RH101AJ8 [Linear]
IC OP-AMP, Operational Amplifier;
| 型号： | RH101AJ8 |
| 厂家： | 
Linear |
| 描述： | IC OP-AMP, Operational Amplifier |
| 文件： | 总19页 (文件大小：370K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
SPEC NO. 05-08-5015 REV. L
REV
RH101A, OPERATIONAL AMPLIFIER
REVISION RECORD
DESCRIPTION
DATE
06/12/96
12/12/97
0
INITIAL RELEASE
A
·
·
·
·
·
·
PAGE 2, ADDED PARAGRAPHS 3.2.1, 3.2.2, AND 3.2.3.
PAGE 2, PARAGRAPH 3.3.b: ADDED “(SEE PARAGRAPH 3.2)”.
PAGE 3, ADDED PARAGRAPHS 3.8.1, 3.8.2, AND 3.8.3.
PAGE 4, PARAGRAPH 3.12: WAFER LOT ACCEPTANCE EXPLANATION WAS REWRITTEN.
PAGE 4, PARAGRAPH 4.4.2, GROUP B INSPECTION WAS REDEFINED.
PAGE 5, PARAGRAPH 4.4.3, GROUP D INSPECTION WAS REDEFINED.
PARAGRAPH 4.5.1, SOURCE INSPECTION WAS REDEFINED.
·
·
PAGES 6, 7, 8, FIGURES 1, 2, 3 CASE OUTLINES: ADDED θja AND θjc .
PAGE 8, CHANGE TO FIGURE 3, PACKAGE TYPE FROM “CERPAK” TO “FLATPACK, GLASS
SEAL”.
·
·
PAGE 9, CHANGE TO FIGURE 6, PACKAGE TYPE FROM “CERPAK” TO “FLATPACK, GLASS
SEAL”.
PAGE 4, AMENDED PARAGRAPHS 4.1 AND 4.1.1 TAKING EXCEPTION TO ANALYSIS OF
CATASTROPHIC FAILURES.
B
03/24/98
C
D
09/28/99
11/17/99
·
·
·
PAGE 6, 7, 8, FIGURE 1, 2, 3, CHANGED θja AND θjc.
PAGE 3, PARAGRAPHS 3.2.1, 3.2.2, 3.2.3 HAD FIGURES 1, 2, AND 3 REMOVED.
PAGE 4, PARAGRAPH 3.7, CHANGED VERBIAGE FROM “SPECIFIED IN TABLE III” TO “AND
AS SPECIFIED IN TABLE III HEREIN”, LINE 2.
PARAGRAPH 3.9, ADDED “HEREIN” AFTER “TABLE II”, LINE 2.
PAGE 5, PARAGRAPH 4.3, ADDED “HEREIN” AFTER “TABLE III”, LINE 2.
PARAGRAPH 4.4.1, ADDED “HEREIN” AFTER “TABLE III”, LINE 2.
PARAGRAPH 4.4.2.2, CHANGED VERBIAGE IN LINE 1 FROM “ALL FOOTNOTES OF TABLE
11A OF MIL-STD-883” TO “ALL FOOTNOTES PERTAINING TO TABLE IIA IN MIL-STD-885”.
PAGE 6, PARAGRAPH 4.4.3.2, CHANGED VERBIAGE IN LINE 1 FROM “ALL FOOTNOTES OF
TABLE IV OF MIL-STD-883” TO “ALL FOOTNOTES PERTAINING TO TABLE IV IN MIL-STD-
883’.
·
·
·
E
08/15/00
PAGE 9, CHANGED THETA JA TO 0JA=170°C/W AND THETA JC TO 0JC=40°C/W FROM
0JA=225°C/W AND 0JC=18°C/W PER PACKAGE ENGINEER.
REVISION RECORD AND DESCRIPTION CONTINUED ON NEXT PAGE.
CAUTION: ELECTROSTATIC DISCHARGE SENSITIVE PART
REVISION
INDEX
REVISION
INDEX
PAGE NO.
REVISION
PAGE NO.
