IRFU4105ZPBF [INFINEON]

AUTOMOTIVE MOSFET; 汽车MOSFET
IRFU4105ZPBF
型号: IRFU4105ZPBF
厂家: Infineon    Infineon
描述:

AUTOMOTIVE MOSFET
汽车MOSFET

晶体 晶体管 功率场效应晶体管 开关 脉冲 局域网
文件: 总11页 (文件大小:267K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PD - 95374A  
IRFR4105ZPbF  
AUTOMOTIVE MOSFET  
IRFU4105ZPbF  
HEXFET® Power MOSFET  
Features  
l
l
l
l
l
l
Advanced Process Technology  
D
Ultra Low On-Resistance  
175°C Operating Temperature  
Fast Switching  
Repetitive Avalanche Allowed up to Tjmax  
Lead-Free  
VDSS = 55V  
R
DS(on) = 24.5mΩ  
G
ID = 30A  
S
Description  
Specifically designed for Automotive applications, this HEXFET®  
Power MOSFET utilizes the latest processing techniques to  
achieve extremely low on-resistance per silicon area. Additional  
features of this design are a 175°C junction operating tempera-  
ture, fast switching speed and improved repetitive avalanche  
rating . These features combine to make this design an extremely  
efficientandreliabledeviceforuseinAutomotiveapplicationsand  
a wide variety of other applications.  
D-Pak  
IRFR4105Z  
I-Pak  
IRFU4105Z  
Absolute Maximum Ratings  
Parameter  
Max.  
30  
Units  
(Silicon Limited)  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
I
I
I
@ T = 25°C  
C
D
D
@ T = 100°C  
C
21  
A
120  
48  
DM  
P
@T = 25°C  
Power Dissipation  
C
W
D
Linear Derating Factor  
Gate-to-Source Voltage  
Single Pulse Avalanche Energy  
0.32  
± 20  
W/°C  
V
V
GS  
EAS (Thermally limited)  
29  
mJ  
Single Pulse Avalanche Energy Tested Value  
Avalanche Current  
EAS (Tested )  
46  
IAR  
See Fig.12a, 12b, 15, 16  
A
Repetitive Avalanche Energy  
EAR  
mJ  
T
J
Operating Junction and  
-55 to + 175  
T
Storage Temperature Range  
°C  
STG  
Soldering Temperature, for 10 seconds  
Mounting Torque, 6-32 or M3 screw  
300 (1.6mm from case )  
10 lbf in (1.1N m)  
Thermal Resistance  
Parameter  
Typ.  
–––  
–––  
–––  
Max.  
3.12  
40  
Units  
Rθ  
Rθ  
Rθ  
Junction-to-Case  
Junction-to-Ambient (PCB mount)  
JC  
JA  
JA  
°C/W  
Junction-to-Ambient  
110  
HEXFET® is a registered trademark of International Rectifier.  
www.irf.com  
1
12/06/04  
IRFR/U4105ZPbF  
Electrical Characteristics @ TJ = 25°C (unless otherwise specified)  
Parameter  
Drain-to-Source Breakdown Voltage  
Min. Typ. Max. Units  
55 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
V(BR)DSS  
V
V(BR)DSS/ TJ  
Breakdown Voltage Temp. Coefficient ––– 0.053 ––– V/°C Reference to 25°C, ID = 1mA  
m
RDS(on)  
VGS(th)  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
–––  
2.0  
19  
–––  
–––  
–––  
–––  
–––  
–––  
18  
24.5  
4.0  
VGS = 10V, ID = 18A  
V
VDS = VGS, ID = 250µA  
VDS = 15V, ID = 18A  
gfs  
Forward Transconductance  
16  
–––  
20  
S
IDSS  
Drain-to-Source Leakage Current  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
µA VDS = 55V, VGS = 0V  
VDS = 55V, VGS = 0V, TJ = 125°C  
nA VGS = 20V  
250  
200  
-200  
27  
IGSS  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Total Gate Charge  
VGS = -20V  
Qg  
Qgs  
Qgd  
td(on)  
tr  
ID = 18A  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Turn-On Delay Time  
5.3  
7.0  
10  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
nC VDS = 44V  
VGS = 10V  
VDD = 28V  
Rise Time  
40  
ID = 18A  
td(off)  
tf  
Turn-Off Delay Time  
26  
ns RG = 24.5  
VGS = 10V  
Fall Time  
24  
LD  
Internal Drain Inductance  
4.5  
Between lead,  
D
nH 6mm (0.25in.)  
