IRF9310 [INFINEON]

-30V 单个 P 通道 HEXFET Power MOSFET, 采用 SO-8 封装;
IRF9310
型号: IRF9310
厂家: Infineon    Infineon
描述:

-30V 单个 P 通道 HEXFET Power MOSFET, 采用 SO-8 封装

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PD - 97437A  
IRF9310PbF  
HEXFET® Power MOSFET  
VDS  
-30  
4.6  
V
RDS(on) max  
(@VGS = 10V)  
m
ID  
-20  
A
(@TA = 25°C)  
SO-8  
Applications  
Charge and Discharge Switch for Notebook PC Battery Application  
Features and Benefits  
Resulting Benefits  
Features  
Low RDSon (4.6mΩ)  
Lower Conduction Losses  
Multi-Vendor Compatibility  
Environmentally Friendlier  
results in  
Industry-Standard SO8 Package  
RoHS Compliant Containing no Lead, no Bromide and no Halogen  
Orderable part number  
Package Type  
Standard Pack  
Note  
Form  
Tube/Bulk  
Quantity  
95  
IRF9310PbF  
IRF9310TRPbF  
SO8  
SO8  
Tape and Reel  
4000  
Absolute Maximum Ratings  
Max.  
-30  
Parameter  
Units  
VDS  
Drain-to-Source Voltage  
V
± 20  
Gate-to-Source Voltage  
Continuous Drain Current, VGS @ 10V  
Continuous Drain Current, VGS @ 10V  
Pulsed Drain Current  
V
GS  
-20  
I
I
I
@ TA = 25°C  
D
D
-16  
A
@ TA = 70°C  
-160  
DM  
2.5  
P
P
@TA = 25°C  
@TA = 70°C  
Power Dissipation  
D
D
W
W/°C  
°C  
1.6  
Power Dissipation  
0.02  
Linear Derating Factor  
-55 to + 150  
Operating Junction and  
T
T
J
Storage Temperature Range  
STG  
Notes  through are on page 2  
www.irf.com  
1
03/19/2010  
IRF9310PbF  
Static @ TJ = 25°C (unless otherwise specified)  
Conditions  
VGS = 0V, ID = -250µA  
Reference to 25°C, ID = -1mA  
Parameter  
Drain-to-Source Breakdown Voltage  
Min. Typ. Max. Units  
-30 ––– –––  
––– 0.020 ––– V/°C  
BVDSS  
∆Β  
V
V
DSS/ TJ  
Breakdown Voltage Temp. Coefficient  
V
GS = -10V, ID = -20A  
RDS(on)  
–––  
–––  
-1.3  
–––  
–––  
–––  
–––  
–––  
39  
3.9  
5.8  
-1.8  
-5.8  
–––  
–––  
–––  
–––  
–––  
58  
4.6  
6.8  
Static Drain-to-Source On-Resistance  
m
VGS = -4.5V, ID = -16A  
VDS = VGS, ID = -100µA  
VDS = -24V, VGS = 0V  
VGS(th)  
Gate Threshold Voltage  
-2.4  
V
VGS(th)  
Gate Threshold Voltage Coefficient  
Drain-to-Source Leakage Current  
––– mV/°C  
IDSS  
-1.0  
µA  
VDS = -24V, VGS = 0V, TJ = 125°C  
-150  
VGS = -20V  
IGSS  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Forward Transconductance  
Total Gate Charge  
-100  
nA  
V
V
V
GS = 20V  
100  
DS = -10V, ID = -16A  
DS = -15V, VGS = -4.5V, ID = - 16A  
gfs  
Qg  
–––  
–––  
165  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
S
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
nC  
VGS = -10V  
DS = -15V  
Qg  
Total Gate Charge  
110  
17  
V
Qgs  
Qgd  
RG  
td(on)  
tr  
nC  
Gate-to-Source Charge  
Gate-to-Drain Charge  
Gate Resistance  
ID = -16A  
28  
2.8  
25  
VDD = -15V, VGS = -4.5V  
ID = -1.0A  
Turn-On Delay Time  
Rise Time  
47  
ns  
pF  
R
G = 1.8Ω  
See Figs. 20a &20b  
GS = 0V  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
65  
70  
V
Ciss  
Coss  
Crss  
Input Capacitance  
––– 5250 –––  
––– 1300 –––  
VDS = -15V  
ƒ = 1.0MHz  
Output Capacitance  
Reverse Transfer Capacitance  
–––  
880  
–––  
Avalanche Characteristics  
Typ.  
–––  
–––  
Max.  
Parameter  
Units  
mJ  
EAS  
IAR  
630  
-16  
Single Pulse Avalanche Energy  
Avalanche Current  
A
Diode Characteristics  
Conditions  
Parameter  
Min. Typ. Max. Units  
D
S
IS  
MOSFET symbol  
Continuous Source Current  
–––  
–––  
-2.5  
showing the  
(Body Diode)  
A
G
ISM  
integral reverse  
p-n junction diode.  
