ADC10221 [NSC]

10-Bit, 15 MSPS, 98 mW A/D Converter with Internal Sample and Hold; 10位, 15 MSPS , 98毫瓦的A / D转换器,内置采样和保持
ADC10221
型号: ADC10221
厂家: National Semiconductor    National Semiconductor
描述:

10-Bit, 15 MSPS, 98 mW A/D Converter with Internal Sample and Hold
10位, 15 MSPS , 98毫瓦的A / D转换器,内置采样和保持

转换器
文件: 总16页 (文件大小:417K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
January 2000  
ADC10221  
10-Bit, 15 MSPS, 98 mW A/D Converter with Internal  
Sample and Hold  
General Description  
Features  
n Internal Sample-and-Hold  
n Single +5V Operation  
The ADC10221 is the first in a family of low power, high per-  
formance CMOS analog-to-digital converters. It can digitize  
signals to 10 bits resolution at sampling rates up to 20 MSPS  
(15 MSPS guaranteed) while consuming a typical 98 mW  
from a single 5V supply. Reference force and sense pins al-  
low the user to connect an external reference buffer amplifier  
to ensure optimal accuracy. The ADC10221 is guaranteed to  
have no missing codes over the full operating temperature  
range. The unique two stage architecture achieves 9.2 Effec-  
tive Bits with a 10MHz input signal and a 20MHz clock fre-  
quency. Output formatting is straight binary coding.  
n Low Power Standby Mode  
n Guaranteed No Missing Codes  
n TTL/CMOS or 3V Logic Input/Output Compatible  
Key Specifications  
n Resolution  
10 Bits  
n Conversion Rate  
20 MSPS (typ)  
15 MSPS (min)  
To ease interfacing to 3V systems, the digital I/O power pins  
of the ADC10221 can be tied to a 3V power source, making  
the outputs 3V compatible. When not converting, power con-  
sumption can be reduced by pulling the PD (Power Down)  
pin high, placing the converter into a low power standby  
state, where it typically consumes less than 4 mW. The  
ADC10221’s speed, resolution and single supply operation  
make it well suited for a variety of applications in video, im-  
aging, communications, multimedia and high speed data ac-  
quisition. Low power, single supply operation ideally suit the  
ADC10221 for high speed portable applications, and its  
speed and resolution are ideal for charge coupled device  
(CCD) input systems.  
n ENOB 10 MHz Input,  
20 MHz Clock  
9.2 Bits (typ)  
0.35 LSB (typ)  
98 mW (typ)  
n DNL  
n Power Consumption  
n Low Power Standby Mode  
<
4 mW (typ)  
Applications  
n Digital Video  
n Document Scanners  
n Medical Imaging  
n Electro-Optics  
The ADC10221 comes in a space saving 32-pin TQFP and  
operates over the industrial (−40˚C TA +85˚C) tempera-  
ture range.  
n Plain Paper Copiers  
n CCD Imaging  
Connection Diagram  
DS101038-1  
TRI-STATE® is a registered trademark of National Semiconductor Corporation.  
© 2000 National Semiconductor Corporation  
DS101038  
www.national.com  
Ordering Information  
Commercial  
(−40˚C TA +85˚C)  
ADC10221CIVT  
NS Package  
TQFP  
Block Diagram  
DS101038-2  
www.national.com  
2
Pin Descriptions and Equivalent Circuits  
Pin  
Symbol  
Equivalent Circuit  
Description  
No.  
Analog I/O  
Analog Input signal to be converted. Conversion  
30  
VIN  
+
range is VREF S to VREF S.  
Analog input that goes to the high side of the  
reference ladder of the ADC. This voltage should  
+
+
31  
32  
2
VREF  
VREF  
VREF  
F
S
F
S
+
force VREF S to be in the range of 2.3V to 4.0V.  
Analog output used to sense the voltage at the top  
of the ADC reference ladder.  
Analog input that goes to the low side of the  
reference ladder of the ADC. This voltage should  
force VREF− S to be in the range of 1.3V to 3.0V.  
Analog output used to sense the voltage at the  
bottom of the ADC reference ladder.  
1
VREF−  
Converter digital clock input. VIN is sampled on the  
falling edge of CLK input.  
9
CLK  
Power Down input. When this pin is high, the  
converter is in the Power Down mode and the data  
output pins are in a high impedance state.  
8
PD  
OE  
Output Enable pin. When this pin and the PD pin  
are low, the output data pins are active. When this  
pin or the PD pin is high, the output data pins are in  
a high impedance state.  
26  
14  
thru  
19  
and  
22  
Digital Output pins providing the 10 bit conversion  
results. D0 is the LSB, D9 is the MSB. Valid data is  
present just after the falling edge of the CLK input.  
