NVT4857UK [NXP]

SD 3.0-SDR104 compliant integrated auto-direction control memory card voltage level translator with EMI filter and ESD protection;
NVT4857UK
型号: NVT4857UK
厂家: NXP    NXP
描述:

SD 3.0-SDR104 compliant integrated auto-direction control memory card voltage level translator with EMI filter and ESD protection

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NVT4857UK  
SD 3.0-SDR104 compliant integrated auto-direction control  
memory card voltage level translator with EMI filter and ESD  
protection  
Rev. 2 — 6 June 2018  
Product data sheet  
1. General description  
The device is an SD 3.0-compliant bidirectional dual voltage level translator with  
auto-direction control. It is designed to interface between a memory card operating at  
1.8 V or 3.0 V signal levels and a host with a nominal supply voltage of 1.2 V to 1.8 V.  
The device supports SD 3.0 SDR104, SDR50, DDR50, SDR25, SDR12 and SD 2.0  
High-Speed (50 MHz) and Default-Speed (25 MHz) modes. The device has an integrated  
voltage selectable low dropout regulator to supply the card-side I/Os, an auto-enable/  
disable function connected to the VSD supply pin, built-in EMI filters and robust ESD  
protections (IEC 61000-4-2, level 4).  
2. Features and benefits  
Supports up to 208 MHz clock rate  
SD 3.0 specification-compliant voltage translation to support SDR104, SDR50,  
DDR50, SDR25, SDR12, High-Speed and Default-Speed modes  
1.2 V to 1.8 V host side interface voltage support  
Feedback channel for clock synchronization  
100 mA Low dropout voltage regulator to supply the card-side I/Os  
Low power consumption by push-pull output stage with break-before-make  
architecture  
Automatic enable and disable through VSD  
Integrated pull-up and pull-down resistors: no external resistors required  
Integrated EMI filters suppress higher harmonics of digital I/Os  
Integrated 8 kV ESD protection according to IEC 61000-4-2, level 4 on card side  
Level shifting buffers keep ESD stress away from the host (zero-clamping concept)  
20-ball WLCSP; pitch 0.4 mm  
3. Applications  
Smart phones  
Tablet PCs  
Mobile handsets  
Digital cameras  
Laptop computers  
SD, MMC or microSD card readers  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
4. Ordering information  
Table 1.  
Ordering information  
Type number  
Topside mark Package  
Name  
Description  
Version  
NVT4857UK  
N4857  
WLCSP20  
wafer level chip-size package; 20 bumps (5 4),  
NVT4857  
size 1.7 x 2.1 x 0.49 mm, 0.4 mm pitch  
4.1 Ordering options  
Table 2.  
Ordering options  
Type number  
Orderable  
Package  
Packing method  
Minimum Temperature  
part number  
order  
quantity  
NVT4857UK  
NVT4857UK  
NVT4857UKZ  
WLCSP20  
WLCSP20  
REEL 7" Q1/T1 *SPECIAL  
MARK CHIPS DP  
500  
Tamb = 40 C to +85 C  
NVT4857UKAZ  
REEL 13" Q1/T1 *SPECIAL  
MARK CHIPS DP  
10000  
Tamb = 40 C to +85 C  
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
2 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
5. Block diagram  
PMU or DC/DC or LDO  
3.0 V 400/800 mA  
V
V
SD  
SUPPLY  
NVT4857  
V
CCB  
V
SD  
I/O STAGE/LDO  
C
ext  
V
CCA  
CLKA  
CLK_FB  
DAT1B  
LEVEL  
TRANSLATOR  
LOGIC  
DAT0B  
GND  
CMDA  
DAT0A  
CLKB  
HOST/  
BASEBAND  
INTERFACE  
V
SD-CARD  
SD  
CMDB  
DAT3B  
DAT2B  
DAT1A  
DAT2A  
DAT3A  
SEL  
CD  
see data sheet  
for details  
basic push-pull driver  
implementation  
aaa-013308  
Fig 1. Application diagram  
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
3 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
6. Functional diagram  
V
SD  
V
track mode  
SD  
SEL  
CARD SIDE  
1.8 V OR V  
R5  
350 kΩ  
SD  
VOLTAGE SELECT  
1.8 V VOLTAGE  
REGULATOR  
V
+
LDO  
INTERNAL REFERENCE  
R1  
R1  
R2  
CLKA  
CLKB  
CLK_FB  
R
pu  
70 kΩ  
R2  
R
pu  
CMDB  
DAT0B  
70 kΩ  
R1  
R1  
CMDA  
DAT0A  
R
pu  
70 kΩ  
R2  
R
pu  
70 kΩ  
R
pu  
70 kΩ  
R2  
R2  
DAT1B  
DAT2B  
R
pu  
70 kΩ  
R1  
DAT1A  
R
pu  
70 kΩ  
R
pu  
70 kΩ  
R1  
R1  
DAT2A  
DAT3A  
R
pu  
70 kΩ  
R2  
DAT3B  
R
pu  
70 kΩ  
V
CCA  
R4  
100 kΩ  
R3  
100 Ω  
CD  
GND  
aaa-013315  
Fig 2. Functional diagram  
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
4 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
7. Pinning information  
7.1 Pinning  
bump A1  
index area  
A1  
B1  
A2  
B2  
A3  
B3  
A4  
B4  
C1  
D1  
E1  
C2  
D2  
E2  
C3  
D3  
E3  
C4  
D4  
E4  
transparent top view,  
solder balls facing down  
aaa-018949  
Fig 3. Pin configuration WLCSP20  
DAT2A  
DAT3A  
CMDA  
DAT0A  
DAT1A  
VCCA  
VSD  
VCCB  
GND  
CLKB  
SEL  
DAT2B  
CD  
GND  
DAT3B  
CMDB  
DAT0B  
CLKA  
CLK_FB  
DAT1B  
aaa-013317  
Fig 4. NVT4857UK pinout transparent top view  
Table 3.  
