PLL602-30DC [MICROCHIP]

IC,MISCELLANEOUS CLOCK GENERATOR,DIE;
PLL602-30DC
型号: PLL602-30DC
厂家: MICROCHIP    MICROCHIP
描述:

IC,MISCELLANEOUS CLOCK GENERATOR,DIE

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750kHz – 800MHz Low Phase Noise XO (for 12 to 25MHz Crystals)  
FEATURES  
DIE CONFIGURATION  
65 mil  
750kHz to 800MHz output range.  
Low phase noise output  
-127dBc/Hz for 155.52MHz @ 10kHz offset  
-115dBc/Hz for 622.08MHz @ 10kHz offset  
(1550,1475)  
17  
25  
24 23 22 21  
20  
19  
18  
GNDBUF  
26  
16  
15  
14  
XIN  
LVCMOS  
LVDSB  
Selectable LVCMOS, LVPECL or LVDS output.  
Selectable High Drive or Standard Drive LVCMOS.  
12MHz to 25MHz crystal input.  
No external load capacitor or varicap required.  
Output Enable selector.  
Die ID:  
A2828-29  
27  
28  
XOUT  
SEL3^  
LVPECLB  
13  
12  
VDDBUF  
VDDBUF  
29  
SEL2^  
3.3V operation.  
Available in Die form (65 mil x 62 mil).  
11  
LVPECL  
30  
31  
OE_CTRL  
NC  
C502A  
10  
9
LVDS  
OE_SEL^  
1
2
3
4
5
6
7
8
(0,0)  
Y
DESCRIPTION  
X
Note: ^ denotes internal pull up  
The PLL602-30 is a monolithic low jitter and low  
phase noise XO IC with LVCMOS, LVDS and  
LVPECL output capabilities, covering the 750kHz to  
800MHz output range using a low cost 12MHz to  
25MHz crystal.  
OUTPUT SELECTION AND ENABLE  
This one IC can be used to produce a XO with  
output frequencies ranging from FXIN / 16 to FXIN x 32  
thanks to the four frequency selector pads. This  
makes the PLL602-30 ideal as a universal die for  
applications ranging from ADSL to SONET.  
OUTSEL1 OUTSEL0  
Selected Output  
(Pad #18)  
(Pad #25)  
0
0
1
1
0
1
0
1
High Drive LVCMOS  
Standard Drive LVCMOS  
LVPECL  
LVDS  
DIE SPECIFICATIONS  
OE_SELECT  
(Pad #9)  
OE_CTRL  
(Pad #30)  
Name  
Value  
State  
Size  
62 x 65 mil  
GND  
0 (Default)  
Output enabled  
Tri-state  
0
Reverse side  
Pad dimensions  
Thickness  
1
80 micron x 80 micron  
10 mil  
0
Tri-state  
1 (Default)  
1 (Default)  
Output enabled  
Pad #9: Bond to GND to set to “0”, bond to VDD to set to “1”  
Pad #30: Logical states defined by PECL levels if OE_SELECT is “0”  
Logical states defined by CMOS levels if OE_SELECT is “1”  
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 11/15/08 Page 1  
750kHz – 800MHz Low Phase Noise XO (for 12 to 25MHz Crystals)  
BLOCK DIAGRAM  
XIN  
VCO  
Divider  
Xtal Osc  
XOUT  
Charge  
Pump  
+
Loop  
Filter  
CLKBAR  
CLK  
Reference  
Divider  
Phase  
Detector  
VCO  
SEL[3:0]  
OE  
FREQUENCY SELECTION TABLE  
SEL3  
(Pad #28)  
SEL2  
(Pad #29)  
SEL1  
(Pad #19)  
SEL0  
(Pad #20)  
Selected Multiplier  
Reserved  
0
0
0
0
0
0
0
0
1
1
1
1
1
1
1
1
0
0
0
0
1
1
1
1
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
Reserved  
Reserved  
Fin x 32  
Reserved  
Reserved  
Fin / 8  
Fin x 2  
Reserved  
Fin / 2  
Fin / 16  
Fin x 4  
Fin / 4  
Fin x 8  
Fin x 16  
No multiplication  
All pads have internal pull-ups (default value is 1). Bond to GND to set to 0.  
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 11/15/08 Page 2  
750kHz – 800MHz Low Phase Noise XO (for 12 to 25MHz Crystals)  
ELECTRICAL SPECIFICATIONS  
1. Absolute Maximum Ratings  
PARAMETERS  
SYMBOL  
MIN.  
MAX.  
UNITS  
Supply Voltage  
VDD  
VI  
4.6  
VDD+0.5  
VDD+0.5  
150  
V
Input Voltage, dc  
Output Voltage, dc  
Storage Temperature  
-0.5  
-0.5  
-65  
V
VO  
TS  
TA  
TJ  
V
C  
C  
C  
C  
kV  
Ambient Operating Temperature*  
Junction Temperature  
-40  
85  
125  
Lead Temperature (soldering, 10s)  
ESD Protection, Human Body Model  
260  
2.5  
Exposure of the device under conditions beyond the limits specified by Maximum Ratings for extended periods may cause permanent damage to the  
device and affect product reliability. These conditions represent a stress rating only, and functional operations of the device at these or any other  
conditions above the operational limits noted in this specification is not implied. Operating Temperature is guaranteed by design for all parts  
(COMMERCIAL and INDUSTRIAL), but tested for COMMERCIAL grade only.  
