ADC1173CIJM/NOPB [NSC]
IC,A/D CONVERTER,SINGLE,8-BIT,CMOS,SOP,24PIN;型号: | ADC1173CIJM/NOPB |
厂家: | National Semiconductor |
描述: | IC,A/D CONVERTER,SINGLE,8-BIT,CMOS,SOP,24PIN 转换器 |
文件: | 总17页 (文件大小:469K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
February 1999
ADC1173
8-Bit, 3-Volt, 15MSPS, 33mW A/D Converter
General Description
Key Specifications
The ADC1173 is a low power, 15 MSPS analog-to-digital
converter that digitizes signals to 8 bits while consuming just
33 mW of power (typ). The ADC1173 uses a unique architec-
ture that achieves 7.6 Effective Bits. Output formatting is
straight binary coding.
n Resolution
8 Bits
15 MSPS (min)
−56 dB (typ)
n Maximum Sampling Frequency
n THD
±
n DNL
0.8 LSB (max)
7.6 Bits (typ)
The excellent DC and AC characteristics of this device, to-
gether with its low power consumption and +3V single supply
operation, make it ideally suited for many video, imaging and
communications applications, including use in portable
equipment. Furthermore, the ADC1173 is resistant to latchup
and the outputs are short-circuit proof. The top and bottom of
the ADC1173’s reference ladder is available for connections,
enabling a wide range of input possibilities.
n ENOB at 3.58 MHz Input
n Guaranteed No Missing Codes
n Differential Phase
n Differential Gain
n Power Consumption
0.5 Degree (max)
1.5% (typ)
33mW (typ)
(excluding reference current)
The ADC1173 is offered in SOIC (EIAJ) and TSSOP. It is de-
signed to operate over the commercial temperature range of
-20˚C to +75˚C.
Applications
n Video Digitization
n Digital Still Cameras
n Set Top Boxes
Features
n Internal Sample-and-Hold Function
n Single +3V Operation
n Internal Reference Bias Resistors
n Industry Standard Pinout
n TRI-STATE® Outputs
n Camcorders
n Personal Computer Video
n Digital Television
n CCD Imaging
n Electro-Optics
Ordering Information
ADC1173CIJM
SOIC (EIAJ)
ADC1173CIJMX
ADC1173CIMTC
ADC1173CIMTCX
SOIC (EIAJ) (tape & reel)
TSSOP
TSSOP (tape & reel)
Pin Configuration
DS100890-1
TRI-STATE® is a registered trademark of National Semiconductor Corporation.
© 1999 National Semiconductor Corporation
DS100890
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Block Diagram
DS100890-2
Pin Descriptions and Equivalent Circuits
Pin
No.
Symbol
Equivalent Circuit
Description
Analog signal input. Conversion range is VRB to
VRT
19
VIN
.
Reference Top Bias with internal pull-up resistor.
Short this pin to VRT to self bias the reference
ladder.
16
17
VRTS
Analog Input that is the high (top) side of the
reference ladder of the ADC. Nominal range is 1.0V
to AVDD. Voltage on VRT and VRB inputs define the
VIN conversion range. Bypass well. See Section 2.0
for more information.
VRT
Analog Input that is the low (bottom) side of the
reference ladder of the ADC. Nominal range is 0V
to 2.0V. Voltage on VRT and VRB inputs define the
VIN conversion range. Bypass well. See Section 2.0
for more information.
23
VRB
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2
Pin Descriptions and Equivalent Circuits (Continued)
Pin
No.
Symbol
Equivalent Circuit
Description
Reference Bottom Bias with internal pull down
resistor. Short to VRB to self bias the reference
ladder.
22
VRBS
CMOS/TTL compatible Digital input that, when low,
enables the digital outputs of the ADC1173. When
high, the outputs are in a high impedance state.
1
OE
CMOS/TTL compatible digital clock Input. VIN is
sampled on the falling edge of CLK input.
12
CLK
Conversion data digital Output pins. D0 is the LSB,
D7 is the MSB. Valid data is output just after the
rising edge of the CLK input. These pins are
enabled by bringing the OE pin low.
