MF88M1-GMCAVXX [MITSUBISHI]
8/16-bit Data Bus Flash Memory Card; 8位/ 16位数据总线闪存卡型号: | MF88M1-GMCAVXX |
厂家: | Mitsubishi Group |
描述: | 8/16-bit Data Bus Flash Memory Card |
文件: | 总22页 (文件大小:148K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
MF82M1-GMCAVXX
8/16-bit Data Bus
MF84M1-GMCAVXX
MF88M1-GMCAVXX
MF816M-GMCAVXX
MF820M-GMCAVXX
MF832M-GMCAVXX
MF82M1-GNCAVXX
MF84M1-GNCAVXX
MF88M1-GNCAVXX
MF816M-GNCAVXX
MF820M-GNCAVXX
MF832M-GNCAVXX
Flash Memory Card
C o n n e c t o r T y p e
Two- piece 68-pin
DESCRIPTION
Buffered interface
The MF8XXX-GMCAVXX is a flash memory card
which uses eight-megabit or sixteen megabit flash
electrically erasable and programmable read only
memory IC’s as common memory and a 64-kilobit
electrically erasable and programmable read only
memory as attribute memory.
The MF8XXX-GNCAVXX is a flash memory card
which uses eight-megabit or sixteen megabit flash
electrically erasable and programmable read only
memory IC’s.
TTL interface level
Program/erase operation by software
command control
100,000 program/erase cycles
Write protect switch
Operating temperature =0 to 70°C
.No Vpp required (5V Vcc only operation)
APPLICATIONS
Notebook computers Printers
Industrial machines
FEATURES
68 pin JEIDA/PCMCIA
8/16 controllable data bus width
PRODUCT LIST
Item
Memory
capacity
2MB
Attribute
memory
Data bus
width(bits)
Access
time (ns)
Memory
IC’s
8Mbit
Outline
drawing
Type name
MF82M1-GMCAVXX
MF84M1-GMCAVXX
MF88M1-GMCAVXX
MF816M-GMCAVXX
MF820M-GMCAVXX
MF832M-GMCAVXX
MF82M1-GNCAVXX
MF84M1-GNCAVXX
MF88M1-GNCAVXX
MF816M-GNCAVXX
MF820M-GNCAVXX
MF832M-GNCAVXX
4MB
8MB
16MB
20MB
32MB
2MB
4MB
8MB
16MB
20MB
32MB
Yes
16Mbit
8Mbit
8/16
150
68P-013
No(FFh)
16Mbit
MITSUBISHI
ELECTRIC
1/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
PIN ASSIGNMENT
Pin
No.
Pin
No.
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
Function
Symbol
Symbol
Function
1
2
GND
D3
Ground
GND
CD1#
D11
D12
D13
D14
D15
CE2#
NC
Ground
Card detect 1
3
D4
4
D5
Data I/O
5
D6
Data I/O
6
D7
7
8
9
CE1#
A10
OE#
A11
A9
Card enable 1
Address input
Output enable
Card enable 2
No connection
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
NC
NC
A8
Address input
A17
A18
A19
A20
A21
VCC
NC
A22
A23
A24
NC
A13
A14
WE#
NC
VCC
NC
A16
A15
A12
A7
A6
A5
A4
A3
A2
A1
A0
D0
Address
input
Write enable
No connection
Power supply voltage
No connection
A21 (NC for < 2 MB types)
Power supply voltage
No connection
A22 (NC for < 4 MB types)
A23 (NC for < 8 MB types)
A24 (NC for < 16 MB types)
Address
input
NC
NC
NC
NC
Address input
No connection
REG# Attribute memory select
62 BVD2
63 BVD1
Battery voltage detect 2
Battery voltage detect 1
64
65
66
67
68
D8
D9
D10
CD2#
GND
D1
D2
WP
GND
Data I/O
Data I/O
Write protect
Ground
Card detect 2
Ground
BLOCK DIAGRAM (MF832M-GMCAVXX)
A24
A23
A22
A21
A0
ADDRESS-
DECODER
16
A20
A19
A18
A17
A16
A15
A14
A13
A12
A11
A10
A9
D15
CE#
D14
D13
D12
D11
D10
D9
8
ADDRESS-
BUS
BUFFERS
21
COMMON
MEMORY
16Mbit
FLASH
MEMORY
´ 16
DATA-BUS
BUFFERS
D8
8
D7
D6
D5
A8
A7
D4
A6
D3
A5
OE# WE#
D2
A4
D1
A3
A2
A1
CE1#
MODE
CONTROL
LOGIC
CE2#
WE#
OE#
VCC
CE# OE# WE#
REG#
WP
8
ATTRIBUTE
MEMORY
13
BVD2
BVD1
WRITE PROTECT
64Kbit
2
ON
OFF
GND
E PROM
´ 1
CD1#
CD2#
MITSUBISHI
ELECTRIC
2/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
FUNCTIONAL DESCRIPTION
The operating mode of the card is determined by
five active low control signals (REG#, CE1#,
CE2#, OE#, WE#), and control registers located in
each memory IC.
After latching the command data, the card will go into
programming, erasure or other operation mode. For
details please refer to the Command Definition table,
each individual command’s definition and the
programming and erasure algorithms.
Common memory function
When the REG# signal is set to a high level
common memory is selected.
Attribute memory function
When the REG# signal is set to a low level attribute
memory is selected.
-Read mode
When each memory IC in the card are switched,
the control registers of each memory IC are set to
read only mode.
