ADC1173CIJMX [NSC]

8-Bit, 3-Volt, 15MSPS, 33mW A/D Converter; 8位, 3伏, 15MSPS , 33MW A / D转换器
ADC1173CIJMX
型号: ADC1173CIJMX
厂家: National Semiconductor    National Semiconductor
描述:

8-Bit, 3-Volt, 15MSPS, 33mW A/D Converter
8位, 3伏, 15MSPS , 33MW A / D转换器

转换器
文件: 总17页 (文件大小:469K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
February 1999  
ADC1173  
8-Bit, 3-Volt, 15MSPS, 33mW A/D Converter  
General Description  
Key Specifications  
The ADC1173 is a low power, 15 MSPS analog-to-digital  
converter that digitizes signals to 8 bits while consuming just  
33 mW of power (typ). The ADC1173 uses a unique architec-  
ture that achieves 7.6 Effective Bits. Output formatting is  
straight binary coding.  
n Resolution  
8 Bits  
15 MSPS (min)  
−56 dB (typ)  
n Maximum Sampling Frequency  
n THD  
±
n DNL  
0.8 LSB (max)  
7.6 Bits (typ)  
The excellent DC and AC characteristics of this device, to-  
gether with its low power consumption and +3V single supply  
operation, make it ideally suited for many video, imaging and  
communications applications, including use in portable  
equipment. Furthermore, the ADC1173 is resistant to latchup  
and the outputs are short-circuit proof. The top and bottom of  
the ADC1173’s reference ladder is available for connections,  
enabling a wide range of input possibilities.  
n ENOB at 3.58 MHz Input  
n Guaranteed No Missing Codes  
n Differential Phase  
n Differential Gain  
n Power Consumption  
0.5 Degree (max)  
1.5% (typ)  
33mW (typ)  
(excluding reference current)  
The ADC1173 is offered in SOIC (EIAJ) and TSSOP. It is de-  
signed to operate over the commercial temperature range of  
-20˚C to +75˚C.  
Applications  
n Video Digitization  
n Digital Still Cameras  
n Set Top Boxes  
Features  
n Internal Sample-and-Hold Function  
n Single +3V Operation  
n Internal Reference Bias Resistors  
n Industry Standard Pinout  
n TRI-STATE® Outputs  
n Camcorders  
n Personal Computer Video  
n Digital Television  
n CCD Imaging  
n Electro-Optics  
Ordering Information  
ADC1173CIJM  
SOIC (EIAJ)  
ADC1173CIJMX  
ADC1173CIMTC  
ADC1173CIMTCX  
SOIC (EIAJ) (tape & reel)  
TSSOP  
TSSOP (tape & reel)  
Pin Configuration  
DS100890-1  
TRI-STATE® is a registered trademark of National Semiconductor Corporation.  
© 1999 National Semiconductor Corporation  
DS100890  
www.national.com  
Block Diagram  
DS100890-2  
Pin Descriptions and Equivalent Circuits  
Pin  
No.  
Symbol  
Equivalent Circuit  
Description  
Analog signal input. Conversion range is VRB to  
VRT  
19  
VIN  
.
Reference Top Bias with internal pull-up resistor.  
Short this pin to VRT to self bias the reference  
ladder.  
16  
17  
VRTS  
Analog Input that is the high (top) side of the  
reference ladder of the ADC. Nominal range is 1.0V  
to AVDD. Voltage on VRT and VRB inputs define the  
VIN conversion range. Bypass well. See Section 2.0  
for more information.  
VRT  
Analog Input that is the low (bottom) side of the  
reference ladder of the ADC. Nominal range is 0V  
to 2.0V. Voltage on VRT and VRB inputs define the  
VIN conversion range. Bypass well. See Section 2.0  
for more information.  
23  
VRB  
www.national.com  
2
Pin Descriptions and Equivalent Circuits (Continued)  
Pin  
No.  
Symbol  
Equivalent Circuit  
Description  
Reference Bottom Bias with internal pull down  
resistor. Short to VRB to self bias the reference  
ladder.  
22  
VRBS  
CMOS/TTL compatible Digital input that, when low,  
enables the digital outputs of the ADC1173. When  
high, the outputs are in a high impedance state.  
1
OE  
CMOS/TTL compatible digital clock Input. VIN is  
sampled on the falling edge of CLK input.  
12  
CLK  
Conversion data digital Output pins. D0 is the LSB,  
D7 is the MSB. Valid data is output just after the  
rising edge of the CLK input. These pins are  
enabled by bringing the OE pin low.  