REVISION
1
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10 11 12 13 14 15 16
17
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18 19
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LINEAR TECHNOLOGY CORPORATION
MILPITAS, CALIFORNIA
TITLE:
ORIG
DSGN
ENGR
MFG
MICROCIRCUIT, LINEAR,
RH101A, OPERATIONAL AMPLIFIER
CM
QA
PROG
FUNCT
SIZE CAGE CODE DRAWING NUMBER REV
64155 05-08-5015
DATE CONTRACT:
L
APPLICATION
SIGNOFFS
FOR OFFICIAL USE ONLY
LINEAR TECHNOLOGY CORPORATION
PAGE 1 OF 19
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SPEC NO. 05-08-5015 REV. L
REV
RH101A, OPERATIONAL AMPLIFIER
REVISION RECORD
DESCRIPTION
DATE
F
10/30/02
·
PAGE 3:
PARAGRAPH 3.2.1 ADDED “OPTION 1”, PARAGRAPH 3.2.2, ADDED “OPTION 2”, PARAGRAPH
3.2.3, ADDED “OPTION 3”.
·
PAGE 4:
PARAGRAPH 3.4, NOTES AT INPUT VOLTAGE AND OUTPUT SHORT CIRCUIT DURATION ARE
CHANGED FROM NOTES 1 AND 2 TO NOTES B AND C.
PARAGRAPH 3.6, TABLE IA CHANGED TO TABLE II.
PARAGRAPH 3.7, TABLE III CHANGED TO TABLE IV.
PARAGRAPH 3.9, TABLE II CHANGED TO TABLE III.
PARAGRAPH 3.10.3, ADDED “DEVICE OPTIONS 1, 2, AND 3” TO LINE 1.
PARAGRAPH 3.11.1 WAS CHANGED FROM “…dosage rate of approximately 20 Rads per
second” TO “…dosage rate of less than or equal to 10 Rads per second”.
·
PAGE 5:
PARAGRAPHS 4.1 THROUGH 4.4.2.1 CHANGES WERE DONE TO CLARIFY GROUP SAMPLING.
·
PAGE 6:
PARAGRAPH 4.4.3 CHANGE WAS DONE TO CLARIFY GROUP SAMPLING.
PARAGRAPHS 4.6.2 THROUGH 4.6.4 WERE RE-WRITTEN. THESE DATA PROVIDED, AND DATA
AVAILABLE.
PARAGRAPH 4.6.10 NOTE, ADDED FURTHER EXPLANATION OF MINIMUM DELIVERED DATA.
·
·
·
PAGES 7 THROUGH 17, ALL FIGURE TITLES CHANGED TO HAVE DEVICE OPTIONS AND
PACKAGE TYPES AT TOP OF PAGE, AND HAVE ALL FIGURES AT BOTTOM OF PAGE.
PAGE 8:
CASE OUTLINE REVISED. LEAD DIMENSION CHANGED FROM .068 TO 0.065.
PAGE 9:
CASE OUTLINE UPDATED TO MIL-STD-1835B.
·
·
PAGE 10, MOVED FIGURES TO BETTER FIT THE PAGE.
G
05/19/03
PAGE 9:
CASE OUTLINE DRAWING CHANGED PIN 1 NOTCH MOVED TO INSIDE LEAD LOCATION.
PAGE 4: CHANGED INITIAL RATE OF RADS TO 240 RADS/SEC.
PAGE 5, CHANGED IN BOTH PARAGRAPHS 4.2, 4.3 IN CONJUNCTION TO 3.3 CHANGED TO
3.4 AND PARAGRAPH 4.3 CHANGED 3.1.1 TO 3.1 AND 3.2.1 TO 3.1.1
PAGE 4, PARAGRAPH 3.10.3 ADDED OPTION 3 IS ALLOY 42 FOR FLATPACK.
PAGE 4, PARAGRAPH 3.10.3 CHANGED OPTION 2 TO ALLOY 42 PACKAGE REQUIREMENT.
PAGE 5, PARAGRAPH 3.11.1 CHANGED VERBIAGE.
H
J
03/15/06
10/11/07
·
·
·
·
·
·
·
K
04/29/08
L
05/27/08
PAGE 5, PARAGRAPH 4.4.2 CHANGED VERBIAGE.
PAGE 9, FIGURE 3 NOTE 2 ADDED TO LEAD THICKNESS.
LINEAR TECHNOLOGY CORPORATION
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
1.0
SCOPE:
1.1
This specification defines the performance and test requirements for a microcircuit processed to a space
level manufacturing flow.