Pin allocation table  
Pin  
Pin  
A1  
B1  
C1  
D1  
E1  
Symbol  
Symbol  
VCCA  
Pin  
A3  
B3  
C3  
D3  
E3  
Symbol  
Pin  
A4  
B4  
C4  
D4  
E4  
Symbol  
DAT2B  
DAT3B  
CMDB  
DAT0B  
DAT1B  
DAT2A  
A2  
B2  
C2  
D2  
E2  
VSD  
DAT3A  
CMDA  
DAT0A  
DAT1A  
CD  
VCCB  
GND  
CLKB  
SEL  
GND  
CLKA  
CLK_FB  
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
5 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
7.2 Pin description  
Table 4.  
Symbol [1]  
DAT2A  
VCCA  
Pin description  
Pin  
A1  
A2  
A3  
A4  
B1  
B2  
B3  
B4  
C1  
C2  
C3  
C4  
D1  
D2  
D3  
D4  
E1  
E2  
E3  
E4  
Type [2] Description  
I/O  
S
data 2 input or output on host side  
supply voltage from host side  
supply voltage  
VSD  
S
DAT2B  
DAT3A  
CD  
I/O  
I/O  
O
data 2 input or output on memory card side  
data 3 input or output on host side  
card detect switch biasing output  
VCCB  
S
internal supply decoupling (VLDO)  
DAT3B  
CMDA  
GND  
I/O  
I/O  
S
data 3 input or output on memory card side  
command input or output on host side  
supply ground  
GND  
S
supply ground  
CMDB  
DAT0A  
CLKA  
CLKB  
DAT0B  
DAT1A  
CLK_FB  
SEL  
I/O  
I/O  
I
command input or output on memory card side  
data 0 input or output on host side  
clock signal input on host side  
O
clock signal output on memory card side  
data 0 input or output on memory card side  
data 1 input or output on host side  
clock feedback output on host side  
card side I/O voltage level select  
data 1 input or output on memory card side  
I/O  
I/O  
O
I
DAT1B  
I/O  
[1] The pin names relate particularly to SD memory cards, but also apply to microSD and MMC memory cards.  
[2] I = input, O = output, I/O = input and output, S = power supply  
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
6 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
8. Functional description  
8.1 Level translator  
The bidirectional level translator shifts the data between the I/O supply levels of the host  
and the memory card. The voltage translator has to support several clock and data  
transfer rates at the signaling levels specified in the SD 3.0 standard specification.  
Table 5.  
Supported modes  
Bus speed mode  
Default-Speed  
High-Speed  
SDR12  
Signal level (V)  
Clock rate (MHz)  
Data rate (MB/s)  
3.3  
3.3  
1.8  
1.8  
1.8  
1.8  
1.8  
25  
12.5  
25  
50  
25  
12.5  
25  
SDR25  
50  
SDR50  
100  
208  
50  
50  
SDR104  
104  
50  
DDR50  
8.2 Enable and direction control  
The device contains an auto-enable feature. If VSD rises above 2.65 V, the LDO and the  
level translator logic is enabled automatically. As soon as VSD drops below the VSDdisable  
,
as specified in Table 10, the LDO and the card side drivers and the level translator logic is  
disabled. All host side pins excluding CLKA1 are configured as inputs with a 70 kresistor  
pulled up to VCCA  
.
8.3 Integrated voltage regulator  
The low dropout voltage regulator delivers supply voltage for the voltage translators and  
the card-side input/output stages. It has to support 1.8 V and 3 V signaling modes as  
stipulated in the SD 3.0 specification. The switching time between the two output voltage  
modes is compliant with SD 3.0 specification. Depending on the signaling level at pin  
SEL, the regulator delivers 1.8 V (SEL = HIGH) or 3.0 V (SEL = LOW).  
Table 6.  
