MM74C89N [NSC]

64-Bit TRI-STATE Random Access Read/Write Memory; 64位三态随机存取存储器读/写
MM74C89N
型号: MM74C89N
厂家: National Semiconductor    National Semiconductor
描述:

64-Bit TRI-STATE Random Access Read/Write Memory
64位三态随机存取存储器读/写

存储
文件: 总6页 (文件大小:132K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
March 1988  
MM54C89/MM74C89 64-Bit TRI-STATE  
Random Access Read/Write Memory  
É
General Description  
The MM54C89/MM74C89 is a 16-word by 4-bit random ac-  
cess read/write memory. Inputs to the memory consist of  
four address lines, four data input lines, a write enable line  
and a memory enable line. The four binary address inputs  
are decoded internally to select each of the 16 possible  
word locations. An internal address register latches the ad-  
dress information on the positive to negative transition of  
the memory enable input. The four TRI-STATE data output  
lines working in conjunction with the memory enable input  
provide for easy memory expansion.  
Read Operation: The complement of the information which  
was written into the memory is non-destructively read out at  
the four outputs. This is accomplished by selecting the de-  
sired address and bringing memory enable low and write  
enable high.  
When the device is writing or disabled the output assumes a  
TRI-STATE (Hi-z) condition.  
Features  
Y
Wide supply voltage range  
Guaranteed noise margin  
High noise immunity  
Low power  
3.0V to 15V  
1.0V  
Address Operation: Address inputs must be stable t pri-  
SA  
or to the positive to negative transition of memory enable. It  
is thus not necessary to hold address information stable for  
Y
Y
Y
0.45 V  
CC  
(typ.)  
fan out of 2  
driving 74L  
more than t after the memory is enabled (positive to neg-  
HA  
ative transition of memory enable).  
TTL compatibility  
Y
Y
Y
Low power consumption  
Fast access time  
100 nW/package (typ.)  
e
Note: The timing is different than the DM7489 in that a positive to negative  
transition of the memory enable must occur for the memory to be  
selected.  
130 ns (typ.) at V  
10V  
CC  
TRI-STATE output  
Write Operation: Information present at the data inputs is  
written into the memory at the selected address by bringing  
write enable and memory enable low.  
Logic and Connection Diagrams  
Dual-In-Line Package  
TL/F/5888–2  
Top View  
Order Number MM54C89  
or MM74C89  
TL/F/5888–1  
TRI-STATEÉ is a registered trademark of National Semiconductor Corporation.  
C
1995 National Semiconductor Corporation  
TL/F/5888  
RRD-B30M105/Printed in U. S. A.  
Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales  
Office/Distributors for availability and specifications.  
Power Dissipation (P )  
D
Dual-In-Line  
Small Outline  
700 mW  
500 mW  
b
a
0.3V  
Voltage at any Pin  
0.3V to V  
CC  
Operating V Range  
CC  
3.0V to 15V  
18V  
Operating Temperature Range  
MM54C89  
MM74C89  
Absolute Maximum V  
CC  
b
a
55 C to 125 C  
§
§
40 C to 85 C  
Lead Temperature (T )  
L
(Soldering, 10 seconds)  
b
a
§
§
260 C  
§
b
a
65 C to 150 C  
Storage Temperature Range (T )  
S
§
§
DC Electrical Characteristics Min/Max limits apply across temperature range, unless otherwise noted  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
CMOS TO CMOS  
e
e
V
V
V
V
Logical ‘‘1’’ Input Voltage  
Logical ‘‘0’’ Input Voltage  
Logical ‘‘1’’ Output Voltage  
Logical ‘‘0’’ Output Voltage  
V
V
5.0V  
10V  
3.5  
8.0  
V
V
IN(1)  
CC  
CC  
e
e
V
CC  
V
CC  
5.0V  
10V  
1.5  
2.0  
V
V
IN(0)  
e
e
e b  
V
CC  
V
CC  
5.0V, I  
10V, I  
10 mA  
10 mA  
4.5  
9.0  
V
V
OUT(1)  
OUT(0)  
O
e b  
O
e
e
e a  
V
CC  
V