2. Crystal Specifications  
PARAMETERS  
SYMBOL  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNITS  
Crystal Resonator Frequency  
Crystal Loading Rating  
Recommended ESR  
FXIN  
CL (xtal)  
RE  
Parallel Fundamental Mode  
12  
25  
MHz  
pF  
20  
AT cut  
30  
Ω
3. General Electrical Specifications  
PARAMETERS  
SYMBOL  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNITS  
Fout<24MHz  
60/28/15  
65/45/30  
100/80/40  
3.63  
Supply Current, Dynamic  
(with loaded outputs,  
15pF)  
LVPECL/  
LVDS/  
LVCMOS  
IDD  
mA  
24MHz<Fout<96MHz  
96MHz<Fout<700MHz  
Operating Voltage  
VDD  
2.97  
45  
V
@ 50% VDD (LVCMOS)  
@ 1.25V (LVDS)  
Output Clock Duty Cycle  
50  
55  
%
@ VDD – 1.3V (LVPECL)  
4. Jitter Specifications  
PARAMETERS  
CONDITIONS  
FREQUENCY  
MIN.  
TYP.  
MAX.  
UNITS  
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 11/15/08 Page 3  
750kHz – 800MHz Low Phase Noise XO (for 12 to 25MHz Crystals)  
With capacitive decoupling  
between VDD and GND.  
Over 10,000 cycles.  
With capacitive decoupling  
between VDD and GND.  
Over 10,000 cycles.  
155.52MHz  
622.08MHz  
155.52MHz  
622.08MHz  
155.52MHz  
622.08MHz  
4.3  
5.0  
35  
Period Jitter,  
RMS  
ps  
ps  
ps  
Period Jitter,  
Peak-to-Peak  
45  
2.4  
2.5  
Integrated Jitter,  
RMS  
Integrated 12 kHz to 20 MHz  
5. Phase Noise Specifications  
PARAMETERS  
FREQUENCY  
@10Hz  
@100Hz  
@1kHz  
@10kHz  
@100kHz UNITS  
Phase Noise,  
relative to carrier  
(typical)  
155.52MHz  
622.08MHz  
-63  
-52  
-93  
-83  
-117  
-105  
-126  
-113  
-123  
dBc/Hz  
-110  
6. LVCMOS Electrical Characteristics  
PARAMETERS  
SYMBOL  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNITS  
IOH  
IOL  
IOH  
IOL  
VOH= VDD-0.4V, VDD=3.3V  
VOL = 0.4V, VDD = 3.3V  
VOH= VDD-0.4V, VDD=3.3V  
VOL = 0.4V, VDD = 3.3V  
10  
10  
30  
30  
mA  
mA  
mA  
mA  
Output Drive Current  
(Standard Drive)  
Output Drive Current  
(High Drive)  
Output Clock Rise/Fall Time  
(Standard Drive)  
0.3V ~ 3.0V with 15 pF load  
0.3V ~ 3.0V with 15 pF load  
2.4  
1.2  
ns  
Output Clock Rise/Fall Time  
(High Drive)  
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 11/15/08 Page 4  
750kHz – 800MHz Low Phase Noise XO (for 12 to 25MHz Crystals)  
7. LVDS Electrical Characteristics  
PARAMETERS  
SYMBOL  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNITS  
Output Differential Voltage  
VDD Magnitude Change  
Output High Voltage  
Output Low Voltage  
Offset Voltage  
VOD  
VOD  
VOH  
247  
-50  
355  
454  
50  
mV  
mV  
V
1.4  
1.1  
1.2  
3
1.6  
RL = 100 Ω  
(see figure)  
VOL  
0.9  
1.125  
0
V
VOS  
1.375  
25  
V
Offset Magnitude Change  
mV  
VOS  
Vout = VDD or GND  
VDD = 0V  
Power-Off Leakage  
IOXD  
IOSD  
uA  
1  
10  
Output Short Circuit Current  
-5.7  
-8  
mA  
8. LVDS Switching Characteristics  
PARAMETERS  
SYMBOL  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNITS  
RL = 100 Ω  
CL = 10 pF  
(see figure)  
Differential Clock Rise Time  
Differential Clock Fall Time  
tr  
tf  
0.7  
0.7  
1.0  
1.0  
ns  
ns  
LVDS Levels Test Circuit  
LVDS Switching Test Circuit  
OUT  
OUT  
CL = 10pF  
50?  
50?  
VOD  
VOS  
VDIFF  
RL = 100?  
CL = 10pF  
OUT  
OUT  
LVDS Transistion Time Waveform  
OUT  
OUT  
0V (Differential)  
80%  
80%  
VDIFF  
0V  
20%  
20%  
tR  
tF  
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 11/15/08 Page 5  
750kHz – 800MHz Low Phase Noise XO (for 12 to 25MHz Crystals)  
9. LVPECL Electrical Characteristics  
PARAMETERS  
SYMBOL  
CONDITIONS  
MIN.  