2.0
APPLICABLE DOCUMENTS:
2.1 Government Specifications and Standards: the following documents listed in the Department of Defense
Index of Specifications and Standards, of the issue in effect on the date of solicitation, form a part of this
specification to the extent specified herein.
SPECIFICATIONS:
MIL-PRF-38535
MIL-STD-883
MIL-STD-1835
Integrated Circuits (Microcircuits) Manufacturing, General Specification for
Test Method and Procedures for Microcircuits
Microcircuits Case Outlines
2.2
Order of Precedence: In the event of a conflict between the documents referenced herein and the contents
of this specification, the order of precedence shall be this specification, MIL-PRF-38535 and other
referenced specifications.
3.0
REQUIREMENTS:
3.1
3.2
General Description: This specification details the requirements for the RH101A Operational Amplifier,
processed to space level manufacturing flow.
Part Number:
3.2.1 Option 1 – RH101AH (TO5 Metal Can, 8 Leads)
3.2.2 Option 2 – RH101AJ8 (Ceramic Dip, 8 Leads)
3.2.3 Option 3 – RH101AW (Glass Sealed Flatpack, 10 Leads)
Part Marking Includes:
3.3
a.
b.
c.
d.
e.
LTC Logo
LTC Part Number (See Paragraph 3.2)
Date Code
Serial Number
ESD Identifier per MIL-PRF-38535, Appendix A
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
3.4
The Absolute Maximum Ratings:
Supply Voltage
Differential Input Voltage
Input Voltage
Output Short Circuit Duration
Operating Temperature Range
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+22V
+30V
+15V
Indefinite
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B/
C/
-55°C to +125°C
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Maximum Junction Temperature
Storage Temperature Range
Lead Temperature (Soldering, 10 sec)
. . .
+150°C
-65°C to +150°C
+300°C
B/ For supply voltages less than + 15V, the maximum input voltage is equal to the supply voltage.
C/ The output may be shorted to ground or either power supply indefinitely, provided the case
temperature is below +125°C.
3.5
3.6
Electrostatic discharge sensitivity, ESDS, shall be Class 1.
Electrical Performance Characteristics: The electrical performance characteristics shall be as specified in
Table I and Table II.
3.7
3.8
Electrical Test Requirements: Screening requirements shall be in accordance with 4.1 herein,
MIL-STD-883, Method 5004, and as specified in Table IV herein.
Burn-In Requirement:
3.8.1 Option 1 (TO5): Static Burn-In, Figure 7; Dynamic Burn-In, Figure 8
3.8.2 Option 2 (Ceramic Dip): Static Burn-In, Figure 9; Dynamic Burn-In, Figure 10
3.8.3 Option 3 (Glass Sealed Flatpack) : Static Burn-In, Figure 11; Dynamic Burn-In,
Figure 12
3.9
Delta Limit Requirement: Delta limit parameters are specified in Table III herein, are calculated after
each burn-in, and the delta rejects are included in the PDA calculation.
3.10
Design, Construction, and Physical Dimensions: Detail design, construction, physical dimensions, and
electrical requirements shall be specified herein.
3.10.1 Mechanical / Packaging Requirements: Case outlines and dimensions are in accordance with
Figure 1, Figure 2, and Figure 3.
3.10.2 Terminal Connections: The terminal connections shall be as specified in Figure 4, Figure 5, and
Figure 6.
3.10.3 Lead Material and Finish: The lead material and finish for Device Options 1, shall be Kovar and
options 2, 3 are Alloy 42. The lead finishes shall be hot solder dip (Finish letter A) in
accordance with MIL-PRF-38535.
3.11
Radiation Hardness Assurance (RHA):
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
3.11.1 The manufacturer shall perform a lot sample test as an internal process monitor for total dose
radiation tolerance. The sample test is performed with MIL-STD-883 TM1019 Condition A as
a guideline.
3.11.2 For guaranteed radiation performance to MIL-STD-883, Method 1019, total dose irradiation, the
manufacturer will provide certified RAD testing and report through an independent test
laboratory when required as a customer purchase order line item.
3.11.3 Total dose bias circuit is specified in Figure 13.
3.12
3.13
Wafer Lot Acceptance: Wafer lot acceptance shall be in accordance with MIL-PRF-38535, Appendix A,
except for the following: Topside glassivation thickness shall be a minimum of 4KÅ.
