FDT4N50NZU [ONSEMI]

Power MOSFET, N-Channel, UniFET II, Ultra FRFET, 500 V, 2 A, 3.0 Ω, SOT223;
FDT4N50NZU
型号: FDT4N50NZU
厂家: ONSEMI    ONSEMI
描述:

Power MOSFET, N-Channel, UniFET II, Ultra FRFET, 500 V, 2 A, 3.0 Ω, SOT223

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Is Now  
To learn more about onsemi™, please visit our website at  
www.onsemi.com  
onsemi andꢀꢀꢀꢀꢀꢀꢀand other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates and/or  
subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of onsemi  
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or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application  
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Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. Other names and brands may be claimed as the property of others.  
MOSFET - Power,  
N-Channel, UniFETt II,  
Ultra FRFETt  
500 V, 2 A, 3 W  
FDT4N50NZU  
Description  
www.onsemi.com  
UniFET II MOSFET is ON Semiconductor’s high voltage  
MOSFET family based on advanced planar stripe and DMOS  
technology. This advanced MOSFET family has the smallest onstate  
resistance among the planar MOSFET, and also provides superior  
switching performance and higher avalanche energy strength. In  
addition, internal gatesource ESD diode allows UniFET II MOSFET  
to withstand over 2 kV HBM surge stress. UniFET II Ultra FRFET  
MOSFET has much superior body diode reverse recovery  
performance. Its trr is less than 50 nsec and the reverse dv/dt immunity  
is 20 V/nsec while normal planar MOSFETs have over 200 nsec and  
4.5 V/nsec respectively. Therefore UniFET II Ultra FRFET MOSFET  
can remove additional component and improve system reliability in  
certain applications that require performance improvement of the  
MOSFET’s body diode. This device family is suitable for switching  
power converter applications such as power factor correction (PFC),  
flat panel display (FPD) TV power, ATX and electronic lamp ballasts.  
V
R
MAX  
I MAX  
D
DSS  
DS(ON)  
500 V  
3
@
1
0
V
2 A  
D
G
S
POWER MOSFET  
D
Features  
Typ. R  
= 2.42 ꢀ  
DS(on)  
G
D
Ultra Low Gate Charge (Typ. Q = 9.1 nC)  
g
S
100% Avalanche Tested  
SOT223  
(TO261)  
CASE 318E  
These Devices are PbFree, Halogen Free/BFR Free and are RoHS  
Compliant  
Applications  
MARKING DIAGRAM  
Computing / Display Power Supplies  
Industrial Power Supplies  
Consumer Power Supplies  
D
AYW  
4N50U  
G
D
S
A
Y
= Assembly Location  
= Year  
W
= Work Week  
4N50U = Device Code  
ORDERING INFORMATION  
See detailed ordering and shipping information on page 2 of  
this data sheet.  
© Semiconductor Components Industries, LLC, 2019  
1
Publication Order Number:  
February, 2021 Rev. 1  
FDT4N50NZU/D  
FDT4N50NZU  
ABSOLUTE MAXIMUM RATINGS (T = 25°C, Unless otherwise noted)  
C
Symbol  
Parameter  
Value  
Unit  
V
V
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current  
500  
DSS  
GSS  
V
DC  
Continuous (T = 25°C)  
25  
V
I
D
2
A
C
Continuous (T = 100°C)  
1.2  
C
I
Drain Current  
Pulsed (Note 1)  
6
A
mJ  
A
DM  
E
Single Pulsed Avalanche Energy (Note 2)  
Avalanche Current (Note 2)  
46  
AS  
AS  
I
2
E
Repetitive Avalanche Energy (Note 1)  
Peak Diode Recovery dv/dt (Note 3)  
Power Dissipation  
2
mJ  
V/ns  
W
AR  
dv/dt  
20  
2
P
(T = 25°C)  
C
D
Derate Above 25°C  
0.02  
W/°C  
°C  
T , T  
Operating and Storage Temperature Range  
55 to +150  
300  
J
STG  
T
L
Maximum Lead Temperature for Soldering, 1/8from Case for 5 seconds  
°C  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
NOTE: Drain current limited by maximum junction temperature.  
1. Repetitive rating: pulsewidth limited by maximum junction temperature.  
2. I = 2 A, R = 25 , starting T = 25°C.  
AS  
G
J
3. I 3 A, di/dt 100 A/s, V 400 V, starting T = 25°C.  
SD  
DD  
J
THERMAL CHARACTERISTICS  
Symbol  
Parameter  
Value  
Unit  
2
R
Thermal Resistance, Junction to Ambient, (1 in Pad of 2 oz. Copper) Max.  
60  
_C/W  
JA  
PACKAGE MARKING AND ORDERING INFORMATION  
Part Number  
Top Marking  
Package  
Packing Method  
Reel Size  
Tape Width  
12 mm  
Quantity  
FDT4N50NZU  
FDT4N50NZU  
SOT223  
Tape & Reel  
330 mm  
4000 Units  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging  
Specifications Brochure, BRD8011/D.  
www.onsemi.com  
2
 