3 thru  
10  
D0-D7  
Positive digital supply pin. Connect to a clean, quiet  
voltage source of +3V. AVDD and DVDD should have  
a common source and be separately bypassed with  
a 10µF capacitor and a 0.1µF ceramic chip  
11, 13  
2, 24  
DVDD  
DVSS  
AVDD  
AVSS  
capacitor. See Section 3.0 for more information.  
The ground return for the digital supply. AVSS and  
DVSS should be connected together close to the  
ADC1173.  
Positive analog supply pin. Connected to a clean,  
quiet voltage source of +3V. AVDD and DVDD should  
have a common source and be separately bypassed  
with a 10 µF capacitor and a 0.1 µF ceramic chip  
capacitor. See Section 3.0 for more information.  
14,  
15, 18  
The ground return for the analog supply. AVSS and  
DVSS should be connected together close to the  
ADC1173 package.  
20, 21  
3
www.national.com  
Absolute Maximum Ratings (Note 1)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
ESD Susceptibility (Note 5)  
Human Body Model  
Machine Model  
2000V  
200V  
Soldering Temp., Infared, 10  
sec. (Note 6)  
300˚C  
AVDD, DVDD  
6.5V  
−0.3V to 6.5V  
Storage Temperature  
−65˚C to +150˚C  
Voltage on Any Pin  
V
RT, VRB  
AVDD to VSS  
Operating Ratings(Notes 1, 2)  
CLK, OE Voltage  
−0.05 to (AVDD + 0.05V)  
DVSS to DVDD  
Digital Output Voltage  
Input Current (Note 3)  
Temperature Range  
AVDD, DVDD  
−20˚C TA +75˚C  
+2.7V to +3.6V  
0V to 100 mV  
1.0V to AVDD  
0V to 2.0V  
±
25mA  
Package Input Current  
(Note 3)  
|AVSS -DVSS  
VRT  
|
±
50mA  
Package Dissipation at 25˚C  
(Note 4)  
VRB  
V
IN Voltage Range  
VRB to VRT  
Converter Electrical Characteristics  
=
=
=
=
=
=
The following specifications apply for AVDD = DVDD +3.0VDC, OE 0V, VRT +2.0V, VRB 0V, CL 20 pF, fCLK 15MHz  
=
=
at 50% duty cycle. Boldface limits apply for TA TMIN to TMAX; all other limits TA 25˚C (Notes 7, 8)  
Typical  
(Note 9)  
Symbol  
Parameter  
Conditions  
Limits  
Units  
DC Accuracy  
±
±
±
1.3  
INL  
Integral Non Linearity  
Differential Non Linearity  
Missing Codes  
0.5  
0.4  
LSB( max)  
LSB( max)  
(max)  
±
DNL  
0.85  
0
EOT  
EOB  
Top Offset  
−12  
mV  
Bottom Offset  
+1.0  
mV  
Video Accuracy  
=
DP  
DG  
Differential Phase Error  
Differential Gain Error  
fin 3.58 MHz sine wave  
0.5  
1.5  
Degree  
%
=
fin 3.58 MHz sine wave  
Analog Input and Reference Characteristics  
VRB  
VRT  
V(min)  
V(max)  
VIN  
Input Range  
2.0  
4
(CLK  
LOW)  
=
CIN  
VIN Input Capacitance  
VIN 1.5V + 0.7Vrms  
pF  
(CLK  
HIGH)  
11  
>
RIN  
BW  
RRT  
Input Resistance  
1
MΩ  
MHz  
Analog Input Bandwidth  
Top Reference Resistor  
120  
360  
300  
200  
400  
(min)  
(max)  
Reference Ladder  
Resistance  
RREF  
RRB  
VRT to VRB  
Bottom Reference Resistor  
90  
mA  
=
=
VRT VRTS, VRB VRBS  
4.2  
IREF  
Reference Ladder Current  
=
=
VRT VRTS,VRB AVSS  
4.8  
1.56  
0.36  
1.2  
mA  
Reference Top Self Bias  
Voltage  
VRT connected to VRTS  
VRB connected to VRBS  
1.45  
1.65  
V(min)  
V(max)  
VRT  
VRB  
VRT connected to VRTS  
VRB connected to VRBS  
0.32  
0.40  
V(min)  
V(max)  
Reference Bottom Self Bias  
Voltage  
VRT connected to VRTS  
VRB connected to VRBS  
,
1.1  
1.3  
µAmin  
µAmax  
VRTS  
VRBS  
-
Self Bias Voltage Delta  
VRT connected to VRTS  
VRB connected to VSS  
,
1.38  
V
www.national.com  
4
