FAM65HR51XS1 [ONSEMI]

H-Bridge in APM16 Series for LLC and Phase-shifted DC-DC Converter;
FAM65HR51XS1
型号: FAM65HR51XS1
厂家: ONSEMI    ONSEMI
描述:

H-Bridge in APM16 Series for LLC and Phase-shifted DC-DC Converter

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H-Bridge in APM16 Series  
for LLC and Phase-shifted  
DC-DC Converter  
FAM65HR51XS1,  
FAM65HR51XS2  
www.onsemi.com  
Features  
SIP or DIP HBridge Power Module for Onboard Charger (OBC) in  
EV or PHEV  
5 kV/1 sec Electrically Isolated Substrate for Easy Assembly  
Creepage and Clearance per IEC606641, IEC 609501  
Compact Design for Low Total Module Resistance  
Module Serialization for Full Traceability  
Lead Free, RoHS and UL94V0 Compliant  
Automotive Qualified per AEC Q101 and AQG324 Guidelines  
APMCAA16  
16 LEAD  
CASE MODGF  
Applications  
DCDC Converter for Onboard Charger in EV or PHEV  
Benefits  
Enable Design of Small, Efficient and Reliable System for Reduced  
Vehicle Fuel Consumption and CO Emission  
2
Simplified Assembly, Optimized Layout, High Level of Integration,  
and Improved Thermal Performance  
APMCAB16  
16 LEAD  
CASE MODGJ  
MARKING DIAGRAM  
XXXXXXXXXXX  
ZZZ ATYWW  
NNNNNNN  
XXXX = Specific Device Code  
ZZZ = Lot ID  
AT  
Y
= Assembly & Test Location  
= Year  
W
= Work Week  
NNN = Serial Number  
ORDERING INFORMATION  
See detailed ordering, marking and shipping information on  
page 2 of this data sheet.  
© Semiconductor Components Industries, LLC, 2020  
1
Publication Order Number:  
June, 2021 Rev. 3  
FAM65HR51XS1/D  
FAM65HR51XS1, FAM65HR51XS2  
ORDERING INFORMATION  
Snubber  
DBC  
PbFree and  
Operating  
Packing  
Capacitor Inside Material RoHS Compliant Temperature (T ) Method  
Part Number  
FAM65HR51XS1  
FAM65HR51XS2  
Package  
Lead Forming  
YShape  
A
APM16CAA  
APM16CAB  
Yes  
Yes  
ALN  
ALN  
Yes  
Yes  
40°C ~ 125°C  
40°C ~ 125°C  
Tube  
Tube  
LShape  
Pin Configuration and Description  
Figure 1. Pin Configuration  
Table 1. PIN DESCRIPTION  
Pin Number  
Pin Name  
AC1  
Pin Description  
Phase 1 Leg of the HBridge  
Source Sense of Q1  
1, 2  
3
Q1 Sense  
Q1 Gate  
B+  
4
Gate Terminal of Q1  
5, 6  
7, 8  
9
Positive Battery Terminal  
Negative Battery Terminal  
Source Sense of Q2  
B−  
Q2 Sense  
Q2 Gate  
Q4 Sense  
Q4 Gate  
Q3 Sense  
Q3 Gate  
AC2  
10  
Gate Terminal of Q2  
11  
Source Sense of Q4  
12  
Gate Terminal of Q4  
13  
Source Sense of Q3  
14  
Gate Terminal of Q3  
15, 16  
Phase 2 Leg of the HBridge  
www.onsemi.com  
2
FAM65HR51XS1, FAM65HR51XS2  
INTERNAL EQUIVALENT CIRCUIT  
Figure 2. Internal Block Diagram  
Table 2. ABSOLUTE MAXIMUM RATINGS (T = 25°C, Unless Otherwise Specified)  
J
Symbol  
Parameter  
Max  
Unit  
V
V
V
(Q1~Q4)  
(Q1~Q4)  
DraintoSource Voltage  
GatetoSource Voltage  
650  
DS  
GS  
20  
V
Drain Current Continuous (T = 25°C, V = 10 V) (Note 1)  
64  
40  
A
I
D
(Q1~Q4)  
C
GS  
Drain Current Continuous (T = 100°C, V = 10 V) (Note 1)  
A
C
GS  
E
E
(Q1~Q4)  
(Q1~Q4)  
Single Pulse Avalanche Energy (Note 2)  
623  
mJ  
mJ  
A
AS  
Single Pulse Avalanche Energy (Note 2)  
Avalanche Current  
21  
AS  
I
AS  
6.5  
P
Power Dissipation (Note 1)  
Maximum Junction Temperature  
Maximum Case Temperature  
Storage Temperature  
463  
W
°C  
°C  
°C  
D
T
55 to +150  
40 to +125  
40 to +125  
J
T
C
T
STG  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Maximum continuous current and power, without switching losses, to reach T = 150°C respectively at T = 25°C and T = 100°C; defined  
J
C
C
by design based on MOSFET R  
and R  
and not subject to production test  
q
DS(ON)  
JC  
2. 623 mJ is characterized at T = 25°C, L = 29.5 mH, I = 6.5 A, V = 145 V.  
