IRFR3707ZPBFTRR [INFINEON]

Transistor;
IRFR3707ZPBFTRR
型号: IRFR3707ZPBFTRR
厂家: Infineon    Infineon
描述:

Transistor

文件: 总11页 (文件大小:363K)
中文:  中文翻译
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PD - 95443B  
IRFR3707ZPbF  
IRFU3707ZPbF  
Applications  
HEXFET® Power MOSFET  
l High Frequency Synchronous Buck  
Converters for Computer Processor Power  
l High Frequency Isolated DC-DC  
Converters with Synchronous Rectification  
for Telecom and Industrial Use  
VDSS RDS(on) max  
Qg  
9.5m  
30V  
9.6nC  
l Lead-Free  
Benefits  
l Very Low RDS(on) at 4.5V VGS  
l Ultra-Low Gate Impedance  
l Fully Characterized Avalanche Voltage  
and Current  
D-Pak  
IRFR3707ZPbF  
I-Pak  
IRFU3707ZPbF  
Absolute Maximum Ratings  
Parameter  
Max.  
Units  
VDS  
V
30  
Drain-to-Source Voltage  
V
± 20  
Gate-to-Source Voltage  
GS  
I
I
I
@ TC = 25°C  
A
56  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
D
D
@ TC = 100°C  
39  
220  
DM  
P
P
@TC = 25°C  
W
50  
25  
Maximum Power Dissipation  
Maximum Power Dissipation  
Linear Derating Factor  
D
D
@TC = 100°C  
0.33  
W/°C  
°C  
T
-55 to + 175  
Operating Junction and  
J
T
Storage Temperature Range  
Soldering Temperature, for 10 seconds  
STG  
300 (1.6mm from case)  
Thermal Resistance  
Parameter  
Typ.  
–––  
–––  
–––  
Max.  
3.0  
Units  
°C/W  
Rθ  
JC  
JA  
JA  
Junction-to-Case  
Rθ  
Rθ  
50  
Junction-to-Ambient (PCB Mount)  
Junction-to-Ambient  
110  
Notes  through are on page 11  
www.irf.com  
1
05/14/08  
IRFR/U3707ZPbF  
Static @ TJ = 25°C (unless otherwise specified)  
Parameter  
Drain-to-Source Breakdown Voltage  
Min. Typ. Max. Units  
30 ––– –––  
Conditions  
VGS = 0V, ID = 250µA  
BVDSS  
V
∆ΒVDSS/TJ  
RDS(on)  
Breakdown Voltage Temp. Coefficient ––– 0.023 ––– V/°C Reference to 25°C, ID = 1mA  
m
Static Drain-to-Source On-Resistance  
–––  
–––  
7.5  
10  
9.5  
VGS = 10V, ID = 15A  
GS = 4.5V, ID = 12A  
12.5  
V
VGS(th)  
Gate Threshold Voltage  
1.35 1.80 2.25  
V
VDS = VGS, ID = 25µA  
VGS(th)/TJ  
IDSS  
Gate Threshold Voltage Coefficient  
Drain-to-Source Leakage Current  
–––  
–––  
–––  
–––  
–––  
71  
-5.0  
–––  
–––  
–––  
–––  
–––  
9.6  
2.6  
0.90  
3.5  
2.6  
4.4  
5.8  
8.0  
11  
––– mV/°C  
1.0  
150  
100  
-100  
–––  
14  
µA VDS = 24V, VGS = 0V  
VDS = 24V, VGS = 0V, TJ = 125°C  
nA VGS = 20V  
IGSS  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Forward Transconductance  
Total Gate Charge  
V
GS = -20V  
gfs  
Qg  
S
VDS = 15V, ID = 12A  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
Qgs1  
Qgs2  
Qgd  
Qgodr  
Qsw  
Qoss  
td(on)  
tr  
Pre-Vth Gate-to-Source Charge  
Post-Vth Gate-to-Source Charge  
Gate-to-Drain Charge  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
V
DS = 15V  
GS = 4.5V  
nC  
V
ID = 12A  
Gate Charge Overdrive  
Switch Charge (Qgs2 + Qgd)  
See Fig. 16  
Output Charge  
nC VDS = 15V, VGS = 0V  
DD = 16V, VGS = 4.5V  
Turn-On Delay Time  
Rise Time  
V
ID = 12A  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
12  
ns Clamped Inductive Load  
3.3  
Ciss  
Coss  
Crss  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
––– 1150 –––  
VGS = 0V  
–––  
–––  
260  
120  
–––  
–––  
pF  
VDS = 15V  
ƒ = 1.0MHz  
Avalanche Characteristics  
Parameter  
Typ.  