Operation of the card then depends on the four
possible combinations of CE1# and CE2# (note WE#
should be set to a high level when the device is in read
mode except during combination (4) where it’s
condition is unimportant) :
GM series
The card includes a byte wide attribute memory
consisting of 8K bytes of E2PROM located at the even
addresses when the card is in the 8 bit
operating mode. It is located at sequential
addresses on the lower half of the data bus when
the card is in 16 bit operating mode i.e. A0 is
ignored.
(1) If CE1# is set to a low level and CE2# is set to a
high level, the card will work as an eight bit data
bus width card. Data can be accessed via the
lower half of the data bus (D0 to D7).
(2) If both CE1# and CE2# are set to a low level, data
will be accessible via the full sixteen bit data bus
width of the card. In this mode LSB of address bus
(A0) is ignored.
(3) If CE1# is set to a high level and CE2# is set
to a low level the odd bytes (only) can be
accessed through upper half of the data bus (D8
to D15). This mode is useful when handling the
odd (upper) bytes in a sixteen bit interface
system. Note that A0 is also ignored in this
operating condition.
(4) If CE1# and CE2# are set to a high level, the
card will be in standby mode where it consumes
low power. The data bus is kept high impedance.
When OE# is set to a low level data can be read from
the card, depending on the address applied and the
setting of CE1# and CE2# as mentioned above, except
under combination (4) When OE# is set to a high level
and WE# is set to a high level the card is in an output
disable mode
To access the attribute memory, first set CE1# and
CE2#. Set CE1# to low level and CE2# to high level
for 8 bit mode or CE1# and CE2# to low level for 16
bit mode. Then select the required address. Note
please take care that in 8 bit mode A0 must be set low
for attribute memory access i.e. an even address is
applied. In 16 bit mode it is not important whether A0
is high or
low. Data can then be read by setting OE# to a low
level with WE set to a high level.
Writing to the attribute memory can be achieved
in byte mode only. To write to attribute memory set
OE# to high level and WE# to low level. The data to
be written will be latched at the rising edge of WE#.
Then, unless WE# changes back
from high level to low level over 100 µs an
automatic erase/program operation starts which will
complete within 10ms.
Please also remember that for attribute memory A0 is
not applicable and it should be set to low, even
addressing only, in 8 bit mode or ignored for 16 bit
mode.
-Write mode
By using the 4 combinations of CE1# and CE2# as
described under Read only above the appropriate
Data Out and Command/Data In bus selection can be
made.
GN series
The card then outputs FFh on the lower half of the
data bus (D0 to D7) when the following conditions
are applied;
(1)CE1#=low level,CE2#=high level,OE#=low
level,WE#=high level,A0=low level.
(2)CE1#=low level,CE2#=low level,OE#=low
level,WE#=high level.
If OE# is set to a high level and WE# set to a low level,
the control register will latch command data applied
at the rising edge of the WE# signal. Note that more
than one bus cycle may be required to latch the
command and/or the related data-please refer to the
Command Definition table.
If OE# is set to a low level and WE# is set to a high
level the card data can be read from the card
depending on the condition of the control register.
MITSUBISHI
ELECTRIC
3/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
is applied. When the card is not in write protect
mode the WP output pin is set to a low level when
VCC is applied. By reading the state of the WP
output the host system can easily check whether the
card is in write protect mode or not.
Write protect mode
The card has a write protect switch on the opposite
edge to the connector edge. When it is switched on,
the card will be placed into a write protect mode,
where data can be read from the card but it cannot
be written to it. The WP output pin is set to a high
level when the card is in write protect mode and V CC
FUNCTION TABLE (COMMON MEMORY)
I/O
(D15 to D8)
I/O
(D7 to D0)
Mode
Standby
A0
CE1# OE#
REG# CE2#
WE#
H
H
H
H
H
H
L
H
H
L
H
L
L
L
H
X
L
L
L
L
X
H
H
H
H
X
X
L
H
X
High-Z
High-Z
Read A(16-bit)
Odd byte data out
High-Z
Even byte data out
Even byte data out
odd byte data out
High-Z
Read B(8-bit)
High-Z
Read C(8-bit)
Odd byte data out
Command or odd byte data in
Command or even byte data in
Write A(16-bit)
H
H
H
L
H
H
L
L
L
H
H
H
L
L
L
X
L
High-Z
Command or even byte data in
Command or odd byte data in
High-Z
Write B(8-bit)
High-Z
H
Command or odd byte data in
Write C(8-bit)
Output disable
H
H
L
X
H
X
H
H
L
H
X
X
High-Z
High-Z
Note 1 : H=VIH, L=VIL, X=VIH or VIL, High-Z= High-impedance
To operate refer to the command definition, algorithms and so on.