J
AS  
DD  
21 mJ is 100% tested at L = 1 mH, I = 6.5 A.  
AS  
Table 3. COMPONENTS (Note 3)  
Device  
Parameter  
Capacitance  
Rated Voltage  
Condition  
Min  
Typ  
150  
630  
Max  
165  
Unit  
nF  
V
Capacitor (Snubber)  
AEC Q200 qualified  
T = 25°C  
J
135  
3. These values are obtained from the specification provided by the manufacturer.  
DBC Substrate  
Flammability Information  
0.63 mm ALN alumina with 0.3 mm copper on both sides.  
DBC substrate is NOT nickel plated.  
All materials present in the power module meet UL  
flammability rating class 94V0.  
Lead Frame  
Compliance to RoHS Directives  
OFC copper alloy, 0.50 mm thick. Plated with 8 um to  
25.4 um thick Matte Tin  
The power module is 100% lead free and RoHS compliant  
2000/53/C directive.  
Solder  
Solder used is a lead free SnAgCu alloy.  
www.onsemi.com  
3
 
FAM65HR51XS1, FAM65HR51XS2  
Solder presents high risk to melt at temperature beyond  
mounting on the PCB or during welding to prevent the  
210°C. Base of the leads, at the interface with the package  
body, should not be exposed to more than 200°C during  
remelting of the solder joints.  
Table 4. ELECTRICAL SPECIFICATIONS (T = 25°C, Unless Otherwise Specified)  
J
Symbol  
Parameter  
Conditions  
I = 1 mA, V = 0 V  
D
Min  
650  
3.0  
Typ  
Max  
Unit  
V
BV  
DraintoSource Breakdown Voltage  
Gate to Source Threshold Voltage  
Q1 – Q4 MOSFET On Resistance  
Q1 – Q4 MOSFET On Resistance  
Forward Transconductance  
DSS  
GS  
V
GS(th)  
V
GS  
= V , I = 3.3 mA  
5.0  
51  
V
DS  
D
R
R
V
GS  
= 10 V, I = 20 A  
44  
79  
30  
mW  
mW  
S
DS(ON)  
DS(ON)  
D
V
GS  
= 10 V, I = 20 A, T = 125°C (Note 4)  
D
J
g
FS  
V
DS  
= 20 V, I = 20 A (Note 4)  
D
I
GatetoSource Leakage Current  
DraintoSource Leakage Current  
V
=
20 V, V = 0 V  
100  
+100  
10  
nA  
mA  
GSS  
GS  
DS  
DS  
I
V
= 650 V, V = 0 V  
DSS  
GS  
DYNAMIC CHARACTERISTICS (Note 4)  
C
Input Capacitance  
V
V
f = 1 MHz  
= 400 V  
4864  
109  
16  
pF  
pF  
pF  
pF  
W
iss  
DS  
= 0 V  
GS  
C
Output Capacitance  
oss  
C
Reverse Transfer Capacitance  
Effective Output Capacitance  
Gate Resistance  
rss  
C
V
DS  
= 0 to 520 V, V = 0 V  
652  
2
oss(eff)  
GS  
R
f = 1 MHz  
g
Q
Total Gate Charge  
V
DS  
= 380 V  
= 20 A  
= 0 to 10 V  
123  
37.5  
49  
nC  
nC  
nC  
g(tot)  
I
D
Q
GatetoSource Gate Charge  
GatetoDrain “Miller” Charge  
gs  
V
GS  
Q
gd  
SWITCHING CHARACTERISTICS (Note 4)  
t
Turnon Time  
V
= 400 V  
= 20 A  
87  
47  
ns  
ns  
ns  
ns  
ns  
ns  
on  
DS  
I
D
t
t
Turnon Delay Time  
Turnon Rise Time  
Turnoff Time  
d(on)  
V
R
= 10 V  
GS  
t
r
43  
= 4.7 W  
G
t
148  
118  
29  
off  
d(off)  
Turnoff Delay Time  
Turnoff Fall Time  
t
f
BODY DIODE CHARACTERISTICS  
V
SourcetoDrain Diode Voltage  
Reverse Recovery Time  
I
= 20 A, V = 0 V  
0.95  
133  
669  
V
SD  
SD  
GS  
T
V
= 520 V, I = 20 A,  
ns  
nC  
rr  
DS  
t
D
d /d = 100 A/ms (Note 4)  
I
Q
Reverse Recovery Charge  
rr  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
4. Defined by design, not subject to production test  
Table 5. THERMAL RESISTANCE  
Parameters  
Min  
Typ  
0.19  
0.75  
Max  
0.27  
Unit  
°C/W  
°C/W  
R
R
(per chip)  
(per chip)  
Q1~Q4 Thermal Resistance JunctiontoCase (Note 5)  
Q1~Q4 Thermal Resistance JunctiontoSink (Note 6)  
θ
JC  
JS  
θ
