CD4011BCJ [NSC]
Quad 2-Input NOR,NAND Buffered B Series Gate; 四2输入NOR , NAND缓冲B系列门型号: | CD4011BCJ |
厂家: | National Semiconductor |
描述: | Quad 2-Input NOR,NAND Buffered B Series Gate |
文件: | 总6页 (文件大小:169K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
March 1988
CD4001BM/CD4001BC Quad 2-Input
NOR Buffered B Series Gate
CD4011BM/CD4011BC Quad 2-Input
NAND Buffered B Series Gate
General Description
Features
Y
Low power TTL
compatibility
Fan out of 2 driving 74L
or 1 driving 74LS
These quad gates are monolithic complementary MOS
(CMOS) integrated circuits constructed with N- and P-chan-
nel enhancement mode transistors. They have equal source
and sink current capabilities and conform to standard B se-
ries output drive. The devices also have buffered outputs
which improve transfer characteristics by providing very
high gain.
Y
5V–10V–15V parametric ratings
Y
Symmetrical output characteristics
Maximum input leakage 1 mA at 15V over full tempera-
ture range
Y
All inputs are protected against static discharge with diodes
.
SS
to V
and V
DD
Schematic Diagrams
CD4001BC/BM
(/4 of device shown
e
a
B
J
A
e
e
Logical ‘‘1’’
Logical ‘‘0’’
High
Low
TL/F/5939–2
*All inputs protected by standard
CMOS protection circuit.
TL/F/5939–1
CD4011BC/BM
(/4 of device shown
e
J
A
B
#
e
e
Logical ‘‘1’’
Logical ‘‘0’’
High
Low
TL/F/5939–6
*All inputs protected by standard
CMOS protection circuit.
TL/F/5939–5
C
1995 National Semiconductor Corporation
TL/F/5939
RRD-B30M105/Printed in U. S. A.
Absolute Maximum Ratings (Notes 1 and 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Operating Conditions
)
Operating Range (V
3 V to 15 V
DC DC
DD
Operating Temperature Range
CD4001BM, CD4011BM
CD4001BC, CD4011BC
b
b
a
a
55 C to 125 C
§
§
40 C to 85 C
b
a
Voltage at any Pin
0.5V to V
DD
0.5V
§
§
Power Dissipation (P )
D
Dual-In-Line
Small Outline
700 mW
500 mW
b
a
V
DD
Range
0.5 V to 18 V
DC DC
b
a
65 C to 150 C
Storage Temperature (T )
S
§
§
Lead Temperature (T )
L
(Soldering, 10 seconds)
260 C
§
DC Electrical Characteristics CD4001BM, CD4011BM (Note 2)
b
a
a
55 C
§
25 C
125 C
§
§
Typ
Symbol
Parameter
Conditions
Units
Min
Max
Min
Max
Min
Max
e
e
e
e
V
I
Quiescent Device
Current
V
DD
V
DD
V
DD
5V, V
IN
10V, V
15V, V
or V
DD SS
0.25
0.50
1.0
0.004
0.005
0.006
0.25
0.50
1.0
7.5
15
30
mA
mA
mA
DD
e
V
V
or V
or V
IN
IN
DD
DD
SS
SS
e
e
e
e
V
V
V
V
Low Level
Output Voltage
V
V
V
5V
10V
15V
0.05
0.05
0.05
0
0
0
0.05
0.05
0.05
0.05
0.05
0.05
V
V
V
OL
OH
IL
DD
DD
DD
k
I
1 mA
1 mA
l
l
O
O
l
(
(
e
e
e
High Level
Output Voltage
V