3 thru
10
D0-D7
Positive digital supply pin. Connect to a clean, quiet
voltage source of +3V. AVDD and DVDD should have
a common source and be separately bypassed with
a 10µF capacitor and a 0.1µF ceramic chip
11, 13
2, 24
DVDD
DVSS
AVDD
AVSS
capacitor. See Section 3.0 for more information.
The ground return for the digital supply. AVSS and
DVSS should be connected together close to the
ADC1173.
Positive analog supply pin. Connected to a clean,
quiet voltage source of +3V. AVDD and DVDD should
have a common source and be separately bypassed
with a 10 µF capacitor and a 0.1 µF ceramic chip
capacitor. See Section 3.0 for more information.
14,
15, 18
The ground return for the analog supply. AVSS and
DVSS should be connected together close to the
ADC1173 package.
20, 21
3
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Absolute Maximum Ratings (Note 1)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales Office/
Distributors for availability and specifications.
ESD Susceptibility (Note 5)
Human Body Model
Machine Model
2000V
200V
Soldering Temp., Infared, 10
sec. (Note 6)
300˚C
AVDD, DVDD
6.5V
−0.3V to 6.5V
Storage Temperature
−65˚C to +150˚C
Voltage on Any Pin
V
RT, VRB
AVDD to VSS
Operating Ratings(Notes 1, 2)
CLK, OE Voltage
−0.05 to (AVDD + 0.05V)
DVSS to DVDD
Digital Output Voltage
Input Current (Note 3)
Temperature Range
AVDD, DVDD
−20˚C ≤ TA ≤ +75˚C
+2.7V to +3.6V
0V to 100 mV
1.0V to AVDD
0V to 2.0V
±
25mA
Package Input Current
(Note 3)
|AVSS -DVSS
VRT
|
±
50mA
Package Dissipation at 25˚C
(Note 4)
VRB
V
IN Voltage Range
VRB to VRT
Converter Electrical Characteristics
=
=
=
=
=
=
The following specifications apply for AVDD = DVDD +3.0VDC, OE 0V, VRT +2.0V, VRB 0V, CL 20 pF, fCLK 15MHz
=
=
at 50% duty cycle. Boldface limits apply for TA TMIN to TMAX; all other limits TA 25˚C (Notes 7, 8)
Typical
(Note 9)
Symbol
Parameter
Conditions
Limits
Units
DC Accuracy
±
±
±
1.3
INL
Integral Non Linearity
Differential Non Linearity
Missing Codes
0.5
0.4
LSB( max)
LSB( max)
(max)
±
DNL
0.85
0
EOT
EOB
Top Offset
−12
mV
Bottom Offset
+1.0
mV
Video Accuracy
=
DP
DG
Differential Phase Error
Differential Gain Error
fin 3.58 MHz sine wave
0.5
1.5
Degree
%
=
fin 3.58 MHz sine wave
Analog Input and Reference Characteristics
VRB
VRT
V(min)
V(max)
VIN
Input Range
2.0
4
(CLK
LOW)
=
CIN
VIN Input Capacitance
VIN 1.5V + 0.7Vrms
pF
(CLK
HIGH)
11
>
RIN
BW
RRT
Input Resistance
1
MΩ
MHz
Ω
Analog Input Bandwidth
Top Reference Resistor
120
360
300
200
400
Ω(min)
Ω(max)
Ω
Reference Ladder
Resistance
RREF
RRB
VRT to VRB
Bottom Reference Resistor
90
mA
=
=
VRT VRTS, VRB VRBS
4.2
IREF
Reference Ladder Current
=
=
VRT VRTS,VRB AVSS
4.8
1.56
0.36
1.2
mA
Reference Top Self Bias
Voltage
VRT connected to VRTS
VRB connected to VRBS
1.45
1.65
V(min)
V(max)
VRT
VRB
VRT connected to VRTS
VRB connected to VRBS
0.32
0.40
V(min)
V(max)
Reference Bottom Self Bias
Voltage
VRT connected to VRTS
VRB connected to VRBS
,
1.1
1.3
µAmin
µAmax
VRTS
VRBS
-
Self Bias Voltage Delta
VRT connected to VRTS
VRB connected to VSS
,
1.38
V