FDT4N50NZU  
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)  
C
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
OFF CHARACTERISTICS  
BV  
Drain to Source Breakdown Voltage  
V
I
= 0 V, I = 250 A, T = 25_C  
500  
V
DSS  
GS  
D
J
B
V
/
T
Breakdown Voltage Temperature  
Coefficient  
= 1 mA, Referenced to 25_C  
0.55  
4.6  
V/_C  
DSS  
J
D
I
Zero Gate Voltage Drain Current  
V
DS  
V
DS  
V
GS  
= 500 V, V = 0 V  
1
A
DSS  
GS  
= 400 V, T = 125_C  
C
I
Gate to Body Leakage Current  
=
25 V, V = 0 V  
10  
A
GSS  
DS  
ON CHARACTERISTICS  
V
Gate Threshold Voltage  
V
GS  
V
GS  
V
DS  
= V , I = 250 A  
3.5  
5.5  
3
V
S
GS(th)  
DS(on)  
DS  
D
R
Static Drain to Source On Resistance  
Forward Transconductance  
= 10 V, I = 1 A  
2.42  
1
D
g
FS  
= 20 V, I = 1 A  
D
DYNAMIC CHARACTERISTICS  
C
Input Capacitance  
V
= 25 V, V = 0 V, f = 1 MHz  
476  
43  
pF  
pF  
pF  
nC  
nC  
nC  
iss  
DS  
GS  
C
Output Capacitance  
oss  
C
Reverse Transfer Capacitance  
Total Gate Charge at 10 V  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
2.7  
9.1  
2.9  
3.3  
rss  
Q
V
DS  
= 400 V, I = 3 A, V = 10 V  
D GS  
g(tot)  
(Note 4)  
Q
gs  
Q
gd  
SWITCHING CHARACTERISTICS  
t
Turn-On Delay Time  
Turn-On Rise Time  
Turn-Off Delay Time  
Turn-Off Fall Time  
V
= 250 V, I = 3 A, V = 10 V,  
16  
16  
34  
15  
ns  
ns  
ns  
ns  
d(on)  
DD  
g
D
GS  
R = 25  
t
r
(Note 4)  
t
d(off)  
t
f
SOURCE-DRAIN DIODE CHARACTERISTICS  
I
Maximum Continuous Source to Drain Diode Forward Current  
Maximum Pulsed Source to Drain Diode Forward Current  
2
6
A
A
S
I
SM  
V
Source to Drain Diode Forward Voltage  
Reverse Recovery Time  
V
V
= 0 V, I = 1 A  
1.2  
V
SD  
GS  
SD  
t
= 400 V, I = 3 A, dI /  
24  
18  
ns  
nC  
rr  
DD  
SD  
F
dt = 100 A/s  
Q
Reverse Recovery Charge  
rr  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
4. Essentially independent of operating temperature typical characteristics.  
www.onsemi.com  
3
 
