74HC574 [ONSEMI]

Octal 3−State Noninverting D Flip−Flop; 八路三态同相D触发器
74HC574
型号: 74HC574
厂家: ONSEMI    ONSEMI
描述:

Octal 3−State Noninverting D Flip−Flop
八路三态同相D触发器

触发器
文件: 总8页 (文件大小:128K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
74HC574  
Octal 3−State Noninverting  
D Flip−Flop  
HighPerformance SiliconGate CMOS  
The 74HC574 is identical in pinout to the LS574. The device inputs  
are compatible with standard CMOS outputs; with pullup resistors,  
they are compatible with LSTTL outputs.  
Data meeting the setup time is clocked to the outputs with the  
rising edge of the Clock. The Output Enable input does not affect the  
states of the flipflops but when Output Enable is high, all device  
outputs are forced to the highimpedance state. Thus, data may be  
stored even when the outputs are not enabled.  
http://onsemi.com  
MARKING  
DIAGRAMS  
20  
1
HC  
574  
TSSOP20  
DT SUFFIX  
CASE 948E  
20  
The HC574 is identical in function to the HC374A but has the  
flipflop inputs on the opposite side of the package from the outputs to  
facilitate PC board layout.  
ALYW G  
1
G
Features  
HC574 = Device Code  
Output Drive Capability: 15 LSTTL Loads  
Outputs Directly Interface to CMOS, NMOS, and TTL  
Operating Voltage Range: 2.0 to 6.0 V  
Low Input Current: 1.0 mA  
In Compliance with the Requirements Defined by JEDEC Standard  
No. 7A  
A
L
Y
W
G
= Assembly Location  
= Wafer Lot  
= Year  
= Work Week  
= PbFree Package  
(Note: Microdot may be in either location)  
ESD Performance: HBM > 2000 V; Machine Model > 200 V  
Chip Complexity: 266 FETs or 66.5 Equivalent Gates  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 3 of this data sheet.  
This is a PbFree Device  
©
Semiconductor Components Industries, LLC, 2007  
1
Publication Order Number:  
March, 2007 Rev. 1  
74HC574/D  
74HC574  
OUTPUT  
1
2
20  
19  
18  
17  
16  
15  
14  
13  
12  
11  
V
CC  
ENABLE  
D0  
Q0  
D1  
D2  
3
Q1  
FUNCTION TABLE  
4
Q2  
Inputs  
Clock  
Output  
OE  
D
Q
D3  
5
Q3  
L
L
L
H
L
X
X
H
D4  
6
Q4  
L
No Change  
Z
D5  
7
Q5  
L,H,  
X
H
D6  
8
Q6  
X = Don’t Care  
Z = High Impedance  
D7  
9
Q7  
GND  
10  
CLOCK  
Figure 1. Pin Assignment  
2
3
4
5
6
7
8
19  
D0  
D1  
D2  
D3  
D4  
D5  
D6  
Q0  
18  
17  
16  
15  
14  
13  
Q1  
Q2  
Q3  
Q4  
Q5  
Q6  
NONINVERTING  
OUTPUTS  
DATA  
INPUTS  
9
11  
1
12  
D7  
Q7  
CLOCK  
PIN 20 = V  
PIN 10 = GND  
CC  
OUTPUT ENABLE  
Figure 2. Logic Diagram  
Design Criteria  
Value  
Units  
Internal Gate Count*  
66.5  
ea.  
Internal Gate Propagation Delay  
Internal Gate Power Dissipation  
Speed Power Product  
1.5  
5.0  
ns  
mW  
pJ  
0.0075  
*Equivalent to a twoinput NAND gate.  
http://onsemi.com  
2
74HC574  
MAXIMUM RATINGS  
Symbol  
Parameter  
Value  
Unit  
V
V
DC Supply Voltage  
*0.5 to )7.0  
CC  
V
DC Input Voltage  
*0.5 to V )0.5  
V
I
O
CC  
V
DC Output Voltage  
(Note 1)  
*0.5 to V )0.5  
V
CC  
I
DC Input Diode Current  
DC Output Diode Current  
DC Output Sink Current  
DC Supply Current per Supply Pin  
DC Ground Current per Ground Pin  
Storage Temperature Range  
$20  
mA  
mA  
mA  
mA  
mA  
_C  
IK  
I
$35  
OK  
I
$35  
O
I
$75  
CC  
I
$75  
GND  
T
*65 to )150  
STG  
T
Lead Temperature, 1 mm from Case for 10 Seconds  
Junction Temperature under Bias  
Thermal Resistance  
260  
_C  
L
T
)150  
_C  
_C/W  
mW  
J
q
TSSOP  
TSSOP  
128  
450  
JA  
P
Power Dissipation in Still Air at 85_C  
Moisture Sensitivity  
D
MSL  
Level 1  
F
Flammability Rating  
Oxygen Index: 30% 35%  
UL 94 V0 @ 0.125 in  
R
V
ESD Withstand Voltage  
Human Body Model (Note 2)  
Machine Model (Note 3)  
>2000  
>200  
V
ESD  
I
Latchup Performance  
Above V and Below GND at 85_C (Note 4)  
$300  
mA  
Latchup  
CC  
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the  
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect  
device reliability.  
1. I absolute maximum rating must be observed.  
O
2. Tested to EIA/JESD22A114A.  
3. Tested to EIA/JESD22A115A.  
4. Tested to EIA/JESD78.  
5. For high frequency or heavy load considerations, see the ON Semiconductor HighSpeed CMOS Data Book (DL129/D).  
RECOMMENDED OPERATING CONDITIONS  
Symbol  
Parameter  
Min  
2.0  
0
Max  
Unit  
V
V
DC Supply Voltage  
(Referenced to GND)  
(Referenced to GND)  
6.0  
CC  
V , V  
DC Input Voltage, Output Voltage  
V
CC  
V
I
O
T
Operating Temperature, All Package Types  
Input Rise and Fall Time (Figure 3)  
*55  
)125  
_C  
ns  
A
t , t  
r
V
V
V
= 2.0 V  
= 4.5 V  
= 6.0 V  
0
0
0
1000  
500  
400  
f
CC  
CC  
CC  
6. Unused inputs may not be left open. All inputs must be tied to a highor lowlogic input voltage level.  
ORDERING INFORMATION  
Device  
Package  
Shipping  
74HC574DTR2G  
TSSOP20*  
2500 / Tape & Reel  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging  
Specifications Brochure, BRD8011/D.  
*This package is inherently PbFree.  
http://onsemi.com  
3
 