Converter Electrical Characteristics (Continued)  
=
=
=
=
=
=
The following specifications apply for AVDD = DVDD +3.0VDC, OE 0V, VRT +2.0V, VRB 0V, CL 20 pF, fCLK 15MHz  
=
=
at 50% duty cycle. Boldface limits apply for TA TMIN to TMAX; all other limits TA 25˚C (Notes 7, 8)  
Typical  
Symbol  
Parameter  
Conditions  
Limits  
Units  
(Note 9)  
2
Analog Input and Reference Characteristics  
1.0  
VA  
V(min)  
V(max)  
VRT  
VRB  
-
Reference Voltage Delta  
Power Supply Characteristics  
=
=
IADD  
IDDD  
Analog Supply Current  
Digital Supply Curretn  
DVDD AVDD 3.6V  
6.8  
2.3  
9.1  
mA  
mA  
mA  
=
=
DVDD AVDD 3.6V  
=
DVDD AVDD 3.6V,  
11  
40  
IAVDD  
IDVDD  
+
Total Operating Current  
=
=
DVDD AVDD 3.6V, CLK Low  
5.8  
33  
mA  
(Note 10)  
=
=
Power Consumption  
DVDD AVDD 3.6V  
mW  
CLK, OE Digital Input Characteristics  
=
=
VIH  
VIL  
IIH  
Logical High Input Voltage  
Logical Low Input Voltage  
Logical High Input Current  
Logic Low Input Current  
Logic Input Capacitance  
DVDD AVDD 3.6V  
2.2  
0.8  
V (min)  
V (max)  
µA  
=
=
DVDD AVDD 3.6V  
=
=
=
VIH DVDD AVDD 3.6V  
5
−5  
5
=
=
=
IIL  
VIL 0V, DVDD AVDD 3.6V  
µA  
CIN  
pF  
Digital Output Characteristics  
=
=
DVDD 2.7V, IOH −360µA  
2.4  
2.1  
V(min)  
V(min)  
V(max)  
VOH  
High Level Output Voltage  
=
=
DVDD 2.7V, IOH −1.1mA  
1.9  
0.6  
=
=
VOL  
Low Level Output Voltage  
Tri-State®Leakage Current  
DVDD 2.7V, IOL 1.6mA  
0.32  
= =  
DVDD 3.6V, OE DVDD,  
VOL 0V or VOH DVDD  
IOZH  
IOZL  
,
±
20  
µA  
=
=
AC Electrical Characteristics  
fC1 Maximum Conversion Rate  
fC2  
20  
15  
MHz(min)  
MHz  
Minimum Conversion Rate  
Output Delay  
1
t
t
OD−0  
OD−1  
CLK high to low data valid  
CLK low to high data valid  
28  
24  
ns(max)  
ns(max)  
Output Delay  
Clock  
Cycles  
Pipline Delay (Latency)  
2.5  
tDS  
tAJ  
Sampling (Aperture) Delay  
Aperture Jitter  
CLK low to acquissition of data  
3
ns  
ps rms  
ns  
30  
15  
22  
12  
tOH  
tEN  
tDIS  
Output Hold Time  
CLK high to data invalid  
Loaded as in Figure 2  
Loaded as in Figure 2  
OE Low to Data Valid  
OE High to High Z State  
ns  
ns  
=
fIN 1.31 MHz  
7.7  
7.6  
7.4  
=
ENOB  
SINAD  
SNR  
Effective Number of Bits  
Signal-to- Noise & Distortion  
Signal-to-Noise Ratio  
fIN 3.58 MHz  
7.0  
43  
44  
Bits (min)  
dB(min)  
dB(min)  
dB  
=
fIN 7.5 MHz  
=
fIN 1.31 MHz  
49  
47.7  
46.5  
=
fIN 3.58 MHz  
=
fIN 7.5 MHz  
=
fIN 1.31 MHz  
49  
48.7  
48.0  
=
fIN 3.58 MHz  
=
fIN 7.5 MHz  
=
fIN 1.31 MHz  
65  
55  
51  
Spurious Free Dynamic  
Range  
=
fIN 3.58 MHz  
SFDR  
THD  
=
fIN 7.5 MHz  
=
fIN 1.31 MHz  
−62  
−54  
−51  
=
Total Harmonic Distortion  
fIN 3.58 MHz  
dB  
=
fIN 7.5 MHz  
5
www.national.com  
Converter Electrical Characteristics (Continued)  
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is func-  
tional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed speci-  
fications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.  
=
=
=
0V, unless otherwise specified.  
SS  
Note 2: All voltages are measured with respect to GND AV  
DV  
SS  
Note 3: When the input voltage at any pin exceeds the power supplies (that is, less than AV or DV , or greater than AV or DV ), the current at that pin should  
SS SS DD DD  
be limited to 25 mA. The 50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of  
25 mA to two.  