FDT4N50NZU  
TYPICAL CHARACTERISTICS  
6
250 s Pulse Test  
= 25°C  
V
DS  
= 20 V  
T
C
6
4
V
GS  
= 20 V  
7.0 V  
6.5 V  
5
4
3
2
15 V  
10 V  
8.0 V  
T = 150°C  
J
T = 25°C  
J
2
0
6.0 V  
18  
1
0
2
4
6
8
10  
12  
14  
16  
20  
3
0
0
4
5
6
7
8
9
V
, DRAINTOSOURCE VOLTAGE (V)  
V
GS  
, GATETOSOURCE VOLTAGE (V)  
DS  
Figure 1. OnRegion Characteristics  
Figure 2. Transfer Characteristics  
3.8  
3.6  
10  
1
V
= 10 V  
GS  
T = 25°C  
T = 150°C  
J
J
3.4  
3.2  
3.0  
2.8  
2.6  
2.4  
T = 25°C  
J
0.1  
0.01  
2.2  
2.0  
V
= 0 V  
1.5  
GS  
0.001  
0
1
2
3
4
5
6
7
0.5  
1.0  
2.0  
I , DRAIN CURRENT (A)  
V
, BODY DIODE FORWARD VOLTAGE (V)  
D
SD  
Figure 3. OnResistance Variation vs. Drain  
Figure 4. Body Diode Forward Voltage  
Variation vs. Source Current and Temperature  
Current and Gate Voltage  
1000  
100  
10  
8
V
= 100 V  
DD  
C
iss  
V
DD  
= 250 V  
V
= 400 V  
DD  
6
C
oss  
4
10  
1
2
0
f = 1 MHz  
= 0 V  
C
rss  
V
I
D
= 3 A  
8
GS  
0.1  
1
10  
100  
2
4
6
10  
V
DS  
, DRAINTOSOURCE VOLTAGE (V)  
CHARGE (nC)  
Figure 5. Capacitance Characteristics  
Figure 6. Gate Charge Characteristics  
www.onsemi.com  
4
FDT4N50NZU  
TYPICAL CHARACTERISTICS  
2.00  
1.2  
1.1  
1.0  
I
V
= 250 A  
D
I
D
= 1 A  
= 0 V  
GS  
1.75  
1.50  
1.25  
1.00  
V
GS  
= 10 V  
0.9  
0.8  
0.75  
0.50  
75  
25  
25  
75  
125  
175  
1000  
0.01  
0
25  
50  
75  
100  
125  
150  
175  
T , AMBIENT TEMPERATURE (°C)  
J
T , JUNCTION TEMPERATURE (°C)  
J
Figure 7. Breakdown Voltage Variation vs.  
Temperature  
Figure 8. OnResistance Variation vs.  
Temperature  
2.5  
2.0  
1.5  
1.0  
Operation in this area  
is limited by R  
10  
1
DS(on)  
100 s  
1 ms  
10 ms  
0.1  
T
= 25°C  
C
0.5  
0
100 ms  
DC  
T = 150°C  
Single Pulse  
J
0.01  
1
10  
100  
25  
50  
75  
100  
125  
150  
V
, DRAINTOSOURCE VOLTAGE (V)  
T , CASE TEMPERATURE (°C)  
DS  
C
Figure 9. Maximum Safe Operating Area  
Figure 10. Maximum Drain Current vs. Case  
Temperature  
10  
1
0.1  
0.05  
Duty Cycle = 0.5  
0.2  
0.1  
0.01  
0.02  
0.01  
1E03  
1E04  
P
DM  
Notes:  
Z
T
(t) = 60°C/W Max.  
JA  
t
T = P  
x Z (t)  
DM JC  
1
JM  
C
Single Pulse  
1E05  
1E06  
Duty Factor, D = t /t  
t
1
2
2
1E06  
1E05  
0.0001  
0.001  
0.1  
1
10  
100  
1000  
t, SQUARE WAVE PULSE DURATION (sec)  
Figure 11. Transient Thermal Response  
www.onsemi.com  
5
FDT4N50NZU  
V
GS  
R
Q
g
L
V
DS  
Q
Q
gs  
gd  
V
GS  
DUT  
I
G
= Const.  
Charge  
Figure 12. Gate Charge Test Circuit & Waveform  
R
L
V
DS  
GS  
90%  
90%  
10%  
90%  
V
DS  
V
DD  
V
GS  
R
G
10%  
V
DUT  
V
GS  
t
t
d(off)  
t
r
t
f
d(on)  
t
on  
t
off  
Figure 13. Resistive Switching Test Circuit & Waveforms  
L
2
1
2
EAS  
+
@ LIAS  
V
DS  
BV  
DSS  
I
D
I
AS  
R
G
V
DD  
I (t)  
D
DUT  
V
DD  
V
GS  
V
DS  
(t)  
t
p
Time  
t
p
Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms  
www.onsemi.com  
6
FDT4N50NZU  
+
DUT  
V
DS  
I
SD  
L
Driver  
R
G
Same Type  
as DUT  
V
DD  
V
GS  
dv/dt controlled by R  
G
I controlled by pulse period  
SD  
Gate Pulse Width  
D +  
Gate Pulse Period  
V
GS  
10 V  
(Driver)  
I
, Body Diode Forward Current  
FM  
I
di/dt  
SD  
(DUT)  
I
RM  
Body Diode Reverse Current  
Body Diode Recovery dv/dt  
V
DS  
V
DD  
V
SD  
(DUT)  
Body Diode  
Forward Voltage Drop  
Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms  
Ultra FRFET and UniFET are trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other coun-  
tries.  
www.onsemi.com  
7
FDT4N50NZU  
PACKAGE DIMENSIONS  
SOT223 (TO261)  
CASE 318E04  
ISSUE R  
q
q
www.onsemi.com  
8
FDT4N50NZU  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
PUBLICATION ORDERING INFORMATION  
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