BLC573 [NXP]

HF / VHF power LDMOS transistor; 高频/甚高频功率LDMOS晶体管
BLC573
型号: BLC573
厂家: NXP    NXP
描述:

HF / VHF power LDMOS transistor
高频/甚高频功率LDMOS晶体管

晶体 晶体管
文件: 总14页 (文件大小:117K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
BLC573  
HF / VHF power LDMOS transistor  
Rev. 01 — 11 December 2008  
Preliminary data sheet  
1. Product profile  
1.1 General description  
A 300 W LDMOS RF power transistor for broadcast applications and industrial, scientific  
and medical applications in the HF to 500 MHz band.  
Table 1.  
Production test information  
Mode of operation  
f
VDS  
(V)  
50  
PL  
Gp  
ηD  
(MHz)  
225  
(W)  
300  
(dB)  
26.5  
(%)  
70  
CW  
CAUTION  
This device is sensitive to ElectroStatic Discharge (ESD). Therefore care should be taken  
during transport and handling.  
1.2 Features  
I Typical CW performance at frequency of 225 MHz, a supply voltage of 50 V and an  
IDq of 900 mA:  
N Average output power = 300 W  
N Power gain = 26.5 dB  
N Efficiency = 70 %  
I Easy power control  
I Integrated ESD protection  
I Excellent ruggedness  
I High efficiency  
I Excellent thermal stability  
I Designed for broadband operation (HF and VHF band)  
I Compliant to Directive 2002/95/EC, regarding Restriction of Hazardous Substances  
(RoHS)  
1.3 Applications  
I Industrial, scientific and medical applications  
I Broadcast transmitter applications  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
2. Pinning information  
Table 2.  
Pinning  
Pin  
1
Description  
drain  
Simplified outline  
Symbol  
1
3
1
3
2
2
gate  
[1]  
3
source  
2
sym112  
[1] Connected to flange.  
3. Ordering information  
Table 3.  
Ordering information  
Type number  
Package  
Name Description  
Version  
BLC573  
-
plastic flanged cavity package; 2 mounting slots; 2 leads SOT895A  
4. Limiting values  
Table 4.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDS  
VGS  
ID  
Parameter  
Conditions  
Min  
Max  
Unit  
V
drain-source voltage  
gate-source voltage  
drain current  
-
110  
0.5 +11  
V
-
42  
A
Tstg  
Tj  
storage temperature  
junction temperature  
65  
+150 °C  
225 °C  
-
5. Thermal characteristics  
Table 5.  
Symbol  
Rth(j-c)  
Thermal characteristics  
Parameter  
Conditions  
Typ  
Unit  
K/W  
[1]  
thermal resistance from  
junction to case  
Tcase = 80 °C; PL = 300 W  
0.21  
[1] Rth(j-c) is measured under RF conditions.  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
2 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
6. Characteristics  
Table 6.  
DC characteristics  
Tj = 25 °C unless otherwise specified  
Symbol Parameter  
Conditions  
Min  
Typ  
Max Unit  
V(BR)DSS drain-source breakdown voltage VGS = 0 V; ID = 3.75 mA  
110  
-
-
V
VGS(th)  
VGSq  
IDSS  
gate-source threshold voltage  
gate-source quiescent voltage  
drain leakage current  
VDS = 10 V; ID = 375 mA 1.25 1.7  
2.25  
V
VDS = 50 V; ID = 900 mA 1.45 1.95 2.45  
V
VGS = 0 V; VDS = 50 V  
-
-
4.2  
-
µA  
A
IDSX  
drain cut-off current  
VGS = VGS(th) + 3.75 V;  
44  
56  
VDS = 10 V  
IGSS  
gfs  
gate leakage current  
VGS = 11 V; VDS = 0 V  
-
-
-
-
420  
nA  
S
forward transconductance  
VDS = 10 V; ID = 18.75 A  
20  
0.09  
-
-
RDS(on) drain-source on-state  
resistance  
VGS = VGS(th) + 3.75 V;  
ID = 12.49 A  
Crs  
feedback capacitance  
VGS = 0 V; VDS = 50 V;  
f = 1 MHz  
-
-
-
2.3  
-
-
-
pF  
pF  
pF  
Ciss  
Coss  
input capacitance  
VGS = 0 V; VDS = 50 V;  
f = 1 MHz  
300  
103  
output capacitance  
VGS = 0 V; VDS = 50 V;  
f = 1 MHz  
Table 7.  