from package  
G
LS  
Internal Source Inductance  
–––  
7.5  
–––  
S
and center of die contact  
Ciss  
Input Capacitance  
–––  
–––  
–––  
–––  
–––  
–––  
740  
140  
74  
–––  
–––  
–––  
–––  
–––  
–––  
VGS = 0V  
Coss  
Output Capacitance  
VDS = 25V  
Crss  
Reverse Transfer Capacitance  
Output Capacitance  
pF ƒ = 1.0MHz  
Coss  
450  
110  
180  
VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz  
Coss  
Output Capacitance  
VGS = 0V, VDS = 44V, ƒ = 1.0MHz  
VGS = 0V, VDS = 0V to 44V  
Coss eff.  
Effective Output Capacitance  
Source-Drain Ratings and Characteristics  
Parameter  
Min. Typ. Max. Units  
Conditions  
I
Continuous Source Current  
–––  
–––  
30  
MOSFET symbol  
S
(Body Diode)  
A
showing the  
I
Pulsed Source Current  
–––  
–––  
120  
integral reverse  
SM  
(Body Diode)  
p-n junction diode.  
V
t
Diode Forward Voltage  
–––  
–––  
–––  
–––  
19  
1.3  
29  
21  
V
T = 25°C, I = 18A, V = 0V  
SD  
J
S
GS  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
ns T = 25°C, I = 18A, VDD = 28V  
J F  
rr  
di/dt = 100A/µs  
Q
t
14  
nC  
rr  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
on  
2
www.irf.com  
IRFR/U4105ZPbF  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
VGS  
15V  
10V  
8.0V  
7.0V  
6.0V  
5.5V  
5.0V  
TOP  
TOP  
BOTTOM 4.5V  
BOTTOM 4.5V  
1
4.5V  
60µs PULSE WIDTH  
4.5V  
60µs PULSE WIDTH  
Tj = 25°C  
Tj = 175°C  
0.1  
1
0.1  
1
1
10  
1
100  
1
0.1  
1
1
10  
1
100  
1
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1000  
30  
T
= 175°C  
J
25  
20  
15  
10  
5
100  
10  
1
T
= 175°C  
J
T
= 25°C  
J
T
= 25°C  
J
V
= 25V  
DS  
60µs PULSE WIDTH  
V
= 8.0V  
DS  
380µs PULSE WIDTH  
0
0
4
5
6
7
8
9
10  
0
10  
20  
30  
40  
V
, Gate-to-Source Voltage (V)  
GS  
I
Drain-to-Source Current (A)  
D,  
Fig 3. Typical Transfer Characteristics  
Fig 4. Typical Forward Transconductance  
Vs. Drain Current  
www.irf.com  
3
IRFR/U4105ZPbF  
1200  
20  
16  
12  
8
V
= 0V,  
= C  
f = 1 MHZ  
GS  
I = 18A  
D
C
C
C
+ C , C  
SHORTED  
iss  
gs  
gd  
ds  
V
= 44V  
= C  
DS  
1000  
800  
600  
400  
200  
0
rss  
oss  
gd  
VDS= 28V  
VDS= 11V  
= C + C  
ds  
gd  
Ciss  
4
Coss  
Crss  
FOR TEST CIRCUIT  
SEE FIGURE 13  
0
0
5
10  
15  
20  
25  
30  
1
10  
, Drain-to-Source Voltage (V)  
100  
Q
Total Gate Charge (nC)  
G
V
DS  
Fig 6. Typical Gate Charge Vs.  
Fig 5. Typical Capacitance Vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000.0  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
100.0  
10.0  
1.0  
T
= 175°C  
J
100µsec  
T
= 25°C  
J
1
1msec  
Tc = 25°C  
Tj = 175°C  
10msec  
V
= 0V  
GS  
Single Pulse  
0.1  
0.1  
1
10  
100  
1000  
0.0  
0.5  
1.0  
1.5  
2.0  
V
, Drain-toSource Voltage (V)  
V
, Source-toDrain Voltage (V)  
DS  
SD  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
4
www.irf.com  
IRFR/U4105ZPbF  
2.5  
2.0  
1.5  
1.0  
0.5  
30  
25  
20  
15  
10  
5
I
= 18A  
D
V
= 10V  
GS  
0
-60 -40 -20  
T
0
20 40 60 80 100 120 140 160 180  
25  
50  
75  
100  
125  
150  
175  
, Junction Temperature (°C)  
T
, Junction Temperature (°C)  
J
J
Fig 10. Normalized On-Resistance  
Fig 9. Maximum Drain Current Vs.  
