PSMN1R8-40YLC [NXP]

N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower technology; N沟道40 V 1.8英里©逻辑电平LFPAK采用NextPower技术MOSFET
PSMN1R8-40YLC
型号: PSMN1R8-40YLC
厂家: NXP    NXP
描述:

N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower technology
N沟道40 V 1.8英里©逻辑电平LFPAK采用NextPower技术MOSFET

文件: 总14页 (文件大小:241K)
中文:  中文翻译
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PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using  
NextPower technology  
22 August 2012  
Product data sheet  
1. Product profile  
1.1 General description  
Logic level enhancement mode N-channel MOSFET in LFPAK package. This product  
is designed and qualified for use in a wide range of industrial, communications and  
domestic equipment.  
1.2 Features and benefits  
High reliability Power SO8 package, qualified to 175°C  
Optimised for 4.5V Gate drive utilising NextPower Superjunction technology  
Ultra low QG, QGD, & QOSS for high system efficiencies at low and high loads  
Ultra low Rdson and low parasitic inductance  
1.3 Applications  
DC-to-DC converters  
Load switching  
Power OR-ing  
Server power supplies  
Sync rectifier  
1.4 Quick reference data  
Table 1.  
Symbol  
Quick reference data  
Parameter  
Conditions  
Min  
Typ  
Max  
40  
Unit  
V
VDS  
ID  
drain-source voltage  
drain current  
25 °C ≤ Tj ≤ 175 °C  
Tmb = 25 °C; VGS = 10 V; Fig. 1  
-
-
-
-
-
[1]  
-
100  
272  
175  
A
Ptot  
Tj  
total power dissipation Tmb = 25 °C; Fig. 2  
junction temperature  
-
W
-55  
°C  
Static characteristics  
RDSon drain-source on-state  
resistance  
VGS = 4.5 V; ID = 25 A; Tj = 25 °C;  
Fig. 12  
-
-
1.8  
1.5  
2.1  
1.8  
mΩ  
mΩ  
VGS = 10 V; ID = 25 A; Tj = 25 °C;  
Fig. 12  
Dynamic characteristics  
QGD gate-drain charge  
VGS = 4.5 V; ID = 25 A; VDS = 20 V;  
Fig. 15; Fig. 14  
-
10.9  
-
nC  
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NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
QG(tot)  
total gate charge  
VGS = 4.5 V; ID = 25 A; VDS = 20 V;  
Fig. 15; Fig. 14  
-
45  
-
nC  
[1] Continuous current is limited by package.  
2. Pinning information  
Table 2.  
Pin  
Pinning information  
Symbol Description  
Simplified outline  
Graphic symbol  
mb  
D
S
1
S
S
S
G
D
source  
source  
source  
gate  
2
G
3
mbb076  
4
1
2 3 4  
mb  
mounting base; connected to  
drain  
LFPAK; Power-  
SO8 (SOT669)  
3. Ordering information  
Table 3.  
Ordering information  
Type number  
Package  
Name  
Description  
plastic single-ended surface-mounted package; 4 leads  
Version  
PSMN1R8-40YLC  
LFPAK;  
SOT669  
Power-SO8  
4. Limiting values  
Table 4.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDS  
Parameter  
Conditions  
Min  
Max  
40  
Unit  
drain-source voltage  
drain-gate voltage  
gate-source voltage  
drain current  
25 °C ≤ Tj ≤ 175 °C  
-
V
VDGR  
VGS  
25 °C ≤ Tj ≤ 175 °C; RGS = 20 kΩ  
-
40  
V
-20  
20  
V
ID  
VGS = 10 V; Tmb = 25 °C; Fig. 1  
VGS = 10 V; Tmb = 100 °C; Fig. 1  
pulsed; tp ≤ 10 µs; Tmb = 25 °C; Fig. 4  
Tmb = 25 °C; Fig. 2  
[1]  
[1]  
-
100  
100  
1128  
272  
175  
175  
260  
A
-
A
IDM  
Ptot  
Tstg  
Tj  
peak drain current  
-
A
total power dissipation  
storage temperature  
junction temperature  
peak soldering temperature  
-
W
°C  
°C  
°C  
-55  
-55  
-
Tsld(M)  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
2 / 14  
 