CC  
5.0V, I  
10V, I  
10 mA  
10 mA  
0.5  
1.0  
V
V
O
e a  
O
e
e
e
e
b
I
I
I
Logical ‘‘1’’ Input Current  
Logical ‘‘0’’ Input Current  
V
15V, V  
15V  
0V  
0.005  
b
0.005  
1.0  
mA  
mA  
IN(1)  
IN(0)  
OZ  
CC  
CC  
IN  
IN  
b
V
15V, V  
1.0  
1.0  
e
e
e
15V  
e
Output Current in High  
Impedance State  
V
CC  
V
CC  
15V, V  
15V, V  
0.005  
0.005  
1.0  
mA  
mA  
b
b
0V  
O
e
I
Supply Current  
V
CC  
15V  
0.05  
300  
mA  
CC  
CMOS/LPTTL INTERFACE  
e
e
b
b
V
V
V
V
Logical ‘‘1’’ Input Voltage  
Logical ‘‘0’’ Input Voltage  
Logical ‘‘1’’ Output Voltage  
Logical ‘‘0’’ Output Voltage  
54C, V  
74C, V  
4.5V  
4.75V  
V
V
1.5  
1.5  
V
V
IN(1)  
CC  
CC  
CC  
CC  
e
e
54C, V  
74C, V  
4.5V  
4.75V  
0.8  
0.8  
V
V
IN(0)  
CC  
CC  
e
e
e b  
360 mA  
54C, V  
74C, V  
4.5V, I  
O
4.75V, I  
2.4  
2.4  
V
V
OUT(1)  
OUT(0)  
CC  
CC  
e b  
360 mA  
e a  
360 mA  
O
e
e
54C, V  
74C, V  
4.5V, I  
O
4.75V, I  
0.4  
0.4  
V
V
CC  
CC  
e a  
360 mA  
O
OUTPUT DRIVE (See 54C/74C Family Characteristics Data Sheet) (Short Circuit Current)  
e
e
e
e
e
I
I
I
I
Output Source Current  
(P-Channel)  
V
T
5.0V, V  
0V  
SOURCE  
SOURCE  
SINK  
CC  
OUT  
b
b
3.3  
1.75  
mA  
mA  
mA  
mA  
e
25 C  
§
10V, V  
A
e
Output Source Current  
(P-Channel)  
V
CC  
0V  
OUT  
b
b
8.0  
15  
3.6  
16  
e
T
25 C  
§
A
e
V
CC  
Output Sink Current  
(N-Channel)  
V
T
5.0V, V  
CC  
OUT  
OUT  
1.75  
8.0  
e
25 C  
§
10V, V  
A
e
V
CC  
Output Sink Current  
(N-Channel)  
V
CC  
SINK  
e
T
A
25 C  
§
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Range’’ they are not  
meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device operation.  
e
e
50 pF, unless otherwise noted  
AC Electrical Characteristics* T  
25 C, C  
§
Conditions  
A
L
Symbol  
Parameter  
Min  
Typ  
Max  
Units  
e
e
t
t
t
t
t
Propagation Delay from  
Memory Enable  
V
V
5V  
10V  
270  
100  
500  
220  
ns  
ns  
pd  
CC  
CC  
e
e
Access Time from  
Address Input  
V
CC  
V
CC  
5V  
10V  
350  
130  
650  
280  
ns  
ns  
ACC  
SA  
e
e
Address Setup Time  
V
CC  
V
CC  
5V  
10V  
150  
60  
ns  
ns  
e
e
Address Hold Time  
V
CC  
V
CC  
5V  
10V  
60  
40  
ns  
ns  
HA  
ME  
e
e
Memory Enable Pulse Width  
V
CC  
V
CC  
5V  
10V  
400  
150  
250  
90  
ns  
ns  
2
e
e
50 pF, unless otherwise noted (Continued)  
AC Electrical Characteristics* T  
25 C, C  
§
A
L
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Units  
e
e
t
t
t
t
t
t
Write Enable Setup  
Time for a Read  
V
5V  
10V  
0
0
ns  
ns  
SR  
WS  
WE  
HD  
SD  
CC  
V
CC  
e
e
Write Enable Setup  
Time for a Write  
V
CC  
V
CC  
5V  
10V  
t
t
ns  
ns  
ME  
ME  
e
e
e
0
Write Enable Pulse Width  
Data Input Hold Time  
Data Input Setup  
V
CC  
V
CC  
5V, t  
WS  
10V, t  
300  
100  
160  
60  
ns  
ns  
e
0
WS  
e
e
V
CC  
V
CC  
5V  
10V  
50  
25  
ns  
ns  
e
e
V
CC  
V
CC  
5V  
10V  
50  
25  
ns  
ns  
e
e
e
e
e
5 pF, R 10k  
L
5 pF, R  
, t  
1H 0H  
Propagation Delay from a Logical  
‘‘1’’ or Logical ‘‘0’’ to the High  
Impedance State from  
V
CC  
V
CC  
5V, C  
L
10V, C  
180  
b
300  
120  
ns  
ns  
e
10k  
85  
L
L
Memory Enable  
e
e
e
e
e
e
t , t  
1H 0H  
Propagation Delay from a Logical  
‘‘1’’ or Logical ‘‘0’’ to the High  
Impedance State from  
Write Enable  
V
CC  
V
CC  
50V, C  
10V, C  
5 pF, R  
5 pF, R  
10k  
10k  
180  
85  
300  
120  
ns  
ns  
L
L
L
L
C
C
C
Input Capacity  
Any Input (Note 2)  
5
pF  
pF  
pF  
IN  
Output Capacity  
Any Output (Note 2)  
(Note 3)  
6.5  
230  
OUT  
PD  
Power Dissipation Capacity  
*AC Parameters are guaranteed by DC correlated testing.  