D0 -D9  
thru  
25  
Positive analog supply pins. These pins should be  
connected to a clean, quiet voltage source of +5V.  
VA and VD should have a common supply and be  
separately bypassed with 10µF to 50µF capacitors  
in parallel with 0.1µF capacitors.  
3, 7,  
28  
VA  
Positive digital supply pins. These pins should be  
connected to a clean, quiet voltage source of +5V.  
VA and VD should have a common supply and be  
separately bypassed with 10µF to 50µF capacitors  
in parallel with 0.1µF capacitors.  
5, 10  
VD  
3
www.national.com  
Pin Descriptions and Equivalent Circuits (Continued)  
Pin  
Symbol  
Equivalent Circuit  
Description  
No.  
Analog I/O  
Positive supply pins for the digital output drivers.  
These pins should be connected to a clean, quiet  
voltage source of +3V to +5V and be separately  
bypassed with 10µF capacitors.  
12, 21  
VD I/O  
AGND  
The ground return for the analog supply. AGND and  
DGND should be connected together close to the  
ADC10221 package.  
4, 27,  
29  
The ground return for the digital supply. AGND and  
DGND should be connected together close to the  
ADC10221 pacjage.  
6, 11  
DGND  
13, 20  
DGND I/O  
The ground return of the digital output drivers.  
www.national.com  
4
Absolute Maximum Ratings (Notes 1, 2)  
If Military/Aerospace specified devices are required,  
please contact the National Semiconductor Sales Office/  
Distributors for availability and specifications.  
Soldering Temp., Infrared, 10 sec. (Note 6)  
300˚C  
Storage Temperature −65˚C to +150˚C  
Operating Ratings(Notes 1, 2)  
=
=
Positive Supply Voltage (V VA VD)  
6.5V  
Operating Temperature  
VA, VD Supply Voltage  
VD I/O Supply Voltage  
VIN Voltage Range  
−40˚C TA +85˚C  
Voltage on Any I/O Pin  
−0.3V to (VA or VD) +0.3V)  
+4.5V to +5.5V  
+2.7V to 5.5V  
±
±
Input Current at Any Pin (Note 3)  
Package Input Current (Note 3)  
25mA  
50mA  
1.3V to (VA-1.0V)  
2.3V to (VA-1.0V)  
1.3V to 3.0V  
=
Package Dissipation at TA 25˚C  
See (Note 4)  
VREF + Voltage Range  
ESD Susceptibility (Note 5)  
Human Body Model  
Machine Model  
VREF− Voltage Range  
1500V  
200V  
PD, CLK, OE Voltage  
−0.3V to + 5.5V  
Converter Electrical Characteristics  
=
=
=
=
=
+3.5VDC, VREF−  
The following specifications apply for VA +5.0VDC, VD 5.0VDC, VD I/O 5.0VDC, VREF  
+
+1.5VDC  
,
=
=
=
=
=
CL 20pF, fCLK 15 MHz, RS 25. Boldface limits apply for TA TMIN to TMAX: all other limits TA 25˚C(Note 7)  
Typical  
(Note 8)  
Limits  
(Note 9)  
Symbol  
Parameter  
Conditions  
Units  
Static Converter Characteristics  
±
±
±
1.0  
INL  
Integral Non-Linearity  
0.45  
0.35  
LSB(max)  
LSB(max)  
Bits  
±
DNL  
Differential-Non Linearity  
0.85  
10  
Resolution with No Missing  
Codes  
Zero Scale Offset Error  
Full-Scale Error  
−6  
−6  
mV(max)  
mV(max)  
Dynamic Converter Characteristics  
=
fIN 1.0 MHz  
9.5  
9.5  
9.2  
Bits  
Bits(min)  
Bits  
=
ENOB  
S/(N+D)  
SNR  
Effective Number of Bits  
fIN 4.43 MHz  
9.0  
56  
58  
=
=
fIN 10 MHz, fCLK 20 MHz  
=
fIN 1.0 MHz  
59  
59  
57  
dB  
dB(min)  
dB  
Signal-to-Noise Plus  
Distortion Ratio  
=
fIN 4.43 MHz  
=
=
fIN 10 MHz, fCLK 20 MHz  
=
fIN 1.0 MHz  
60  
60  
58  
dB  
dB(min)  
dB  
=
fIN 4.43 MHz  
Signal-to-Noise Ratio  
=
=
fIN 10 MHz, fCLK 20 MHz  
=
fIN 1.0 MHz  
−71  
−70  
−66  
dB  
dB(min)  
dB  
=
THD  
Total Harmonic Distortion  
fIN 4.43 MHz  
−59  
60  
=
=
fIN 10 MHz, fCLK 20 MHz  
=
fIN 1.0 MHz  
74  
72  
68  
dB  
dB  
dB  
Spurious Free Dynamic  
Range  
=
fIN 4.43 MHz  
SFDR  
=
=
fIN 10 MHz, fCLK 20 MHz  
=
=