Input  
SEL[1]  
H
SD card side voltage level control signal truth table  
Output  
VCCB  
Pin[2]  
Function  
1.8 V  
DAT0B to DAT3B, CLKB  
DAT0B to DAT3B, CLKB  
low supply voltage level (1.8 Vtyp)  
L
tracking VSD  
high supply voltage level (tracking VSD)  
[1] H = HIGH; L = LOW; X = don‘t care  
[2] Host-side pins are not influenced by SEL.  
An external capacitor is needed between the regulator output pin VCCB and ground for  
proper operation of the integrated voltage regulator. See Table 8 for recommended  
capacitance and equivalent series resistance. It is recommended to place the capacitor  
close to the VSD and VCCB pin and maintain short connections of both to ground.  
1. CLKA is a pure high-ohmic input. Please refer to Figure 2 “Functional diagram” for more detail.  
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
7 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
8.4 Feedback clock channel  
The clock is transmitted from the host to the memory card side. The voltage translator and  
the Printed-Circuit Board (PCB) tracks introduce some amount of delay. It reduces timing  
margin for data read back from memory card, especially at higher data rates. Therefore, a  
feedback path is provided to compensate the delay. The reasoning behind this approach  
is the fact that the clock is always delivered by the host, while the data in the timing critical  
read mode comes from the card.  
8.5 EMI filter  
All input/output driver stages are equipped with EMI filters to reduce interferences towards  
sensitive mobile communication.  
8.6 ESD protection  
The device has robust ESD protections on all memory card pins as well as on the VSD pin.  
The architecture prevents any stress for the host: the voltage translator discharges any  
stress to supply ground.  
Pin Card Detection (CD) might be pulled down by the memory card which has to be  
detected by the host. The pin is equipped with International Electrotechnical  
Commission (IEC) system-level ESD protection and pull-up resistor connected to the host  
supply VCCA  
.
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
8 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
9. Limiting values  
Table 7.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol Parameter  
Conditions  
Min  
Max  
Unit  
VCC  
supply voltage  
4 ms transient  
on pin VSD  
0.5  
0.5  
0.5  
-
+4.6  
+4.6  
+4.6  
1000  
+150  
+85  
V
on pin VCCA  
V
VI  
input voltage  
4 ms transient at I/O pins  
Tamb = 40 C to +85 C  
V
Ptot  
total power dissipation  
storage temperature  
ambient temperature  
mW  
C  
C  
Tstg  
Tamb  
VESD  
55  
40  
[1]  
electrostatic discharge  
voltage  
IEC 61000-4-2, level 4, all memory card-side pins,  
VSD and CD to ground  
contact discharge  
air discharge  
8  
+8  
kV  
kV  
V
15  
+15  
Human Body Model (HBM)  
2000 +2000  
JEDEC JESD22-A114F; all pins  
Charge Device Model (CDM) JEDEC  
JESD22-C101E; all pins  
500  
100  
+500  
+100  
V
Ilu(IO)  
input/output latch-up current JESD 78B: 0.5 VCC < VI < 1.5 VCC  
;
mA  
Tj < 125 C  
[1] All system level tests are performed with the application-specific capacitors connected to the supply pins VSUPPLY, VLDO and VCCA  
.
10. Recommended operating conditions  
Table 8.  
Operating conditions  
Symbol Parameter  
Conditions  
Min  
2.9  
1.1  
0.3  
0.3  
-
Typ  
Max  
Unit  
V
[1]  
[2]  
VCC  
supply voltage  
input voltage  
on pin VSD  
-
3.6  
on pin VCCA  
-
2.0  
V
VI  
host side  
-
VCCA + 0.3  
V
memory card side  
recommended capacitor at pin VCCB  
-
VO(LDO) + 0.3 V  
Cext  
ESR  
Cext  
external  
capacitance  
2.2  
-
F  
equivalent series at pin VLDO  
resistance  
0
-
50  
m  
external  
recommended capacitor at pin VSD  
recommended capacitor at pin VCCA  
-
-
0.1  
0.1  
-
-
F  
F  
capacitance  
[1] By minimum value the device is still fully functional, but the voltage on pin VLDO might drop below the recommended memory card  
supply voltage.  
[2] The voltage must not exceed 3.6 V.  
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
9 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
Table 9.  
Integrated resistors  
Tamb = 25 C; unless otherwise specified.  
Symbol  
Parameter  
Conditions  
Min  
70  
200  
49  
70  
-
Typ  
100  
350  
70  
Max  
130  
500  
91  
Unit  
Rpd  
Rpu  
Rs  
pull-down resistance  
R3; tolerance 30 %  
R5  
k  
k  
k  
pull-up resistance  
series resistance  
all data lines and CMDx  
R4  
100  
22.5  
15  
130  
-
[1]  
[1]  
host side; R1; tolerance 30 %  
card side; R2; tolerance 30 %  
-
-
[1] Guaranteed by design.  
11. Static characteristics  
Table 10. Static characteristics  
At recommended operating conditions; Tamb = 40 C to +85 C; voltages are referenced to GND (ground = 0 V);  
Cext = 2.2 F at pin VCCB; unless otherwise specified.  
