HGTG20N60B3D [ONSEMI]

600V,PT IGBT;
HGTG20N60B3D
型号: HGTG20N60B3D
厂家: ONSEMI    ONSEMI
描述:

600V,PT IGBT

局域网 电动机控制 栅 瞄准线 双极性晶体管
文件: 总9页 (文件大小:430K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
UFS Series N-Channel IGBT  
with Anti-Parallel Hyperfast  
Diode  
40 A, 600 V  
HGTG20N60B3D  
www.onsemi.com  
The HGTG20N60B3D is a MOS gated high voltage switching  
device combining the best features of MOSFETs and bipolar  
transistors. The device has the high input impedance of a MOSFET  
and the low onstate conduction loss of a bipolar transistor. The much  
lower onstate voltage drop varies only moderately between 25°C and  
150°C. The diode used in antiparallel with the IGBT is the  
RHRP3060.  
The IGBT is ideal for many high voltage switching applications  
operating at moderate frequencies where low conduction losses are  
essential.  
C
G
E
E
C
G
Formerly developmental type TA49016.  
COLLECTOR  
(BOTTOM  
SIDE METAL)  
Features  
40 A, 600 V at T = 25°C  
Typical Fall Time 140 ns at 150°C  
Short Circuit Rated  
Low Conduction Loss  
Hyperfast AntiParallel Diode  
This is a PbFree Device  
C
TO2473LD SHORT LEAD  
CASE 340CK  
JEDEC STYLE  
MARKING DIAGRAM  
$Y&Z&3&K  
G20N60B3D  
$Y  
&Z  
&3  
&K  
= ON Semiconductor Logo  
= Assembly Plant Code  
= Numeric Date Code  
= Lot Code  
G20N60B3D = Specific Device Code  
ORDERING INFORMATION  
See detailed ordering and shipping information on page 7 of  
this data sheet.  
© Semiconductor Components Industries, LLC, 2001  
1
Publication Order Number:  
April, 2020 Rev. 2  
HGTG20N60B3D/D  
HGTG20N60B3D  
ABSOLUTE MAXIMUM RATINGS (T = 25°C unless otherwise specified)  
C
Parameter  
Symbol  
HGTG20N60B3D  
Unit  
V
Collector to Emitter Voltage  
BV  
600  
600  
CES  
CGR  
Collector to Gate Voltage, R = 1 MW  
BV  
V
GE  
Collector Current Continuous  
At T = 25°C  
I
40  
20  
A
A
C
C25  
At T = 110°C  
I
C
C110  
Average Diode Forward Current at 110°C  
Collector Current Pulsed (Note 1)  
Gate to Emitter Voltage Continuous  
Gate to Emitter Voltage Pulsed  
I
20  
A
A
V
V
(AVG)  
I
160  
CM  
V
20  
GES  
GEM  
V
30  
Switching Safe Operating Area at T = 150°C  
SSOA  
30 A at 600 V  
C
Power Dissipation Total at T = 25°C  
P
165  
1.32  
W
W/°C  
°C  
C
D
Power Dissipation Derating T > 25°C  
C
Operating and Storage Junction Temperature Range  
Maximum Lead Temperature for Soldering  
T , T  
40 to 150  
260  
J
STG  
T
°C  
L
Short Circuit Withstand Time (Note 2) at V = 15 V  
t
4
ms  
GE  
SC  
SC  
Short Circuit Withstand Time (Note 2) at V = 10 V  
t
10  
ms  
GE  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Repetitive Rating: Pulse width limited by maximum junction temperature.  