DD
V
DD
V
DD
5V
10V
15V
4.95
9.95
14.95
4.95
9.95
14.95
5
10
15
4.95
9.95
14.95
V
V
V
k
I
l
e
e
e
e
4.5V
Low Level
Input Voltage
V
DD
V
DD
V
DD
5V, V
10V, V
15V, V
1.5
3.0
4.0
2
4
6
1.5
3.0
4.0
1.5
3.0
4.0
V
V
V
O
e
e
9.0V
13.5V
O
O
e
e
e
e
0.5V
High Level
Input Voltage
V
DD
V
DD
V
DD
5V, V
10V, V
15V, V
3.5
7.0
11.0
3.5
7.0
11.0
3
6
9
3.5
7.0
11.0
V
V
V
IH
O
e
e
1.0V
1.5V
O
O
e
e
e
e
0.4V
I
I
I
Low Level Output
Current
(Note 3)
V
DD
V
DD
V
DD
5V, V
10V, V
15V, V
0.64
1.6
4.2
0.51
1.3
3.4
0.88
2.25
8.8
0.36
0.9
2.4
mA
mA
mA
OL
O
e
e
0.5V
1.5V
O
O
e
e
e
e
e
e
b
b
b
b
b
0.36
High Level Output
Current
(Note 3)
V
DD
V
DD
V
DD
5V, V
10V, V
15V, V
4.6V
9.5V
13.5V
0.64
0.51
0.88
2.25
mA
mA
mA
OH
IN
O
b
b
b
b
b
b
1.6
4.2
1.3
3.4
0.9
2.4
O
O
b
8.8
b
5
e
e
e
e
b
0.10
0.10
b
b
0.10
0.10
b
1.0
1.0
Input Current
V
DD
V
DD
15V, V
15V, V
0V
15V
10
10b
5
mA
mA
IN
IN
Connection Diagrams
CD4001BC/CD4001BM
Dual-In-Line Package
CD4011BC/CD4011BM
Dual-In-Line Package
TL/F/5939–4
Top View
TL/F/5939–3
Order Number CD4001B or CD4011B
Top View
2
DC Electrical Characteristics CD4001BC, CD4011BC (Note 2)
b
a
a
40 C
§
25 C
§
85 C
§
Symbol
Parameter
Conditions
Units
Min
Max
Min
Typ
Max
Min
Max
e
e
e
e
V
I
Quiescent Device
Current
V
DD
V
DD
V
DD
5V, V
IN
or V
DD SS
1
2
4
0.004
0.005
0.006
1
2
4
7.5
15
30
mA
mA
mA
DD
e
10V, V
15V, V
V
V
or V
IN
IN
DD
DD
SS
SS
e
or V
e
e
e
V
V
V
V
Low Level
V
V
V
5V
0.05
0.05
0.05
0
0
0
0.05
0.05
0.05
0.05
0.05
0.05
V
V
V
OL
OH
IL
DD
DD
DD
k
Output Voltage
10V
I
1 mA
1 mA
l
l
O
O
l
15V
(
(
e
e
e
High Level
V
DD
V
DD
V
DD
5V
4.95
9.95
4.95
9.95
5
4.95
9.95
V
V
V
k
Output Voltage
10V
15V
I
10
15
l
14.95
14.95
14.95
e
e
e
e
4.5V
e
9.0V
Low Level
V
DD
V
DD
V
DD
5V, V
1.5
3.0
4.0
2
4
6
1.5
3.0
4.0
1.5
3.0
4.0
V
V
V
O
Input Voltage
10V, V
15V, V
O
O
e
13.5V
e
e
e
e
0.5V
High Level
V
DD
V
DD
V
DD
5V, V
O
3.5
7.0
3.5
7.0
3
6
9
3.5
7.0
V
V
V
IH
e
e
Input Voltage
10V, V
15V, V
1.0V
1.5V
O
O
11.0
11.0
11.0
e
e
e
e
0.4V
I
I
I
Low Level Output
Current
V
DD
V
DD
V
DD
5V, V
O
0.52
1.3
0.44
1.1
0.88
2.25
8.8
0.36
0.9
mA
mA
mA
OL
e
e
10V, V
15V, V
0.5V
1.5V
O
O
(Note 3)
3.6
3.0
2.4
e
e
e
e
e
e
b
b
b
b
b
0.36
High Level Output
Current
V
DD
V
DD
V
DD
5V, V
4.6V
0.52
0.44
0.88
2.25
mA
mA
mA
OH
IN
O
b
b
b
b
b
b
10V, V
15V, V
9.5V
1.3
3.6
1.1
3.0
0.9
2.4
O
O
b
(Note 3)
13.5V
8.8
b
5
e
e
e
e
b
b
b
b
Input Current
V
V
15V, V
15V, V
0V
0.30
10
10b
5
0.30
1.0
mA
mA
DD
IN
15V
0.30
0.30
1.0
DD
IN
AC Electrical Characteristics* CD4001BC, CD4001BM
e
e
e
e
50 pF, R 200k. Typical temperature coefficient is 0.3%/ C.