Symbol Parameter  
Conditions  
Min  
Typ[2]  
Max  
Unit  
Automatic enable feature: VSD  
VSDen  
VSDdisable device disable voltage level VCCA 1.0 V, VSD falling edge  
VSDen VSDen hysteresis voltage  
Supply voltage regulator for card-side I/O pin: VCCB  
device enable voltage level VCCA 1.0 V, VSD rising edge  
2.25  
2.2  
-
2.45  
2.4  
50  
2.65  
2.6  
-
V
V
mV  
VO(LDO) regulator/switch output  
voltage  
SEL = LOW;3.0 V VSD 3.6 V;  
IO < 100 mA  
VSD-0.2  
VSD-0.1 VSD  
V
SEL = HIGH; VSD 2.9 V; IO < 100 mA  
1.7  
-
1.8  
-
1.95  
100  
V
IO(LDO)  
regulator/switch output  
current  
mA  
Host-side input signals: CMDA and DAT0A to DAT3A, CLKA; 1.1 V VCCA 2.0 V  
VIH  
HIGH-level input voltage  
0.75   
VCCA  
-
-
VCCA  
0.3  
+
V
V
VIL  
LOW-level input voltage  
0.3  
0.25   
VCCA  
Host-side control signals; 1.1 V VCCA 2.0 V  
SEL  
VIH  
HIGH-level input voltage  
LOW-level input voltage  
0.75   
VCCA  
-
-
VCCA  
0.3  
+
V
V
VIL  
0.3  
0.25   
VCCA  
Host-side output signals: CLK_FB, CMDA and DAT0A to DAT3A; 1.1 V VCCA 2.0 V  
VOH  
HIGH-level output voltage IO = 2 mA; VI = VIH (card side)  
for CLK_FB  
0.8   
VCCA  
-
-
-
-
-
V
V
V
HIGH-level output voltage IO = 2 A; VI = VIH (card side)  
for CMDA, DATxA  
0.8   
VCCA  
VOL  
LOW-level output voltage  
IO = 2 mA; VI = VIL (card side)  
-
0.15   
VCCA  
NVT4857UK  
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© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
10 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
Table 10. Static characteristics …continued  
At recommended operating conditions; Tamb = 40 C to +85 C; voltages are referenced to GND (ground = 0 V);  
C
ext = 2.2 F at pin VCCB; unless otherwise specified.  
Symbol Parameter Conditions  
Card-side input signals: CMDB and DAT0B to DAT3B  
Min  
Typ[2]  
Max  
Unit  
VIH  
HIGH-level input voltage  
SEL = LOW (3.0 V card interface)  
SEL = HIGH (1.8 V card interface)  
SEL = LOW (3.0 V card interface)  
SEL = HIGH (1.8 V card interface)  
0.625   
VO(LDO)  
-
-
-
-
VO(LDO)  
0.3  
+
+
V
V
V
V
0.625   
VO(LDO)  
VO(LDO)  
0.3  
VIL  
LOW-level input voltage  
0.3  
0.3  
0.3   
VO(LDO)  
0.35   
VO(LDO)  
Card-side output signal  
CMDB and DAT0B to DAT3B, CLKB  
VOH  
HIGH-level output voltage IO = 4 mA; VI = VIH (host side);  
0.85   
VO(LDO)  
-
-
-
-
-
VO(LDO)  
0.3  
+
V
V
V
V
V
for CLKB only  
SEL = LOW (3.0 V card interface)  
IO = 2 mA; VI = VIH (host side);  
SEL = HIGH (1.8 V card interface)  
0.85   
VO(LDO)  
2.0  
HIGH-level output voltage IO = 2 A; VI = VIH (host side);  
0.85   
VO(LDO)  
2.0  
for CMDB, DATxB  
SEL = HIGH (1.8 V card interface)  
VOL  
LOW-level output voltage  
IO = 4 mA; VI = VIL (host side);  
0.3  
0.125   
VO(LDO)  
SEL = LOW (2.9 V card interface)  
IO = 2 mA; VI = VI card L (host side);  
0.3  
0.125   
SEL = HIGH (1.8 V interface)  
VO(LDO)  
Bus signal equivalent capacitance  
Cch channel capacitance  
[3]  
VI = 0 V; fi = 1 MHz; VSD = 3.0 V;  
VCCA = 1.8 V  
host side  
card side  
-
-
7
-
-
pF  
pF  
15  
Current consumption  
ICC(stat) static supply current  
VSD VSDen (active mode);  
all inputs = HIGH;  
SEL = LOW (3.0 V card interface)  
SEL = HIGH (1.8 V card interface)  
-
-
-
-
-
-
100  
100  
7
A  
A  
A  
ICC(stb)  
standby supply current  
VSD VSDen and VCCA 1.0 V  
(inactive mode);  
all host side inputs = HIGH  
[1] Guaranteed by design and characterization.  