–––  
–––  
–––  
Max.  
Units  
mJ  
A
Single Pulse Avalanche Energy  
EAS  
IAR  
42  
12  
Avalanche Current  
Repetitive Avalanche Energy  
EAR  
5.0  
mJ  
Diode Characteristics  
Parameter  
Min. Typ. Max. Units  
Conditions  
MOSFET symbol  
D
S
56  
IS  
–––  
–––  
Continuous Source Current  
(Body Diode)  
A
showing the  
integral reverse  
G
ISM  
–––  
–––  
220  
Pulsed Source Current  
(Body Diode)  
p-n junction diode.  
VSD  
trr  
–––  
–––  
–––  
–––  
25  
1.0  
38  
26  
V
T = 25°C, I = 12A, V = 0V  
Diode Forward Voltage  
Reverse Recovery Time  
Reverse Recovery Charge  
Forward Turn-On Time  
J S GS  
ns T = 25°C, I = 12A, VDD = 15V  
J
F
Qrr  
ton  
di/dt = 100A/µs  
17  
nC  
Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)  
2
www.irf.com  
IRFR/U3707ZPbF  
10000  
1000  
100  
10  
1000  
100  
10  
VGS  
10V  
VGS  
10V  
TOP  
TOP  
6.0V  
4.5V  
4.0V  
3.3V  
2.8V  
2.5V  
2.2V  
6.0V  
4.5V  
4.0V  
3.3V  
2.8V  
2.5V  
2.2V  
BOTTOM  
BOTTOM  
1
2.2V  
0.1  
1
2.2V  
0.01  
0.001  
20µs PULSE WIDTH  
Tj = 175°C  
20µs PULSE WIDTH  
Tj = 25°C  
0.1  
0.1  
1
10  
0.1  
1
10  
V
, Drain-to-Source Voltage (V)  
V
, Drain-to-Source Voltage (V)  
DS  
DS  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Output Characteristics  
1000  
2.0  
1.5  
1.0  
0.5  
I
= 30A  
D
V
= 10V  
GS  
100  
10  
T
= 175°C  
J
1
T = 25°C  
J
0.1  
0.01  
V
= 10V  
DS  
20µs PULSE WIDTH  
0
2
4
6
8
-60 -40 -20  
T
0
20 40 60 80 100 120 140 160 180  
V
, Gate-to-Source Voltage (V)  
, Junction Temperature (°C)  
GS  
J
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance  
vs. Temperature  
www.irf.com  
3
IRFR/U3707ZPbF  
10000  
6.0  
5.0  
4.0  
3.0  
2.0  
1.0  
0.0  
V
= 0V,  
= C  
f = 1 MHZ  
GS  
I = 12A  
D
C
C
C
+ C , C  
SHORTED  
iss  
gs  
gd  
ds  
= C  
V
V
= 24V  
= 15V  
rss  
oss  
gd  
= C + C  
DS  
DS  
ds  
gd  
C
iss  
1000  
C
oss  
C
rss  
V
100  
1
10  
100  
0
2
4
6
8
10  
12  
, Drain-to-Source Voltage (V)  
DS  
Q
Total Gate Charge (nC)  
G
Fig 6. Typical Gate Charge vs.  
Fig 5. Typical Capacitance vs.  
Gate-to-Source Voltage  
Drain-to-Source Voltage  
1000.00  
100.00  
10.00  
1.00  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
T
= 175°C  
J
100µsec  
1msec  
T = 25°C  
J
1
10msec  
Tc = 25°C  
Tj = 175°C  
V
= 0V  
Single Pulse  
GS  
0.10  
0.1  
0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0 2.2  
, Source-to-Drain Voltage (V)  
0
1
10  
100  
1000  
V
V
, Drain-to-Source Voltage (V)  
SD  
DS  
Fig 8. Maximum Safe Operating Area  
Fig 7. Typical Source-Drain Diode  
Forward Voltage  
4
www.irf.com  
IRFR/U3707ZPbF  
2.5  
2.0  
1.5  
1.0  
60  
50  
40  
30  
20  
10  
0
Limited By Package  
I
= 250µA  
D
-75 -50 -25  
0
25 50 75 100 125 150 175 200  
, Temperature ( °C )  
25  
50  
75  
100  
125  
150  
175  
T
J
T
, Case Temperature (°C)  
C
Fig 9. Maximum Drain Current vs.  
