IRFS4115TRR [INFINEON]

Power Field-Effect Transistor, 99A I(D), 150V, 0.0121ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, PLASTIC, D2PAK-3;
IRFS4115TRR
型号: IRFS4115TRR
厂家: Infineon    Infineon
描述:

Power Field-Effect Transistor, 99A I(D), 150V, 0.0121ohm, 1-Element, N-Channel, Silicon, Metal-oxide Semiconductor FET, TO-263AB, PLASTIC, D2PAK-3

文件: 总9页 (文件大小:286K)
中文:  中文翻译
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PD - 96198A  
IRFS4115PbF  
IRFSL4115PbF  
HEXFET® Power MOSFET  
Applications  
l High Efficiency Synchronous Rectification in SMPS  
D
VDSS  
RDS(on) typ.  
150V  
10.3m  
12.1m  
99A  
l Uninterruptible Power Supply  
l High Speed Power Switching  
l Hard Switched and High Frequency Circuits  
max.  
G
ID  
(Silicon Limited)  
Benefits  
ID (Package Limited)  
195A  
S
l Improved Gate, Avalanche and Dynamic dV/dt  
Ruggedness  
l Fully Characterized Capacitance and Avalanche  
D
SOA  
D
l Enhanced body diode dV/dt and dI/dt Capability  
l Lead-Free  
S
S
D
G
G
D2Pak  
IRFS4115PbF  
TO-262  
IRFSL4115PbF  
G
D
S
Gate  
Drain  
Source  
Absolute Maximum Ratings  
Symbol  
ID @ TC = 25°C  
ID @ TC = 100°C  
ID @ TC = 25°C  
IDM  
Parameter  
Max.  
99  
Units  
Continuous Drain Current, VGS @ 10V (Silicon Limited)  
Continuous Drain Current, VGS @ 10V (Silicon Limited)  
Continuous Drain Current, VGS @ 10V (Wire Bond Limited)  
Pulsed Drain Current  
70  
A
195  
396  
375  
2.5  
PD @TC = 25°C  
W
Maximum Power Dissipation  
Linear Derating Factor  
W/°C  
V
VGS  
± 20  
18  
Gate-to-Source Voltage  
Peak Diode Recovery  
dv/dt  
TJ  
V/ns  
-55 to + 175  
Operating Junction and  
TSTG  
Storage Temperature Range  
°C  
300  
Soldering Temperature, for 10 seconds  
(1.6mm from case)  
10lb in (1.1N m)  
Mounting torque, 6-32 or M3 screw  
Avalanche Characteristics  
Single Pulse Avalanche Energy  
EAS (Thermally limited)  
830  
mJ  
A
Avalanche Current  
IAR  
See Fig. 14, 15, 22a, 22b,  
Repetitive Avalanche Energy  
EAR  
mJ  
Thermal Resistance  
Symbol  
Parameter  
Typ.  
–––  
Max.  
0.4  
Units  
Rθ  
Junction-to-Case  
JC  
°C/W  
RθJA  
–––  
40  
Junction-to-Ambient  
www.irf.com  
1
03/09/11  
IRFS/SL4115PbF  
Static @ TJ = 25°C (unless otherwise specified)  
Symbol  
V(BR)DSS  
Parameter  
Min. Typ. Max. Units  
Conditions  
VGS = 0V, ID = 250μA  
Drain-to-Source Breakdown Voltage  
Breakdown Voltage Temp. Coefficient  
Static Drain-to-Source On-Resistance  
Gate Threshold Voltage  
150 ––– –––  
V
Reference to 25°C, ID = 3.5mA  
VGS = 10V, ID = 62A  
V / T  
(BR)DSS Δ  
Δ
––– 0.18 ––– V/°C  
J
RDS(on)  
VGS(th)  
IDSS  
––– 10.3 12.1  
mΩ  
V
VDS = VGS, ID = 250μA  
VDS = 150V, VGS = 0V  
VDS = 150V, VGS = 0V, TJ = 125°C  
VGS = 20V  
3.0  
–––  
5.0  
20  
Drain-to-Source Leakage Current  
––– –––  
μA  
––– ––– 250  
––– ––– 100  
––– ––– -100  
IGSS  
RG  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Internal Gate Resistance  