Note 4: The absolute maximum junction temperatures (T max) for this device is 150˚C. The maximum allowable power dissipation is dictated by T max, the  
J
J
=
junction-to-ambient thermal resistance θ , and the ambient temperature, T , and can be calculated using the formula P MAX (T max - T )/θ . In the 24-pin  
J
A
A
D
J
A
J
A
=
TSSOP, θ is 92˚C/W, so P MAX 1,358 mW at 25˚C and 815 mW at the maximum operating ambient temperature of 75˚C. (Typical thermal resistance, θ , of  
JA JA  
D
this part is 98˚C/W for the EIAJ SOIC). Note that the power dissipation of this device under normal operation will typically be about 49 mW (33 mW quiescent power  
+ 13 mW reference ladder power + 3 mW due to 1 TTL loan on each digital output. The values for maximum power dissipation listed above will be reached only when  
the ADC1173 is operated in a severe fault condition (e.g. when input or output pins are driven beyond the power supply voltages, or the power supply polarity is re-  
versed). Obviously, such conditions should always be avoided.  
Note 5: Human body model is 100 pF capacitor discharged through a 1.5kresistor. Machine model is 220 pf discharged through ZERO .  
Note 6: See AN450, Surface Mounting Methods and Their Effect on Product Reliability, or the section entitled Surface Mountfound in any post 1986 National  
Semiconductor Linear Data Book, for other methods of soldering surface mount devices.  
Note 7: The analog inputs are protected as shown below. Input voltage magnitudes up to 6.5V or to 500 mV below GND will not damage this device. However, errors  
in the A/D conversion can occur if the input goes above V or below GND by more than 50 mV. As an example, if AV is 2.7V , the full-scale input voltage must  
DD  
DD  
DC  
be 2.75V  
to ensure accurate conversions.  
DC  
DS100890-10  
Note 8: To guarantee accuracy, it is required that AV  
DD  
and DV  
be well bypassed. Each supply pin must be decoupled with separate bypass capacitors.  
DD  
Note 9: Typical figures are at T = 25˚C, and represent most likely parametric norms. Test limits are guaranteed to National’s AOQL (Average Outgoing Quality  
J
Level).  
Note 10: At least two clock cycles must be presented to the ADC1173 after power up. See Section 4.0 for details.  
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6
Typical Performance Characteristics  
INL vs Temperature  
DNL vs Temperature  
SNR vs Temperature  
DS100890-21  
DS100890-22  
DS100890-20  
SNR vs fIN  
THD vs Temperature  
SINAD/ENOB vs Temp  
DS100890-23  
DS100890-24  
DS100890-33  
SINAD/ENOB vs fIN  
SFDR vs fIN  
Differential Gain vs Temperature  
DS100890-26  
DS100890-29  
DS100890-31  
Differential Phase vs Temperature  
Spectral Response  
IDDD + IADD vs fCLK  
DS100890-27  
DS100890-32  
DS100890-28  
7
www.national.com  
Typical Performance Characteristics (Continued)  
tOD vs Temperature  
DS100890-25  
SAMPLING (APERTURE) DELAY is that time required after  
Specification Definitions  
the fall of the clock input for the sampling switch to open. The  
Sample/Hold circuit effectively stops capturing the input sig-  
nal and goes into the holdmode tDS after the clock goes  
low.  
ANALOG INPUT BANDWIDTH is a measure of the fre-  
quency at which the reconstructed output fundamental drops  
3 dB below its low frequency value for a full scale input. The  
test is performed with fIN equal to 100 KHz plus integer mul-  
tiples of fCLK. The input frequency at which the output is −3  
dB relative to the low frequency input signal is the full power  
bandwidth.  
SIGNAL TO NOISE RATIO (SNR) is the ratio of the rms  
value of the input signal to the rms value of the other spectral  
components below one-half the sampling frequency, not in-  
cluding harmonics or dc.  
APERTURE JITTER is the time uncertainty of the sampling  
point (tDS), or the range of variation in the sampling delay.  
SIGNAL TO NOISE PLUS DISTORTION (S/(N+D) or SI-  
NAD) Is the ratio of the rms value of the input signal to the  
rms value of all of the other spectral components below half  
the clock frequency, including harmonics but excluding dc.  
BOTTOM OFFSET is the difference between the input volt-  
age that just causes the output code to transition to the first  
code and the negative reference voltage. Bottom offset is  
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the differ-  
ence, expressed in dB, between the rms values of the input  
signal and the peak spurious signal, where a spurious signal  
is any signal present in the output spectrum that is not  
present at the input.  