%
DG  
DP  
Differential Gain Error  
Differential Phase Error  
Overrange Output Code  
Underrange Output Code  
Full Power Bandwidth  
fIN 4.43 MHz, fCLK 17.72 MHz  
0.5  
0.5  
=
=
fIN 4.43 MHz, fCLK 17.72 MHz  
deg  
>
VIN VREF  
+
1023  
0
<
VIN VREF  
BW  
150  
56  
MHz  
dB  
Power Supply Rejection  
Ratio  
Change in Full Scale with 4.5V to  
5.5V Supply Change  
PSRR  
Reference and Analog Input Characteristics  
1.3  
4.0  
V(min)  
V(max)  
VIN  
Analog Input Range  
Analog VIN Input  
Capacitance  
CIN  
IIN  
5
pF  
µA  
Input Leakage Current  
10  
5
www.national.com  
Converter Electrical Characteristics (Continued)  
=
=
=
=
=
+3.5VDC, VREF−  
The following specifications apply for VA +5.0VDC, VD 5.0VDC, VD I/O 5.0VDC, VREF  
+
+1.5VDC  
,
=
=
=
=
=
CL 20pF, fCLK 15 MHz, RS 25. Boldface limits apply for TA TMIN to TMAX: all other limits TA 25˚C(Note 7)  
Typical  
(Note 8)  
Limits  
(Note 9)  
Symbol  
Parameter  
Conditions  
Units  
Reference and Analog Input Characteristics  
Reference Ladder  
Resistance  
850  
1150  
(min)  
(max)  
RREF  
1000  
3.5  
VREF  
VREF  
+
Positive Reference Voltage  
4.0  
V(max)  
Negative Reference  
Voltage  
1.5  
1.3  
V(min)  
(VREF+) −  
(VREF −)  
1.0  
2.7  
V(min)  
V(max)  
Total Reference Voltage  
2.0  
DC and Logic Electrical Characteristics  
=
=
=
=
=
+3.5VDC, VREF−  
The following specifications apply for VA +5.0VDC, VD +5.0VDC, VD I/O 5.0VDC, VREF  
+
+1.5VDC  
,
=
=
=
=
=
CL 20 pF, fCLK 15 MHz, RS 25. Boldface limits apply for TA TMIN to TMAX: all other limits TA 25˚C (Note 7)  
Typical  
(Note 8)  
Limits  
(Note 9)  
Symbol  
Parameter  
Conditions  
Units  
CLK, OE, PD, Digital Input Characteristics  
=
VIH  
VIL  
IIH  
Logical 1Input Voltage  
Logical 0Input Voltage  
Logical 1Input Current  
Logical 0Input Current  
VD 5.5V  
2.0  
1.0  
V(min)  
V(max)  
µA  
=
VD 4.5V  
=
VIH VD  
10  
=
IIL  
VIL DGND  
−10  
µA  
D00 - D13 Digital Output Characteristics  
=
=
Logical 1Output  
Voltage  
VD I/O + 4.5V, IOUT −0.5 mA  
4.0  
2.4  
V(min)  
V(min)  
VOH  
= =  
VD I/O + 2.7V, IOUT −0.5 mA  
=
=
Logical 0Output  
Voltage  
VD I/O + 4.5V, IOUT 1.6 mA  
0.4  
0.4  
V(max)  
V(max)  
VOL  
= =  
VD I/O + 2.7V, IOUT 1.6 mA  
=
TRI-STATE Output  
Current  
VOUT DGND  
−10  
10  
µA  
µA  
IOZ  
=
VOUT VD  
=
±
±
IOS  
Output Short Circuit  
Current  
VD I/O 3V  
12  
25  
mA  
mA  
=
VD I/O 5V  
Power Supply Characteristics  
=
=
PD LOW, Ref not included  
14.5  
0.5  
16  
6
IA  
Analog Supply Current  
mA(max)  
PD HIGH, Ref not included  
=
ID  
IDI/O  
+
PD LOW, Ref not included  
5
0.2  
Digital Supply Current  
Power Consumption  
mA(max)  
=
PD HIGH, Ref not included  
PD  
98  
110  
mW (max)  
AC Electrical Characteristics  
=
=
=
= =  
+1.5VDC, fCLK 15 MHz,  
The following specifications apply for VA +5.0VDC, VD I/O 5.0VDC, VREF  
+
+3.5VDC, VREF  
=
=
=
=
=
trc tfc 5 ns, RS 25. CL (data bus loading) 20 pF, Boldface limits apply for TA TMIN to TMAX: all other limits TA  
=
25˚C(Note 7)  
Typical  
(Note 8)  
Limits  
(Note 9)  
Units  
(Limits)  
Symbol  
Parameter  
Conditions  
fCLK1  
fCLK2  
tCH  
Maximum Clock Frequency  
Minimum Clock Frequency  
Clock High Time  
20  
1
15  
MHz(min)  
MHz(max)  
ns(min  
23  
23  
tCL  
Clock Low Time  
ns(min)  
%
45  
55  
(min)  
Duty Cycle  
50  
%
(max)  
Pipeliine Delay (Latency)  
2.0  
5
Clock Cycles  
ns(max)  
trc, tfc  
Clock Input Rise and Fall Time  
www.national.com  
6
AC Electrical Characteristics (Continued)  
=
=
=
= =  
+1.5VDC, fCLK 15 MHz,  