Wafer Lot Acceptance Report: SEM is performed per MIL-STD-883, Method 2018 and copies of SEM
photographs shall be supplied with the Wafer Lot Acceptance Report as part of a Space Data Pack when
specified as a customer purchase order line item.
4.0
VERIFICATION (QUALITY ASSURANCE PROVISIONS)
4.1
4.2
4.3
Quality Assurance Provisions: Quality Assurance provisions shall be in accordance with MIL-PRF-38535.
Linear Technology is a QML certified company and all Rad Hard candidates are assembled on qualified
Class S manufacturing lines.
Sampling and Inspection: Sampling and Inspection shall be in accordance with MIL-STD-883, Method
5005 with QML allowed and TRB approved deviations in conjunction with paragraphs 3.1.1, 3.2.1, and
3.4 of the test method.
Screening: Screening requirements shall be in accordance with MIL-STD-883, Method 5004 with QML
allowed and TRB approved deviations in conjunction with paragraphs 3.1, 3.1.1, and 3.4 of the test
method. Electrical testing shall be as specified in Table IV herein.
4.3.1 Analysis of catastrophic (open/short) failures from burn-in will be conducted only when a lot fails
the burn-in or re-burn-in PDA requirements.
4.4
Quality Conformance Inspection: Quality conformance inspection shall be in accordance with 4.2 and 4.3
herein and as follows:
4.4.1 Group A Inspection: Group A inspection shall be performed in accordance with 4.1 herein, per
MIL-STD-883, Method 5005, and specified in Table IV herein.
4.4.2 Group B Inspection: When purchased, a full Group B is performed on an inspection lot. As a
minimum, Subgroups 1-4 plus 6 are performed on every assembly lot, and Subgroup B2
(Resistance to Solvents / Mark Permanency) and Subgroup B3 (Solderability) are performed prior
to the first shipment from any inspection lot and Attributes provided when a Full Space Data Pack
is ordered. Subgroup B5 (Operating Life) is performed on each wafer lot. This subgroup may or
may not be from devices built in the same package style as the current inspection lot. Attributes
and variables data for this subgroup will be provided upon request at no charge.
4.4.2.1 Group B, Subgroup 2c = 10%
Group B, Subgroup 5 = *5%
(*per wafer or inspection lot
Group B, Subgroup 3 = 10%
Group B, Subgroup 4 = 5%
whichever is the larger quantity)
Group B, Subgroup 6 = 15%
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
4.4.2.2 All footnotes pertaining to Table IIa in MIL-STD-883, Method 5005 apply. The quantity
(accept number) of all other subgroups are per MIL-STD-883, Method 5005, Table IIa.
Group D Inspection: When purchased, a full Group D is performed on an inspection lot. As a
minimum, periodic full Group D sampling is performed on each package family for each
assembly location every 26 weeks. A generic Group D Summary is provided when a full Space
Data Pack is ordered.
4.4.3
4.4.3.1 Group D, Subgroups 3, 4 and 5 = 15% each (Sample Size Series).
4.4.3.2 All footnotes pertaining to Table IV in MIL-STD-883, Method 5005 apply. The
quantity (accept number) or sample number and accept number of all other subgroups
are per MIL-STD-883, Method 5005, Table IV.
4.5
Source Inspection:
4.5.1 The manufacturer will coordinate Source Inspection at wafer lot acceptance and pre-seal internal
visual.
4.5.2 The procuring activity has the right to perform source inspection at the supplier’s facility prior to
shipment for each lot of deliverables when specified as a customer purchase order line item. This
may include wafer lot acceptance and final data review.
4.6
Deliverable Data: Deliverable data that will ship with devices when a Space Data Pack is ordered:
4.6.1 Lot Serial Number Sheets identifying all devices accepted through final inspection by serial
number.
4.6.2 100% attributes (completed lot specific traveler; includes Group A Summary)
4.6.3 Burn-In Variables Data and Deltas (if applicable)
4.6.4 Group B2, B3, and B5 Attributes (Variables data, if performed on lot shipping)
4.6.5 Generic Group D data (4.4.3 herein)
4.6.6 SEM photographs (3.13 herein)
4.6.7 Wafer Lot Acceptance Report (3.13 herein)
4.6.8 X-Ray Negatives and Radiographic Report
4.6.9 A copy of outside test laboratory radiation report if ordered
4.6.10 Certificate of Conformance certifying that the devices meet all the requirements of this
specification and have successfully completed the mandatory tests and inspections herein.
