IRF9321 [INFINEON]

-30V 单个 P 通道 HEXFET Power MOSFET, 采用 SO-8 封装;
IRF9321
型号: IRF9321
厂家: Infineon    Infineon
描述:

-30V 单个 P 通道 HEXFET Power MOSFET, 采用 SO-8 封装

文件: 总9页 (文件大小:280K)
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PD - 95960  
IRF9321PbF  
HEXFET® Power MOSFET  
VDS  
-30  
7.2  
V
RDS(on) max  
(@VGS = -10V)  
m
RDS(on) max  
(@VGS = -4.5V)  
11.2  
34  
m
Qg (typical)  
nC  
A
SO-8  
ID  
-15  
(@TA = 25°C)  
Applications  
Charge and Discharge Switch for Notebook PC Battery Application  
Features and Benefits  
Features  
Resulting Benefits  
results in  
Industry-Standard SO-8 Package  
Multi-Vendor Compatibility  
RoHS Compliant Containing no Lead, no Bromide and no Halogen  
Environmentally Friendlier  
Orderable part number  
Package Type  
Standard Pack  
Form Quantity  
Note  
IRF9321PbF  
IRF9321TRPbF  
SO8  
SO8  
Tube/Bulk  
Tape and Reel  
95  
4000  
Absolute Maximum Ratings  
Max.  
Parameter  
Drain-to-Source Voltage  
Units  
VDS  
-30  
±20  
-15  
V
Gate-to-Source Voltage  
V
GS  
Continuous Drain Current, VGS @ -10V  
Continuous Drain Current, VGS @ -10V  
Pulsed Drain Current  
I
I
I
@ TA = 25°C  
D
D
-12  
A
@ TA = 70°C  
-120  
2.5  
DM  
Power Dissipation  
P
D
P
D
@TA = 25°C  
@TA = 70°C  
W
W/°C  
°C  
1.6  
0.02  
Power Dissipation  
Linear Derating Factor  
Operating Junction and  
-55 to + 150  
T
T
J
Storage Temperature Range  
STG  
Notes  through † are on page 2  
www.irf.com  
1
05/11/2010  
IRF9321PbF  
Static @ TJ = 25°C (unless otherwise specified)  
Conditions  
VGS = 0V, ID = -250µA  
Reference to 25°C, ID = -1mA  
VGS = -10V, ID = -15A  
Parameter  
Drain-to-Source Breakdown Voltage  
Min.  
Typ.  
–––  
0.021  
5.9  
Max.  
–––  
–––  
7.2  
Units  
V
BVDSS  
∆Β  
RDS(on)  
-30  
–––  
–––  
–––  
-1.3  
–––  
–––  
–––  
–––  
–––  
30  
V
DSS/ TJ  
Breakdown Voltage Temp. Coefficient  
V/°C  
Static Drain-to-Source On-Resistance  
m
VGS = -4.5V, ID = -12A  
9.3  
11.2  
-2.4  
–––  
-1.0  
-150  
-100  
100  
–––  
–––  
98  
VGS(th)  
VDS = VGS, ID = -50µA  
Gate Threshold Voltage  
-1.8  
-5.9  
–––  
–––  
–––  
–––  
–––  
34  
V
VGS(th)  
Gate Threshold Voltage Coefficient  
Drain-to-Source Leakage Current  
mV/°C  
VDS = -24V, VGS = 0V  
VDS = -24V, VGS = 0V, TJ = 125°C  
VGS = -20V  
IDSS  
µA  
IGSS  
Gate-to-Source Forward Leakage  
Gate-to-Source Reverse Leakage  
Forward Transconductance  
Total Gate Charge  
nA  
VGS = 20V  
VDS = -10V, ID = -12A  
VDS = -15V, VGS = -4.5V, ID = - 12A  
gfs  
Qg  
S
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
nC  
V
GS = -10V  
Qg  
Total Gate Charge  
65  
VDS = -15V  
ID = -12A  
Qgs  
Qgd  
RG  
td(on)  
tr  
nC  
Gate-to-Source Charge  
Gate-to-Drain Charge  
Gate Resistance  
10  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
–––  
16  
18  
V
DD = -30V, VGS = -4.5V  
Turn-On Delay Time  
Rise Time  
21  
ID = -1.0A  
79  
ns  
pF  
RG = 6.8  
See Figs. 19a & 19b  
VGS = 0V  
td(off)  
tf  
Turn-Off Delay Time  
Fall Time  
185  
145  
2590  
590  
360  
Ciss  
Coss  
Crss  
Input Capacitance  
VDS = -25V  
Output Capacitance  
Reverse Transfer Capacitance  
ƒ = 1.0MHz  
Avalanche Characteristics  
Typ.  