=
defined as EOB VZT - VRB, where VZT is the first code tran-  
sition input voltage. Note that this is different from the normal  
Zero Scale Error.  
DIFFERENTIAL GAIN ERROR is the percentage difference  
between the output amplitudes of a high frequency recon-  
structed sine wave at two different dc levels.  
TOP OFFSET is the difference between the positive refer-  
ence voltage and the input voltage that just causes the out-  
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of  
the maximum deviation from the ideal step size of 1 LSB.  
=
put code to transition to full scale and is defined as EOT  
VFT − VRT. Where VFT is the full scale transition input volt-  
DIFFERENTIAL PHASE ERROR is the difference in the out-  
put phase of a reconstructed small signal sine wave at two  
different dc levels.  
age. Note that this is different from the normal Full Scale Er-  
ror.  
TOTAL HARMONIC DISTORTION (THD) is the ratio of the  
rms total of the first six harmonic components, to the rms  
value of the input signal.  
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE  
BITS) is another method of specifying Signal-to-Noise and  
Distortion Ratio, or SINAD. ENOB is defined as (SINAD -  
1.76) / 6.02 and says that the converter is equivalent to a  
perfect ADC of this (ENOB) number of bits.  
INTEGRAL NON-LINEARITY (INL) is a measure of the de-  
viation of each individual code from a line drawn from zero  
scale (1⁄  
full scale (1⁄  
2
LSB below the first code transition) through positive  
2
LSB above the last code transition). The devia-  
tion of any given code from this straight line is measured  
from the center of that code value. The end poinnt test  
method is used.  
OUTPUT DELAY is the time delay after the rising edge of  
the input clock before the data update is present at the out-  
put pins.  
OUTPUT HOLD TIME is the length of time that the output  
data is valid after the rise of the input clock.  
PIPELINE DELAY (LATENCY) is the number of clock cycles  
between initiation of conversion and the availability of that  
conversion result at the output. New data is available at ev-  
ery clock cycle, but the data lags the conversion by the pipe-  
line delay.  
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8
Timing Diagram  
DS100890-11  
FIGURE 1. ADC1173 Timing Diagram  
DS100890-12  
FIGURE 2. tEN, tDISTest Circuit  
9
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you desire to eliminate these adjustments, you should re-  
duce the signal swing to avoid clipping at the ADC1173 out-  
put that can result from normal tolerances of all system com-  
ponents. With no adjustments, the nominal value for the  
amplifier feedback resistor is 510and the 5.1k resistor at  
the inverting input should be changed to 860and returned  
to +3V rather than to the Offset Adjust potentiometer.  
Functional Description  
The ADC1173 uses a new, unique architecture to achieve  
7.4 effective bits at and maintains superior dynamic perfor-  
1
mance up to  
2 the clock frequency.  
The analog signal at VIN that is within the voltage range set  
by VRT and VRB are digitized to eight bits at up to 20 MSPS.  
Input voltages below VRB will cause the output word to con-  
sist of all zeroes. Input voltages above VRT will cause the  
output word to consist of all ones. VRT has a range of 1.0 Volt  
to the analog supply voltage, AVDD, while VRB has a range of  
0 to 2.0 Volts. VRT should always be at least 1.0 Volt more  
2.0 Reference Inputs  
The reference inputs VRT (Reference Top) and VRB (Refer-  
ence Bottom) are the top and bottom of the reference ladder.  
Input signals between these two voltages will be digitized to  
8 bits. External voltages applied to the reference input pins  
should be within the range specified in the Operating Ratings  
table (1.0V to AVDD for VRT and 0V to (AVDD - 1.0V) for VRB).  
Any device used to drive the reference pins should be able to  
source sufficient current into the VRT pin and sink sufficient  
current from the VRB pin.  
positive than VRB  
.
If VRT and VRTS are connected together and VRB and VRBS  
are connected together, the nominal values of VRT and VRB  
are 1.56V and 0.36V, respectively. If VRT and VRTS are con-  
nected together and VRB is grounded, the nominal value of  
VRT is 1.38V.  
Data is acquired at the falling edge of the clock and the digi-  
tal equivalent of the data is available at the digital outputs 2.5  
clock cycles plus tOD later. The ADC1173 will convert as long  
as the clock signal is present at pin 12. The Output Enable  
pin OE, when low, enables the output pins. The digital out-  
puts are in the high impedance state when the OE pin is  
high.  
