  
–8–  
REV. B  
AD7868  
AD 7868 D YNAMIC SP ECIFICATIO NS  
Figure 10 shows a typical plot of effective number of bits versus  
frequency for an AD7868BQ with a sampling frequency of  
83 kHz. T he effective number of bits typically falls between 11.7  
and 11.85 corresponding to SNR figures of 72.2 and 73.1 dB.  
T he AD7868 is specified and 100% tested for dynamic perfor-  
mance specifications as well as traditional dc specifications such  
as integral and differential nonlinearity. T hese ac specifications  
are required for signal processing applications such as speech  
recognition, spectrum analysis, and high-speed modems. T hese  
applications require information on the converter’s effect on the  
spectral content of the input signal. Hence, the parameters for  
which the AD7868 is specified include SNR, harmonic distor-  
tion and peak harmonics. T hese terms are discussed in more de-  
tail in the following sections.  
Signal-to-Noise Ratio (SNR)  
SNR is the measured signal-to-noise ratio at the output of the  
ADC or DAC. T he signal is the rms magnitude of the funda-  
mental. Noise is the rms sum of all the nonfundamental signals  
up to half the sampling frequency (fs/2) excluding dc. SNR is  
dependent upon the number of levels used in the quantization  
process; the more levels, the smaller the quantization noise. T he  
theoretical signal-to-noise ratio for a sine wave input is given by  
SNR = (6.02N + 1.76) dB  
(1)  
where N is the number of bits. T hus for an ideal 12-bit con-  
verter, SNR = 74 dB.  
Figure 9. AD7868, ADC FFT Plot  
12  
Effective Num ber of Bits  
T he formula given in Equation 1 relates the SNR to the number  
of bits. Rewriting the formula, as in Equation 2, it is possible to  
get a measure of performance expressed in effective number of  
bits (N).  
11.5  
11  
SNR 1.76  
N =  
(2)  
6.02  
T he effective number of bits for a device can be calculated di-  
rectly from its measured SNR.  
SAMPLE FREQUENCY = 83 kHz  
10.5  
T
= 25°C  
A
H ar m onic D istor tion  
Harmonic distortion is the ratio of the rms sum of harmonics to  
the fundamental. For the AD7868, total harmonic distortion  
(T HD) is defined as  
10  
0
41.5  
INPUT FREQUENCY – kHz  
2
2
2
2
2
Figure 10. Effective Num ber of Bits vs. Frequency for the  
ADC  
V2 +V3 +V4 +V5 +V6  
THD = 20 log  
V1  
D AC Testing  
where V1 is the rms amplitude of the fundamental and V2, V3,  
V4, V5 and V6 are the rms amplitudes of the second through to  
the sixth harmonic. T he T HD is also derived from the FFT plot  
of the ADC or DAC output spectrum.  
A simplified diagram of the method used to test the dynamic  
performance specifications of the DAC is outlined in Figure 11.  
Data is loaded to the DAC under control of the microcontroller  
and associated logic. T he output of the DAC is applied to a 9th  
order low-pass filter whose cutoff frequency corresponds to the  
Nyquist limit. T he output of the filter is in turn applied to a  
16-bit accurate digitizer. T his digitizes the signal and the micro-  
controller generates an FFT plot from which the dynamic per-  
formance of the DAC can be evaluated.  
AD C Testing  
T he output spectrum from the ADC is evaluated by applying a  
sine-wave signal of very low distortion to the VIN input which is  
sampled at an 83 kHz sampling rate. A Fast Fourier T ransform  
(FFT ) plot is generated from which the SNR data can be ob-  
tained. Figure 9 shows a typical 2048 point FFT plot of the  
AD7868BQ ADC with an input signal of 10 kHz and a sam-  
pling frequency of 83 kHz. T he SNR obtained from this graph  
is 73 dB. It should be noted that the harmonics are taken into  
account when calculating the SNR.  
REV. B  
–9–  
AD7868  
quencies at an update rate of 83 kHz. T he plot of Figure 14 is  
without a sample-and-hold on the DAC output while the plot of  
Figure 15 is generated with a sample-and-hold on the output.  