Vs. Temperature  
Case Temperature  
10  
D = 0.50  
1
0.20  
0.10  
0.05  
R1  
R1  
R2  
R2  
R3  
R3  
0.1  
Ri (°C/W) τi (sec)  
0.02  
0.01  
τ
J τJ  
τ
τ
Cτ  
1.100  
1.601  
0.418  
0.000174  
0.000552  
0.007193  
τ
1τ1  
τ
2 τ2  
3τ3  
Ci= τi/Ri  
0.01  
/
SINGLE PULSE  
Notes:  
1. Duty Factor D = t1/t2  
( THERMAL RESPONSE )  
2. Peak Tj = P dm x Zthjc + Tc  
0.001  
1E-006  
1E-005  
0.0001  
, Rectangular Pulse Duration (sec)  
0.001  
0.01  
t
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRFR/U4105ZPbF  
120  
100  
80  
60  
40  
20  
0
15V  
I
D
TOP  
2.0A  
3.5A  
18A  
DRIVER  
L
BOTTOM  
V
DS  
D.U.T  
AS  
R
+
-
G
V
DD  
I
A
2
V0GVS  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
V
(BR)DSS  
t
p
25  
50  
75  
100  
125  
150  
175  
Starting T , Junction Temperature (°C)  
J
I
AS  
Fig 12c. Maximum Avalanche Energy  
Fig 12b. Unclamped Inductive Waveforms  
Vs. Drain Current  
Q
G
10 V  
Q
Q
GD  
GS  
4.5  
4.0  
3.5  
3.0  
2.5  
2.0  
V
G
Charge  
Fig 13a. Basic Gate Charge Waveform  
I
= 250µA  
D
Current Regulator  
Same Type as D.U.T.  
50KΩ  
.2µF  
12V  
.3µF  
+
V
DS  
D.U.T.  
-
V
GS  
-75 -50 -25  
0
25 50 75 100 125 150 175  
3mA  
T , Temperature ( °C )  
J
I
I
D
G
Current Sampling Resistors  
Fig 14. Threshold Voltage Vs. Temperature  
Fig 13b. Gate Charge Test Circuit  
6
www.irf.com  
IRFR/U4105ZPbF  
100  
10  
1
Duty Cycle = Single Pulse  
Allowed avalanche Current vs  
avalanche pulsewidth, tav  
0.01  
assuming  
Tj = 25°C due to  
avalanche losses. Note: In no  
case should Tj be allowed to  
exceed Tjmax  
0.05  
0.10  
0.1  
1.0E-06  
1.0E-05  
1.0E-04  
1.0E-03  
1.0E-02  
1.0E-01  
tav (sec)  
Fig 15. Typical Avalanche Current Vs.Pulsewidth  
Notes on Repetitive Avalanche Curves , Figures 15, 16:  
(For further info, see AN-1005 at www.irf.com)  
1. Avalanche failures assumption:  
Purely a thermal phenomenon and failure occurs at a  
temperature far in excess of Tjmax. This is validated for  
every part type.  
2. Safe operation in Avalanche is allowed as long asTjmax is  
not exceeded.  
3. Equation below based on circuit and waveforms shown in  
Figures 12a, 12b.  
4. PD (ave) = Average power dissipation per single  
avalanche pulse.  
5. BV = Rated breakdown voltage (1.3 factor accounts for  
voltage increase during avalanche).  
6. Iav = Allowable avalanche current.  
30  
25  
20  
15  
10  
5
TOP  
BOTTOM 1% Duty Cycle  
= 18A  
Single Pulse  
I
D
7. T = Allowable rise in junction temperature, not to exceed  
Tjmax (assumed as 25°C in Figure 15, 16).  
tav = Average time in avalanche.  
0
25  
50  
75  
100  
125  
150  
175  
D = Duty cycle in avalanche = tav ·f  
ZthJC(D, tav) = Transient thermal resistance, see figure 11)  
Starting T , Junction Temperature (°C)  
J
PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC  
Fig 16. Maximum Avalanche Energy  
Iav = 2DT/ [1.3·BV·Zth]  
EAS (AR) = PD (ave)·tav  
Vs. Temperature  
www.irf.com  
7
IRFR/U4105ZPbF  
Driver Gate Drive  
P.W.  
P.W.  