2. V = 360 V, T =125°C, R = 25 W  
CE  
C
G
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise specified)  
C
Parameter  
Symbol  
Test Condition  
I = 250 mA, V = 0 V  
C
Min  
600  
Typ  
Max  
Unit  
V
Collector to Emitter Breakdown Voltage  
Collector to Emitter Leakage Current  
BV  
I
CES  
GE  
V
= BV  
T
C
T
C
T
C
T
C
= 25°C  
= 150°C  
= 25°C  
= 150°C  
250  
2.0  
2.0  
2.5  
6.0  
100  
mA  
mA  
V
CES  
CE  
CES  
Collector to Emitter Saturation Voltage  
V
I
= I  
C110  
, V = 15 V  
1.8  
2.1  
5.0  
CE(SAT)  
C
C
GE  
V
Gate to Emitter Threshold Voltage  
Gate to Emitter Leakage Current  
Switching SOA  
V
I
= 250 mA, V = V  
GE  
3.0  
V
GE(TH)  
CE  
I
V
GE  
=
20 V  
nA  
A
GES  
SSOA  
T
= 150°C, V = 15 V,  
V
V
= 480 V  
= 600 V  
100  
30  
C
G
GE  
CE  
R
= 10 W, L = 45 mH  
A
CE  
Gate to Emitter Plateau Voltage  
V
GEP  
I
I
= I  
, V = 0.5 BV  
CES  
8.0  
80  
105  
25  
20  
220  
140  
475  
1050  
1.5  
V
C
C110  
CE  
OnState Gate Charge  
Q
= I  
C110  
,
V
V
= 15 V  
= 20 V  
105  
135  
nC  
nC  
ns  
ns  
ns  
ns  
mJ  
mJ  
V
G(ON)  
C
V
GE  
= 0.5 BV  
CE  
CES  
GE  
Current TurnOn Delay Time  
Current Rise Time  
t
T
CE  
= 150°C,  
d(ON)I  
C
I
= I  
,
C110  
t
rI  
d(OFF)I  
V
V
= 0.8 BV  
= 15 V,  
,
CE  
GE  
G
CES  
Current TurnOff Delay Time  
Current Fall Time  
t
275  
175  
R
= 10 W,  
L = 100 mH  
t
fI  
TurnOn Energy  
E
ON  
TurnOff Energy (Note 3)  
Diode Forward Voltage  
Diode Reverse Recovery Time  
E
OFF  
V
EC  
I
I
I
= 20 A  
1.9  
55  
45  
EC  
EC  
EC  
t
rr  
ns  
ns  
= 20 A, dI /dt = 100 A/ms  
EC  
= 1 A, dI /dt = 100 A/ms  
EC  
www.onsemi.com  
2
 
HGTG20N60B3D  
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise specified) (continued)  
C
Parameter  
Thermal Resistance  
Symbol  
Test Condition  
Min  
Typ  
Max  
0.76  
1.2  
Unit  
°C/W  
°C/W  
R
IGBT  
q
JC  
Diode  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
3. TurnOff Energy Loss (E  
) is defined as the integral of the instantaneous power loss starting at the trailing edge of the input pulse and  
OFF  
ending at the point where the collector current equals zero (I = 0 A) The HGTG20N60B3D was tested per JEDEC standard No. 241  
CE  
Method for Measurement of Power Device TurnOff Switching Loss. This test method produces the true total TurnOff Energy Loss. TurnOn  
losses include diode losses.  
TYPICAL PERFORMANCE CURVES  
100  
80  
100  
80  
12 V  
PULSE DURATION = 250 ms  
DUTY CYCLE < 0.5%, V = 10 V  
V
GE  
= 15 V  
V
GE  
= 10 V  
CE  
PULSE DURATION = 250 ms,  
DUTY CYCLE < 0.5%, T = 25°C  
T
C
= 150°C  
C
60  
60  
V
= 9 V  
= 8.5 V  