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4
Converter Electrical Characteristics (Continued)
=
=
=
=
=
=
The following specifications apply for AVDD = DVDD +3.0VDC, OE 0V, VRT +2.0V, VRB 0V, CL 20 pF, fCLK 15MHz
=
=
at 50% duty cycle. Boldface limits apply for TA TMIN to TMAX; all other limits TA 25˚C (Notes 7, 8)
Typical
Symbol
Parameter
Conditions
Limits
Units
(Note 9)
2
Analog Input and Reference Characteristics
1.0
VA
V(min)
V(max)
VRT
VRB
-
Reference Voltage Delta
Power Supply Characteristics
=
=
IADD
IDDD
Analog Supply Current
Digital Supply Curretn
DVDD AVDD 3.6V
6.8
2.3
9.1
mA
mA
mA
=
=
DVDD AVDD 3.6V
=
DVDD AVDD 3.6V,
11
40
IAVDD
IDVDD
+
Total Operating Current
=
=
DVDD AVDD 3.6V, CLK Low
5.8
33
mA
(Note 10)
=
=
Power Consumption
DVDD AVDD 3.6V
mW
CLK, OE Digital Input Characteristics
=
=
VIH
VIL
IIH
Logical High Input Voltage
Logical Low Input Voltage
Logical High Input Current
Logic Low Input Current
Logic Input Capacitance
DVDD AVDD 3.6V
2.2
0.8
V (min)
V (max)
µA
=
=
DVDD AVDD 3.6V
=
=
=
VIH DVDD AVDD 3.6V
5
−5
5
=
=
=
IIL
VIL 0V, DVDD AVDD 3.6V
µA
CIN
pF
Digital Output Characteristics
=
=
DVDD 2.7V, IOH −360µA
2.4
2.1
V(min)
V(min)
V(max)
VOH
High Level Output Voltage
=
=
DVDD 2.7V, IOH −1.1mA
1.9
0.6
=
=
VOL
Low Level Output Voltage
Tri-State®Leakage Current
DVDD 2.7V, IOL 1.6mA
0.32
= =
DVDD 3.6V, OE DVDD,
VOL 0V or VOH DVDD
IOZH
IOZL
,
±
20
µA
=
=
AC Electrical Characteristics
fC1 Maximum Conversion Rate
fC2
20
15
MHz(min)
MHz
Minimum Conversion Rate
Output Delay
1
t
t
OD−0
OD−1
CLK high to low data valid
CLK low to high data valid
28
24
ns(max)
ns(max)
Output Delay
Clock
Cycles
Pipline Delay (Latency)
2.5
tDS
tAJ
Sampling (Aperture) Delay
Aperture Jitter
CLK low to acquissition of data
3
ns
ps rms
ns
30
15
22
12
tOH
tEN
tDIS
Output Hold Time
CLK high to data invalid
Loaded as in Figure 2
Loaded as in Figure 2
OE Low to Data Valid
OE High to High Z State
ns
ns
=
fIN 1.31 MHz
7.7
7.6
7.4
=
ENOB
SINAD
SNR
Effective Number of Bits
Signal-to- Noise & Distortion
Signal-to-Noise Ratio
fIN 3.58 MHz
7.0
43
44
Bits (min)
dB(min)
dB(min)
dB
=
fIN 7.5 MHz
=
fIN 1.31 MHz
49
47.7
46.5
=
fIN 3.58 MHz
=
fIN 7.5 MHz
=
fIN 1.31 MHz
49
48.7
48.0
=
fIN 3.58 MHz
=
fIN 7.5 MHz
=
fIN 1.31 MHz
65
55
51
Spurious Free Dynamic
Range
=
fIN 3.58 MHz
SFDR
THD
=
fIN 7.5 MHz
=
fIN 1.31 MHz
−62
−54
−51
=
Total Harmonic Distortion
fIN 3.58 MHz
dB
=
fIN 7.5 MHz
5
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Converter Electrical Characteristics (Continued)
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is func-
tional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed speci-
fications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.
=
=
=
0V, unless otherwise specified.
SS
Note 2: All voltages are measured with respect to GND AV
DV
SS
Note 3: When the input voltage at any pin exceeds the power supplies (that is, less than AV or DV , or greater than AV or DV ), the current at that pin should
SS SS DD DD
be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of
25 mA to two.
