BULD85KC [POINN]

NPN SILICON TRANSISTOR WITH INTEGRATED DIODE; 带集成二极管NPN硅晶体管
BULD85KC
型号: BULD85KC
厂家: POWER INNOVATIONS LTD    POWER INNOVATIONS LTD
描述:

NPN SILICON TRANSISTOR WITH INTEGRATED DIODE
带集成二极管NPN硅晶体管

晶体 二极管 晶体管 开关 局域网
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BULD85KC  
NPN SILICON TRANSISTOR WITH INTEGRATED DIODE  
Copyright © 1997, Power Innovations Limited, UK  
MAY 1994 - REVISED SEPTEMBER 1997  
Designed Specifically for High Frequency  
Electronic Ballasts  
TO-220 PACKAGE  
(TOP VIEW)  
Integrated Fast t Anti-Parallel Diode,  
rr  
1
2
3
B
C
E
Enhancing Reliability  
Diode t Typically 1 µs  
rr  
Tightly Controlled Transistor Storage Times  
Voltage Matched Integrated Transistor and  
Diode  
Pin 2 is in electrical contact with the mounting base.  
MDTRACA  
Characteristics Optimised for Cool Running  
device symbol  
C
Diode-Transistor Charge Coupling  
Minimised to Enhance Frequency Stability  
description  
The new BULDxx range of transistors have been  
B
designed specifically for use in High Frequency  
Electronic Ballasts (HFEB’s). This range of  
switching transistors has tightly controlled  
storage times and an integrated fast t anti-  
E
rr  
parallel diode. The revolutionary design ensures  
that the diode has both fast forward and reverse  
recovery times, achieving the same performance  
as a discrete anti-parallel diode plus transistor.  
The integrated diode has minimal charge  
coupling with the transistor, increasing frequency  
stability, especially in lower power circuits where  
the circulating currents are low. By design, this  
new device offers a voltage matched integrated  
transistor and anti-parallel diode.  
absolute maximum ratings at 25°C case temperature (unless otherwise noted)  
RATING  
SYMBOL  
VALUE  
UNIT  
Collector-emitter voltage (VBE = 0)  
Collector-base voltage (IE = 0)  
Collector-emitter voltage (IB = 0)  
Emitter-base voltage  
VCES  
VCBO  
VCEO  
VEBO  
IC  
600  
V
V
600  
400  
V
9
V
Continuous collector current  
Peak collector current (see Note 1)  
Continuous base current  
6
A
ICM  
8
A
IB  
2
A
Peak base current (see Note 1)  
IBM  
4
A
Continuous device dissipation at (or below) 25°C case temperature  
Maximum average continuous diode forward current at (or below) 25°C case temperature  
Operating junction temperature range  
Ptot  
IE(av)  
Tj  
70  
W
A
0.5  
-65 to +150  
-65 to +150  
°C  
°C  
Storage temperature range  
Tstg  
NOTE 1: This value applies for tp = 10 ms, duty cycle £ 2%.  
P R O D U C T  
I N F O R M A T I O N  
Information is current as of publication date. Products conform to specifications in accordance  
with the terms of Power Innovations standard warranty. Production processing does not  
necessarily include testing of all parameters.  
1
BULD85KC  
NPN SILICON TRANSISTOR WITH INTEGRATED DIODE  
MAY 1994 - REVISED SEPTEMBER 1997  
electrical characteristics at 25°C case temperature  
PARAMETER  
TEST CONDITIONS  
MIN  
TYP  
MAX  
UNIT  
Collector-emitter  
sustaining voltage  
Collector-emitter  
cut-off current  
Emitter cut-off  
current  
VCEO(sus)  
ICES  
IC  
=
0.1 A  
L = 25 mH  
400  
V
VCE = 600 V  
VBE = 0  
IC = 0  
10  
1
µA  
mA  
V
IEBO  
VEB  
=
9 V  
Base-emitter  
VBE(sat)  
VCE(sat)  
IB  
=
0.2 A  
IC  
=
1 A  
(see Notes 2 and 3)  
(see Notes 2 and 3)  
0.85  
1.1  
saturation voltage  
Collector-emitter  
saturation voltage  
IB  
IB  
=
=
0.2 A  
0.4 A  
10 V  
1 V  
IC  
IC  
=
=
1 A  
2 A  
0.2  
0.4  
0.5  
1
V
VCE  
VCE  
VCE  
=
=
=
IC = 0.01 A  
10  
10  
10  
17.5  
15  
Forward current  
transfer ratio  
hFE  
IC  
IC  
=
=
1 A  
2 A  
(see Notes 2 and 3)  
(see Notes 2 and 3)  
20  
20  
5 V  
15.5  
Anti-parallel diode  
forward voltage  
VEC  
IE  
=
1 A  
1.2  
1.5  
V
NOTES: 2. These parameters must be measured using pulse techniques, tp = 300 µs, duty cycle £ 2%.  