GE  
T
C
= 25°C  
C
V
GE  
40  
20  
0
40  
T
= 40°C  
V
V
= 8.0 V  
= 7.5 V  
GE  
GE  
20  
0
V
GE  
= 7.0 V  
0
2
4
6
8
10  
4
6
8
10  
12  
V
GE  
, GATE TO EMITTER VOLTAGE (V)  
V
CE  
, COLLECTOR TO EMITTER VOLTAGE (V)  
Figure 1. TRANSFER CHARACTERISTICS  
Figure 2. SATURATION CHARACTERISTICS  
100  
50  
40  
T
C
= 25°C  
PULSE DURATION = 250 ms  
DUTY CYCLE < 0.5%,  
80  
60  
40  
20  
0
V
GE  
= 15 V  
V
GE  
= 15 V  
30  
20  
T
C
= 40°C  
T
= 150°C  
C
10  
0
25  
50  
75  
100  
125  
150  
0
1
2
3
4
5
V
CE  
, COLLECTOR TO EMITTER VOLTAGE (V)  
T , CASE TEMPERATURE (°C)  
C
Figure 3. DC COLLECTOR CURRENT vs. CASE  
TEMPERATURE  
Figure 4. COLLECTOR TO EMITTER ONSTATE  
VOLTAGE  
www.onsemi.com  
3
 
HGTG20N60B3D  
TYPICAL PERFORMANCE CURVES (continued)  
5000  
4000  
3000  
2000  
1000  
0
15  
12  
600  
FREQUENCY = 1 MHz  
CIES  
480  
V
= 600 V  
CE  
360  
240  
9
6
V
CE  
= 400 V  
COES  
V
= 200 V  
CE  
T
C
= 25°C  
120  
0
3
0
I
= 1.685 mA  
g(REF)  
CRES  
R
L
= 30 W  
0
5
10  
15  
20  
25  
0
20  
40  
60  
80  
100  
V
CE  
, COLLECTOR TO EMITTER VOLTAGE (V)  
Q , GATE CHARGE (nC)  
G
Figure 5. CAPACITANCE vs. COLLECTOR TO  
EMITTER VOLTAGE  
Figure 6. GATE CHARGE WAVEFORMS  
500  
400  
100  
T
J
= 150°C, R = 10 W, L = 100 mH  
T = 150°C, R = 10 W, L = 100 mH  
J G  
G
50  
40  
300  
200  
V
CE  
= 480 V, V = 15 V  
GE  
30  
20  
V
CE  
= 480 V, V = 15 V  
GE  
10  
100  
0
10  
20  
30  
40  
0
10  
20  
30  
40  
I
, COLLECTOR TO EMITTER CURRENT (A)  
I
, COLLECTOR TO EMITTER CURRENT (A)  
CE  
CE  
Figure 7. TURNON DELAY TIME vs.  
Figure 8. TURNOFF DELAY TIME vs.  
COLLECTOR TO EMITTER CURRENT  
COLLECTOR TO EMITTER CURRENT  
1000  
100  
10  
100  
T
J
= 150°C, R = 10 W, L = 100 mH  
T
= 150°C, R = 10 W, L = 100 mH  
G
J G  
V
CE  
= 480 V, V = 15 V  
GE  
V
CE  
= 480 V, V = 15 V  
GE  
10  
1
0
10  
20  
30  
40  
0
10  
20  
30  
40  
I
, COLLECTOR TO EMITTER CURRENT (A)  
I
, COLLECTOR TO EMITTER CURRENT (A)  
CE  
CE  
Figure 9. TURNON RISE TIME vs.  
COLLECTOR TO EMITTER CURRENT  
Figure 10. TURNOFF FALL TIME vs.  
COLLECTOR TO EMITTER CURRENT  
www.onsemi.com  
4
 
HGTG20N60B3D  
TYPICAL PERFORMANCE CURVES (continued)  
1400  
1200  
1000  
800  
2500  
T
J
= 150°C, R = 10 W, L = 100 mH  
T
= 150°C, R = 10 W, L = 100 mH  
G
J G  
2000  
1500  
1000  
500  
0
V
CE  
= 480 V, V = 15 V  
GE  
V
CE  
= 480 V, V = 15 V  
GE  
600  
400  
200  
0
0
10  
20  
30  
40  
0
10  
20  
30  
40  
I
, COLLECTOR TO EMITTER CURRENT (A)  
I
, COLLECTOR TO EMITTER CURRENT (A)  
CE  
CE  
Figure 11. TURNON ENERGY LOSS vs.  
Figure 12. TURNOFF ENERGY LOSS vs.  