L
T
25 C, Input t ; t
§
20 ns. C
§
A
r
f
L
Symbol
Parameter
Conditions
Typ
Max
Units
e
e
e
t
t
t
Propagation Delay Time,
High-to-Low Level
V
V
V
5V
120
50
250
100
70
ns
ns
ns
PHL
DD
DD
DD
10V
15V
35
e
e
e
Propagation Delay Time,
Low-to-High Level
V
DD
V
DD
V
DD
5V
110
50
250
100
70
ns
ns
ns
PLH
10V
15V
35
e
e
e
, t
THL TLH
Transition Time
V
DD
V
DD
V
DD
5V
90
50
40
200
100
80
ns
ns
ns
10V
15V
C
C
Average Input Capacitance
Power Dissipation Capacity
Any Input
Any Gate
5
7.5
pF
pF
IN
14
PD
*AC Parameters are guaranteed by DC correlated testing.
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Temperature Range’’
they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device
operation.
Note 2: All voltages measured with respect to V unless otherwise specified.
SS
Note 3: I and I
OL
are tested one output at a time.
OH
3
AC Electrical Characteristics* CD4011BC, CD4011BM
e
e
e
e
50 pF, R 200k. Typical Temperature Coefficient is 0.3%/ C.
L
T
25 C, Input t ; t
§
20 ns. C
§
A
r
f
L
Symbol
Parameter
Conditions
Typ
Max
Units
e
e
e
t
t
t
Propagation Delay,
High-to-Low Level
V
V
V
5V
120
50
250
100
70
ns
ns
ns
PHL
DD
DD
DD
10V
15V
35
e
e
e
Propagation Delay,
Low-to-High Level
V
DD
V
DD
V
DD
5V
85
40
30
250
100
70
ns
ns
ns
PLH
10V
15V
e
e
e
, t
THL TLH
Transition Time
V
DD
V
DD
V
DD
5V
90
50
40
200
100
80
ns
ns
ns
10V
15V
C
C
Average Input Capacitance
Power Dissipation Capacity
Any Input
Any Gate
5
7.5
pF
pF
IN
14
PD
*AC Parameters are guaranteed by DC correlated testing.
Typical Performance Characteristics
Typical
Transfer Characteristics
Typical
Transfer Characteristics
Typical
Transfer Characteristics
TL/F/5939–7
TL/F/5939–8
TL/F/5939–9
Typical
Transfer Characteristics
TL/F/5939–11
TL/F/5939–12
FIGURE 5
FIGURE 6
TL/F/5939–10
4
Typical Performance Characteristics (Continued)
TL/F/5939–13
TL/F/5939–14
TL/F/5939–15
FIGURE 7
FIGURE 8
FIGURE 9
TL/F/5939–16
TL/F/5939–18
FIGURE 10
TL/F/5939–17
FIGURE 12
FIGURE 11
TL/F/5939–19
TL/F/5939–20
FIGURE 13
FIGURE 14
5
Physical Dimensions inches (millimeters)
Ceramic Dual-In-Line Package (J)
Order Number CD4001BMJ, CD4001BCJ, CD40011BMJ or CD4011BCJ
NS Package Number J14A
Molded Dual-In-Line Package (N)
Order Number CD4001BMN, CD4001BCN, CD4011BMN or CD4011BCN
NS Package Number N14A
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and whose
failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
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