nA  
VGS = -20V  
–––  
2.3  
–––  
Ω
Dynamic @ TJ = 25°C (unless otherwise specified)  
Conditions  
VDS = 50V, ID = 62A  
Symbol  
gfs  
Qg  
Parameter  
Forward Transconductance  
Total Gate Charge  
Min. Typ. Max. Units  
97  
––– –––  
S
ID = 62A  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
77  
28  
26  
51  
18  
73  
41  
39  
120  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
nC  
VDS = 75V  
Qgs  
Gate-to-Source Charge  
Gate-to-Drain ("Miller") Charge  
Total Gate Charge Sync. (Qg - Qgd)  
Turn-On Delay Time  
VGS = 10V  
Qgd  
ID = 62A, VDS =0V, VGS = 10V  
VDD = 98V  
Qsync  
td(on)  
ns  
ID = 62A  
tr  
Rise Time  
td(off)  
RG = 2.2Ω  
VGS = 10V  
Turn-Off Delay Time  
tf  
Fall Time  
VGS = 0V  
Ciss  
Input Capacitance  
––– 5270 –––  
––– 490 –––  
––– 105 –––  
pF  
VDS = 50V  
Coss  
Output Capacitance  
Crss  
ƒ = 1.0 MHz, See Fig. 5  
VGS = 0V, VDS = 0V to 120V , See Fig. 11  
VGS = 0V, VDS = 0V to 120V  
Reverse Transfer Capacitance  
Coss eff. (ER)  
Coss eff. (TR)  
Effective Output Capacitance (Energy Related) ––– 460 –––  
Effective Output Capacitance (Time Related) ––– 530 –––  
Diode Characteristics  
Conditions  
Symbol  
Parameter  
Min. Typ. Max. Units  
D
IS  
MOSFET symbol  
Continuous Source Current  
––– –––  
99  
A
showing the  
(Body Diode)  
G
ISM  
integral reverse  
p-n junction diode.  
Pulsed Source Current  
(Body Diode)  
––– ––– 396  
A
S
TJ = 25°C, IS = 62A, VGS = 0V  
VSD  
trr  
Diode Forward Voltage  
Reverse Recovery Time  
––– –––  
––– 86  
1.3  
V
TJ = 25°C  
TJ = 125°C  
TJ = 25°C  
TJ = 125°C  
TJ = 25°C  
VR = 130V,  
IF = 62A  
–––  
ns  
––– 110 –––  
––– 300 –––  
––– 450 –––  
Qrr  
Reverse Recovery Charge  
nC  
A
di/dt = 100A/μs  
IRRM  
ton  
Reverse Recovery Current  
Forward Turn-On Time  
–––  
6.5  
–––  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
Notes:  
 Calculated continuous current based on maximum allowable junction  
temperature. Bond wire current limit is 195A. Note that current  
limitations arising from heating of the device leads may occur with  
† Coss eff. (TR) is a fixed capacitance that gives the same charging time  
as Coss while VDS is rising from 0 to 80% VDSS  
‡ Coss eff. (ER) is a fixed capacitance that gives the same energy as  
Coss while VDS is rising from 0 to 80% VDSS  
.
some lead mounting arrangements. (Refer to AN-1140)  
‚ Repetitive rating; pulse width limited by max. junction  
temperature.  
ƒ Recommended max EAS limit, starting TJ = 25°C,  
L = 0.17mH, RG = 25Ω, IAS = 100A, VGS =15V.  
„ ISD 62A, di/dt 1040A/μs, VDD V(BR)DSS, TJ 175°C.  
Pulse width 400μs; duty cycle 2%.  
.
ˆ When mounted on 1" square PCB (FR-4 or G-10 Material). For recom  
mended footprint and soldering techniques refer to application note #AN-994.  
‰ Rθ is measured at TJ approximately 90°C.  
Š RθJC value shown is at time zero.  