[2] Typical values are measured at Tamb = 25 C.  
[3] EMI filter line capacitance per data channel from I/O driver to pin; Cch is guaranteed by design.  
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
11 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
12. Dynamic characteristics  
12.1 Voltage regulator  
Table 11. Voltage regulator  
Tamb = 25 C; unless otherwise specified.  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Voltage regulator output pin: VCCB  
tstartup(LDO)  
tf(o)  
regulator start-up time VCCA = 1.8 V; VSD = 3.0 V; Cext = 2.2 F;  
-
-
-
-
-
-
400  
1
s  
ms  
s  
see Figure 6  
output fall time  
output rise time  
VO(LDO) = 3.0 V to 1.8 V;  
SEL = LOW to HIGH; see Figure 5  
tr(o)  
VO(LDO) = 1.8 V to 3.0 V;  
100  
SEL = HIGH to LOW; see Figure 5  
V
V
V
V
SD  
SD  
SD  
SD  
1.8 V  
1.8 V  
1.8 V  
1.8 V  
1.8 V  
1.8 V  
1.8 V  
1.8 V  
CLK_SD  
0 V  
5 ms (min.)  
V
SD  
CMD  
0 V  
V
SD  
DATA[3:0]  
0 V  
SEL  
0 V  
50 %  
50 %  
0 V  
V
t
t
r(o)  
f(o)  
V
SD  
97 %  
SD  
V
LDO  
1.8 V  
1.8 V  
150 mV  
1.8 V  
aaa-013318  
Fig 5. Regulator mode change timing  
V
SD  
2.65 V  
V
SD  
GND  
t
startup(reg)  
V
O(reg)  
97 %  
regulator  
output  
0 V  
aaa-013319  
Measuring points: VSD signal at 2.65 V and regulator output signal at 0.97 VO(LDO)  
.
Fig 6. Regulator start-up time  
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12.2 Level translator  
Table 12. Level translator dynamic characteristics  
At recommended operating conditions; VCCA = 1.2 V; Tamb = 25 C; unless otherwise specified.  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Host side transition times  
[1]  
[1]  
[1]  
[1]  
tr  
tf  
tr  
tf  
rise time  
fall time  
rise time  
fall time  
SEL = HIGH (1.8 V card interface);  
VCCA = 1.8 V  
-
-
-
-
0.4  
0.4  
0.4  
0.4  
1.0  
1.0  
1.0  
1.0  
ns  
ns  
ns  
ns  
SEL = HIGH (1.8 V card interface);  
VCCA = 1.2 V  
Card side transition times  
[2]  
[2]  
tr  
tf  
rise time  
fall time  
SEL = HIGH (1.8 V card interface);  
40 C Tamb +85 C  
0.4  
0.4  
0.88  
0.88  
1.32  
1.32  
ns  
ns  
Card input transition times  
[3]  
[3]  
tr  
tf  
rise time  
fall time  
SEL = HIGH (1.8 V card interface);  
40 C Tamb +85 C  
0.2  
0.2  
0.5  
0.96  
0.96  
ns  
ns  
0.45  
Host to card propoagation delay  
DATxA to DATxB, CMDA to CMDB, CLKA to CLKB  
tpd propagation delay  
SEL = HIGH (1.8 V card interface);  
VCCA = 1.2 V  
-
-
3.0  
5.5  
5.5  
ns  
ns  
CLKA to CLK_FB  
tpd  
propagation delay  
SEL = HIGH (1.8 V card interface);  
VCCA = 1.2 V  
10.0  
Card to host propagation delay  
DATxB to DATxA, CMDB to CMDA  
tpd  
propagation delay  
SEL = HIGH (1.8 V card interface);  
VCCA = 1.2 V  
-
2.5  
4.5  
ns  
[1] transition between VOL = 0.35 * VCCA and VOH = 0.65 * VCCA  
[2] transition between VOL = 0.45 V and VOH = 1.4 V  
[3] Guaranteed by design; transition between VIL = 0.58 V and VIH = 1.27 V with Ctrace = 3.5 pF and Ccard+CRADLE = 12 pF, trace length =  
11 mm  
V
CC  
V
OH  
V
OL  
GND  
t
f
V
OL  
t
r
V
OH  
aaa-014796  
VOH and VOL are specified in Table 12 as Table note [1] and Table note [2]  
Fig 7. Output rise and fall times  
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input  
0.5*V  
0.5*V  
CCI  
CCI  
output  
0.5*V  
0.5*V  
CCO  
CCO  
t
pd  
t
pd  
aaa-013321  
Output delay is for every single channel, from input to output, 0.5*VCCI to 0.5*VCCO, in which VCCI  
and VCCO are the input and output voltage domain.  
