NVCR8LS025N65S3A [ONSEMI]

Power MOSFET, N-Channel, SUPERFET® III, Easy Drive, 650 V, 75 A, 25 mΩ, Bare Die;
NVCR8LS025N65S3A
型号: NVCR8LS025N65S3A
厂家: ONSEMI    ONSEMI
描述:

Power MOSFET, N-Channel, SUPERFET® III, Easy Drive, 650 V, 75 A, 25 mΩ, Bare Die

文件: 总8页 (文件大小:208K)
中文:  中文翻译
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DIE DATA SHEET  
www.onsemi.com  
MOSFET – Power,  
N-Channel, Automotive,  
SUPERFET) III, Easy-Drive  
650 V, 25 mW  
NVCR8LS025N65S3A  
Features  
Typical R  
Typical Q  
= 19.9 mW at V = 10 V  
GS  
DS(on)  
ORDERING INFORMATION  
= 236 nC at V = 10 V  
g(tot)  
GS  
Device  
Package  
AECQ101 Qualified  
RoHS Compliant  
NVCR8LS025N65S3A  
Wafer Sawn on Foil  
DIMENSION (mm)  
Die Size  
RECOMMENDED STORAGE CONDITIONS  
10830 x 7610  
Temperature  
RH  
22 to 28°C  
Die Size (Sawn)  
Source Attach Area  
Gate Attach Area  
Die Thickness  
10810 30 x 7590 30  
(10155 x 3346) x 2  
406 x 618  
40% to 66%  
203.2 25.4  
Gate and Source : AlSiCu  
Drain : TiNiVAg (back side of die)  
Passivation : SiN  
Wafer Diameter : 8 inch  
Wafer sawn on UV Tape  
Bad dice identified in Inking  
Gross Die Count : 296  
ELECTRICAL CHARACTERISTICS  
The Chip is 100% Probed to Meet the Conditions and Limits Specified at T = 25°C  
J
Symbol  
Parameter  
Condition  
= 1 mA, V = 0 V  
Min.  
Typ.  
Max.  
Unit  
V
BV  
Drain to Source Breakdown Voltage  
Drain to Source Leakage Current  
Gate to Source Leakage Current  
Gate to Source Threshold Voltage  
Bare Die Drain to Source On Resistance  
Drain to Source Diode Forward Voltage  
I
650  
DSS  
D
GS  
I
I
V
V
V
= 650 V, V = 0 V  
1
mA  
nA  
V
DSS  
GSS  
DS  
GS  
GS  
GS  
= +30 / 20 V, V = 0 V  
100  
4.5  
25  
DS  
V
= V , I = 3 mA  
2.5  
GS(th)  
DS  
D
*R  
I
D
= 37.5 A, V = 10 V  
19.9  
mW  
V
DS(on)  
GS  
V
V
= 0 V, I = 37.5 V  
1.2  
SD  
GS  
SD  
*Accurate RDS(on) test at die level is not feasible for this thin die as limited by the test contact precision attainable in a die form. The max RDS(on)  
specification is defined from the historical performance of the die in package but is not guaranteed by test in production. The die RDS(on)  
performance depends on the Source wire/ribbon bonding layout.  
© Semiconductor Components Industries, LLC, 2022  
1
Publication Order Number:  
NVCR8LS025N65S3A/D  
September, 2022 Rev. 0  
NVCR8LS025N65S3A  
ABSOLUTE MAXIMUM RATINGS  
in Reference to the NVHL025N65S3 electrical data in TO2473LD ( T = 25°C unless otherwise noted)  
J
Symbol  
V
Parameter  
Ratings  
650  
Unit  
V
Drain to Source Voltage  
Gate to Source Voltage  
DSS  
V
GS  
DC Positive  
30  
V
AC Positive, (f > 1Hz)  
30  
V
AC Negative, (f > 1Hz)  
20  
V
°
I
Continuous Drain Current  
Pulsed Drain Current  
T
T
= 25 C  
75  
A
D
C
C
°
= 100 C  
65.8  
300  
A
I
Pulsed (Note 1)  
A
DM  
E
Single Pulse Avalanche Energy (Note 2)  
Repetitive Avalanche (Note 1)  
MOSFET dv/dt  
2025  
5.95  
100  
mJ  
mJ  
V/ns  
V/ns  
W
AS  
AR  
E
dv/dt  
Peak Diode Recovery dv/dt (Note 3)  
20  
°
P
Power Dissipation R  
T
C
= 25 C  
595  
D
qJC  
T
T
Operating and Storage Temperature  
–55 to +150  
°C  
J, STG  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Repetitive rating: pulsewidth limited by maximum junction temperature.  