2
www.irf.com  
IRFS/SL4115PbF  
1000  
100  
10  
1000  
100  
10  
VGS  
15V  
10V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
5.0V  
VGS  
15V  
10V  
8.0V  
7.0V  
6.5V  
6.0V  
5.5V  
5.0V  
TOP  
TOP  
BOTTOM  
BOTTOM  
5.0V  
1
60μs PULSE WIDTH  
Tj = 175°C  
5.0V  
60μs PULSE WIDTH  
Tj = 25°C  
1
0.1  
0.1  
1
10  
100  
0.1  
1
10  
100  
V
, Drain-to-Source Voltage (V)  
DS  
V
, Drain-to-Source Voltage (V)  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1000  
100  
10  
3.0  
2.5  
2.0  
1.5  
1.0  
0.5  
I
= 62A  
D
V
= 10V  
GS  
T
= 175°C  
J
T
= 25°C  
J
1
V
= 50V  
DS  
60μs PULSE WIDTH  
0.1  
2
4
6
8
10 12 14 16  
-60 -40 -20 0 20 40 60 80 100120140160180  
, Junction Temperature (°C)  
T
J
V
, Gate-to-Source Voltage (V)  
GS  
Fig 4. Normalized On-Resistance vs. Temperature  
Fig 3. Typical Transfer Characteristics  
100000  
10000  
1000  
100  
14.0  
V
= 0V,  
= C  
f = 1 MHZ  
GS  
I
= 62A  
D
C
C
C
+ C , C  
SHORTED  
ds  
iss  
gs  
gd  
V
V
V
= 120V  
= 75V  
= 30V  
DS  
DS  
DS  
12.0  
10.0  
8.0  
= C  
rss  
oss  
gd  
= C + C  
ds  
gd  
C
iss  
C
oss  
6.0  
C
rss  
4.0  
2.0  
10  
0.0  
1
10  
100  
1000  
0
20  
40  
60  
80  
100  
V
, Drain-to-Source Voltage (V)  
Q , Total Gate Charge (nC)  
DS  
G
Fig 5. Typical Capacitance vs. Drain-to-Source Voltage  
Fig 6. Typical Gate Charge vs. Gate-to-Source Voltage  
www.irf.com  
3
IRFS/SL4115PbF  
1000  
10000  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R (on)  
DS  
T
= 175°C  
100  
10  
1
J
100μsec  
1msec  
DC  
T
J
= 25°C  
10msec  
Tc = 25°C  
Tj = 175°C  
Single Pulse  
V
= 0V  
3.0  
GS  
0.1  
1
0.0  
0.5  
V
1.0  
1.5  
2.0  
2.5  
3.5  
1
10  
100  
1000  
, Source-to-Drain Voltage (V)  
V
DS  
, Drain-to-Source Voltage (V)  
SD  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
200  
190  
180  
170  
160  
150  
140  
120  
100  
80  
60  
40  
20  
0
Id = 3.5mA  
-60 -40 -20 0 20 40 60 80 100120140160180  
25  
50  
75  
100  
125  
150  
175  
T
, Temperature ( °C )  
T
, Case Temperature (°C)  
J
C
Fig 9. Maximum Drain Current vs.  
Fig 10. Drain-to-Source Breakdown Voltage  
Case Temperature  
6.0  
5.0  
4.0  
3.0  
2.0  
1.0  
0.0  
6.0  
5.0  
4.0  
3.0  
2.0  
1.0  
I
I
I
= 250μA  
= 1.0mA  
= 1.0A  
D
D
D
-20  
0
20 40 60 80 100 120 140 160  
Drain-to-Source Voltage (V)  
-75 -50 -25  
0
25 50 75 100 125 150 175  
T
, Temperature ( °C )  
J
V
DS,  
Fig 11. Typical COSS Stored Energy  
Fig 12. Threshold Voltage vs. Temperature  
4
www.irf.com  
IRFS/SL4115PbF  
1
0.1  
D = 0.50  
0.20  
0.10  
0.05  
R1  
R1  
R2  
R2  
Ri (°C/W) τi (sec)  
0.01  
0.02  
0.01  
τ
τ
J τJ  
CτC  
0.245  
0.0059149  
τ
τ
1 τ1  
2 τ2  
0.155  
0.0006322  
Ci= τi/Ri  
Ci = τi/Ri  
0.001  
0.0001  
SINGLE PULSE  
( THERMAL RESPONSE )  
Notes:  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthjc + Tc  
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
t
, Rectangular Pulse Duration (sec)  
1
Fig. 13 Maximum Effective Transient Thermal Impedance, Junction-to-Case  
50  
50  
40  
30  
20  
10  
0
I = 62A  
F
I = 42A  
F
V
= 130V  
V
= 130V  
R
R
40  
30  
20  
10  
0
T = 25°C  
T = 25°C  
J
J
T = 125°C  
J
T = 125°C  
J
0
200  
400  
600  
800  
1000  
0
200  
400  
600  
800  
1000  
di /dt (A/μs)  
di /dt (A/μs)  
F
F
Fig. 15 - Typical Recovery Current vs. dif/dt  
Fig. 14 - Typical Recovery Current vs. dif/dt  
2500  
3000  
I = 42A  
I = 62A  
F
F
V
= 130V  
V
= 130V  
R
R
2000  
1500  
1000  
500  
0
2400  
1800  
1200  
600  
0
T = 25°C  
T = 25°C  
J
J
T = 125°C  
J
T = 125°C  
J
0
200  
400  
600  
800  
1000  
0
200  
400  
600  
800  
1000  
di /dt (A/μs)  
di /dt (A/μs)  
F
F
Fig. 16 - Typical Stored Charge vs. dif/dt  
Fig. 17 - Typical Stored Charge vs. dif/dt  
www.irf.com  
5
IRFS/SL4115PbF  
Driver Gate Drive  
P.W.  