The following specifications apply for VA +5.0VDC, VD I/O 5.0VDC, VREF  
+
+3.5VDC, VREF  
=
=
=
=
=
trc tfc 5 ns, RS 25. CL (data bus loading) 20 pF, Boldface limits apply for TA TMIN to TMAX: all other limits TA  
=
25˚C(Note 7)  
Typical  
(Note 8)  
Limits  
(Note 9)  
Units  
(Limits)  
Symbol  
Parameter  
Conditions  
tr, tf  
tOD  
tOH  
Output Rise and Fall Times  
Fall of CLK to data valid  
Output Data Hold Time  
10  
20  
12  
ns  
ns(max)  
ns  
25  
From output High,  
2K to Ground  
25  
18  
ns  
ns  
tDIS  
Rising edge of OE to valid data  
From output Low,  
2K to VD I/O  
tEN  
Falling edge of OE to valid data  
Data valid time  
1K to VCC  
25  
40  
ns  
ns  
tVALID  
tAJ  
<
Aperture Jitter  
30  
ps  
=
Full Scale Step Response  
tr 10ns  
1
conversion  
VIN step from  
Overrange Recovery Time  
(VREF+ +100 mV) to  
(VREF−)  
1
conversion  
PD low to 1/2 LSB accurate  
conversion (Wake-Up time)  
tWU  
700  
ns  
Note 1: Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is func-  
tional, but do not guarantee specific performance limits. For guaranteed specifications and test conditions, see the Electrical Characteristics. The guaranteed speci-  
fications apply only for the test conditions listed. Some performance characteristics may degrade when the device is not operated under the listed test conditions.  
=
=
=
Note 2: All voltages are measured with respect to GND AGND DGND 0V, unless otherwise specified.  
<
>
V
Note 3: When the input voltage at any pin exceeds the power supplies ( V  
AGND or V  
or V ), the current at that pin should be limited to 25 mA. The  
A D  
IN  
IN  
50 mA maximum package input current rating limits the number of pins that can safely exceed the power supplies with an input current of 25 mA to two.  
Note 4: The absolute maximum junction temperature (T max) for this device is 150˚C. The maximum allowable power dissipation is dictated by TJmax, the  
J
junction-to-ambient thermal resistance (θ ), and the ambient temperature (T ), and can be calculated using the formula P MAX = (T max - T )/θ . In the 32-pin  
JA  
A
D
J
A
JA  
TQFP, θ is 69˚C/W, so P MAX = 1,811 mW at 25˚C and 942 mW at the maximum operating ambient temperature of 85˚C. Note that the power dissipation of this  
JA  
D
device under normal operation will typically be about 110 mW (98 mW quiescent power + 2 mW reference ladder power +10 mW due to 10 TTL load on each digital  
output). The values for maximum power dissipation listed above will be reached only when the ADC10221 is operated in a severe fault condition (e.g. when input or  
output pins are driven beyond the power supply voltages, or the power supply polarity is reversed). Obviously, such conditions should always be avoided.  
Note 5: Human body model is 100 pF capacitor discharged through a 1.5kresistor. Machine model is 220 pF discharged through ZERO .  
Note 6: See AN450, Surface Mounting Methods and Their Effect on Product Reliability, or the section entitled Surface Mountfound in any post 1986 National  
Semiconductor Linear Data Book, for other methods of soldering surface mount devices.  
Note 7: The inputs are protected as shown below. Input voltage magnitudes up to 500mV beyond the supply rails will not damage this device. However, errors in  
the A/D conversion can occur if the input goes above V or below AGND by more than 300 mV.  
A
DS101038-24  
DS101038-12  
DS101038-11  
=
=
J
Note 8: Typical figures are at T  
T
25˚C, and represent most likely parametric norms.  
A
Note 9: Tested limits are guaranteed to National’s AOQL (Average Outgoing Quality Level).  
