CD4011BCM [FAIRCHILD]

Quad 2-Input NOR Buffered B Series Gate . Quad 2-Input NAND Buffered B Series Gate; 四2输入或非缓冲B系列门。四2输入与非缓冲B系列门
CD4011BCM
型号: CD4011BCM
厂家: FAIRCHILD SEMICONDUCTOR    FAIRCHILD SEMICONDUCTOR
描述:

Quad 2-Input NOR Buffered B Series Gate . Quad 2-Input NAND Buffered B Series Gate
四2输入或非缓冲B系列门。四2输入与非缓冲B系列门

逻辑集成电路 光电二极管 栅
文件: 总9页 (文件大小:120K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
October 1987  
Revised March 2002  
CD4001BC/CD4011BC  
Quad 2-Input NOR Buffered B Series Gate •  
Quad 2-Input NAND Buffered B Series Gate  
General Description  
Features  
Low power TTL:  
The CD4001BC and CD4011BC quad gates are monolithic  
complementary MOS (CMOS) integrated circuits con-  
structed with N- and P-channel enhancement mode tran-  
sistors. They have equal source and sink current  
capabilities and conform to standard B series output drive.  
The devices also have buffered outputs which improve  
transfer characteristics by providing very high gain.  
Fan out of 2 driving 74L compatibility: or 1 driving 74LS  
5V–10V–15V parametric ratings  
Symmetrical output characteristics  
Maximum input leakage 1 µA at 15V over full  
temperature range  
All inputs are protected against static discharge with diodes  
to VDD and VSS  
.
Ordering Code:  
Order Number  
CD4001BCM  
CD4001BCSJ  
CD4001BCN  
CD4011BCM  
CD4011BCN  
Package Number  
Package Description  
M14A  
M14D  
N14A  
M14A  
N14A  
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow  
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide  
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide  
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow  
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide  
Devices also available in Tape and Reel. Specify by appending the suffix letter Xto the ordering code.  
Connection Diagrams  
Pin Assignments for DIP, SOIC and SOP  
CD4001BC  
Pin Assignments for DIP and SOIC  
CD4011BC  
Top View  
Top View  
© 2002 Fairchild Semiconductor Corporation  
DS005939  
www.fairchildsemi.com  
Schematic Diagrams  
CD4001BC  
1
/
4 of device shown  
J = A + B  
Logical 1= HIGH  
Logical 0= LOW  
All inputs protected by standard  
CMOS protection circuit.  
CD4011BC  
1
/
4 of device shown  
J = A B  
Logical 1= HIGH  
Logical 0= LOW  
All inputs protected by standard  
CMOS protection circuit.  
www.fairchildsemi.com  
2
Absolute Maximum Ratings(Note 1)  
(Note 2)  
Recommended Operating  
Conditions  
Voltage at any Pin  
Power Dissipation (PD)  
Dual-In-Line  
0.5V to VDD +0.5V  
Operating Range (VDD  
)
3 VDC to 15 VDC  
Operating Temperature Range  
CD4001BC, CD4011BC  
700 mW  
500 mW  
55°C to +125°C  
Small Outline  
Note 1: Absolute Maximum Ratingsare those values beyond which the  
safety of the device cannot be guaranteed. Except for Operating Tempera-  
ture Rangethey are not meant to imply that the devices should be oper-  
ated at these limits. The Electrical Characteristics tables provide conditions  
for actual device operation.  
V
DD Range  
0.5 VDC to +18 VDC  
65°C to +150°C  
Storage Temperature (TS)  
Lead Temperature (TL)  
(Soldering, 10 seconds)  
Note 2: All voltages measured with respect to VSS unless otherwise speci-  
260°C  
fied.  
DC Electrical Characteristics (Note 2)  
55°C  
+25°C  
Typ  
0.004  
0.005  
0.006  
0
+125°C  
Symbol  
IDD  
Parameter  
Conditions  
Units  
Min  
Max  
Min  
Max  
0.25  
0.50  
1.0  
Min  
Max  
Quiescent Device  
Current  
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
V
DD = 5V, VIN = VDD or VSS  
DD = 10V, VIN = VDD or VSS  
DD = 15V, VIN = VDD or VSS  
DD = 5V  
0.25  
0.5  
7.5  
15  
µA  
1.0  
30  
VOL  
VOH  
VIL  
LOW Level  
0.05  
0.05  
0.05  
0.05  
0.05  
0.05  
0.05  
0.05  
0.05  
Output Voltage  
DD = 10V  
DD = 15V  
DD = 5V  
|IO| < 1 µA  
0
V
V
0
HIGH Level  
4.95  
9.95  
4.95  
9.95  
5
4.95  
9.95  
Output Voltage  
DD = 10V  
DD = 15V  
|IO| < 1 µA  
10  
14.95  
14.95  
15  
14.95  
LOW Level  
DD = 5V, VO = 4.5V  
DD = 10V, VO = 9.0V  