5. Test method compliant with MIL STD 8831012.1, from case temperature under the chip to case temperature measured below the package  
at the chip center, Cosmetic oxidation and discoloration on the DBC surface allowed  
6. Defined by thermal simulation assuming the module is mounted on a 5 mm Al360 die casting material with 30 um of 1.8 W/mK thermal  
interface material  
Table 6. ISOLATION (Isolation resistance at tested voltage from the base plate to control pins or power terminals.)  
Test  
Test Conditions  
Isolation Resistance  
Unit  
Leakage @ Isolation Voltage (HiPot)  
V
AC  
= 5 kV, 50 Hz  
100M <  
W
www.onsemi.com  
4
 
FAM65HR51XS1, FAM65HR51XS2  
PARAMETER DEFINITIONS  
Reference to Table 4: Parameter of Electrical Specifications  
BV  
Q1 – Q4 MOSFET DraintoSource Breakdown Voltage  
DSS  
The maximum draintosource voltage the MOSFET can endure without the avalanche breakdown of the bodydrain  
PN junction in off state.  
The measurement conditions are to be found in Table 4.  
The typ. Temperature behavior is described in Figure 13  
V
GS(th)  
Q1 – Q4 MOSFET Gate to Source Threshold Voltage  
The gatetosource voltage measurement is triggered by a threshold ID current given in conditions at Table 3.  
The typ. Temperature behavior can be found in Figure 12  
R
Q1 – Q4 MOSFET On Resistance  
DS(ON)  
RDS(on) is the total resistance between the source and the drain during the on state.  
The measurement conditions are to be found in Table 4.  
The typ behavior can be found in Figure 10 and Figure 11 as well as Figure 17  
g
FS  
Q1 – Q4 MOSFET Forward Transconductance  
Transconductance is the gain in the MOSFET, expressed in the Equation below.  
It describes the change in drain current by the change in the gatesource bias voltage: g = [ DI / DV ]  
fs  
DS  
GS VDS  
I
Q1 – Q4 MOSFET GatetoSource Leakage Current  
GSS  
The current flowing from Gate to Source at the maximum allowed VGS  
The measurement conditions are described in the Table 4.  
I
Q1 – Q4 MOSFET DraintoSource Leakage Current  
DSS  
Drain – Source current is measured in off state while providing the maximum allowed drainto-source voltage and the  
gate is shorted to the source.  
IDSS has a positive temperature coefficient.  
www.onsemi.com  
5
FAM65HR51XS1, FAM65HR51XS2  
Figure 3. Timing Measurement Variable Definition  
Table 7. PARAMETER OF SWITCHING CHARACTERISTICS  
TurnOn Delay (t  
)
This is the time needed to charge the input capacitance, Ciss, before the load current ID starts flowing.  
The measurement conditions are described in the Table 4.  
For signal definition please check Figure 3 above.  
d(on)  
Rise Time (t )  
The rise time is the time to discharge output capacitance, Coss.  
After that time the MOSFET conducts the given load current ID.  
The measurement conditions are described in the Table 4.  
For signal definition please check Figure 3 above.  
r
TurnOn Time (t  
)
Is the sum of turnondelay and rise time  
on  
TurnOff Delay (t  
)
td(off) is the time to discharge Ciss after the MOSFET is turned off.  
During this time the load current ID is still flowing  
d(off)  
The measurement conditions are described in the Table 4.  
For signal definition please check Figure 3 above.  
Fall Time (t )  
The fall time, tf, is the time to charge the output capacitance, Coss.  