Period  
Period  
D =  
D.U.T  
+
*
=10V  
V
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
Reverse  
Recovery  
Current  
‚
Body Diode Forward  
„
Current  
-
+
di/dt  
-
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
VDD  
Re-Applied  
Voltage  
dv/dt controlled by RG  
RG  
+
-
Body Diode  
Forward Drop  
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel  
HEXFET® Power MOSFETs  
RD  
VDS  
VGS  
D.U.T.  
RG  
+VDD  
-
10V  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
Fig 18a. Switching Time Test Circuit  
V
DS  
90%  
10%  
V
GS  
t
t
r
t
t
f
d(on)  
d(off)  
Fig 18b. Switching Time Waveforms  
8
www.irf.com  
IRFR/U4105ZPbF  
D-Pak (TO-252AA) Package Outline  
D-Pak (TO-252AA) Part Marking Information  
EXAMPLE: THIS IS AN IRFR120  
PART NUMBER  
WIT H AS S EMB LY  
LOT CODE 1234  
INTERNATIONAL  
RECTIFIER  
LOGO  
DATE CODE  
YEAR 9 = 1999  
WE E K 16  
IRFU120  
916A  
AS S E MBLE D ON WW 16, 1999  
IN THE ASSEMBLY LINE "A"  
12  
34  
LINE A  
Note: "P" in assembly line position  
AS S E MB L Y  
LOT CODE  
indicates "Lead-F ree"  
OR  
PART NUMBER  
DAT E CODE  
P = DE S IGNAT E S L E AD-F RE E  
PRODUCT (OPTIONAL)  
INTERNATIONAL  
RECTIFIER  
LOGO  
IRFU120  
12 34  
YEAR 9 = 1999  
AS S E MB L Y  
LOT CODE  
WE E K 16  
A = AS S E MB L Y S I T E CODE  
www.irf.com  
9
IRFR/U4105ZPbF  
I-Pak (TO-251AA) Package Outline  
Dimensions are shown in millimeters (inches)  
I-Pak (TO-251AA) Part Marking Information  
PART NUMBER  
EXAMPLE: THIS IS AN IRFU120  
INTERNATIONAL  
WIT H AS S EMBL Y  
DAT E CODE  
YEAR 9 = 1999  
WE E K 19  
RECTIFIER  
LOGO  
IRFU120  
919A  
78  
LOT CODE 5678  
ASS EMBLED ON WW 19, 1999  
IN THE ASSEMBLY LINE "A"  
56  
LINE A  
AS S E MB L Y  
LOT CODE  
Note: "P" in assembly line  
pos ition indi cates "Lead-F ree"  
OR  
PART NUMBER  
DAT E CODE  
INTERNATIONAL  
RECTIFIER  
LOGO  
IRFU120  
56 78  
P = DESIGNATES LEAD-FREE  
PRODUCT (OPTIONAL)  
YEAR 9 = 1999  
AS S E MB LY  
LOT CODE  
WEEK 19  
A = AS S E MB L Y S I T E CODE  
10  
www.irf.com  
IRFR/U4105ZPbF  
D-Pak (TO-252AA) Tape & Reel Information  
Dimensions are shown in millimeters (inches)  
TR  
TRL  
TRR  
16.3 ( .641 )  
15.7 ( .619 )  
16.3 ( .641 )  
15.7 ( .619 )  
12.1 ( .476 )  
11.9 ( .469 )  
8.1 ( .318 )  
7.9 ( .312 )  
FEED DIRECTION  
FEED DIRECTION  
NOTES :  
1. CONTROLLING DIMENSION : MILLIMETER.  
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).  
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
13 INCH  
16 mm  
NOTES :  
1. OUTLINE CONFORMS TO EIA-481.  
Notes:  
„ Coss eff. is a fixed capacitance that gives the same charging time  
 Repetitive rating; pulse width limited by  
max. junction temperature. (See fig. 11).  
‚ Limited by TJmax, starting TJ = 25°C, L = 0.18mH  
as Coss while VDS is rising from 0 to 80% VDSS  
.
†
‡
Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive  
avalanche performance.  
RG = 25, IAS = 18A, VGS =10V. Part not  
recommended for use above this value.  
This value determined from sample failure population. 100%  
tested to this value in production.  
ƒ Pulse width 1.0ms; duty cycle 2%.  
When mounted on 1" square PCB (FR-4 or G-10 Material) .  
For recommended footprint and soldering techniques refer to  
application note #AN-994  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Automotive [Q101] market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.12/04  
www.irf.com  
11  

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