Note 10: When the input signal is between V  
+ and (V + 300mV), the output code will be 3FFh, or all 1s. When the input signal is between −300 mV and V  
−,  
REF  
A
REF  
the output code will be 000h, or all 0s.  
7
www.national.com  
=
=
=
=
Typical Performance Characteristics VA VD VDI/O 5V, fCLK 20MHz, unless otherwise  
specified.  
Typical INL  
INL vs fCLK  
INL vs VA  
DS101038-26  
DS101038-25  
DS101038-27  
INL vs Clock Duty Cycle  
Typical DNL  
DNL vs fCLK  
DS101038-38  
DS101038-28  
DS101038-39  
SINAD & ENOB vs  
Temperature and fIN  
DNL vs VA  
DNL vs Clock Duty Cycle  
DS101038-40  
DS101038-29  
DS101038-30  
SINAD & ENOB vs  
fCLK and fIN  
IA + ID vs. Temperature  
SINAD & ENOB vs VA  
DS101038-37  
DS101038-31  
DS101038-32  
www.national.com  
8
=
=
=
=
Typical Performance Characteristics VA VD VDI/O 5V, fCLK 20MHz, unless otherwise  
specified. (Continued)  
Spectral Response at 20 MSPs  
DS101038-35  
OUTPUT DELAY is the time delay after the fall of the input  
clock before the data update is present at the output pins.  
Specification Definitions  
APERTURE JITTER is the variation in aperture delay from  
OUTPUT HOLD TIME is the length of time that the output  
sample to sample. Aperture jitter shows up as input noise.  
data is valid after the fall of the input clock.  
APERTURE DELAY See Sampling Delay.  
OVER RANGE RECOVERY TIME is the time required after  
DIFFERENTIAL GAIN ERROR is the percentage difference  
VIN goes from AGND to VREF+ or VIN goes from VA to VREF  
between the output amplitudes of a given amplitude small  
signal, high frequency sine wave input at two different dc in-  
put levels.  
for the converter to recover and make a conversion with its  
rated accuracy.  
PIPELINE DELAY (LATENCY) is the number of clock cycles  
between initiation of conversion and when that data is pre-  
sented to the output driver stage. Data for any given sample  
is available by the Pipeline Delay plus the Output Delay after  
that sample is taken. New data is available at every clock  
cycle, but the data lags the conversion by the pipeline delay.  
DIFFERENTIAL PHASE ERROR is the difference in the out-  
put phase of a small signal sine wave input at two different  
dc input levels.  
DIFFERENTIAL NON-LINEARITY (DNL) is the measure of  
the maximum deviation from the ideal step size of 1 LSB.  
EFFECTIVE NUMBER OF BITS (ENOB, or EFFECTIVE  
BITS) is another method of specifying Signal-to-Noise and  
Distortion Ratio (S/N+D or SINAD). ENOB is defined as (SI-  
NAD −1.76) / 6.02.  
PSRR (POWER SUPPLY REJECTION RATIO) is the ratio  
of the change in dc power supply voltage to the resulting  
change in Full Scale Error, expressed in dB.  
SAMPLING (APERTURE) DELAY or APERTURE TIME is  
that time required after the fall of the clock input for the sam-  
pling switch to open. The sample is effectively taken this  
amount of time after the fall of the clock input.  
FULL POWER BANDWIDTH is a measure of the frequency  
at which the reconstructed output fundamental drops 3 dB  
below its 1 MHz value for a full scale input. The test is per-  
formed with fIN equal to 100 kHz plus integral multiples of  
SIGNAL TO NOISE RATIO (SNR) is the ratio, expressed in  
dB, of the rms value of the input signal to the rms value of the  
sum of all other spectral components below one-half the  
sampling frequency, not including harmonics or dc.  
fCLK. The input frequency at which the output is −3 dB rela-  
tive to the1 MHz input signal is the full power bandwidth.  
FULL SCALE (FS) INPUT RANGE of the ADC is the input  
range of voltages over which the ADC will digitize that input.  
SIGNAL TO NOISE PLUS DISTORTION (S/(N+D) or SI-  
NAD) is the ratio, expressed in dB, of the RMS value of the  
input signal to the RMS value of all of the other spectral com-  
ponents below half the clock frequency, including harmonics  
but excluding dc.  
=
=
=
For VREF  
+
3.50V and VREF  
(VREF−) 2.00V.  
FULL SCALE OFFSET ERROR is a measure of how far the  
last code transition is from the ideal 11⁄  
LSB below VREF  
1.50V, FS  
(VREF+) −  
=
2
+
and is defined as V1023 −1.5 LSB − VREF+ , where V1023 is  
the voltage at which the transitions from code 1022 to 1023  
occurs.  