During this time the load current drops down and the voltage VDS rises accordingly.  
The measurement conditions are described in the Table 4.  
f
For signal definition please check Figure 3 above.  
TurnOff Time (t  
)
Is the sum of turnoffdelay and fall time  
off  
www.onsemi.com  
6
 
FAM65HR51XS1, FAM65HR51XS2  
TYPICAL CHARACTERISTICS  
1.2  
1.0  
0.8  
0.6  
0.4  
70  
60  
V
= 10 V  
GS  
50  
40  
30  
20  
R
= 0.27°C/W  
q
JC  
R
= 0.27°C/W  
q
JC  
0.2  
0
10  
0
0
3
0
25  
50  
75  
100  
125  
150  
25  
50  
75  
100  
125  
150  
T , CASE TEMPERATURE (°C)  
T , CASE TEMPERATURE (°C)  
C
C
Figure 4. Normalized Power Dissipation vs.  
Case  
Figure 5. Maximum Continuous ID vs. Case  
Temperature  
V = 0 V  
GS  
60  
50  
40  
30  
20  
V
= 20 V  
DS  
100  
10  
1
T = 25°C  
J
T = 150°C  
T = 25°C  
J
J
0.1  
T = 150°C  
J
10  
0
T = 55°C  
J
0.01  
4
5
6
7
8
0
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
1.4  
V
, GATETOSOURCE VOLTAGE (V)  
V
SD  
, BODY DIODE FORWARD VOLTAGE (V)  
GS  
Figure 6. Transfer Characteristics  
Figure 7. Forward Diode  
100  
90  
80  
70  
60  
50  
40  
30  
20  
80  
70  
60  
50  
40  
30  
20  
V
= 15 V  
10 V  
GS  
8.0 V  
V
GS  
= 15 V  
10 V  
7.0 V  
6.0 V  
8.0 V  
7.0 V  
6.0 V  
5.5 V  
5.0 V  
5.5 V  
5.0 V  
10  
0
10  
0
1
2
3
4
5
6
7
8
9
10  
0
10 20 30  
40 50 60 70  
80 90 100  
V
DS  
, DRAINTOSOURCE VOLTAGE (V)  
V
DS  
, DRAINTOSOURCE VOLTAGE (V)  
Figure 8. On Region Characteristics (255C)  
Figure 9. On Region Characteristics (1505C)  
www.onsemi.com  
7
FAM65HR51XS1, FAM65HR51XS2  
TYPICAL CHARACTERISTICS  
200  
150  
100  
2.5  
I
V
= 20 A  
I
D
= 20 A  
D
= 10 V  
GS  
2.0  
1.5  
1.0  
T = 150°C  
J
T = 25°C  
J
50  
0
0.5  
0
5.5  
6.5  
7.5  
8.5  
9.5  
75 50 25  
0
25  
50 75 100 125 150 175  
V
GS  
, GATETOSOURCE VOLTAGE (V)  
T , JUNCTION TEMPERATURE (°C)  
J
Figure 10. OnResistance vs. GatetoSource  
Figure 11. RDS(norm) vs. Junction Temperature  
Voltage  
1.2  
1.0  
1.2  
1.1  
1.0  
I
D
= 3.3 mA  
I = 10 A  
D
0.8  
0.6  
0.9  
0.8  
75 50 25  
0
25 50 75 100 125 150 175  
75 50 25  
0
25 50 75 100 125 150 175  
T , AMBIENT TEMPERATURE (°C)  
A
T , AMBIENT TEMPERATURE (°C)  
A
Figure 12. Normalized Gate Threshold Voltage  
vs. Temperature  
Figure 13. Normalized Breakdown Voltage vs.  
