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DM54LS502W/883 [NSC]

8 - BIT SUCCESSIVE APPROXIMATION REGISTER; 8 - 位逐次逼近寄存器
DM54LS502W/883
型号： DM54LS502W/883
厂家： National Semiconductor    National Semiconductor
描述：

8 - BIT SUCCESSIVE APPROXIMATION REGISTER
8 - 位逐次逼近寄存器
文件： 总6页 (文件大小：18K)
中文：  中文翻译
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MICROCIRCUIT DATA SHEET  
Original Creation Date: 04/20/98  
Last Update Date: 08/24/98  
MNDM54LS502-X REV 1A0  
Last Major Revision Date: 04/20/98  
8 - BIT SUCCESSIVE APPROXIMATION REGISTER  
General Description  
The 'LS502 is an 8-bit register with the interchange logic necessary to perform  
serial-to-parallel conversion and provide an active LOW Conversion Complete (CC) signal  
coincident with storage of the eighth bit. An active LOW Start (S) input performs  
synchronous initialization which forces Q7 LOW and all others HIGH. Subsequent clocks  
shift Q7 LOW signal downstream which simultaneously backfills the register such that the  
first serial data (D input) bit is stored in Q7, the second bit in Q6, the third in Q5,  
etc. The serial input data is also synchronized by an auxilliary flip-flop and brought  
out on QD.  
Designed primarily for use in the successive approximate technique for analog-to-digital  
conversion, the 'LS502 can also be used as a serial-to-parallel conversion ring counter  
and as the storage and control element in recursive digital routines.  
Industry Part Number  
NS Part Numbers  
54LS502  
DM54LS502J/883*  
DM54LS502W/883**  
Prime Die  
L502  
Controlling Document  
5962-9080001MEA*, MFA**  
Processing  
Subgrp Description  
Temp (oC)  
MIL-STD-883, Method 5004  
1
Static tests at  
+25  
2
Static tests at  
+125  
-55  
3
Static tests at  
4
Dynamic tests at  
Dynamic tests at  
Dynamic tests at  
Functional tests at  
Functional tests at  
Functional tests at  
Switching tests at  
Switching tests at  
Switching tests at  
+25  
Quality Conformance Inspection  
5
+125  
-55  
6
MIL-STD-883, Method 5005  
7
+25  
8A  
8B  
9
+125  
-55  
+25  
10  
11  
+125  
-55  
1
MICROCIRCUIT DATA SHEET  
MNDM54LS502-X REV 1A0  
Features  
- LOW power Schottky version of 2502  
- Storage and control for successive approximation A to D conversion  
- Performs serial - to - parallel conversion  
2
MICROCIRCUIT DATA SHEET  
MNDM54LS502-X REV 1A0  
(Absolute Maximum Ratings)  
(Note 1)  
Storage Temperature  
-65 C to +150 C  
Ambient Temperature under Bias  
Input Voltage  
-55 C to +125 C  
-0.5V to +10.0V  
VCC Pin Potential to Ground Pin  
Junction Temperature under Bias  
Current Applied to Output in LOW state (Max)  
-0.5V to +7.0V  
-55 C to +175 C  
twice the rated Iol (ma)  
Note 1: Absolute Maximum ratings are those values beyond which the device may be damaged or  
have its useful life impaired. Functional operation under these conditions is not  
implied.  
Recommended Operating Conditions  
Free Air Ambient Temperature  
Military  
-55 C to +125 C  
+4.5V to +5.5V  
Supply Voltage  
Military  
3
MICROCIRCUIT DATA SHEET  
MNDM54LS502-X REV 1A0  
Electrical Characteristics  
DC PARAMETER  
(The following conditions apply to all the following parameters, unless otherwise specified.)  
DC: VCC 4.5V to 5.5V, Temp range: -55C to 125C  
PIN-  
SUB-  
SYMBOL  
IIH  
PARAMETER  
CONDITIONS  
NOTES  
MIN  
MAX UNIT  
NAME  
GROUPS  
Input High  
Current  
VCC=5.5V, VM=2.7V, VINH=4.5V  
1, 3 INPUTS  
1, 3 INPUTS  
20.0  
0.1  
uA  
mA  
1, 2,  
3
IBVI  
Input High  
Current Breakdown  
Test  
VCC=5.5V, VM=10.0V, VINH=4.5V  
1, 2,  
3
IIL  
VOL  