SPURIOUS FREE DYNAMIC RANGE (SFDR) is the differ-  
ence, expressed in dB or dBc, between the RMS values of  
the input signal and the peak spurious signal, where a spu-  
rious signal is any signal present in the output spectrum that  
is not present at the input.  
FULL SCALE STEP RESPONSE is defined as the time re-  
quired after VIN goes from VREF− to VREF+, or VREF+ to  
V
REF−, and settles sufficiently for the converter to recover  
TOTAL HARMONIC DISTORTION (THD) is the ratio, ex-  
pressed in dB, of the rms total of the first six harmonic com-  
ponents, to the rms value of the input signal.  
and make a conversion with its rated accuracy.  
INTEGRAL NON-LINEARITY (INL) is a measure of the de-  
viation of each individual code from a line drawn from nega-  
ZERO SCALE OFFSET ERROR is the difference between  
tive full scale (1⁄  
2
LSB below the first code transition) through  
the ideal input voltage (1⁄  
LSB) and the actual input voltage  
2
positive full scale (11⁄  
2
LSB above the last code transition).  
that just causes a transition from an output code of zero to  
an output code of one.  
The deviation of any given code from this straight line is  
measured from the center of that code value.  
9
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Timing Diagram  
DS101038-15  
FIGURE 1. ADC10221 Timing Diagram  
DS101038-17  
DS101038-16  
FIGURE 2. AC Test Circuit  
FIGURE 3. tEN, tDIS Test Circuit  
Functional Description  
The ADC10221 maintains excellent dynamic performance  
for input signals up to half the clock frequency. The use of an  
internal sample-and-hold amplifier (SHA) enables sustained  
dynamic performance for signals of input frequency beyond  
the clock rate, lowers the converter’s input capacitance and  
reduces the number of external components required.  
has a range of 2.3 to 4.0 Volts, while VREF− S has a range of  
1.3 to 3.0 Volts. VREF+ S should always be at least 1.0 Volt  
more positive than VREF− S.  
Data is acquired at the falling edge of the clock and the digi-  
tal equivalent of that data is available at the digital outputs  
2.0 clock cycles plus tOD later. The ADC10221 will convert as  
long as the clock signal is present at pin 9 and the PD pin is  
low. The Output Enable pin (OE), when low, enables the out-  
put pins. The digital outputs are in the high impedance state  
when the OE pin is low or the PD pin is high.  
The analog signal at VIN that is within the voltage range set  
by VREF+ S and VREF− S are digitized to ten bits at up to  
25 MSPS. Input voltages below VREF− S will cause the out-  
put word to consist of all zeroes. Input voltages above VREF  
+
S will cause the output word to consist of all ones. VREF+ S  
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10  
Figure 4 shows a simple reference biasing scheme with  
minimal components. While this circuit might suffice for  
some applications, it does suffer from thermal drift because  
the external 750resistor at pins 1 and 2 will have a differ-  
ent temperature coefficient than the on-chip resistors. Also,  
the on-chip resistors, while well matched to each other, will  
have a large tolerance compared with any external resistors,  
causing the value of VREF- to be quite variable.  
Applications Information  
1.0 THE ANALOG INPUT  
The analog input of the ADC10221 is a switch (transmission  
gate) followed by a switched capacitor amplifier. The capaci-  
tance seen at the input changes with the clock level, appear-  
ing as about 3 pF when the clock is low, and about 5 pF  
when the clock is high. This small change in capacitance can  
be reasonably assumed to be a fixed capacitance. Care  
should be taken to avoid driving the input beyond the supply  
rails, even momentarily, as during power-up.  
The circuit of Figure 5 is an improvement over the circuit of  
Figure 4 in that both ends of the reference ladder are defined  
with reference voltages. This reduces problems of high refer-  
ence variability and thermal drift, but requires two reference  
sources.  
The CLC409 has been found to be a good device to drive the  
ADC10221 because of its low voltage capability, wide band-  
width, low distortion and minimal Differential Gain and Differ-  
ential Phase. The CLC409 performs best with a feedback re-  
sistor of about 100 ohms.  
In addition to the usual VREF+ and VREF− reference inputs,  
the ADC10221 has two sense outputs for precision control of  
the ladder voltages. These sense outputs (VREF+ S and  
VREF− S) compensate for errors due to IR drops between the  
Care should be taken to keep digital noise out of the analog  
input circuitry to maintain highest noise performance.  
source of the reference voltages and the ends of the refer-  
ence ladder itself.  
With the addition of two op-amps, the voltages at the top and  
bottom of the reference ladder can be forced to the exact  
value desired, as shown in Figure 6.  
2.0 REFERENCE INPUTS  
Note: Throughout this data sheet reference is made to  
V
REF+ and to VREF−. These refer to the internal voltage  
across the reference ladder and are, nominally, VREF+ S and  
REF− S, respectively.  