Temperature  
30  
25  
20  
15  
10  
100K  
10K  
1K  
C
ISS  
C
C
OSS  
100  
RSS  
V
= 0 V  
GS  
10  
1
5
0
f = 1 MHz  
0
100  
200  
300  
400  
500  
600  
700  
0.1  
1
10  
100  
1000  
V
DS  
, DRAINTOSOURCE VOLTAGE (V)  
V
DS  
, DRAINTOSOURCE VOLTAGE (V)  
Figure 14. Eoss vs. DraintoSource Voltage  
Figure 15. Capacitance Variation  
www.onsemi.com  
8
FAM65HR51XS1, FAM65HR51XS2  
TYPICAL CHARACTERISTICS  
10  
8
0.060  
T
C
= 25°C  
V
DD  
= 130 V  
0.055  
0.050  
V
DD  
= 400 V  
V
GS  
= 10 V  
6
4
V
GS  
= 20 V  
0.045  
0.040  
2
0
0
40  
80  
120  
160  
0
20  
40  
60  
80  
Q , GATE CHARGE (nC)  
G
I , DRAIN CURRENT (A)  
D
Figure 16. Gate Charge Characteristics  
Figure 17. ONResistance Variation with Drain  
Current and Gage Voltage  
1000  
100  
10  
T
R
= 25°C  
For temperatures above 25°C  
C
= 0.27°C/W  
derate peak current as follows:  
q
JC  
100  
Single Pulse  
1 ms  
150 * T  
C
Ǹ
I + I  
 
2
125  
10 ms  
Limited I  
240 A  
DM  
100 ms  
1 ms  
10 ms  
100  
Notes:  
= 0.27°C/W  
1
R
Limit  
DS(on)  
R
100 ms  
q
JC  
Thermal Limit  
Package Limit  
Peak T = P  
x Z (t) + T  
q
JC C  
J
DM  
Single Pulse  
0.000001 0.00001 0.0001 0.001  
t, PULSE WIDTH (sec)  
Duty Cycle, D = t /t  
1
2
0.1  
10  
0.1  
1
10  
1000  
0.01  
0.1  
1
V
DS  
, DRAINTOSOURCE VOLTAGE (V)  
Figure 18. Safe Operating Area  
Figure 19. Peak Current Capability  
1
Duty Cycle = 0.5  
0.2  
0.1  
0.1  
0.05  
0.02  
0.01  
P
DM  
0.01  
Notes:  
Single Pulse  
R
= 0.27°C/W  
q
JC  
t
Peak T = P  
x Z (t) + T  
q
JC C  
1
J
DM  
t
Duty Cycle, D = t /t  
2
1
2
0.001  
0.00001  
0.0001  
0.001  
t, PULSE WIDTH (sec)  
0.01  
0.1  
1
Figure 20. Transient Thermal Impedance  
www.onsemi.com  
9
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
APMCAA16 / 16LD, AUTOMOTIVE MODULE  
CASE MODGF  
ISSUE C  
DATE 03 NOV 2021  
GENERIC  
MARKING DIAGRAM*  
XXXX = Specific Device Code  
ZZZ = Lot ID  
*This information is generic. Please refer to  
device data sheet for actual part marking.  
PbFree indicator, “G” or microdot “G”, may  
or may not be present. Some products may  
not follow the Generic Marking.  
AT  
Y
W
= Assembly & Test Location  
= Year  
= Work Week  
XXXXXXXXXXXXXXXX  
ZZZ ATYWW  
NNNNNNN  
NNN = Serial Number  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON94732G  
APMCAA16 / 16LD, AUTOMOTIVE MODULE  
PAGE 1 OF 1  
onsemi and  
are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves  
the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular  
purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation  
special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others.  
© Semiconductor Components Industries, LLC, 2018  
www.onsemi.com  
MECHANICAL CASE OUTLINE  
PACKAGE DIMENSIONS  
APMCAB16 / 16LD, AUTOMOTIVE MODULE  
CASE MODGJ  
ISSUE C  
DATE 03 NOV 2021  
GENERIC  
MARKING DIAGRAM*  
XXXX = Specific Device Code  
ZZZ = Lot ID  
*This information is generic. Please refer to  
device data sheet for actual part marking.  
PbFree indicator, “G” or microdot “G”, may  
or may not be present. Some products may  
not follow the Generic Marking.  
AT  
Y
W
= Assembly & Test Location  
= Year  
= Work Week  
XXXXXXXXXXXXXXXX  
ZZZ ATYWW  
NNNNNNN  
NNN = Serial Number  
Electronic versions are uncontrolled except when accessed directly from the Document Repository.  
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.  
DOCUMENT NUMBER:  
DESCRIPTION:  
98AON97133G  
APMCAB16 / 16LD, AUTOMOTIVE MODULE  
PAGE 1 OF 1  
onsemi and  
are trademarks of Semiconductor Components Industries, LLC dba onsemi or its subsidiaries in the United States and/or other countries. onsemi reserves  
the right to make changes without further notice to any products herein. onsemi makes no warranty, representation or guarantee regarding the suitability of its products for any particular  
purpose, nor does onsemi assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation  
special, consequential or incidental damages. onsemi does not convey any license under its patent rights nor the rights of others.  
© Semiconductor Components Industries, LLC, 2018  
www.onsemi.com  
onsemi,  
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates  
and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property.  
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