3. These parameters must be measured using voltage-sensing contacts, separate from the current carrying contacts, and located  
within 3.2 mm from the device body.  
thermal characteristics  
PARAMETER  
Junction to free air thermal resistance  
Junction to case thermal resistance  
MIN  
MIN  
TYP  
MAX  
UNIT  
RqJA  
RqJC  
62.5  
1.78  
°C/W  
°C/W  
switching characteristics at 25°C case temperature  
PARAMETER  
TEST CONDITIONS  
Measured by holding transistor  
TYP  
MAX  
UNIT  
Anti-parallel diode  
trr  
(see Note 4)  
1
µs  
reverse recovery time in an off condition, VEB = -3 V.  
NOTE 4: Tested in a typical High Frequency Electronic Ballast.  
inductive-load switching characteristics at 25°C case temperature  
PARAMETER  
TEST CONDITIONS  
MIN  
MIN  
TYP  
MAX  
UNIT  
I
C = 1 A  
IB(on) = 0.2 A  
IB(off) = 0.2 A  
V
CC = 40 V  
tsv  
Storage time  
4
5
µs  
L = 1 mH  
VCLAMP = 300 V  
resistive-load switching characteristics at 25°C case temperature  
PARAMETER  
TEST CONDITIONS  
TYP  
MAX  
UNIT  
I
C = 1 A  
I
B(on) = 0.2 A  
tfi  
Current fall time  
150  
200  
ns  
VCC = 300 V  
IB(off) = 0.2 A  
P R O D U C T  
I N F O R M A T I O N  
2
BULD85KC  
NPN SILICON TRANSISTOR WITH INTEGRATED DIODE  
MAY 1994 - REVISED SEPTEMBER 1997  
TYPICAL CHARACTERISTICS  
ANTI-PARALLEL DIODE  
INSTANTANEOUS FORWARD CURRENT  
vs  
FORWARD CURRENT TRANSFER RATIO  
vs  
COLLECTOR CURRENT  
INSTANTANEOUS FORWARD VOLTAGE  
LDX85CHF  
LDX85CVF  
30  
10  
1·0  
TC = 25°C  
TC = 25°C  
10  
0·1  
VCE  
VCE  
=
=
1 V  
5 V  
VCE = 10 V  
3·0  
0·01  
0·01  
0·1  
1·0  
10  
0
0·5  
1·0  
1·5  
2·0  
2·5  
IC - Collector Current - A  
VEC - Instantaneous Forward Voltage - V  
Figure 1.  
Figure 2.  
BASE-EMITTER SATURATION VOLTAGE  
vs  
CASE TEMPERATURE  
LDX85CVB  
1.0  
0.9  
0.8  
0.7  
0.6  
IC = 1 A  
IB = 0.2 A  
-50  
-25  
0
25  
50  
75  
100 125 150  
TC - Case Temperature - °C  
Figure 3.  
P R O D U C T  
I N F O R M A T I O N  
3
BULD85KC  
NPN SILICON TRANSISTOR WITH INTEGRATED DIODE  
MAY 1994 - REVISED SEPTEMBER 1997  
MAXIMUM SAFE OPERATING REGIONS  
MAXIMUM FORWARD-BIAS  
SAFE OPERATING AREA  
MAXIMUM REVERSE-BIAS  
SAFE OPERATING AREA  
LDX85CFB  
LDX85CRB  
10  
1·0  
10  
8
TC = 25°C  
IB(on) = IC / 5  
VBE(off) = -5 V  
TC = 25°C  
6
4
0·1  
tp = 100 µs  
2
tp = 1 ms  
tp = 10 ms  
DC Operation  
0·01  
0
1·0  
10  
100  
1000  
0
100 200 300 400 500 600 700 800  
VCE - Collector-Emitter Voltage - V  
VCE - Collector-Emitter Voltage - V  
Figure 4.  
Figure 5.  
THERMAL INFORMATION  
THERMAL RESPONSE JUNCTION TO AMBIENT  
vs  
POWER PULSE DURATION  
LDX85CZA  
1·0  
0·1  
60%  
40%  
TA = 25°C  
20%  
10%  
t1  
t2  
0%  
0·01  
duty cycle = t1/t2  
Read time at end of t1,  
æZ  
ö
TJ (max) TA = PD (peak) · ç qJA÷ · RqJA (max)  
R
è
qJA ø  
102  
0·001  
10-4  
10-3  
10-2  
10-1  
100  
101  
103  
t1 - Power Pulse Duration - s  
Figure 6.  