74HC574  
DC ELECTRICAL CHARACTERISTICS (Voltages Referenced to GND)  
V
Guaranteed Limit  
CC  
(V)  
Symbol  
Parameter  
Test Conditions  
= V – 0.1 V  
*55 to 25_C v85_C v125_C  
Unit  
V
Minimum HighLevel Input  
V
out  
2.0  
3.0  
4.5  
6.0  
1.5  
2.1  
1.5  
2.1  
1.5  
2.1  
V
IH  
out  
CC  
Voltage  
|I | v 20 mA  
3.15  
4.2  
3.15  
4.2  
3.15  
4.2  
V
Maximum LowLevel Input  
Voltage  
V
out  
= 0.1 V  
2.0  
3.0  
4.5  
6.0  
0.5  
0.9  
1.35  
1.8  
0.5  
0.9  
1.35  
1.8  
0.5  
0.9  
1.35  
1.8  
V
IL  
out  
|I | v 20 mA  
V
V
Minimum HighLevel Output  
V
out  
= V  
IH  
2.0  
4.5  
6.0  
1.9  
4.4  
5.9  
1.9  
4.4  
5.9  
1.9  
4.4  
5.9  
V
V
V
OH  
OH  
in  
Voltage  
|I | v 20 mA  
Minimum HighLevel Output  
Voltage  
V
V
= V  
= V  
|I | v 2.4 mA  
3.0  
4.5  
6.0  
2.48  
3.98  
5.48  
2.34  
3.84  
5.34  
2.2  
3.7  
5.2  
in  
IH  
out  
|I | v 6.0 mA  
out  
|I | v 7.8 mA  
out  
V
Maximum LowLevel Output  
Voltage  
2.0  
4.5  
6.0  
0.1  
0.1  
0.1  
0.1  
0.1  
0.1  
0.1  
0.1  
0.1  
OL  
in  
IL  
|I | v 20 mA  
out  
V
= V  
|I | v 2.4 mA  
3.0  
4.5  
6.0  
0.26  
0.26  
0.26  
0.33  
0.33  
0.33  
0.4  
0.4  
0.4  
in  
in  
IL  
out  
|I | v 6.0 mA  
out  
|I | v 7.8 mA  
out  
I
Maximum Input Leakage  
Current  
V
= V or GND  
6.0  
$0.1  
$1.0  
$1.0  
mA  
mA  
in  
CC  
I
Maximum ThreeState  
Leakage Current  
Output in HighImpedance State  
= V or V  
6.0  
$0.5  
$5.0  
$10  
OZ  
V
in  
IL  
IH  
V
= V or GND  
out  
CC  
I
Maximum Quiescent Supply  
Current (per Package)  
V
out  
= V or GND  
6.0  
4.0  
40  
40  
mA  
CC  
in  
CC  
I
= 0 mA  
7. Information on typical parametric values can be found in the ON Semiconductor HighSpeed CMOS Data Book (DL129/D).  
http://onsemi.com  
4
74HC574  
AC ELECTRICAL CHARACTERISTICS (C = 50 pF; Input t = t = 6.0 ns)  
L
r
f
V
Guaranteed Limit  
CC  
(V)  
Symbol  
Parameter  
*55 to 25_C v85_C v125_C  
Unit  
f
Maximum Clock Frequency (50% Duty Cycle)  
(Figures 3 and 6)  
2.0  
3.0  
4.5  
6.0  
6.0  
15  
30  
35  
4.8  
10  
24  
28  
4.0  
8.0  
20  
MHz  
max  
24  
t
t
t
,
Maximum Propagation Delay, Clock to Q  
(Figures 3 and 6)  
2.0  
3.0  
4.5  
6.0  
160  
105  
32  
200  
145  
40  
240  
190  
48  
ns  
ns  
ns  
ns  
PLH  
t
PHL  
27  
34  
41  
,
Maximum Propagation Delay, Output Enable to Q  
(Figures 4 and 7)  
2.0  
3.0  
4.5  
6.0  
150  
100  
30  
190  
125  
38  
225  
150  
45  
PLZ  
t
PHZ  
26  
33  
38  
,
Maximum Propagation Delay, Output Enable to Q  
(Figures 4 and 7)  
2.0  
3.0  
4.5  
6 0  
140  
90  
28  
24  
175  
120  
35  
210  
140  
42  
PZL  
t
PZH  
30  
36  
t
,
Maximum Output Transition Time, any Output  
(Figures 3 and 6)  
2.0  
3.0  
4.5  
6.0  
60  
27  
12  
10  
75  
32  
15  
13  
90  