 
 
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
Symbol  
Parameter  
Conditions  
Min  
Max  
Unit  
VESD  
electrostatic discharge voltage MM (JEDEC JESD22-A115)  
890  
-
V
Source-drain diode  
IS  
source current  
peak source current  
Tmb = 25 °C  
[1]  
-
-
100  
A
A
ISM  
pulsed; tp ≤ 10 µs; Tmb = 25 °C  
1128  
Avalanche ruggedness  
EDS(AL)S non-repetitive drain-source  
avalanche energy  
VGS = 10 V; Tj(init) = 25 °C; ID = 100 A;  
Vsup ≤ 40 V; RGS = 50 Ω; unclamped;  
Fig. 3  
-
248  
mJ  
[1] Continuous current is limited by package.  
003aaj880  
03na19  
120  
320  
I
D
P
der  
(%)  
(A)  
240  
80  
160  
80  
0
(1)  
40  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
T
(°C)  
T
(°C)  
mb  
mb  
Fig. 1. Continuous drain current as a function of  
mounting base temperature  
Fig. 2. Normalized total power dissipation as a  
function of mounting base temperature  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
3 / 14  
 
 
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
003aaj881  
103  
I
(A)  
AL  
102  
(1)  
10  
(2)  
1
10-3  
10-2  
10-1  
1
10  
t
(ms)  
AL  
Fig. 3. Single pulse avalanche rating; avalanche current as a function of avalanche time  
003aaj882  
104  
I
D
(A)  
103  
Limit RDSon = V / I  
DS  
D
µ
tp =10  
s
102  
10  
100 µs  
DC  
1 ms  
10 ms  
100 ms  
1
10-1  
10-1  
1
10  
102  
V
(V)  
DS  
Fig. 4. Safe operating area; continuous and peak drain currents as a function of drain-source voltage  
5. Thermal characteristics  
Table 5.  
Symbol  
Thermal characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
0.55  
Unit  
Rth(j-mb)  
thermal resistance  
from junction to  
mounting base  
Fig. 5  
-
0.45  
K/W  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
4 / 14  
 
 
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
003aaj883  
1
Z
δ = 0.5  
0.2  
th(j-mb)  
(K/W)  
10-1  
0.1  
0.05  
t
p
P
δ =  
10-2  
0.02  
T
single shot  
t
t
p
T
10-3  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
1
t (s)  
p
Fig. 5. Transient thermal impedance from junction to mounting base as a function of pulse duration  
6. Characteristics  
Table 6.  
Symbol  
Characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Static characteristics  
V(BR)DSS drain-source  
breakdown voltage  
ID = 250 µA; VGS = 0 V; Tj = 25 °C  
ID = 250 µA; VGS = 0 V; Tj = -55 °C  
40  
-
-
V
V
V
36  
-
-
VGS(th)  
gate-source threshold ID = 1 mA; VDS = VGS; Tj = 25 °C;  
1.05  
1.45  
1.95  
voltage  
Fig. 10  
ID = 10 mA; VDS = VGS; Tj = 150 °C;  
Fig. 11  
0.5  
-
-
-
-
V
V
ID = 1 mA; VDS = VGS; Tj = -55 °C;  
Fig. 11  
2.25  
IDSS  
drain leakage current  
gate leakage current  
VDS = 40 V; VGS = 0 V; Tj = 25 °C  
VDS = 40 V; VGS = 0 V; Tj = 150 °C  
VGS = 16 V; VDS = 0 V; Tj = 25 °C  
VGS = -16 V; VDS = 0 V; Tj = 25 °C  
-
-
-
-
-
-
1
µA  
µA  
nA  
nA  
mΩ  
-
100  
100  
100  
2.1  
IGSS  
-
-
RDSon  
drain-source on-state  
resistance  
VGS = 4.5 V; ID = 25 A; Tj = 25 °C;  
Fig. 12  
1.8  
VGS = 4.5 V; ID = 25 A; Tj = 150 °C;  
Fig. 12; Fig. 13  
-
-
-
-
3.6  
mΩ  
mΩ  
mΩ  
VGS = 10 V; ID = 25 A; Tj = 25 °C;  
Fig. 12  
1.5  
-
1.8  
VGS = 10 V; ID = 25 A; Tj = 150 °C;  
Fig. 12; Fig. 13  
3.25  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
5 / 14  
 