–––  
–––  
Max.  
310  
-12  
Parameter  
Units  
mJ  
EAS  
IAR  
Single Pulse Avalanche Energy  
Avalanche Current  
A
Diode Characteristics  
Conditions  
Parameter  
Min.  
Typ.  
Max.  
Units  
D
IS  
MOSFET symbol  
Continuous Source Current  
–––  
–––  
-2.5  
showing the  
(Body Diode)  
A
G
ISM  
integral reverse  
p-n junction diode.  
Pulsed Source Current  
(Body Diode)  
–––  
–––  
-120  
S
VSD  
trr  
T = 25°C, I = -2.5A, V = 0V  
J S GS  
Diode Forward Voltage  
–––  
–––  
–––  
–––  
38  
-1.2  
57  
V
T = 25°C, I = -2.5A, VDD = -24V  
Reverse Recovery Time  
Reverse Recovery Charge  
ns  
nC  
J
F
Qrr  
di/dt = 100/µs  
24  
36  
Thermal Resistance  
Typ.  
–––  
–––  
Max.  
20  
Parameter  
Junction-to-Drain Lead  
Junction-to-Ambient  
Units  
RθJL  
RθJA  
°C/W  
50  
Notes:  
 Repetitive rating; pulse width limited by max. junction temperature.  
‚ Starting TJ = 25°C, L = 4.3mH, RG = 25, IAS = -12A.  
ƒ Pulse width 400µs; duty cycle 2%.  
„ When mounted on 1 inch square copper board.  
Rθ is measured at TJ of approximately 90°C.  
† For DESIGN AID ONLY, not subject to production testing.  
2
www.irf.com  
IRF9321PbF  
1000  
100  
10  
1000  
100  
10  
VGS  
-10V  
VGS  
-10V  
TOP  
TOP  
-5.0V  
-4.5V  
-4.0V  
-3.5V  
-3.0V  
-2.8V  
-2.5V  
-5.0V  
-4.5V  
-4.0V  
-3.5V  
-3.0V  
-2.8V  
-2.5V  
BOTTOM  
BOTTOM  
1
-2.5V  
1
-2.5V  
0.1  
0.01  
60µs PULSE WIDTH  
Tj = 150°C  
60µs PULSE WIDTH  
Tj = 25°C  
0.1  
0.1  
1
10  
100  
0.1  
1
10  
100  
-V , Drain-to-Source Voltage (V)  
-V , Drain-to-Source Voltage (V)  
DS  
DS  
Fig 2. Typical Output Characteristics  
Fig 1. Typical Output Characteristics  
1000  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
I
= -15A  
D
V
= -10V  
GS  
100  
10  
1
T
= 25°C  
J
T = 150°C  
J
V
= -10V  
DS  
60µs PULSE WIDTH  
0.1  
1
2
3
4
5
-60 -40 -20  
0
20 40 60 80 100 120140 160  
T
J
, Junction Temperature (°C)  
-V , Gate-to-Source Voltage (V)  
GS  
Fig 3. Typical Transfer Characteristics  
Fig 4. Normalized On-Resistance vs. Temperature  
14.0  
100000  
10000  
1000  
V
= 0V,  
= C  
f = 1 MHZ  
GS  
I = -12A  
D
C
C
C
+ C , C  
SHORTED  
iss  
gs  
gd  
ds  
12.0  
= C  
rss  
oss  
gd  
= C + C  
V
V
V
= -24V  
= -15V  
= -6.0V  
DS  
DS  
DS  
ds  
gd  
10.0  
8.0  
6.0  
4.0  
2.0  
0.0  
C
iss  
C
C
oss  
rss  
100  
0
25  
50  
75  
100  
1
10  
-V , Drain-to-Source Voltage (V)  
100  
Q , Total Gate Charge (nC)  
G