FUNCTION TABLE (ATTRIBUTE MEMORY )
GM series
I/O
(D15 to D8)
I/O
(D7 to D0)
CE1# OE#
REG# CE2#
WE#
Mode
Standby
Read A(16-bit)
Read B
A0
L
L
L
L
L
L
L
L
L
L
H
L
H
H
L
H
L
L
L
H
L
L
L
H
X
X
L
L
L
L
H
H
H
H
H
X
H
H
H
H
L
L
L
L
H
X
X
L
H
X
X
L
L
X
X
High-Z
High-Z
Data out(not valid)
High-Z
Even byte data out
Even byte data out
Data out(not valid)
High-Z
Even byte data in
Even byte data in
Odd byte data in (not valid)
High-Z
(8-bit)
High-Z
Read C(8-bit)
Write A(16-bit)
Write B
(8-bit)
Write C(8-bit)
Output disable
Data out(not valid)
Odd byte data in (not valid)
High-Z
L
H
H
L
High-Z
Odd byte data in (not valid)
High-Z
X
High-Z
GN series
I/O
(D15 to D8)
High-Z
Data out(not valid)
High-Z
High-Z
Data out(not valid)
High-Z
I/O
(D7 to D0)
CE1# OE#
REG# CE2#
WE#
Mode
A0
Standby
Read A(16-bit)
Read B
(8-bit)
Read C(8-bit)
Output disable
L
L
L
L
L
L
H
L
H
H
L
H
L
L
L
H
X
X
L
L
L
L
H
X
H
H
H
H
H
X
X
L
H
X
X
High-Z
Data out (FFh)
Data out (FFh)
Data out(not valid)
High-Z
X
High-Z
Note 2 : H=VIH, L=VIL, X=VIH or VIL, High-Z= High-impedance
MITSUBISHI
ELECTRIC
4/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
COMMAND DEFINITION
The corresponding memories of the card are set to
read/write mode and the operation is
controlled by the software command written in the
control register.
COMMAND DEFINITION TABLE
First bus cycle
Mode Address Data in
Second bus cycle
Bus
cycles
1
Command
Mode Address
Data in
-
Data out
-
Read/Reset
Write
ZA
FFh(FFFFh)
-
-
Programme setup/
Programme
Erase Setup/
Erase Confirm
Programme
Suspend/Resume
Erase Suspend/
Resume
Read Status
Register
2
2
2
2
2
1
2
Write
PA
40(4040)h
Write
PA
PD
-
Write
Write
Write
Write
Write
Write
BA
PA
BA
ZA
ZA
ZA
20(2020)h
B0(B0B0)h
B0(B0B0)h
70(7070)h
50(5050)h
90(9090)h
Write
Write
Write
Read
-
BA
PA
BA
ZA
-
D0(D0D0)h
-
D0(D0D0)h
-
-
D0(D0D0)h
-
-
-
RD
-
Clear Status
Register
Read Device
Identifier Code
Read
DIA
DID
Note 3: Indicates the basic functions of commands and should not write another commands.
Refer to the algorithms to operate.
Signal status is defined in function table and bus status.
Parenthesized data shows the data for 16 bit mode operation.
ZA=an address of a memory zone (Please refer to the memory zone)
PA=Programming address
PD=Programming data
BA=An address of a memory block (Please refer to the memory block)
RD=Data of status Register
DIA=Device identifier address
000000h for manufacturer code 000002h for device code
DID=Device identifier data
2MB=manufacturer code : 89 (8989)h
Others=manufacturer code : 89 (8989)h
device code : A6h (A6A6)h
device code : AA (AAAA)h
Read/Reset
Erase Setup/Erase confirm
The memory in the card is switched to read mode by
writing FFh (FFFFh for 16 bit operation) into
the control resister. This mode is maintained
until the contents of register are changed. This
mode needs to be written to every
The erase setup is a command to set up the memory
block for erasure. Writing setup erase command 20h
(2020h for 16 bit operation) in the control register
followed by erase confirm command D0h (D0D0h
for 16 bit operation) will initiate a erasure
operation. Erasing will take place automatically
after the rising edge of WE# controlled by a internal
timer. The completion of
memory zone to which access is required.
Programme Setup/Programme
The setup programme command sets up the card for
programming. It is applied when 40h (4040h for 16
bit operation) is written to control register.
Programming will take place automatically after
latching the address and data which are applied at
the rising edge of WE#.
erase can be confirmed by reading status register.
(For details please refer to the algorithm)
These commands will not erase all the data of a
memory card and should be repeated for all the
required memory blocks. At an eight bit access
mode it should be noticed that the erasure of a
memory block will result in odd byte or even byte
erasure.
The completion of programme can be confirmed by
reading status register.
(For details please refer to the algorithm)
MITSUBISHI
ELECTRIC
5/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
Erase Suspend/Erase Resume
Clear Status Register
The erase suspend command B0h (B0B0h for 16
bit operation) is a command to generate erase
interruption and to read data from another block
of selected memory zone. By writing in the
control register erase resume command D0h
(D0D0h for 16 bit operation), the memory block will
continue the erase operation.
The clear status register command will clear data of
status register. It is applied when 50h (5050h for 16
bit operation) is written to the control
register. If an error occurred during programme or
erase, the status register must be cleared before
retrying programme or erase.
These commands must be executed in erase
algorithm.
(For details please refer to the algorithm)
Read Device Identifier Codes
The read device identifier codes command is
implemented by writing 90h (9090h for 16 bit
operation) to the command register. After writing
the command, manufacturer code can be read at the
address of 000000h of the zone and device code can
be read at the address 000002h of the zone. Each
card uses the same type of memory throughout and
each memory zone will respond the same code.
(Do not apply high voltage to A10 pin in order to try
and read the device identifier codes as this will
result in the card being destroyed.)
Read Status Register
The Read status register is a command to read the
status register’s data and to make sure programme
or erase operations complete successfully. The data
of status register can be read after writing 70h
(7070h for 16 bit operation) in the control register.
The register’s read data is latched on the falling
edge of OE#. At programme or erase, the status
register’s data must be read to verify the results.
STATUS REGISTER
When operating programme or erase, it is necessary
to read status register data and to transact these bit.
Each memory IC used in this
card has internal status register to make sure
programme or erase operations complete
successfully.