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
RG  
gate resistance  
f = 1 MHz  
0.5  
1
2
Ω
Dynamic characteristics  
QG(tot)  
total gate charge  
ID = 25 A; VDS = 20 V; VGS = 10 V;  
Fig. 14; Fig. 15  
-
-
96  
45  
-
-
nC  
nC  
ID = 25 A; VDS = 20 V; VGS = 4.5 V;  
Fig. 15; Fig. 14  
ID = 0 A; VDS = 0 V; VGS = 10 V  
-
-
-
88  
-
-
-
nC  
nC  
nC  
QGS  
gate-source charge  
ID = 25 A; VDS = 20 V; VGS = 4.5 V;  
Fig. 15; Fig. 14  
15.5  
8.4  
QGS(th)  
pre-threshold gate-  
source charge  
QGS(th-pl)  
post-threshold gate-  
source charge  
-
7.1  
-
nC  
QGD  
gate-drain charge  
-
-
10.9  
2.7  
-
-
nC  
V
VGS(pl)  
gate-source plateau  
voltage  
ID = 25 A; VDS = 20 V; Fig. 15; Fig. 14  
Ciss  
Coss  
Crss  
input capacitance  
output capacitance  
VDS = 20 V; VGS = 0 V; f = 1 MHz;  
Tj = 25 °C; Fig. 16  
-
-
-
6680  
825  
-
-
-
pF  
pF  
pF  
reverse transfer  
capacitance  
310  
td(on)  
tr  
td(off)  
tf  
turn-on delay time  
rise time  
VDS = 20 V; RL = 0.8 Ω; VGS = 4.5 V;  
RG(ext) = 5 Ω  
-
-
-
-
-
32.2  
37  
-
-
-
-
-
ns  
ns  
ns  
ns  
nC  
turn-off delay time  
fall time  
62.5  
31.7  
30  
Qoss  
output charge  
VGS = 0 V; VDS = 20 V; f = 1 MHz;  
Tj = 25 °C  
Source-drain diode  
VSD source-drain voltage  
trr  
IS = 25 A; VGS = 0 V; Tj = 25 °C; Fig. 17  
-
-
-
-
0.77  
37  
1.1  
V
reverse recovery time IS = 25 A; dIS/dt = -100 A/µs; VGS = 0 V;  
-
-
-
ns  
nC  
ns  
VDS = 20 V  
Qr  
ta  
recovered charge  
43  
reverse recovery rise  
time  
VGS = 0 V; IS = 25 A; dIS/dt = -100 A/µs;  
VDS = 20 V; Fig. 18  
21  
tb  
reverse recovery fall  
time  
-
16  
-
ns  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
6 / 14  
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
003aaj884  
003aaj885  
100  
10  
I
4.5  
10  
D
3
R
2.6  
DSon  
(A)  
Ω
(m  
)
80  
60  
40  
20  
0
7.5  
5
2.4  
2.5  
0
V
(V) =  
2.2  
GS  
0
0.5  
1
1.5  
2
0
4
8
12  
16  
V
(V)  
V
(V)  
GS  
DS  
Fig. 6. Output characteristics; drain current as a  
function of drain-source voltage; typical values  
Fig. 7. Drain-source on-state resistance as a function  
of gate-source voltage; typical values  
003aaj886  
003aaj887  
300  
100  
g
I
fs  
D
(S)  
(A)  
250  
80  
200  
150  
100  
50  
60  
40  
20  
Tj = 150 °C  
Tj = 25 °C  
0
0
0
20  
40  
60  
80  
100  
(A)  
0
1
2
3
4
I
V
(V)  
GS  
D
Fig. 8. Forward transconductance as a function of  
drain current; typical values  
Fig. 9. Transfer characteristics; drain current as a  
function of gate-source voltage; typical values  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
7 / 14  
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
003aaj888  
003aaj889  
10-1  
3
I
D
V
GS(th)  
(V)  
(A)  
Max (1mA)  
10-2  
I
= 5mA  
D
2
1
0
Max  
Min  
Typ  
10-3  
10-4  
10-5  
10-6  
1mA  
Min (5mA)  
0
1
2
3
-60  
0
60  
120  
180  
T (°C)  
V
(V)  
j
GS  
Fig. 10. Sub-threshold drain current as a function of  
gate-source voltage  
Fig. 11. Gate-source threshold voltage as a function of  
junction temperature  
003aaj890  
003aaj891  
10  
2
2.4  
R
DSon  
a
2.6  
10V  
(mΩ)  
8
1.5  
6
V
=4.5V  
GS  
1
0.5  
0
4
3
4.5  
2
10  
VGS (V) =  
0
0
20  
40  
60  
80  
100  
-60  
0
60  
120  
180  
I (A)  
T (°C)  
j
D
Fig. 12. Drain-source on-state resistance as a function Fig. 13. Normalized drain-source on-state resistance  
of drain current; typical values factor as a function of junction temperature  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
8 / 14  
 