Note 4: The absolute maximum junction temperatures (T max) for this device is 150˚C. The maximum allowable power dissipation is dictated by T max, the
J
J
=
junction-to-ambient thermal resistance θ , and the ambient temperature, T , and can be calculated using the formula P MAX (T max - T )/θ . In the 24-pin
J
A
A
D
J
A
J
A
=
TSSOP, θ is 92˚C/W, so P MAX 1,358 mW at 25˚C and 815 mW at the maximum operating ambient temperature of 75˚C. (Typical thermal resistance, θ , of
JA JA
D
this part is 98˚C/W for the EIAJ SOIC). Note that the power dissipation of this device under normal operation will typically be about 49 mW (33 mW quiescent power
+ 13 mW reference ladder power + 3 mW due to 1 TTL loan on each digital output. The values for maximum power dissipation listed above will be reached only when
the ADC1173 is operated in a severe fault condition (e.g. when input or output pins are driven beyond the power supply voltages, or the power supply polarity is re-
versed). Obviously, such conditions should always be avoided.
Note 5: Human body model is 100 pF capacitor discharged through a 1.5kΩ resistor. Machine model is 220 pf discharged through ZERO Ω.
Note 6: See AN450, ″Surface Mounting Methods and Their Effect on Product Reliability″, or the section entitled ″Surface Mount″ found in any post 1986 National
Semiconductor Linear Data Book, for other methods of soldering surface mount devices.
Note 7: The analog inputs are protected as shown below. Input voltage magnitudes up to 6.5V or to 500 mV below GND will not damage this device. However, errors
in the A/D conversion can occur if the input goes above V or below GND by more than 50 mV. As an example, if AV is 2.7V , the full-scale input voltage must
DD
DD
DC
be ≤2.75V
to ensure accurate conversions.
DC
DS100890-10
Note 8: To guarantee accuracy, it is required that AV
DD
and DV
be well bypassed. Each supply pin must be decoupled with separate bypass capacitors.
DD
Note 9: Typical figures are at T = 25˚C, and represent most likely parametric norms. Test limits are guaranteed to National’s AOQL (Average Outgoing Quality
J
Level).
Note 10: At least two clock cycles must be presented to the ADC1173 after power up. See Section 4.0 for details.
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6
Typical Performance Characteristics
INL vs Temperature
DNL vs Temperature
SNR vs Temperature
DS100890-21
DS100890-22
DS100890-20
SNR vs fIN
THD vs Temperature
SINAD/ENOB vs Temp
DS100890-23
DS100890-24
DS100890-33
SINAD/ENOB vs fIN
SFDR vs fIN
Differential Gain vs Temperature
DS100890-26
DS100890-29
DS100890-31
Differential Phase vs Temperature
Spectral Response
IDDD + IADD vs fCLK
DS100890-27
DS100890-32
DS100890-28
7
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Typical Performance Characteristics (Continued)
tOD vs Temperature
DS100890-25
SAMPLING (APERTURE) DELAY is that time required after
Specification Definitions
the fall of the clock input for the sampling switch to open. The
Sample/Hold circuit effectively stops capturing the input sig-
nal and goes into the ″hold″ mode tDS after the clock goes
low.
ANALOG INPUT BANDWIDTH is a measure of the fre-
quency at which the reconstructed output fundamental drops
3 dB below its low frequency value for a full scale input. The
test is performed with fIN equal to 100 KHz plus integer mul-
tiples of fCLK. The input frequency at which the output is −3
dB relative to the low frequency input signal is the full power
bandwidth.
SIGNAL TO NOISE RATIO (SNR) is the ratio of the rms
value of the input signal to the rms value of the other spectral
components below one-half the sampling frequency, not in-
cluding harmonics or dc.
APERTURE JITTER is the time uncertainty of the sampling
point (tDS), or the range of variation in the sampling delay.
SIGNAL TO NOISE PLUS DISTORTION (S/(N+D) or SI-
NAD) Is the ratio of the rms value of the input signal to the
rms value of all of the other spectral components below half
the clock frequency, including harmonics but excluding dc.
BOTTOM OFFSET is the difference between the input volt-
age that just causes the output code to transition to the first
code and the negative reference voltage. Bottom offset is
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the differ-
ence, expressed in dB, between the rms values of the input
signal and the peak spurious signal, where a spurious signal
is any signal present in the output spectrum that is not
present at the input.