DS  
Fig 5. Typical Capacitance vs.Drain-to-Source Voltage  
Fig 6. Typical Gate Charge vs.Gate-to-Source Voltage  
www.irf.com  
3
IRF9321PbF  
1000  
1000  
100  
10  
OPERATION IN THIS AREA  
LIMITED BY R  
(on)  
DS  
100µsec  
1msec  
100  
T
= 150°C  
J
10msec  
T
= 25°C  
V
DC  
10  
J
1
T
= 25°C  
A
Tj = 150°C  
Single Pulse  
= 0V  
GS  
1.0  
0.1  
0.01  
0.1  
1
10  
100  
0.3  
0.5  
0.7  
0.9  
1.1  
1.3  
-V , Drain-to-Source Voltage (V)  
-V , Source-to-Drain Voltage (V)  
DS  
SD  
Fig 7. Typical Source-Drain Diode Forward Voltage  
Fig 8. Maximum Safe Operating Area  
2.4  
15  
2.2  
2.0  
1.8  
1.6  
1.4  
1.2  
1.0  
10  
5
I
= -50µA  
D
0
-75 -50 -25  
0
25 50 75 100 125 150  
25  
50  
75  
100  
125  
150  
T
, Temperature ( °C )  
T
, Ambient Temperature (°C)  
J
A
Fig 10. Threshold Voltage vs. Temperature  
Fig 9. Maximum Drain Current vs.  
AmbientTemperature  
100  
D = 0.50  
10  
1
0.20  
0.10  
0.05  
0.02  
0.01  
0.1  
0.01  
0.001  
Notes:  
1. Duty Factor D = t1/t2  
2. Peak Tj = P dm x Zthja + T  
SINGLE PULSE  
( THERMAL RESPONSE )  
A
1E-006  
1E-005  
0.0001  
0.001  
0.01  
0.1  
1
10  
100  
1000  
t
, Rectangular Pulse Duration (sec)  
1
Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Ambient  
4
www.irf.com  
IRF9321PbF  
20  
18  
16  
14  
12  
10  
8
60  
50  
40  
30  
20  
10  
0
I
= -15A  
D
Vgs = -4.5V  
T
T
= 125°C  
= 25°C  
J
J
6
4
Vgs = -10V  
2
0
2
4
6
8
10 12 14 16 18 20  
0
20  
40  
60  
80  
100  
120  
-I , Drain Current (A)  
D
-V  
Gate -to -Source Voltage (V)  
GS,  
Fig 13. Typical On-Resistance vs. Drain Current  
Fig 12. On-Resistance vs. Gate Voltage  
1400  
1000  
I
D
1200  
1000  
800  
600  
400  
200  
0
TOP  
-1.4A  
-2.2A  
800  
600  
400  
200  
0
BOTTOM -12A  
25  
50  
75  
100  
125  
150  
1E-5  
1E-4  
1E-3  
1E-2  
1E-1  
1E+0  
Starting T , Junction Temperature (°C)  
J
Time (sec)  
Fig 14. Maximum Avalanche Energy vs. Drain Current  
Fig 15. Typical Power vs. Time  
Driver Gate Drive  
P.W.  
Period  
Period  
D =  
D.U.T *  
P.W.  
+
*
=10V  
V
GS  
ƒ
Circuit Layout Considerations  
Low Stray Inductance  
Ground Plane  
Low Leakage Inductance  
Current Transformer  
-
D.U.T. I Waveform  
SD  
+
Reverse  
Recovery  
Current  
‚
Body Diode Forward  
„
Current  
di/dt  
-
+
-
D.U.T. V Waveform  
DS  
Diode Recovery  
dv/dt  

V
DD  
VDD  
di/dt controlled by RG  
Re-Applied  
Voltage  
RG  
+
-
Driver same type as D.U.T.  