VOH  
IOS  
VCD  
ICC  
Input LOW Current VCC=5.5V, VM=0.4V, VINH=4.5V  
1, 3 INPUTS -0.06 -1.2  
mA  
V
1, 2,  
3
Output LOW  
Voltage  
VCC=4.5V, IOL=4.0mA, VINH=4.5V  
1, 3 OUTPUTS  
0.4  
1, 2,  
3
High Level Output VCC=4.5V, VIH=2.0V, IOH=-0.4mA,  
1, 3 OUTPUTS 2.5  
V
1, 2,  
3
Voltage  
VINH=4.5V, VIL=0.7V  
Short Circuit  
Output Current  
VCC=5.5V, VINH=4.5V, VOUT=0.0V,  
VINL=0.0V  
1, 3 OUTPUT -20.0 -100  
mA  
V
1, 2,  
3
Input Clamp Diode VCC=4.5V, IM=-18mA, VINH=4.5V  
Voltage  
1, 3 INPUTS  
1, 3 VCC  
-1.5  
65.0  
1, 2,  
3
Supply Current  
VCC=5.5V, VINL=0.0V  
mA  
1, 2,  
3
AC PARAMETER - 15pF  
(The following conditions apply to all the following parameters, unless otherwise specified.)  
AC: CL=15pF Temp range: +25C  
tpLH Propagation Delay VCC=5.0V  
5
CP to  
Qn or  
CC  
35.0  
ns  
ns  
9
9
tpHL  
Propagation Delay VCC=5.0V  
5
CP to  
Qn or  
CC  
25.0  
ts (H/L)  
th (H/L)  
Setup Time  
Hold Time  
VCC=5.0V  
VCC=5.0V  
VCC=5.0V  
VCC=5.0V  
VCC=5.0V  
VCC=5.0V  
5
5
5
5
5
5
S to CP 5.0  
S to CP 5.0  
D to CP 5.0  
D to CP 5.0  
ns  
ns  
ns  
ns  
ns  
9
9
9
9
9
ts (H/L) 2 Setup Time  
th (H/L) 2 Hold Time  
tw (H/L)  
fMAX  
Pulse Width  
CP  
CP  
20.0  
25.0  
Maximum Clock  
Frequency  
MHZ 9  
4
MICROCIRCUIT DATA SHEET  
MNDM54LS502-X REV 1A0  
Electrical Characteristics  
AC PARAMETER - 50pF  
(The following conditions apply to all the following parameters, unless otherwise specified.)  
AC: CL=50pF, RL=2K ohms  
SYMBOL PARAMETER  
tpLH  
Temp range: -55C to +125C  
PIN-  
NAME  
SUB-  
CONDITIONS  
NOTES  
MIN  
2.0  
MAX UNIT  
GROUPS  
Propagation Delay VCC=5.0V  
Propagation Delay VCC=5.0V  
2, 4 CP to  
Qn or  
40.0  
ns  
ns  
ns  
ns  
9
CC  
2, 4 CP to  
Qn or  
2.0  
2.0  
2.0  
52.0  
30.0  
39.0  
10, 11  
9
CC  
tpHL  
2, 4 CP to  
Qn or  
CC  
2, 4 CP to  
Qn or  
10, 11  
CC  
ts (H/L)  
th (H/L)  
Setup Time  
Hold Time  
VCC=5.0V  
VCC=5.0V  
VCC=5.0V  
VCC=5.0V  
VCC=5.0V  
VCC=5.5V  
2, 4 S to CP 5.0  
2, 4 S to CP 10.0  
2, 4 S to CP 5.0  
2, 4 S to CP 10.0  
2, 4 D to CP 5.0  
2, 4 D to CP 10.0  
2, 4 D to CP 5.0  
2, 4 D to CP 10.0  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
9
10, 11  
9
10, 11  
9
ts (H/L) 2 SetupTime  
th (H/L) 2 Hold Time  
10, 11  
9
10, 11  
9
tw (H/L)  
fMAX  
Pulse Width  
2, 4 CP  
2, 4 CP  
2, 4 CP  
2, 4 CP  
20.0  
25.0  
25.0  
20.0  
10, 11  
Clock Frequency  
MHZ 9  
MHZ 10, 11  
Note 1: Screen tested 100% on each device at -55C, +25C & +125C temperature, subgroups A1, 2,  
3, 7 & 8.  
Note 2: Screen tested 100% on each device at +25C temperature only, subgroup A9.  
Note 3: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, +125C & -55C  
temperature, subgroups A1, 2, 3, 7 & 8.  
Note 4: Sample tested (Method 5005, Table 1) on each MFG. lot at +25C, subgroup A9.  
Subgroups 10 & 11 are guaranteed, not tested.  
Note 5: Guaranteed, not tested.  
5
MICROCIRCUIT DATA SHEET  
MNDM54LS502-X REV 1A0  
Revision History  
Rev ECN # Rel Date Originator Changes  
1A0  
M0002904 08/24/98  
Linda Collins  
Initial MDS release:MNDM54LS502-X Rev. 1A0. Changed  
note 5 (Guaranteed, not tested) in the AC 50pF notes  
reference column to note 2 (Screen tested 100% at  
+25C, subgroup 9) & to note 4 (Sample tested at +25C,  
subgroup 9. Subgroups 10 & 11 are guaranteed, not  
tested). Changed note 2 in the AC 15pF notes reference  
column to note 5. Reworded the phrase in note 4 from  
'and periodically at +125C & -55C, subgroups 10 & 11'  
to 'Subgroups 10 & 11 are guaranteed, not tested'.  
6

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