COLLECTOR TO EMITTER CURRENT  
COLLECTOR TO EMITTER CURRENT  
120  
500  
100  
T
R
= 150°C, T = 75°C, V = 15 V  
T = 150°C, V = 15 V, R = 10 W  
C GE G  
J
C
GE  
= 10 W, L = 100 mH  
G
100  
80  
60  
40  
20  
0
V
CE  
= 480 V  
f
f
= 0.05 / (t  
+ t  
d(ON)I  
)
MAX1  
MAX2  
d(OFF)I  
= (P P ) / (E + E  
)
D
C
ON  
OFF  
P
D
P
C
= ALLOWABLE DISSIPATION  
= CONDUCTION DISSIPATION  
(DUTY FACTOR = 50%)  
= 0.76°C/W  
R
q
JC  
10  
5
10  
20  
30  
40  
0
100  
200  
300  
400  
500  
600  
700  
I
, COLLECTOR TO EMITTER CURRENT (A)  
V
CE  
, COLLECTOR EMITTER VOLTAGE (V)  
CE  
Figure 13. OPERATING FREQUENCY vs.  
COLLECTOR TO EMITTER CURRENT  
Figure 14. SWITCHING SAFE OPERATING AREA  
0
10  
0.5  
0.2  
0.1  
1  
10  
0.05  
0.02  
t
1
P
0.01  
D
2  
10  
t
2
SINGLE PULSE  
DUTY FACTOR, D = t / t  
1
2
PEAK T = (P x Z  
x R ) + T  
q
JC C  
q
J
D
JC  
3  
10  
5  
4  
10  
3  
10  
2  
1  
0
1
10  
10  
10  
10  
10  
t1, RECTANGULAR PULSE DURATION (s)  
Figure 15. IGBT NORMALIZED TRANSIENT THERMAL RESPONSE, JUNCTION TO CASE  
www.onsemi.com  
5
 
HGTG20N60B3D  
TYPICAL PERFORMANCE CURVES (continued)  
100  
80  
60  
40  
20  
0
50  
T
= 25°C, d /dt = 100 A/ms  
C
IEC  
t
rr  
40  
30  
20  
10  
0
150°C  
t
a
100°C  
t
b
25°C  
0
0.5  
1.0  
1.5  
2.0  
2.5  
1
5
10  
20  
V
EC  
, FORWARD VOLTAGE (V)  
V
EC  
, FORWARD CURRENT (A)  
Figure 16. DIODE FORWARD CURRENT vs.  
FORWARD VOLTAGE DROP  
Figure 17. RECOVERY TIMES vs. FORWARD CURRENT  
TEST CIRCUIT AND WAVEFORMS  
90%  
OFF  
L = 100 mH  
10%  
ON  
RHRP3060  
V
GE  
E
E
V
CE  
R
G
= 10 W  
90%  
+
10%  
d(OFF)I  
I
V
DD  
= 480 V  
CE  
t
t
rI  
t
fI  
t
d(ON)I  
Figure 18. INDUCTIVE SWITCHING TEST CIRCUIT  
Figure 19. SWITCHING TEST WAVEFORMS  
www.onsemi.com  
6
 
HGTG20N60B3D  
HANDLING PRECAUTIONS FOR IGBTs  
OPERATING FREQUENCY INFORMATION  
Insulated Gate Bipolar Transistors are susceptible to  
gateinsulation damage by the electrostatic discharge of  
energy through the devices. When handling these devices,  
care should be exercised to assure that the static charge built  
in the handler’s body capacitance is not discharged through  
the device. With proper handling and discharge procedures,  
however, IGBTs are currently being extensively used in  
production by numerous equipment manufacturers in  
military, industrial and consumer applications, with virtually  
no damage problems due to electrostatic discharge. IGBTs  
can be handled safely if the following basic precautions are  
taken:  
Operating frequency information for a typical device  
(Figure 13) is presented as a guide for estimating device  
performance for a specific application. Other typical  
frequency vs collector current (I ) plots are possible using  
CE  
the information shown for a typical unit in Figures 4, 7, 8, 11  
and 12. The operating frequency plot (Figure 13) of a typical  
device shows f  
or f  
whichever is smaller at each  
MAX1  
MAX2  
point. The information is based on measurements of a  
typical device and is bounded by the maximum rated  
junction temperature.  
f
is defined by f  
= 0.05 / (t  
t
).  
MAX1  
MAX1  
d(OFF)I d(ON)I  
Deadtime (the denominator) has been arbitrarily held to  
1. Prior to assembly into a circuit, all leads should be  
kept shorted together either by the use of metal  
shorting springs or by the insertion into conductive  
material such as “ECCOSORBDt LD26” or  
equivalent.  