7 (15) BIT
Programme/
Erase Status Bit Suspend Bit
6 (14) BIT
Erase
5 (13) BIT
Erase Error
Bit
4 (12) BIT
Programme
Error Bit
3 (11) BIT
Vcc Error
Bit
2 (10) BIT
Programme
Suspend Bit
1,0 (9,8) BIT
Reserved
Note 4: ( ) ; for 16 bit operation
Bit ; Field name
Bit ; Field name
7(15) BIT ; Programme/Erase Status Bit
0=Busy (in programming/erasing) 1=Ready
6(14) BIT ; Erase Suspend Bit
1=Erase Suspended
5(13) BIT ; Erase Error Bit
1=Erase Error
4(12) BIT ; Programme Error Bit
1=Programme Error
3(11) BIT ; Vcc Error
2(10) BIT ; Programme Suspend Bit
1=Programme Suspended
1=Error of voltage at Vcc
1,0(9,8) BIT ; Reserved for future
MITSUBISHI
ELECTRIC
6/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
MEMORY ZONE AND BLOCK
8 bit mode
Even byte
Odd byte
Zone1
0000000h
Zone0
0000001h
03FFFFFh
0400001h
07FFFFFh
0800001h
0BFFFFFh
0C00001h
0FFFFFFh
1000001h
13FFFFFh
1400001h
17FFFFFh
1800001h
1BFFFFFh
1C00001h
1FFFFFFh
0000001h
Block0
03FFFFEh
0400000h
07FFFFEh
0800000h
0BFFFFEh
0C00000h
0FFFFFEh
1000000h
13FFFFEh
1400000h
17FFFFEh
1800000h
1BFFFFEh
1C00000h
1FFFFFEh
001FFFFh
0020001h
Zone2
Zone3
Block1
003FFFFh
.
.
.
.
.
.
Zone4
Zone5
Zone6
Zone7
Zone9
Block31
0300001h
03FFFFFh
Zone8
Zone10
Zone11
Zone13
Zone15
2MB; 1 zone=64KB*16 blocks
Others; 1 zone=64KB*32 blocks
Zone12
Zone14
Note 5 : 2MB;1 zone=0h to 1FFFFFh address
Others;1 zone=0h to 3FFFFFh address
Zone 2 to 15 do not exist in 2MB
Zone 2 to 15 do not exist in 4MB
Zone 4 to 15 do not exist in 8MB
Zone 8 to 15 do not exist in 16MB
Zone 10 to 15 do not exist in 20MB
16 bit mode
Odd byte
Zone0
Even byte
0000000h
03FFFFFh
0400000h
07FFFFFh
0800000h
0BFFFFFh
0C00000h
0FFFFFFh
1000000h
13FFFFFh
1400000h
17FFFFFh
1800000h
1BFFFFFh
1C00000h
1FFFFFFh
0000000h
001FFFFh
0020000h
Block0
Block1
Zone1
Zone2
Zone3
Zone4
Zone5
Zone6
Zone7
003FFFFh
.
.
.
.
.
.
Block31
0300000h
03FFFFFh
2MB; 1 zone=64KW*16 blocks
Others; 1 zone=64KW*32 blocks
Note 6 : 2MB;1 zone=0h to 1FFFFFh address
Others;1 zone=0h to 3FFFFFh address
Zone 1 to 7 do not exist in 2MB
Zone 1 to 7 do not exist in 4MB
Zone 2 to 7 do not exist in 8MB
Zone 4 to 7do not exist in 16MB
Zone 5 to 7 do not exist in 20MB
MITSUBISHI
ELECTRIC
7/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
PROGRAMME ALGORITHM
ERASE ALGORITHM
PROGRAMME
ERASE
8 bit Operation
8 bit Operation
Write the programme setup command (40h) to the
address to be programmed. The next write sequence
will initiate the programming operation which will
end automatically as this period being controlled by
an internal timer and the data will be programmed.
To make sure that the data is
programmed correctly read data of the status
register. The read status register command (70h)
may or may not be applied to read the data after the
programme data input. If the data is programmed
step address and programme data according to the
above sequence.
The next address to be programmed should be
written with in a memory zone. After the last
programming operation, write the reset command
(FFh) in control register of the programmed memory
zones.
Write the erase setup command (20h) and erase
confirm command (D0h) for the applicable block
address.
An erasure operation will then commence which
will be finished in 1.6s typical or less this being
automatically controlled by an internal timer.
To make sure that the data is erased correctly
and read data of the status register.
The read status register command (70h) may or may
not be applied to read the data after the erase
confirm command.
After erasure has completed write the reset
command (FFh) to the control register, proceed
to the erase operation for the next memory block.
16 bit Operation
Most of the algorithm of 16 bit erasure is same as
the one of the 8 bit erasure.
(Please refer to the algorithm and the state of bus
at erasure.)
When overwriting bits programmed as “0”,
programme “1” or the device reliability is affected.
16 bit operation
The algorithm of 16 bit programming is almost same
as the 8 bit programming. (Please refer to the
algorithm and the status of bus at programming)
ERASE SUSPEND
8 bit Operation
The erase suspend is a command to generate block
erase interruption in order to read or programme
data from another block of the selected memory
zone. It is necessary to write the erase suspend
command (B0h) in the erase algorithm.
The execution of the erase suspend can be confirmed
by reading data of the status register.
Then it is necessary to write the read command
(FFh) in control register in order to read data, after
reading the status register’s data.
PROGRAMME SUSPEND
8 bit Operation
The programme suspend is a command to generate
zone programme interruption in order to read or
data from another block of the selected memory
zone. It is necessary to write the erase suspend
command (B0h) in the programme algorithm.
The execution of the programme suspend can be
confirmed by reading data of the status register.
Then it is necessary to write the read command
(FFh) in control register in order to read data, after
reading the status register’s data.