2. I = 15 A, R = 25 W, Starting T = 25°C.  
AS  
G
J
3. I < 75 A, di/dt 200 A/ms, VDD BVDSS, starting T = 25°C  
SD  
J
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Value  
Unit  
Thermal Resistance, Junction to Case, Max  
Thermal Resistance, Junction to Ambient, Max  
0.21  
°C/W  
R
q
J C  
J A  
40  
°C/W  
R
q
www.onsemi.com  
2
NVCR8LS025N65S3A  
ELECTRICAL CHARACTERISTICS  
in Reference to the NVHL025N65S3 electrical data in TO2473LD ( T = 25°C unless otherwise noted)  
J
Symbol  
Parameter  
Conditions  
Min.  
Typ.  
Max.  
Unit  
OFF CHARACTERISTICS  
BV  
I
Drain to Source Breakdown Voltage  
Drain to Source Leakage Current  
I
= 1 mA, V = 0 V  
650  
1
V
DSS  
D
GS  
V
V
V
V
= 650 V, V = 0 V, T = 25°C  
mA  
mA  
nA  
nA  
DSS  
GSS  
DS  
DS  
GS  
GS  
GS  
J
= 520 V, V = 0 V, T = 125°C  
7.92  
GS  
J
I
Gate to Source Leakage Current  
= +30 V  
+100  
100  
= 20 V  
ON CHARACTERISTICS  
V
Gate to Source Threshold Voltage  
V
I
= V I = 3.0 mA  
DS, D  
2.5  
4.5  
25  
V
GS(th)  
GS  
R
Drain to Source OnResistance  
= 37.5 A,  
T = 25°C  
19.9  
34.6  
78.5  
mW  
mW  
S
DS(on)  
D
J
V
GS  
= 10 V  
T = 100°C  
J
g
FS  
Forward Transconductance  
V
DS  
= 20 V, I = 75 A  
D
DYNAMIC CHARACTERISTICS  
C
C
C
C
C
Input Capacitance  
V
= 400 V, V = 0 V,  
7330  
197  
pF  
pF  
pF  
pF  
pF  
nC  
nC  
nC  
W
iss  
DS  
GS  
f = 1 MHz  
Output Capacitance  
oss  
Reverse Transfer Capacitance  
Effective Output Capacitance  
Energy Related Output Capacitance  
Total Gate Charge  
33.6  
2062  
285  
rss  
V
DS  
V
DS  
V
GS  
= 0 V to 400 V, V = 0 V  
GS  
oss(eff.)  
oss(er.)  
= 0 V to 400 V, V = 0 V  
GS  
Q
Q
Q
= 10 V, V = 400 V I = 75 A  
236  
g(ToT)  
gs  
DS  
, D  
(Note 4)  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
Gate Resistance  
59.3  
97.3  
0.818  
gd  
RG  
f = 1 MHz  
SWITCHING CHARACTERISTICS  
t
t
t
t
TurnOn Delay Time  
Rise Time  
V
R
= 400 V, I = 75 A, V = 10 V,  
= 2 W  
43.3  
109  
120  
107  
ns  
ns  
ns  
ns  
d(on)  
DD  
D
GS  
G
r
(Note 4)  
TurnOff Delay Time  
Fall Time  
d(off)  
f
DRAIN*SOURCE DIODE CHARACTERISTICS  
S
I
Maximum Continuous Drain to Source Diode Forward Current  
75  
300  
1.2  
A
A
V
I
Maximum Pulsed Drain to Source Diode Forward Current  
SM  
V
Source to Drain Diode Voltage  
Reverse Recovery Time  
V
V
= 0 V, I = 37.5 A, V = 0 V  
SD  
GS  
SD  
GS  
t
rr  
= 0 V, I = 75 A, dI /dt = 100 A/ms  
714  
ns  
GS  
SD  
SD  
Q
Reverse Recovery Charge  
26.4  
mC  
rr  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
4. Essentially independent of operating temperature typical characteristics.  
SUPERFET is a registered trademark of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or subsidiaries in the United States  
and/or other countries.  