Fig 8. Output delay timing  
12.3 ESD characteristic of pin card detect  
Table 13. ESD characteristic of card detect  
At recommended operating conditions; Tamb = +25 C; voltages are referenced to  
GND (ground = 0 V); unless otherwise specified  
Symbol Parameter  
Conditions  
Min  
Typ  
Max Unit  
ESD protection pins: CD  
VBR  
rdyn  
breakdown voltage  
dynamic resistance  
TLP; I = 1 mA  
-
-
-
8
-
-
-
V
[1]  
[1]  
positive transient  
negative transient  
0.5  
0.5  
[1] TLP according to ANSI-ESD STM5.5.1/IEC 62615 Zo = 50 ; pulse width = 100 ns; rise time = 200 ps;  
averaging window = 50 ns to 80 ns  
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13. Test information  
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Definitions test circuit:  
Rsource = source resistance of pulse generator.  
term = termination resistance should be equal to output impedance Zo of pulse generator.  
R
CL = load capacitance including jig and probe capacitance.  
RL = load resistance.  
Fig 9. Load circuitry for measuring switching time  
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14. Package outline  
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197ꢈꢉꢀꢊ  
Fig 10. Package outline NVT4857UK (WLCSP20)  
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15. Packing information  
2.00 0.05  
Ø 1.50 + 0.10  
1.75 0.10  
4.00 0.10  
4.00 0.10  
5° max.  
3.50 0.05  
+ 0.30  
− 0.10  
8.00  
K
0
B
2.25 0.05  
0
K
0.65 0.05  
0.25 0.02  
0
K
0
Ø 0.50 0.05  
0
5° max.  
A
1.85 0.05  
All dimensions in mm.  
aaa-013545  
Fig 11. Carrier tape  
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16. Soldering of WLCSP packages  
16.1 Introduction to soldering WLCSP packages  
This text provides a very brief insight into a complex technology. A more in-depth account  
of soldering WLCSP (Wafer Level Chip-Size Packages) can be found in application note  
AN10439 “Wafer Level Chip Scale Package” and in application note AN10365 “Surface  
mount reflow soldering description”.  
Wave soldering is not suitable for this package.  
All NXP WLCSP packages are lead-free.  
16.2 Board mounting  
Board mounting of a WLCSP requires several steps:  
1. Solder paste printing on the PCB  
2. Component placement with a pick and place machine  
3. The reflow soldering itself  
16.3 Reflow soldering  
Key characteristics in reflow soldering are:  
Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to  
higher minimum peak temperatures (see Figure 12) than a SnPb process, thus  
reducing the process window  
Solder paste printing issues, such as smearing, release, and adjusting the process  
window for a mix of large and small components on one board  
Reflow temperature profile; this profile includes preheat, reflow (in which the board is  
heated to the peak temperature), and cooling down. It is imperative that the peak  
temperature is high enough for the solder to make reliable solder joints (a solder paste  
characteristic) while being low enough that the packages and/or boards are not  
damaged. The peak temperature of the package depends on package thickness and  
volume and is classified in accordance with Table 14.  
Table 14. Lead-free process (from J-STD-020D)  
Package thickness (mm) Package reflow temperature (C)  
Volume (mm3)  
< 350  
260  
350 to 2000  
260  
> 2000  
260  
< 1.6  
1.6 to 2.5  
> 2.5  
260  
250  
245  
250  
245  
245  
Moisture sensitivity precautions, as indicated on the packing, must be respected at all  
times.  
Studies have shown that small packages reach higher temperatures during reflow  
soldering, see Figure 12.  
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maximum peak temperature  
= MSL limit, damage level  
temperature  
minimum peak temperature  
= minimum soldering temperature  
peak  
temperature  
time  
001aac844  
MSL: Moisture Sensitivity Level  
Fig 12. Temperature profiles for large and small components  
For further information on temperature profiles, refer to application note AN10365  
“Surface mount reflow soldering description”.  
16.3.1 Stand off  
The stand off between the substrate and the chip is determined by:  
The amount of printed solder on the substrate  
The size of the solder land on the substrate  
The bump height on the chip  
The higher the stand off, the better the stresses are released due to TEC (Thermal  
Expansion Coefficient) differences between substrate and chip.  
16.3.2 Quality of solder joint  
A flip-chip joint is considered to be a good joint when the entire solder land has been  
wetted by the solder from the bump. The surface of the joint should be smooth and the  
shape symmetrical. The soldered joints on a chip should be uniform. Voids in the bumps  
after reflow can occur during the reflow process in bumps with high ratio of bump diameter  
to bump height, i.e. low bumps with large diameter. No failures have been found to be  
related to these voids. Solder joint inspection after reflow can be done with X-ray to  
monitor defects such as bridging, open circuits and voids.  
16.3.3 Rework  
In general, rework is not recommended. By rework we mean the process of removing the  
chip from the substrate and replacing it with a new chip. If a chip is removed from the  
substrate, most solder balls of the chip will be damaged. In that case it is recommended  
not to re-use the chip again.  