DD = 15V, VO = 13.5V  
DD = 5V, VO = 0.5V  
DD = 10V, VO = 1.0V  
DD = 15V, VO = 1.5V  
DD = 5V, VO = 0.4V  
DD = 10V, VO = 0.5V  
DD = 15V, VO = 1.5V  
DD = 5V, VO = 4.6V  
DD = 10V, VO = 9.5V  
DD = 15V, VO = 13.5V  
DD = 15V, VIN = 0V  
DD = 15V, VIN = 15V  
1.5  
3.0  
4.0  
2
1.5  
3.0  
4.0  
1.5  
3.0  
4.0  
Input Voltage  
4
V
6
VIH  
IOL  
IOH  
IIN  
HIGH Level  
3.5  
7.0  
3.5  
7.0  
3
3.5  
7.0  
Input Voltage  
6
V
11.0  
0.64  
1.6  
11.0  
0.51  
1.3  
9
11.0  
0.36  
0.9  
LOW Level Output  
Current  
0.88  
2.25  
8.8  
0.88  
2.25  
8.8  
mA  
(Note 3)  
4.2  
3.4  
2.4  
HIGH Level Output  
Current  
0.64  
1.6  
4.2  
0.51  
1.3  
3.4  
0.36  
0.9  
2.4  
mA  
(Note 3)  
5  
Input Current  
0.10  
10  
0.10  
1.0  
µA  
5  
0.1  
10  
0.10  
1.0  
Note 3: IOL and IOH are tested one output at a time.  
AC Electrical Characteristics (Note 4)  
CD4001BC: TA = 25°C, Input tr; tf = 20 ns. CL = 50 pF, RL = 200k. Typical temperature coefficient is 0.3%/°C.  
Symbol  
Parameter  
Conditions  
Typ  
120  
50  
35  
110  
50  
35  
90  
50  
40  
5
Max  
250  
100  
70  
Units  
tPHL  
Propagation Delay Time,  
V
V
V
V
V
V
V
V
V
DD = 5V  
HIGH-to-LOW Level  
DD = 10V  
DD = 15V  
DD = 5V  
ns  
ns  
ns  
tPLH  
Propagation Delay Time,  
LOW-to-HIGH Level  
250  
100  
70  
DD = 10V  
DD = 15V  
DD = 5V  
tTHL, tTLH  
Transition Time  
200  
100  
80  
DD = 10V  
DD = 15V  
CIN  
Average Input Capacitance  
Power Dissipation Capacity  
Any Input  
Any Gate  
7.5  
pF  
pF  
CPD  
14  
Note 4: AC Parameters are guaranteed by DC correlated testing.  
3
www.fairchildsemi.com  
AC Electrical Characteristics (Note 5)  
CD4011BC: T = 25°C, Input tr; tf = 20 ns. CL = 50 pF, RL = 200k. Typical Temperature Coefficient is 0.3%/°C.  
A
Symbol  
Parameter  
Propagation Delay,  
Conditions  
Typ  
120  
50  
35  
85  
40  
30  
90  
50  
40  
5
Max  
250  
100  
70  
Units  
tPHL  
V
V
V
V
V
V
V
V
V
DD = 5V  
HIGH-to-LOW Level  
DD = 10V  
DD = 15V  
DD = 5V  
ns  
tPLH  
Propagation Delay,  
LOW-to-HIGH Level  
250  
100  
70  
DD = 10V  
DD = 15V  
DD = 5V  
ns  
ns  
tTHL, tTLH Transition Time  
200  
100  
80  
DD = 10V  
DD = 15V  
CIN  
Average Input Capacitance  
Power Dissipation Capacity  
Any Input  
Any Gate  
7.5  
pF  
pF  
CPD  
14  
Note 5: AC Parameters are guaranteed by DC correlated testing.  
Typical Performance Characteristics  
Typical  
Transfer Characteristics  
Typical  
Transfer Characteristics  
Typical  
Transfer Characteristics  
www.fairchildsemi.com  
4
Typical Performance Characteristics (Continued)  
Typical Transfer Characteristics  
5
www.fairchildsemi.com  
Typical Performance Characteristics (Continued)  
www.fairchildsemi.com  
6
Physical Dimensions inches (millimeters) unless otherwise noted  
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow  
Package Number M14A  
7
www.fairchildsemi.com  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide  
Package Number M14D  
www.fairchildsemi.com  
8
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide  
Package Number N14A  
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and  
Fairchild reserves the right at any time without notice to change said circuitry and specifications.  
LIFE SUPPORT POLICY  
FAIRCHILDS PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD  
SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or systems  
which, (a) are intended for surgical implant into the  
body, or (b) support or sustain life, and (c) whose failure  
to perform when properly used in accordance with  
instructions for use provided in the labeling, can be rea-  
sonably expected to result in a significant injury to the  
user.  
2. A critical component in any component of a life support  
device or system whose failure to perform can be rea-  
sonably expected to cause the failure of the life support  
device or system, or to affect its safety or effectiveness.  
www.fairchildsemi.com  
9
www.fairchildsemi.com  

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