LOW-PASS  
FILTER  
AD7868  
DAC  
MICRO-  
CONTROLLER  
16-BIT  
DIGITIZER  
R2  
2k2  
C9  
330pF  
Figure 11. AD7868 DAC Dynam ic Perform ance Test Circuit  
ADG201HS  
R1  
T he digitizer sampling is synchronized with the DAC update  
rate to ease FFT calculations. T he digitizer samples the DAC  
output after the output has settled to its new value. T herefore, if  
the digitizer were to sample the output directly it would effec-  
tively be sampling a dc value each time. As a result, the dynamic  
performance of the DAC would not be measured correctly. Us-  
ing the digitizer directly on the DAC output would give better  
results than the actual performance of the DAC. Using a filter  
between the DAC and the digitizer means that the digitizer  
samples a continuously moving signal and the true dynamic per-  
formance of the AD7868 DAC output is measured.  
2k2  
V
OUT  
AD7868*  
S1  
D1  
AD711  
LDAC  
IN1  
1µs  
ONE  
SHOT  
DELAY  
Q
LDAC  
*ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 13. DAC Sam ple-and-Hold Circuit  
80  
Figure 12 shows a typical 2048 point Fast Fourier T ransform  
plot for the AD7868 DAC with an update rate of 83 kHz and an  
output frequency of 1 kHz. T he SNR obtained from the graph is  
73 dBs.  
70  
60  
50  
40  
30  
20  
10  
0
T
= +25°C  
A
0
1
2
3
4
5
FREQUENCY – kHz  
Figure 14. DAC Perform ance vs. Frequency (No Sam ple-  
and-Hold)  
80  
70  
60  
50  
40  
30  
20  
Figure 12. AD7868 DAC FFT Plot  
Some applications will require improved performance versus fre-  
quency from the AD7868 DAC. In these applications, a simple  
sample-and-hold circuit such as that outlined in Figure 13 will  
extend the very good performance of the DAC to 20 kHz. Other  
applications will already have an inherent sample-and-hold  
function following the AD7868 DAC output. An example of  
this type of application is driving a switched-capacitor filter  
where the updating of the DAC is synchronized with the  
switched-capacitor filter. T his inherent sample-and-hold  
function also extends the frequency range performance.  
T
= +25°C  
A
10  
0
5
10  
FREQUENCY – kHz  
15  
20  
0
P er for m ance ver sus Fr equency  
T he typical performance plots of Figures 14 and 15 show the  
AD7868s DAC performance over a wide range of input fre-  
Figure 15. DAC Perform ance vs. Frequency (Sam ple-and-  
Hold)  
REV. B  
–10–  
AD7868  
MICRO P RO CESSO R INTERFACING  
DSP56000 internal serial control registers have to be configured  
for a 16-bit data word with valid data on the first falling clock  
edge. Conversion starts and DAC updating are controlled by an  
external timer. Data transfers, which occur during ADC conver-  
sions, are between the processor receive and transmit shift regis-  
ters and the AD7868s ADC and DAC. At the end of each  
16-bit transfer the DSP56000 receives an internal interrupt indi-  
cating the transmit register is empty and the receive register is  
full.  
Microprocessor interfacing to the AD7868 is via a serial bus that  
uses standard protocol compatible with DSP machines. T he  
communication interface consists of separate transmit (DAC)  
and receive (ADC) sections whose operations can be either syn-  
chronous or asynchronous with respect to each other. Each sec-  
tion has a clock signal, a data signal and a frame or strobe pulse.  
Synchronous operation means that data is transmitted from the  
ADC and to the DAC at the same time. In this mode only one  
interface clock is needed and this has to be the ADC clock out,  
so RCLK must be connected to T CLK. For asynchronous op-  
eration, DAC and ADC data transfers are independent of each  
other, the ADC provides the receive clock (RCLK) while the  
transmit clock (T CLK) may be provided by the processor or the  
ADC or some other external clock source.  
TIMER  
CONVST  
LDAC  
CONTROL  
Another option to be considered with serial interfacing is the use  
of a gated clock. A gated clock means that the device that is  
sending the data switches on the clock when data is ready to be  
transmitted and three states the clock output when transmission  
is complete. Only 16 clock pulses are transmitted with the first  
data bit getting latched into the receiving device on the first fall-  
ing clock edge. Ideally, there is no need for frame pulses, how-  
ever, the AD7868 DAC frame input (TFS) has to be driven  
high between data transmissions. T he easiest method is to use  
RFS to drive TFS and use only synchronous interfacing. T his  
avoids the use of interconnects between the processor and  
AD7868 frame signals. Not all processors have a gated clock  
facility, Figure 16 shows an example with the DSP56000.  