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Device removal can be done when the substrate is heated until it is certain that all solder  
joints are molten. The chip can then be carefully removed from the substrate without  
damaging the tracks and solder lands on the substrate. Removing the device must be  
done using plastic tweezers, because metal tweezers can damage the silicon. The  
surface of the substrate should be carefully cleaned and all solder and flux residues  
and/or underfill removed. When a new chip is placed on the substrate, use the flux  
process instead of solder on the solder lands. Apply flux on the bumps at the chip side as  
well as on the solder pads on the substrate. Place and align the new chip while viewing  
with a microscope. To reflow the solder, use the solder profile shown in application note  
AN10365 “Surface mount reflow soldering description”.  
16.3.4 Cleaning  
Cleaning can be done after reflow soldering.  
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17. Abbreviations  
Table 15. Abbreviations  
Acronym  
Description  
DUT  
EMI  
Device Under Test  
ElectroMagnetic Interference  
ElectroStatic Discharge  
MultiMedia Card  
ESD  
MMC  
PCB  
RoHS  
SD  
Printed-Circuit Board  
Restriction of Hazardous Substances  
Secure Digital  
WLCSP  
Wafer-Level Chip-Scale Package  
18. Revision history  
Table 16. Revision history  
Document ID  
NVT4857UK v.2  
Modifications:  
Release date Data sheet status  
20180606 Product data sheet  
Table 12 “Level translator dynamic characteristics”:  
Change notice  
Supersedes  
201805042I  
NVT4857UK v.1.1  
Updated typ and max values for Card side transition times tr, tf  
Added Card input transition times tr, tf and associated Table note 3  
Product data sheet 201612019I NVT4857UK v.1  
NVT4857UK v.1.1  
Modifications:  
20161213  
Table 1 “Ordering information”: Corrected topside mark from “NV4857” to “N4857” to reflect the  
production marking; no impact to product functionality.  
NVT4857UK v.1  
20151120  
Product data sheet  
-
-
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19. Legal information  
19.1 Data sheet status  
Document status[1][2]  
Product status[3]  
Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
Suitability for use — NXP Semiconductors products are not designed,  
19.2 Definitions  
authorized or warranted to be suitable for use in life support, life-critical or  
safety-critical systems or equipment, nor in applications where failure or  
malfunction of an NXP Semiconductors product can reasonably be expected  
to result in personal injury, death or severe property or environmental  
damage. NXP Semiconductors and its suppliers accept no liability for  
inclusion and/or use of NXP Semiconductors products in such equipment or  
applications and therefore such inclusion and/or use is at the customer’s own  
risk.  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Customers are responsible for the design and operation of their applications  
and products using NXP Semiconductors products, and NXP Semiconductors  
accepts no liability for any assistance with applications or customer product  
design. It is customer’s sole responsibility to determine whether the NXP  
Semiconductors product is suitable and fit for the customer’s applications and  
products planned, as well as for the planned application and use of  
customer’s third party customer(s). Customers should provide appropriate  
design and operating safeguards to minimize the risks associated with their  
applications and products.  
Product specification — The information and data provided in a Product  
data sheet shall define the specification of the product as agreed between  
NXP Semiconductors and its customer, unless NXP Semiconductors and  
customer have explicitly agreed otherwise in writing. In no event however,  
shall an agreement be valid in which the NXP Semiconductors product is  
deemed to offer functions and qualities beyond those described in the  
Product data sheet.  
NXP Semiconductors does not accept any liability related to any default,  
damage, costs or problem which is based on any weakness or default in the  
customer’s applications or products, or the application or use by customer’s  
third party customer(s). Customer is responsible for doing all necessary  
testing for the customer’s applications and products using NXP  
Semiconductors products in order to avoid a default of the applications and  
the products or of the application or use by customer’s third party  
customer(s). NXP does not accept any liability in this respect.  
19.3 Disclaimers  
Limited warranty and liability — Information in this document is believed to  
be accurate and reliable. However, NXP Semiconductors does not give any  
representations or warranties, expressed or implied, as to the accuracy or  
completeness of such information and shall have no liability for the  
consequences of use of such information. NXP Semiconductors takes no  
responsibility for the content in this document if provided by an information  
source outside of NXP Semiconductors.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) will cause permanent  
damage to the device. Limiting values are stress ratings only and (proper)  
operation of the device at these or any other conditions above those given in  
the Recommended operating conditions section (if present) or the  
Characteristics sections of this document is not warranted. Constant or  
repeated exposure to limiting values will permanently and irreversibly affect  
the quality and reliability of the device.  
In no event shall NXP Semiconductors be liable for any indirect, incidental,  
punitive, special or consequential damages (including - without limitation - lost  
profits, lost savings, business interruption, costs related to the removal or  
replacement of any products or rework charges) whether or not such  
damages are based on tort (including negligence), warranty, breach of  
contract or any other legal theory.  