V
DS101038-18  
FIGURE 4. Simple, low component cournt reference biasing  
11  
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Applications Information (Continued)  
DS101038-19  
FIGURE 5. Better low component count reference biasing  
The VREF+ F and VREF− F pins should each be bypassed to  
AGND with 10 µF tantalum or electrolytic and 0.1 µF ceramic  
capacitors. The circuit of Figure 6 may be used if it is desired  
to obtain precise reference voltages. The LMC6082 in this  
circuit was chosen for its low offset voltage, low voltage ca-  
pability and low cost.  
Voltages at the reference sense pins (VREF+ S and VREF− S)  
should be within the range specified in the Operating Ratings  
table (2.3V to 4.0V for VREF+ and 1.3V to 3.0V for VREF−).  
Any device used to drive the reference pins should be able to  
source sufficient current into the VREF+ F pin and sink suffi-  
cient current from the VREF− F pin when the ladder is at its  
minimum value of 850 Ohms.  
Since the current flowing through the sense lines (those lines  
associated with VREF+ S and VREF− S) is essentially zero,  
there is negligible voltage drop across any resistance in se-  
ries with these sense pins and the voltage at the inverting in-  
put of the op-amp accurately represents the voltage at the  
top (or bottom) of the ladder. The op-amp drives the force in-  
put, forcing the voltage at the ends of the ladder to equal the  
voltage at the op-amp’s non-inverting input, plus any offset  
voltage. For this reason, op-amps with low VOS, such as the  
LMC6081 and LMC6082, should be used for this application.  
The reference voltage at the top of the ladder (VREF+) may  
take on values as low as 1.0V above the voltage at the bot-  
tom of the ladder (VREF−) and as high as (VA - 1.0V) Volts.  
The voltage at the bottom of the ladder (VREF−) may take on  
values as low as 1.3 Volts and as high as 3.0V. However, to  
minimize noise effects and ensure accurate conversions, the  
total reference voltage range (VREF+ - VREF−) should be a  
minimum of 2.0V and a maximum of 2.7V.  
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12  
Applications Information (Continued)  
DS101038-20  
FIGURE 6. Setting precision reference voltages  
3.0 POWER SUPPLY CONSIDERATIONS  
circuit. Be sure that the supplies to circuits driving the CLK,  
PD, OE, analog input and reference pins do not come up any  
faster than does the voltage at the ADC10221 power pins.  
A/D converters draw sufficient transient current to corrupt  
their own power supplies if not adequately bypassed. A 10  
µF to 50 µF tantalum or aluminum electrolytic capacitor  
should be placed within an inch (2.5 centimeters) of the A/D  
power pins, with a 0.1 µF ceramic chip capacitor placed as  
close as possible to each of the converter’s power supply  
pins. Leadless chip capacitors are preferred because they  
have low lead inductance.  
4.0 THE ADC10221 CLOCK  
Although the ADC10221 is tested and its performance is  
guaranteed with a 15 MHz clock, it typically will function with  
clock frequencies from 1 MHz to 20 MHz. Performance is  
best if the clock rise and fall times are 5 ns or less and if the  
clock line is terminated with a series RC of about 100 Ohms  
and 47 pF near the clock input pin, as shown in Figure 6.  
While a single voltage source should be used for the analog  
and digital supplies of the ADC10221, these supply pins  
should be well isolated from each other to prevent any digital  
noise from being coupled to the analog power pins. A choke  
or ferrite bead is recommended between the analog and  
digital supply lines, with a ceramic capacitor close to the  
analog supply pin.  
5.0 LAYOUT AND GROUNDING  
Proper routing of all signals and proper ground techniques  
are essential to ensure accurate conversion. Separate ana-  
log and digital ground planes are required to meet data sheet  
limits. The analog ground plane should be low impedance  
and free of noise form other parts of the system.  
The converter digital supply should not be the supply that is  
used for other digital circuitry on the board. It should be the  
same supply used for the ADC10221 analog supply.  
Each bypass capacitor should be located as close to the ap-  
propriate converter pin as possible and connected to the pin  
and the appropriate ground plane with short traces. The ana-  
log input should be isolated from noisy signal traces to avoid  
coupling of spurious signals into the input. Any external com-  
As is the case with all high speed converters, the ADC10221  
should be assumed to have little high frequency power sup-  
ply rejection. A clean analog power source should be used.  
No pin should ever have a voltage on it that is in excess of  
the supply voltages or below ground, not even on a transient  
basis. This can be a problem upon application of power to a  
13  
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Digital and analog signal lines should never run parallel to  
each other in close proximity with each other. They should  
only cross each other when absolutely necessary, and then  
only at 90˚ angles. Violating this rule can result in digital  
noise getting into the input, which degrades accuracy and  
dynamic performance (THD, SNR, SINAD).  