Note: Items 4.6.1 and 4.6.10 will be delivered as a minimum, with each shipment. This is
noted on the Purchase Order Review Form as “No Charge Data”.
5.0
Packaging Requirements: Packaging shall be in accordance with Appendix A of MIL-PRF-38535. All devices
shall be packaged in conductive material or packaged in anti-static material with an external conductive field
shielding barrier.
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
DEVICE OPTION # 1
(H) TO5 / 8 LEADS CASE OUTLINE
θja = +150°C/W
θjc = +40°C/W
FIGURE 1
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
DEVICE OPTION # 2
(J8) CERAMIC DIP / 8 LEADS CASE OUTLINE
NOTE: 1. LEAD DIMENSIONS APPLY TO SOLDER DIP OR TIN PLATE LEADS.
2. 8 LEAD D MAX = .405 (10.287)
θja = +110°C/W
θjc = +30°C/W
FIGURE 2
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
DEVICE OPTION # 3
(W10) GLASS SEALED FLATPACK / 10LEADS CASE OUTLINE
NOTE: 1. THIS DIMENSION ALLOWS FOR OFF-
CENTER LID, MENISCUS AND GLASS OVER RUN.
NOTE: 2. INCREASE DIMENSION BY 0.003 INCH
WHEN LEAD FINISH IS APPLIED (SOLDER DIPPED).
θja = +170°C/W
θjc = +40°C/W
FIGURE 3
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
TERMINAL CONNECTIONS
DEVICE OPTION #1, TO5 8 LEAD METAL CAN
DEVICE OPTION #2, 8 LEAD CERAMIC DIP
FIGURE 4
FIGURE 5
DEVICE OPTION #3, GLASS SEALED
10 LEAD FLATPACK
FIGURE 6
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
STATIC BURN-IN CIRCUIT
OPTION 1, TO5 METAL CAN / 8 LEADS
FIGURE 7
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
DYNAMIC BURN-IN CIRCUIT
OPTION 1, TO5 METAL CAN / 8 LEADS
FIGURE 8
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
STATIC BURN-IN CIRCUIT
OPTION #2, CERDIP / 8 LEADS
FIGURE 9
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
DYNAMIC BURN-IN CIRCUIT
OPTION 2, CERDIP / 8 LEADS
FIGURE 10
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
STATIC BURN-IN CIRCUIT
OPTION 3, GLASS SEALED FLATPACK / 10 LEAD
FIGURE 11
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
DYNAMIC BURN-IN CIRCUIT
OPTION 3, GLASS SEALED FLATPACK / 10 LEAD
FIGURE 12
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
TOTAL DOSE BIAS CIRCUIT
FIGURE 13
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
TABLE I: ELECTRICAL CHARACTERISTICS (PRE-IRRADIATION) NOTE A
TABLE II: ELECTRICAL CHARACTERISTICS (POST-IRRADIATION) NOTE E
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SPEC NO. 05-08-5015 REV. L
RH101A, OPERATIONAL AMPLIFIER
TABLE III: POST BURN-IN ENDPOINTS AND DELTA LIMIT REQUIREMENTS
T = 25°C
A
ENDPOINT LIMIT
DELTA
PARAMETER
MIN
MAX
2.0
+75
+75
MIN
-0.5
-7.5
-7.5
MAX
0.5
7.5
UNITS
mV
nA
VOS
+IIB
-IIB
-2.0
+1.0
+1.0
7.5
nA
TABLE IV: ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
FINAL ELECTRICAL TEST REQUIREMENTS (METHOD
5004)
SUBGROUP
1*, 2, 3, 4, 5, 6
GROUP A TEST REQUIREMENTS (METHOD 5005)
GROUP B AND D FOR CLASS S ENDPOINT ELECTRICAL
PARAMETERS (METHOD 5005)
1, 2, 3, 4, 5, 6
1, 2, 3
*PDA APPLIES TO SUBGROUP 1.
PDA TEST NOTE: The PDA is specified as 5% based on failures from Group A, Subgroup 1, tests after cooldown as the
final electrical test in accordance with method 5004 of MIL-STD-883. The verified failures of Group A, Subgroup 1 and
delta rejects after burn-in divided by the total number of devices submitted for burn-in in that lot shall be used to determine
the percent for the lot.
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