Fig 10. Threshold Voltage vs. Temperature  
Case Temperature  
10  
D = 0.50  
1
0.20  
0.10  
0.05  
R1  
R1  
R2  
R2  
R3  
R3  
Ri (°C/W) τi (sec)  
0.1  
0.01  
τ
J τJ  
τ
τ
0.823  
1.698  
0.481  
0.000128  
0.000845  
0.016503  
Cτ  
0.02  
0.01  
τ
1τ1  
τ
2 τ2  
3τ3  
Ci= τi/Ri  
Ci= τi/Ri  
SINGLE PULSE  
( THERMAL RESPONSE )  
Notes:  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthjc + Tc  
0.001  
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
t
, Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case  
www.irf.com  
5
IRFR/U3707ZPbF  
15V  
200  
180  
160  
140  
120  
100  
80  
I
D
TOP  
3.7A  
5.6A  
DRIVER  
L
V
DS  
BOTTOM 12A  
D.U.T  
AS  
R
+
-
G
V
DD  
I
A
2VGS  
0.01  
t
p
Fig 12a. Unclamped Inductive Test Circuit  
60  
40  
V
(BR)DSS  
20  
t
p
0
25  
50  
75  
100  
125  
150  
175  
Starting T , Junction Temperature (°C)  
J
Fig 12c. Maximum Avalanche Energy  
vs. Drain Current  
LD  
I
AS  
VDS  
Fig 12b. Unclamped Inductive Waveforms  
+
-
VDD  
D.U.T  
Current Regulator  
Same Type as D.U.T.  
VGS  
Pulse Width < 1µs  
Duty Factor < 0.1%  
50KΩ  
.2µF  
12V  
.3µF  
Fig 14a. Switching Time Test Circuit  
VDS  
+
V
DS  
D.U.T.  
-
90%  
V
GS  
3mA  
10%  
VGS  
I
I
D
G
Current Sampling Resistors  
td(on)  
td(off)  
tr  
tf  
Fig 13. Gate Charge Test Circuit  
Fig 14b. Switching Time Waveforms  
6
www.irf.com  
IRFR/U3707ZPbF  
Driver Gate Drive  
P.W.  
Period  
D.U.T  
Period  
D =  
P.W.  
+
*
=10V  
V
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
‚
-
Reverse  
Recovery  
Current  
Body Diode Forward  
„
Current  
di/dt  
-
+
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
VDD  
Re-Applied  
Voltage  
dv/dt controlled by RG  
RG  
+
-
Body Diode  
Forward Drop  
Driver same type as D.U.T.  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
Inductor Curent  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
Fig 15. Peak Diode Recovery dv/dt Test Circuit for N-Channel  
HEXFET® Power MOSFETs  
Id  
Vds  
Vgs  
Vgs(th)  
Qgs1  
Qgs2  
Qgd  
Qgodr  
Fig 16. Gate Charge Waveform  
www.irf.com  
7
IRFR/U3707ZPbF  
Power MOSFET Selection for Non-Isolated DC/DC Converters  
Synchronous FET  
Control FET  
The power loss equation for Q2 is approximated  
by;  
Special attention has been given to the power losses  
in the switching elements of the circuit - Q1 and Q2.  
Power losses in the high side switch Q1, also called  
the Control FET, are impacted by the Rds(on) of the  
MOSFET, but these conduction losses are only about  
one half of the total losses.  
P = P  
+ P + P*  
loss  
conduction  
drive  
output  
P = Irms 2 × Rds(on)  
loss ( )  
Power losses in the control switch Q1 are given  
by;  
+ Q × V × f  
(
)
g
g
Qoss  
Ploss = Pconduction+ Pswitching+ Pdrive+ Poutput  
+
×V × f + Q × V × f  
(
)
in  
rr  
in  
2  
This can be expanded and approximated by;  
*dissipated primarily in Q1.  