 
 
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
003aaj892  
10  
V
DS  
V
GS  
(V)  
I
D
8
V
GS(pl)  
8 V  
6
4
2
0
32 V  
V
GS(th)  
GS  
V
VDS  
=
20 V  
Q
GS1  
Q
GS2  
Q
GS  
Q
GD  
Q
G(tot)  
003aaa508  
Fig. 14. Gate charge waveform definitions  
0
20  
40  
60  
80  
Q
100  
(nC)  
G
Fig. 15. Gate-source voltage as a function of gate  
charge; typical values  
003aaj893  
003aaj894  
104  
100  
I
C
S
iss  
C
(A)  
(pF)  
80  
60  
40  
103  
C
oss  
C
rss  
20  
Tj = 150°C  
°
Tj = 25  
C
102  
10-1  
0
1
10  
102  
0
0.3  
0.6  
0.9  
V
1.2  
VDS (V)  
(V)  
SD  
Fig. 16. Input, output and reverse transfer capacitances Fig. 17. Source current as a function of source-drain  
as a function of drain-source voltage; typical  
values  
voltage; typical values  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
9 / 14  
 
 
 
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
003aaf 444  
ID  
(A)  
trr  
ta  
tb  
0
0.25 I  
RM  
IRM  
t (s)  
Fig. 18. Reverse recovery timing definition  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
10 / 14  
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
7. Package outline  
Plastic single-ended surface-mounted package (LFPAK; Power-SO8); 4 leads  
SOT669  
A
2
E
A
C
c
E
b
b
2
1
2
L
3
1
mounting  
base  
b
4
D
1
D
H
L
2
1
2
3
4
X
e
w
M
c
A
b
1/2 e  
A
(A )  
3
C
A
1
θ
L
detail X  
y
C
0
2.5  
5 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
(1)  
D
(1)  
D
(1)  
(1)  
1
A
A
A
H
L
L
L
2
w
y
θ
UNIT  
A
b
b
b
b
c
c
E
E
1
e
1
2
3
1
2
3
4
2
max  
1.20 0.15 1.10  
1.01 0.00 0.95  
0.50 4.41 2.2 0.9 0.25 0.30 4.10  
0.35 3.62 2.0 0.7 0.19 0.24 3.80  
5.0 3.3  
4.8 3.1  
6.2 0.85 1.3  
5.8 0.40 0.8  
1.3  
0.8  
8°  
0°  
mm  
0.25  
4.20  
1.27  
0.25 0.1  
Note  
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
JEITA  
06-03-16  
11-03-25  
SOT669  
MO-235  
Fig. 19. Package outline LFPAK; Power-SO8 (SOT669)  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
11 / 14  
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
In no event shall NXP Semiconductors be liable for any indirect, incidental,  
punitive, special or consequential damages (including - without limitation -  
lost profits, lost savings, business interruption, costs related to the removal  
or replacement of any products or rework charges) whether or not such  
damages are based on tort (including negligence), warranty, breach of  
contract or any other legal theory.  
8. Legal information  
8.1 Data sheet status  
Notwithstanding any damages that customer might incur for any reason  
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards  
customer for the products described herein shall be limited in accordance  
with the Terms and conditions of commercial sale of NXP Semiconductors.  
Document  
Product  
Definition  
status [1][2] status [3]  
Objective  
[short] data  
sheet  
Development This document contains data from  
the objective specification for product  
development.  
Right to make changes — NXP Semiconductors reserves the right to  
make changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
Preliminary  
[short] data  
sheet  
Qualification This document contains data from the  
preliminary specification.  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in life support, life-critical or  
safety-critical systems or equipment, nor in applications where failure or  
malfunction of an NXP Semiconductors product can reasonably be expected  
to result in personal injury, death or severe property or environmental  
damage. NXP Semiconductors and its suppliers accept no liability for  
inclusion and/or use of NXP Semiconductors products in such equipment or  
applications and therefore such inclusion and/or use is at the customer’s own  
risk.  
Product  
[short] data  
sheet  
Production  
This document contains the product  
specification.  
[1] Please consult the most recently issued document before initiating or  
completing a design.  
[2] The term 'short data sheet' is explained in section "Definitions".  
[3] The product status of device(s) described in this document may have  
changed since this document was published and may differ in case of  
multiple devices. The latest product status information is available on  
the Internet at URL http://www.nxp.com.  
Quick reference data — The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