The reference ladder can be self-biased by connecting VRT  
to VRTS and connecting VRB to VRBS to provide top and bot-  
tom reference voltages of approximately 1.56V and 0.36V,  
respectively, with VCC = 3.0V. This connection is shown in  
Figure 3. If VRT and VRTS are tied together, but VRB is tied to  
analog ground, a top reference voltage of approximately  
1.38V is generated. The top and bottom of the ladder should  
be bypassed with 10µF tantalum capacitors located close to  
the reference pins.  
Applications Information  
The reference self-bias circuit of Figure 3 is very simple and  
performance is adequate for many applications. Superior  
performance can generally be achieved by driving the refer-  
ence pins with a low impedance source.  
1.0 The Analog Input  
The analog input of the ADC1173 is a switch followed by an  
integrator. The input capacitance changes with the clock  
level, appearing as 4 pF when the clock is low, and 11 pF  
when the clock is high. Since a dynamic capacitance is more  
difficult to drive than a fixed capacitance, choose an amplifier  
that can drive this type of load. The CLC409, CLC440,  
LM6152, LM6154, LM6181 and LM6182 have been found to  
be excellent devices for driving the ADC1173. Do not drive  
the input beyond the supply rails.  
By forcing a little current into or out of the top and bottom of  
the ladder, as shown in Figure 4, the top and bottom refer-  
ence voltages can be trimmed. The resistive divider at the  
amplifier inputs can be replaced with potentiometers. The  
LMC662 amplifier shown was chosen for its low offset volt-  
age and low cost. Note that a negative power supply is  
needed for these amplifiers as their outputs may be required  
to go slightly negative to force the required reference  
voltages.  
Figure 3 shows an example of an input circuit using the  
LM6181. This circuit has both gain and offset adjustments. If  
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10  
Applications Information (Continued)  
DS100890-13  
FIGURE 3. Simple, Low Component Count, Self -Bias Reference application. Because of resistor tolerances, the  
reference voltages can vary by as much as 6%. Choose an amplifier that can drive a dynamic capacitance (see text).  
11  
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Applications Information (Continued)  
DS100890-14  
FIGURE 4. Better defining the ADC Reference Voltage. Self-bias is still used, but the reference voltages are trimmed  
by providing a small trim current with the operational amplifiers.  
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12  
Applications Information (Continued)  
DS100890-15  
FIGURE 5. Driving the reference to force desired values requires driving with a low impedance source, provided by  
the transistors. Note that pins 16 and 22 are not connected.  
If reference voltages are desired that are more than a few  
tens of millivolts from the self-bias values, the circuit of Fig-  
ure 5 will allow forcing the reference voltages to whatever  
levels are desired. This circuit provides the best performance  
because of the low source impedance of the transistors.  
Note that the VRTS and VRBS pins are left floating.  
possible to the converter’s power supply pins. Leadless chip  
capacitors are preferred because they have low lead induc-  
tance.  
While a single voltage source should be used for the analog  
and digital supplies of the ADC1173, these supply pins  
should be well isolated from each other to prevent any digital  
noise from being coupled to the analog power pins. A 47  
Ohm resistor is recommend between the analog and digital  
supply lines, with a ceramic capacitor close to the analog  
supply pin. Avoid inductive components in the analog supply  
line.  
VRT can be anywhere between VRB + 1.0V and the analog  
supply voltage, and VRB can be anywhere between ground  
and 1.0V below VRT. To minimize noise effects and ensure  
accurate conversions, the total reference voltage range (VRT  
- VRB) should be a minimum of 1.0V and a maximum of  
=
about VA. Best performance can be realized with VRT 1.56  
The converter digital supply should not be the supply that is  
used for other digital circuitry on the board. It should be the  
same supply used for the A/D analog supply.  
=
and VRB 0.36V.  
3.0 Power Supply Considerations  
As is the case with all high speed converters, the ADC1173  
should be assumed to have little power supply rejection, es-  
pecially when self-biasing is used by connecting VRT and  
VRTS together.  
Many A/D converters draw sufficient transient current to cor-  
rupt their own power supplies if not adequately bypassed. A  
10µF tantalum or aluminum electrolytic capacitor should be  
placed within an of inch (2.5 centimeters) of the A/D power  
pins, with a 0.1 µF ceramic chip capacitor placed as close as  
No pin should ever have a voltage on it that is in excess of  
the supply voltages or below ground, not even on a trasient  
13  
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the high frequency components of the digital switching cur-  
rents, directing them away from the analog pins. The rela-  
tively lower frequency analog ground currents do not see a  
significant impedance across this narrow ground connection.  
Applications Information (Continued)  
basis. This can be a problem upon application of power to a  
circuit. Be sure that the supplies to circuits driving the CLK,  
OE, analog input and reference pins do not come up any  
faster than does the voltage at the ADC1173 power pins.  