Note 2: Capacitance is guaranteed by periodic testing.  
Note 3: C determines the no load AC power consumption of any CMOS device. For complete explanation see 54C/74C Family Characteristics application note,  
PD  
AN-90.  
e
AC Electrical Characteristics* Guaranteed across the specified temperature range, C  
50 pF  
L
MM54C89  
e b  
MM74C89  
e b  
A
a
55 C to 125 C  
a
Parameter  
Conditions  
T
T
40 C to 85 C  
Units  
§
§
Max  
§
§
Max  
A
Min  
Min  
e
e
e
t
t
t
t
t
t
t
V
V
V
5V  
10V  
15V  
700  
310  
250  
600  
265  
210  
ns  
ns  
ns  
PD  
CC  
CC  
CC  
e
e
e
V
CC  
V
CC  
V
CC  
5V  
10V  
15V  
910  
400  
320  
780  
345  
270  
ns  
ns  
ns  
ACC  
SA  
e
e
e
V
CC  
V
CC  
V
CC  
5V  
10V  
15V  
210  
90  
70  
180  
80  
60  
ns  
ns  
ns  
e
e
e
V
CC  
V
CC  
V
CC  
5V  
10V  
15V  
80  
55  
45  
70  
50  
40  
ns  
ns  
ns  
HA  
ME  
WE  
HD  
e
e
e
V
CC  
V
CC  
V
CC  
5V  
10V  
15V  
560  
210  
170  
480  
180  
150  
ns  
ns  
ns  
e
e
e
V
CC  
V
CC  
V
CC  
5V  
10V  
15V  
420  
140  
110  
360  
120  
100  
ns  
ns  
ns  
e
e
e
V
CC  
V
CC  
V
CC  
5V  
10V  
15V  
70  
35  
30  
60  
30  
25  
ns  
ns  
ns  
*AC Parameters are guaranteed by DC correlated testing.  
3
AC Electrical Characteristics*  
e
Guaranteed across the specified temperature range, C  
50 pF (Continued)  
L
MM54C89  
a
55 C to 125 C  
MM74C89  
e b a  
e b  
Parameter  
Conditions  
T
A
T
A
40 C to 85 C  
§
Units  
§
§
§
Max  
Min  
Max  
Min  
e
e
e
t
t
V
V
V
5V  
10V  
15V  
70  
35  
30  
60  
30  
25  
ns  
ns  
ns  
SD  
CC  
CC  
CC  
e
e
e
, t  
1H 0H  
V
CC  
V
CC  
V
CC  
5V  
10V, C  
15V, R  
420  
170  
135  
360  
145  
115  
ns  
ns  
ns  
e
e
5 pF  
10 kX  
L
L
*AC Parameters are guaranteed by DC correlated testing.  
Truth Table  
ME  
WE  
Operation  
Write  
Read  
Inhibit, Storage  
Inhibit, Storage  
Condition of Outputs  
TRI-STATE  
Complement of Selected Word  
TRI-STATE  
TRI-STATE  
L
L
H
H
L
H
L
H
AC Test Circuits  
t
t
1H  
0H  
TL/F/5888–3  
TL/F/5888–4  
Switching Time Waveforms  
t
t
1H  
0H  
TL/F/5888–6  
TL/F/5888–5  
Read Cycle  
Write Cycle  
TL/F/5888–8  
TL/F/5888–7  
4
Switching Time Waveforms (Continued)  
Read Modify Write Cycle  
TL/F/5888–9  
e
e
Note: t  
60 ns  
10 ns  
r
t
f
5
Physical Dimensions inches (millimeters)  
Ceramic Dual-In-Line Package (J)  
Order Number MM54C89J or MM74C89J  
NS Package Number J16A  
Molded Dual-In-Line Package (N)  
Order Number MM54C89N or MM74C89N  
NS Package Number N16E  
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NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant  
into the body, or (b) support or sustain life, and whose  
failure to perform, when properly used in accordance  
with instructions for use provided in the labeling, can  
be reasonably expected to result in a significant injury  
to the user.  
2. A critical component is any component of a life  
support device or system whose failure to perform can  
be reasonably expected to cause the failure of the life  
support device or system, or to affect its safety or  
effectiveness.  
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Corporation  
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