Pulsed Source Current  
(Body Diode)  
–––  
–––  
-160  
VSD  
trr  
T = 25°C, I = -2.5A, V = 0V  
J S GS  
Diode Forward Voltage  
–––  
–––  
–––  
–––  
71  
-1.2  
107  
18  
V
T = 25°C, I = -2.5A, VDD = -24V  
Reverse Recovery Time  
Reverse Recovery Charge  
ns  
nC  
J
F
Qrr  
di/dt = 100A/µs  
12  
Thermal Resistance  
Typ.  
–––  
–––  
Max.  
20  
Parameter  
Junction-to-Drain Lead  
Junction-to-Ambient  
Units  
RθJL  
RθJA  
°C/W  
50  
Notes:  
 Repetitive rating; pulse width limited by max. junction temperature.  
‚ Starting TJ = 25°C, L = 4.9mH, RG = 25, IAS = -16A.  
ƒ Pulse width 400µs; duty cycle 2%.  
„ When mounted on 1 inch square copper board.  
Rθ is measured at TJ of approximately 90°C.  
† For DESIGN AID ONLY, not subject to production testing.  
2
www.irf.com  
IRF9310PbF  
1000  
100  
10  
1000  
100  
10  
VGS  
-10V  
60µs PULSE WIDTH  
Tj = 25°C  
VGS  
-10V  
60µs PULSE WIDTH  
Tj = 150°C  
TOP  
TOP  
-4.5V  
-3.5V  
-3.1V  
-2.9V  
-2.7V  
-2.5V  
-2.3V  
-4.5V  
-3.5V  
-3.1V  
-2.9V  
-2.7V  
-2.5V  
-2.3V  
BOTTOM  
BOTTOM  
1
0.1  
0.01  
-2.3V  
-2.3V  
1
0.1  
1
10  
100  
0.1  
1
10  
100  
-V , Drain-to-Source Voltage (V)  
-V , Drain-to-Source Voltage (V)  
DS  
DS  
Fig 2. Typical Output Characteristics  
Fig 1. Typical Output Characteristics  
1000  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
I
= -20A  
D
V
= -10V  
GS  
100  
10  
T
= 150°C  
J
T
= 25°C  
J
V
= -10V  
DS  
60µs PULSE WIDTH  
1.0  
1
2
3
4
5
-60 -40 -20  
0
20 40 60 80 100 120140 160  
T
J
, Junction Temperature (°C)  
-V , Gate-to-Source Voltage (V)  
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance vs. Temperature  
100000  
10000  
1000  
14.0  
V
= 0V,  
= C  
f = 1 MHZ  
GS  
I = -16A  
D
C
C
C
+ C , C  
SHORTED  
ds  
iss  
gs  
gd  
12.0  
= C  
rss  
oss  
gd  
= C + C  
V
= -24V  
= -15V  
ds  
gd  
DS  
10.0  
8.0  
6.0  
4.0  
2.0  
0.0  
V
DS  
C
iss  
C
C
oss  
rss  
100  
1
10  
-V , Drain-to-Source Voltage (V)  
100  
0
25  
50  
75  
100  
125  
150  
Q
Total Gate Charge (nC)  
DS  
G
Fig 5. Typical Capacitance vs.Drain-to-Source Voltage  
Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage  
www.irf.com  
3
IRF9310PbF  
1000.00  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R (on)  
DS  
100µsec  
100.00  
1msec  
T
= 150°C  
J
10.00  
1.00  
0.10  
T
= 25°C  
J
1
T
= 25°C  
A
10msec  
10  
Tj = 150°C  
V
= 0V  
GS  
Single Pulse  
0.1  
0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0 1.1  
0.1  
1
100  
-V , Source-to-Drain Voltage (V)  
SD  
-V , Drain-to-Source Voltage (V)  
DS  
Fig 7. Typical Source-Drain Diode Forward Voltage  
Fig 8. Maximum Safe Operating Area  
2.5  
20  
15  
10  
5
2.0  
1.5  
1.0  
I
= -100µA  
D
0
-75 -50 -25  
0
25 50 75 100 125 150  
25  
50  
75  
100  
125  
150  
T
, Temperature ( °C )  
T
, Ambient Temperature (°C)  
J
A
Fig 10. Threshold Voltage vs. Temperature  
Fig 9. Maximum Drain Current vs.  
AmbientTemperature  
100  
D = 0.50  
10  
1
0.20  
0.10  
0.05  
0.02  
0.01  
0.1  
0.01  
0.001  
0.0001  
Notes:  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthja + T  
SINGLE PULSE  
( THERMAL RESPONSE )  
A
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t
, Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient  
4
www.irf.com  
IRF9310PbF  
12  
10  
8
14  
12  
10  
8
I
= -20A  
D
V
= -4.5V  
GS  
T = 125°C  
6
J
6
V
= -10V  
GS  
4
4
T = 25°C  
J
2
2
2
4
6
8
10 12 14 16 18 20  
0
20 40 60 80 100 120 140 160  
-I , Drain Current (A)  
D
-V  
Gate -to -Source Voltage (V)  
GS,  
Fig 13. Typical On-Resistance vs. Drain Current  
Fig 12. On-Resistance vs. Gate Voltage  
1000  
2700  
I
D
2400  
2100  
1800  
1500  
1200  
900  
TOP  
-1.8A  
-2.7A  
BOTTOM -16A  
800  
600  
400  
200  
0
600  
300  
0
1E-5  
1E-4  
1E-3  
1E-2  
1E-1  
1E+0  
25  
50  
75  
100  
125  
150  
Starting T , Junction Temperature (°C)  
Time (sec)  
J
Fig 14. Maximum Avalanche Energy vs. Drain Current  
Fig 16. Typical Power vs. Time  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
D.U.T *  
P.W.  