+5V  
AD7868*  
4.7kΩ  
2kΩ  
4.7kΩ  
DSP56000  
RFS  
SC0  
TFS  
SCK  
SRD  
RCLK  
DR  
DT  
STD  
TCLK  
*ADDITIONAL PINS OMITTED FOR CLARITY  
T able I below shows the number of interconnect lines between  
the processor and the AD7868 for the different interfacing op-  
tions. T he AD7868 has the facility to use different clocks for  
transmitting and receiving data. T his option, however, only ex-  
ists on some processors and normally just one clock (ADC  
clock) is used for all communication with the AD7868. For sim-  
plicity, all the interface examples in this data sheet use synchro-  
nous interfacing and use the ADC clock (RCLK) as an input for  
the DAC clock (T CLK). For a better understanding of each of  
these interfaces, consult the relevant processor data sheet.  
Figure 16. AD7868—DSP56000 Interface  
AD 7868—AD SP -2101/AD SP -2102 Inter face  
An interface which is suitable for the ADSP-2101 or the ADSP-  
2102 is shown in Figure 17. T he interface is configured for syn-  
chronous, continuous clock operation. T he LDAC is tied low so  
the DAC gets updated on the sixteenth falling clock after TFS  
goes low. Alternatively LDAC may be driven from a timer as  
shown in Figure 16. As with the previous interface the processor  
receives an interrupt after reading or writing to the AD7868 and  
updates its own internal registers in preparation for the next  
data transfer.  
Table I. Interconnect Lines for D ifferent Interfacing O ptions  
TIMER  
CONVST  
No. of  
Configuration Interconnects Signals  
CONTROL  
5V  
Synchronous  
4
RCLK, DR, DT and RFS  
(T CLK = RCLK, TFS = RFS)  
RCLK, DR, RFS, DT , TFS  
(T CLK = RCLK or  
ADSP-2101/  
ADSP-2102  
+
5V  
AD7868*  
Asynchronous* 5 or 6  
4.7kΩ  
2kΩ  
4.7kΩ  
RFS  
RFS  
µP serial CLK)  
RCLK, DR and DT  
RCLK  
SCLK  
DR  
Synchronous  
Gated Clock  
3
DR  
(T CLK = RCLK, TFS = RFS)  
TFS  
DT  
TFS  
TCLK  
DT  
*5 LINES OF INT ERCONNECT WHEN T CLK = RCLK  
6 LINES OF INT ERCONNECT WHEN T CLK = µP SERIAL CLK  
AD 7868—D SP 56000 Inter face  
LDAC  
Figure 16 shows a typical interface between the AD7868 and  
DSP56000. T he interface arrangement is synchronous with a  
gated clock requiring only three lines of interconnect. T he  
*ADDITIONAL PINS OMITTED FOR CLARITY  
Figure 17. AD7868—ADSP-2101/ADSP-2102 Interface  
REV. B  
–11–  
AD7868  
AD 7868—TMS32020/TMS320C25 Inter face  
analog circuitry from digital noise. T he circuit layout of Figures  
22 and 23 have both analog and digital ground planes which are  
kept separated and only joined together at the AD7868 AGND  
pins.  
Figure 18 shows an interface which is suitable for the  
T MS32020/T MS320C25 processors. T his interface is config-  
ured for synchronous, continuous clock operation. Note, the  
AD7868 will not interface correctly to these processors if the  
AD7868 is configured for a noncontinuous clock. Conversion  
starts and DAC updating are controlled by an external timer.  
NO ISE  
Keep the input signal leads to VIN and signal return leads from  
AGND as short as possible to minimize input noise coupling. In  
applications where this is not possible, use a shielded cable be-  
tween the source and the ADC. Reduce the ground circuit im-  
pedance as much as possible since any potential difference in  
grounds between the signal source and the ADC appears as an  
error voltage in series with the input signal.  
TIMER  
CONVST  
LDAC  
5V  
CONTROL  
TMS32020  
TMS320C25  
+
5V  
AD7868*  
INP UT/O UTP UT BO ARD  
Figure 19 shows an analog I/O board based on the AD7868.  
T he corresponding printed circuit board (PCB) layout and  
silkscreen are shown in Figures 21 to 23.  