Terms and conditions of commercial sale — NXP Semiconductors  
products are sold subject to the general terms and conditions of commercial  
sale, as published at http://www.nxp.com/profile/terms, unless otherwise  
agreed in a valid written individual agreement. In case an individual  
agreement is concluded only the terms and conditions of the respective  
agreement shall apply. NXP Semiconductors hereby expressly objects to  
applying the customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
Notwithstanding any damages that customer might incur for any reason  
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards  
customer for the products described herein shall be limited in accordance  
with the Terms and conditions of commercial sale of NXP Semiconductors.  
Right to make changes — NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
No offer to sell or license — Nothing in this document may be interpreted or  
construed as an offer to sell products that is open for acceptance or the grant,  
conveyance or implication of any license under any copyrights, patents or  
other industrial or intellectual property rights.  
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Export control — This document as well as the item(s) described herein  
may be subject to export control regulations. Export might require a prior  
authorization from competent authorities.  
product for such automotive applications, use and specifications, and (b)  
whenever customer uses the product for automotive applications beyond  
NXP Semiconductors’ specifications such use shall be solely at customer’s  
own risk, and (c) customer fully indemnifies NXP Semiconductors for any  
liability, damages or failed product claims resulting from customer design and  
use of the product for automotive applications beyond NXP Semiconductors’  
standard warranty and NXP Semiconductors’ product specifications.  
Quick reference data — The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
Non-automotive qualified products — Unless this data sheet expressly  
states that this specific NXP Semiconductors product is automotive qualified,  
the product is not suitable for automotive use. It is neither qualified nor tested  
in accordance with automotive testing or application requirements. NXP  
Semiconductors accepts no liability for inclusion and/or use of  
Translations — A non-English (translated) version of a document is for  
reference only. The English version shall prevail in case of any discrepancy  
between the translated and English versions.  
non-automotive qualified products in automotive equipment or applications.  
19.4 Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
In the event that customer uses the product for design-in and use in  
automotive applications to automotive specifications and standards, customer  
(a) shall use the product without NXP Semiconductors’ warranty of the  
20. Contact information  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
NVT4857UK  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2018. All rights reserved.  
Product data sheet  
Rev. 2 — 6 June 2018  
23 of 24  
NVT4857UK  
NXP Semiconductors  
SD 3.0 - SDR104 auto-direction control memory card level translator  
21. Contents  
1
General description. . . . . . . . . . . . . . . . . . . . . . 1  
Features and benefits . . . . . . . . . . . . . . . . . . . . 1  
2
3
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Ordering information. . . . . . . . . . . . . . . . . . . . . 2  
Ordering options. . . . . . . . . . . . . . . . . . . . . . . . 2  
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Functional diagram . . . . . . . . . . . . . . . . . . . . . . 4  
4
4.1  
5
6
7
7.1  
7.2  
Pinning information. . . . . . . . . . . . . . . . . . . . . . 5  
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5  
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 6  
8
Functional description . . . . . . . . . . . . . . . . . . . 7  
Level translator. . . . . . . . . . . . . . . . . . . . . . . . . 7  
Enable and direction control. . . . . . . . . . . . . . . 7  
Integrated voltage regulator . . . . . . . . . . . . . . . 7  
Feedback clock channel. . . . . . . . . . . . . . . . . . 8  
EMI filter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
ESD protection . . . . . . . . . . . . . . . . . . . . . . . . . 8  
8.1  
8.2  
8.3  
8.4  
8.5  
8.6  
9
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Recommended operating conditions. . . . . . . . 9  
Static characteristics. . . . . . . . . . . . . . . . . . . . 10  
10  
11  
12  
Dynamic characteristics . . . . . . . . . . . . . . . . . 12  
Voltage regulator. . . . . . . . . . . . . . . . . . . . . . . 12  
Level translator. . . . . . . . . . . . . . . . . . . . . . . . 13  
ESD characteristic of pin card detect . . . . . . . 14  
12.1  
12.2  
12.3  
13  
14  
15  
Test information. . . . . . . . . . . . . . . . . . . . . . . . 15  
Package outline . . . . . . . . . . . . . . . . . . . . . . . . 16  
Packing information . . . . . . . . . . . . . . . . . . . . 17  
16  
16.1  
16.2  
16.3  
16.3.1  
16.3.2  
16.3.3  
16.3.4  
Soldering of WLCSP packages. . . . . . . . . . . . 18  
Introduction to soldering WLCSP packages . . 18  
Board mounting . . . . . . . . . . . . . . . . . . . . . . . 18  
Reflow soldering. . . . . . . . . . . . . . . . . . . . . . . 18  
Stand off . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
Quality of solder joint . . . . . . . . . . . . . . . . . . . 19  
Rework . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
Cleaning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20  
17  
18  
Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 21  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 21  
19  
Legal information. . . . . . . . . . . . . . . . . . . . . . . 22  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 22  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 23  
19.1  
19.2  
19.3  
19.4  
20  
21  
Contact information. . . . . . . . . . . . . . . . . . . . . 23  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2018.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 6 June 2018  
Document identifier: NVT4857UK  

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