After the erase resume command (D0h) is written in
the control register, the memory block will continue
erase operation.
After the programme resume command (D0h) is
written in the control register, the memory zone will
continue the programme operation.
16 bit Operation
Most of the algorithm of 16 bit erase suspending is
same as the one of the 8 bit erase suspending.
(Please refer to the algorithm and the state of bus
at erase suspending.)
16 bit Operation
Most of the algorithm of 16 bit programme
suspending is same as the one of the 8 bit
programme suspending.
(Please refer to the algorithm and the state of bus
at programme suspending.)
MITSUBISHI
ELECTRIC
8/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
PROGRAMME ALGORITHM
8 bit mode
PROGRAMME START
ADDRESS=FIRST LOCATION
WRITE PROGRAMME SETUP COMMAND(40h)
WRITE PROGRAMME DATA
READ STATUS REGISTER
BIT 7= “ 0”
PROGRAMME
SUSPEND LOOP A
NO
PROGRAMME
SUSPEND?
CHECK PROGRAMME
STATUS BIT
YES
BIT 7= “ 1”
BIT 3= “ 1”
CHECK Vcc
ERROR BIT
BIT 3= “ 0”
BIT 4= “ 1”
CHECK PROGRAMME
ERROR BIT
BIT 4= “ 0”
ADDRESS=
NEXT ADDRESS
WRITE STATUS REGISTER
CLEAR COMMAND(50h)
LAST ADDRESS?
NO
YES
WRITE RESET COMMAND(FFh)
PROGRAMME PASSED
PROGRAMME FAILED
MITSUBISHI
ELECTRIC
9/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
PROGRAMME ALGORITHM
16 bit mode
PROGRAMME START
ADDRESS=FIRST LOCATION
WRITE PROGRAMME SETUP COMMAND(4040h)
WRITE PROGRAMME DATA
READ STATUS REGISTER
PROGRAMME
SUSPEND LOOP B
NO
BIT 7.AND.15= “ 0”
PROGRAMME
SUSPEND?
CHECK PROGRAMME
STATUS BIT
YES
BIT 7.AND.15= “ 1”
BIT 3.OR11= “ 1”
CHECK Vcc
ERROR BIT
BIT 3.OR.11= “ 0”
BIT 4.OR.12= “ 1”
CHECK PROGRAMME
ERROR BIT
BIT 4.OR.12= “ 0”
ADDRESS=
NEXT ADDRESS
WRITE STATUS REGISTER
CLEAR COMMAND(5050h)
LAST ADDRESS?
YES
NO
WRITE RESET COMMAND(FFFFh)
PROGRAMME PASSED
PROGRAMME FAILED
MITSUBISHI
ELECTRIC
10/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
A
B
WRITE SUSPEND
COMMAND(B0B0h)
WRITE SUSPEND
COMMAND(B0h)
READ STATUS REGISTER
READ STATUS REGISTER
BIT 7.AND.15.= ” 0”
BIT 7.= ” 0”
CHECK PROGRAMME
STATUS BIT
CHECK PROGRAMME
STATUS BIT
BIT 7.= ” 1”
BIT 7.AND.15.= ” 1”
BI T 2.AND.10.= ” 0”
BI T 2.= ” 0”
CHECK PROGRAMME
SUSPEND BIT
CHECK PROGRAMME
SUSPEND BIT
BIT 2.= ” 1”
BIT 2.AND.10.= ” 1”
WRITE READ
WRITE READ
COMMAND(FFFFh)
COMMAND(FFh)
READ DATA
READ DATA
WRITE RESUME
COMMAND(D0D0h)
WRITE RESUME
COMMAND(D0h)
PROGRAMME SUSPEND PASSED
PROGRAMME SUSPEND PASSED
Note 7: If Vcc error bit is detected, try to programme again at Vcc level.
This is a programme algorithm for a memory zone and not for a card.
Reading data from the zone generating programme suspend.
.OR. : =Logical or
; .AND. : =Logical and
MITSUBISHI
ELECTRIC
11/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
ERASE ALGORITHM
8 bit mode
ERASE START
ADDRESS=BLOCK ADDRESS
WRITE ERASE SETUP
COMMAND(20h)
WRITE ERASE COMMAND(D0h)
READ STATUS REGISTER
ERASE SUSPEND
NO
LOOP C
YES
BIT 7= ” 0”
ERASE
SUSPEND?
CHECK ERASE
STATUS BIT
BIT 7 = ” 1”
BIT 3= ” 1”
CHECK Vcc
ERROR BIT
BIT 3= ” 0”
BIT 4. OR. 5= ” 1”
BIT 5.OR.13= ” 1”
CHECK CONTROL
COMMAND BIT
BIT 4. OR. .5= ” 0”
CHECK ERASE
ERROR BIT
WRITE STATUS REGISTER CLEAR COMMAND(50h)
BIT 5.OR.13 = ” 0”
WRITE RESET COMMAND(FFh)
ERASE PASSED
ERASE FAILED
MITSUBISHI
ELECTRIC
12/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
ERASE ALGORITHM
16 bit mode
ERASE START
ADDRESS=BLOCK ADDRESS
WRITE ERASE SETUP
COMMAND(2020h)
WRITE ERASE COMMAND(D0D0h)
READ STATUS REGISTER
ERASE SUSPEND
NO
LOOP D
YES
BIT 7.AND.15= ” 0”
BIT 3.OR.11= ” 1”
ERASE
SUSPEND?