=
defined as EOB VZT - VRB, where VZT is the first code tran-
sition input voltage. Note that this is different from the normal
Zero Scale Error.
DIFFERENTIAL GAIN ERROR is the percentage difference
between the output amplitudes of a high frequency recon-
structed sine wave at two different dc levels.
TOP OFFSET is the difference between the positive refer-
ence voltage and the input voltage that just causes the out-
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of
the maximum deviation from the ideal step size of 1 LSB.
=
put code to transition to full scale and is defined as EOT
VFT − VRT. Where VFT is the full scale transition input volt-
DIFFERENTIAL PHASE ERROR is the difference in the out-
put phase of a reconstructed small signal sine wave at two
different dc levels.
age. Note that this is different from the normal Full Scale Er-
ror.
TOTAL HARMONIC DISTORTION (THD) is the ratio of the
rms total of the first six harmonic components, to the rms
value of the input signal.
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE
BITS) is another method of specifying Signal-to-Noise and
Distortion Ratio, or SINAD. ENOB is defined as (SINAD -
1.76) / 6.02 and says that the converter is equivalent to a
perfect ADC of this (ENOB) number of bits.
INTEGRAL NON-LINEARITY (INL) is a measure of the de-
viation of each individual code from a line drawn from zero
scale (1⁄
full scale (1⁄
2
LSB below the first code transition) through positive
2
LSB above the last code transition). The devia-
tion of any given code from this straight line is measured
from the center of that code value. The end poinnt test
method is used.
OUTPUT DELAY is the time delay after the rising edge of
the input clock before the data update is present at the out-
put pins.
OUTPUT HOLD TIME is the length of time that the output
data is valid after the rise of the input clock.
PIPELINE DELAY (LATENCY) is the number of clock cycles
between initiation of conversion and the availability of that
conversion result at the output. New data is available at ev-
ery clock cycle, but the data lags the conversion by the pipe-
line delay.
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8
Timing Diagram
DS100890-11
FIGURE 1. ADC1173 Timing Diagram
DS100890-12
FIGURE 2. tEN, tDISTest Circuit
9
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you desire to eliminate these adjustments, you should re-
duce the signal swing to avoid clipping at the ADC1173 out-
put that can result from normal tolerances of all system com-
ponents. With no adjustments, the nominal value for the
amplifier feedback resistor is 510Ω and the 5.1k resistor at
the inverting input should be changed to 860Ω and returned
to +3V rather than to the Offset Adjust potentiometer.
Functional Description
The ADC1173 uses a new, unique architecture to achieve
7.4 effective bits at and maintains superior dynamic perfor-
1
mance up to
⁄2 the clock frequency.
The analog signal at VIN that is within the voltage range set
by VRT and VRB are digitized to eight bits at up to 20 MSPS.
Input voltages below VRB will cause the output word to con-
sist of all zeroes. Input voltages above VRT will cause the
output word to consist of all ones. VRT has a range of 1.0 Volt
to the analog supply voltage, AVDD, while VRB has a range of
0 to 2.0 Volts. VRT should always be at least 1.0 Volt more
2.0 Reference Inputs
The reference inputs VRT (Reference Top) and VRB (Refer-
ence Bottom) are the top and bottom of the reference ladder.
Input signals between these two voltages will be digitized to
8 bits. External voltages applied to the reference input pins
should be within the range specified in the Operating Ratings
table (1.0V to AVDD for VRT and 0V to (AVDD - 1.0V) for VRB).
Any device used to drive the reference pins should be able to
source sufficient current into the VRT pin and sink sufficient
current from the VRB pin.
positive than VRB
.
If VRT and VRTS are connected together and VRB and VRBS
are connected together, the nominal values of VRT and VRB
are 1.56V and 0.36V, respectively. If VRT and VRTS are con-
nected together and VRB is grounded, the nominal value of
VRT is 1.38V.
Data is acquired at the falling edge of the clock and the digi-
tal equivalent of the data is available at the digital outputs 2.5
clock cycles plus tOD later. The ADC1173 will convert as long
as the clock signal is present at pin 12. The Output Enable
pin OE, when low, enables the output pins. The digital out-
puts are in the high impedance state when the OE pin is
high.