36  
18  
15  
TLH  
t
THL  
C
Maximum Input Capacitance  
10  
15  
10  
15  
10  
15  
pF  
pF  
in  
C
out  
Maximum ThreeState Output Capacitance, Output in HighImpedance  
State  
8. For propagation delays with loads other than 50 pF, and information on typical parametric values, see the ON Semiconductor HighSpeed  
CMOS Data Book (DL129/D).  
Typical @ 25°C, V = 5.0 V  
CC  
C
PD  
Power Dissipation Capacitance (Per Enabled Output)*  
24  
pF  
2
*Used to determine the noload dynamic power consumption: P = C  
V
f + I  
V
. For load considerations, see the ON  
D
PD CC  
CC CC  
Semiconductor HighSpeed CMOS Data Book (DL129/D).  
TIMING REQUIREMENTS (C = 50 pF; Input t = t = 6.0 ns)  
L
r
f
Guaranteed Limit  
V
– 55 to 25_C  
v 85_C  
v 125_C  
CC  
Symbol  
Parameter  
Figure  
(V)  
Min  
Max  
Min  
Max  
Min  
Max  
Unit  
t
Minimum Setup Time, Data to Clock  
5
2.0  
3.0  
4.6  
6.0  
50  
40  
10  
9.0  
65  
50  
13  
11  
75  
60  
15  
13  
ns  
su  
t
Minimum Hold Time, Clock to Data  
Minimum Pulse Width, Clock  
5
3
3
2.0  
3.0  
4.5  
6.0  
5.0  
5.0  
5.0  
5.0  
5.0  
5.0  
5.0  
5.0  
5.0  
5.0  
5.0  
5.0  
ns  
ns  
ns  
h
t
2.0  
3.0  
4.5  
6.0  
75  
60  
15  
13  
95  
80  
19  
16  
110  
90  
22  
19  
w
t , t  
r
Maximum Input Rise and Fall Times  
2.0  
3.0  
4.5  
6.0  
1000  
800  
500  
400  
1000  
800  
500  
400  
1000  
800  
500  
400  
f
http://onsemi.com  
5
74HC574  
SWITCHING WAVEFORMS  
t
t
f
r
3.0 V  
GND  
V
CC  
1.3 V  
90%  
50%  
10%  
CLOCK  
GND  
t
t
PLZ  
PZL  
t
w
HIGH  
IMPEDANCE  
1/f  
1.3 V  
max  
Q
Q
10%  
90%  
V
V
OL  
t
t
PHL  
PLH  
t
t
PHZ  
PZH  
90%  
50%  
10%  
OH  
Q
HIGH  
IMPEDANCE  
t
t
THL  
TLH  
Figure 3.  
Figure 4.  
TEST POINT  
OUTPUT  
VALID  
V
DEVICE  
UNDER  
TEST  
CC  
DATA  
50%  
C *  
L
GND  
t
t
h
su  
V
CC  
CLOCK  
50%  
GND  
*Includes all probe and jig capacitance.  
Figure 5.  
Figure 6.  
C
Q
19  
18  
Q0  
Q1  
2
3
4
5
D0  
D
C
Q
D1  
D2  
D3  
D
C
Q
17  
16  
Q2  
Q3  
D
C
Q
TEST POINT  
1 kW  
D
CONNECT TO V WHEN  
CC  
OUTPUT  
TESTING t  
AND t  
.
PLZ  
PZL  
C
Q
15  
14  
DEVICE  
UNDER  
TEST  
Q4  
Q5  
6
7
CONNECT TO GND WHEN  
TESTING t AND t  
D4  
D5  
D
.
PZH  
PHZ  
C *  
L
C
Q
D
C
Q
13  
12  
*Includes all probe and jig capacitance.  
Q6  
Q7  
8
9
D6  
D7  
D
Figure 7. Test Circuit  
C
Q
D
11  
CLOCK  
1
OUTPUT ENABLE  
Figure 8. Expanded Logic Diagram  
http://onsemi.com  
6
74HC574  
PACKAGE DIMENSIONS  
TSSOP20  
CASE 948E02  
ISSUE C  
NOTES:  
20X K REF  
1. DIMENSIONING AND TOLERANCING PER  
ANSI Y14.5M, 1982.  
K
K1  
M
S
S
V
0.10 (0.004)  
T U  
S
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSION A DOES NOT INCLUDE MOLD  
FLASH, PROTRUSIONS OR GATE BURRS.  
MOLD FLASH OR GATE BURRS SHALL NOT  