CHECK ERASE
STATUS BIT
BIT 7.AND>15 = ” 1”
CHECK Vcc
ERROR BIT
BIT 3.OR.11= ” 0”
BIT 4.OR.5 OR. 12.OR.13= ” 1”
CHECK CONTROL
COMMAND BIT
BIT 4.OR.5 OR. 12.OR.13= ” 0”
BIT 5.OR.13= ” 1”
CHECK ERASE
ERROR BIT
WRITE STATUS REGISTER CLEAR COMMAND(50h)
BIT 5 .OR.13= ” 0”
WRITE RESET COMMAND(FFh)
ERASE PASSED
ERASE FAILED
MITSUBISHI
ELECTRIC
13/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
C
D
WRITE SUSPEND
COMMAND(B0B0h)
WRITE SUSPEND
COMMAND(B0h)
READ STATUS REGISTER
READ STATUS REGISTER
BIT 7.AND.15.= ” 0”
BIT 7.= ” 0”
CHECK ERASE
STATUS BIT
CHECK ERASE
STATUS BIT
BIT 7.= ” 1”
BIT 7.AND.15.= ” 1”
BI T 6.AND.15.= ” 0”
BI T 6.= ” 0”
CHECK ERASE
SUSPEND BIT
CHECK ERASE
SUSPEND BIT
BIT 6.= ” 1”
BIT 6.AND.15.= ” 1”
READ /
READ /
PROGRAMME
PROGRAMME
WRITE RESUME
COMMAND(D0D0h)
WRITE RESUME
COMMAND(D0h)
PROGRAMME SUSPEND PASSED
PROGRAMME SUSPEND PASSED
Note 8 : If Vcc error bit is detected, try to programme again at Vcc level.
This is an erase algorithm for a memory block and not for a card.
Reading data from blocks other than the suspended block in the zone generating erase suspend.
.OR. : =Logical or
;
.AND. : =Logical and
ABSOLUTE MAXIMUM RATINGS
Symbol
VCC
VI
VO
Parameter
VCC Supply voltage
Input voltage
Conditions
Ratings
-0.5 to 6.5
-0.3 to VCC+0.3
0 to VCC
Unit
V
V
With respect to GND
Output voltage
V
Topr
Tstg
Operating temperature
Storage temperature
Read/Write Operation
0 to 70
-40 to 80
°C
°C
MITSUBISHI
ELECTRIC
14/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
RECOMMENDED OPERATING CONDITIONS (Ta=0 to 55°C, unless otherwise noted)
Limits
Typ.
5.0
Parameter
VCC Supply voltage
High input voltage
Low input voltage
Number of simultaneous activated
memory zones/blocks
Symbol
Unit
Min.
4.75
Max.
5.25
VCC
VIH
VIL
V
V
V
Zone
Block
2.4
0
VCC
0.8
1
Programme
Erase
NACT
1
CAPACITANCE
Limits
Typ.
Test conditions
Parameter
Symbol
Min.
Max.
Ci
Co
Input capacitance
Output capacitance
VI=GND, vi=25mVrms, f=1 MHZ, Ta=25°C
VI=GND, vo=25mVrms, f=1 MHZ, Ta=25°C
45
45
pF
pF
Note 9 : These parameters are not 100% tested.
ELECTRICAL CHARACTERISTICS
Ta= 0 to 55°C, VCC=5V+/-5%, unless otherwise noted)
Limits
Typ.
Unit
V
Conditions
Parameter
Symbol
VOH
Min.
Max.
IOH=-0.1mA, BVDn
IOH=-1.0mA, Other outputs
IOL=2mA
2.4
2.4
0
High output current
VOL
IIH
Low output voltage
High input current
0.4
10
V
µA
VI=VCC V
-10
-70
VI=0V
CE1#, CE2#, OE#, WE#, REG#
Other inputs
IIL
Low output voltage
µA
µA
µA
mA
-10
10
High output current
in off state
Low output current
in off state
Active VCC supply
current 1
IOZH
CE1#=CE2#=VIH or OE#=VIH,VO(Dm)=VCC
CE1#=CE2#=VIH or OE#=VIH, VO(Dm)=0V
-10
IOZL
CE1#=CE2#=VIL, Other inputs=VIH or VIL,
Outputs=open
130
110
200
ICC 1 • 1
Active VCC supply
current 2
CE1#=CE2# < 0.2V, Other inputs < 0.2V
or > VCC-0.2V, Outputs=open
mA
ICC 1 • 2
180
2MB
4MB
8MB
6.0
6.0
10
ICC 2 • 1 Standby VCC
supply current 1
CE1#=CE2#=VIH, Other
inputs=VIH or VIL
16MB
20MB
32MB
2MB
4MB
8MB
16MB
20MB
32MB
18
22
34
1.2
1.4
1.8
1.8
2.0
2.6
mA
0.05
0.05
0.10
0.20
0.25
0.40
ICC 2 • 2 Standby VCC supply CE1#=CE2# > VCC-0.2V,
current 2
Other inputs < 0.2V
or > VCC-0.2V
µA
Note 10 : Currents flowing into the card are taken as positive (unsigned).
Typical values are measured at VCC=5.0V,Ta=25°C.
The card consumes active current at programming, erasure even if both CE1# and CE2# are
high level.
MITSUBISHI
ELECTRIC
15/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
SWITCHING CHARACTERISTICS (COMMON MEMORY) (Ta= 0 to 55°C, Vcc=5V+/-5% )
Limits
Typ.
Parameter
Symbol
tcR
ta(A)
ta(CE)
ta(OE)
tdis(CE)
Unit
Min.
150
Max.
