2SK4174 [PANASONIC]

Power Field-Effect Transistor, 28A I(D), 0.052ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-220AB, TO-220D-A1, 3 PIN;
2SK4174
型号: 2SK4174
厂家: PANASONIC    PANASONIC
描述:

Power Field-Effect Transistor, 28A I(D), 0.052ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-220AB, TO-220D-A1, 3 PIN

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文件: 总4页 (文件大小:350K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
This product complies with the RoHS Directive (EU 2002/95/EC).  
Power MOS FETs  
2SK4174  
Silicon N-channel enhancement MOS FET  
For high speed switching circuits  
Features  
Package  
Gate-source surrender voltage VGSS : ±25 V guaranteed  
Avalanche energy capability guaranteed: EAS > 216 mJ  
High-speed switching: tf = 90 ns (typ.)  
Code  
TO-220D-A1  
Pin Name  
1: Gate  
Absolute Maximum Ratings TC = 25°C  
2: rain  
ce  
Parameter  
Drain-source surrender voltage  
Gate-source surrender voltage  
Drain current  
Symbol  
VDSS  
VGSS  
ID  
Rating  
110  
Unit  
V
Marking Symbol: K4174  
V
±5  
A
Internal Connection  
Peak drain current *  
IP  
A
±130  
216  
D
Avalanche energy capability  
Avalanche energy capability *  
EAS  
EAR  
mJ  
mJ  
W
W
°C  
°C  
9  
G
40  
Drain power dissipation  
PD  
Tj  
T = 25°C  
a
2.0  
S
Junction temperature  
Storage temperature  
150  
T
5 to +150  
Note) : surane of ve pulse. (Repeitive perios on-duty 20%)  
*
Bt, imust thin 40% of all tat the timimpressed pulse rpetitively.  
T
5.0 sOn-duty 20%  
µ ≤  
Electrical Chs TC = 25°C±3°C  
Param
Drain-source surrender voltage  
Drain-source cutoff current  
Gate-source cutoff current  
Gate threshold voltage  
Symbol  
Conditions  
ID = 1 mA, VGS = 0  
Min  
Typ  
Max  
Unit  
V
VDSS  
IDSS  
IGSS  
Vth  
110  
VDS = 88 V, VGS = 0  
VGS = ±25 V, VDS = 0  
VDS = 10 V, ID = 1.0 mA  
1.0  
±1.0  
4.0  
mA  
mA  
V
2.0  
14  
Drain-source ON resistance  
Forward transfer conductance  
Short-circuit inputcapacitance(Commonsource)  
Short-circuitoutputcapacitance(Commonsource)  
Reverse transfer capacitance (Common source)  
Turn-on delay time  
RDS(on) VGS = 10 V, ID = 14.0A  
38  
21  
52  
mW  
S
VDS = 10 V, ID = 14.0A  
Yfs  
Ciss  
Coss  
Crss  
td(on)  
tr  
1500  
500  
180  
30  
pF  
pF  
pF  
ns  
VDS = 10 V, VGS = 0, f = 1 MHz  
Rise time  
50  
ns  
VDD = 30 V, ID = 14.0A  
RL 2.2 W, VGS = 10 V  
Turn-off delay time  
td(off)  
tf  
150  
90  
ns  
Fall time  
ns  
Publication date: February 2009  
SJG00045AED  
1
This product complies with the RoHS Directive (EU 2002/95/EC).  
2SK4174  
Electrical Characteristics (continued) TC = 25°C±3°C  
Parameter  
Diode forward voltage  
Symbol  
VDSF  
trr  
Conditions  
IDR = 28A, VGS = 0  
Min  
Typ  
1.0  
75  
Max  
Unit  
V
1.4  
Reverse recovery time  
Reverse recovery charge  
Gate charge load  
ns  
L = 230 mH, VDD = 100 V  
IDR = 14.0A, di / dt = 100A/ms  
Qrr  
0.3  
64  
nC  
Qg  
nC  
Gate-source charge  
Qgs  
VDD = 30 V, ID = 14.0A, VGS = 10 V  
6.0  
28.5  
nC  
Gate-drain charge  
Qgd  
nC  
Thermal resistance (ch-c)  
Thermal resistance (ch-a)  
Rth(ch-c)  
Rth(ch-a)  
3.13  
62.5  
°C/W  
°C/W  
Note) Measuring methods are based on JAPANESE INDUSTRIAL STANDARJIS C 7030 measuring metods for transistors.  
PC T  
Safoperation aea  
a
103  
100  
80  
Norepetitive ulse  
TC = 2°C  
IDP  
102  
0  
t = 1.0 µs  
100 µs  
ID  
60  
TC = Ta  
1 ms  
40  
0  
0
DC  
10 ms  
Wihout a at shink  
50  
101  
0
00  
150  
1
10  
102  
103  
( )  
Ambient temperaure Ta (°C
Drain-source voltage VDS V  
2
SJG00045AED  
This product complies with the RoHS Directive (EU 2002/95/EC).  
2SK4174  
TO-220D-A1  
Unit: mm  
4.6 ±0.2  
2.9 ±0.2  
9.9 ±0.3  
3.2 ±0.1  
1.4 ±0
1.6 ±0
2.6 ±0.1  
0.8 ±0.1  
0.40 ±0.05  
2.54 ±0.3  
5.08 ±0.5  
1
2
3
SJG00045AED  
3
Request for your special attention and precautions in using the technical information and  
semiconductors described in this book  
(1) If any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and  
regulations of the exporting country, especially, those with regard to security export control, must be observed.  
(2) The technical information described in this book is intended only to show the main characteristics and application circuit examples  
of the products. No license is granted in and to any intellectual property right or other right owned by Panasonic Corporation or any  
other company. Therefore, no responsibility is assumed by our company as to the infringement upon any such right owned by any  
other company which may arise as a result of the use of technical information described in this book.  
(3) The products described in this book are intended to be used for standard applications or general electronic equipment (such as office  
equipment, communications equipment, measuring instruments and household appliances).  
Consult our sales staff in advance for information on the following applications:  
Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment, combustion equipment, life support  
systems and safety devices) in which exceptional quality and reliability requied, or if the failure or malfunction of the prod-  
ucts may directly jeopardize life or harm the human body.  
Any applications other than the standard applications intended.  
(4) The products and product specifications described in this book are subjet to change wit notice for modification and/or im-  
provement. At the final stage of your design, purchasingr use of the roducts, therfor the most up-to-date Product  
Standards in advance to make sure that the latest specifictions stisfy your requirements.  
(5) When designing your equipment, comply with he ange f absolute maximing nd the guaranteed operating conditions  
(operating power supply voltage and operating nvirent etc.). Especiall, plee be ceful not to exceed the range of absolute  
maximum rating on the transient state, such as powpower-off and modeswitching. Otherwise, we will not be liable for any  
defect which may arise later in your equpmen
Even when the products are used withthe guaanteed values, kinto he cosideration of incidence of break down and failure  
mode, possible to occur to semiconductor products. Measures on the sytems such as redundant design, arresting the spread of fire  
or preventing glitch are recommin ordto prevent physicinjury, fre, social damaes, for example, by using the products.  
(6) Comply with the instructios for se in rder to prevent breakdwn and characteristics change due to external factors (ESD, EOS,  
thermal stress and mechanicastress) at the time of andlig, mounting or at customer's process. When using products for which  
damp-proof packinis reqired, stisfy the condtions, sch as shelf life and the elapsed time since first opening the packages.  
(7) This book may e not eprinted or reprodhethr wholly or partially, without the prior written permission of our company.  
2008080

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