The reference ladder can be self-biased by connecting VRT
to VRTS and connecting VRB to VRBS to provide top and bot-
tom reference voltages of approximately 1.56V and 0.36V,
respectively, with VCC = 3.0V. This connection is shown in
Figure 3. If VRT and VRTS are tied together, but VRB is tied to
analog ground, a top reference voltage of approximately
1.38V is generated. The top and bottom of the ladder should
be bypassed with 10µF tantalum capacitors located close to
the reference pins.
Applications Information
The reference self-bias circuit of Figure 3 is very simple and
performance is adequate for many applications. Superior
performance can generally be achieved by driving the refer-
ence pins with a low impedance source.
1.0 The Analog Input
The analog input of the ADC1173 is a switch followed by an
integrator. The input capacitance changes with the clock
level, appearing as 4 pF when the clock is low, and 11 pF
when the clock is high. Since a dynamic capacitance is more
difficult to drive than a fixed capacitance, choose an amplifier
that can drive this type of load. The CLC409, CLC440,
LM6152, LM6154, LM6181 and LM6182 have been found to
be excellent devices for driving the ADC1173. Do not drive
the input beyond the supply rails.
By forcing a little current into or out of the top and bottom of
the ladder, as shown in Figure 4, the top and bottom refer-
ence voltages can be trimmed. The resistive divider at the
amplifier inputs can be replaced with potentiometers. The
LMC662 amplifier shown was chosen for its low offset volt-
age and low cost. Note that a negative power supply is
needed for these amplifiers as their outputs may be required
to go slightly negative to force the required reference
voltages.
Figure 3 shows an example of an input circuit using the
LM6181. This circuit has both gain and offset adjustments. If
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10
Applications Information (Continued)
DS100890-13
FIGURE 3. Simple, Low Component Count, Self -Bias Reference application. Because of resistor tolerances, the
reference voltages can vary by as much as 6%. Choose an amplifier that can drive a dynamic capacitance (see text).
11
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Applications Information (Continued)
DS100890-14
FIGURE 4. Better defining the ADC Reference Voltage. Self-bias is still used, but the reference voltages are trimmed
by providing a small trim current with the operational amplifiers.
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12
Applications Information (Continued)
DS100890-15
FIGURE 5. Driving the reference to force desired values requires driving with a low impedance source, provided by
the transistors. Note that pins 16 and 22 are not connected.
If reference voltages are desired that are more than a few
tens of millivolts from the self-bias values, the circuit of Fig-
ure 5 will allow forcing the reference voltages to whatever
levels are desired. This circuit provides the best performance
because of the low source impedance of the transistors.
Note that the VRTS and VRBS pins are left floating.
possible to the converter’s power supply pins. Leadless chip
capacitors are preferred because they have low lead induc-
tance.
While a single voltage source should be used for the analog
and digital supplies of the ADC1173, these supply pins
should be well isolated from each other to prevent any digital
noise from being coupled to the analog power pins. A 47
Ohm resistor is recommend between the analog and digital
supply lines, with a ceramic capacitor close to the analog
supply pin. Avoid inductive components in the analog supply
line.
VRT can be anywhere between VRB + 1.0V and the analog
supply voltage, and VRB can be anywhere between ground
and 1.0V below VRT. To minimize noise effects and ensure
accurate conversions, the total reference voltage range (VRT
- VRB) should be a minimum of 1.0V and a maximum of
=
about VA. Best performance can be realized with VRT 1.56
The converter digital supply should not be the supply that is
used for other digital circuitry on the board. It should be the
same supply used for the A/D analog supply.
=
and VRB 0.36V.
3.0 Power Supply Considerations
As is the case with all high speed converters, the ADC1173
should be assumed to have little power supply rejection, es-
pecially when self-biasing is used by connecting VRT and
VRTS together.
Many A/D converters draw sufficient transient current to cor-
rupt their own power supplies if not adequately bypassed. A
10µF tantalum or aluminum electrolytic capacitor should be
placed within an of inch (2.5 centimeters) of the A/D power
pins, with a 0.1 µF ceramic chip capacitor placed as close as
No pin should ever have a voltage on it that is in excess of
the supply voltages or below ground, not even on a trasient
13
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the high frequency components of the digital switching cur-
rents, directing them away from the analog pins. The rela-
tively lower frequency analog ground currents do not see a
significant impedance across this narrow ground connection.