Read cycle time
ns
ns
ns
ns
ns
Address access time
Card enable access time
Output enable access time
150
150
75
75
Output disable time (from CE#)
Output disable time (from OE#)
Output enable time (from CE#)
tdis(OE)
ten(CE)
ten(OE)
tv(A)
75
ns
ns
ns
ns
5
5
0
Output enable time (from OE#)
Data valid time after address change
TIMING REQUIREMENTS (COMMON MEMORY) (Ta= 0 to 55°C, Vcc=5V+/-5% )
Limits
Typ.
Parameter
Unit
Symbol
Min.
150
20
Max.
tcW
tSU(A)
trec(WE)
tsu(D-WEH) Data setup time
th(D)
Write cycle time
Address setup time
Write recovery time
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
ms
20
50
20
0
100
20
20
80
40
Data hold time
tWRR
Write recovery time before read
tsu(A-WEH) Address setup time to write enable high
tsu(CE)
th(CE)
tw(WE)
tWPH
tDP
tDE
Card enable setup time
Card enable hold time
Write pulse width
Write pulse width high
Duration of programming operation
Duration of erase operation
6.5
900
Note 11 : Refer to switching characteristics for read parameters
TIMING DIAGRAM
Common Memory Read
tcR
VIH
An
VIL
ta(A)
tV(A)
VIH
VIL
ta(CE)
CE#
OE#
tdis(CE)
ta(OE)
VIH
VIL
ten(CE)
ten(OE)
tdis(OE)
VOH
VOL
Dm
(DOUT)
OUTPUT VALID
High-Z
WE# =“H” level, REG# =”H” level
MITSUBISHI
ELECTRIC
16/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
TIMING DIAGRAM (COMMON MEMORY)
Programme Mode
PROGRAMME
STATUS REGISTER
PA
PROGRAMME
RESET
PA
SET UP
VIH
VIL
PA
PA
An
trec(WE)
tcW
tsu(A-WEH)
tsu(A)
VIH
VIL
CE#
OE#
tWRR
tDP
th(CE)
tsu(CE)
VIH
VIL
tWPH
VIH
VIL
WE#
Dm
tsu(D-WEH)
th(WE)
tw(WE)
Din
VOH
VOL
Dout
FF
40
High-Z
REG# =”H” level
Erase Mode
ERESE
SET UP
STATUS REGISTER
PA
ERASE
PA
RESET
PA
VIH
An
PA
VIL
trec(WE)
tcW
tsu(A-WEH)
tsu(A)
VIH
CE#
VIL
tWRR
tDE
th(CE)
tsu(CE)
VIH
OE#
VIL
tWPH
VIH
WE#
VIL
tsu(D-WEH)
th(WE)
tw(WE)
Din
VOH
Dm
Dout
FF
40
VOL
High-Z
REG# =”H” level
MITSUBISHI
ELECTRIC
17/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
SWITCHING CHARACTERISTICS (ATTRIBUTE MEMORY)
Read Cycle (Ta= 0 to 55°C, VCC=5V+/-5%, unless otherwise noted)
Limits
Typ.
Parameter
Symbol
tcRR
Min.
300
Max. Unit
ns
Read cycle time
ta(A)R
Address access time
Card enable access time
Output enable access time
300
300
150
100
ns
ns
ns
ns
ta(CE)R
ta(OE)R
tdis(dis)R
Output disable time (from CE#)
Output disable time (from OE#)
Output enable time (from CE#)
tdis(OE)R
ten(CE)R
ten(CE)R
tv(A)R
100
ns
ns
ns
ns
5
5
0
Output enable time (from OE#)
Data valid time after address change
TIMING REQUIREMENTS (ATTRIBUTE MEMORY)
Write Cycle GM series only (Ta= 0 to 55°C, VCC=5V+/-5%, unless otherwise noted)
Limits
Typ.
Parameter
Symbol
Min.
30
Max. Unit
tASR
tAHR
tCSR
tCHR
tDSR
tDHR
tOESR
tOEHR
tWPR
tDLR
tBLR
tWCR
Address setup time
Address hold time
CE setup time
ns
ns
ns
ns
ns
ns
ns
ns
ns
ns
µs
ms
30
40
30
120
40
30
40
170
120
100
10
CE hold time
Data setup time
Data hold time
OE setup time
OE hold time
Write pulse width
Data latch time
Byte load cycle time
Write cycle time
TIMING DIAGRAM (Attribute Memory)
Read
tCRR
VIH
An
VIL
ta(A)R
ta(CE)R
tv(A)R
VIH
CE#
VIL
ten(CE)R
tdis(CE)R
ta(OE)R
VIH
OE#
VIL
tdis(OE)R
ten(OE)R
VOH
VOL
High-Z
Dm
(DOUT)
OUTPUT VALID
WE# =“H” level, REG# =”L” level
MITSUBISHI
ELECTRIC
18/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
Byte Write (GM series only)
tAHR
VIH
An
VIL
tCSR
tASR
tCHR
VIH
CE#
VIL
tWPR
VIH
WE#
VIL
VIH
tOESR
tOEHR
OE#
tdis(OE)R
VIL
tDSR
tDHR
Hi-Z
VIH
VIL
Dm
(DIN)
ten(OE)R
Hi-Z
VOH
VOL
Dm
(DOUT)
REG# =“L” level
PAGE MODE WRITE (GM series only)
An
(n>5)
An
(A0~A5)
4h
0h
2h
3Ch
3Eh
CE#
th(CE)R
tsu(CE)R
tw(WE)R
WE#
tsu(A)R
tsu(OE-WE)R
OE#
th(OE-WE)R
tDLR
tBLCR
trec(WE)R
tcWR
th(D)R
t(D-WEH)R
Hi-Z
DIN
tdis(OE)R
Hi-Z
DOUT
REG# =“L” level
MITSUBISHI
ELECTRIC
19/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
Note 12 : AC Test Conditions
Input pulse levels : VIL=0.4V, VIH=2.8V
Input pulse rise, fall time : tr=tf=10ns
Reference voltage
Input : VIL=0.8V, VIH=2.4V
Output : VOL=0.8V, VOH=2.0V
(ten and tdis are measured when output voltage is ± 500mV from steady state. )
Load : 100pF+ 1 TTL gate
5pF+ 1 TTL gate (at ten and tdis measuring)
13 : The data write is performed during the interval when both CE# and WE# are “L” level.