RF characteristics  
Mode of operation: CW; f = 225 MHz; RF performance at VDS = 50 V; IDq = 900 mA; Tcase = 25 °C;  
unless otherwise specified; in a class-AB production test circuit  
Symbol Parameter  
Conditions  
PL = 300 W  
PL = 300 W  
PL = 300 W  
Min  
25  
Typ  
Max Unit  
Gp  
power gain  
26.5 28  
dB  
dB  
%
RLin  
ηD  
input return loss  
drain efficiency  
10  
13  
70  
-
-
67  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
3 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
001aaj155  
800  
C
oss  
(pF)  
600  
400  
200  
0
0
10  
20  
30  
40  
V
50  
(V)  
DS  
VGS = 0 V; f = 1 MHz.  
Fig 1. Output capacitance as a function of drain-source voltage; capacitance value  
without internal matching  
6.1 Ruggedness in class-AB operation  
The BLC573 is capable of withstanding a load mismatch corresponding to VSWR = 13 : 1  
through all phases under the following conditions: VDS = 50 V; IDq = 900 mA; PL = 300 W;  
f = 225 MHz.  
7. Application information  
7.1 Impedance information  
Table 8.  
Typical impedance  
Measured ZS and ZL test circuit impedances.  
f
ZS  
ZL  
MHz  
225  
0.7 + j2.0  
1.95 + j2.0  
drain  
Z
L
gate  
Z
S
001aaf059  
Fig 2. Definition of transistor impedance  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
4 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
7.2 Reliability  
001aaj156  
5
4
3
2
10  
Years  
(1) (2) (3) (4) (5) (6)  
10  
10  
10  
10  
1
(7) (8) (9) (10) (11)  
0
4
8
12  
16  
20  
I
(A)  
dc  
TTF (0.1 % failure fraction).  
(1) Tj = 100 °C  
(2) Tj = 110 °C  
(3) Tj = 120 °C  
(4) Tj = 130 °C  
(5) Tj = 140 °C  
(6) Tj = 150 °C  
(7) Tj = 160 °C  
(8) Tj = 170 °C  
(9) Tj = 180 °C  
(10) Tj = 190 °C  
(11) Tj = 200 °C  
Fig 3. BLC573 electromigration (ID, total device)  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
5 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
8. Test information  
8.1 RF performance  
The following figures are measured in a class-AB production test circuit.  
8.1.1 1-Tone CW  
001aaj157  
001aaj158  
30  
80  
30  
G
η
G
p
p
D
(dB)  
(%)  
(dB)  
η
D
(7)  
(6)  
(5)  
28  
60  
28  
G
p
26  
24  
22  
40  
20  
0
26  
24  
22  
(1)  
(2)  
(3)  
(4)  
0
100  
200  
300  
400  
0
100  
200  
300  
400  
P
(W)  
P (W)  
L
L
VDS = 50 V; IDq = 900 mA; f = 225 MHz.  
VDS = 50 V; f = 225 MHz.  
(1) IDq = 500 mA  
(2) IDq = 700 mA  
(3) IDq = 900 mA  
(4) IDq = 1100 mA  
(5) IDq = 1300 mA  
(6) IDq = 1500 mA  
(7) IDq = 1700 mA  
Fig 4. Power gain and drain efficiency as functions of  
load power; typical values  
Fig 5. Power gain as function of load power; typical  
values  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
6 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
001aaj159  
60  
P
L
(dBm)  
ideal P  
L
58  
(2)  
56  
54  
52  
50  
(1)  
P
L
24  
26  
28  
30  
32  
34  
P (dBm)  
i
VDS = 50 V; IDq = 900 mA; f = 225 MHz.  
(1) PL(1dB) = 55.2 dBm (331 W)  
(2) PL(3dB) = 55.8 dBm (380 W)  
Fig 6. Load power as function of input power; typical values  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
7 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
8.1.2 2-Tone CW  
001aaj160  
001aaj161  
30  
80  
0
G
(dB)  
η
(%)  
IMD3  
(dBc)  
p
D
η
D
28  
60  
20  
(1)  
(2)  
(3)  
(4)  
(5)  
(6)  
(7)  
(8)  
26  
24  
22  
40  
20  
0
40  
60  
80  
G
p
0
100  
200  
300  
400  
500  
(W)  
0
100  
200  
300  
400  
L(PEP)  
500  
(W)  
P
P
L(PEP)  
VDS = 50 V; IDq = 900 mA; f1 = 224.95 MHz;  
f2 = 225.05 MHz.  
VDS = 50 V; f1 = 224.95 MHz; f2 = 225.05 MHz.  