EXCEED 0.15 (0.006) PER SIDE.  
0.15 (0.006) T U  
J J1  
20  
11  
2X L/2  
4. DIMENSION B DOES NOT INCLUDE  
INTERLEAD FLASH OR PROTRUSION.  
INTERLEAD FLASH OR PROTRUSION  
SHALL NOT EXCEED 0.25 (0.010) PER SIDE.  
5. DIMENSION K DOES NOT INCLUDE  
DAMBAR PROTRUSION. ALLOWABLE  
DAMBAR PROTRUSION SHALL BE 0.08  
(0.003) TOTAL IN EXCESS OF THE K  
DIMENSION AT MAXIMUM MATERIAL  
CONDITION.  
B
SECTION NN  
L
U−  
PIN 1  
IDENT  
0.25 (0.010)  
N
1
10  
6. TERMINAL NUMBERS ARE SHOWN FOR  
REFERENCE ONLY.  
7. DIMENSION A AND B ARE TO BE  
DETERMINED AT DATUM PLANE W.  
M
S
0.15 (0.006) T U  
A
V−  
N
MILLIMETERS  
INCHES  
DIM MIN  
MAX  
6.60  
4.50  
1.20  
0.15  
0.75  
MIN  
MAX  
0.260  
0.177  
F
A
B
6.40  
4.30  
−−−  
0.252  
0.169  
DETAIL E  
C
−−− 0.047  
0.006  
0.030  
D
0.05  
0.50  
0.002  
0.020  
F
G
H
0.65 BSC  
0.026 BSC  
W−  
0.27  
0.09  
0.09  
0.19  
0.19  
0.37  
0.20  
0.16  
0.30  
0.25  
0.011  
0.004  
0.004  
0.007  
0.007  
0.015  
0.008  
0.006  
0.012  
0.010  
C
J
J1  
K
G
D
H
K1  
L
DETAIL E  
6.40 BSC  
0.252 BSC  
0
0.100 (0.004)  
TSEATING  
M
0
8
8
_
_
_
_
PLANE  
SOLDERING FOOTPRINT*  
7.06  
1
0.65  
PITCH  
01.36X6  
16X  
1.26  
DIMENSIONS: MILLIMETERS  
*For additional information on our PbFree strategy and soldering  
details, please download the ON Semiconductor Soldering and  
Mounting Techniques Reference Manual, SOLDERRM/D.  
http://onsemi.com  
7
74HC574  
ON Semiconductor and  
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make changes without further notice  
to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
“Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All  
operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights  
nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications  
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should  
Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates,  
and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death  
associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal  
Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.  
PUBLICATION ORDERING INFORMATION  
LITERATURE FULFILLMENT:  
N. American Technical Support: 8002829855 Toll Free  
USA/Canada  
Europe, Middle East and Africa Technical Support:  
Phone: 421 33 790 2910  
Japan Customer Focus Center  
Phone: 81357733850  
ON Semiconductor Website: www.onsemi.com  
Order Literature: http://www.onsemi.com/orderlit  
Literature Distribution Center for ON Semiconductor  
P.O. Box 5163, Denver, Colorado 80217 USA  
Phone: 3036752175 or 8003443860 Toll Free USA/Canada  
Fax: 3036752176 or 8003443867 Toll Free USA/Canada  
Email: orderlit@onsemi.com  
For additional information, please contact your local  
Sales Representative  
74HC574/D  