Generally, analog and digital lines should cross each other at  
90 degrees to avoid getting digital noise into the analog path.  
In video (high frequency) systems, however, avoid crossing  
analog and digital lines altogether. Clock lines should be iso-  
lated from ALL other lines, analog and digital. Even the gen-  
erally accepted 90 degree crossing should be avoided as  
even a little coupling can cause problems at high frequen-  
cies. Best performance at high frequencies and at high reso-  
lution is obtained with a straight signal path.  
4.0 The ADC1173 Clock  
Although the ADC1173 is tested and its performance is guar-  
anteed with a 15MHz clock, it typically will function with clock  
frequencies from 1MHz to 20MHz.  
If continuous conversions are not required, power consump-  
tion can be reduced somewhat by stopping the clock at a  
logic low when the ADC1173 is not being used. This reduces  
the current drain in the ADC1173’s digital circuitry from a  
typical value of 2.3mA to about 100µA.  
Be especially careful with the layout of inductors. Mutual in-  
ductance can change the characteristics of the circuit in  
which they are used. Inductors should not be placed side by  
side, not even with just a small part of their bodies being be-  
side each other.  
Note that powering up the ADC1173 with the clock stopped  
may not save power, as it will result in an increased current  
flow (by as much as 170%) in the reference ladder. In some  
cases, this may increase the ladder current above the speci-  
fied limit. Toggling the clock twice at 1MHz or higher and re-  
turning it to the low state will eliminate the excess ladder cur-  
rent.  
The analog input should be isolated from noisy signal traces  
to avoid coupling of spurious signals into the input. Any ex-  
ternal component (e.g., a filter capacitor) connected be-  
tween the converter’s input and ground should be connected  
to a very clean point in the analog ground return.  
An alternative power-saving technique is to power up the  
ADC1173 with the clock active, then halt the clock in the low  
state after two clock cycles. Stopping the clock in the high  
state is not recommended as a power-saving technique.  
5.0 Layout and Grounding  
Proper grounding and proper routing of all signals is essen-  
tial to ensure accurate conversion. Separate analog and  
digital ground planes that are connected beneath the  
ADC1173 are required to meet data sheet limits. The analog  
and digital grounds may be in the same layer, but should be  
separated from each other. The analog and digital ground  
planes should never overlap each other.  
Capacitive coupling between the typically noisy digital  
ground plane and the sensitive analog circuitry can lead to  
poor performance that may seem impossible to isolate and  
remedy. The solution is to keep the analog circuity well sepa-  
rated from the digital circuitry and from the digital ground  
plane.  
Digital circuits create substantial supply and ground tran-  
sients. The logic noise thus generated could have significant  
impact upon system noise performance. The best logic fam-  
ily to use in systems with A/D converters is one which em-  
ploys non-saturating transistor designs, or has low noise  
characteristics, such as the 74HC(T) and 74AC(T)Q families.  
Worst noise generators are logic families that draw the larg-  
est supply current transients during clock or signal edges,  
like the 74F and the 74AC(T) families. In general, slower  
logic families, such as 74LS and 74HC(T), will produce less  
high frequency noise than do high speed logic families, such  
as the 74F and 74AC(T) families.  
DS100890-16  
FIGURE 6. Layout example showing separate analog  
and digital ground planes connected below the  
ADC1173.  
Figure 6 gives an example of a suitable layout. All analog cir-  
cuitry (input amplifiers, filters, reference components, etc.)  
should be placed on or over the analog ground plane. All  
digital circuitry and I/O lines should be placed over the digital  
ground plane.  
Since digital switching transients are composed largely of  
high frequency components, total ground plane copper  
weight will have little effect upon the logic-generated noise.  
This is because of the skin effect. Total surface area is more  
important than is total ground plane volume.  
6.0 Dynamic Performance  
The ADC1173 is ac tested and its dynamic performance is  
guaranteed. To meet the published specifications, the clock  
source driving the CLK input must be free of jitter. For best  
ac performance, isolating the ADC clock from any digital cir-  
cuitry should be done with adequate buffers, as with a clock  
tree. See Figure 7.  
An effective way to control ground noise is by connecting the  
analog and digital ground planes together beneath the ADC  
with a copper trace that is very narrow (about 3/16 inch)  
compared with the rest of the ground plane. This narrowing  
beneath the converter provides a fairly high impedance to  
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14  
Applications Information (Continued)  
DS100890-17  
FIGURE 7. Isolating the ADC clock from Digital Circuitry.  
It is good practice to keep the ADC clock line as short as  
possible and to keep it well away from any other signals.  