Applications Information (Continued)
basis. This can be a problem upon application of power to a
circuit. Be sure that the supplies to circuits driving the CLK,
OE, analog input and reference pins do not come up any
faster than does the voltage at the ADC1173 power pins.
Generally, analog and digital lines should cross each other at
90 degrees to avoid getting digital noise into the analog path.
In video (high frequency) systems, however, avoid crossing
analog and digital lines altogether. Clock lines should be iso-
lated from ALL other lines, analog and digital. Even the gen-
erally accepted 90 degree crossing should be avoided as
even a little coupling can cause problems at high frequen-
cies. Best performance at high frequencies and at high reso-
lution is obtained with a straight signal path.
4.0 The ADC1173 Clock
Although the ADC1173 is tested and its performance is guar-
anteed with a 15MHz clock, it typically will function with clock
frequencies from 1MHz to 20MHz.
If continuous conversions are not required, power consump-
tion can be reduced somewhat by stopping the clock at a
logic low when the ADC1173 is not being used. This reduces
the current drain in the ADC1173’s digital circuitry from a
typical value of 2.3mA to about 100µA.
Be especially careful with the layout of inductors. Mutual in-
ductance can change the characteristics of the circuit in
which they are used. Inductors should not be placed side by
side, not even with just a small part of their bodies being be-
side each other.
Note that powering up the ADC1173 with the clock stopped
may not save power, as it will result in an increased current
flow (by as much as 170%) in the reference ladder. In some
cases, this may increase the ladder current above the speci-
fied limit. Toggling the clock twice at 1MHz or higher and re-
turning it to the low state will eliminate the excess ladder cur-
rent.
The analog input should be isolated from noisy signal traces
to avoid coupling of spurious signals into the input. Any ex-
ternal component (e.g., a filter capacitor) connected be-
tween the converter’s input and ground should be connected
to a very clean point in the analog ground return.
An alternative power-saving technique is to power up the
ADC1173 with the clock active, then halt the clock in the low
state after two clock cycles. Stopping the clock in the high
state is not recommended as a power-saving technique.
5.0 Layout and Grounding
Proper grounding and proper routing of all signals is essen-
tial to ensure accurate conversion. Separate analog and
digital ground planes that are connected beneath the
ADC1173 are required to meet data sheet limits. The analog
and digital grounds may be in the same layer, but should be
separated from each other. The analog and digital ground
planes should never overlap each other.
Capacitive coupling between the typically noisy digital
ground plane and the sensitive analog circuitry can lead to
poor performance that may seem impossible to isolate and
remedy. The solution is to keep the analog circuity well sepa-
rated from the digital circuitry and from the digital ground
plane.
Digital circuits create substantial supply and ground tran-
sients. The logic noise thus generated could have significant
impact upon system noise performance. The best logic fam-
ily to use in systems with A/D converters is one which em-
ploys non-saturating transistor designs, or has low noise
characteristics, such as the 74HC(T) and 74AC(T)Q families.
Worst noise generators are logic families that draw the larg-
est supply current transients during clock or signal edges,
like the 74F and the 74AC(T) families. In general, slower
logic families, such as 74LS and 74HC(T), will produce less
high frequency noise than do high speed logic families, such
as the 74F and 74AC(T) families.
DS100890-16
FIGURE 6. Layout example showing separate analog
and digital ground planes connected below the
ADC1173.
Figure 6 gives an example of a suitable layout. All analog cir-
cuitry (input amplifiers, filters, reference components, etc.)
should be placed on or over the analog ground plane. All
digital circuitry and I/O lines should be placed over the digital
ground plane.
Since digital switching transients are composed largely of
high frequency components, total ground plane copper
weight will have little effect upon the logic-generated noise.
This is because of the skin effect. Total surface area is more
important than is total ground plane volume.
6.0 Dynamic Performance
The ADC1173 is ac tested and its dynamic performance is
guaranteed. To meet the published specifications, the clock
source driving the CLK input must be free of jitter. For best
ac performance, isolating the ADC clock from any digital cir-
cuitry should be done with adequate buffers, as with a clock
tree. See Figure 7.