8.2 Definitions  
Preview — The document is a preview version only. The document is still  
subject to formal approval, which may result in modifications or additions.  
NXP Semiconductors does not give any representations or warranties as to  
the accuracy or completeness of information included herein and shall have  
no liability for the consequences of use of such information.  
Customers are responsible for the design and operation of their  
applications and products using NXP Semiconductors products, and NXP  
Semiconductors accepts no liability for any assistance with applications or  
customer product design. It is customer’s sole responsibility to determine  
whether the NXP Semiconductors product is suitable and fit for the  
customer’s applications and products planned, as well as for the planned  
application and use of customer’s third party customer(s). Customers should  
provide appropriate design and operating safeguards to minimize the risks  
associated with their applications and products.  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences  
of use of such information.  
NXP Semiconductors does not accept any liability related to any default,  
damage, costs or problem which is based on any weakness or default  
in the customer’s applications or products, or the application or use by  
customer’s third party customer(s). Customer is responsible for doing all  
necessary testing for the customer’s applications and products using NXP  
Semiconductors products in order to avoid a default of the applications  
and the products or of the application or use by customer’s third party  
customer(s). NXP does not accept any liability in this respect.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is  
intended for quick reference only and should not be relied upon to contain  
detailed and full information. For detailed and full information see the  
relevant full data sheet, which is available on request via the local NXP  
Semiconductors sales office. In case of any inconsistency or conflict with the  
short data sheet, the full data sheet shall prevail.  
Product specification — The information and data provided in a Product  
data sheet shall define the specification of the product as agreed between  
NXP Semiconductors and its customer, unless NXP Semiconductors and  
customer have explicitly agreed otherwise in writing. In no event however,  
shall an agreement be valid in which the NXP Semiconductors product  
is deemed to offer functions and qualities beyond those described in the  
Product data sheet.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) will cause permanent  
damage to the device. Limiting values are stress ratings only and (proper)  
operation of the device at these or any other conditions above those  
given in the Recommended operating conditions section (if present) or the  
Characteristics sections of this document is not warranted. Constant or  
repeated exposure to limiting values will permanently and irreversibly affect  
the quality and reliability of the device.  
Terms and conditions of commercial sale — NXP Semiconductors  
products are sold subject to the general terms and conditions of commercial  
sale, as published at http://www.nxp.com/profile/terms, unless otherwise  
agreed in a valid written individual agreement. In case an individual  
agreement is concluded only the terms and conditions of the respective  
agreement shall apply. NXP Semiconductors hereby expressly objects to  
applying the customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
8.3 Disclaimers  
Limited warranty and liability — Information in this document is believed  
to be accurate and reliable. However, NXP Semiconductors does not give  
any representations or warranties, expressed or implied, as to the accuracy  
or completeness of such information and shall have no liability for the  
consequences of use of such information. NXP Semiconductors takes no  
responsibility for the content in this document if provided by an information  
source outside of NXP Semiconductors.  
No offer to sell or license — Nothing in this document may be interpreted  
or construed as an offer to sell products that is open for acceptance or the  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
12 / 14  
 