Body Diode  
Inductor Current  
Forward Drop  
ISD controlled by Duty Factor "D"  
D.U.T. - Device Under Test  
I
SD  
Ripple 5%  
* VGS = 5V for Logic Level Devices  
* Reverse Polarity of D.U.T for P-Channel  
Fig 16. Diode Reverse Recovery Test Circuit for P-Channel HEXFET® Power MOSFETs  
www.irf.com  
5
IRF9321PbF  
Id  
Vds  
Vgs  
L
VCC  
DUT  
0
Vgs(th)  
20K  
Qgs1  
Qgs2  
Qgodr  
Qgd  
Fig 17a. Gate Charge Test Circuit  
Fig 17b. Gate Charge Waveform  
L
V
DS  
I
AS  
D.U.T  
R
G
V
DD  
I
A
AS  
-VGS  
DRIVER  
0.01  
t
p
t
p
V
(BR)DSS  
15V  
Fig 18b. Unclamped Inductive Waveforms  
Fig 18a. Unclamped Inductive Test Circuit  
RD  
VDS  
t
t
r
t
t
f
d(on)  
d(off)  
VGS  
V
GS  
D.U.T.  
10%  
RG  
-
+
VDD  
-VGS  
90%  
Pulse Width ≤ 1 µs  
Duty Factor ≤ 0.1 %  
V
DS  
Fig 19a. Switching Time Test Circuit  
Fig 19b. Switching Time Waveforms  
6
www.irf.com  
IRF9321PbF  
SO-8 Package Outline(Mosfet & Fetky)  
Dimensions are shown in milimeters (inches)  
SO-8 Part Marking Information  
Note: For the most current drawing please refer to IR website at http://www.irf.com/package/  
www.irf.com  
7
IRF9321PbF  
SO-8 Tape and Reel (Dimensions are shown in milimeters (inches))  
TERMINAL NUMBER 1  
12.3 ( .484 )  
11.7 ( .461 )  
8.1 ( .318 )  
7.9 ( .312 )  
FEED DIRECTION  
NOTES:  
1. CONTROLLING DIMENSION : MILLIMETER.  
2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS(INCHES).  
3. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
330.00  
(12.992)  
MAX.  
14.40 ( .566 )  
12.40 ( .488 )  
NOTES :  
1. CONTROLLING DIMENSION : MILLIMETER.  
2. OUTLINE CONFORMS TO EIA-481 & EIA-541.  
Qualification Information†  
Consumer ††  
Qualification level  
(per JEDEC JESD47F††† guidelines)  
MSL1  
(per JEDEC J-STD-020D†††  
Moisture Sensitivity Level  
RoHS Compliant  
SO-8  
)
Yes  
†
Qualification standards can be found at International Rectifier’s web site  
http://www.irf.com/product-info/reliability  
††  
Higher qualification ratings may be available should the user have such requirements.  
Please contact your International Rectifier sales representative for further information:  
http://www.irf.com/whoto-call/salesrep/  
††† Applicable version of JEDEC standard at the time of product release.  
Data and specifications subject to change without notice.  
IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105  
TAC Fax: (310) 252-7903  
Visit us at www.irf.com for sales contact information.05/2010  
8
www.irf.com  
IMPORTANT NOTICE  
The information given in this document shall in no For further information on the product, technology,  
event be regarded as a guarantee of conditions or delivery terms and conditions and prices please  
characteristics (“Beschaffenheitsgarantie”) .  
contact your nearest Infineon Technologies office  
(www.infineon.com).  
With respect to any examples, hints or any typical  
values stated herein and/or any information  
regarding the application of the product, Infineon  
Technologies hereby disclaims any and all  
warranties and liabilities of any kind, including  
without limitation warranties of non-infringement  
of intellectual property rights of any third party.  
WARNINGS  
Due to technical requirements products may  
contain dangerous substances. For information on  
the types in question please contact your nearest  
Infineon Technologies office.  
In addition, any information given in this document  
is subject to customers compliance with its  
obligations stated in this document and any  
applicable legal requirements, norms and  
standards concerning customers products and any  
use of the product of Infineon Technologies in  
customers applications.  
Except as otherwise explicitly approved by Infineon  
Technologies in a written document signed by  
authorized  
representatives  
of  
Infineon  
Technologies, Infineon Technologies’ products may  
not be used in any applications where a failure of  
the product or any consequences of the use thereof  
can reasonably be expected to result in personal  
injury.  
The data contained in this document is exclusively  
intended for technically trained staff. It is the  
responsibility of customers technical departments  
to evaluate the suitability of the product for the  
intended application and the completeness of the  
product information given in this document with  
respect to such application.  

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