MAX.  
UNITS  
Output High Voltage  
Output Low Voltage  
VOH  
VOL  
VDD – 1.025  
V
V
RL = 50 Ω to (VDD – 2V)  
(see figure)  
VDD – 1.620  
10. LVPECL Switching Characteristics  
PARAMETERS  
Clock Rise Time  
Clock Fall Time  
SYMBOL  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNITS  
tr  
tf  
@20/80% - LVPECL  
@80/20% - LVPECL  
0.6  
0.5  
1.5  
1.5  
ns  
ns  
LVPECL Levels Test Circuit  
LVPECL Output Skew  
OUT  
VDD  
OUT  
50  
50  
2.0V  
50%  
OUT  
tSKEW  
OUT  
LVPECL Transistion Time Waveform  
DUTY CYCLE  
45 - 55%  
55 - 45%  
OUT  
80%  
50%  
20%  
OUT  
tR  
tF  
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 11/15/08 Page 6  
750kHz – 800MHz Low Phase Noise XO (for 12 to 25MHz Crystals)  
PAD ASSIGNMENT  
Pad #  
Name  
Description  
X (m)  
Y (m)  
1
2
3
4
5
6
7
8
GND  
GND  
248  
361  
109  
109  
109  
109  
109  
109  
109  
109  
Ground.  
Ground.  
GND  
473  
Ground.  
GND  
587  
Ground.  
GND  
702  
Ground.  
NC  
874  
No connection.  
Ground.  
GND  
1042  
1171  
GNDBUF  
Ground, buffer circuitry.  
Used to select between LVPECL or LVCMOS logic states for  
OE. Internal pull up.  
9
OE_SELECT  
1400  
125  
10  
11  
12  
13  
14  
15  
16  
17  
LVDS  
1400  
1400  
1400  
1400  
1400  
1400  
1400  
1389  
259  
476  
LVDS output.  
LVPECL  
VDDBUF  
VDDBUF  
LVPECLB  
LVDSB  
LVPECL output.  
616  
3.3V power supply, buffer circuitry.  
3.3V power supply, buffer circuitry.  
Complementary LVPECL output.  
Complementary LVDS output.  
LVCMOS output.  
716  
871  
1089  
1227  
1365  
LVCMOS  
GNDBUF  
Ground, buffer circuitry.  
Used to select LVCMOS, LVPECL or LVDS output type.  
Internal pull up.  
18  
OUTSEL1  
1232  
1365  
19  
20  
21  
22  
23  
24  
SEL1  
SEL0  
VDD  
VDD  
VDD  
VDD  
1042  
854  
659  
559  
459  
358  
1365  
1365  
1365  
1365  
1365  
1365  
Used to select multiplication factor. Internal pull up.  
Used to select multiplication factor. Internal pull up.  
3.3V power supply.  
3.3V power supply.  
3.3V power supply.  
3.3V power supply.  
Used to select LVCMOS, LVPECL or LVDS output type.  
Internal pull up.  
25  
OUTSEL0  
194  
1365  
26  
27  
28  
29  
XIN  
109  
109  
109  
109  
1223  
1017  
858  
Crystal input. See crystal specification page 3.  
Crystal output. See crystal specification page 3.  
Used to select multiplication factor. Internal pull up.  
Used to select multiplication factor. Internal pull up.  
XOUT  
SEL3  
SEL2  
646  
Used to enable/disable the output(s). See Output Selection and  
Enable table on page 1.  
30  
31  
OE_CTRL  
NC  
109  
109  
397  
181  
No connection  
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 11/15/08 Page 7  
750kHz – 800MHz Low Phase Noise XO (for 12 to 25MHz Crystals)  
ORDERING INFORMATION  
For part ordering, please contact our Sales Department:  
47745 Fremont Blvd., Fremont, CA 94538, USA  
Tel: (510) 492-0990 Fax: (510) 492-0991  
PART NUMBER  
The order number for this device is a combination of the following:  
Part Number, Package Type and Operating Temperature Range  
Part Number  
Temperature  
C=Commercial (0°C to 70°C)  
Package Type  
D=Die  
W=Wafer  
Part Number/Order Number  
Marking  
Package Option  
PLL602-30DC  
PLL602-30WC  
P602-30DC  
P602-30WC  
Die (Waffle Pack  
Wafer  
PhaseLink Corporation, reserves the right to make changes in its products or specifications, or both at any time without notice. The information  
furnished by Phaselink is believed to be accurate and reliable. However, PhaseLink makes no guarantee or warranty concerning the accuracy of said  
information and shall not be responsible for any loss or damage of whatever nature resulting from the use of, or reliance upon this product.  
LIFE SUPPORT POLICY: PhaseLink’s products are not authorized for use as critical components in life support devices or systems without the  
express written approval of the President of PhaseLink Corporation.  
47745 Fremont Blvd., Fremont, California 94538 Tel (510) 492-0990 Fax (510) 492-0991 www.phaselink.com Rev 11/15/08 Page 8  

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