P R O D U C T  
I N F O R M A T I O N  
4
BULD85KC  
NPN SILICON TRANSISTOR WITH INTEGRATED DIODE  
MAY 1994 - REVISED SEPTEMBER 1997  
THERMAL INFORMATION  
THERMAL RESPONSE JUNCTION TO CASE  
vs  
POWER PULSE DURATION  
LDX85CZC  
1·0  
TC = 25°C  
60%  
40%  
20%  
10%  
0%  
0·1  
t1  
duty cycle = t1/t2  
Read time at end of t1,  
t2  
æZ  
ö
TJ (max) TC = PD (peak) · ç qJC÷ · RqJC (max)  
R
è
qJCø  
0·01  
10-4  
10-3  
10-2  
10-1  
100  
101  
102  
t1 - Power Pulse Duration - s  
Figure 7.  
MAXIMUM POWER DISSIPATION JUNCTION TO AMBIENT  
vs  
POWER PULSE DURATION  
LDX85CPA  
1000  
TA = 25°C  
0%  
100  
10%  
20%  
10  
40%  
60%  
1·0  
10-4  
10-3  
10-2  
10-1  
100  
101  
102  
103  
t1 - Power Pulse Duration - s  
Figure 8.  
P R O D U C T  
I N F O R M A T I O N  
5
BULD85KC  
NPN SILICON TRANSISTOR WITH INTEGRATED DIODE  
MAY 1994 - REVISED SEPTEMBER 1997  
THERMAL INFORMATION  
MAXIMUM POWER DISSIPATION JUNCTION TO CASE  
vs  
POWER PULSE DURATION  
LDX85CPC  
1000  
100  
10  
0%  
TC = 25°C  
10%  
20%  
40%  
60%  
10-4  
10-3  
10-2  
10-1  
100  
101  
102  
t1 - Power Pulse Duration - s  
Figure 9.  
P R O D U C T  
I N F O R M A T I O N  
6
BULD85KC  
NPN SILICON TRANSISTOR WITH INTEGRATED DIODE  
MAY 1994 - REVISED SEPTEMBER 1997  
MECHANICAL DATA  
TO-220  
3-pin plastic flange-mount package  
This single-in-line package consists of a circuit mounted on a lead frame and encapsulated within a plastic  
compound. The compound will withstand soldering temperature with no deformation, and circuit performance  
characteristics will remain stable when operated in high humidity conditions. Leads require no additional  
cleaning or processing when used in soldered assembly.  
TO220  
4,70  
4,20  
10,4  
10,0  
1,32  
1,23  
3,96  
3,71  
ø
2,95  
2,54  
see Note B  
6,6  
6,0  
15,90  
14,55  
see Note C  
6,1  
3,5  
14,1  
12,7  
1,70  
1,07  
0,97  
0,61  
1
2
3
2,74  
2,34  
0,64  
0,41  
2,90  
2,40  
5,28  
4,88  
VERSION 1  
VERSION 2  
ALL LINEAR DIMENSIONS IN MILLIMETERS  
NOTES: A. The centre pin is in electrical contact with the mounting tab.  
B. Mounting tab corner profile according to package version.  
C. Typical fixing hole centre stand off height according to package version.  
Version 1, 18.0 mm. Version 2, 17.6 mm.  
MDXXBE  
P R O D U C T  
I N F O R M A T I O N  
7
BULD85KC  
NPN SILICON TRANSISTOR WITH INTEGRATED DIODE  
MAY 1994 - REVISED SEPTEMBER 1997  
IMPORTANT NOTICE  
Power Innovations Limited (PI) reserves the right to make changes to its products or to discontinue any  
semiconductor product or service without notice, and advises its customers to verify, before placing orders, that the  
information being relied on is current.  
PI warrants performance of its semiconductor products to the specifications applicable at the time of sale in  
accordance with PI's standard warranty. Testing and other quality control techniques are utilized to the extent PI  
deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily  
performed, except as mandated by government requirements.  
PI accepts no liability for applications assistance, customer product design, software performance, or infringement  
of patents or services described herein. Nor is any license, either express or implied, granted under any patent  
right, copyright, design right, or other intellectual property right of PI covering or relating to any combination,  
machine, or process in which such semiconductor products or services might be or are used.  
PI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, INTENDED, AUTHORIZED, OR WARRANTED TO BE  
SUITABLE FOR USE IN LIFE-SUPPORT APPLICATIONS, DEVICES OR SYSTEMS.  
Copyright © 1997, Power Innovations Limited  
P R O D U C T  
I N F O R M A T I O N  
8

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