相关型号:

74HC574-Q100

Octal D-type flip-flop; positive edge-trigger; 3-state
NEXPERIA

74HC574BQ

Octal D-type flip-flop; positive edge-trigger; 3-stateProduction
NEXPERIA

74HC574BQ-Q100

Octal D-type flip-flop; positive edge-trigger; 3-stateProduction
NEXPERIA

74HC574D

Octal D-type flip-flop; positive edge-trigger; 3-state
NXP

74HC574D

Octal D-type flip-flop; positive edge-trigger; 3-stateProduction
NEXPERIA

74HC574D-Q100

Octal D-type flip-flop; positive edge-trigger; 3-state
NEXPERIA

74HC574D-T

IC HC/UH SERIES, 8-BIT DRIVER, TRUE OUTPUT, PDSO20, PLASTIC, SO-20, Bus Driver/Transceiver
NXP

74HC574DB

IC HC/UH SERIES, 8-BIT DRIVER, TRUE OUTPUT, PDSO20, 5.30 MM, PLASTIC, MO-150, SOT339-1, SSOP-20, Bus Driver/Transceiver
NXP

74HC574DB-T

IC HC/UH SERIES, 8-BIT DRIVER, TRUE OUTPUT, PDSO20, PLASTIC, SSOP-20, Bus Driver/Transceiver
NXP

74HC574DTR2G

Octal 3−State Noninverting D Flip−Flop
ONSEMI

74HC574N

Octal D-type flip-flop; positive edge-trigger; 3-state
NXP

74HC574NB

IC HC/UH SERIES, 8-BIT DRIVER, TRUE OUTPUT, PDIP20, Bus Driver/Transceiver
NXP