Other signals can introduce jitter into the clock signal.  
dynamic capacitance is more difficult to drive than is a fixed  
capacitance, and should be considered when choosing a  
driving device. The CLC409, CLC440, LM6152, LM6154,  
LM6181 and LM6182 have been found to be excellent de-  
vices for driving the ADC1173 analog input.  
7.0 Common Application Pitfalls  
Driving the inputs (analog or digital) beyond the power  
supply rails. For proper operation, all inputs should not go  
more than 50mV below the ground pins or 50mV above the  
supply pins. Exceeding these limits on even a transient basis  
can cause faulty or erratic operation. It is not uncommon for  
high speed digital circuits (e.g., 74F and 74AC devices) to  
exhibit undershoot that goes more than a volt below ground.  
A resistor of 50in series with the offending digital input will  
usually eliminate the problem.  
Driving the VRT pin or the VRB pin with devices that can  
not source or sink the current required by the ladder. As  
mentioned in section 2.0, care should be taken to see that  
any driving devices can source sufficient current into the VRT  
pin and sink sufficient current from the VRB pin. If these pins  
are not driven with devices than can handle the required cur-  
rent, these reference pins will not be stable, resulting in a re-  
duction of dynamic performance.  
Using a clock source with excessive jitter, using an ex-  
cessively long clock signal trace, or having other sig-  
nals coupled to the clock signal trace. This will cause the  
sampling interval to vary, causing excessive output noise  
and a reduction in SNR performance. Simple gates with RC  
timing is generally inadequate as a clock source.  
Care should be taken not to overdrive the inputs of the  
ADC1173. Such practice may lead to conversion inaccura-  
cies and even to device damage.  
Attempting to drive a high capacitance digital data bus.  
The more capacitance the output drivers must charge for  
each conversion, the more instantaneous digital current is  
required from DVDD and DGND. These large charging cur-  
rent spikes can couple into the analog section, degrading dy-  
namic performance. Buffering the digital data outputs (with  
an 74ACQ541, for example) may be necessary if the data  
bus to be driven is heavily loaded. Dynamic performance  
can also be improved by adding 47series resistors at each  
digital output, reducing the energy coupled back into the  
converter output pins.  
Input test signal contains harmonic distortion that inter-  
feres with the measurement of dynamic signal to noise  
ratio. Harmonic and other interfering signals can be re-  
moved by inserting a filter at the signal input. Suitable filters  
are shown in Figure 8 and Figure 9. The circuit of Figure 8  
has cutoff of about 5.5 MHz and is suitable for input frequen-  
cies of 1 MHz to 5 MHz. The circuit of Figure 9 has a cutoff  
of about 11 MHz and is suitable for input frequencies of 5  
MHz to 10 MHz. These filters should be driven by a genera-  
tor of 75 Ohm source impedance and terminated with a 75  
ohm resistor.  
Using an inadequate amplifier to drive the analog input.  
As explained in Section 1.0, the capacitance seen at the in-  
put alternates between 4 pF and 11 pF with the clock. This  
DS100890-18  
FIGURE 8. 5.5 MHz Low Pass Filter to Eliminate Harmonics at the Signal Input.  
DS100890-19  
FIGURE 9. 11 MHz Low Pass filter to eliminate harmonics at the signal input.  
Use at input frequencies of 5 MHz to 10 MHz  
15  
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Physical Dimensions inches (millimeters) unless otherwise noted  
24-Lead Package JM  
Ordering Number ADC1173CIJM  
NS Package Number M24D  
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16  
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)  
24-Lead Package TC  
Ordering Number ADC1173CIMTC  
NS Package Number MTC24  
LIFE SUPPORT POLICY  
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL  
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant  
into the body, or (b) support or sustain life, and  
whose failure to perform when properly used in  
accordance with instructions for use provided in the  
labeling, can be reasonably expected to result in a  
significant injury to the user.  
2. A critical component is any component of a life  
support device or system whose failure to perform  
can be reasonably expected to cause the failure of  
the life support device or system, or to affect its  
safety or effectiveness.  
National Semiconductor  
Corporation  
Americas  
Tel: 1-800-272-9959  
Fax: 1-800-737-7018  
Email: support@nsc.com  
National Semiconductor  
Europe  
National Semiconductor  
Asia Pacific Customer  
Response Group  
Tel: 65-2544466  
Fax: 65-2504466  
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Japan Ltd.  
Tel: 81-3-5639-7560  
Fax: 81-3-5639-7507  
Fax: +49 (0) 1 80-530 85 86  
Email: europe.support@nsc.com  
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National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.  

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