4.7kΩ  
2kΩ  
4.7kΩ  
FSR  
RFS  
RCLK  
DR  
CLKR  
DR  
T he analog input to the AD7868 is buffered with an AD711 op  
amp. T here is a component grid provided near the analog input  
on the PCB which may be used for an antialiasing filter for the  
ADC or a reconstruction filter for the DAC or any other condi-  
tioning circuitry. T o facilitate this option, there are two wire  
links (labeled LK1 and LK2) required on the analog input and  
output tracks.  
TFS  
TCLK  
DT  
FSX  
CLKX  
DX  
*ADDITIONAL PINS OMITTED FOR CLARITY  
T he board contains a SHA circuit which can be used on the  
output of the AD7868 DAC to extend the very good perfor-  
mance of the part over a wider frequency range. T he increased  
performance from the SHA can be seen in Figures 14 and 15 of  
this data sheet. A wire link (labeled LK3) connects the board  
output to either the SHA output or directly to the AD7868  
DAC output.  
Figure 18. AD7868—TMS32020/TMS320C25 Interface  
AP P LICATIO N H INTS  
Good printed circuit board (PCB) layout is as important as the  
circuit design itself in achieving high speed A/D performance.  
T he AD7868s comparator is required to make bit decisions on  
an LSB size of 1.465 mV. T o achieve this, the designer has to  
be conscious of noise both in the ADC itself and in the preced-  
ing analog circuitry. Switching mode power supplies are not rec-  
ommended as the switching spikes will feed through to the  
comparator causing noisy code transitions. Other causes of con-  
cern are ground loops and digital feedthrough from micropro-  
cessors. T hese are factors which influence any ADC, and a  
proper PCB layout which minimizes these effects is essential for  
best performance.  
T here are three LDAC link options on the board; LDAC can be  
driven from an external source independent of CONVST,  
LDAC can be tied to CONVST or LDAC can be tied to GND.  
Choosing the latter option of tying LDAC to GND disables the  
SHA operation, and places the SHA permanently in the track  
mode.  
Microprocessor connections to the board are made by a 9-way  
D-type connector. T he pinout is shown in Figure 20. T he  
ADCs digital outputs are buffered with 74HC4050s. T hese  
buffers provide a higher current output capability for high  
capacitance loads or cables. Normally, these buffers are not  
required as the AD7868 will be sitting on the same board as the  
processor.  
LAYO UT H INTS  
Ensure that the layout for the printed circuit board has the digi-  
tal and analog signal lines separated as much as possible. T ake  
care not to run any digital track alongside an analog signal track.  
Guard (screen) the analog input with AGND.  
P O WER SUP P LY CO NNECTIO NS  
Establish a single point analog ground (star ground) separate  
from the logic system ground as close as possible to the AD7868  
AGND pins. Connect all other grounds and the AD7868  
DGND to this single analog ground point. Do not connect any  
other digital grounds to this analog ground point.  
T he PCB requires two analog power supplies and one 5 V digi-  
tal supply. Connections to the analog supply are made directly  
to the PCB as shown on the silkscreen in Figure 21. T he con-  
nections are labeled V+ and V– and the range for both of these  
supplies is 12 V to 15 V. Connections to the 5 V digital supply  
are made through the D-type connector SKT 6. T he ±5 V ana-  
log supply required by the AD7868 are generated from two volt-  
age regulators on the V+ and V– supplies.  