(1) IDq = 500 mA  
(2) IDq = 700 mA  
(3) IDq = 900 mA  
(4) IDq = 1100 mA  
(5) IDq = 1300 mA  
(6) IDq = 1500 mA  
(7) IDq = 1700 mA  
(8) IDq = 1800 mA  
Fig 7. Power gain and drain efficiency as functions of  
peak envelope load power; typical values  
Fig 8. Third order intermodulation distortion as a  
function of peak envelope load power; typical  
values  
8.2 Test circuit  
Table 9.  
List of components  
For production test circuit, see Figure 9 and Figure 10.  
Printed-Circuit Board (PCB): Rogers 5880; εr = 2.2 F/m; height = 0.79 mm; Cu (top/bottom metallization); thickness copper  
plating = 35 mm.  
Component  
Description  
Value  
Remarks  
B1  
ferrite SMD bead  
100 ; 100 MHz  
Ferroxcube BDS3/3/8.9-4S2 or equivalent  
[1]  
[1]  
[1]  
[1]  
C1  
multilayer ceramic chip capacitor 100 pF  
multilayer ceramic chip capacitor 39 pF  
multilayer ceramic chip capacitor 180 pF  
multilayer ceramic chip capacitor 220 pF  
multilayer ceramic chip capacitor 4.7 µF  
C2  
C3, C4  
C5, C6, C7  
C8  
TDK C4532X7R1E475MT020U or equivalent  
[1]  
[1]  
C9, C10, C20 multilayer ceramic chip capacitor 1 nF  
C11  
C12  
multilayer ceramic chip capacitor 30 pF  
electrolytic capacitor 220 µF; 63 V  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
8 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
Table 9.  
List of components …continued  
For production test circuit, see Figure 9 and Figure 10.  
Printed-Circuit Board (PCB): Rogers 5880; εr = 2.2 F/m; height = 0.79 mm; Cu (top/bottom metallization); thickness copper  
plating = 35 mm.  
Component  
Description  
Value  
Remarks  
[2]  
C13, C14,  
C15, C16  
multilayer ceramic chip capacitor 47 pF  
[1]  
[1]  
[1]  
C17  
C18  
C19  
L1  
multilayer ceramic chip capacitor 33 pF  
multilayer ceramic chip capacitor 36 pF  
multilayer ceramic chip capacitor 16 pF  
2 turns enamelled copper wire  
4 turns enamelled copper wire  
metal film resistor  
D = 3 mm;  
d = 1 mm;  
length = 2 mm;  
leads = 2 × 6 mm  
L2  
D = 2 mm;  
d = 1 mm;  
length = 13 mm;  
leads = 2 × 5 mm  
R1  
100 ; 0.6 W  
[1] American Technical Ceramics type 100B or capacitor of same quality.  
[2] American Technical Ceramics type 180R or capacitor of same quality.  
V
DD  
C12  
V
GG  
C8  
C9  
B1  
C10  
C13  
C15  
L1  
R1  
output  
C20 50 Ω  
input  
50 C1  
C3  
C4  
C6  
L2  
C2  
C19  
C18  
C5  
C7  
C14  
C16  
C11  
C17  
001aaj162  
Fig 9. Class-AB common-source production test circuit  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
9 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
B1  
C12  
C10  
C8  
C9  
C13 C15  
C6  
C3  
R1  
L1  
C20  
C1  
L2  
C7  
C19  
C4  
C5  
C2  
C18  
C14 C16  
C17  
C11  
12.2  
mm  
Use isolated washer  
16 mm  
29 mm  
28 mm  
76 mm  
001aaj163  
Fig 10. Component layout for class-AB production test circuit  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
10 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
9. Package outline  
Plastic flanged cavity package; 2 mounting slots; 2 leads  
SOT895A  
D
F
A
D
1
B
U
1
q
c
C
1
L
M
M
M
B
w1  
A
p
H
U
2
E
E
1
3
A
2
M M  
C
b
w2  
Q
0
5
10 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
UNIT  
A
b
c
D
D
1
E
E
1
F
H
L
p
Q
q
U
1
U
2
w
w
2
1
4.1  
3.3  
12.83 0.17  
12.57 0.14  
19.9 20.42 9.53 9.78  
19.7 20.12 9.27 9.53  
1.14 19.94 5.3  
0.89 18.92 4.5  
3.38 1.75  
3.12 1.50  
34.16 9.98  
33.91 9.65  
mm  
27.94  
1.100  
0.25  
0.6  
0.161 0.505 0.0065 0.785 0.804 0.375 0.385 0.045 0.785 0.209 0.133 0.069  
0.130 0.495 0.0055 0.775 0.792 0.365 0.375 0.035 0.745 0.177 0.123 0.059  
1.345 0.392  
1.335 0.380  
inches  
0.01 0.023  
REFERENCES  
JEDEC JEITA  
OUTLINE  
VERSION  
EUROPEAN  
PROJECTION  
ISSUE DATE  
IEC  
06-02-21  
06-04-03  
SOT895A  
Fig 11. Package outline SOT895A  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
11 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
10. Handling information  
10.1 Moisture sensitivity  
Table 10. Moisture sensitivity level  
Test methodology  
Class  
IPC/JEDEC J-STD-020-D  
3
11. Abbreviations  
Table 11. Abbreviations  
Acronym  
CW  
Description  
Continuous Wave  
EDGE  
GSM  
HF  
Enhanced Data rates for GSM Evolution  
Global System for Mobile communications  
High Frequency  
LDMOS  
RF  
Laterally Diffused Metal-Oxide Semiconductor  
Radio Frequency  
SMD  
TTF  
Surface Mount Device  
Time To Failure  
VHF  
Very High Frequency  
VSWR  
Voltage Standing-Wave Ratio  
12. Revision history  
Table 12. Revision history  
Document ID  
Release date  
Data sheet status  
Change notice  
Supersedes  
BLC573_1  
20081211  
Preliminary data sheet  
-
-
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