P
= I 2 × Rds(on )  
(
)
loss  
rms  
For the synchronous MOSFET Q2, Rds(on) is an im-  
portant characteristic; however, once again the im-  
portance of gate charge must not be overlooked since  
it impacts three critical areas. Under light load the  
MOSFET must still be turned on and off by the con-  
trol IC so the gate drive losses become much more  
significant. Secondly, the output charge Qoss and re-  
verse recovery charge Qrr both generate losses that  
are transfered to Q1 and increase the dissipation in  
that device. Thirdly, gate charge will impact the  
MOSFETs’ susceptibility to Cdv/dt turn on.  
Qgd  
ig  
Qgs2  
ig  
+ I ×  
× V × f + I ×  
× V × f  
in  
in  
+ Q × V × f  
(
)
g
g
Qoss  
+
×V × f  
in  
2
This simplified loss equation includes the terms Qgs2  
The drain of Q2 is connected to the switching node  
of the converter and therefore sees transitions be-  
tween ground and Vin. As Q1 turns on and off there is  
a rate of change of drain voltage dV/dt which is ca-  
pacitively coupled to the gate of Q2 and can induce  
a voltage spike on the gate that is sufficient to turn  
the MOSFET on, resulting in shoot-through current .  
The ratio of Qgd/Qgs1 must be minimized to reduce the  
potential for Cdv/dt turn on.  
and Qoss which are new to Power MOSFETdata sheets.  
Qgs2 is a sub element of traditional gate-source  
charge that is included in all MOSFET data sheets.  
The importance of splitting this gate-source charge  
into two sub elements, Qgs1 and Qgs2, can be seen from  
Fig 16.  
Qgs2 indicates the charge that must be supplied by  
the gate driver between the time that the threshold  
voltage has been reached and the time the drain cur-  
rent rises to Idmax at which time the drain voltage be-  
gins to change. Minimizing Qgs2 is a critical factor in  
reducing switching losses in Q1.  
Qoss is the charge that must be supplied to the out-  
put capacitance of the MOSFET during every switch-  
ing cycle. Figure A shows how Qoss is formed by the  
parallel combination of the voltage dependant (non-  
linear) capacitance’s Cds and Cdg when multiplied by  
the power supply input buss voltage.  
Figure A: Qoss Characteristic  
8
www.irf.com  
IRFR/U3707ZPbF  
D-Pak (TO-252AA) Package Outline  
D-Pak (TO-252AA) Part Marking Information  
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
www.irf.com  
9
IRFR/U3707ZPbF  
I-Pak (TO-251AA) Package Outline (Dimensions are shown in millimeters (inches)  
I-Pak (TO-251AA) Part Marking Information  
OR  
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
10  
www.irf.com  
IRFR/U3707ZPbF  
D-Pak (TO-252AA) Tape & Reel Information  
Dimensions are shown in millimeters (inches)  
TR  
TRL  
TRR  
16.3 ( .641 )  
15.7 ( .619 )  
16.3 ( .641 )  
15.7 ( .619 )  
12.1 ( .476 )  
11.9 ( .469 )  
8.1 ( .318 )  
7.9 ( .312 )  
FEED DIRECTION  
FEED DIRECTION  
NOTES :  
1. CONTROLLING DIMENSION : MILLIMETER.  
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).  
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
13 INCH  
16 mm  
NOTES :  
1. OUTLINE CONFORMS TO EIA-481.  
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
Notes:  
 Repetitive rating; pulse width limited by  
max. junction temperature.  
‚ Starting TJ = 25°C, L = 0.58mH, RG = 25,  
IAS = 12A.  
„ Calculated continuous current based on maximum allowable  
junction temperature. Package limitation current is 30A.  
When mounted on 1" square PCB (FR-4 or G-10 Material).  
For recommended footprint and soldering techniques refer to  
application note #AN-994.  
ƒ Pulse width 400µs; duty cycle 2%.  
Data and specifications subject to change without notice.  
This product has been designed and qualified for the Industrial market.  
Qualification Standards can be found on IR’s Web site.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information. 05/2008  
www.irf.com  
11  

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