14 : Do not apply inverted phase signal externally when Dm pin is in output mode.
15 : CE# is indicated as follows:
Read A/Write A : CE#=CE1#=CE2#
Read B/Write B : CE#=CE1#, CE2#=“H” level
Read C/Write C : CE#=CE2#, CE1#=“H” level
16:
Indicates the don’t care input.
RECOMMENDED POWER UP/DOWN CONDITIONS (Ta=0 to 55°C, unless otherwise noted)
Limits
Test conditions
Parameter
Symbol
Min.
0
Max.
VI
Unit
V
0V< VCC <2V
2V< VCC < VIH
VIH < VCC
Vi(CE)
CE input voltage
VCC-0.1
VI
V
VI
V
VIH
5.0
1.0
0.1
3.0
tsu(CE)
CE# setup time
CE# recovery time
VCC rise time
ms
µs
ms
ms
trec(CE)
tpr(VCC)
tpf(VCC)
300
300
VCC fall time
POWER UP TIMING DIAGRAM
tpr(Vcc)
0.9×VCC
VCC
4.75V
tsu(CE)
VIH
2V
0.1×VCC
CE1#,CE2#
0V
Insertion
VCC
tpr(Vcc)
0.9×VCC
4.75V
tsu(CE)
VIH
2V
0.1×VCC
CE1#,CE2#
0V
Withdraw
BLOCK PROGRAM/ERASE TIME
Limits
Parameters
Unit
s
s
Typ.
1.1
0.5
Max.
10
2.1
Block erase time
Block program time
Note 17 : At Ta=25°C, Vcc=5V
Byte/word program time is about 8µs (typical), but not guaranteed.
MITSUBISHI
ELECTRIC
20/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
!
Warning ( if card with battery / card with auxiliary battery )
(1)Do not charge, short, disassemble, deform, heat, or throw the batteries into fire, as they may ignite, overheat,
rupture or explode.
(2)Place the batteries out of the reach of children. If somebody swallows them, they should see a doctor
immediately.
(3)When discarding or storing the batteries, wrap them individually with cellophane tape or other nonconductive
material. If they are positioned in contact with any other metals or batteries, they may explode, rupture or
leak electrolyte solution.
!
Caution
This product is not designed or manufactured for use in a device or system that is used under circumstances in
which human life is potentially at stake. Please contact Mitsubishi Electric Corporation or an authorized
Mitsubishi Semiconductor product distributor when considering the use of a product contained herein for a
special applications, such as apparatus or systems for transportation, vehicular, medical, aerospace, nuclear,
or undersea repeater use.
Keep safety first in your circuit designs !
Mitsubishi Electric Corporation puts the maximum effort into making semiconductor products better and more
reliable, but there is always the possibility that trouble may occur with them. Trouble with semiconductors may
lead to personal injury, fire or property damage. Remember to give due consideration to safety when making
your circuit designs, with appropriate measures such as (1)placement of substitutive, auxiliary circuits,(2)use of
non-flammable material or (3)prevention against any malfunction or mishap.
Notes regarding these materials
lThese materials are intended as a reference to assist our customers in the selection of the Mitsubishi
semiconductor product best suited to the customer’s application; they do not convey any license under any
intellectual property rights, or any other rights, belonging to Mitsubishi Electric Corporation or a third party.
l Mitsubishi Electric Corporation assumes no responsibility for any damage, or infringement of any third-
party’s rights, originating in the use of any product data, diagrams, charts or circuit application examples
contained in these materials.
l All information contained in these materials, including product data, diagrams and charts, represent
information on products at the time of publication of these materials, and are subject to change by Mitsubishi
Electric Corporation without notice due to product improvements or other reasons. It is therefore
recommended that customers contact Mitsubishi Electric Corporation or an authorized Mitsubishi
Semiconductor product distributor for the latest product information before purchasing a product listed
herein.
l For instruction on proper use of the IC card, thoroughly read the manual attached to the product before use.
After reading please store the manual in s safe place for future reference.
l The prior written approval of Mitsubishi Electric Corporation is necessary to reprint or reproduce in whole
or in part these materials.
l If these products or technologies are subject the Japanese export control restrictions, they must be exported
under a license from the Japanese government and cannot be imported into a country other than approved
destination. Any diversion or re-export contrary to the export control laws and regulations of Japan and/or
the country of destination is prohibited.
l Please contact Mitsubishi Electric Corporation or an authorized Mitsubishi Semiconductor product
distributor for further details on these materials or the products contained therein.
MITSUBISHI
ELECTRIC
21/22
Feb.1999 Rev2.0
MITSUBISHI MEMORY CARD
FLASH MEMORY CARDS
OUTLINE(68P-013)
MITSUBISHI
ELECTRIC
22/22
Feb.1999 Rev2.0
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