www.onsemi.com  
3
NVCR8LS025N65S3A  
TYPICAL CHARACTERISTICS  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
120  
90  
60  
30  
0
CURRENT LIMITED  
BY SILICON  
CURRENT LIMITED  
BY PACKAGE  
0
25  
50  
75  
100  
125  
150  
25  
50  
75  
100  
125  
150  
T , Case Temperature (°C)  
C
T , Case Temperature (°C)  
C
Figure 1. Normalized Power Dissipation vs. Case  
Temperature  
Figure 2. Maximum Continuous Drain Current  
vs. Case Temperature  
10  
DUTY CYCLE DESCENDING ORDER  
1
D = 0.50  
0.20  
0.10  
0.05  
0.02  
0.01  
P
DM  
0.1  
0.01  
t
1
t
2
SINGLE PULSE  
NOTES:  
DUTY FACTOR: D = t /t  
1
2
PEAK T = P x Z  
x R  
+ T  
J
DM  
qJC  
qJC C  
0.001  
105  
104  
103  
102  
101  
100  
t, Rectangular Pulse Duration (s)  
Figure 3. Normalized Maximum Transient Thermal Impedance  
5000  
1000  
o
T
= 25  
C
C
VGS = 10 V  
FOR TEMPERATURES  
o
ABOVE 25 C DERATE PEAK  
CURRENT AS FOLLOWS:  
150 T  
C
I = I  
25  
125  
100  
SINGLE PULSE  
10  
105  
104  
103  
102  
101  
100  
101  
t, Rectangular Pulse Duration (s)  
Figure 4. Peak Current Capability  
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4
NVCR8LS025N65S3A  
TYPICAL CHARACTERISTICS (continued)  
1000  
100  
10  
30 us  
100 us  
1 ms  
10 ms  
DC  
Operation in this area  
may be limited by R  
DS(on)  
1
DC  
Rds(on)limit  
10 us  
Single Pulse  
0.1  
0.01  
T = Max Rated  
J
T
C
= 25°C  
1
10  
100  
1000  
V
DS  
, DrainSource Voltage (V)  
Figure 5. Forward Bias Safe Operating Area  
1000  
300  
100  
Pulse Duration = 250 μs  
Duty Cycle = 0.5% Max  
V
GS  
= 0 V  
V
DD  
= 20 V  
100  
10  
1
T = 150°C  
J
10  
1
T = 25°C  
J
T = 25°C  
J
T = 150°C  
J
T = 55°C  
J
0.1  
2
3
4
5
6
7
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
V
GS  
, Gate to Source Voltage (V)  
V
SD  
, Body Diode Forward Voltage (V)  
Figure 7. Forward Diode Characteristics  
Figure 6. Transfer Characteristic  
200  
100  
80  
60  
40  
20  
0
250 μs Pulse Width  
V
250 μs Pulse Width  
T = 150°C  
J
GS  
T = 25°C  
10 V Top  
8 V  
J
V
GS  
150  
100  
50  
10 V Top  
8 V  
7 V  
6.5 V  
6 V  
7 V  
6.5 V  
6 V  
5.5 V  
5 V Bottom  
5.5 V  
5 V Bottom  
0
0
1
2
3
4
5
0
1
2
3
4
5
V
DS  
, Drain to Source Voltage (V)  
V
DS  
, Drain to Source Voltage (V)  
Figure 8. Saturation Characteristics  
Figure 9. Saturation Characteristics  
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5
NVCR8LS025N65S3A  
TYPICAL CHARACTERISTICS (continued)  
3.0  
120  
100  
80  
60  
40  
20  
0
Pulse Duration = 250 μs  
Pulse Duration = 250 μs  
Duty Cycle = 0.5% Max  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
Duty Cycle = 0.5% Max  
I
D
= 75 A  
T = 150°C  
J
I
D
= 75 A  
V
GS  
= 10 V  
T = 25°C  
J
80  
40  
0
40  
80  
120  
160  
6
7
8
9
10  
V
GS  
, Gate to Source Voltage (V)  
T , Junction Temperature (°C)  
J
Figure 10. RDSON vs. Gate Voltage  
Figure 11. Normalized RDSON vs. Junction  
Temperature  
1.2  
1.0  
0.8  
0.6  
0.4  
1.2  
1.1  
1.0  
0.9  
0.8  
V
I
= V  
DS  
= 3 mA  
GS  
I
D
= 10 mA  
D
80  
40  
0
40  
80  
120  
160  
80  
40  
0
40  
80  
120  
160  
T , Junction Temperature (°C)  
J
T , Junction Temperature (°C)  
J
Figure 12. Normalized Gate Threshold Voltage  
vs. Temperature  
Figure 13. Normalized Drain to Source  
Breakdown Voltage vs. Junction Temperature  
10  
8
1.E+06  
1.E+05  
1.E+04  
1.E+03  
1.E+02  
1.E+01  
1.E+00  
1.E01  
I
D
= 75 A  
Coss  
Ciss  
V
= 325 V  
DD  
V
= 260 V  
V
DD  
= 390 V  
DD  
6
4
Crss  
2
f = 1 MHz  
GS  
V
= 0 V  
0
0,1  
1
10  
100  
1000  
0
50  
100  
150  
200  
250  
V
DS  
, Drain to Source Voltage (V)  
Q , Gate Charge (nC)  
G
Figure 14. Capacitance vs. Drain to Source Volatage  
Figure 15. Gate Charge vs. Gate to Source Voltage  
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6
NVCR8LS025N65S3A  
TYPICAL CHARACTERISTICS (continued)  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
0.04  
0.03  
0.02  
0.01  
VGS = 10 V  
VGS = 20 V  
T
C
= 25°C  
0
0
60  
120  
180  
240  
300  
0
130  
260  
390  
520  
650  
V
DS  
, Drain to Source Voltage (V)  
I , Drain Current (A)  
D
Figure 16. EOSS vs. Drain to Source Voltage  
Figure 17. OnResistance Variation vs. Drain  
Current and Gate Voltage  
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7
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