P.W.  
Period  
D.U.T  
Period  
D =  
+
*
=10V  
V
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
‚
-
Reverse  
Recovery  
Current  
Body Diode Forward  
„
Current  
di/dt  
-
+
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
VDD  
Re-Applied  
Voltage  
dv/dt controlled by RG  
RG  
+
-
Body Diode  
Forward Drop  
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
Inductor Current  
I
SD  
Ripple  
5%  
* VGS = 5V for Logic Level Devices  
Fig 18. Peak Diode Recovery dv/dt Test Circuit for N-Channel  
HEXFET® Power MOSFETs  
V
(BR)DSS  
15V  
t
p
DRIVER  
+
L
V
DS  
D.U.T  
AS  
R
G
V
DD  
-
I
A
V
2
GS  
Ω
0.01  
t
p
I
AS  
Fig 19b. Unclamped Inductive Waveforms  
Fig 19a. Unclamped Inductive Test Circuit  
RD  
VDS  
V
DS  
90%  
VGS  
D.U.T.  
RG  
+
VDD  
-
VGS  
10%  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
V
GS  
t
t
r
t
t
f
d(on)  
d(off)  
Fig 20a. Switching Time Test Circuit  
Fig 20b. Switching Time Waveforms  
Id  
Current Regulator  
Same Type as D.U.T.  
Vds  
Vgs  
50KΩ  
.2μF  
12V  
.3μF  
+
V
DS  
D.U.T.  
-
Vgs(th)  
V
GS  
3mA  
I
I
D
G
Qgs1  
Qgs2  
Qgd  
Qgodr  
Current Sampling Resistors  
Fig 21a. Gate Charge Test Circuit  
Fig 21b. Gate Charge Waveform  
6
www.irf.com  
IRFS/SL4115PbF  
D2Pak (TO-263AB) Package Outline  
Dimensions are shown in millimeters (inches)  
D2Pak (TO-263AB) Part Marking Information  
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
www.irf.com  
7
IRFS/SL4115PbF  
TO-262 Package Outline  
Dimensions are shown in millimeters (inches)  
TO-262 Part Marking Information  
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
8
www.irf.com  
IRFS/SL4115PbF  
D2Pak (TO-263AB) Tape & Reel Information  
Dimensions are shown in millimeters (inches)  
TRR  
1.60 (.063)  
1.50 (.059)  
1.60 (.063)  
1.50 (.059)  
4.10 (.161)  
3.90 (.153)  
0.368 (.0145)  
0.342 (.0135)  
FEED DIRECTION  
1.85 (.073)  
11.60 (.457)  
11.40 (.449)  
1.65 (.065)  
24.30 (.957)  
23.90 (.941)  
15.42 (.609)  
15.22 (.601)  
TRL  
1.75 (.069)  
1.25 (.049)  
10.90 (.429)  
10.70 (.421)  
4.72 (.136)  
4.52 (.178)  
16.10 (.634)  
15.90 (.626)  
FEED DIRECTION  
13.50 (.532)  
12.80 (.504)  
27.40 (1.079)  
23.90 (.941)  
4
330.00  
(14.173)  
MAX.  
60.00 (2.362)  
MIN.  
30.40 (1.197)  
MAX.  
NOTES :  
1. COMFORMS TO EIA-418.  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSION MEASURED @ HUB.  
4. INCLUDES FLANGE DISTORTION @ OUTER EDGE.  
26.40 (1.039)  
24.40 (.961)  
4
3
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information. 03/2011  
www.irf.com  
9

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