+
*
=10V  
V
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
Reverse  
Recovery  
Current  
‚
Body Diode Forward  
„
Current  
di/dt  
-
+
-
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
VDD  
di/dt controlled by RG  
Re-Applied  
Voltage  
RG  
+
-
Driver same type as D.U.T.  
Body Diode  
Inductor Current  
Forward Drop  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
* Reverse Polarity of D.U.T for P-Channel  
Fig 17. Diode Reverse Recovery Test Circuit for P-Channel HEXFET® Power MOSFETs  
www.irf.com  
5
IRF9310PbF  
Id  
Vds  
Vgs  
L
VCC  
DUT  
0
Vgs(th)  
20K  
Qgs1  
Qgs2  
Qgodr  
Qgd  
Fig 18a. Gate Charge Test Circuit  
Fig 18b. Gate Charge Waveform  
L
V
DS  
I
AS  
D.U.T  
R
G
V
DD  
I
A
AS  
-VGS  
DRIVER  
0.01  
t
p
t
p
V
(BR)DSS  
15V  
Fig 19b. Unclamped Inductive Waveforms  
Fig 19a. Unclamped Inductive Test Circuit  
RD  
VDS  
t
t
r
t
t
f
d(on)  
d(off)  
VGS  
V
GS  
D.U.T.  
10%  
RG  
-
+
VDD  
-VGS  
90%  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
V
DS  
Fig 20a. Switching Time Test Circuit  
Fig 20b. Switching Time Waveforms  
6
www.irf.com  
IRF9310PbF  
SO-8 Package Outline(Mosfet & Fetky)  
Dimensions are shown in milimeters (inches)  
SO-8 Part Marking Information  
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
www.irf.com  
7
IRF9310PbF  
SO-8 Tape and Reel (Dimensions are shown in milimeters (inches))  
TERMINAL NUMBER 1  
12.3 ( .484 )  
11.7 ( .461 )  
8.1 ( .318 )  
7.9 ( .312 )  
FEED DIRECTION  
NOTES:  
1. CONTROLLING DIMENSION : MILLIMETER.  
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES).  
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
330.00  
(12.992)  
MAX.  
14.40 ( .566 )  
12.40 ( .488 )  
NOTES :  
1. CONTROLLING DIMENSION : MILLIMETER.  
2. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
Qualification Information†  
Consumer ††  
Qualification level  
(per JEDEC JESD47F††† guidelines)  
MSL1  
(per JEDEC J-STD-020D†††  
Moisture Sensitivity Level  
RoHS Compliant  
SO-8  
)
Yes  
†
Qualification standards can be found at International Rectifier’s web site  
http://www.irf.com/product-info/reliability  
††  
Higher qualification ratings may be available should the user have such requirements.  
Please contact your International Rectifier sales representative for further information:  
http://www.irf.com/whoto-call/salesrep/  
††† Applicable version of JEDEC standard at the time of product release.  
Revision History  
Date  
Comment  
3/18/2010  
Figure 16, Power vs. Time curve is modified and updated. All other parameters remain unchanged.  
Data and specifications subject to change without notice.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.03/2010  
8
www.irf.com  
IMPORTANT NOTICE  
The information given in this document shall in no For further information on the product, technology,  
event be regarded as a guarantee of conditions or delivery terms and conditions and prices please  
characteristics (“Beschaffenheitsgarantie”) .  
contact your nearest Infineon Technologies office  
(www.infineon.com).  
With respect to any examples, hints or any typical  
values stated herein and/or any information  
regarding the application of the product, Infineon  
Technologies hereby disclaims any and all  
warranties and liabilities of any kind, including  
without limitation warranties of non-infringement  
of intellectual property rights of any third party.  
WARNINGS  
Due to technical requirements products may  
contain dangerous substances. For information on  
the types in question please contact your nearest  
Infineon Technologies office.  
In addition, any information given in this document  
is subject to customers compliance with its  
obligations stated in this document and any  
applicable legal requirements, norms and  
standards concerning customers products and any  
use of the product of Infineon Technologies in  
customers applications.  
Except as otherwise explicitly approved by Infineon  
Technologies in a written document signed by  
authorized  
representatives  
of  
Infineon  
Technologies, Infineon Technologies’ products may  
not be used in any applications where a failure of  
the product or any consequences of the use thereof  
can reasonably be expected to result in personal  
injury.  
The data contained in this document is exclusively  
intended for technically trained staff. It is the  
responsibility of customers technical departments  
to evaluate the suitability of the product for the  
intended application and the completeness of the  
product information given in this document with  
respect to such application.  

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