An effective way to control ground noise is by connecting the
analog and digital ground planes together beneath the ADC
with a copper trace that is very narrow (about 3/16 inch)
compared with the rest of the ground plane. This narrowing
beneath the converter provides a fairly high impedance to
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14
Applications Information (Continued)
DS100890-17
FIGURE 7. Isolating the ADC clock from Digital Circuitry.
It is good practice to keep the ADC clock line as short as
possible and to keep it well away from any other signals.
Other signals can introduce jitter into the clock signal.
dynamic capacitance is more difficult to drive than is a fixed
capacitance, and should be considered when choosing a
driving device. The CLC409, CLC440, LM6152, LM6154,
LM6181 and LM6182 have been found to be excellent de-
vices for driving the ADC1173 analog input.
7.0 Common Application Pitfalls
Driving the inputs (analog or digital) beyond the power
supply rails. For proper operation, all inputs should not go
more than 50mV below the ground pins or 50mV above the
supply pins. Exceeding these limits on even a transient basis
can cause faulty or erratic operation. It is not uncommon for
high speed digital circuits (e.g., 74F and 74AC devices) to
exhibit undershoot that goes more than a volt below ground.
A resistor of 50Ω in series with the offending digital input will
usually eliminate the problem.
Driving the VRT pin or the VRB pin with devices that can
not source or sink the current required by the ladder. As
mentioned in section 2.0, care should be taken to see that
any driving devices can source sufficient current into the VRT
pin and sink sufficient current from the VRB pin. If these pins
are not driven with devices than can handle the required cur-
rent, these reference pins will not be stable, resulting in a re-
duction of dynamic performance.
Using a clock source with excessive jitter, using an ex-
cessively long clock signal trace, or having other sig-
nals coupled to the clock signal trace. This will cause the
sampling interval to vary, causing excessive output noise
and a reduction in SNR performance. Simple gates with RC
timing is generally inadequate as a clock source.
Care should be taken not to overdrive the inputs of the
ADC1173. Such practice may lead to conversion inaccura-
cies and even to device damage.
Attempting to drive a high capacitance digital data bus.
The more capacitance the output drivers must charge for
each conversion, the more instantaneous digital current is
required from DVDD and DGND. These large charging cur-
rent spikes can couple into the analog section, degrading dy-
namic performance. Buffering the digital data outputs (with
an 74ACQ541, for example) may be necessary if the data
bus to be driven is heavily loaded. Dynamic performance
can also be improved by adding 47Ω series resistors at each
digital output, reducing the energy coupled back into the
converter output pins.
Input test signal contains harmonic distortion that inter-
feres with the measurement of dynamic signal to noise
ratio. Harmonic and other interfering signals can be re-
moved by inserting a filter at the signal input. Suitable filters
are shown in Figure 8 and Figure 9. The circuit of Figure 8
has cutoff of about 5.5 MHz and is suitable for input frequen-
cies of 1 MHz to 5 MHz. The circuit of Figure 9 has a cutoff
of about 11 MHz and is suitable for input frequencies of 5
MHz to 10 MHz. These filters should be driven by a genera-
tor of 75 Ohm source impedance and terminated with a 75
ohm resistor.
Using an inadequate amplifier to drive the analog input.
As explained in Section 1.0, the capacitance seen at the in-
put alternates between 4 pF and 11 pF with the clock. This
DS100890-18
FIGURE 8. 5.5 MHz Low Pass Filter to Eliminate Harmonics at the Signal Input.
DS100890-19
FIGURE 9. 11 MHz Low Pass filter to eliminate harmonics at the signal input.
Use at input frequencies of 5 MHz to 10 MHz
15
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Physical Dimensions inches (millimeters) unless otherwise noted
24-Lead Package JM
Ordering Number ADC1173CIJM
NS Package Number M24D
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16
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
24-Lead Package TC
Ordering Number ADC1173CIMTC
NS Package Number MTC24
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2. A critical component is any component of a life
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相关型号:
ADC1173CIMTC/NOPB
IC 1-CH 8-BIT RESISTANCE LADDER ADC, PARALLEL ACCESS, PDSO24, TSSOP-24, Analog to Digital Converter
NSC
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