Applications Information (Continued)  
ponent (e.g., a filter capacitor) connected between the con-  
verter’s input and ground should be connected to a very  
clean point in the analog ground return.  
Figure 7 gives an example of a suitable layout, including  
power supply routing, ground plane separation, and bypass  
capacitor placement. All analog circuitry (input amplifiers, fil-  
ters, reference components, etc.) should be placed on or  
over the analog ground plane. All digital circuitry and I/O  
lines should be over the digital ground plane.  
DS101038-21  
FIGURE 7. An acceptable layout pattern  
www.national.com  
14  
(e.g., 74F and 74AC devices) to exhibit undershoot that goes  
more than a volt below ground. A resistor of 50 to 100in  
series with the offending digital input will usually eliminate  
the problem.  
Applications Information (Continued)  
6.0 DYNAMIC PERFORMANCE  
The ADC10221 is ac tested and its dynamic performance is  
guaranteed. To meet the published specifications, the clock  
source driving the CLK input must be free of jitter. For best  
ac performance, isolating the ADC clock from any digital cir-  
cuitry should be done with adequate buffers, as with a clock  
tree. See Figure 8  
Care should be taken not to overdrive the inputs of the  
ADC10221 (or any device) with a device that is powered  
from supplies outside the range of the ADC10221 supply.  
Such practice may lead to conversion inaccuracies and even  
to device damage.  
Meeting dynamic specifications is also dependent upon  
keeping digital noise out of the input, as mentioned in Sec-  
tions 1.0 and 5.0.  
Attempting to drive a high capacitance digital data bus.  
The more capacitance the output drivers has to charge for  
each conversion, the more instantaneous digital current is  
required from VD and DGND. These large charging current  
spikes can couple into the analog section, degrading dy-  
namic performance. Adequate bypassing and maintaining  
separate analog and digital ground planes will reduce this  
problem on the board. Buffering the digital data outputs (with  
an 74F541, for example) may be necessary if the data bus to  
be driven is heavily loaded. Dynamic performance can also  
be improved by adding series resistors of 47at each digital  
output.  
Driving the VREF+ F pin or the VREF− F pin with devices  
that can not source or sink the current required by the  
ladder. As mentioned in section 2.0, be careful to see that  
any driving devices can source sufficient current into the  
VREF+ F pin and sink sufficient current from the VREF− F pin.  
DS101038-22  
If these pins are not driven with devices than can handle the  
required current, they will not be held stable and the con-  
verter output will exhibit excessive noise.  
FIGURE 8. Isolating the ADC clock from digital  
circuitry  
Using a clock source with excessive jitter. This will cause  
the sampling interval to vary, causing excessive output noise  
and a reduction in SNR performance. Simple gates with RC  
timing is generally inadequate.  
7.0 COMMON APPLICATION PITFALLS  
Driving the inputs (analog or digital) beyond the power  
supply rails. For proper operation, all inputs should not go  
more than 300mV beyond the supply pins. Exceeding these  
limits on even a transient basis can cause faulty or erratic  
operation. It is not uncommon for high speed digital circuits  
Using the same voltage source for VD and other digital  
logic. As mentioned in Section 3.0, VD should use the same  
power source used by VA, but should be decoupled from VA.  
15  
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Physical Dimensions inches (millimeters) unless otherwise noted  
32-Lead TQFP Package  
Ordering Number ADC10221CIVT  
NS Package Number VBE32A  
LIFE SUPPORT POLICY  
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT  
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT AND GENERAL  
COUNSEL OF NATIONAL SEMICONDUCTOR CORPORATION. As used herein:  
1. Life support devices or systems are devices or  
systems which, (a) are intended for surgical implant  
into the body, or (b) support or sustain life, and  
whose failure to perform when properly used in  
accordance with instructions for use provided in the  
labeling, can be reasonably expected to result in a  
significant injury to the user.  
2. A critical component is any component of a life  
support device or system whose failure to perform  
can be reasonably expected to cause the failure of  
the life support device or system, or to affect its  
safety or effectiveness.  
National Semiconductor  
Corporation  
Americas  
Tel: 1-800-272-9959  
Fax: 1-800-737-7018  
Email: support@nsc.com  
National Semiconductor  
Europe  
National Semiconductor  
Asia Pacific Customer  
Response Group  
Tel: 65-2544466  
Fax: 65-2504466  
National Semiconductor  
Japan Ltd.  
Tel: 81-3-5639-7560  
Fax: 81-3-5639-7507  
Fax: +49 (0) 1 80-530 85 86  
Email: europe.support@nsc.com  
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National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.  

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