Low impedance analog and digital power supply common re-  
turns are essential to low noise operation of the ADC, so make  
the foil width for these tracks as wide as possible. T he use of  
ground planes minimizes impedance paths and also guards the  
REV. B  
–12–  
AD7868  
5V  
V+  
IN  
OUT  
C1  
10µF  
C2  
0.1µF  
IC5  
78L05  
V+  
C6  
GND  
C5  
10µF  
0.1µF  
ANALOG INPUT  
±3V RANGE  
VDD  
VDD  
LK1  
C
R7  
200  
A
B
AD711  
+
RO ADC  
IC2  
SKT1  
VIN  
C24  
0.1µF  
C23  
10µF  
V–  
A
B
COMPONENT  
GRID  
RI DAC  
LK4  
C7  
10µF  
C8  
0.1µF  
C
RO DAC  
IC1  
AD7868  
–5V  
A
B
LK5  
CONTROL  
C
COMPONENT  
GRID  
AGND  
SKT6  
9-WAY D-TYPE  
CONNECTOR  
B
LK2  
C
AGND  
SKT2  
B
5V  
R3  
A
C
IC7 1/2  
74HC4050  
A
ANALOG OUTPUT  
±3V RANGE  
5V  
DGND  
DGND  
R5  
4.7kΩ  
R4  
2kΩ  
LK3  
+
V
4.7kΩ  
DR  
DR  
C10  
0.1µF  
C9  
10µF  
RCLK  
RFS  
RCLK  
IC4  
ADG201HS  
RFS  
+
AD711  
R1  
IC3  
2kΩ  
LK9  
VOUT  
V–  
LK8  
TFS  
TCLK  
DT  
C12  
0.1µF  
C11  
10µF  
TFS  
TCLK  
DT  
C21  
330pF  
R2  
2kΩ  
DGND  
CLK  
5V  
LDAC  
CONVST  
VSS  
R6  
15k  
VCC  
Q
VSS  
REXT/C  
EXT  
C22  
68pF  
B
A
B
A
C
CEXT  
V–  
–5V  
IN  
OUT  
5V  
LK7  
–5V  
C4  
0.1µF  
C3  
10µF  
CLR  
IC6  
IC8 1/2  
74HC221  
79L05  
C
A
B
GND  
GND  
LK6  
SKT3  
LDAC  
SKT4  
SKT5  
EXT CLK  
CONVST  
Figure 19. Input/Output Circuit Based on the AD7868  
WIRE LINK O P TIO NS  
LK1, Analog Input Link  
LK1 connects the analog input to a component grid or to a  
buffer amplifier which drives the ADC input.  
1
2
3
4
5
6
7
8
9
LK2, Analog O utput Link  
LK2 connects the analog output to the component grid or to  
either the SHA or DAC output (see LK3).  
NC = NO CONNECT  
LK3, SH A or D AC Select  
T he analog output may be taken directly from the DAC or from  
a SHA at the output of the DAC.  
Figure 20. SKT6, D-Type Connector Pinout  
REV. B  
–13–  
AD7868  
LK4, D AC Refer ence Selection  
CO MP O NENT LIST  
T he DAC reference may be connected to either the ADC refer-  
ence output (RO ADC) or to the DAC reference (RO DAC).  
IC1  
IC2, IC3  
IC4,  
IC5,  
IC6,  
AD7868  
2X AD711  
ADG201HS  
MC78L05  
MC79L05  
74HC4050  
74HC221  
LK5, AD C Inter nal Clock Selection  
T his link configures the ADC for continuous or noncontinuous  
internal clock operation.  
IC7,  
IC8,  
LK6, D AC Updating  
C1, C3, C5, C7  
C9, C11, C13, C15  
C17, C19, C23  
T he DAC, LDAC input may asserted independently of the  
ADC CONVST signal or it may be tied to CONVST or it may  
tied to GND.  
10 µF Capacitor  
0.1 µF Capacitor  
C2, C4, C6, C8  
C10, C12, C14, C16  
C18, C20, C24  
LK7, AD C Clock Sour ce  
T his link provides the option for the ADC to use its own inter-  
nal clock oscillator or an external T T L compatible clock.  
C21  
C22  
330 pF Capacitor  
68 pF Capacitor  
R1, R2, R4  
R3, R5  
2 kResistor  
4.7 kResistor  
LK8 Fr am e Synchr onous O ption  
LK8 provides the option of tying the ADC RFS output to the  
DAC TFS input.  
R6  
R7  
15 kResistor  
200 Resistor  
LK9 Tr ansm it/Receive Clock O ption  
LK9 provides the option to connect the ADC RCLK to the  
DAC T CLK.  
LK1, LK2, LK3,  
LK4, LK5, LK6,  
LK7, LK8  
Shorting Plugs  
LK9  
SKT 1, SKT 2, SKT 3,  
SKT 4, SKT 5  
BNC Sockets  
SKT 6  
9-Contact D-T ype Connector  
Figure 21. Silkscreen for the Circuit Diagram of Figure 19  
REV. B  
–14–  
AD7868  
Figure 22. Com ponent Side Layout for the Circuit Diagram of Figure 19  
Figure 23. Solder Side Layout for the Circuit Diagram of Figure 19  
REV. B  
–15–  
AD7868  
O UTLINE D IMENSIO NS  
D imensions shown in inches and (mm).  
24-P in P lastic (N-24)  
24-P in Cer dip (Q -24)  
28-P in P lastic SO IC (R-28)  
REV. B  
–16–  

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