12 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
13. Legal information  
13.1 Data sheet status  
Document status[1][2]  
Product status[3]  
Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
damage. NXP Semiconductors accepts no liability for inclusion and/or use of  
NXP Semiconductors products in such equipment or applications and  
therefore such inclusion and/or use is at the customer’s own risk.  
13.2 Definitions  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) may cause permanent  
damage to the device. Limiting values are stress ratings only and operation of  
the device at these or any other conditions above those given in the  
Characteristics sections of this document is not implied. Exposure to limiting  
values for extended periods may affect device reliability.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Terms and conditions of sale — NXP Semiconductors products are sold  
subject to the general terms and conditions of commercial sale, as published  
at http://www.nxp.com/profile/terms, including those pertaining to warranty,  
intellectual property rights infringement and limitation of liability, unless  
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of  
any inconsistency or conflict between information in this document and such  
terms and conditions, the latter will prevail.  
13.3 Disclaimers  
General — Information in this document is believed to be accurate and  
reliable. However, NXP Semiconductors does not give any representations or  
warranties, expressed or implied, as to the accuracy or completeness of such  
information and shall have no liability for the consequences of use of such  
information.  
No offer to sell or license — Nothing in this document may be interpreted  
or construed as an offer to sell products that is open for acceptance or the  
grant, conveyance or implication of any license under any copyrights, patents  
or other industrial or intellectual property rights.  
Right to make changes — NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
Quick reference data — The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in medical, military, aircraft,  
space or life support equipment, nor in applications where failure or  
malfunction of an NXP Semiconductors product can reasonably be expected  
to result in personal injury, death or severe property or environmental  
13.4 Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
14. Contact information  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
BLC573_1  
© NXP B.V. 2008. All rights reserved.  
Preliminary data sheet  
Rev. 01 — 11 December 2008  
13 of 14  
BLC573  
NXP Semiconductors  
HF / VHF power LDMOS transistor  
15. Contents  
1
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
1.1  
1.2  
1.3  
General description. . . . . . . . . . . . . . . . . . . . . . 1  
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
2
Pinning information. . . . . . . . . . . . . . . . . . . . . . 2  
Ordering information. . . . . . . . . . . . . . . . . . . . . 2  
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2  
Thermal characteristics. . . . . . . . . . . . . . . . . . . 2  
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Ruggedness in class-AB operation. . . . . . . . . . 4  
3
4
5
6
6.1  
7
7.1  
7.2  
Application information. . . . . . . . . . . . . . . . . . . 4  
Impedance information . . . . . . . . . . . . . . . . . . . 4  
Reliability . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5  
8
8.1  
8.1.1  
8.1.2  
8.2  
Test information. . . . . . . . . . . . . . . . . . . . . . . . . 6  
RF performance . . . . . . . . . . . . . . . . . . . . . . . . 6  
1-Tone CW . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
2-Tone CW . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Test circuit. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8  
9
Package outline . . . . . . . . . . . . . . . . . . . . . . . . 11  
Handling information. . . . . . . . . . . . . . . . . . . . 12  
Moisture sensitivity . . . . . . . . . . . . . . . . . . . . . 12  
Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 12  
10  
10.1  
11  
12  
13  
Legal information. . . . . . . . . . . . . . . . . . . . . . . 13  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 13  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
13.1  
13.2  
13.3  
13.4  
14  
15  
Contact information. . . . . . . . . . . . . . . . . . . . . 13  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2008.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 11 December 2008  
Document identifier: BLC573_1  

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