 
 
 
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
grant, conveyance or implication of any license under any copyrights, patents  
or other industrial or intellectual property rights.  
Export control — This document as well as the item(s) described herein  
may be subject to export control regulations. Export might require a prior  
authorization from competent authorities.  
Non-automotive qualified products — Unless this data sheet expressly  
states that this specific NXP Semiconductors product is automotive qualified,  
the product is not suitable for automotive use. It is neither qualified nor  
tested in accordance with automotive testing or application requirements.  
NXP Semiconductors accepts no liability for inclusion and/or use of non-  
automotive qualified products in automotive equipment or applications.  
In the event that customer uses the product for design-in and use in  
automotive applications to automotive specifications and standards,  
customer (a) shall use the product without NXP Semiconductors’ warranty  
of the product for such automotive applications, use and specifications, and  
(b) whenever customer uses the product for automotive applications beyond  
NXP Semiconductors’ specifications such use shall be solely at customer’s  
own risk, and (c) customer fully indemnifies NXP Semiconductors for any  
liability, damages or failed product claims resulting from customer design and  
use of the product for automotive applications beyond NXP Semiconductors’  
standard warranty and NXP Semiconductors’ product specifications.  
Translations — A non-English (translated) version of a document is for  
reference only. The English version shall prevail in case of any discrepancy  
between the translated and English versions.  
8.4 Trademarks  
Notice: All referenced brands, product names, service names and  
trademarks are the property of their respective owners.  
Adelante, Bitport, Bitsound, CoolFlux, CoReUse, DESFire, EZ-HV,  
FabKey, GreenChip, HiPerSmart, HITAG, I²C-bus logo, ICODE, I-CODE,  
ITEC, Labelution, MIFARE, MIFARE Plus, MIFARE Ultralight, MoReUse,  
QLPAK, Silicon Tuner, SiliconMAX, SmartXA, STARplug, TOPFET,  
TrenchMOS, TriMedia and UCODE — are trademarks of NXP B.V.  
HD Radio and HD Radio logo — are trademarks of iBiquity Digital  
Corporation.  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
13 / 14  
 
NXP Semiconductors  
PSMN1R8-40YLC  
N-channel 40 V 1.8 mΩ logic level MOSFET in LFPAK using NextPower  
technology  
9. Contents  
1
Product profile ....................................................... 1  
1.1  
1.2  
1.3  
1.4  
General description .............................................. 1  
Features and benefits ...........................................1  
Applications ..........................................................1  
Quick reference data ............................................ 1  
2
3
4
5
6
7
Pinning information ...............................................2  
Ordering information .............................................2  
Limiting values .......................................................2  
Thermal characteristics .........................................4  
Characteristics .......................................................5  
Package outline ................................................... 11  
8
Legal information .................................................12  
Data sheet status ............................................... 12  
Definitions ...........................................................12  
Disclaimers .........................................................12  
Trademarks ........................................................ 13  
8.1  
8.2  
8.3  
8.4  
© NXP B.V. 2012. All rights reserved  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 22 August 2012  
PSMN1R8-40YLC  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2012. All rights reserved  
Product data sheet  
22 August 2012  
14 / 14  

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