10% of the onstate time for a 50% duty factor. Other  
definitions are possible. t  
Figure 19.  
and t  
are defined in  
d(OFF)I  
d(ON)I  
Device turnoff delay can establish an additional  
frequency limiting condition for an application other than  
2. When devices are removed by hand from their  
carriers, the hand being used should be grounded  
by any suitable means for example, with a  
metallic wristband.  
T
. t  
is important when controlling output ripple  
JM d(OFF)I  
under a lightly loaded condition.  
is defined by f = (P P ) /(E  
allowable dissipation (P ) is defined by P = (T T ) /  
f
+ E ). The  
ON  
MAX2  
MAX2  
D
C
OFF  
D
D
JM  
C
3. Tips of soldering irons should be grounded.  
4. 1. Devices should never be inserted into or  
removed from circuits with power on.  
R
. The sum of device switching and conduction losses  
qJC  
must not exceed P . A 50% duty factor was used (Figure 13)  
and the conduction losses (P ) are approximated by  
D
C
5. Gate Voltage Rating Never exceed the  
P = (V x I ) / 2.  
C CE CE  
gatevoltage rating of V . Exceeding the rated  
GEM  
E
and E  
are defined in the switching waveforms  
ON  
OFF  
VGE can result in permanent damage to the oxide  
layer in the gate region.  
shown in Figure 19. E is the integral of the instantaneous  
ON  
power loss (I x V ) during turnon and E is the  
OFF  
CE  
CE  
6. Gate Termination The gates of these devices are  
essentially capacitors. Circuits that leave the gate  
opencircuited or floating should be avoided.  
These conditions can result in turnon of the  
device due to voltage buildup on the input  
capacitor due to leakage currents or pickup.  
7. Gate Protection - These devices do not have an  
internal monolithic zener diode from gate to  
emitter. If gate protection is required an external  
zener is recommended.  
integral of the instantaneous power loss during turnoff. All  
tail losses are included in the calculation for E ; i.e. the  
OFF  
collector current equals zero (I = 0).  
CE  
ORDERING INFORMATION  
Part Number  
HGTG20N60B3D  
Package  
Brand  
Shipping  
450 Units / Tube  
TO247  
G20N60B3D  
NOTE: When ordering, use the entire part number.  
All brand names and product names appearing in this document are registered trademarks or trademarks of their respective holders.  
www.onsemi.com  
7
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
TO2473LD SHORT LEAD  
CASE 340CK  
ISSUE A  
DATE 31 JAN 2019  
P1  
D2  
A
E
P
A
A2  
Q
E2  
S
D1  
D
E1  
B
2
2
1
3
L1  
A1  
b4  
L
c
(3X) b  
(2X) b2  
M
M
B A  
0.25  
MILLIMETERS  
MIN NOM MAX  
4.58 4.70 4.82  
2.20 2.40 2.60  
1.40 1.50 1.60  
1.17 1.26 1.35  
1.53 1.65 1.77  
2.42 2.54 2.66  
0.51 0.61 0.71  
20.32 20.57 20.82  
(2X) e  
DIM  
A
A1  
A2  
b
b2  
b4  
c
GENERIC  
D
MARKING DIAGRAM*  
D1 13.08  
~
~
D2  
E
0.51 0.93 1.35  
15.37 15.62 15.87  
AYWWZZ  
XXXXXXX  
XXXXXXX  
E1 12.81  
~
~
E2  
e
L
4.96 5.08 5.20  
5.56  
15.75 16.00 16.25  
3.69 3.81 3.93  
3.51 3.58 3.65  
XXXX = Specific Device Code  
~
~
A
Y
= Assembly Location  
= Year  
WW = Work Week  
ZZ = Assembly Lot Code  
L1  
P
*This information is generic. Please refer to  
device data sheet for actual part marking.  
PbFree indicator, “G” or microdot “G”, may  
or may not be present. Some products may  
not follow the Generic Marking.  
P1 6.60 6.80 7.00  
Q
S
5.34 5.46 5.58  
5.34 5.46 5.58  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON13851G  
TO2473LD SHORT LEAD  
PAGE 1 OF 1  
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